Description TO-220F. Symbol Parameter FCP11N60F FCPF11N60F Units

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FCP11N60F/FCPF11N60F 600V N-Channel MOSFET Features 650V @T J = 150 C Typ. R DS(on) = 0.32Ω Fast Recovery Type ( t rr = 120ns) Ultra Low Gate Charge (typ. Q g = 40nC) Low Effective Output Capacitance (typ. C oss eff.=95pf) 100% avalanche tested RoHS Compliant G D S TO-220 G D S Description SuperFET TM is, Fairchild s proprietary, new generation of high voltage MOSFET family that is utilizing an advanced charge balance mechanism for outstanding low on-resistance and lower gate charge performance. This advanced technology has been tailored to minimize conduction loss, provide superior switching performance, and withstand extreme dv/dt rate and higher avalanche energy. Consequently, SuperFET is very suitable for various AC/DC power conversion in switching mode operation for system miniaturization and higher efficiency. TO-220F December 2008 SuperFET TM G D! "! " "! "! S Absolute Maximum Ratings Symbol Parameter FCP11N60F FCPF11N60F Units Drain Current - Continuous (T C = 25 C) 11 11 * A - Continuous (T C = 100 C) 7 7 * A M Drain Current - Pulsed (Note 1) 33 33 * A S Gate-Source Voltage ± 30 V E AS Single Pulsed Avalanche Energy (Note 2) 340 mj I AR Avalanche Current (Note 1) 11 A E AR Repetitive Avalanche Energy (Note 1) 12.5 mj dv/dt Peak Diode Recovery dv/dt (Note 3) 4.5 V/ns P D Power Dissipation (T C = 25 C) 125 36 * W - Derate above 25 C 1.0 0.29 * W/ C T J, T STG Operating and Storage Temperature Range -55 to +150 C T L Maximum lead temperature for soldering purposes, 300 C 1/8" from case for 5 seconds * Drain current limited by maximum junction termperature. Thermal Characteristics Symbol Parameter FCP11N60F FCPF11N60F Units R θjc Thermal Resistance, Junction-to-Case 1.0 3.5 C/W R θcs Thermal Resistance, Case-to-Sink 0.5 -- C/W R θja Thermal Resistance, Junction-to-Ambient 62.5 62.5 C/W 2008 Fairchild Semiconductor Corporation 1 www.fairchildsemi.com

Package Marking and Ordering Information Device Marking Device Package Reel Size Tape Width Quantity FCP11N60F FCP11N60F TO-220 -- -- 50 FCPF11N60F FCPF11N60F TO-220F -- -- 50 Electrical Characteristics T C = 25 C unless otherwise noted Symbol Parameter Test Conditions Min. Typ. Max. Units Off Characteristics BS Drain-Source Breakdown Voltage = 0 V, = 250 µa, T J = 25 C 600 -- -- V = 0 V, = 250 µa, T J = 150 C -- 650 -- V BS / Breakdown Voltage Temperature = 250 µa, Referenced to 25 C -- 0.6 -- V/ C T J Coefficient B Drain-Source Avalanche Breakdown = 0 V, = 11 A -- 700 -- V Voltage SS Zero Gate Voltage Drain Current = 600 V, = 0 V -- -- 10 µa = 480 V, T C = 125 C -- -- 100 µa I GSSF Gate-Body Leakage Current, Forward = 30 V, = 0 V -- -- 100 na I GSSR Gate-Body Leakage Current, Reverse = -30 V, = 0 V -- -- -100 na On Characteristics (th) Gate Threshold Voltage =, = 250 µa 3.0 -- 5.0 V R DS(on) Static Drain-Source = 10 V, = 5.5 A -- 0.32 0.38 Ω On-Resistance g FS Forward Transconductance = 40 V, = 5.5 A (Note 4) -- 9.7 -- S Dynamic Characteristics C iss Input Capacitance = 25 V, = 0 V, -- 1148 1490 pf C oss Output Capacitance f = 1.0 MHz -- 671 870 pf C rss Reverse Transfer Capacitance -- 63 82 pf C oss Output Capacitance = 480 V, = 0 V, -- 35 -- pf f = 1.0 MHz C oss eff. Effective Output Capacitance = 0V to 480 V, = 0 V -- 95 -- pf Switching Characteristics t d(on) Turn-On Delay Time V DD = 300 V, = 11 A, -- 34 80 ns t r Turn-On Rise Time R G = 25 Ω -- 98 205 ns t d(off) Turn-Off Delay Time -- 119 250 ns t f Turn-Off Fall Time (Note 4, 5) -- 56 120 ns Q g Total Gate Charge = 480 V, = 11 A, -- 40 52 nc Q gs Gate-Source Charge = 10 V -- 7.2 -- nc (Note 4, 5) Q gd Gate-Drain Charge -- 21 -- nc Drain-Source Diode Characteristics and Maximum Ratings I S Maximum Continuous Drain-Source Diode Forward Current -- -- 11 A I SM Maximum Pulsed Drain-Source Diode Forward Current -- -- 33 A V SD Drain-Source Diode Forward Voltage = 0 V, I S = 11 A -- -- 1.4 V t rr Reverse Recovery Time = 0 V, I S = 11 A, -- 120 -- ns Q rr Reverse Recovery Charge di F / dt = 100 A/µs (Note 4) -- 0.8 -- µc Notes: 1. Repetitive Rating : Pulse width limited by maximum junction temperature 2. I AS = 5.5A, V DD = 50V, R G = 25 Ω, Starting T J = 25 C 3. I SD 11A, di/dt 200A/µs, V DD BS, Starting T J = 25 C 4. Pulse Test : Pulse width 300µs, Duty cycle 2% 5. Essentially independent of operating temperature 2 www.fairchildsemi.com

Typical Performance Characteristics Figure 1. On-Region Characteristics 10 2 Top : 15.0 V 10.0 V 8.0 V 7.0 V 6.5 V 10 1 6.0 V Bottom : 5.5 V 10 1, Drain-Source Voltage [V] 1. 250 µs Pulse Test 2. T C = 25 o C Figure 2. Transfer Characteristics 2 4 6 8 10, Gate-Source Voltage [V] Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage Drain Current and Gate Voltage Variation vs. Source Current and Temperatue 1.0 10 1 150 o C 25 o C -55 o C * Note 1. = 40V 2. 250 µs Pulse Test R DS(ON) [Ω], Drain-Source On-Resistance 0.8 0.6 0.4 0.2 = 10V = 20V * Note : T J = 25 o C 0.0 0 5 10 15 20 25 30 35 40 R, Reverse Drain Current [A] 10 1 150 o C 25 o C 1. = 0V 2. 250 µs Pulse Test 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 V SD, Source-Drain Voltage [V] Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics Capacitance [pf] 6000 5000 4000 3000 2000 1000 C rss C iss C oss C iss = C gs + C gd (C ds = shorted) C oss = C ds + C gd C rss = C gd 1. = 0 V 2. f = 1 MHz, Gate-Source Voltage [V] 12 10 8 6 4 2 = 100V = 250V = 400V * Note : = 11A 0 10 1, Drain-Source Voltage [V] 0 0 5 10 15 20 25 30 35 40 45 Q G, Total Gate Charge [nc] 3 www.fairchildsemi.com

Typical Performance Characteristics (Continued) Figure 7. Breakdown Voltage Variation vs. Temperature BS, (Normalized) Drain-Source Breakdown Voltage 1.2 1.1 1.0 0.9 0.8-100 -50 0 50 100 150 200 T J, Junction Temperature [ o C] Figure 9-1. Safe Operating Area for FCP11N60F 1. = 0 V 2. = 250 µa R DS(ON), (Normalized) Drain-Source On-Resistance Figure 8. On-Resistance Variation vs. Temperature 3.0 2.5 2.0 1.5 1.0 0.5 0.0-100 -50 0 50 100 150 200 T J, Junction Temperature [ o C] Figure 9-2. Safe Operating Area for FCPF11N60F 1. = 10 V 2. = 5.5 A 10 2 Operation in This Area is Limited by R DS(on) 10 2 Operation in This Area is Limited by R DS(on) 10 1 1. T C = 25 o C 2. T J = 150 o C 3. Single Pulse 100 us 1 ms 10 ms DC 10 1 1. T C = 25 o C 2. T J = 150 o C 3. Single Pulse 100 us 1 ms 10 ms 100 ms DC 10-2 10 1 10 2 10 3, Drain-Source Voltage [V] 10-2 10 1 10 2 10 3, Drain-Source Voltage [V] Figure 10. Maximum Drain Current vs. Case Temperature 12.5 10.0 7.5 5.0 2.5 0.0 25 50 75 100 125 150 T C, Case Temperature [ o C] 4 www.fairchildsemi.com

Typical Performance Characteristics (Continued) Figure 11-1. Transient Thermal Response Curve for FCP11N60F Z θjc (t), Thermal Response 10-2 D=0.5 0.2 0.1 0.05 0.02 0.01 single pulse 1. Z θ JC (t) = 1.0 o C/W Max. 2. Duty Factor, D =t 1 /t 2 3. T JM - T C = P DM * Z θ JC (t) 10-5 10-4 10-3 10-2 10 1 t 1, Square W ave Pulse Duration [sec] Figure 11-2. Transient Thermal Response Curve for FCPF11N60F P DM t 1 t 2 D=0.5 Z θjc (t), Thermal Response 0.2 0.1 0.05 0.02 0.01 single pulse 1. Z θ JC (t) = 3.5 o C/W Max. 2. D uty F actor, D =t 1 /t 2 3. T JM - T C = P DM * Z θ JC (t) P DM 10-2 t 1 t 2 10-5 10-4 10-3 10-2 10 1 t 1, Square W ave Pulse Duration [sec] 5 www.fairchildsemi.com

12V 200nF 3mA 50KΩ 300nF Gate Charge Test Circuit & Waveform Same Type as DUT 10V Q gs DUT Resistive Switching Test Circuit & Waveforms Q g Q gd Charge R L 90% R G V DD 10V DUT 10% t d(on) t r t d(off) tf t on t off Unclamped Inductive Switching Test Circuit & Waveforms L 1 E AS = ---- LI 2 2 AS BS -------------------- BS -V DD BS I AS R G V DD (t) 10V DUT V DD (t) t p t p Time 6 www.fairchildsemi.com

Peak Diode Recovery dv/dt Test Circuit & Waveforms DUT + I SD _ L Driver R G Same Type as DUT dv/dt controlled by RG I SD controlled by pulse period V DD ( Driver ) Gate Pulse Width D = -------------------------- Gate Pulse Period 10V I FM, Body Diode Forward Current I SD ( DUT ) di/dt I RM Body Diode Reverse Current ( DUT ) Body Diode Recovery dv/dt V SD V DD Body Diode Forward Voltage Drop 7 www.fairchildsemi.com

Mechanical Dimensions TO - 220 Dimensions in Millimeters 8 www.fairchildsemi.com

Mechanical Dimensions (Continued) 15.80 ±0.20 3.30 ±0.10 TO-220F 10.16 ±0.20 ø3.18 ±0.10 2.54 ±0.20 (7.00) (0.70) 6.68 ±0.20 (1.00x45 ) 15.87 ±0.20 9.75 ±0.30 MAX1.47 0.80 ±0.10 (30 ) 0.35 ±0.10 #1 0.50 +0.10 0.05 2.76 ±0.20 2.54TYP [2.54 ±0.20] 2.54TYP [2.54 ±0.20] 9.40 ±0.20 4.70 ±0.20 Dimensions in Millimeters 9 www.fairchildsemi.com

tm tm tm TRADEMARKS The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not intended to be an exhaustive list of all such trademarks. Build it Now CorePLUS CorePOWER CROSSVOLT CTL Current Transfer Logic EcoSPARK EfficentMax EZSWITCH * Fairchild Fairchild Semiconductor FACT Quiet Series FACT FAST FastvCore FlashWriter * FPS F-PFS FRFET Global Power Resource SM Green FPS Green FPS e-series GTO IntelliMAX ISOPLANAR MegaBuck MICROCOUPLER MicroFET MicroPak MillerDrive MotionMax Motion-SPM OPTOLOGIC OPTOPLANAR PDP SPM Power-SPM PowerTrench PowerXS Programmable Active Droop QFET QS Quiet Series RapidConfigure Saving our world, 1mW /W /kw at a time SmartMax SMART START SPM STEALTH SuperFET SuperSOT -3 SuperSOT -6 SuperSOT -8 SupreMOS SyncFET The Power Franchise * EZSWITCH and FlashWriter are trademarks of System General Corporation, used under license by Fairchild Semiconductor. TinyBoost TinyBuck TinyLogic TINYOPTO TinyPower TinyPWM TinyWire μserdes UHC Ultra FRFET UniFET VCX VisualMax XS DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS. LIFE SUPPORT POLICY FAIRCHILD S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user. 2. A critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. ANTI-COUNTERFEITING POLICY Fairchild Semiconductor Corporation s Anti-Counterfeiting Policy. Farichild s Anti-Counterfeiting Policy is also stated on our external website, www.fairchildsemi.com, under Sales Support. Counterfeiting of semiconductor parts is a growing problem in the industry. All manufactures of semiconductor products are experiencing counterfeiting of their parts. Customers who inadvertently purchase counterfeit parts experience many problems such as loss of brand reputation, substandard performance, failed application, and increased cost of production and manufacturing delays. Fairchild is taking strong measures to protect ourselves and our customers from the proliferation of counterfeit parts. Farichild strongly encourages customers to purchase Farichild parts either directly from Fairchild or from Authorized Fairchild Distributors who are listed by country on our web page cited above. Products customers buy either from fairchild directly or from Authorized Fairchild Distributors are genuine parts, have full traceability, meet Fairchild s quality standards for handing and storage and provide access to Farichild s full range of up-to-date technical and product information. Fairchild and our Authorized Distributors will stand behind all warranties and will appropriately address and warranty issues that may arise. Fairchild will not provide any warranty coverage or other assistance for parts bought from Unauthorized Sources. Farichild is committed to combat this global problem and encourage our customers to do their part in stopping this practice by buying direct or from authorized distributors. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Product Status Definition Advance Information Formative / In Design Datasheet contains the design specifications for product development. Specifications may change in any manner without notice. Preliminary No Identification Needed First Production Full Production Datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. Datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve the design. Obsolete Not In Production Datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor. The datasheet is for reference information only. Rev. I37 10 www.fairchildsemi.com