Test Report Product Name : MEGABOOK Model No. : MS-1010, M620 Applicant : MICRO-STAR INTL Co., LTD. Address : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C. Date of Receipt : 2004/08/02 Issued Date : 2004/08/31 Report No. : 048L041E The test results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation. Page: 1 of 85
Declaration of Conformity The following products is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). The listed standard as below were applied: The following Equipment: Product Trade Name Model Number : MEGABOOK : MSI : MS-1010, M620 This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC).For the evaluation regarding EMC, the following standards were applied: RFI Emission: EN 55022:1998+A1: 2000+A2:2003 Class B : Product family standard EN 61000-3-2: 2000 Class D : Limits for harmonic current emission EN 61000-3-3:1995+A1:2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system Immunity : EN 55024:1998+A1:2001 Product family standard The following importer/manufacturer is responsible for this declaration: Company Name : Company Address : Telephone : Person is responsible for marking this declaration: Name (Full Name) Position/ Title Date Legal Signature
EMC/Safety Test Laboratory Accredited by DNV, Nemko and NVLAP QTK No.:048L041E Statement of Conformity The certifies that the following designated product Product : MEGABOOK Trade Name : MSI Model Number : MS-1010, M620 Company Name : MICRO-STAR INT'L Co.,LTD This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). For the evaluation regarding EMC, the following standards were applied: RFI Emission: EN 55022:1998+A1: 2000+A2:2003 Class B : Product family standard EN 61000-3-2: 2000 Class D : Limits for harmonic current emission EN 61000-3-3:1995+A1:2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system Immunity : EN 55024:1998+A1:2001 Product family standard TEST LABORATORY Gene Chang / Manager The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo. QuieTek Corporation / No. 5-22, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. Tel: 886-2-8601-3788, Fax: 886-2-8601-3789, E-mail: service@quietek.com
Test Report Certification Issued Date : 2004/08/31 Report No. : 048L041E Product Name Applicant Address Manufacturer Model No. Rated Voltage Trade Name Measurement Standard : MEGABOOK : MICRO-STAR INTL Co., LTD. : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C. : MICRO-STAR INTL Co., LTD. : MS-1010, M620 : AC 230 V / 50 Hz : MSI : EN 55022:1998+A1:2000+A2:2003, EN 55024:1998+A1:2001,EN 61000-3-2:2000, EN 61000-3-3:1995+A1:2001 Measurement Procedure : EN 55022:1998+A1:2000+A2:2003, EN 61000-3-2:2000,EN 61000-3-3:1995+A1:2001, IEC 61000-4-2:1995+A1:1998+A2:2000, IEC 61000-4-3:1995+A1:1998+A2:2000, IEC 61000-4-4:1995+A1:2000+A2:2001, IEC 61000-4-5:1995+A1:2000,IEC 61000-4-6:1996+A1:2000, IEC 61000-4-8:1993+A1:2000,IEC 61000-4-11:1994+A1:2000 Classification : B Test Result : Complied The test results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation. Documented By : Tested By : (Demi Chang) Approved By : (Denny Wang) (Gene Chang) Page: 2 of 85
Test Report Certification Issued Date : 2004/08/31 Report No. : 048L041E Accredited by NIST (NVLAP) NVLAP Lab Code: 200533-0 Product Name Applicant Address Manufacturer Model No. FCC ID. Rated Voltage Trade Name : MEGABOOK MICRO-STAR INTL Co., LTD. : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C. : MICRO-STAR INTL Co., LTD. : MS-1010, M620 : : DoC : AC 240 V / 50 Hz : MSI Measurement Standard : AS/NZS CISPR 22:2002 Measurement Procedure : AS/NZS CISPR 22:2002 Classification : B Test Result : Complied The test results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation. This report must not be used to claim product endorsement by NVLAP any agency of the U.S. Government Documented By : Tested By : (Demi Chang) Approved By : (Denny Wang) ( Gene Chang ) Page: 3 of 85
TABLE OF CONTENTS Description Page 1. General Information...7 1.1. EUT Description...7 1.2. Test Mode...8 1.3. Tested System Details...9 1.4. Configuration of tested System...10 1.5. EUT Exercise Software...11 1.6. Test Facility...12 2. Conducted Emission...13 2.1. Test Equipment List...13 2.2. Test Setup...13 2.3. Limits...14 2.4. Test Procedure...14 2.5. Uncertainty...14 2.6. Test Specification...14 2.7. Test Result...15 2.8. Test Photo...19 3. Impedance Stabilization Network...21 3.1. Test Equipment List...21 3.2. Test Setup...21 3.3. Limits...22 3.4. Test Procedure...22 3.5. Uncertainty...22 3.6. Test Specification...22 3.7. Test Result...23 3.8. Test Photo...26 4. Radiated Emission...27 4.1. Test Equipment List...27 4.2. Test Setup...27 4.3. Limits...28 4.4. Test Procedure...28 4.5. Uncertainty...28 4.6. Test Specification...28 4.7. Test Result...29 4.8. Test Photo...33 5. Power Harmonics...35 5.1. Test Equipment List...35 5.2. Test Setup...35 5.3. Limits...36 5.4. Test Procedure...37 5.5. Uncertainty...37 5.6. Test Specification...37 5.7. Test Result...38 5.8. Test Photo...40 6. Voltage Fluctuation and Flicker...41 Page: 4 of 85
6.1. Test Equipment List...41 6.2. Test Setup...41 6.3. Limits...42 6.4. Test Procedure...42 6.5. Uncertainty...42 6.6. Test Specification...42 6.7. Test Result...43 6.8. Test Photo...45 7. Electrostatic Discharge (ESD)...46 7.1. Test Equipment List...46 7.2. Test Setup...46 7.3. Limits...47 7.4. Test Procedure...47 7.5. Uncertainty...47 7.6. Test Specification...47 7.7. Test Result...48 7.8. Test Photo...50 8. Radiated Susceptibility (RS)...51 8.1. Test Equipment List...51 8.2. Test Setup...51 8.3. Limits...52 8.4. Test Procedure...52 8.5. Uncertainty...52 8.6. Test Specification...52 8.7. Test Result...53 8.8. Test Photo...55 9. Electrical Fast Transient/Burst (EFT/B)...56 9.1. Test Equipment List...56 9.2. Test Setup...56 9.3. Limits...57 9.4. Test Procedure...57 9.5. Uncertainty...57 9.6. Test Specification...57 9.7. Test Result...58 9.8. Test Photo...60 10. Surge...62 10.1. Test Equipment List...62 10.2. Test Setup...62 10.3. Limits...63 10.4. Test Procedure...63 10.5. Uncertainty...63 10.6. Test Specification...63 10.7. Test Result...64 10.8. Test Photo...66 11. Conducted Susceptibility (CS)...67 11.1. Test Equipment List...67 11.2. Test Setup...67 Page: 5 of 85
11.3. Limits...68 11.4. Test Procedure...69 11.5. Uncertainty...69 11.6. Test Specification...69 11.7. Test Result...70 11.8. Test Photo...72 12. Power Frequency Magnetic Field...74 12.1. Test Equipment List...74 12.2. Test Setup...74 12.3. Limits...75 12.4. Test Procedure...75 12.5. Uncertainty...75 12.6. Test Specification...75 12.7. Test Result...76 12.8. Test Photo...78 13. Voltage Dips and Interruption Measurement...79 13.1. Test Equipment List...79 13.2. Test Setup...79 13.3. Limits...80 13.4. Test Procedure...80 13.5. Uncertainty...80 13.6. Test Specification...80 13.7. Test Result...81 13.8. Test Photo...83 Attachement...84 EUT Photograph...84 Reference : Laboratory of License Page: 6 of 85
1. General Information 1.1. EUT Description Product Name Trade Name Model No. EUT Voltage MEGABOOK MSI MS-1010, M620 AC 100-240 V, 50/ 60 Hz Component Motherboard MSI, MS1010 VGA On board Sound On board LAN On board Modem On board CPU Intel Pentium M 1.5GHz Intel Pentium M 1.7GHz HDD Fujitsu, MHT2040AT DVD Quanta Storage, SBW-242B DDR RAM Apacer, 256MB UNB PC2700 CL2.5 Power Adapter LITEON, PA-1650-02 Input: AC 100-240V,50/60Hz,1.6A Output: DC 19V,3.42A Cable Out: Non-Shielded, 1.8m, with one ferrite core bonded. Power Cord: Non-Shielded, 1.8m Power Adapter LI SHIN, 0335A1965 Input: AC 100-240V,50/60Hz,1.7A Output: DC 19V,3.42A Cable Out: Non-Shielded, 1.8m, with one ferrite core bonded. Power Cord: Non-Shielded, 1.8m Note: The EUT is including two models, The MS-1010 for MSI and the M620 for different marketing requirement. MS-1010, M620 Key parts List Item Vendor Model CPU Intel Pentium-M 1.5GHz/1.7GHz HDD Fujitsu MHT2040AT Wireless LAN Intel WM3B2200BG MDC Modem Actiontec MD560LMI-2 CD-ROM Combo Quanta Storage Inc. SBW-242B LCD Samsung LTN154X1-L02 Adapter (1) LITEON PA-1650-02 Adapter (2) LI SHIN 0335A1965 Page: 7 of 85
1.2. Test Mode QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as: Pre-Test Mode EMC Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz),Adapter(LITE ON) Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz),Adapter(LI SHIN) Mode 3:Intel Pentium M 1.7GHz,LCD (1280*800/60Hz)+AV(1024*768/60Hz), Adapter(LITE ON) Mode 4:Intel Pentium M 1.5GHz,LCD(1280*800/60Hz)+S-VIDEO(1024*768/60Hz), Adapter(LI SHIN) Final Test Mode EMI Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz),Adapter(LITE ON) Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz),Adapter(LI SHIN) EMS Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz),Adapter(LITE ON) Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz),Adapter(LI SHIN) Page: 8 of 85
1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Product Manufacturer Model No. Serial No. Power Cord 1 Monitor SONY CPD-G500 2737939 Non-Shielded, 1.8m 2 Microphone & Earphone ROSA RSM-900 N/A N/A 3 USB 2.0 HDD Topdisk ME-910 220955 Power by PC 4 USB 2.0 HDD Topdisk ME-910 235576 Power by PC 5 USB 2.0 HDD Topdisk ME-910 233729 Power by PC 6 USB 2.0 HDD Topdisk ME-910 220904 Power by PC 7 Monitor SONY PVM-14M2U 2111404 Non-Shielded, 1.8m 8 Notebook PC DELL PP01L N/A Non-Shielded, 1.8m 9 Exchange Network Sun Moon Star PX-4 95170087 Non-Shielded, 1.8m Page: 9 of 85
1.4. Configuration of tested System Connection Diagram Signal Cable Type Signal cable Description A D-SUB Cable Shielded, 1.8m, with two ferrite cores bonded B Earphone & Microphone Cable Non-Shielded, 1.8m C USB Cable Shielded, 1.2m D USB Cable Shielded, 1.2m E USB Cable Shielded, 1.2m F USB Cable Shielded, 1.2m G Signal Cable Shielded, 1.2m H LAN Cable Non-Shielded, 7m I TELECOM Cable Non-Shielded, 7m J TELECOM Cable Non-Shielded, 7m Page: 10 of 85
1.5. EUT Exercise Software 1 Setup the EUT and simulators as shown on 1.4. 2 Turn on the power of all equipment. 3 Notebook reads data from disk. 4 Data will be transmitting and receiving through EUT. 5 The transmitting and received status will be shown on the monitor. 6 Repeat the above procedure (4 ) to (5). Page: 11 of 85
1.6. Test Facility Ambient conditions in the laboratory: Items Test Item Required (IEC 68-1) Actual Temperature ( C) IEC 61000-4-11 15-35 23.1 Humidity (%RH) 25-75 55 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) IEC 61000-4-2 15-35 25 Humidity (%RH) 30-60 55 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) IEC 61000-4-5 15-35 23.1 Humidity (%RH) 10-75 55 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) IEC 61000-4-8 15-35 23.1 Humidity (%RH) 25-75 55 Barometric pressure (mbar) 860-1060 950-1000 Site Description: Site Name: Site Address: July 03, 2002 Accreditation on NVLAP NVLAP Lab Code: 200533-0 June 11, 2001 Accreditation on DNV Statement No. : 413-99-LAB11 April 18, 2001 Accreditation on Nemko Certificate No.: ELA 165 Certificate No.: ELA 162 Certificate No.: ELA 191 Quietek Corporation No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwa, R.O.C. TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789 E-Mail : service@quietek.com 0914 ILAC MRA Page: 12 of 85
2. Conducted Emission 2.1. Test Equipment List The following test equipment are used during the conducted emission test: Item Instrument Manufacturer Type No./Serial No Last Cal.. Remark 1 Test Receiver R & S ESCS 30/838251/001 Jan.,2004 2 L.I.S.N. R & S ESH3-Z5/836679/0023 May,2004 EUT 3 L.I.S.N. R & S ENV 4200/833209/0023 May,2004 Peripherals 4 Pulse Limiter R & S ESH3-Z2 May,2004 5 No.2 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 2.2. Test Setup Page: 13 of 85
2.3. Limits EN 55022:1998+A1: 2000+A2:2003 AC Mains Limits (dbuv) Frequency Class A Class B MHz QP AV QP AV 0.15-0.50 79 66 66-56 56-46 0.50-5.0 73 60 56 46 5.0-30 73 60 60 50 Remarks: In the above table, the tighter limit applies at the band edges 2.4. Test Procedure AC Mains: The EUT and simulators are connected to the main power through a line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm /50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) Both sides of AC line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed according to EN 55022:1998+A1: 2000+A2:2003 on conducted measurement. The bandwidth of the field strength meter (R & S Test Receiver ESCS 30) is set at 9kHz. 2.5. Uncertainty The measurement uncertainty is defined as ± 2.02 db 2.6. Test Specification According to EN 55022:1998+A1:2000+A2:2003 Page: 14 of 85
2.7. Test Result Product MEGABOOK Test Mode Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz),Adapter(LITE ON) Date of Test 2004/08/04 Test Site No.2 Shielded Room Test Condition Line 1 Test Range 0.15-30MHz Frequency Cable LISN Reading Measurement Limits Loss Factor Level Level MHz db db dbuv dbuv dbuv ============================================================== Quasi-Peak * 0.224 0.21 0.10 48.45 48.76 62.67 0.306 0.21 0.10 43.40 43.71 60.07 0.689 0.16 0.10 41.15 41.41 56.00 1.010 0.16 0.10 38.43 38.69 56.00 1.586 0.16 0.12 39.81 40.09 56.00 4.813 0.29 0.17 33.02 33.48 56.00 Average 0.224 0.21 0.10 39.20 39.51 52.67 0.306 0.21 0.10 33.90 34.21 50.08 0.689 0.16 0.10 34.70 34.96 46.00 1.010 0.16 0.10 32.40 32.66 46.00 * 1.586 0.16 0.12 35.60 35.88 46.00 4.813 0.29 0.17 23.00 23.46 46.00 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + LISN Factor + Cable loss. Page: 15 of 85
Product MEGABOOK Test Mode Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz),Adapter(LITE ON) Date of Test 2004/08/30 Test Site No.2 Shielded Room Test Condition Line 2 Test Range 0.15-30MHz Frequency Cable LISN Reading Measurement Limits Loss Factor Level Level MHz db db dbuv dbuv dbuv ============================================================== Quasi-Peak * 0.207 0.21 0.10 49.39 49.70 63.33 0.310 0.21 0.10 43.50 43.81 59.98 0.484 0.21 0.10 37.68 37.99 56.26 0.688 0.16 0.10 41.19 41.45 56.00 1.009 0.16 0.10 37.82 38.08 56.00 4.693 0.29 0.17 34.07 34.53 56.00 Average 0.207 0.21 0.10 42.10 42.41 53.33 0.310 0.21 0.10 35.90 36.21 49.98 0.484 0.21 0.10 27.70 28.01 46.27 * 0.688 0.16 0.10 35.30 35.56 46.00 1.009 0.16 0.10 30.20 30.46 46.00 4.693 0.29 0.17 23.90 24.36 46.00 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + LISN Factor + Cable loss. Page: 16 of 85
Product MEGABOOK Test Mode Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz),Adapter(LI SHIN) Date of Test 2004/08/04 Test Site No.2 Shielded Room Test Condition Line 1 Test Range 0.15-30MHz Frequency Cable LISN Reading Measurement Limits Loss Factor Level Level MHz db db dbuv dbuv dbuv ============================================================== Quasi-Peak 0.201 0.21 0.10 44.56 44.87 63.58 0.263 0.21 0.10 39.07 39.38 61.33 0.395 0.21 0.10 36.67 36.98 57.97 * 0.611 0.21 0.10 42.78 43.09 56.00 3.427 0.23 0.15 26.82 27.20 56.00 22.302 0.26 0.49 20.81 21.56 60.00 Average 0.201 0.21 0.10 38.20 38.51 53.58 0.263 0.21 0.10 30.20 30.51 51.33 0.395 0.21 0.10 27.00 27.31 47.97 * 0.611 0.21 0.10 34.00 34.31 46.00 3.427 0.23 0.15 18.50 18.88 46.00 22.302 0.26 0.49 14.80 15.55 50.00 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + LISN Factor + Cable loss. Page: 17 of 85
Product MEGABOOK Test Mode Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz),Adapter(LI SHIN) Date of Test 2004/08/04 Test Site No.2 Shielded Room Test Condition Line 2 Test Range 0.15-30MHz Frequency Cable LISN Reading Measurement Limits Loss Factor Level Level MHz db db dbuv dbuv dbuv ============================================================== Quasi-Peak 0.197 0.21 0.10 44.30 44.61 63.74 0.271 0.21 0.10 39.61 39.92 61.08 * 0.537 0.21 0.10 39.95 40.26 56.00 0.744 0.16 0.10 39.22 39.48 56.00 1.170 0.16 0.11 34.18 34.45 56.00 22.486 0.26 0.50 21.55 22.30 60.00 Average 0.197 0.21 0.10 34.60 34.91 53.74 0.271 0.21 0.10 32.20 32.51 51.08 * 0.537 0.21 0.10 29.80 30.11 46.00 0.744 0.16 0.10 28.60 28.86 46.00 1.170 0.16 0.11 23.70 23.97 46.00 22.486 0.26 0.50 15.00 15.75 50.00 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + LISN Factor + Cable loss. Page: 18 of 85
2.8. Test Photo Test Mode : Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz), Adapter(LITE ON) Description: Front View of Conducted Test-Mode1 Test Mode : Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz), Adapter(LITE ON) Description: Back View of Conducted Test-Mode1 Page: 19 of 85
Test Mode : Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz), Adapter(LI SHIN) Description: Front View of Conducted Test-Mode2 Test Mode : Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz), Adapter(LI SHIN) Description: Back View of Conducted Test-Mode2 Page: 20 of 85
3. Impedance Stabilization Network 3.1. Test Equipment List The following test equipment are used during the conducted emission test: Item Instrument Manufacturer Type No./Serial No Last Cal.. Remark 1 Test Receiver R & S ESCS 30/838251/001 Jan.,2004 2 L.I.S.N. R & S ESH3-Z5/836679/0023 May,2004 EUT 3 L.I.S.N. R & S ENV 4200/833209/0023 May,2004 Peripherals 4 Pulse Limiter R & S ESH3-Z2 May,2004 5 ISN SCHAFFNE T400/19099 Apr.,2004 6 No.2 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 3.2. Test Setup Page: 21 of 85
3.3. Limits Telecommunication ports EN 55022:1998+A1: 2000+A2:2003 Telecommunication ports Limits db(uv) Frequency MHz Limit for conducted emissions from telecommunication ports of equipment intended for use in telecommunication centers only Limit for conducted emissions from telecommunication ports QP AV QP AV 0.15 0.50 97-87 84-74 84-74 74-64 0.5 30 87 74 74 64 Remarks: In the above table, the tighter limit applies at the band edges. 3.4. Test Procedure Telecommunication Port: The mains voltage shall be supplied to the EUT via the LISN when the measurement of telecommunication port is performed. The common mode disturbances at the telecommunication port shall be connected to the ISN, which is 150 ohm impedance. Both alternative cables are tested related to the LCL requested. The measurement range is from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz. The 60dB LCL ISN is used for cat. 5 cable, 50dB LCL ISN is used for cat. 3 and 80dB LCL is used for alternative one.. 3.5. Uncertainty The measurement uncertainty is defined as ± 1.8 db 3.6. Test Specification According to EN 55022:1998+A1: 2000+A2:2003 Page: 22 of 85
3.7. Test Result Product MEGABOOK Test Mode Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz),Adapter(LITE ON) Date of Test 2004/08/20 Test Site No.2 Shielded Room Test Condition 100Mbps Test Range 0.15-30MHz Frequency Cable LISN Reading Measurement Limits Loss Factor Level Level MHz db db dbuv dbuv dbuv ============================================================== Quasi-Peak 0.305 0.04 9.50 38.33 47.87 78.11 3.954 0.19 9.50 40.57 50.26 74.00 5.908 0.22 9.50 47.67 57.39 74.00 7.925 0.25 9.50 52.27 62.02 84.00 16.228 0.33 9.50 57.72 67.55 84.00 * 29.235 0.40 9.50 59.61 69.51 84.00 Average 0.305 0.04 9.50 36.90 46.44 68.11 3.954 0.19 9.50 38.90 48.59 64.00 5.908 0.22 9.50 46.00 55.72 64.00 7.925 0.25 9.50 51.00 60.75 74.00 16.228 0.33 9.50 55.00 64.83 74.00 * 29.235 0.40 9.50 57.50 67.40 74.00 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + LISN Factor + Cable loss. Page: 23 of 85
Product MEGABOOK Test Mode Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz),Adapter(LITE ON) Date of Test 2004/08/20 Test Site No.2 Shielded Room Test Condition 10Mbps Test Range 0.15-30MHz Frequency Cable LISN Reading Measurement Limits Loss Factor Level Level MHz db db dbuv dbuv dbuv ============================================================== Quasi-Peak 0.305 0.04 9.50 38.31 47.85 78.11 0.610 0.07 9.50 37.72 47.29 74.00 * 4.892 0.20 9.50 43.85 53.55 74.00 10.060 0.28 9.50 52.90 62.68 84.00 20.000 0.35 9.50 41.05 50.90 84.00 25.037 0.38 9.50 35.33 45.21 84.00 Average 0.305 0.04 9.50 36.80 46.34 68.11 0.610 0.07 9.50 32.50 42.07 64.00 * 4.892 0.20 9.50 37.00 46.70 64.00 10.060 0.28 9.50 44.60 54.38 74.00 20.000 0.35 9.50 34.60 44.45 74.00 25.037 0.38 9.50 25.90 35.78 74.00 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + LISN Factor + Cable loss. Page: 24 of 85
Product MEGABOOK Test Mode Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz),Adapter(LITE ON) Date of Test 2004/08/20 Test Site No.2 Shielded Room Test Condition Telecom Test Range 0.15-30MHz Frequency Cable LISN Reading Measurement Limits Loss Factor Level Level MHz db db dbuv dbuv dbuv ============================================================== Quasi-Peak 0.237 0.02 9.50 48.37 57.89 80.19 0.304 0.04 9.50 47.61 57.15 78.14 * 2.048 0.14 9.50 44.58 54.22 74.00 4.096 0.19 9.50 38.35 48.04 74.00 6.143 0.22 9.50 28.24 37.96 74.00 25.229 0.38 9.50 23.55 33.43 74.00 Average 0.237 0.02 9.50 43.30 52.82 70.20 0.304 0.04 9.50 44.00 53.54 68.13 * 2.048 0.14 9.50 43.30 52.94 64.00 4.096 0.19 9.50 38.20 47.89 64.00 6.143 0.22 9.50 27.70 37.42 64.00 25.229 0.38 9.50 22.60 32.48 64.00 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + LISN Factor + Cable loss. Page: 25 of 85
3.8. Test Photo Test Mode : Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz), Adapter(LITE ON) Description: Front View of ISN Test Mode1 Test Mode : Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz), Adapter(LITE ON) Description: Back View of ISN Test Mode1 Page: 26 of 85
4. Radiated Emission 4.1. Test Equipment List The following test equipment are used during the radiated emission test: Test Site Equipment Manufacturer Model No./Serial No. Last Cal. OATS 2 Test Receiver R & S ESCS 30 / 836858 / 022 Jan.,2004 Note: Spectrum Analyzer Advantest R3162 / 100803482 May,2004 Bilog Antenna SCHAFFNER CBL6112B / 2705 Oct.,2003 Pre-Amplifier QTK QTK-AMP-01/ 0001 Jul.,2004 1. All equipments that need to be calibrate are with calibration period of 1 year. 2. Mark X test instruments are used to measure the final test results. 4.2. Test Setup Page: 27 of 85
4.3. Limits EN 55022: 1998+A1: 2000+A2:2003 Limits (dbuv/m) Frequency Class A Class B MHz Distance (m) dbuv/m Distance (m) dbuv/m 30 230 10 40 10 30 230 1000 10 47 10 37 Remarks: In the above table, the tighter limit applies at the band edges. 4.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 10 meters. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated according to EN 55022: 1998+A1: 2000+A2:2003 on radiated measurement. Radiated emissions were investigated over the frequency range from 30MHz to1ghz using a receiver bandwidth of 120kHz. Radiated measurement was performed at an antenna to EUT distance of 10 meters. 4.5. Uncertainty The measurement uncertainty is defined as ± 3.8 db 4.6. Test Specification According to EN 55022: 1998+A1: 2000+A2:2003 Page: 28 of 85
4.7. Test Result Product MEGABOOK Test Mode Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz),Adapter(LITE ON) Date of Test 2004/08/30 Test Site OATS 2 Test Condition Horizontal Test Range 30-1000MHz Freq. Cable Probe PreAMP Reading Measurement Margin Limit Loss Factor Level Level MHz db db/m db dbuv dbuv/m db dbuv/m ============================================================= Horizontal: 110.080 1.28 12.01 0.00 11.37 24.66 5.34 30.00 120.000 1.33 11.84 0.00 6.49 19.66 10.34 30.00 * 150.906 1.49 10.40 0.00 14.18 26.08 3.92 30.00 400.000 2.78 14.85 0.00 11.16 28.79 8.21 37.00 600.065 3.81 17.65 0.00 5.98 27.44 9.56 37.00 957.900 5.65 20.14 0.00 6.83 32.62 4.38 37.00 Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. *, means this data is the worst emission level. 3. Measurement Level = Reading Level + Probe Factor + Cable Loss. Page: 29 of 85
Product MEGABOOK Test Mode Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz),Adapter(LITE ON) Date of Test 2004/08/30 Test Site OATS 2 Test Condition Vertical Test Range 30-1000MHz Freq. Cable Probe PreAMP Reading Measurement Margin Limit Loss Factor Level Level MHz db db/m db dbuv dbuv/m db dbuv/m ========================================================== Vertical: * 110.200 1.28 11.12 0.00 11.83 24.23 5.77 30.00 150.896 1.49 9.28 0.00 6.44 17.22 12.78 30.00 162.975 1.56 8.47 0.00 10.33 20.36 9.64 30.00 282.622 2.17 12.31 0.00 7.79 22.27 14.73 37.00 400.007 2.78 16.45 0.00 11.96 31.19 5.81 37.00 600.063 3.81 19.54 0.00 7.66 31.02 5.98 37.00 Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. *, means this data is the worst emission level. 3. Measurement Level = Reading Level + Probe Factor + Cable Loss. Page: 30 of 85
Product MEGABOOK Test Mode Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz),Adapter(LI SHIN) Date of Test 2004/08/12 Test Site OATS 2 Test Condition Horizontal Test Range 30-1000MHz Freq. Cable Probe PreAMP Reading Measurement Margin Limit Loss Factor Level Level MHz db db/m db dbuv dbuv/m db dbuv/m ============================================================= Horizontal: 161.150 1.54 9.42 0.00 12.42 23.38 6.62 30.00 202.400 1.75 8.54 0.00 13.10 23.39 6.61 30.00 250.000 2.00 11.81 0.00 14.30 28.11 8.89 37.00 480.037 3.19 16.70 0.00 11.05 30.94 6.06 37.00 720.080 4.42 18.32 0.00 5.84 28.59 8.41 37.00 * 797.000 4.82 19.57 0.00 7.64 32.03 4.97 37.00 960.102 5.66 20.14 0.00 5.58 31.37 5.63 37.00 Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. *, means this data is the worst emission level. 3. Measurement Level = Reading Level + Probe Factor + Cable Loss. Page: 31 of 85
Product MEGABOOK Test Mode Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz),Adapter(LI SHIN) Date of Test 2004/08/12 Test Site OATS 2 Test Condition Vertical Test Range 30-1000MHz Freq. Cable Probe PreAMP Reading Measurement Margin Limit Loss Factor Level Level MHz db db/m db dbuv dbuv/m db dbuv/m ========================================================== Vertical: * 111.180 1.29 11.12 0.00 14.25 26.66 3.34 30.00 120.000 1.33 10.36 0.00 11.71 23.40 6.60 30.00 160.100 1.54 8.68 0.00 14.92 25.14 4.86 30.00 202.400 1.75 8.53 0.00 12.33 22.61 7.39 30.00 250.000 2.00 11.86 0.00 14.95 28.81 8.19 37.00 480.038 3.19 16.40 0.00 7.46 27.05 9.95 37.00 797.200 4.82 19.32 0.00 8.38 32.52 4.48 37.00 960.102 5.66 20.43 0.00 3.32 29.41 7.59 37.00 Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. *, means this data is the worst emission level. 3. Measurement Level = Reading Level + Probe Factor + Cable Loss. Page: 32 of 85
4.8. Test Photo Test Mode : Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz), Adapter(LITE ON) Description: Front View of Radiated Test- Mode 1 Test Mode : Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz), Adapter(LITE ON) Description: Back View of Radiated Test- Mode 1 Page: 33 of 85
Test Mode : Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz), Adapter(LI SHIN) Description: Front View of Radiated Test- Mode 2 Test Mode : Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz), Adapter(LI SHIN) Description: Back View of Radiated Test- Mode 2 Page: 34 of 85
5. Power Harmonics 5.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Power Harmonics Tester SCHAFFNER Profline 2105-400 S/N: HK54148 Feb.,2004 2 Analyzer SCHAFFNER CCN 1000-1/X71887 Feb.,2004 3 No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 5.2. Test Setup Page: 35 of 85
5.3. Limits Limits of Class A Harmonics Currents Harmonics Maximum Permissible Order harmonic current A n Odd harmonics Harmonics Order n Maximum Permissible harmonic current A Even harmonics 3 2.30 2 1.08 5 1.14 4 0.43 7 0.77 6 0.30 9 0.40 8 n 40 0.23 * 8/n 11 0.33 13 0.21 15 n 39 0.15 * 15/n Limits of Class B Harmonics Currents For Class B equipment, the harmonic of the input current shall not exceed the maximum permissible values given in table which is the limit of Class A multiplied by a factor of 1.5. Limits of Class C Harmonics Currents Harmonics Order n Maximum Permissible harmonic current Expressed as a percentage of the input current at the fundamental frequency % 2 2 3 30.λ * 5 10 7 7 9 5 11 n 39 (odd harmonics only) *λ is the circuit power factor 3 Page: 36 of 85
Limits of Class D Harmonics Currents Harmonics Order n Maximum Permissible harmonic current per watt ma/w Maximum Permissible harmonic current A 3 3.4 2.30 5 1.9 1.14 7 1.0 0.77 9 0.5 0.40 11 0.35 0.33 11 n 39 (odd harmonics only) 3.85/n See limit of Class A 5.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed. 5.5. Uncertainty The measurement uncertainty is defined as ± 3.23 % 5.6. Test Specification According to EN 61000-3-2:2000 Page: 37 of 85
5.7. Test Result Product MEGABOOK Test Mode Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz),Adapter(LITE ON) Date of Test 2004/08/06 Test Site No.3 Shielded Room Test Condition Test Range Owing to the EUT with a less than 75W of rated power, this test item is not performed Page: 38 of 85
Product MEGABOOK Test Mode Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz),Adapter(LI SHIN) Date of Test 2004/08/06 Test Site No.3 Shielded Room Test Condition Test Range Owing to the EUT with a less than 75W of rated power, this test item is not performed Page: 39 of 85
5.8. Test Photo Test Mode : Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz), Adapter(LITE ON) Description: Power Harmonics Test Setup -Mode 1 Test Mode : Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz), Adapter(LI SHIN) Description: Power Harmonics Test Setup -Mode 2 Page: 40 of 85
6. Voltage Fluctuation and Flicker 6.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Power Harmonics Tester SCHAFFNER Profline 2105-400 S/N: HK54148 Feb.,2004 2 Analyzer SCHAFFNER CCN 1000-1/X71887 Feb.,2004 3 No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 6.2. Test Setup Page: 41 of 85
6.3. Limits Voltage Fluctuations and Flicker: The following limits apply: - the value of P st shall not be greater than 1.0; - the value of P 1t shall not be greater than 0.65; - the value of d(t) during a voltage change shall not exceed 3.3 % for more than 500 ms; - the relative steady-state voltage change, d c, shall not exceed 3.3 %; - the maximum relative voltage change, d max, shall not exceed; a) 4 % without additional conditions; b) 6 % for equipment which is: - switched manually, or - switched automatically more frequently than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds), or manual restart, after a power supply interruption. NOTE The cycling frequency will be further limited by the P st and P 1t limit. For example: a d max of 6%producing a rectangular voltage change characteristic twice per hour will give a P 1t of about 0.65. c) 7 % for equipment which is: - attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment such as mixers, garden equipment such as lawn mowers, portable tools such as electric drills), or - switched on automatically, or is intended to be switched on manually, no more than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds) or manual restart, after a power supply interruption. P st and P 1t requirements shall not be applied to voltage changes caused by manual switching. 6.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed. 6.5. Uncertainty The measurement uncertainty is defined as ± 3.23 % 6.6. Test Specification According to EN 61000-3-3:1995+A1:2001 Page: 42 of 85
6.7. Test Result Product MEGABOOK Test Mode Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz),Adapter(LITE ON) Date of Test 2004/08/06 Test Site No.3 Shielded Room Test Condition Test Range Test Result: Pass Status: Test Completed Pst i and limit line European Limits 1.00 0.75 Pst 0.50 0.25 0.00 1:11:44 Time is too short for Plt plot Parameter values recorded during the test: Vrms at the end of test (Volt): 229.77 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.001 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.001 Test limit: 0.650 Pass Page: 43 of 85
Product MEGABOOK Test Mode Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz),Adapter(LI SHIN) Date of Test 2004/08/06 Test Site No.3 Shielded Room Test Condition Test Range Test Result: Pass Status: Test Completed Pst i and limit line European Limits 1.00 0.75 Pst 0.50 0.25 0.00 1:30:28 Time is too short for Plt plot Parameter values recorded during the test: Vrms at the end of test (Volt): 229.74 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.001 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.001 Test limit: 0.650 Pass Page: 44 of 85
6.8. Test Photo Test Mode : Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz), Adapter(LITE ON) Description: Flicker Test Setup -Mode 1 Test Mode : Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz), Adapter(LI SHIN) Description: Flicker Test Setup -Mode 2 Page: 45 of 85
7. Electrostatic Discharge (ESD) 7.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 ESD Simulator System KeyTek MZ-15/EC S/N:0112372 Mar.,2004 2 Horizontal Coupling Plane(HCP) 3 Vertical Coupling Plane(VCP) QuieTek HCP AL50 N/A QuieTek VCP AL50 N/A 4 No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 7.2. Test Setup Page: 46 of 85
7.3. Limits Item Environmental Phenomena Units Test Specification Performance Criteria Enclosure Port Electrostatic Discharge Kv (Charge Voltage) ±8 Air Discharge B ±4 Contact Discharge Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. 7.4. Test Procedure Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT. Indirect application of discharges to the EUT: Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. 7.5. Uncertainty The measurement uncertainty is defined as ± 6.003 % 7.6. Test Specification According to IEC 61000-4-2:1995 +A1:1998+A2:2000 Page: 47 of 85
7.7. Test Result Product MEGABOOK Test Mode Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz),Adapter(LITE ON) Date of Test 2004/07/30 Test Site No.3 Shielded Room Test Condition Test Range Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge 10 10 +8kV -8kV B B B B Pass Pass Contact Discharge 25 25 +4kV -4kV B B B B Pass Pass Indirect Discharge 50 +4kV B A Pass (HCP) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Front) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Left) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Back) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Right) 50-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 48 of 85
Product MEGABOOK Test Mode Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz),Adapter(LI SHIN) Date of Test 2004/07/30 Test Site No.3 Shielded Room Test Condition Test Range Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge 10 10 +8kV -8kV B B B B Pass Pass Contact Discharge 25 25 +4kV -4kV B B B B Pass Pass Indirect Discharge 50 +4kV B A Pass (HCP) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Front) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Left) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Back) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Right) 50-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 49 of 85
7.8. Test Photo Test Mode : Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz), Adapter(LITE ON) Description: ESD Test Setup -Mode 1 Test Mode : Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz), Adapter(LI SHIN) Description: ESD Test Setup -Mode 2 Page: 50 of 85
8. Radiated Susceptibility (RS) 8.1. Test Equipment List The following test equipment are used during the test: Item Equipment Manufacturer Model No. / Serial No. Last Cal. 1 Signal Generator R & S SYM02 / 825454/029 Jan.,2004 2 Power Amplifier A & R 100W10000M7 / A285000010 N/A 3 RF Power Amplifier OPHIRRF 5022F / 1075 N/A 4 Bilog Antenna Chase CBL6112B / 2452 Sep.,2003 5 Power Meter R & S NRVD / 100219 Sep.,2003 6 Directional Coupler A & R DC6180 / 22735 Feb.,2004 7 No.2 EMC Fully Chamber Jul.,2004 Note: All equipment upon which need to calibrated are with calibration period of 1 year. 8.2. Test Setup Page: 51 of 85
8.3. Limits Item Environmental Phenomena Enclosure Port Radio-Frequency Electromagnetic Field Amplitude Modulated Units MHz V/m(Un-modulated, rms) % AM (1kHz) Test Specification 80-1000 3 80 Performance Criteria A 8.4. Test Procedure The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. Both horizontal and vertical polarization of the antenna and six sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD camera is used to monitor EUT screen. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 3 V/M Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 80MHz - 1000MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s 8.5. Uncertainty The measurement uncertainty is defined as ± 6.17 % 8.6. Test Specification According to IEC 61000-4-3:1995+A1:1998+A2:2000 Page: 52 of 85
8.7. Test Result Product MEGABOOK Test Mode Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz),Adapter(LITE ON) Date of Test 2004/08/10 Test Site Chamber2 Test Condition Test Range 80-1000MHz Field Complied To Frequency Position Polarity Required Strength Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results 80-1000 FRONT H 3 A A PASS 80-1000 FRONT V 3 A A PASS 80-1000 BACK H 3 A A PASS 80-1000 BACK V 3 A A PASS 80-1000 RIGHT H 3 A A PASS 80-1000 RIGHT V 3 A A PASS 80-1000 LEFT H 3 A A PASS 80-1000 LEFT V 3 A A PASS 80-1000 UP H 3 A A PASS 80-1000 UP V 3 A A PASS 80-1000 DOWN H 3 A A PASS 80-1000 DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 53 of 85
Product MEGABOOK Test Mode Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz),Adapter(LI SHIN) Date of Test 2004/08/10 Test Site Chamber2 Test Condition Test Range 80-1000MHz Field Complied To Frequency Position Polarity Required Strength Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results 80-1000 FRONT H 3 A A PASS 80-1000 FRONT V 3 A A PASS 80-1000 BACK H 3 A A PASS 80-1000 BACK V 3 A A PASS 80-1000 RIGHT H 3 A A PASS 80-1000 RIGHT V 3 A A PASS 80-1000 LEFT H 3 A A PASS 80-1000 LEFT V 3 A A PASS 80-1000 UP H 3 A A PASS 80-1000 UP V 3 A A PASS 80-1000 DOWN H 3 A A PASS 80-1000 DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 54 of 85
8.8. Test Photo Test Mode : Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz), Adapter(LITE ON) Description: Radiated Susceptibility Test Setup -Mode 1 Test Mode : Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz), Adapter(LI SHIN) Description: Radiated Susceptibility Test Setup -Mode 2 Page: 55 of 85
9. Electrical Fast Transient/Burst (EFT/B) 9.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Fast Transient/Burst Generator SCHAFFNER NSG 2050 S/N: 200124-031AR Nov.,2003 2 No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 9.2. Test Setup Page: 56 of 85
9.3. Limits Item Environmental Phenomena Units Test Specification Performance Criteria Signal Ports and Telecommunication Ports Fast Transients kv (Peak) Common Mode Tr/Ts ns Rep. Frequency khz Input DC Power Ports Fast Transients Common Mode Input AC Power Ports Fast Transients Common Mode kv (Peak) Tr/Ts ns Rep. Frequency khz kv (Peak) Tr/Ts ns Rep. Frequency khz ±0.5 5/50 5 ±0.5 5/50 5 ±1 5/50 5 B B B 9.4. Test Procedure The EUT and load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. For Signal Ports and Telecommunication Ports: The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1min. For Input DC and AC Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 min. The length of power cord between the coupling device and the EUT shall be 1m. 9.5. Uncertainty The measurement uncertainty is defined as ± 8.80 % 9.6. Test Specification According to IEC 61000-4-4:1995+A1:2000+A2:2001 Page: 57 of 85
9.7. Test Result Product MEGABOOK Test Mode Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz),Adapter(LITE ON) Date of Test 2004/08/07 Test Site No.3 Shielded Room Test Condition Test Range Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L ± 1kV 60 CDN B B PASS N ± 1kV 60 CDN B B PASS PE ± 1kV 60 CDN B B PASS L-N ± 1kV 60 CDN B B PASS L-PE ± 1kV 60 CDN B B PASS N-PE ± 1kV 60 CDN B B PASS L+N+PE ± 1kV 60 CDN B B PASS LAN ± 0.5kV 90 Clamp B A PASS Telecom ± 0.5kV 90 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 58 of 85
Product MEGABOOK Test Mode Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz),Adapter(LI SHIN) Date of Test 2004/08/07 Test Site No.3 Shielded Room Test Condition Test Range Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L ± 1kV 60 CDN B B PASS N ± 1kV 60 CDN B B PASS PE ± 1kV 60 CDN B B PASS L-N ± 1kV 60 CDN B B PASS L-PE ± 1kV 60 CDN B B PASS N-PE ± 1kV 60 CDN B B PASS L+N+PE ± 1kV 60 CDN B B PASS LAN ± 0.5kV 90 Clamp B A PASS Telecom ± 0.5kV 90 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 59 of 85
9.8. Test Photo Test Mode : Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz), Adapter(LITE ON) Description: EFT/B Test Setup -Mode 1 Test Mode : Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz), Adapter(LITE ON) Description: EFT/B Test Setup -Mode 1-Clamp Page: 60 of 85
Test Mode : Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz), Adapter(LI SHIN) Description: EFT/B Test Setup -Mode 2 Test Mode : Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz), Adapter(LI SHIN) Description: EFT/B Test Setup -Mode 2-Clamp Page: 61 of 85
10. Surge 10.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Surge Generator SCHAFFNER NSG 2050 S/N: 200124-031AR Nov.,2003 2 No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 10.2. Test Setup Page: 62 of 85
10.3. Limits Item Environmental Phenomena Units Test Specification Performance Criteria Signal Ports and Telecommunication Ports (See 1) and 2)) Surges Tr/Ts us 1.2/50 (8/20) Line to Ground kv ± 1 B Input DC Power Ports Surges Line to Ground Tr/Ts us kv AC Input and AC Output Power Ports Surges Tr/Ts us Line to Line kv Line to Ground kv 1.2/50 (8/20) ± 0.5 B 1.2/50 (8/20) ± 1 ± 2 Notes: 1) Applicable only to ports which according to the manufacturer s may directly to outdoor cables. 2) Where normal functioning cannot be achieved because of the impact of the CDN on the EUT,no test shall be required. B 10.4. Test Procedure The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Input and Output AC Power or DC Input and DC Output Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 0 0, 90 0, 180 0, 270 0 and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min. 10.5. Uncertainty The measurement uncertainty is defined as ± 7.93 % 10.6. Test Specification According to IEC 61000-4-5:1995+A1:2000 Page: 63 of 85
10.7. Test Result Product MEGABOOK Test Mode Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz),Adapter(LITE ON) Date of Test 2004/08/10 Test Site No.3 Shielded Room Test Condition Test Range Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 64 of 85
Product MEGABOOK Test Mode Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz),Adapter(LI SHIN) Date of Test 2004/08/10 Test Site No.3 Shielded Room Test Condition Test Range Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 65 of 85
10.8. Test Photo Test Mode : Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz), Adapter(LITE ON) Description: SURGE Test Setup-Mode 1 Report No: 048L041E Test Mode : Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz), Adapter(LI SHIN) Description: SURGE Test Setup-Mode 2 Page: 66 of 85
11. Conducted Susceptibility (CS) 11.1. Test Equipment List The following test equipment are used during the test: Item Equipment Manufacturer Model No. / Serial No. Last Cal. 1 Signal Generator R & S SYM01 / 10065 Jan.,2004 2 Power Amplifier A & R 150A220 / 23076 N/A 3 Power Meter HP EPM-4418A / GB37482040 Feb.,2004 4 Power Sensor Agilent 8482A / MY41091031 Aug.,2004 5 Directional Coupler A & R DC2600 / 23325 Feb.,2004 6 CDN Lüthi CDN L-801 M1 / 2047 Jun.,2004 7 CDN Lüthi CDN L-801 M2/M3 / 2043 Jun.,2004 8 FIXED PAD TRILITHIC HFP-525-3/6-NF/NF / N/A N/A 9 EM Clamp Lüthi EM101 / 3552C Apr.,2004 10 No.2 EMC Fully Chamber N/A Note: All equipment upon which need to calibrated are with calibration period of 1 year. 11.2. Test Setup Page: 67 of 85
11.3. Limits Item Environmental Phenomena Units Signal Ports and Telecommunication Ports MHz Radio-Frequency V (rms, Continuous Conducted Un-modulated) % AM (1kHz) Input DC Power Ports Radio-Frequency Continuous Conducted Input AC Power Ports Radio-Frequency Continuous Conducted MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) Test Specification Performance Criteria 0.15-80 3 80 0.15-80 3 80 0.15-80 3 80 A A A Page: 68 of 85
11.4. Test Procedure The EUT are placed on a table that is 0.8 meter height, and a ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 130dBuV(3V) Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 0.15MHz 80MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s. 11.5. Uncertainty The measurement uncertainty is defined as ± 6.17 % 11.6. Test Specification According to IEC 61000-4-6:1996+A1:2000 Page: 69 of 85
11.7. Test Result Product MEGABOOK Test Mode Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz),Adapter(LITE ON) Date of Test 2004/08/10 Test Site Chamber2 Test Condition Test Range 0.15-80MHz Frequency Voltage Inject Tested Port of Required Performance Result Range Applied Method EUT Criteria Criteria Complied (MHz) dbuv(v) To 0.15~80 130 (3V) CDN AC IN A A PASS 0.15~80 130 (3V) Clamp LAN A A PASS 0.15~80 130 (3V) Clamp Telecom A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 70 of 85
Product MEGABOOK Test Mode Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz),Adapter(LI SHIN) Date of Test 2004/08/10 Test Site Chamber2 Test Condition Test Range 0.15-80MHz Frequency Voltage Inject Tested Port of Required Performance Result Range Applied Method EUT Criteria Criteria Complied (MHz) dbuv(v) To 0.15~80 130 (3V) CDN AC IN A A PASS 0.15~80 130 (3V) Clamp LAN A A PASS 0.15~80 130 (3V) Clamp Telecom A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 71 of 85
11.8. Test Photo Test Mode : Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz), Adapter(LITE ON) Description: Conducted Susceptibility Test Setup -Mode 1 Test Mode : Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz), Adapter(LITE ON) Description: Conducted Susceptibility Test Setup -Mode 1-Clamp Page: 72 of 85
Test Mode : Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz), Adapter(LI SHIN) Description: Conducted Susceptibility Test Setup -Mode 2 Test Mode : Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz), Adapter(LI SHIN) Description: Conducted Susceptibility Test Setup -Mode 2-Clamp Page: 73 of 85
12. Power Frequency Magnetic Field 12.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Power Line Maganetics SCHAFFNER INA 2141 S/N: 6002 Jun.,2004 2 Gauss Meter F.W.BELL 4090 Jun.,2004 3 Magnetic Field Coil SCHAFFNER INA702 Jun.,2004 S/N: 199749-020 IN 4 No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 12.2. Test Setup Page: 74 of 85
12.3. Limits Item Environmental Phenomena Units Test Specification Performance Criteria Enclosure Port Power-Frequency Magnetic Field Hz A/m (r.m.s.) 50 1 A 12.4. Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured at least 1m*1m min. The test magnetic field shall be placed at central of the induction coil. The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT. And the induction coil shall be rotated by 90 in order to expose the EUT to the test field with different orientation (X, Y, Z Orientations). 12.5. Uncertainty The measurement uncertainty is defined as ± 3.23 % 12.6. Test Specification According to IEC 61000-4-8:1993+A1:2000 Page: 75 of 85
12.7. Test Result Product MEGABOOK Test Mode Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz),Adapter(LITE ON) Date of Test 2004/08/10 Test Site No.3 Shielded Room Test Condition Test Range Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 76 of 85
Product MEGABOOK Test Mode Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz),Adapter(LI SHIN) Date of Test 2004/08/10 Test Site No.3 Shielded Room Test Condition Test Range Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 77 of 85
12.8. Test Photo Test Mode : Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz), Adapter(LITE ON) Description: Power Frequency Magnetic Field Test Setup -Mode 1 Test Mode : Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz), Adapter(LI SHIN) Description: Power Frequency Magnetic Field Test Setup -Mode 2 Page: 78 of 85
13. Voltage Dips and Interruption Measurement 13.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Voltage Dips Generator SCHAFFNER NSG 2050 S/N: 200124-031AR Nov.,2003 2 No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 13.2. Test Setup Page: 79 of 85
13.3. Limits Item Environmental Phenomena Units Test Specification Performance Criteria Input AC Power Ports Voltage Dips Voltage Interruptions >95 0.5 30 25 > 95 250 % Reduction Period % Reduction Periods % Reduction Periods B C C 13.4. Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The power cord shall be used the shortest power cord as specified by the manufacturer. For Voltage Dips/ Interruptions test: The selection of test voltage is based on the rated power range. If the operation range is large than 20% of lower power range, both end of specified voltage shall be tested. Otherwise, the typical voltage specification is selected as test voltage. The EUT is connected to the power mains through a coupling device that directly couples to the Voltage Dips and Interruption Generator. The EUT shall be tested for 30% voltage dip of supplied voltage and duration 10ms, for 60% voltage dip of supplied voltage and duration 100ms with a sequence of three voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied voltage and duration 5000ms with a sequence of three voltage interruptions with intervals of 10 seconds. Voltage phase shifting are shall occur at 0 O, 45 O, 90 O, 135 O, 180 O, 225 O, 270 O, 315 O of the voltage. 13.5. Uncertainty The measurement uncertainty is defined as ± 2.03 % 13.6. Test Specification According to IEC 61000-4-11:1994+A1:2000 Page: 80 of 85
13.7. Test Result Product Test Mode MEGABOOK Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz),Adapter(LITE ON) Date of Test 2004/08/10 Test Site No.3 Shielded Room Test Condition Test Range Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Criteria Complied To Test Result 30(161V) 0 25 C A PASS 30(161V) 45 25 C A PASS 30(161V) 90 25 C A PASS 30(161V) 135 25 C A PASS 30(161V) 180 25 C A PASS 30(161V) 225 25 C A PASS 30(161V) 270 25 C A PASS 30(161V) 315 25 C A PASS >95(0V) 0 0.5 B A PASS >95(0V) 45 0.5 B A PASS >95(0V) 90 0.5 B A PASS >95(0V) 135 0.5 B A PASS >95(0V) 180 0.5 B A PASS >95(0V) 225 0.5 B A PASS >95(0V) 270 0.5 B A PASS >95(0V) 315 0.5 B A PASS >95(0V) 0 250 C A PASS >95(0V) 45 250 C A PASS >95(0V) 90 250 C A PASS >95(0V) 135 250 C A PASS >95(0V) 180 250 C A PASS >95(0V) 225 250 C A PASS >95(0V) 270 250 C A PASS >95(0V) 315 250 C A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 81 of 85
Product Test Mode MEGABOOK Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz),Adapter(LI SHIN) Date of Test 2004/08/10 Test Site No.3 Shielded Room Test Condition Test Range Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Criteria Complied To Test Result 30(161V) 0 25 C A PASS 30(161V) 45 25 C A PASS 30(161V) 90 25 C A PASS 30(161V) 135 25 C A PASS 30(161V) 180 25 C A PASS 30(161V) 225 25 C A PASS 30(161V) 270 25 C A PASS 30(161V) 315 25 C A PASS >95(0V) 0 0.5 B A PASS >95(0V) 45 0.5 B A PASS >95(0V) 90 0.5 B A PASS >95(0V) 135 0.5 B A PASS >95(0V) 180 0.5 B A PASS >95(0V) 225 0.5 B A PASS >95(0V) 270 0.5 B A PASS >95(0V) 315 0.5 B A PASS >95(0V) 0 250 C A PASS >95(0V) 45 250 C A PASS >95(0V) 90 250 C A PASS >95(0V) 135 250 C A PASS >95(0V) 180 250 C A PASS >95(0V) 225 250 C A PASS >95(0V) 270 250 C A PASS >95(0V) 315 250 C A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 82 of 85
13.8. Test Photo Test Mode : Mode 1:Intel Pentium M 1.7GHz,LCD+CRT(1280*800/60Hz), Adapter(LITE ON) Description: Voltage Dips Test Setup -Mode 1 Test Mode : Mode 2:Intel Pentium M 1.5GHz,LCD+CRT(1280*800/60Hz), Adapter(LI SHIN) Description: Voltage Dips Test Setup -Mode 2 Page: 83 of 85
Attachement EUT Photograph Page: 84 of 85
(1) EUT Photo (2) EUT Photo Page: 1
(3) EUT Photo (4) EUT Photo Page: 2
(5) EUT Photo (6) EUT Photo Page: 3
(7) EUT Photo (8) EUT Photo Page: 4
(9) EUT Photo (10) EUT Photo Page: 5
(11) EUT Photo (12) EUT Photo Page: 6