A CMOS TEMPERATURE SENSOR WITH -60OC TO 150OC SENSING RANGE AND ±1.3OC INACCURACY

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A CMOS EMPERAURE SENSOR WH -60OC O 150OC SENSNG RANGE AN ±1.3OC NACCURACY Subhra Chakraborty, Abhishek Pandey and Vijay Nath epartment of Electronics and Communication Engineering, Birla nstitute of echnology, Mesra Ranchi, Jharkhand, ndia E-Mail: subhra.chakbty@gmail.com ABSRAC An energy efficient temperature sensor for constant temperature monitoring has been introduced in this paper. he proposed sensor doesn t use BJ for sensing; instead it utilizes the temperature dependency of threshold voltage of MOSFEs for designing of this sensor. he sensor circuit is designed with separate biasing circuit for limiting the power dissipation of the circuit. Both PA and CA voltages has been extracted from the circuit. he proposed temperature sensor is simulated in Cadence Analog esign Environment with UMC90nm library. he circuit has been designed for the range of -60 o C to 150 o C. he simulation result shows an inaccuracy of ±1.3 o C and 862nW power consumption. Keywords: temperature sensor, low power, nano watt, sub-threshold, high range, temperature to voltage. NROUCON he level of integration of electronic systems is increasing day by day. Most integrated electronic systems consist of on chip smart sensors for constantly monitoring the physical condition of the chip. Among these physical parameters temperature is the most important parameter to be constantly monitored. his is because keeping the temperature of a circuit in check not only reduces thermal damage but also increases the reliability of the system. And above all self heating of a circuit significantly increases the power consumption of the circuit. As the level of integration increases the self heating phenomenon of the chip becomes more prominent. t is known that today the processors are highly integrated and they require cooling paste and fan for its heat control. he temperature of the processor is sensed using an onchip thermal diode [1]. But the conditioning and monitoring circuit for the diode is off-chip. his off-chip circuit is used for controlling the fan speed. n the past many temperature sensors have been designed and reported. he reported temperature sensors have different ranges and accuracy. he designing of temperature sensors in CMOS technology usually utilize three common techniques: - (i) BJ (ii) inverter delay (iii) hreshold voltage. n the BJ based sensors the PA or CA characteristics are extracted from base emitter junction by forward biasing it [2-4]. his type of temperature sensors are known for producing accurate results. But since this type of sensors use at least two PNP transistors, the area of the chip increases. CMOS temperature sensor based on the delay in propagation of signal through inverters has also been implemented by many research groups [5-8]. his same technique can be also be implemented in another way by measuring the variation in frequency of oscillation caused by variation in temperature. Both of these kinds of sensors require a larger chip area and produces difficulty in attaining linearity for higher range. he temperature sensors based on the threshold voltage of MOSFEs are known for their lower power consumption and smaller die area [9-11]. hese types of sensors utilize the fact that the threshold voltage of MOSFE varies with temperature. he voltage or current across MOSFEs always varies with the temperature, but the challenge in designing these types of sensors is to linearize this variation. his task is accomplished by proper selection of circuit architecture and adjusting W/L ratio of the transistors used so that the non-linearity can be reduced. wo types of curves can be obtained from this type of temperature sensor, PA (Proportional to Absolute emperature) and CA (Complementary o Absolute emperature) [12]. f a circuit can produce both type of curve, then both the signals can be used to produce a highly reliable result using signal conditioning. A similar technique has been used for designing the circuit proposed in this paper. he rest of this paper has been organized as follows. he characteristic of MOSFE operating in subthreshold region is given in Section. Section describes the methodology and architecture of the proposed temperature sensor. he simulation result and discussion has been summarized in Section V. Finally, the conclusion of the overall paper is illustrated in Section V. MOSFE N SUB-HRESHOL REGON Sometimes the MOSFEs are considered in switched off condition below cut-off, but in reality the current through MOSFEs decrease exponentially below cut-off. he general equations for MOSFEs are designed for operating in the linear and saturation region. he equation of MOSFE in sub-threshold is quite different from the equations for linear and saturation region. For a NMOS operating in sub-threshold region, the current flowing through it can be given by [13] VGS Vth VS VGS Vth mv V W mv W e e e L 0 1 L 0 (1) k Where, V B q W = Width of the MOSFE. 3588

L = Length of the MOSFE. V GS = Gate to source voltage applied to the transistor. V S = rain to source voltage applied to the transistor. o = Process dependent parameter. V th = hreshold voltage. m = Sub-threshold slope parameter. k B = Boltzmann constant. q = Elementary charge. = Absolute temperature. Again the V th can be written as V th V th N A 0 2V ln (2) ni Where, V th0 = hreshold voltage at zero body to source voltage. N A = Carrier concentration. n i = ntrinsic carrier concentration. When the threshold voltage V th is considered, another important phenomenon comes into play, called the BL (drain-induced barrier lowering) effect. At high drain voltages a reduced threshold voltage is encountered due to this effect. Using the above written current equation, the trans-conductance and drain-source resistance of NMOS in sub-threshold region can be given as. g m (3) VGS mv as active resistors. hese transistors have been connected in differential connection to utilize the difference in current flow with respect to temperature using current mirror through transistors M3, M4 and M9, M10. his same current mirror helps in obtaining the voltage due to difference in current flow. he current mirror used in this circuit doesn t actually mirror the current flowing in one of the sides to another, but it actually mirrors the amplified or attenuated current with respect to the W/L ratio of the transistors. his is done so that a linear result can be obtained from output. he W/L ratios of the transistors configured as active resistors are also suitably adjusted for linearization of the output voltages. he transistors connected above and below the differential connection M5, M6 and M11, M12 are important in terms of controlling the output voltage range of the sensor with respect to the temperature range. his output voltage range is given by the W/L ratios of these transistors. But again these transistors also control the power consumption of the circuit with the help of the biasing transistors Mb1, Mb2, Mb3, Mb4, Mb5 and Mb6. hese many transistors have been connected in series to reduce the biasing current of the circuit. he biasing current for any threshold voltage based temperature sensor should be optimized properly because it not only limits the power consumption of the circuit but also defines the upper limit of the temperature to be sensed. For these designs the power supply voltages are also important because they also can limit the temperature sensing range. r d V (4) S mv Where, λ = BM coefficient. PROPOSE EMPERAURE SENSOR When a MOS transistor is configured as an active resistor, if its small signal model is considered, the resistance exhibited by the transistor is 1/g m. And while operating in sub-threshold region the output resistance of the MOSFE can be written as r o mv m k B 1 (5) g q m From the above equation it can be concluded that the output resistance of a MOSFE configured as an active resistor is directly related to its temperature. n the proposed temperature sensor circuit given in Fig.1 both PA (Proportional to Absolute emperature) and CA (Complementary to Absolute emperature) voltages has been extracted. n the proposed design the transistors M1, M2, M7 and M8 are configured Figure-1. Proposed temperature sensor. SMULAON RESULS he temperature sensor proposed in this paper has been simulated in Analog esign Environment of Cadence using UMC90nm library. he proposed circuit uses a ±0.5V supply. Both PA and CA characteristics have been extracted from the circuit, however the CA characteristics shows superior results than PA. he proposed circuit has been designed for sensing temperature from -60 o C to 150 o C. he PA voltage, Vptat gives an output voltage of -88.0683mV at - 60 o C and 236.665mV at 150 o C. he sensitivity for Vptat is 1.54635mV/ o C. he CA voltage, Vctat shows an output 3589

voltage of 100.595mV to -157.838mV for the temperature range of -60 o C to 150 o C with a sensitivity of 1.23063mV/ o C. Both Vptat and Vctat curves has been shown in Figure-2. much better result in terms of accuracy. he error curves for both Vptat and Vctat are given in Figure-3. he circuit has been simulated at different process corners to get the worst operating conditions. he circuit has been simulated in five different process corners tt, ss, ff, snfp and fnsp. he simulation result is shown in Fig. 4. From the result it can be observed that the ff and snfp corner shows the worst result for the designed circuit. t is known that the power consumption of any CMOS circuit increases with increasing temperature. Figure-2. Vptat and Vctat of the proposed temperature sensor. Figure-4. Vptat and Vctat at different process corners. Figure-3. Vptat error and Vctat error of the proposed temperature sensor. he inaccuracy of any temperature sensor is given as the maximum deviation from actual value at any given temperature in between the specified range of the sensor. For the specified range of the given sensor the Vptat shows an inaccuracy of ±2.13 o C, while the Vctat shows a lower inaccuracy of ±1.3 o C. So, the Vctat shows a able-5. Power consumption of the proposed temperature sensor. 3590

able-1. Performance comparison of proposed sensor with previously designed temperature sensors table type styles. Parameter [9] [14] [15] [16] [12] Proposed circuit echnology (nm) 1000 180 90 180 180 90 Power supply 1 1 1 0.6-2.5-1 (V) emperature range ( o C) +10 to +100 naccuracy ( o C) +1 Power consumption (W) -10 to +30 +0.8, - 1 +50 to +125 +0.8, - 1 +10 to +120 +2-45 to +85 +1.8, - 0.9-60 to +150 +1.3 100u 119n 25u 7n 478u 862n he overall resultant power dissipation of the proposed sensor with increasing temperature is given in Figure-5. he curve shows maximum power dissipation of 862nW at 150 o C and 216nW at room temperature. n able-1 the proposed temperature sensor has been compared with previously designed circuits. he Vctat from the designed sensor is chosen for comparison as it produces better result than Vptat. From the table it can be observed that the circuit senses for a larger range. Generally for CMOS temperature sensor utilizing threshold voltage of MOSFE for sensing, the inaccuracy increases with range. But, the proposed design keeps the inaccuracy in check, well within ±1.3 o C. Also the power consumption of the circuit is on the lower side. CONCLUSONS he temperature sensor circuit presented in this paper utilizes the variation in threshold voltage with temperature to produce PA and CA voltage signal. he CA voltage produces better result in terms of accuracy for the designed sensor. he voltage sensitivity per degree centigrade of the designed sensor is also quite high. Moreover the circuit senses for temperature range of -60 o C to 150 o C, which is spread over 210 degrees. he accuracy of the circuit is also quite good with respect to the temperature range. he power dissipation of the circuit is also on the lower side, which is well under 1uW. Since the proposed sensor senses for a widespread range of temperature with satisfactory accuracy the sensor can find its application in military and aerospace applications. REFERENCES [1] AM Functional ata Sheet, 940 Pin Package Jun. 2004, Advanced Micro evices, nc., 31412, Rev 3.05. [2] Pertijs, M. A. P., Meijer, G. C. M., and Huijsing, J. H., Precision temperature measurement using CMOS substrate pnp transistors. EEE Sensors Journal, vol. 4, no. 3, pp. 294 300, 2004. [3] A.L. Aita, M.A.P. Pertijs, K.A.A. Makinwa, J.H. Huijsing, A CMOS smart temperature sensor with a batch-calibrated inaccuracy of ±0.25 C (3σ) from - 70 C to 130 C, EEE nt. Solid-State Circuits Conf. (SSCC) ig. ech. Papers, pp. 342 343, 2009. [4] M. Pertijs, K. Makinwa, and J.Huijsing, A CMOS emperature Sensor with a 3 sigma naccuracy of 0.1C from -55 C to 120 C. EEE J. Solid-State Circuits, vol. 40, no.12, pp. 2805-2815, ecember 2005. [5] P. Chen, C. Chen, C. sai, and W. Lu, A ime-to igital Converter Based CMOS Smart emperature sensor. EEE J. Solid-State Circuits, vol. 40, no.8, pp. 1642-1648, August 2005. [6] K. Woo, S. Meninger,. Xanthopoulos, E. Crain,. Ha, and. Ham, ime-domain CMOS temperature sensors with dual delay-locked loops for microprocessor thermal monitoring, EEE rans. Very Large Scale ntegr. (VLS) Syst., vol. 20, no. 9, pp. 1590 1601, September 2012. [7] K. Kim, H. Lee, and C. Kim, 366-Ks/s 1.09-nJ 0.0013-mm2 frequencyto-digital converter based CMOS temperature sensor utilizing multiphase clock, EEE rans. Very Large Scale ntegr. (VLS) Syst., vol. 20, no. 12, pp. 1 5, ecember 2012. [8] K. Arabi and B. Kaminska, Built-in temperature sensors for on-line thermal monitoring of microelectronic structures, Proc. EEE nternational Conference on Computer esign, pp. 462-467, 1997. [9] V. Szekely, Cs. Marta, Zs. Kohari, and M. Rencz, CMOS Sensors for On-Line hermal Monitoring of VLS Circuits, EEE rans. Very Large Scale ntegration Systems, vol. 5, no. 3, pp. 270-276, September 1997. [10] M. Sasaki, M. keda, K. Asada, A emperature Sensor with an naccuracy of -1/+0.8 C using 90nm 1-3591

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