Test Report. Product Name : MEGA BOOK Model No. : MS-1022, S425, S425B

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Test Report Product Name : MEGA BOOK Model No. : MS-1022, S425, S425B Applicant : MICRO-STAR INTL Co., LTD. Address : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C. Date of Receipt : 2005/08/01 Issued Date : 2005/09/16 Report No. : 058L035E The test results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation. Page: 1 of 98

Declaration of Conformity The following products is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). The listed standard as below were applied: The following Equipment: Product Model Number Trade Name : MEGA BOOK : MS-1022, S425, S425B : MSI This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC).For the evaluation regarding EMC, the following standards were applied: RFI Emission: EN 55022:1998+A1:2000+A2:2003 Class B EN 61000-3-2:2000 Class D EN 61000-3-3:1995+A1:2001 : Product family standard : Limits for harmonic current emission : Limitation of voltage fluctuation and flicker in low-voltage supply system Immunity : EN 55024:1998+A1:2001+A2:2003 : Product family standard The following importer/manufacturer is responsible for this declaration: Company Name : Company Address : Telephone : Facsimile : Person is responsible for marking this declaration: Name (Full Name) Position/ Title Date Legal Signature

QTK No.:058L035E Statement of Conformity The certifies that the following designated product Product Model Number Trade Name Company Name : MEGA BOOK : MS-1022, S425, S425B : MSI : MICRO-STAR INT'L Co.,LTD. This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). For the evaluation regarding EMC, the following standards were applied: RFI Emission: EN 55022:1998+A1:2000+A2:2003 Class B : Product family standard EN 61000-3-2:2000 Class D : Limits for harmonic current emission EN 61000-3-3:1995+A1:2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system Immunity: EN 55024:1998+A1:2001+A2:2003 : Product family standard TEST LABORATORY 0914 Gene Chang / Manager The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo. QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. Tel: 886-2-8601-3788, Fax: 886-2-8601-3789, E-mail: service@quietek.com

Test Report Certification Issued Date : 2005/09/16 Report No. : 058L035E Product Name Applicant Address Manufacturer Model No. Rated Voltage EUT Voltage Trade Name : MEGA BOOK : MICRO-STAR INTL Co., LTD. : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C. : MICRO-STAR INTL Co., LTD. : MS-1022, S425, S425B : AC 230 V / 50 Hz : AC 100-240V / 50-60Hz : MSI Applicable Standard : EN 55022:1998+A1: 2000+A2: 2003 EN 61000-3-2:2000,EN 61000-3-3:1995+A1: 2001 EN 55024:1998+A1: 2001+A2: 2003 Classification Test Result : B : Complied The test results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation. Documented By : Tested By : Approved By : (Rita Huang) (Vic Chang ) 0914 (Gene Chang) Page: 2 of 98

TABLE OF CONTENTS Description Page 1. General Information...6 1.1. EUT Description...6 1.2. Test Mode...8 1.3. Tested System Details...10 1.4. Configuration of tested System...11 1.5. EUT Exercise Software...12 1.6. Test Facility...13 2. Conducted Emission...14 2.1. Test Equipment List...14 2.2. Test Setup...14 2.3. Limits...15 2.4. Test Procedure...15 2.5. Uncertainty...15 2.6. Test Specification...15 2.7. Test Result...16 2.8. Test Photo...20 3. Impedance Stabilization Network...22 3.1. Test Equipment List...22 3.2. Test Setup...22 3.3. Limits...23 3.4. Test Procedure...23 3.5. Uncertainty...23 3.6. Test Specification...23 3.7. Test Result...24 3.8. Test Photo...30 4. Radiated Emission...32 4.1. Test Equipment List...32 4.2. Test Setup...32 4.3. Limits...33 4.4. Test Procedure...33 4.5. Uncertainty...33 4.6. Test Specification...33 4.7. Test Result...34 4.8. Test Photo...38 5. Power Harmonics...40 5.1. Test Equipment List...40 5.2. Test Setup...40 5.3. Limits...41 5.4. Test Procedure...42 5.5. Uncertainty...42 5.6. Test Specification...42 5.7. Test Result...43 5.8. Test Photo...47 6. Voltage Fluctuation and Flicker...48 Page: 3 of 98

6.1. Test Equipment List...48 6.2. Test Setup...48 6.3. Limits...49 6.4. Test Procedure...49 6.5. Uncertainty...49 6.6. Test Specification...49 6.7. Test Result...50 6.8. Test Photo...52 7. Electrostatic Discharge (ESD)...53 7.1. Test Equipment List...53 7.2. Test Setup...53 7.3. Limits...54 7.4. Test Procedure...54 7.5. Uncertainty...54 7.6. Test Specification...54 7.7. Test Result...55 7.8. Test Photo...57 8. Radiated Susceptibility (RS)...58 8.1. Test Equipment List...58 8.2. Test Setup...58 8.3. Limits...59 8.4. Test Procedure...59 8.5. Uncertainty...59 8.6. Test Specification...59 8.7. Test Result...60 8.8. Test Photo...62 9. Electrical Fast Transient/Burst (EFT/B)...63 9.1. Test Equipment List...63 9.2. Test Setup...63 9.3. Limits...64 9.4. Test Procedure...64 9.5. Uncertainty...64 9.6. Test Specification...64 9.7. Test Result...65 9.8. Test Photo...67 10. Surge...69 10.1. Test Equipment List...69 10.2. Test Setup...69 10.3. Limits...70 10.4. Test Procedure...70 10.5. Uncertainty...70 10.6. Test Specification...70 10.7. Test Result...71 10.8. Test Photo...73 11. Conducted Susceptibility (CS)...74 11.1. Test Equipment List...74 11.2. Test Setup...74 Page: 4 of 98

11.3. Limits...75 11.4. Test Procedure...76 11.5. Uncertainty...76 11.6. Test Specification...76 11.7. Test Result...77 11.8. Test Photo...79 12. Power Frequency Magnetic Field...81 12.1. Test Equipment List...81 12.2. Test Setup...81 12.3. Limits...82 12.4. Test Procedure...82 12.5. Uncertainty...82 12.6. Test Specification...82 12.7. Test Result...83 12.8. Test Photo...85 13. Voltage Dips and Interruption Measurement...86 13.1. Test Equipment List...86 13.2. Test Setup...86 13.3. Limits...87 13.4. Test Procedure...87 13.5. Uncertainty...87 13.6. Test Specification...87 13.7. Test Result...88 13.8. Test Photo...90 Attachement...91 EUT Photograph...91 Reference : Laboratory of License Page: 5 of 98

1. General Information 1.1. EUT Description Product Name Trade Name Model No. MEGA BOOK MSI MS-1022, S425, S425B Component Power Adapter (1) Power Adapter (2) Li Shin, 0335A1965 Input:100-240V / 50-60Hz, 1.7A Output: 19V-3.42A Cable in: Shielded, 1.8m Cable out: Shielded, 1.8 with one ferrite core bonded. FSP, FSP090-1ADC21 Input: 100-240V / 50-60Hz, 1.6A Output: 19V-4.74A Cable in: Shielded, 1.8m Cable out: Shielded, 1.8 with two ferrite cores bonded. Note: 1. The EUT is including three models, The MS-1022 for MSI and the S425, S425B PRO for different marketing requirement. Page: 6 of 98

Keyparts List Item Vendor Model Discription Centrino 1.6GHz Dothan 533 CPU LCD HDD Intel AU Samsung Toshiba Fujitsu Centrino 1.73GHz Dothan 533 Centrino 1.86GHz Dothan 533 Centrino 2.0GHz Dothan 533 Centrino 2.13GHz Dothan 533 14" WXGA TFT B140EW01 V.1 14" WXGA TFT LTN140W1-L01-1 2.5" 60GB RoHS 60GB 2.5" 80GB RoHS 80GB MHT2060AT 60GB 2.5" 80GB 4,200RPM 80GB HLDS DVD Dual GCA-4080N ODD QSI Combo DVD Dual SCB5265, w/ GBAS SDVD8441, w/ GBAS TwinMOS DDR2-533 512MB 64MX8 DDR2 SO-DIMM 8G-22JJ5-3AT Memory Apacer 512 MB DDRⅡ SDRAM SO-DIMM with 78.92051.400 Samsung chip 512 MB DDRⅡ SDRAM SO-DIMM with Elpida 78.92051.421 chip Inverter Sumida TWS-400-9152 14.1"&15.0" Battery WellTop Black 6cell Li-ion Battery AC-Adapter FSP Li Shin SYS, Power Supply Adaptor, 90W/100-240Vin,4.74A/19Vout, SPI/FSP090-1ADC21,For MS-1013,SYS/ POWER SUPPLY ADAPTOR/ 65W/90-265Vin/3.42A/19Vout/LI SHIN/SLS0335A1965/For MS-1031, K/B Chicony US/ Canada Keyboard Power Cord Well Shin Fan Jet Touch Pad Elantech 800410-2001 CABL,EXTPowerCord,Round/1/183cm,10A/12 5V,WS-004/027(UL),SPT-2 18AWGx2C 60C BK 6FT,UL,for MS-1006 CABL,EXTPowerCord,Round/1/183cm,10A/12 5V,YP-12/YC-14, UL,for MS-1003 -- 90W -- -- -- -- -- MDC Modem Qcom MD560(B)-01. MDC Form Factor BT/Modem Combo Card,Azalia Interface Wireless LAN Intel Intel 2915ABG Wireless LAN Page: 7 of 98

1.2. Test Mode QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as: Pre-Test Mode EMC Mode 1: Dothen 1.6GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Mode 2: Dothan 1.73GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Mode 3: Dothen 1.86GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Mode 4: Dothen 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Mode 5: Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Mode 6: Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Final Test Mode EMI Mode 5: Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Mode 6: Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter EMS Mode 5: Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Mode 6: Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Page: 8 of 98

MODE 1 MODE 2 CPU Dothan 1.6GHz(533) Dothan 1.73GHz(533) LCD Samsung LTN140W1-L01-1 AU B140EW01 V.1 HDD Toshiba MK6025GAS Toshiba MK8025GAS O.D.D HLDS GCA-4080N QSI SCB5265 DDR DDR2 Module 512MB DDR2 Module 512MB Apacer(Samsung chip) MDC Qcom MD560(B)-01. Qcom MD560(B)-01. Wireless LAN Intel 2915ABG Intel 2915ABG Battery Li-io 6cell Li-io 6cell Inverter Sumida TWS-400-9152 Sumida TWS-400-9152 Power Adapter FSP090-1ADC21 Li shin 0335A1965 MODE 3 MODE 4 CPU Dothan 1.86GHz(533) Dothan 2.0Hz(533) LCD Samsung LTN140W1-L01-1 AU B140EW01 V.1 HDD Fujitsu MHT2060AT Fujitsu MHT2080AT O.D.D QSI SDVD8441 HLDS GCA-4080N DDR DDR2 Module 512MB Apacer (Elpida chip) DDR2 Module 512MB MDC Qcom MD560(B)-01. Qcom MD560(B)-01. Wireless LAN Intel 2915ABG Intel 2915ABG Battery Li-io 6cell Li-io 6cell Inverter Sumida TWS-400-9152 SumidaTWS-400-9152 Power Adapter FSP090-1ADC21 Li shin 0335A1965 MODE 5 MODE 6 CPU Dothan 2.13GHz 533) Pentium M 2.0GHz(533) LCD Samsung LTN140W1-L01-1 AU B140EW01 V.1 HDD Samsung MP0804H Western Digital WD600 O.D.D QSI SCB5265 QSI SDVD8441 DDR DDR2 Module 512MB Apacer(Samsung chip) DDR2 Module 512MB Apacer(Elpida chip) MDC Qcom MD560(B)-01. Qcom MD560(B)-01. Wireless LAN Intel 2915ABG Intel 2915ABG Battery Li-io 6cell Li-io 6cell Inverter Sumida TWS-400-9152 Sumida TWS-400-9152 Power Adapter FSP090-1ADC21 Li shin 0335A1965 Page: 9 of 98

1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Product Manufacturer Model No. Serial No. Power Cord 1 LCD Monitor CMV CT-723D 3RC213238L40223 Non-Shielded, 1.8m 2 USB Mouse Logitech M-UV83 LNA34515305 N/A 3 USB 2.0 HDD Topdisk ME-910 235484 Power by PC 4 USB 2.0 HDD Topdisk ME-910 212523 Power by PC 5 Slim COMBO ASUS SCB-2408D 42DM355285 Non-Shielded, 1.8m,with one ferrite core bonded. 6 Microphone & N/A MIC-06 N/A N/A Earphone 7 Walkman AIWA HS-TA164 N/A N/A 8 LCD Monitor CMV CT-723D 3RC113237H40004 Non-Shielded, 1.8m 9 Exchange Network Sun Moon Star PX-4 95170087 Non-Shielded, 1.8m 10 Notebook PC DELL PPT N/A Non-Shielded, 0.8m Page: 10 of 98

1.4. Configuration of tested System Connection Diagram Signal Cable Type Signal cable Description A S-VIDEO Cable Shielded, 1.5m B USB Mouse Cable Shielded, 1.8m C USB Cable Shielded, 1.0m D USB Cable Shielded, 1.0m E 1394 Cable Shielded, 1.0m F Earphone & Microphone Cable Non-Shielded, 1.8m G Audio Cable Non-Shielded, 1.5m H D-SUB Cable Shielded, 1.8m, with two ferrite cores bonded I TELECOM Cable Non-Shielded, 7.0m J TELECOM Cable Non-Shielded, 7.0m K LAN Cable Non-Shielded, 7.0m Page: 11 of 98

1.5. EUT Exercise Software 1 Setup the EUT and simulators as shown on 1.4. 2 Turn on the power of all equipment. 3 EUT get into Windows XP operating system. 4 Notebook will read data from USB 2.0 HDD and then writes the data into USB 2.0 HDD, same operation for hard disk. 5 Notebook will read data from CD-ROM or DVD and then writes the data into External USB optical device. 6 Notebook sends H character to LCD display and external monitor at the same time, the screen will display and fill with H pattern. 7 Notebook will communicate with the partner PC through the internal Fax/modem module (Lan Module). 8 The transmitted and received status will be shown on the monitor (TV). 9 Repeat the above procedure (4) to (8). Page: 12 of 98

1.6. Test Facility Ambient conditions in the laboratory: Items Test Item Required (IEC 68-1) Actual Temperature ( C) EN55022 CE 15-35 25 Humidity (%RH) 25-60 50 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) EN55022 RE 15-35 25 Humidity (%RH) 25-60 50 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) IEC 61000-4-11 15-35 24 Humidity (%RH) 25-75 51 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) IEC 61000-4-2 15-35 24.3 Humidity (%RH) 30-60 50 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) IEC 61000-4-5 15-35 26 Humidity (%RH) 10-75 50 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) IEC 61000-4-8 15-35 24 Humidity (%RH) 25-75 51 Barometric pressure (mbar) 860-1060 950-1000 Site Description: Site Name: Site Address: Accredited by NVLAP NVLAP Lab Code: 200533-0 Effective through: June 30, 2005 June 11, 2001 Accredited by DNV Statement No. : 413-99-LAB11 April 18, 2001 Accredited by Nemko Certificate No.: ELA 165 May 03,2001 Accredited by TUV Rheinland Certificate No.: 10011438-1-2004 Accredited by CNLA Accredited Number: 0914 Effective through: October 31, 2005 Quietek Corporation No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C. TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789 E-Mail : service@quietek.com 0914 Page: 13 of 98

2. Conducted Emission 2.1. Test Equipment List The following test equipment are used during the conducted emission test: Item Instrument Manufacturer Type No./Serial No Last Cal.. Remark 1 Test Receiver R & S ESCS 30/838251/001 Jan.,2005 2 L.I.S.N. R & S ESH3-Z5/836679/0023 May,2005 EUT 3 L.I.S.N. R & S ENV 4200/833209/0023 May,2005 Peripherals 4 Pulse Limiter R & S ESH3-Z2 May,2005 5 No.2 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 2.2. Test Setup Page: 14 of 98

2.3. Limits EN 55022:1998+A1: 2000+A2: 2003 AC Mains Limits (dbuv) Frequency Class A Class B MHz QP AV QP AV 0.15-0.50 79 66 66-56 56-46 0.50-5.0 73 60 56 46 5.0-30 73 60 60 50 Remarks: In the above table, the tighter limit applies at the band edges 2.4. Test Procedure AC Mains: The EUT and simulators are connected to the main power through a line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm /50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) Both sides of AC line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed according to EN 55022:1998+A1: 2000+A2:2003 on conducted measurement. The bandwidth of the field strength meter (R & S Test Receiver ESCS 30) is set at 9kHz. 2.5. Uncertainty The measurement uncertainty is defined as ± 2.02 db 2.6. Test Specification According to EN 55022:1998+A1:2000+A2:2003 Page: 15 of 98

2.7. Test Result Product MEGA BOOK Test Mode Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Date of Test 2005/08/24 Test Site No.2 Shielded Room Test Condition Conducted Emission Test Range 0.15-30MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv LINE 1 Quasi-Peak 0.177 0.202 39.270 39.472-25.757 65.229 0.220 0.202 36.560 36.762-27.238 64.000 1.200 0.216 31.330 31.546-24.454 56.000 1.652 0.222 33.600 33.822-22.178 56.000 * 2.773 0.236 37.170 37.406-18.594 56.000 6.197 0.283 28.580 28.863-31.137 60.000 Average 0.177 0.202 20.510 20.712-34.517 55.229 0.220 0.202 28.960 29.162-24.838 54.000 1.200 0.216 30.460 30.676-15.324 46.000 1.652 0.222 32.220 32.442-13.558 46.000 * 2.773 0.236 35.290 35.526-10.474 46.000 6.197 0.283 20.460 20.743-29.257 50.000 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 16 of 98

Product MEGA BOOK Test Mode Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Date of Test 2005/08/24 Test Site No.2 Shielded Room Test Condition Conducted Emission Test Range 0.15-30MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv LINE 2 Quasi-Peak 0.170 0.202 41.270 41.472-23.957 65.429 0.224 0.202 37.770 37.972-25.913 63.886 0.455 0.206 30.860 31.066-26.220 57.286 1.880 0.225 30.460 30.685-25.315 56.000 * 2.787 0.237 36.040 36.277-19.723 56.000 4.683 0.262 34.330 34.592-21.408 56.000 Average 0.170 0.202 15.810 16.012-39.417 55.429 0.224 0.202 27.610 27.812-26.073 53.886 0.455 0.206 25.720 25.926-21.360 47.286 1.880 0.225 24.100 24.325-21.675 46.000 2.787 0.237 29.410 29.647-16.353 46.000 * 4.683 0.262 30.410 30.672-15.328 46.000 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 17 of 98

Product MEGA BOOK Test Mode Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Date of Test 2005/08/24 Test Site No.2 Shielded Room Test Condition Conducted Emission Test Range 0.15-30MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv LINE 1 Quasi-Peak 0.151 0.316 41.860 42.176-23.795 65.971 * 0.216 0.536 47.480 48.016-16.099 64.114 0.576 0.300 36.420 36.720-19.280 56.000 2.201 0.350 32.640 32.990-23.010 56.000 4.177 0.400 37.270 37.670-18.330 56.000 12.470 0.820 29.580 30.400-29.600 60.000 Average 0.151 0.316 32.310 32.626-23.345 55.971 * 0.216 0.536 43.920 44.456-9.659 54.114 0.576 0.300 32.180 32.480-13.520 46.000 2.201 0.350 24.560 24.910-21.090 46.000 4.177 0.400 26.490 26.890-19.110 46.000 12.470 0.820 23.880 24.700-25.300 50.000 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 18 of 98

Product MEGA BOOK Test Mode Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Date of Test 2005/08/24 Test Site No.2 Shielded Room Test Condition Conducted Emission Test Range 0.15-30MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv LINE 2 Quasi-Peak * 0.213 0.300 47.040 47.340-16.860 64.200 0.505 0.310 36.540 36.850-19.150 56.000 1.080 0.320 35.870 36.190-19.810 56.000 2.201 0.350 33.200 33.550-22.450 56.000 4.977 0.420 32.100 32.520-23.480 56.000 20.443 0.920 30.700 31.620-28.380 60.000 Average * 0.213 0.300 44.070 44.370-9.830 54.200 0.505 0.310 29.580 29.890-16.110 46.000 1.080 0.320 29.260 29.580-16.420 46.000 2.201 0.350 24.980 25.330-20.670 46.000 4.977 0.420 25.450 25.870-20.130 46.000 20.443 0.920 22.390 23.310-26.690 50.000 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 19 of 98

2.8. Test Photo Test Mode : Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Description: Front View of Conducted Test - Mode 5 Test Mode : Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Description: Back View of Conducted Test - Mode 5 Page: 20 of 98

Test Mode : Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Description: Front View of Conducted Test - Mode 6 Test Mode : Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Description: Back View of Conducted Test - Mode 6 Page: 21 of 98

3. Impedance Stabilization Network 3.1. Test Equipment List The following test equipment are used during the conducted emission test: Item Instrument Manufacturer Type No./Serial No Last Cal.. Remark 1 Test Receiver R & S ESCS 30/838251/001 Jan.,2005 2 L.I.S.N. R & S ESH3-Z5/836679/0023 May,2005 EUT 3 L.I.S.N. R & S ENV 4200/833209/0023 May,2005 Peripherals 4 Pulse Limiter R & S ESH3-Z2 May,2005 5 ISN SCHAFFNER T400/19099 Apr.,2005 6 Voltage Probe SCHAFFNER CVP 2200A/18331 Apr.,2005 7 RF Current Probe FCC F-65/199 Apr.,2005 8 No.2 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 3.2. Test Setup Page: 22 of 98

3.3. Limits Telecommunication ports EN 55022:1998+A1: 2000+A2:2003 Telecommunication ports Limits db(uv) Frequency MHz Limit for conducted emissions from telecommunication ports of equipment intended for use in telecommunication centers only Limit for conducted emissions from telecommunication ports QP AV QP AV 0.15 0.50 97-87 84-74 84-74 74-64 0.5 30 87 74 74 64 Remarks: In the above table, the tighter limit applies at the band edges. 3.4. Test Procedure Telecommunication Port: The mains voltage shall be supplied to the EUT via the LISN when the measurement of telecommunication port is performed. The common mode disturbances at the telecommunication port shall be connected to the ISN, which is 150 ohm impedance. Both alternative cables are tested related to the LCL requested. The measurement range is from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz. The 60dB LCL ISN is used for cat. 5 cable, 50dB LCL ISN is used for cat. 3 and 80dB LCL is used for alternative one.. 3.5. Uncertainty The measurement uncertainty is defined as ± 1.8 db 3.6. Test Specification According to EN 55022:1998+A1: 2000+A2:2003 Page: 23 of 98

3.7. Test Result Product MEGA BOOK Test Mode Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Date of Test 2005/08/24 Test Site No.2 Shielded Room Test Condition Impedance Stabilization Network Test Range 0.15-30MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv 100Mbps Quasi-Peak 0.306 9.792 53.120 62.912-16.631 79.543 * 0.603 9.768 56.240 66.008-7.992 74.000 2.404 9.742 45.440 55.182-18.818 74.000 5.908 9.779 49.140 58.919-15.081 74.000 13.420 9.839 58.320 68.159-15.841 84.000 18.239 9.863 58.820 68.683-15.317 84.000 Average 0.306 9.792 50.210 60.002-9.541 69.543 * 0.603 9.768 51.260 61.028-2.972 64.000 2.404 9.742 42.100 51.842-12.158 64.000 5.908 9.779 45.300 55.079-8.921 64.000 13.420 9.839 55.420 65.259-8.741 74.000 18.239 9.863 56.440 66.303-7.697 74.000 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 24 of 98

Product MEGA BOOK Test Mode Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Date of Test 2005/08/24 Test Site No.2 Shielded Room Test Condition Impedance Stabilization Network Test Range 0.15-30MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv 10Mbps Quasi-Peak 0.306 9.792 52.640 62.432-17.111 79.543 * 0.615 9.768 57.360 67.128-6.872 74.000 1.705 9.742 46.800 56.542-17.458 74.000 4.970 9.766 40.840 50.606-23.394 74.000 10.166 9.815 51.420 61.235-22.765 84.000 15.056 9.841 40.620 50.461-33.539 84.000 Average 0.306 9.792 50.070 59.862-9.681 69.543 * 0.615 9.768 52.260 62.028-1.972 64.000 1.705 9.742 42.100 51.842-12.158 64.000 4.970 9.766 32.420 42.186-21.814 64.000 10.166 9.815 24.770 34.585-39.415 74.000 15.056 9.841 17.890 27.731-46.269 74.000 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 25 of 98

Product MEGA BOOK Test Mode Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Date of Test 2005/08/24 Test Site No.2 Shielded Room Test Condition Impedance Stabilization Network Test Range 0.15-30MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv Telecom Quasi-Peak 0.306 9.792 47.140 56.932-22.611 79.543 * 0.615 9.768 56.940 66.708-7.292 74.000 1.076 9.734 45.580 55.314-18.686 74.000 2.334 9.741 46.020 55.761-18.239 74.000 6.302 9.784 42.300 52.084-21.916 74.000 8.715 9.806 34.480 44.286-29.714 74.000 Average 0.306 9.792 44.330 54.122-15.421 69.543 * 0.615 9.768 51.690 61.458-2.542 64.000 1.076 9.734 40.810 50.544-13.456 64.000 2.334 9.741 41.640 51.381-12.619 64.000 6.302 9.784 32.820 42.604-21.396 64.000 8.715 9.806 30.950 40.756-23.244 64.000 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 26 of 98

Product MEGA BOOK Test Mode Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Date of Test 2005/08/24 Test Site No.2 Shielded Room Test Condition Impedance Stabilization Network Test Range 0.15-30MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv 100Mbps Quasi-Peak 0.365 9.880 52.090 61.970-15.887 77.857 0.634 9.858 45.880 55.738-18.262 74.000 4.033 9.810 27.740 37.550-36.450 74.000 7.920 9.790 50.240 60.030-23.970 84.000 13.357 9.960 58.250 68.210-15.790 84.000 * 23.127 9.910 63.690 73.600-10.400 84.000 Average 0.365 9.880 41.580 51.460-16.397 67.857 0.634 9.858 38.720 48.578-15.422 64.000 4.033 9.810 20.470 30.280-33.720 64.000 7.920 9.790 47.810 57.600-16.400 74.000 13.357 9.960 56.230 66.190-7.810 74.000 * 23.127 9.910 61.360 71.270-2.730 74.000 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 27 of 98

Product MEGA BOOK Test Mode Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Date of Test 2005/08/24 Test Site No.2 Shielded Room Test Condition Impedance Stabilization Network Test Range 0.15-30MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv 10Mbps Quasi-Peak 0.361 9.880 50.140 60.020-17.951 77.971 * 0.716 9.850 48.060 57.910-16.090 74.000 1.787 9.820 45.400 55.220-18.780 74.000 3.627 9.810 41.870 51.680-22.320 74.000 9.978 9.780 53.940 63.720-20.280 84.000 14.982 9.950 45.730 55.680-28.320 84.000 Average 0.361 9.880 40.970 50.850-17.121 67.971 0.716 9.850 42.820 52.670-11.330 64.000 * 1.787 9.820 43.560 53.380-10.620 64.000 3.627 9.810 39.510 49.320-14.680 64.000 9.978 9.780 28.870 38.650-35.350 74.000 14.982 9.950 20.700 30.650-43.350 74.000 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 28 of 98

Product MEGA BOOK Test Mode Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Date of Test 2005/08/24 Test Site No.2 Shielded Room Test Condition Impedance Stabilization Network Test Range 0.15-30MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv Telecom Quasi-Peak 0.361 9.880 47.130 57.010-20.961 77.971 * 0.720 9.849 50.810 60.659-13.341 74.000 1.420 9.820 42.410 52.230-21.770 74.000 1.857 9.820 46.460 56.280-17.720 74.000 4.623 9.800 34.840 44.640-29.360 74.000 8.404 9.790 30.100 39.890-34.110 74.000 Average 0.361 9.880 39.440 49.320-18.651 67.971 * 0.720 9.849 45.630 55.479-8.521 64.000 1.420 9.820 34.640 44.460-19.540 64.000 1.857 9.820 35.130 44.950-19.050 64.000 4.623 9.800 29.500 39.300-24.700 64.000 8.404 9.790 20.400 30.190-33.810 64.000 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 29 of 98

3.8. Test Photo Test Mode : Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Description: Front View of ISN Test - Mode 5 Test Mode : Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Description: Back View of ISN Test - Mode 5 Page: 30 of 98

Test Mode : Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Description: Front View of ISN Test - Mode 6 Test Mode : Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Description: Back View of ISN Test - Mode 6 Page: 31 of 98

4. Radiated Emission 4.1. Test Equipment List The following test equipment are used during the radiated emission test: Test Site Equipment Manufacturer Model No./Serial No. Last Cal. OATS 5 Test Receiver R & S ESCS 30 / 100123 Jan.,2005 Spectrum Analyzer Advantest R3162 / 100803468 Feb.,2005 Pre-Amplifier QTK QTK-A026-1 May,2005 Bilog Antenna SCHAFFNER CBL6112B May,2005 Note: 1. All equipments that need to be calibrate are with calibration period of 1 year. 2. Mark X test instruments are used to measure the final test results. 4.2. Test Setup Page: 32 of 98

4.3. Limits EN 55022: 1998+A1: 2000+A2:2003 Limits (dbuv/m) Frequency Class A Class B MHz Distance (m) dbuv/m Distance (m) dbuv/m 30 230 10 40 10 30 230 1000 10 47 10 37 Remarks: In the above table, the tighter limit applies at the band edges. 4.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 10 meters. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated according to EN 55022: 1998+A1: 2000+A2:2003 on radiated measurement. Radiated emissions were investigated over the frequency range from 30MHz to1ghz using a receiver bandwidth of 120kHz. Radiated measurement was performed at an antenna to EUT distance of 10 meters. 4.5. Uncertainty The measurement uncertainty is defined as ± 3.8 db 4.6. Test Specification According to EN 55022: 1998+A1: 2000+A2:2003 Page: 33 of 98

4.7. Test Result Product MEGA BOOK Test Mode Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Date of Test 2005/08/24 Test Site OATS 5 Test Condition Radiated Emission Test Range 30-1000MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv/m db dbuv/m Horizontal * 71.000 7.257 15.880 23.138-6.862 30.000 125.000 14.161 8.900 23.062-6.938 30.000 280.570 16.573 4.800 21.373-15.627 37.000 300.000 17.238 7.300 24.537-12.463 37.000 336.065 18.560 3.950 22.510-14.490 37.000 399.995 21.071 4.320 25.391-11.609 37.000 450.000 22.030 1.550 23.580-13.420 37.000 840.068 28.213 0.420 28.633-8.367 37.000 Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. *, means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 34 of 98

Product MEGA BOOK Test Mode Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Date of Test 2005/08/24 Test Site OATS 5 Test Condition Radiated Emission Test Range 30-1000MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv/m db dbuv/m Vertical * 66.360 6.879 19.890 26.769-3.231 30.000 75.000 7.786 11.190 18.975-11.025 30.000 86.000 10.030 12.670 22.699-7.301 30.000 125.000 14.161 7.010 21.172-8.828 30.000 174.553 11.840 8.870 20.710-9.290 30.000 300.027 17.239 4.900 22.139-14.861 37.000 501.340 23.329 2.360 25.690-11.310 37.000 846.300 28.307 0.360 28.667-8.333 37.000 Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. *, means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 35 of 98

Product MEGA BOOK Test Mode Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Date of Test 2005/08/24 Test Site OATS 5 Test Condition Radiated Emission Test Range 30-1000MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv/m db dbuv/m Horizontal 59.745 6.965 14.500 21.465-8.535 30.000 * 82.500 9.280 16.020 25.300-4.700 30.000 124.995 14.161 10.300 24.462-5.538 30.000 175.000 11.803 6.600 18.403-11.597 30.000 240.017 14.440 5.800 20.240-16.760 37.000 300.800 17.272 5.830 23.102-13.898 37.000 336.065 18.560 4.100 22.660-14.340 37.000 401.068 21.131 8.120 29.251-7.749 37.000 601.735 25.171 4.290 29.461-7.539 37.000 840.083 28.213 1.340 29.553-7.447 37.000 Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. *, means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 36 of 98

Product MEGA BOOK Test Mode Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Date of Test 2005/08/24 Test Site OATS 5 Test Condition Radiated Emission Test Range 30-1000MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv/m db dbuv/m Vertical * 41.500 14.130 10.730 24.860-5.140 30.000 74.955 7.778 10.530 18.308-11.692 30.000 140.283 13.620 8.030 21.650-8.350 30.000 175.000 11.803 7.810 19.613-10.387 30.000 397.480 20.922 2.870 23.792-13.208 37.000 501.337 23.329 4.390 27.719-9.281 37.000 600.062 25.137 3.250 28.387-8.613 37.000 Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. *, means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 37 of 98

4.8. Test Photo Test Mode : Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Description: Front View of Radiated Test- Mode 5 Test Mode : Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Description: Back View of Radiated Test- Mode 5 Page: 38 of 98

Test Mode : Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Description: Front View of Radiated Test- Mode 6 Test Mode : Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Description: Back View of Radiated Test- Mode 6 Page: 39 of 98

5. Power Harmonics 5.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Power Harmonics Tester SCHAFFNER Profline 2105-400 S/N: HK54148 Feb.,2005 2 Analyzer SCHAFFNER CCN 1000-1/X71887 Feb.,2005 3 No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 5.2. Test Setup Page: 40 of 98

5.3. Limits Limits of Class A Harmonics Currents Harmonics Maximum Permissible Order harmonic current A n Odd harmonics Harmonics Order n Maximum Permissible harmonic current A Even harmonics 3 2.30 2 1.08 5 1.14 4 0.43 7 0.77 6 0.30 9 0.40 8 n 40 0.23 * 8/n 11 0.33 13 0.21 15 n 39 0.15 * 15/n Limits of Class B Harmonics Currents For Class B equipment, the harmonic of the input current shall not exceed the maximum permissible values given in table which is the limit of Class A multiplied by a factor of 1.5. Limits of Class C Harmonics Currents Harmonics Order n Maximum Permissible harmonic current Expressed as a percentage of the input current at the fundamental frequency % 2 2 3 30.λ * 5 10 7 7 9 5 11 n 39 (odd harmonics only) *λ is the circuit power factor 3 Page: 41 of 98

Limits of Class D Harmonics Currents Harmonics Order n Maximum Permissible harmonic current per watt ma/w Maximum Permissible harmonic current A 3 3.4 2.30 5 1.9 1.14 7 1.0 0.77 9 0.5 0.40 11 0.35 0.33 11 n 39 (odd harmonics only) 3.85/n See limit of Class A 5.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed. 5.5. Uncertainty The measurement uncertainty is defined as ± 3.23 % 5.6. Test Specification According to EN 61000-3-2:2000 Page: 42 of 98

5.7. Test Result Date of Test 2005/08/23 Test Site No.3 Shielded Room Test Mode Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Product MEGA BOOK Test Condition Power Harmonics Test Range Test Result: Pass Source qualification: Normal Current & voltage waveforms 0.9 300 Current (Amps) 0.6 0.3 0.0-0.3-0.6 200 100 0-100 -200 Voltage (Volts) -0.9-300 Harmonics and Class D limit line European Limits Current RMS(Amps) 0.50 0.45 0.40 0.35 0.30 0.25 0.20 0.15 0.10 0.05 0.00 4 8 12 16 20 24 28 32 36 40 Harmonic # Test result: Pass Worst harmonic was #3 with 13.67% of the limit. Page: 43 of 98

Test Result: Pass Source qualification: Normal THC(A): 0.08 I-THD(pk%): 18.45 POHC(A): 0.005 POHC Limit(A): 0.042 Highest parameter values during test: V_RMS (Volts): 229.83 Frequency(Hz): 50.00 I_Peak (Amps): 0.829 I_RMS (Amps): 0.450 I_Fund (Amps): 0.434 Crest Factor: 1.912 Power (Watts): 98 Power Factor: 0.945 Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.000 3 0.067 0.332 20.2 0.068 0.498 13.67 Pass 4 0.000 5 0.027 0.186 14.3 0.027 0.278 9.70 Pass 6 0.000 7 0.017 0.098 17.4 0.017 0.146 11.88 Pass 8 0.000 9 0.007 0.049 15.1 0.008 0.073 10.69 Pass 10 0.000 11 0.002 0.034 6.8 0.003 0.051 5.25 Pass 12 0.000 13 0.002 0.029 5.2 0.002 0.043 3.90 Pass 14 0.000 15 0.003 0.025 11.5 0.003 0.038 8.31 Pass 16 0.000 17 0.003 0.022 15.4 0.004 0.033 10.67 Pass 18 0.000 19 0.003 0.020 14.8 0.003 0.030 10.36 Pass 20 0.000 21 0.002 0.018 11.0 0.002 0.027 7.90 Pass 22 0.000 23 0.001 0.016 8.0 0.001 0.025 5.57 Pass 24 0.000 25 0.001 0.015 9.7 0.002 0.023 7.04 Pass 26 0.000 27 0.002 0.014 12.7 0.002 0.021 8.98 Pass 28 0.000 29 0.002 0.013 13.6 0.002 0.019 9.48 Pass 30 0.000 31 0.001 0.012 12.2 0.002 0.018 8.59 Pass 32 0.000 33 0.001 0.011 10.2 0.001 0.017 7.21 Pass 34 0.000 35 0.001 0.011 9.6 0.001 0.016 6.87 Pass 36 0.000 37 0.001 0.010 11.8 0.001 0.015 8.44 Pass 38 0.000 39 0.001 0.010 13.0 0.001 0.014 9.25 Pass 40 0.000 1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 44 of 98

Date of Test 2005/08/23 Test Site No.3 Shielded Room Test Mode Mode 6:Pentium M 2.0GHz/533MHz Product MEGA BOOK LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Test Condition Power Harmonics Test Range Test Result: Pass Source qualification: Normal Current & voltage waveforms 6 300 Current (Amps) 4 2 0-2 -4 200 100 0-100 -200 Voltage (Volts) -6-300 Harmonics and Class D limit line European Limits Current RMS(Amps) 0.35 0.30 0.25 0.20 0.15 0.10 0.05 0.00 4 8 12 16 20 24 28 32 36 40 Harmonic # Test result: Pass Worst harmonic was #0 with 0.00% of the limit. Page: 45 of 98

Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(pk%): 0.00 POHC(A): 0.000 POHC Limit(A): 0.000 Highest parameter values during test: V_RMS (Volts): 229.83 Frequency(Hz): 50.00 I_Peak (Amps): 3.864 I_RMS (Amps): 0.773 I_Fund (Amps): 0.316 Crest Factor: 5.632 Power (Watts): 72 Power Factor: 0.403 Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.004 3 0.259 0.244 0.0 0.272 0.365 0.00 Pass 4 0.004 5 0.249 0.136 0.0 0.262 0.204 0.00 Pass 6 0.005 7 0.236 0.072 0.0 0.247 0.107 0.00 Pass 8 0.005 9 0.219 0.036 0.0 0.229 0.054 0.00 Pass 10 0.006 11 0.199 0.025 0.0 0.207 0.038 0.00 Pass 12 0.006 13 0.178 0.021 0.0 0.184 0.032 0.00 Pass 14 0.006 15 0.155 0.019 0.0 0.159 0.028 0.00 Pass 16 0.006 17 0.131 0.016 0.0 0.134 0.024 0.00 Pass 18 0.005 19 0.109 0.015 0.0 0.110 0.020 0.00 Pass 20 0.005 21 0.087 0.013 0.0 0.088 0.018 0.00 Pass 22 0.004 23 0.067 0.012 0.0 0.068 0.017 0.00 Pass 24 0.004 25 0.050 0.011 0.0 0.051 0.015 0.00 Pass 26 0.003 27 0.036 0.010 0.0 0.036 0.015 0.00 Pass 28 0.002 29 0.024 0.010 0.0 0.025 0.013 0.00 Pass 30 0.002 31 0.017 0.009 0.0 0.017 0.013 0.00 Pass 32 0.001 33 0.013 0.008 0.0 0.014 0.013 0.00 Pass 34 0.001 35 0.013 0.008 0.0 0.014 0.012 0.00 Pass 36 0.001 37 0.012 0.007 0.0 0.013 0.011 0.00 Pass 38 0.001 39 0.012 0.007 0.0 0.012 0.010 0.00 Pass 40 0.001 1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 46 of 98

5.8. Test Photo Test Mode : Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Description: Power Harmonics Test Setup -Mode 5 Test Mode : Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Description: Power Harmonics Test Setup -Mode 6 Page: 47 of 98

6. Voltage Fluctuation and Flicker 6.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Power Harmonics Tester SCHAFFNER Profline 2105-400 S/N: HK54148 Feb.,2005 2 Analyzer SCHAFFNER CCN 1000-1/X71887 Feb.,2005 3 No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 6.2. Test Setup Page: 48 of 98

6.3. Limits Voltage Fluctuations and Flicker: The following limits apply: - the value of P st shall not be greater than 1.0; - the value of P 1t shall not be greater than 0.65; - the value of d(t) during a voltage change shall not exceed 3.3 % for more than 500 ms; - the relative steady-state voltage change, d c, shall not exceed 3.3 %; - the maximum relative voltage change, d max, shall not exceed; a) 4 % without additional conditions; b) 6 % for equipment which is: - switched manually, or - switched automatically more frequently than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds), or manual restart, after a power supply interruption. NOTE The cycling frequency will be further limited by the P st and P 1t limit. For example: a d max of 6%producing a rectangular voltage change characteristic twice per hour will give a P 1t of about 0.65. c) 7 % for equipment which is: - attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment such as mixers, garden equipment such as lawn mowers, portable tools such as electric drills), or - switched on automatically, or is intended to be switched on manually, no more than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds) or manual restart, after a power supply interruption. P st and P 1t requirements shall not be applied to voltage changes caused by manual switching. 6.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed. 6.5. Uncertainty The measurement uncertainty is defined as ± 3.23 % 6.6. Test Specification According to EN 61000-3-3:1995+A1:2001 Page: 49 of 98

6.7. Test Result Date of Test 2005/08/23 Test Site No.3 Shielded Room Test Mode Mode 5:Dothen 2.13GHz/533MHZ Product MEGA BOOK LCD+D-SUB 1024*768/60Hz,FSP Adapter Test Condition Flicker Test Range Test Result: Pass Status: Test Completed Pst i and limit line European Limits 1.00 0.75 Pst 0.50 0.25 0.00 9:38:48 Time is too short for Plt plot Parameter values recorded during the test: Vrms at the end of test (Volt): 229.69 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.001 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.001 Test limit: 0.650 Pass Page: 50 of 98

Date of Test 2005/08/23 Test Site No.3 Shielded Room Test Mode Mode 6:Pentium M 2.0GHz/533MHz Product MEGA BOOK LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Test Condition Flicker Test Range Test Result: Pass Status: Test Completed Pst i and limit line European Limits 1.00 0.75 Pst 0.50 0.25 0.00 14:13:22 Time is too short for Plt plot Parameter values recorded during the test: Vrms at the end of test (Volt): 229.75 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.001 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.001 Test limit: 0.650 Pass Page: 51 of 98

6.8. Test Photo Test Mode : Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Description: Flicker Test Setup -Mode 5 Test Mode : Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Description: Flicker Test Setup -Mode 6 Page: 52 of 98

7. Electrostatic Discharge (ESD) 7.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 ESD Simulator System KeyTek MZ-15/EC S/N: 0112372 Mar.,2005 2 Horizontal Coupling Plane(HCP) 3 Vertical Coupling Plane(VCP) QuieTek HCP AL50 N/A QuieTek VCP AL50 N/A 4 No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 7.2. Test Setup Page: 53 of 98

7.3. Limits Item Environmental Phenomena Units Test Specification Performance Criteria Enclosure Port Electrostatic Discharge Kv (Charge Voltage) ±8 Air Discharge B ±4 Contact Discharge Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. 7.4. Test Procedure Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT. Indirect application of discharges to the EUT: Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. 7.5. Uncertainty The measurement uncertainty is defined as ± 6.003 % 7.6. Test Specification According to IEC 61000-4-2 Edition 1.2: 2001-04 Page: 54 of 98

7.7. Test Result Product MEGA BOOK Test Mode Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Date of Test 2005/09/06 Test Site No.3 Shielded Room Test Condition Electrostatic Discharge Test Range Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge 10 10 +8kV -8kV B B B B Pass Pass Contact Discharge 25 25 +4kV -4kV B B B B Pass Pass Indirect Discharge 50 +4kV B A Pass (HCP) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Front) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Left) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Back) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Right) 50-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 55 of 98

Product MEGA BOOK Test Mode Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Date of Test 2005/09/06 Test Site No.3 Shielded Room Test Condition Electrostatic Discharge Test Range Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge 10 10 +8kV -8kV B B B B Pass Pass Contact Discharge 25 25 +4kV -4kV B B B B Pass Pass Indirect Discharge 50 +4kV B A Pass (HCP) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Front) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Left) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Back) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Right) 50-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 56 of 98

7.8. Test Photo Test Mode : Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Description: ESD Test Setup -Mode 5 Test Mode : Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Description: ESD Test Setup -Mode 6 Page: 57 of 98

8. Radiated Susceptibility (RS) 8.1. Test Equipment List Item Equipment Manufacturer Model No. / Serial No. Last Cal. 1 Signal Generator R & S SMY02 / 825454/029 Oct., 2004 2 Power Amplifier A & R 100W10000M7 / A285000010 N/A 3 RF Power Amplifier OPHIRRF 5022F / 1075 N/A 4 Bilog Antenna Chase CBL6112B / 2452 Sep., 2005 5 Power Meter R & S NRVD / 100219 Jan., 2005 6 Directional Coupler A & R DC6180 / 22735 Jan, 2005 7 No.2 EMC Fully Chamber Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 8.2. Test Setup Page: 58 of 98

8.3. Limits Item Environmental Phenomena Enclosure Port Radio-Frequency Electromagnetic Field Amplitude Modulated Units MHz V/m(Un-modulated, rms) % AM (1kHz) Test Specification 80-1000 3 80 Performance Criteria A 8.4. Test Procedure The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. Both horizontal and vertical polarization of the antenna and six sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD camera is used to monitor EUT screen. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 3 V/M Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 80MHz - 1000MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s 8.5. Uncertainty The measurement uncertainty is defined as ± 6.17 % 8.6. Test Specification According to IEC 61000-4-3:2002+A1:2002 Page: 59 of 98

8.7. Test Result Product MEGA BOOK Test Mode Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Date of Test 2005/09/06 Test Site Chamber2 Test Condition Radiated Susceptibility Test Range 80-1000MHz Field Complied To Frequency Position Polarity Required Strength Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results 80-1000 FRONT H 3 A A PASS 80-1000 FRONT V 3 A A PASS 80-1000 BACK H 3 A A PASS 80-1000 BACK V 3 A A PASS 80-1000 RIGHT H 3 A A PASS 80-1000 RIGHT V 3 A A PASS 80-1000 LEFT H 3 A A PASS 80-1000 LEFT V 3 A A PASS 80-1000 UP H 3 A A PASS 80-1000 UP V 3 A A PASS 80-1000 DOWN H 3 A A PASS 80-1000 DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 60 of 98

Product MEGA BOOK Test Mode Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Date of Test 2005/09/06 Test Site Chamber2 Test Condition Radiated Susceptibility Test Range 80-1000MHz Field Complied To Frequency Position Polarity Required Strength Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results 80-1000 FRONT H 3 A A PASS 80-1000 FRONT V 3 A A PASS 80-1000 BACK H 3 A A PASS 80-1000 BACK V 3 A A PASS 80-1000 RIGHT H 3 A A PASS 80-1000 RIGHT V 3 A A PASS 80-1000 LEFT H 3 A A PASS 80-1000 LEFT V 3 A A PASS 80-1000 UP H 3 A A PASS 80-1000 UP V 3 A A PASS 80-1000 DOWN H 3 A A PASS 80-1000 DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 61 of 98

8.8. Test Photo Test Mode : Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Description: Radiated Susceptibility Test Setup -Mode 5 Test Mode : Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Description: Radiated Susceptibility Test Setup -Mode 6 Page: 62 of 98

9. Electrical Fast Transient/Burst (EFT/B) 9.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Fast Transient/Burst Generator SCHAFFNER NSG 2050 S/N: 200124-031AR 2 No.3 Shielded Room N/A Jun.,2005 Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 9.2. Test Setup Page: 63 of 98

9.3. Limits Item Environmental Phenomena Units Test Specification Performance Criteria I/O and communication ports Fast Transients Common Mode Input DC Power Ports Fast Transients Common Mode Input AC Power Ports Fast Transients Common Mode kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz +0.5 5/50 5 +0.5 5/50 5 +1 5/50 5 B B B 9.4. Test Procedure The EUT are placed on a table that is 0.8 meter height, and a ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and ground reference plane. The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1min. For Input DC and AC Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 min. The length of power cord between the coupling device and the EUT shall be 0.5m ± 0.05m.. 9.5. Uncertainty The measurement uncertainty is defined as ± 8.80 % 9.6. Test Specification According to IEC 61000-4-4:2004 Page: 64 of 98

9.7. Test Result Product MEGA BOOK Test Mode Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Date of Test 2005/09/06 Test Site No.3 Shielded Room Test Condition Electrical Fast Transient/Burst Test Range Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L - N- PE ± 1kV 60 CDN B A PASS LAN ± 0.5kV 90 Clamp B A PASS Telecom ± 0.5kV 90 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 65 of 98

Product MEGA BOOK Test Mode Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Date of Test 2005/09/06 Test Site No.3 Shielded Room Test Condition Electrical Fast Transient/Burst Test Range Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L - N- PE ± 1kV 60 CDN B A PASS LAN ± 0.5kV 90 Clamp B A PASS Telecom ± 0.5kV 90 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 66 of 98

9.8. Test Photo Test Mode : Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Description: EFT/B Test Setup -Mode 5 Test Mode : Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Description: EFT/B Test Setup (Clamp) -Mode 5 Page: 67 of 98

Test Mode : Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Description: EFT/B Test Setup -Mode 6 Test Mode : Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Description: EFT/B Test Setup (Clamp) - Mode 6 Page: 68 of 98

10. Surge 10.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Surge Generator SCHAFFNER NSG 2050 S/N: 200124-031AR Nov.,2004 2 No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 10.2. Test Setup Page: 69 of 98

10.3. Limits Item Environmental Phenomena Units Test Specification Performance Criteria Signal Ports and Telecommunication Ports (See 1) and 2)) Surges Tr/Ts us 1.2/50 (8/20) Line to Ground kv ± 1 B Input DC Power Ports Surges Line to Ground Tr/Ts us kv AC Input and AC Output Power Ports Surges Tr/Ts us Line to Line kv Line to Ground kv 1.2/50 (8/20) ± 0.5 B 1.2/50 (8/20) ± 1 ± 2 Notes: 1) Applicable only to ports which according to the manufacturer s may directly to outdoor cables. 2) Where normal functioning cannot be achieved because of the impact of the CDN on the EUT,no test shall be required. B 10.4. Test Procedure The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Input and Output AC Power or DC Input and DC Output Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 0 0, 90 0, 180 0, 270 0 and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min. 10.5. Uncertainty The measurement uncertainty is defined as ± 7.93 % 10.6. Test Specification According to IEC 61000-4-5 Edition 1.1: 2001-04 Page: 70 of 98

10.7. Test Result Product MEGA BOOK Test Mode Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Date of Test 2005/09/06 Test Site No.3 Shielded Room Test Condition Surge Test Range Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 71 of 98

Product MEGA BOOK Test Mode Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Date of Test 2005/09/06 Test Site No.3 Shielded Room Test Condition Surge Test Range Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 72 of 98

10.8. Test Photo Test Mode : Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Description: SURGE Test Setup-Mode 5 Test Mode : Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Description: SURGE Test Setup-Mode 6 Page: 73 of 98

11. Conducted Susceptibility (CS) 11.1. Test Equipment List The following test equipment are used during the test: Item Equipment Manufacturer Model No. / Serial No. Last Cal. 1 CS SYSTEM SCHAFFNER NSG 2070 Mar.,2005 2 CDN SCHAFFNER CDN M016S / 20822 Dec.,2004 3 CDN SCHAFFNER CDN M016S / 20823 Dec.,2004 4 FIXED PAD SCHAFFNER INA 2070-1 / 2115 N/A 5 EM Clamp KEMZ 801 / 21024 Mar.,2005 6 No.2 EMC Fully Chamber N/A Note: All equipment upon which need to calibrated are with calibration period of 1 year. 11.2. Test Setup Page: 74 of 98

11.3. Limits Item Environmental Phenomena Units Signal Ports and Telecommunication Ports MHz Radio-Frequency V (rms, Continuous Conducted Un-modulated) % AM (1kHz) Input DC Power Ports Radio-Frequency Continuous Conducted Input AC Power Ports Radio-Frequency Continuous Conducted MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) Test Specification Performance Criteria 0.15-80 3 80 0.15-80 3 80 0.15-80 3 80 A A A Page: 75 of 98

11.4. Test Procedure The EUT are placed on a table that is 0.8 meter height, and a ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 130dBuV(3V) Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 0.15MHz 80MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s. 11.5. Uncertainty The measurement uncertainty is defined as ± 6.17 % 11.6. Test Specification According to IEC 61000-4-6 Edition 2.1: 2004-11 Page: 76 of 98

11.7. Test Result Product MEGA BOOK Test Mode Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Date of Test 2005/09/06 Test Site Chamber2 Test Condition Conducted Susceptibility Test Range 0.15-80MHz Frequency Voltage Inject Tested Port of Required Performance Result Range Applied Method EUT Criteria Criteria Complied (MHz) dbuv(v) To 0.15~80 130 (3V) CDN AC IN A A PASS 0.15~80 130 (3V) Clamp LAN A A PASS 0.15~80 130 (3V) Clamp Telecom A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 77 of 98

Product MEGA BOOK Test Mode Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Date of Test 2005/09/06 Test Site Chamber2 Test Condition Conducted Susceptibility Test Range 0.15-80MHz Frequency Voltage Inject Tested Port of Required Performance Result Range Applied Method EUT Criteria Criteria Complied (MHz) dbuv(v) To 0.15~80 130 (3V) CDN AC IN A A PASS 0.15~80 130 (3V) Clamp LAN A A PASS 0.15~80 130 (3V) Clamp Telecom A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 78 of 98

11.8. Test Photo Test Mode : Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Description: Conducted Susceptibility Test Setup -Mode 5 Test Mode : Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Description: Conducted Susceptibility Test Setup (Clamp) - Mode 5 Page: 79 of 98

Test Mode : Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Description: Conducted Susceptibility Test Setup -Mode 6 Test Mode : Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Description: Conducted Susceptibility Test Setup (Clamp) - Mode 6 Page: 80 of 98

12. Power Frequency Magnetic Field 12.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Power Line Maganetics SCHAFFNER INA 2141 S/N: 6002 Jun.,2005 2 Gauss Meter F.W.BELL 4090 Jun.,2005 3 Magnetic Field Coil SCHAFFNER INA702 Jun.,2005 S/N: 199749-020 IN 4 No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 12.2. Test Setup Page: 81 of 98

12.3. Limits Item Environmental Phenomena Units Test Specification Performance Criteria Enclosure Port Power-Frequency Magnetic Field Hz A/m (r.m.s.) 50 1 A 12.4. Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured at least 1m*1m min. The test magnetic field shall be placed at central of the induction coil. The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT. And the induction coil shall be rotated by 90 in order to expose the EUT to the test field with different orientation (X, Y, Z Orientations). 12.5. Uncertainty The measurement uncertainty is defined as ± 3.23 % 12.6. Test Specification According to IEC 61000-4-8 Edition 1.1: 2001-03 Page: 82 of 98

12.7. Test Result Product MEGA BOOK Test Mode Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Date of Test 2005/09/06 Test Site No.3 Shielded Room Test Condition Power Frequency Magnetic Field Test Range Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 83 of 98

Product MEGA BOOK Test Mode Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Date of Test 2005/09/06 Test Site No.3 Shielded Room Test Condition Power Frequency Magnetic Field Test Range Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 84 of 98

12.8. Test Photo Test Mode : Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Description: Power Frequency Magnetic Field Test Setup -Mode 5 Test Mode : Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Description: Power Frequency Magnetic Field Test Setup -Mode 6 Page: 85 of 98

13. Voltage Dips and Interruption Measurement 13.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Voltage Dips Generator SCHAFFNER NSG 2050 S/N: 200124-031AR Nov.,2004 2 No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 13.2. Test Setup Page: 86 of 98

13.3. Limits Item Environmental Phenomena Units Test Specification Performance Criteria Input AC Power Ports Voltage Dips Voltage Interruptions >95 0.5 30 25 > 95 250 % Reduction Period % Reduction Periods % Reduction Periods B C C 13.4. Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The power cord shall be used the shortest power cord as specified by the manufacturer. For Voltage Dips/ Interruptions test: The selection of test voltage is based on the rated power range. If the operation range is large than 20% of lower power range, both end of specified voltage shall be tested. Otherwise, the typical voltage specification is selected as test voltage. The EUT is connected to the power mains through a coupling device that directly couples to the Voltage Dips and Interruption Generator. The EUT shall be tested for 30% voltage dip of supplied voltage and duration 10ms, for 60% voltage dip of supplied voltage and duration 100ms with a sequence of three voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied voltage and duration 5000ms with a sequence of three voltage interruptions with intervals of 10 seconds. Voltage phase shifting are shall occur at 0 O, 45 O, 90 O, 135 O, 180 O, 225 O, 270 O, 315 O of the voltage. 13.5. Uncertainty The measurement uncertainty is defined as ± 2.03 % 13.6. Test Specification According to IEC 61000-4-11 Second Edition: 2004-03 Page: 87 of 98

13.7. Test Result Product MEGA BOOK Test Mode Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Date of Test 2005/09/06 Test Site No.3 Shielded Room Test Condition Voltage Dips and Interruption Measurement Test Range Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Criteria Complied To Test Result 30(161V) 0 25 C A PASS 30(161V) 45 25 C A PASS 30(161V) 90 25 C A PASS 30(161V) 135 25 C A PASS 30(161V) 180 25 C A PASS 30(161V) 225 25 C A PASS 30(161V) 270 25 C A PASS 30(161V) 315 25 C A PASS >95(0V) 0 0.5 B A PASS >95(0V) 45 0.5 B A PASS >95(0V) 90 0.5 B A PASS >95(0V) 135 0.5 B A PASS >95(0V) 180 0.5 B A PASS >95(0V) 225 0.5 B A PASS >95(0V) 270 0.5 B A PASS >95(0V) 315 0.5 B A PASS >95(0V) 0 250 C A PASS >95(0V) 45 250 C A PASS >95(0V) 90 250 C A PASS >95(0V) 135 250 C A PASS >95(0V) 180 250 C A PASS >95(0V) 225 250 C A PASS >95(0V) 270 250 C A PASS >95(0V) 315 250 C A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 88 of 98

Product MEGA BOOK Test Mode Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Date of Test 2005/09/06 Test Site No.3 Shielded Room Test Condition Voltage Dips and Interruption Measurement Test Range Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Criteria Complied To Test Result 30(161V) 0 25 C A PASS 30(161V) 45 25 C A PASS 30(161V) 90 25 C A PASS 30(161V) 135 25 C A PASS 30(161V) 180 25 C A PASS 30(161V) 225 25 C A PASS 30(161V) 270 25 C A PASS 30(161V) 315 25 C A PASS >95(0V) 0 0.5 B A PASS >95(0V) 45 0.5 B A PASS >95(0V) 90 0.5 B A PASS >95(0V) 135 0.5 B A PASS >95(0V) 180 0.5 B A PASS >95(0V) 225 0.5 B A PASS >95(0V) 270 0.5 B A PASS >95(0V) 315 0.5 B A PASS >95(0V) 0 250 C A PASS >95(0V) 45 250 C A PASS >95(0V) 90 250 C A PASS >95(0V) 135 250 C A PASS >95(0V) 180 250 C A PASS >95(0V) 225 250 C A PASS >95(0V) 270 250 C A PASS >95(0V) 315 250 C A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 89 of 98

13.8. Test Photo Test Mode : Mode 5:Dothen 2.13GHz/533MHZ LCD+D-SUB 1024*768/60Hz,FSP Adapter Description: Voltage Dips Test Setup -Mode 5 Test Mode : Mode 6:Pentium M 2.0GHz/533MHz LCD+D-SUB 1024*768/60Hz, Li Shin Adapter Description: Voltage Dips Test Setup -Mode 6 Page: 90 of 98

Attachement EUT Photograph (1) EUT Photo (2) EUT Photo Page: 91 of 98

(3) EUT Photo (4) EUT Photo Page: 92 of 98

(5) EUT Photo (6) EUT Photo Page: 93 of 98

(7) EUT Photo (8) EUT Photo Page: 94 of 98

(9) EUT Photo (10) EUT Photo Page: 95 of 98

(11) EUT Photo (12) EUT Photo Page: 96 of 98

(13) EUT Photo Page: 97 of 98

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