DLA LAND AND MARITIME COLUMBUS, OHIO TITLE MICROCIRCUIT, DIGITAL, CMOS, ±% V/ +5V, 4 Ω, SINGLE SPDT SWITCH, MONOLITHIC SILICON REVISIONS

Similar documents
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO TITLE MICROCIRCUIT, DIGITAL-LINEAR, 1 OHM, SPDT ANALOG SWITCH, MONOLITHIC SILICON REVISIONS

LTR DESCRIPTION DATE (YY-MM-DD) APPROVED. Update boilerplate paragraphs to current requirements. - PHN

TITLE MICROCIRCUIT, DIGITAL, MICROPROCESSOR VOLTAGE MONITORS WITH PROGRAMMABLE VOLTAGE DETECTION, MONOLITHIC SILICON REVISIONS

TITLE MICROCIRCUIT, DIGITAL, ADVANCED CMOS, 16- BIT BUS TRANSCEIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE, MONOLITHIC SILICON REVISIONS

Correct lead finish for device 01 on last page. - CFS

DLA LAND AND MARITIME COLUMBUS, OHIO

DLA LAND AND MARITIME COLUMBUS, OHIO

DLA LAND AND MARITIME COLUMBUS, OHIO

TITLE MICROCIRCUIT, DIGITAL, ADVANCED CMOS, 16- BIT D-TYPE EDGE-TRIGGERED FLIP-FLOP WITH 3-STATE OUTPUTS, TTL COMPATIBLE, MONOLITHIC SILICON REVISIONS

DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO TITLE

DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO TITLE MICROCIRCUIT, LINEAR, 17 V, 1.5 A SYNCHRONOUS STEP-DOWN CONVERTER, MONOLITHIC SILICON REVISIONS

REVISIONS LTR DESCRIPTION DATE APPROVED Thomas M. Hess. Update boilerplate to current MIL-PRF requirements. - PHN

REVISIONS LTR DESCRIPTION DATE APPROVED Thomas M. Hess. Update boilerplate paragraphs to current requirements. - PHN

DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO

DLA LAND AND MARITIME COLUMBUS, OHIO

DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO TITLE MICROCIRCUIT, DIGITAL, 3.3 V CAN TRANSCEIVERS, MONOLITHIC SILICON REVISIONS

DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO TITLE MICROCIRCUIT, DIGITAL, QUADRUPLE 2-INPUT EXCLUSIVE-OR GATE, MONOLITHIC SILICON REVISIONS

DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO TITLE MICROCIRCUIT, LINEAR, PRECISION PROGRAMMABLE REFERENCE, MONOLITHIC SILICON REVISIONS

DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO

DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited.

DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited.

DLA LAND AND MARITIME COLUMBUS, OHIO

DLA LAND AND MARITIME COLUMBUS, OHIO

TITLE MICROCIRCUIT, LINEAR, LC 2 MOS, QUAD SPST SWITCHES, MONOLITHIC SILICON REVISIONS LTR DESCRIPTION DATE APPROVED REV PAGE REV PAGE REV

DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO

DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited. DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO TITLE

DLA LAND AND MARITIME COLUMBUS, OHIO

DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO

TITLE MICROCIRCUIT, DIGITAL, 200 MHz GENERAL PURPOSE CLOCK BUFFER, PCI-X COMPLIANT, MONOLITHIC SILICON REVISIONS LTR DESCRIPTION DATE APPROVED

V62/03634 DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO TITLE

DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO TITLE MICROCIRCUIT, DIGITAL, CMOS, GENERAL PURPOSE LINK LAYER CONTROLLER, MONOLITHIC SILICON

TITLE MICROCIRCUIT, LINEAR, 16-BIT, ISOLATED SIGMA-DELTA MODULATOR, MONOLITHIC SILICON REVISIONS LTR DESCRIPTION DATE APPROVED REV PAGE REV PAGE REV

Correct the maximum operating temperature range in section 1.1, 1.3 and phn. Update boilerplate to current MIL-PRF requirements.

DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO

DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO TITLE MICROCIRCUIT, DIGITAL, DIGITAL TRANSMITTER, MONOLITHIC SILICON REVISIONS

DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO

TITLE MICROCIRCUIT, DIGITAL, PHASE DETECTOR/ FREQUENCY SYNTHESIZER, MONOLITHIC SILICON REVISIONS LTR DESCRIPTION DATE APPROVED

DLA LAND AND MARITIME COLUMBUS, OHIO

DLA LAND AND MARITIME COLUMBUS, OHIO

TITLE MICROCIRCUIT, LINEAR, V AUX POWER DISTRIBUTION SWITCH, MONOLITHIC SILICON REVISIONS LTR DESCRIPTION DATE APPROVED REV PAGE REV PAGE REV

DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO TITLE MICROCIRCUIT, DIGITAL, HIGH SPEED ISOLATORS, MONOLITHIC SILICON REVISIONS

DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO TITLE MICROCIRCUIT, DIGITAL, CONTROLLER AREA NETWORK (CAN) TRANSCEIVER, MONOLITHIC SILICON

A Add footnote to paragraphs and 6.3. Make changes to figure 1 and the dimensions table. - ro

DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited.

DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO

DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO TITLE

DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited.

DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO TITLE MICROCIRCUIT, LINEAR, SWITCH MODE LEAD ACID BATTERY CHARGER, MONOLITHIC SILICON

DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited.

DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO TITLE

DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO

V62/03626 REVISIONS LTR DESCRIPTION DATE APPROVED REV PAGE REV PAGE REV REV STATUS OF PAGES PAGE

Add device type 02. Update boilerplate to current revision. - CFS

DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO

DLA LAND AND MARITIME COLUMBUS, OHIO

TITLE MICROCIRCUIT, LINEAR, DUAL, 16-BIT NANODAC+ WITH 4 ppm/ C REFERENCE, SPI INTERFACE, MONOLITHIC SILICON REVISIONS LTR DESCRIPTION DATE APPROVED

TITLE MICROCIRCUIT, DIGITAL, 16 BIT DUAL-SUPPLY BUS TRANSCEIVER WITH CONFIGURABLE VOLTAGE TRANSLATION AND 3-STATE OUTPUTS, MONOLITHIC SILICON

DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited.

DLA LAND AND MARITIME COLUMBUS, OHIO

DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited.

DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited.

DLA LAND AND MARITIME COLUMBUS, OHIO

REVISIONS LTR DESCRIPTION DATE APPROVED. Update boilerplate to current MIL-PRF requirements. - PHN Thomas M. Hess

TITLE MICROCIRCUIT, LINEAR, DC MOTOR DRIVER IC, MONOLITHIC SILICON REVISIONS LTR DESCRIPTION DATE APPROVED REV PAGE REV PAGE REV REV STATUS OF PAGES

DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO TITLE MICROCIRCUIT, LINEAR, VOLTAGE PREREGULATOR, HIGH POWER FACTOR, MONOLITHIC SILICON

DLA LAND AND MARITIME COLUMBUS, OHIO

DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited.

DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO TITLE MICROCIRCUIT, DIGITAL, CMOS, THREE-PORT CABLE TRANSCEIVER/ARBITER, MONOLITHIC SILICON

ADG1411/ADG1412/ADG1413

1 pc Charge Injection, 100 pa Leakage, CMOS, ±5 V/+5 V/+3 V Dual SPDT Switch ADG636

CMOS, ±5 V/+5 V, 4 Ω, Single SPDT Switches ADG619/ADG620

0.5 Ω CMOS, 1.8 V to 5.5 V, Dual SPDT/2:1 Mux, Mini LFCSP ADG854

Low Voltage, 400 MHz, Quad 2:1 Mux with 3 ns Switching Time ADG774A

1 Ω Typical On Resistance, ±5 V, +12 V, +5 V, and +3.3 V Dual SPDT Switches ADG1636

MP2735/MP2736 Low-Voltage 0.45Ω Dual SPDT Analog Switches

REVISIONS LTR DESCRIPTION DATE APPROVED Thomas M. Hess. Update boilerplate to current MIL-PRF requirements. - PHN

Functional Diagrams, Pin Configurations, and Truth Table

Low Voltage, 400 MHz, Quad 2:1 Mux with 3 ns Switching Time ADG774A

LC 2 MOS Quad SPST Switches ADG441/ADG442/ADG444

CMOS 3 V/5 V, Wide Bandwidth Quad 2:1 Mux ADG774

<0.5 Ω CMOS, 1.65 V to 3.6 V, Quad SPST Switches ADG811/ADG812/ADG813

1.5 Ω On Resistance, ±15 V/12 V/±5 V, icmos, Dual SPDT Switch ADG1436

CMOS 1.8 V to 5.5 V, 2.5 Ω 2:1 Mux/SPDT Switch in SOT-23 ADG719-EP

CMOS ±5 V/+5 V, 4 Ω Dual SPST Switches ADG621/ADG622/ADG623

3 V/5 V CMOS 0.5 Ω SPDT/2:1 Mux in SC70 ADG849

Low Capacitance, Low Charge Injection, ±15 V/+12 V icmos Dual SPST Switches ADG1221/ADG1222/ADG1223

ADG1606/ADG Ω RON, 16-Channel, Differential 8-Channel, ±5 V,+12 V,+5 V, and +3.3 V Multiplexers FEATURES FUNCTIONAL BLOCK DIAGRAMS

0.4 Ω CMOS, Dual DPDT Switch in WLCSP/LFCSP/TSSOP ADG888

LC 2 MOS 5 Ω RON SPST Switches ADG451/ADG452/ADG453

16-Channel CMOS Analog Multiplexer. Memory

High Temperature, High Voltage, Latch-Up Proof, 8-Channel Multiplexer ADG5298

Low Voltage, 300 MHz Quad 2:1 Mux Analog HDTV Audio/Video Switch ADG794

Quad SPDT ±15 V/+12 V Switches ADG1334

STANDARDIZED MILITARY DRAWING REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED M. A. Frye

0.35 Ω CMOS 1.65 V to 3.6 V Single SPDT Switch/2:1 MUX ADG839

STANDARD MICROCIRCUIT DRAWING MICROCIRCUIT, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY, TTL, DUAL CARRY-SAVE FULL ADDERS, MONOLITHIC SILICON

0.5 Ω CMOS 1.65 V to 3.6 V Dual SPDT/2:1 MUX ADG836L

Maxim Integrated Products 1

SGM4684 Chip Scale Packaging, Low-Voltage 0.4Ω, Dual, SPDT Analog Switch

DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited. DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO

Transcription:

REVISIONS LTR DESCRIPTION DTE PPROVED Prepared in accordance with SME Y14.24 Vendor item drawing REV PGE REV PGE REV STTUS OF PGES REV PGE 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/ PREPRED BY Phu H. Nguyen DL LND ND MRITIME 43218-3990 Original date of drawing YY MM DD CHECKED BY Phu H. Nguyen 11-01-19 PPROVED BY Thomas M. Hess TITLE MICROCIRCUIT, DIGITL, CMOS, ±% V/ +5V, 4 Ω, SINGLE SPDT SWITCH, MONOLITHIC SILICON CODE IDENT. NO. REV PGE 1 OF 12 MSC N/ 5962-V029-11

1. SCOPE 1.1 Scope. This drawing documents the general requirements of a high performance CMOS, ±5 V/ +5 V, 4 Ω, single SPDT switch microcircuit, with an operating temperature range of -40 C to +125 C. 1.2 Vendor Item Drawing dministrative Control Number. The manufacturer,s PIN is the item of identification. The vendor item drawing establishes an administrative control number for identifying the item on the engineering documentation: 1.2.1 Device type(s). - 01 X E Drawing Device type Case outline Lead finish number (See 1.2.1) (See 1.2.2) (See 1.2.3) Device type Generic Circuit function 01 DG619-EP CMOS, ±5 V/ +5 V, 4 Ω, single SPDT switch 1.2.2 Case outline(s). The case outlines are as specified herein. Outline letter Number of pins JEDEC PUB 95 Package style X 8 JEDEC MO-178 Small outline Package 1.2.3 Lead finishes. The lead finishes are as specified below or other lead finishes as provided by the device manufacturer: Finish designator B C D E Z Material Hot solder dip Tin-lead plate Gold plate Palladium Gold flash palladium Other DL LND ND MRITIME REV PGE 2

1.3 bsolute maximum ratings. 1/ Voltage referenced : V DD to V SS... 13.0 V V DD to GND... -0.3 V to +6.5 V V SS to GND... +0.3 V to -6.5 V nalog input 2/... V SS 0.3 V to V DD + 0.3 V Digital input 2/... -0.3 V to V DD + 0.3 V or 30 m (which ever occurs first) Peak current, S or D... 100 M (pulsed at 1 ms, 10% duty cycle mzximum) Continuous current, S or D... 50 m mbient operating temperature range... -55 C to +125 C Storage temperature range... -65 C to +150 C Maximum junction temperature (T J )... 150 C Thermal impedance: θ J... 229 C /W θ JC... 91.99 C /W Lead soldering: Reflow, peak temperature... 260(+0/-5) C Time at peak temperature... 20 sec to 40 sec 2. PPLICBLE DOCUMENTS JEDEC PUB 95 Registered and Standard Outlines for Semiconductor Devices (pplications for copies should be addressed to the Electronic Industries lliance, 3103 North 10 th St., Suite 240-S, rlington, V 22201-2107 or online at http://www.jedec.org) 3. REQUIREMENTS 3.1 Marking. Parts shall be permanently and legibly marked with the manufacturer s part number as shown in 6.3 herein and as follows:. Manufacturer s name, CGE code, or logo B. Pin 1 identifier C. ESDS identification (optional) 3.2 Unit container. The unit container shall be marked with the manufacturer s part number and with items and C (if applicable) above. 3.3 Electrical characteristics. The maximum and recommended operating conditions and electrical performance characteristics are as specified in 1.3, 1.4, and table I herein. 1/ Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device reliability. 2/ Overvoltage at IN, S or D are clamped by internal diodes. Current should be limited to the maximum ratings given. DL LND ND MRITIME REV PGE 3

3.4 Design, construction, and physical dimension. The design, construction, and physical dimensions are as specified herein. 3.5 Diagrams. 3.5.1 Case outline. The case outline shall be as shown in 1.2.2 and figure 1. 3.5.2 Terminal connections. The terminal connections shall be as shown in figure 2. 3.5.3 Functional block diagram. The functional block diagram shall be as shown in figure 3. 3.5.4 Truth table. The truth table shall be as shown in figure 4. 3.5.5 On Resistance. The On resistance shall be as shown in figure 5. 3.5.6 Off Leakage. The Off leakage shall be as shown in figure 6. 3.5.7 On Leakage. The On leakage shall be as shown in figure 7. 3.5.8 Switching times. The switching times shall be as shown in figure 8. 3.5.9 Break before making time delay. The break before making time delay shall be as shown in figure 9. 3.5.10 Charge injection. The charge injection shall be as shown in figure 10. 3.5.11 Off isolation. The Off isolation shall be as shown in figure 11. 3.5.12 Channel to channel crosstalk. The channel to channel crosstalk shall be as shown in figure 12. 3.5.13 Bandwidth. The bandwidth shall be as shown in figure 13. DL LND ND MRITIME REV PGE 4

TBLE I. Electrical performance characteristics. 1/ Test Symbol Test conditions Limits Unit 2/ T = 25 C -55 C T +125 C unless otherwise specified Min Max Min Max DUL SUPPLY nalog switch nalog signal range V DD = +4.5 V, V SS = -4.5 V V SS V DD V On resistance R ON V S = ±4.5 V, I DS = -10 m 6.5 10 Ω See figure 5 R ON Match between channels R ON V S = ±4.5 V, I DS = -10 m 1.1 1.45 On resistance flatness R FLT (ON)) V S = ±3.3 V, I DS = -10 m 1.35 1.6 Leakage currents (V DD = +5.5 V, V SS = -5.5 V) Source off leakage, I S (Off) V S = ±4.5 V, V D = ±4.5 V, ±0.25 ±3 n See figure 6 Channel On leakage, I D, I S V S = V D = ±4.5 V, ±0.25 ±25 (On) See figure 7 Digital inputs Input high voltage V INH 2.4 V Input low voltage V INL 0.8 Input current, I NL or I NH V IN = V INL or V INH 0.05 TYP ±0.1 µ Digital input capacitance C IN 2 TYP pf Dynamic characteristic 3/ t ON R L = 300 Ω, C L = 35 pf, 220 390 ns t OFF V S = 3.3 V, See figure 8 75 135 Break before make time delay t BBM R L = 300 Ω, C L = 35 pf, V S1 = V S2 = 3.3 V, See figure 9 70 TYP 10 Charge injection V S -= 0 V, R S = 0 Ω, C L = 1 nf, See figure 10 6 TYP pc Off isolation R L = 50 Ω, C L = 5 pf, f = 1 MHz, See figure 11-67 TYP db Channel to channel crosstalk R L = 50 Ω, C L = 5 pf, f = 1 MHz, See figure 12-67 TYP Bandwidth -3 db R L = 50 Ω, C L = 5 pf, See figure 13 190 TYP MHz C S (Off) f = 1 MHz 25 TYP pf C D, C S (On) 95 TYP Power requirements (V DD = +5.5 V, V SS = -5.5 V) I DD Digital inputs = 0 V or 5.5 V 0.001 TYP 1.0 µ I SS 0.001 TYP 1.0 µ See footnotes at end of table. DL LND ND MRITIME REV PGE 5

TBLE I. Electrical performance characteristics Continued. 1/ Test Symbol Test conditions Limits Unit 2/ T = 25 C -55 C T +125 C unless otherwise specified Min Max Min Max SINGLE SUPPLY nalog switch nalog signal range V DD = +4.5 V, V SS = -0 V 0 V DD V On resistance R ON V S = 0 V to 4.5 V, I DS = -10 m 10 14 Ω See figure 5 R ON Match between channels R ON V S = 0 V to 4.5 V, I DS = -10 m 1.1 1.4 On resistance flatness R FLT (ON)) V S =1.5 V to 3.3 V, I DS = -10 m 0.5 TYP 1.4 Leakage currents (V DD = +5.5 V) Source off leakage, I S (Off) V S = 1 V/4.5 V, V D = 4.5 V/1 V, See figure 6 ±0.25 ±3 n Channel On leakage, I D, I S V S = V D = ±4.5 V, ±0.25 ±25 (On) See figure 7 Digital inputs Input high voltage V INH 2.4 V Input low voltage V INL 0.8 Input current, I NL or I NH V IN = V INL or V INH 0.05 TYP ±0.1 µ Digital input capacitance C IN 2 TYP pf Dynamic characteristic 3/ t ON R L = 300 Ω, C L = 35 pf, 120 215 ns t OFF V S = 3.3 V, See figure 8 75 105 Break before make time delay t BBM R L = 300 Ω, C L = 35 pf, V S1 = V S2 = 3.3 V, See figure 9 40 TYP 10 Charge injection V S -= 0 V, R S = 0 Ω, C L = 1 nf, See figure 10 110 TYP pc Off isolation R L = 50 Ω, C L = 5 pf, f = 1 MHz, See figure 11-67 TYP db Channel to channel crosstalk R L = 50 Ω, C L = 5 pf, f = 1 MHz, See figure 12-67 TYP Bandwidth -3 db R L = 50 Ω, C L = 5 pf, See figure 13 190 TYP MHz C S (Off) f = 1 MHz 25 TYP pf C D, C S (On) 95 TYP Power requirements (V DD = +5.5 V) I DD Digital inputs = 0 V or 5.5 V 0.001 TYP 1.0 µ 1/ Testing and other quality control techniques are used to the extent deemed necessary to assure product performance over the specified temperature range. Product may not necessarily be tested across the full temperature range and all parameters may not necessarily be tested. In the absence of specific parametric testing, product performance is assured by characterization and/or design. 2/ V DD = 5 V ±10%, V SS = 0 V, GND = 0 V, -55 C T 125 C, unless otherwise noted. 3/ Guaranteed by design, not subject to production test. DL LND ND MRITIME REV PGE 6

Case X Dimensions Symbol Millimeters Symbol Millimeters Min Max Min Max 0.90 1.30 E 1.50 1.70 1 0.05 0.15 E1 2.60 3.00 2 0.95 1.45 e 0.65 BSC b 0.22 0.38 L 0.30 0.60 c 0.08 0.22 L1 0.60 BSC D 2.80 3.00 FIGURE 1. Case outline. DL LND ND MRITIME REV PGE 7

Case outline X Pin No. Mnemonic Description 1 D Drain terminal. Can be an input or output 2 S1 Source terminal. Can be an input or output 3 GND Ground (0 V) reference. 4 V DD Most positive power supply 5 NC No connect. Not internal connected. 6 IN Logic control input 7 V SS Most negative power supply. This pin is only used in dual supply applications and should be tied to ground in single supply applications. 8 S2 Source terminal. can be an input or output FIGURE 2. Terminal connections. FIGURE 3. Functional block diagram. IN Switch S1 Switch S2 0 On Off 1 Off On FIGURE 4. Truth table. DL LND ND MRITIME REV PGE 8

FIGURE 5. ON Resistance. FIGURE 6. OFF leakage. FIGURE 7. ON Leakage. FIGURE 8. Switching times. FIGURE 9. Break before make time delay. DL LND ND MRITIME REV PGE 9

FIGURE 10. Charge injection. FIGURE 11. Off isolation. DL LND ND MRITIME REV PGE 10

FIGURE 12. Channel to channel crosstalk. FIGURE 13. Bandwidth. DL LND ND MRITIME REV PGE 11

4. VERIFICTION 4.1 Product assurance requirements. The manufacturer is responsible for performing all inspection and test requirements as indicated in their internal documentation. Such procedures should include proper handling of electrostatic sensitive devices, classification, packaging, and labeling of moisture sensitive devices, as applicable. 5. PREPRTION FOR DELIVERY 5.1 Packaging. Preservation, packaging, labeling, and marking shall be in accordance with the manufacturer s standard commercial practices for electrostatic discharge sensitive devices. 6. NOTES 6.1 ESDS. Devices are electrostatic discharge sensitive and are classified as ESDS class 1 minimum. 6.2 Configuration control. The data contained herein is based on the salient characteristics of the device manufacturer s data book. The device manufacturer reserves the right to make changes without notice. This drawing will be modified as changes are provided. 6.3 Suggested source(s) of supply. Identification of the suggested source(s) of supply herein is not to be construed as a guarantee of present or continued availability as a source of supply for the item. Vendor item drawing administrative control number 1/ Device manufacturer CGE code Vendor part number -01XE 24355 DG619SRJZ-EP-RL7 1/ The vendor item drawing establishes an administrative control number for identifying the item on the engineering documentation. CGE code Source of supply 24355 nalog Devices Rt 1 Industrial Park PO Box 9106 Norwood, M 02062 Point of contact: 7910 Triad Center Drive Greensboro, NC 27409-9605 DL LND ND MRITIME REV PGE 12