Improved etaloning characteristics, High-speed type and low noise type available The are back-thinned CCD image sensors designed for spectrometers. Two types consisting of a high-speed type (S11071 series) and low noise type (S1040-01 series) are available with improved etaloning characteristics. The offer nearly flat spectral response characteristics with high quantum efficiency from the U to near infrared region. Features Improved etaloning characteristics High sensitivity over a wide spectral range and nearly flat spectral response characteristics High CCD node sensitivity: 8 μ/e- (S11071 series) 6.5 μ/e- (S1040-01 series) High full well capacity and wide dynamic range (with anti-blooming function) Pixel size: 14 14 μm Applications Spectrometers, etc. Selection guide Type No. Number of total pixels Number of active pixels Active area [mm (H) mm ()] S11071-1004 1044 104 16 14.336 0.4 S11071-1006 1044 70 104 64 14.336 0.896 S11071-1104 068 048 16 8.67 0.4 S11071-1106 068 70 048 64 8.67 0.896 S1040-1004-01 1044 104 16 14.336 0.4 S1040-1006-01 1044 70 104 64 14.336 0.896 S1040-1104-01 068 048 16 8.67 0.4 S1040-1106-01 068 70 048 64 8.67 0.896 Readout speed max. (MHz) Applicable driver circuit 10 C1188 0.5 C1187 Improved etaloning characteristics Etaloning is an interference phenomenon that occurs when the light incident on a CCD repeatedly reflects between the front and back surfaces of the CCD while being attenuated, and causes alternately high and low sensitivity. When long-wavelength light enters a backthinned CCD, etaloning occurs due to the relationship between the silicon substrate thickness and the absorption length. The S11071/ S1040-01 series back-thinned CCDs have achieved a significant improvement in etaloning by using a unique structure that is unlikely to cause interference. Etaloning characteristics (typical example) Relative sensitivity (%) (Ta=5 C) 110 100 Etaloning-improved type 90 80 70 60 Conventional type 50 40 30 0 10 0 900 910 90 930 940 950 960 970 980 990 1000 Wavelength (nm) KMPDB084EA www.hamamatsu.com 1
General ratings Parameter S11071 series S1040-01 series Pixel size 14 (H) 14 () μm ertical clock phase -phase Horizontal clock phase 4-phase Output circuit Two-stage MOSFET source follower One-stage MOSFET source follower Package 4-pin ceramic DIP (refer to dimensional outline) Window* 1 Quartz glass *1: Temporary window type (ex: S11071-1106N, S1040-1106N-01) is available upon request. Absolute maximum ratings (Ta=5 C) Parameter Symbol Min. Typ. Max. Unit Operating temperature* Topr -50 - +50 C Storage temperature Tstg -50 - +70 C OD voltage S11071 series -0.5 - +5 OD S1040-01 series -0.5 - +30 RD voltage RD -0.5 - +18 ret voltage ret -0.5 - +18 OFD voltage OFD -0.5 - +18 IS/ISH voltage IS, ISH -0.5 - +18 OFG voltage OFG -10 - +15 IG voltage IG1, IG -10 - +15 IGH voltage IG1H, IGH -10 - +15 SG voltage SG -10 - +15 OG voltage OG -10 - +15 RG voltage RG -10 - +15 TG voltage TG -10 - +15 ertical clock voltage P1, P -10 - +15 Horizontal clock voltage P1H, PH P3H, P4H -10 - +15 *: Chip temperature Operating conditions (MPP mode, Ta=5 C) Parameter Symbol S11071 series S1040-01 series Min. Typ. Max. Min. Typ. Max. Unit Output transistor drain voltage OD 1 15 18 3 4 5 Reset drain voltage RD 14 15 16 11 1 13 Over flow drain voltage OFD 11 1 13 11 1 13 Over flow gate voltage OFG 0 13 14 0 1 13 Output gate voltage OG 4 5 6 4 5 6 Substrate voltage SS - 0 - - 0 - Output amplifier return voltage ret - 1 Input source IS, ISH - RD - - RD - Test point ertical input gate IG1, IG -9-8 - -9-8 - Horizontal input gate IG1H, IGH -9-8 - -9-8 - ertical shift register clock voltage High P1H, PH 4 6 8 4 6 8 Low P1L, PL -9-8 -7-9 -8-7 Horizontal shift register clock voltage High P1HH, PHH P3HH, P4HH 4 6 8 4 6 8 Low P1HL, PHL P3HL, P4HL -6-5 -4-6 -5-4 Summing gate voltage High SGH 4 6 8 4 6 8 Low SGL -6-5 -4-6 -5-4 Reset gate voltage High RGH 4 6 8 4 6 8 Low RGL -6-5 -4-6 -5-4 Transfer gate voltage High TGH 4 6 8 4 6 8 Low TGL -9-8 -7-9 -8-7 External load resistance RL.0..4 90 100 110 kω
Electrical characteristics (Ta=5 C) Parameter Symbol S11071 series S1040-01 series Min. Typ. Max. Min. Typ. Max. Unit Signal output frequency* 3 fc - 5 10-0.5 0.5 MHz -1004(-01) - 00 - - 00 - ertical shift register -1006(-01) - 600 - - 600 - CP1, CP capacitance -1104(-01) - 400 - - 400 - pf -1106(-01) - 100 - - 100 - Horizontal shift register -1004(-01)/-1006(-01) CP1H, CPH - 80 - - 80 - capacitance -1104(-01)/-1106(-01) CP3H, CP4H - 160 - - 160 - pf Summing gate capacitance CSG - 10 - - 10 - pf Reset gate capacitance CRG - 10 - - 10 - pf Transfer gate capacitance -1004(-01)/-1006(-01) - 30 - - 30 - CTG -1104(-01)/-1106(-01) - 60 - - 60 - pf Charge transfer efficiency* 4 CTE 0.99995 0.99999-0.99995 0.99999 - - DC output level* 3 out 7 8 9 17 18 19 Output impedance* 3 Zo - 0.3 - - 10 - kω Power consumption* 3, * 5 P - 75 - - 4 - mw *3: The values depend on the load resistance. (S11071 series: OD=15, RL=. kω, S1040-01 series: OD=4, RL=100 kω) *4: Charge transfer efficiency per pixel, measured at half of the full well capacity *5: Power consumption of the on-chip amplifier plus load resistance Electrical and optical characteristics (Ta=5 C, unless otherwise noted) Parameter Symbol S11071 series S1040-01 series Min. Typ. Max. Min. Typ. Max. Unit Saturation output voltage sat - Fw Sv - - Fw Sv - Full well capacity ertical 50 60-50 60 - Fw Horizontal 150 00-50 300 - ke - CCD node sensitivity* 6 Sv 7 8 9 5.5 6.5 7.5 μ/e - Dark current* 7 DS - 50 500-50 500 e - /pixel/s Readout noise* 8 Nr - 3 8-6 15 e - rms Dynamic range* 9 Line binning DR 650 8700-41700 50000 - - Spectral response range λ - 00 to 00 to - - 1100 1100 - nm Photo response non-uniformity* 10 PRNU - ±3 ±10 - ±3 ±10 % *6: The values depend on the load resistance. (S11071 series: OD=15, RL=. kω, S1040-01 series: OD=4, RL=100 kω) *7: Dark current is reduced to half for every 5 to 7 C decrease in temperature. *8: S11071 series: readout frequency MHz, S1040-01 series (temperature: -40 C): 0 khz *9: Dynamic range (DR) = Full well capacity / Readout noise *10: Measured at one-half of the saturation output (full well capacity) using LED light (peak emission wavelength: 660 nm) Photo response non-uniformity = Fixed pattern noise (peak to peak) Signal 100 [%] 3
Spectral response (without window)* 11 Spectral transmittance characteristic of window material 100 (Typ. Ta=5 C) 100 (Typ. Ta=5 C) 90 80 80 Quantum efficiency (%) 60 40 Transmittance (%) 70 60 50 40 30 0 0 10 0 00 400 600 800 1000 Wavelength (nm) 100 KMPDB0316EA 0 100 00 300 400 500 600 700 800 900 10001100100 Wavelength (nm) KMPDB0303EA *11: Spectral response with quartz glass is decreased according to the spectral transmittance characteristic of window material. Dark current vs. temperature Window material 100 (Typ.) Type No. S1040-01 series S11071 series *1: Resin sealing Window material Quartz glass* 1 (option: window-less) Dark current (e-/pixel/s) 10 1 0.1 0.01-50 -40-30 -0-10 0 10 0 30 Temperature ( C) KMPDB0304EA 4
Device structure (conceptual drawing of top view in dimensional outline) S11071 series Thinning 3 1 0 19 18 17 16 Thinning 4 1 64 5 4 3 1 3 4 5 104 15 14 13 4-bevel -bevel n signal output =16, 64 H=104, 048 3 4 5 6 7 8 9 10 11 1 4 blank pixels n signal output 4 blank pixels 6-bevel 6-bevel KMPDC0343EA S1040-01 series Thinning 3 1 0 19 18 17 16 Thinning 4 1 64 5 4 3 1 3 4 5 104 15 14 13 4-bevel -bevel n signal output =16, 64 H=104, 048 3 4 5 6 7 8 9 10 11 1 4 blank pixels n signal output 4 blank pixels 6-bevel 6-bevel KMPDC069EB 5
Timing chart (line binning) Integration time ertical binning period Readout period (shutter has to be open) (shutter has to be closed) (shutter has to be closed) P1 P, TG P1H Tpwv 1 3...1 16 + 6 (bevel): S11071/S1040-1004, -1104 3...69 70 64 + 6 (bevel): S11071/S1040-1006, -1106 Tovr Tpwh, Tpws Tovrh 1 3 4...1043 1044: S11071/S1040-1004, -1006 4...067 068: S11071/S1040-1104, -1106 PH P3H P4H, SG RG Tpwr OS D1 D D19 D0 D3...D10, S1...S104, D11...D0: S11071/S1040-1004, -1006 S1...S048 : S11071/S1040-1104, -1106 KMPDC070EC Parameter Symbol S11071 series S1040-01 series Min. Typ. Max. Min. Typ. Max. Unit P1, P, TG Pulse width * 13 Tpwv 1 8-6 8 - μs Rise and fall time * 13 Tprv, Tpfv 0 - - 0 - - ns Pulse width * 13 Tpwh 50 100-1000 000 - ns P1H, PH, P3H, P4H Rise and fall time * 13 Tprh, Tpfh 10 - - 10 - - ns Pulse overlap time Tovrh 5 50-500 1000 - ns Duty ratio * 13-40 50 60 40 50 60 % Pulse width * 13 Tpws 50 100-1000 000 - ns SG Rise and fall time * 13 Tprs, Tpfs 10 - - 10 - - ns Pulse overlap time Tovrh 5 50-500 1000 - ns Duty ratio * 13-40 50 60 40 50 60 % RG Pulse width Tpwr 5 50-100 1000 - ns Rise and fall time Tprr, Tpfr 5 - - 5 - - ns TG-P1H Overlap time Tovr 1-1 - μs *13: Symmetrical clock pulses should be overlapped at 50% of maximum amplitude. 6
Dimensional outline (unit: mm) A 3.3 ± 0.35 4 13 B Index mark 1 1 7.94 ± 0.3 38.10 ± 0.4 10.03 ± 0.3 10.41 ± 0.5 +0.05 0.5-0.03 1.7 ± 0.5 3.0 ± 0.5 Index mark 0.46 ± 0.05 1.7 ± 0..54 ± 0.13 Photosensitive surface 1.7 ± 0.17 1.47 S11071/ S1040 Type No. A -1004(-01) 14.336 (H) -1006(-01) 14.336 (H) -1104(-01) 8.67 (H) Active area B 0.4 () 0.896 () 0.4 () -1106(-01) 8.67 (H) 0.896 () KMPDA03EC 7
Pin connections S11071 series Pin No. Symbol Function Remark (standard operation) 1 OS Output transistor source RL=. kω OD Output transistor drain +15 3 OG Output gate +5 4 SG Summing gate Same pulse as P4H 5 ret Output amplifier return +1 6 RD Reset drain +15 7 P4H CCD horizontal register clock-4 8 P3H CCD horizontal register clock-3 9 PH CCD horizontal register clock- 10 P1H CCD horizontal register clock-1 11 IGH Test point (horizontal input gate-) -8 1 IG1H Test point (horizontal input gate-1) -8 13 OFG Over flow gate +13 14 OFD Over flow drain +1 15 ISH Test point (horizontal input source) Connect to RD 16 IS Test point (vertical input source) Connect to RD 17 SS Substrate GND 18 RD Reset drain +15 19 IG Test point (vertical input gate-) -8 0 IG1 Test point (vertical input gate-1) -8 1 P CCD vertical register clock- P1 CCD vertical register clock-1 3 TG Transfer gate Same pulse as P 4 RG Reset gate S1040-01 series Pin No. Symbol Function Remark (standard operation) 1 OS Output transistor source RL=100 kω OD Output transistor drain +4 3 OG Output gate +5 4 SG Summing gate Same pulse as P4H 5 SS Substrate GND 6 RD Reset drain +1 7 P4H CCD horizontal register clock-4 8 P3H CCD horizontal register clock-3 9 PH CCD horizontal register clock- 10 P1H CCD horizontal register clock-1 11 IGH Test point (horizontal input gate-) -8 1 IG1H Test point (horizontal input gate-1) -8 13 OFG Over flow gate +1 14 OFD Over flow drain +1 15 ISH Test point (horizontal input source) Connect to RD 16 IS Test point (vertical input source) Connect to RD 17 SS Substrate GND 18 RD Reset drain +1 19 IG Test point (vertical input gate-) -8 0 IG1 Test point (vertical input gate-1) -8 1 P CCD vertical register clock- P1 CCD vertical register clock-1 3 TG Transfer gate Same pulse as P 4 RG Reset gate 8
Precaution for use (electrostatic countermeasures) Handle these sensors with bare hands or wearing cotton gloves. In addition, wear anti-static clothing or use a wrist band with an earth ring, in order to prevent electrostatic damage due to electrical charges from friction. Avoid directly placing these sensors on a work-desk or work-bench that may carry an electrostatic charge. Provide ground lines or ground connection with the work-floor, work-desk and work-bench to allow static electricity to discharge. Ground the tools used to handle these sensors, such as tweezers and soldering irons. It is not always necessary to provide all the electrostatic measures stated above. Implement these measures according to the amount of damage that occurs. Driver circuits for CCD image sensor (S1040-01/S11071 series) C1187/C1188 [sold separately] The C1187, C1188 are driver circuits designed for HAMAMATSU CCD image sensors S1040-01/S11071 series. The C1187, C1188 can be used in spectrometers, etc. when combined with the CCD image sensor. Features Built-in 14-bit A/D converter Interface to computer: USB.0 Power supply: USB bus power operation (C1187) DC+5 operation (C1188) C1187 C1188 Information furnished by HAMAMATSU is believed to be reliable. However, no responsibility is assumed for possible inaccuracies or omissions. Specifications are subject to change without notice. No patent rights are granted to any of the circuits described herein. Type numbers of products listed in the specification sheets or supplied as samples may have a suffix (X) which means tentative specifications or a suffix (Z) which means developmental specifications. 010 Hamamatsu Photonics K.K. www.hamamatsu.com HAMAMATSU PHOTONICS K.K., Solid State Division 116-1 Ichino-cho, Higashi-ku, Hamamatsu City, 435-8558 Japan, Telephone: (81) 53-434-3311, Fax: (81) 53-434-5184 U.S.A.: Hamamatsu Corporation: 360 Foothill Road, P.O.Box 6910, Bridgewater, N.J. 08807-0910, U.S.A., Telephone: (1) 908-31-0960, Fax: (1) 908-31-118 Germany: Hamamatsu Photonics Deutschland GmbH: Arzbergerstr. 10, D-811 Herrsching am Ammersee, Germany, Telephone: (49) 815-375-0, Fax: (49) 815-65-8 France: Hamamatsu Photonics France S.A.R.L.: 19, Rue du Saule Trapu, Parc du Moulin de Massy, 9188 Massy Cedex, France, Telephone: 33-(1) 69 53 71 00, Fax: 33-(1) 69 53 71 10 United Kingdom: Hamamatsu Photonics UK Limited: Howard Court, 10 Tewin Road, Welwyn Garden City, Hertfordshire AL7 1BW, United Kingdom, Telephone: (44) 1707-94888, Fax: (44) 1707-35777 North Europe: Hamamatsu Photonics Norden AB: Smidesvägen 1, SE-171 41 Solna, Sweden, Telephone: (46) 8-509-031-00, Fax: (46) 8-509-031-01 Italy: Hamamatsu Photonics Italia S.R.L.: Strada della Moia, 1 int. 6, 000 Arese, (Milano), Italy, Telephone: (39) 0-935-81-733, Fax: (39) 0-935-81-741 Cat. No. KMPD110E04 Aug. 010 DN 9