Lecture 26 - Design Problems & Wrap-Up. May 15, 2003

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6.012 Microelectronic Devices and Circuits - Spring 2003 Lecture 26-1 Lecture 26 - Design Problems & 6.012 Wrap-Up May 15, 2003 Contents: 1. Design process 2. Design project pitfalls 3. Lessons learned from design project 4. 6.012 Wrap-Up Annoucements: Pick up your design projects after lecture today. Final review session Wednesday, May 21, 7-9pm. Final Exam: May 23, 1:30-4:30 PM; open book, calculator required; entire subject under examination but emphasis on lectures #18-26.

6.012 Microelectronic Devices and Circuits - Spring 2003 Lecture 26-2 Key questions What is design all about? How do we approach a design problem? How can we use simulation tools to help? What were some pitfalls and lessons learned from the 6.012 design project? What did we learn in 6.012, and where do I go from here?

6.012 Microelectronic Devices and Circuits - Spring 2003 Lecture 26-3 1. Design Problems Design a circuit or system to meet real-world specifications. A few modern-day examples: Optical receiver for communications (6.012) Imagers for digital cameras (Pablo) Circuits for cell phones (Susan) Amplifier for ultrasound systems TV tuner, cable modem Microprocessors

6.012 Microelectronic Devices and Circuits - Spring 2003 Lecture 26-4 Generic Design Process Understand system & important specifications* If sims are way off or don t depend on your design parameters in the right way, go back and revise your understanding! Guided by your solid understanding Topology to meet specifications Understand trade-offs Initial design values (hand calculations) Simulate to verify design Revise design parameters Final design, build & test * Engineering principle: You can t have everything! Must understand what s most important and then make trade-offs in your design.

6.012 Microelectronic Devices and Circuits - Spring 2003 Lecture 26-5 2. Optical Receiver Design Project Transimpedance Limiting Amplifier (or Saturating) Amplifier V 2 Output Driver V out Optical Fiber I light NMOS or PMOS transistor in the linear regime C load =50fF Key Specs: large swing small swing A v large V M t p low NM high Minimize power & area where possible. There are 28 W s and L s in this problem, and at least 6 key specs. How do we get started??

6.012 Microelectronic Devices and Circuits - Spring 2003 Lecture 26-6 Getting Started Transimpedance Limiting Amplifier (or Saturating) Amplifier V 2 Output Driver V out Optical Fiber I light NMOS or PMOS transistor in the linear regime C load =50fF Define boundaries between the stages. As long as we use a realistic input driving source and output load, we can design each stage independent of the others. Analyze each stage and understand how the specifications change with the W s and L s. Design the W s and L s to meet the specifications. Put the stages back together and verify the complete design.

6.012 Microelectronic Devices and Circuits - Spring 2003 Lecture 26-7 Transimpedance Amplifier I1 I light R 2.5V 0 1µs 2µs > 0.1V pp < 10mV pp time Since and have small swing, the small signal model is a good/bad model for the transimpedance amplifier. I light R + - (g mn +g mp ) r on r op Does =A v, = /A v where A v =-(g mn +g mp )r on r op? This says for small, A v means This is true for an open-loop inverter, but is this true for a transimpedance amplifier?? Need to consider closed loop system:

6.012 Microelectronic Devices and Circuits - Spring 2003 Lecture 26-8 How do we implement the resistor? 10µA I light I1 0 1µs 2µs time I light R 2.5V 0 1µs 2µs > 0.1V pp < 10mV pp time Want R as constant as possible over the range of I light values, i.e. R as linear as possible. R 0 10µA I light

6.012 Microelectronic Devices and Circuits - Spring 2003 Lecture 26-9 NMOS vs. PMOS I1 2.5V NMOS 0 1µs 2µs > 0.1V pp < 10mV pp time PMOS I1 I light I light I dn -I dp V dsn V sdp Where do the transistors look most like resistors? V ds V gs -V tn V gs -V tn = V dsmax = I light =0 I light =10µA V sd V sg +V tp V sg +V tp = V sdmax = I light =0 I light =10µA Are we in danger of going out of the linear regime?

6.012 Microelectronic Devices and Circuits - Spring 2003 Lecture 26-10 NMOS PMOS I1 I1 I light I light In the linear regime, I dn = W ---- µ L n C ox V gs V tn V ds -------- Vds 2 In the linear regime, W V sd I dp = ---- µ L p C ox V sg + V -------- tp Vsd 2 1 - R di dn = ------------ = W ---- µ dv ds L n C ox ( V gs V tn V ds ) 1 - R di dp -------------- W = = ---- µ dv sd L p C ox ( V sg + V tp V sd ) R = 1 ------------------------------------------------------------------- W ---- µ L n C ox ( V gs V tn V ds ) R = 1 ------------------------------------------------------------------- W ---- µ L p C ox ( V sg + V tp V sd ) R 1 = ---------------------------------------------------- R W ---- µ L n C ox ( V gd V tn ) = 1 ---------------------------------------------------- W ---- µ L p C ox ( V dg + V tp ) What makes R non-linear?

6.012 Microelectronic Devices and Circuits - Spring 2003 Lecture 26-11 What about the bulk connection? I1 I light 2.5V 0 1µs 2µs > 0.1V pp < 10mV pp time Choices: G D S V dd Ground If we choose V tp V tp with V sb V tp = V tpo γ 2φ n + V sb 2φ n R = 1 ------------------------------------------------------------------------------------------------------------------- W ---- µ L p C ox ( V dg γ 2φ n + V sb + V tpo 2φ n )

6.012 Microelectronic Devices and Circuits - Spring 2003 Lecture 26-12 High Gain Stage 2.6V 2.5V I2 V 2 C in3 0 1µs 2µs time Key specs: V M, A v V M : A v =-(g mn +g mp )r on r op How does A v depend on W and L?

6.012 Microelectronic Devices and Circuits - Spring 2003 Lecture 26-13 Output Driver V 2 0 1µs 2µs time V 2 I3 V out C load=50ff Key specs: NM, t p NM: How does t p depend on W/L?

6.012 Microelectronic Devices and Circuits - Spring 2003 Lecture 26-14 Power Dissipation I1 V 2 I2 I3 V out I light C load =50fF A. Dynamic Power Dynamic power dissipated by charging and discharging capacitors over time. Dynamic Power: P = C V sw 2 f V sw V 2 V 3 B. Static Power Static power is current flowing all the time. P=V DD *I Which stage has constant current?

6.012 Microelectronic Devices and Circuits - Spring 2003 Lecture 26-15 Going back After we ve done the first pass design, go back and try to minimize power and area. Minimum area: Minimum static power: Minimum dynamic power:

6.012 Microelectronic Devices and Circuits - Spring 2003 Lecture 26-16 Using HSPICE to verify the design Simulators: Model 2nd and 3rd order effects, all the things that are hard to calculate by hand. Allow final tweaking of parameters to ensure the specs are met. Verify the design before we spend lots of $$ to implement it. Build margin into the design for inadequacies in device modeling, process variations, temperature variations, etc. Simulators do not: Replace our understanding of the circuit! If the simulator doesn t show the dependency we expect, we need to revise our understanding.

6.012 Microelectronic Devices and Circuits - Spring 2003 Lecture 26-17 Design Process Understand system & important specifications* If sims are way off or don t depend on your design parameters in the right way, go back and revise your understanding! Guided by your solid understanding Topology to meet specifications Understand tradeoffs Initial design values (hand calculations) Simulate to verify design Revise design parameters Final design, build & test

6.012 Microelectronic Devices and Circuits - Spring 2003 Lecture 26-18 3. Lessons learned from 6.012 design project Break large problems into smaller pieces. You can t have everything - need to understand the trade-offs in your design. Simulators are an essential tool to verify your design and your understanding. Design problems have many issues to think about, it s important to get an early start. State-of-the art tools have bugs, the networks will crash, customers will change specs, etc. Things will always come up... There s no procrastinating in this business!

6.012 - Microelectronic Devices and Circuits - Spring 2003 Lecture 26-19 4. Wrap up of 6.012 The amazing properties of Si two types of carriers: electrons and holes [although can make good electronic devices with just one, i.e. MESFET; but can t do CMOS without two] carrier concentrations can be controlled over many orders of magnitude and in short length scales by addition of dopants carrier concentrations can be controlled electrostatically carriers are fast: electrons can cross L =0.1 µm in about: τ = L 0.1 µm = v e 10 7 cm/s =1ps high current density: J e = qnv e =1.6 10 19 C 10 17 cm 3 =1.6 10 5 A/cm 2 high current drivability to capacitance ratio extraordinary physical and chemical properties 10 7 cm/s

6.012 - Microelectronic Devices and Circuits - Spring 2003 Lecture 26-20 The amazing properties of Si MOSFET ideal properties of Si/SiO 2 interface: can drive surface all the way from accumulation to inversion [not possible in GaAs, for example] performance improves as MOSFET scales down in size; as L, W : current: capacitance: I D = W 2L µc ox(v GS V T ) 2 unchanged C gs = WLC ox figure of merit for device switching delay: No gate current. V T can be engineered. C gs V DD I D = L 2 2V DD µ(v GS V T ) 2 MOSFETs come in two types: NMOS and PMOS. Easy to integrate.

6.012 - Microelectronic Devices and Circuits - Spring 2003 Lecture 26-21 The amazing properties of Si CMOS Rail-to-rail logic: logic levels are 0 and V DD. No power consumption while idling in any logic state. Scales well. As L, W : Power consumption (all dynamic): P diss = fc L V 2 DD fwlc ox V 2 DD Propagation delay: t P Logic density: C L V DD W L µc ox(v DD V T ) 2 Density 1 A = 1 WL

6.012 - Microelectronic Devices and Circuits - Spring 2003 Lecture 26-22 All this is enabling the electronics revolution: exponential growth in complexity and functionality of integrated circuits [Moore s Law] exponential decrease in power per function and cost per function of integrated circuits profound penetration of IC technology into all aspects of human society

6.012 - Microelectronic Devices and Circuits - Spring 2003 Lecture 26-23 Circuit design lessons from 6.012: 1. Importance of optimum level of abstraction: device physics equations, i.e.: I D = W 2L µc ox(v GS V T ) 2, etc. device equivalent circuit models, i.e.: G + C gd i d D v gs Cgs C gb - S - v bs g m v gs g mb v bs ro C sb + B C db device SPICE models, i.e.: drain gate I D + q GD v GD + + q GS q BD + RD D v BD + IS I DS (V GS, V DS, V BS ) IS S v BS' + bulk + q GB RS q BS + source

6.012 - Microelectronic Devices and Circuits - Spring 2003 Lecture 26-24 2. Many considerations in circuit design: multiple performance specs: in analog systems: gain, bandwidth, power consumption, swing, noise, etc. in digital systems: propagation delay, power, ease of logic synthesis, noise, etc. need to be immune to temperature variations and device parameter variations (i.e.: differential amplifier) must choose suitable technology: CMOS, BJT, CBJT, BiCMOS, etc. must avoid costly components (i.e.: resistors, capacitors) 3. Trade-offs: gain-bandwidth trade-off in amplifiers (i.e.: Miller effect) performance-power trade-off (i.e.: delay in logic circuits, gain in amplifiers) performance-cost trade-off (cost=design complexity, Si area, more aggressive technology) accuracy-complexity trade-off in modeling

6.012 - Microelectronic Devices and Circuits - Spring 2003 Lecture 26-25 Exciting times ahead in Si IC technology: analog electronics (since 50 s): amplifiers, mixers, oscillators, DAC, ADC, etc. digital electronics (since 60 s): computers, microcontrollers, random logic, DSP solid-state memory (since 60 s): dynamic randomaccess memory, non-volatile RAM energy conversion (since 70 s): solar cells, photodetectors power control (since 70 s): smart power communications (since 80 s): VHF, UHF, RF front ends, modems, fiber-optic systems sensing, imaging (since 80 s): CCD cameras, CMOS cameras, many kinds of sensors micro-electro-mechanical systems (since 90 s): accelerometers, movable mirror displays biochip (from 2000): DNA sequencing, µfluidics vacuum microelectronics (from 2000?): field-emitter displays??????? (microreactors, microturbines, etc.)

6.012 - Microelectronic Devices and Circuits - Spring 2003 Lecture 26-26 Exciting times ahead in circuit design too: Numbers of transistors available outstrips ability to design by 3 to 1! Operational frequency of logic, analog, and communications circuits increasing very fast. Operational voltage shrinking quickly. New device technologies: GaAs HEMT, InP HBT, etc.

6.012 - Microelectronic Devices and Circuits - Spring 2003 Lecture 26-27 More subjects in microelectronics at MIT 6.152J - Microelectronics Processing Technology. Theory and practice of IC technology. Carried out in clean rooms of Microsystems Technology Laboratories. Fulfills Institute or EECS Lab requirement. Fall and Spring. 6.301 - Solid-State Circuits. Analog circuit design. Design project. Spring. 6.334 - Power Electronics. Power electronics devices and circuits. Spring. H-level. 6.374 - Analysis and Design of Digital Integrated Circuits. Digital circuit design. Design projects. Fall. H-level. 6.720J - Integrated Microelectronic Devices. Microelectronic device physics and design. Emphasis on MOSFET. Design project. Fall. H-level. 6.775 - Design of Analog MOS LSI. Analog circuit design based on MOSFETs. Design project. Fall. H-level.