250V N-Channel MOSFET General Description These N-Channel enhancement mode power field effect transistors are produced using Fairchild s proprietary, planar stripe, DMOS technology. This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high efficiency switching DC/DC converters, switch mode power supplies, DC-AC converters for uninterrupted power supplies and motor controls. Features 8.8A, 250V, R DS(on) = 0.43Ω @ = 10 V Low gate charge ( typical 26.5 nc) Low Crss ( typical 45.5 pf) Fast switching 100% avalanche tested Improved dv/dt capability QFET D G D S TO-220 FQP Series G D S TO-220F FQPF Series G S Absolute Maximum Ratings T C = 25 C unless otherwise noted Symbol Parameter FQP9N25C FQPF9N25C Units S Drain-Source Voltage 250 V Drain Current - Continuous (T C = 25 C) 8.8 8.8 * A - Continuous (T C = 100 C) 5.6 5.6 * A M Drain Current - Pulsed (Note 1) 35.2 35.2 * A S Gate-Source Voltage ± 30 V E AS Single Pulsed Avalanche Energy (Note 2) 285 mj I AR Avalanche Current (Note 1) 8.8 A E AR Repetitive Avalanche Energy (Note 1) 7.4 mj dv/dt Peak Diode Recovery dv/dt (Note 3) 5.5 V/ns P D Power Dissipation (T C = 25 C) 74 38 W - Derate above 25 C 0.59 0.3 W/ C T J, T STG Operating and Storage Temperature Range -55 to +150 C Maximum lead temperature for soldering purposes, T L 1/8" from case for 5 seconds * Drain current limited by maximum junction temperature. Thermal Characteristics 300 C Symbol Parameter FQP9N25C FQPF9N25C Units R θjc Thermal Resistance, Junction-to-Case 1.69 3.29 C/W R θjs Thermal Resistance, Case-to-Sink Typ. 0.5 -- C/W R θja Thermal Resistance, Junction-to-Ambient 62.5 62.5 C/W
Electrical Characteristics T C = 25 C unless otherwise noted Symbol Parameter Test Conditions Min Typ Max Units Off Characteristics BS Drain-Source Breakdown Voltage = 0 V, = 250 µa 250 -- -- V BS Breakdown Voltage Temperature I / T J Coefficient D = 250 µa, Referenced to 25 C -- 0.30 -- V/ C SS = 250 V, = 0 V -- -- 10 µa Zero Gate Voltage Drain Current = 200 V, T C = 125 C -- -- 100 µa I GSSF Gate-Body Leakage Current, Forward = 30 V, = 0 V -- -- 100 na I GSSR Gate-Body Leakage Current, Reverse = -30 V, = 0 V -- -- -100 na On Characteristics (th) Gate Threshold Voltage =, = 250 µa 2.0 -- 4.0 V R DS(on) Static Drain-Source V On-Resistance GS = 10 V, = 4.4 A -- 0.35 0.43 Ω g FS Forward Transconductance = 40 V, = 4.4 A (Note 4) -- 7.0 -- S Dynamic Characteristics C iss Input Capacitance = 25 V, = 0 V, -- 545 710 pf C oss Output Capacitance f = 1.0 MHz -- 115 150 pf C rss Reverse Transfer Capacitance -- 45.5 60 pf Switching Characteristics t d(on) Turn-On Delay Time -- 15 40 ns V DD = 125 V, = 8.8 A, t r Turn-On Rise Time R G = 25 Ω -- 85 180 ns t d(off) Turn-Off Delay Time -- 90 190 ns t f Turn-Off Fall Time (Note 4, 5) -- 65 140 ns Q g Total Gate Charge = 200 V, = 8.8 A, -- 26.5 35 nc Q gs Gate-Source Charge = 10 V -- 3.5 -- nc Q gd Gate-Drain Charge (Note 4, 5) -- 13.5 -- nc Drain-Source Diode Characteristics and Maximum Ratings I S Maximum Continuous Drain-Source Diode Forward Current -- -- 8.8 A I SM Maximum Pulsed Drain-Source Diode Forward Current -- -- 35.2 A V SD Drain-Source Diode Forward Voltage = 0 V, I S = 8.8 A -- -- 1.5 V t rr Reverse Recovery Time = 0 V, I S = 8.8 A, -- 218 -- ns Q rr Reverse Recovery Charge di F / dt = 100 A/µs (Note 4) -- 1.58 -- µc Notes: 1. Repetitive Rating : Pulse width limited by maximum junction temperature 2. L = 5.9mH, I AS = 8.8A, V DD = 50V, R G = 25 Ω, Starting T J = 25 C 3. I SD 8.8A, di/dt 300A/µs, V DD BS, Starting T J = 25 C 4. Pulse Test : Pulse width 300µs, Duty cycle 2% 5. Essentially independent of operating temperature
Typical Characteristics 10 1 Top : 15.0 V 10.0 V 8.0 V 7.0 V 6.5 V 6.0 V 5.5 V 5.0 V Bottom : 4.5 V 1. 250µ s Pulse Test 2. T C = 25 10 1 150 o C 25 o C -55 o C 1. = 40V 2. 250µ s Pulse Test 10 1, Drain-Source Voltage [V] 2 4 6 8 10, Gate-Source Voltage [V] Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics 1.25 R DS(ON) [Ω ], Drain-Source On-Resistance 1.00 0.75 0.50 0.25 = 10V = 20V Note : T = 25 J R, Reverse Drain Current [A] 10 1 150 25 1. = 0V 2. 250µ s Pulse Test 0.00 0 10 20 30 0.2 0.4 0.6 0.8 1.0 1.2 1.4 V SD, Source-Drain voltage [V] Figure 3. On-Resistance Variation vs Drain Current and Gate Voltage Figure 4. Body Diode Forward Voltage Variation with Source Current and Temperature Capacitance [pf] 2000 1500 1000 500 1. = 0 V 2. f = 1 MHz C iss C oss C rss 0 10 1, Drain-Source Voltage [V] C iss = C gs + C gd (C ds = shorted) C oss = C ds + C gd C rss = C gd, Gate-Source Voltage [V] 12 10 8 6 4 2 = 50V = 125V = 200V Note : I = 8.8A D 0 0 5 10 15 20 25 30 Q G, Total Gate Charge [nc] Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics
Typical Characteristics (Continued) BS, (Normalized) Drain-Source Breakdown Voltage 1.2 1.1 1.0 0.9 0.8-100 -50 0 50 100 150 200 T J, Junction Temperature [ o C] Notes : 1. = 0 V 2. = 250 µ A R DS(ON), (Normalized) Drain-Source On-Resistance 3.0 2.5 2.0 1.5 1.0 0.5 0.0-100 -50 0 50 100 150 200 T J, Junction Temperature [ o C] 1. = 10 V 2. = 4.4 A Figure 7. Breakdown Voltage Variation vs Temperature Figure 8. On-Resistance Variation vs Temperature 10 2 Operation in This Area is Limited by R DS(on) 10 2 Operation in This Area is Limited by R DS(on) 10 1 Notes : 1. T C = 25 o C 2. T J = 150 o C 3. Single Pulse 100 µs 1 ms 10 ms DC 10 1 1. T C = 25 o C 2. T J = 150 o C 3. Single Pulse 10 µs 100 µs 1 ms 10 ms DC 10 1 10 2, Drain-Source Voltage [V] 10 1 10 2, Drain-Source Voltage [V] Figure 9-1. Maximum Safe Operating Area for FQP9N25C Figure 9-2. Maximum Safe Operating Area for FQPF9N25C 10 8 6 4 2 0 25 50 75 100 125 150 T C, Case Temperature [ ] Figure 10. Maximum Drain Current vs Case Temperature
Typical Characteristics (Continued) Z θjc (t), Thermal Response 10-2 D=0.5 0.2 0.1 0.05 0.02 0.01 single pulse N otes : 1. Z θ JC (t) = 1.69 /W M ax. 2. D uty F actor, D =t 1 /t 2 3. T JM - T C = P DM * Z θ JC (t) P DM t 1 t 2 10-5 10-4 10-3 10-2 10 1 t 1, Square W ave Pulse Duration [sec] Figure 11-1. Transient Thermal Response Curve for FQP9N25C D=0.5 Z θjc (t), Thermal Response 0.2 N otes : 1. Z θ JC (t) = 3.29 /W Max. 0.1 2. D uty Factor, D =t 1 /t 2 3. T JM - T C = P DM * Z θ JC (t) 0.05 0.02 0.01 single pulse P DM t 1 t 2 10-2 10-5 10-4 10-3 10-2 10 1 t 1, Square W ave Pulse Duration [sec] Figure 11-2. Transient Thermal Response Curve for FQPF9N25C
12V 200nF 50KΩ 300nF Gate Charge Test Circuit & Waveform Same Type as DUT 10V Q gs Q g Q gd 3mA DUT Charge Resistive Switching Test Circuit & Waveforms R L 90% R G V DD 10V DUT 10% t d(on) t r t d(off) tf t on t off Unclamped Inductive Switching Test Circuit & Waveforms L E AS = ---- 1 LI 2 2 AS BS -------------------- BS -V DD BS I AS R G V DD (t) 10V DUT V DD (t) t p t p Time
Peak Diode Recovery dv/dt Test Circuit & Waveforms DUT + _ I SD L Driver R G Same Type as DUT V DD dv/dt controlled by RG I SD controlled by pulse period ( Driver ) Gate Pulse Width D = -------------------------- Gate Pulse Period 10V I FM, Body Diode Forward Current I SD ( DUT ) di/dt I RM Body Diode Reverse Current ( DUT ) Body Diode Recovery dv/dt V SD V DD Body Diode Forward Voltage Drop
Package Dimensions (1.70) 1.30 ±0.10 9.90 ±0.20 (8.70) ø3.60 ±0.10 TO-220 2.80 ±0.10 4.50 ±0.20 1.30 +0.10 0.05 9.20 ±0.20 13.08 ±0.20 (1.46) (1.00) 1.27 ±0.10 (45 ) (3.00) (3.70) 1.52 ±0.10 15.90 ±0.20 10.08 ±0.30 18.95MAX. 2.54TYP [2.54 ±0.20] 0.80 ±0.10 2.54TYP [2.54 ±0.20] 0.50 +0.10 0.05 2.40 ±0.20 10.00 ±0.20 Dimensions in Millimeters
Package Dimensions (Continued) 3.30 ±0.10 TO-220F 10.16 ±0.20 ø3.18 ±0.10 2.54 ±0.20 (7.00) (0.70) 6.68 ±0.20 15.80 ±0.20 (1.00x45 ) 15.87 ±0.20 9.75 ±0.30 MAX1.47 0.80 ±0.10 (30 ) 0.35 ±0.10 #1 0.50 +0.10 0.05 2.76 ±0.20 2.54TYP [2.54 ±0.20] 2.54TYP [2.54 ±0.20] 9.40 ±0.20 4.70 ±0.20 Dimensions in Millimeters
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