FDG901D Slew Rate Control IC for P-Channel MOSFETs

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FDG90D Slew Rate Control IC for P-Channel MOSFETs Features Three Programmable Slew Rates Reduces Inrush Current Minimizes EMI Normal Turn-Off Speed Low-Power CMOS Operates Over Wide Voltage Range Compact Industry Standard SC70-5 Surface Mount Package RoHS Compliant Applications Battery Load switch Power management General Description February 2008 The FDG90D is specifically designed to control the turn on of a P-Channel MOSFET in order to limit the inrush current in battery switching applications with high capacitance loads. During turn-on, the FDG90D drives the MOSFET's gate low with a regulated current source, thereby controlling the MOSFET's turn on. For turn-off, the IC pulls the MOSFET gate up quickly for efficient turn off. Pin SC70-5 Package Marking and Ordering Information Device Marking Device Reel Size Tape Width Quantity 9 FDG90D 7 8mm 3000 units 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com

Pin Configuration Absolute Maximum Ratings Parameter Min. Max. Unit Supply Voltage -0.5 0 V DC Input Voltage (Logic Inputs) -0.7 9 V Power Dissipation for Single Operation @ 85 C 50 mw Operating and Storage Junction Temperature -65 50 C Thermal Resistance, Junction to Ambient (note ) 425 C/W Recommended Operating Range GATE 5 GND SLEW 2 VDD 3 4 LOGIC IN Parameter Min. Max. Unit Supply Voltage 2.7 6 V Operating Junction Temperature -40 50 C Electrical Characteristics T A = 25 C unless otherwise noted Parameter Symbol Conditions Min. Typ. Max. Units Logic Levels Logic High Input Voltage V IH V DD = 2.7V to 6.0V 2.55 V Logic Low Input Voltage V IL V DD = 2.7V to 6.0V 2.0 V Off Characteristics - Slew Rate Control Driver Supply Input Breakdown Voltage BV DG I DG = 0A, V IN = 0V, V SLEW = 0V 9 V Slew Input Breakdown Voltage BV SLEW I SLEW = 0A, V IN = 0V 9 V Logic Input Breakdown Voltage BV IN I IN = 0A, V SLEW = 0V 9 V Supply Input Leakage Current IR DG V DG = 8V, V IN = 0V, V SLEW = 0V na Slew Input Leakage Current IR SLEW V SLEW = 8V, V IN = 0V na Logic Input Leakage Current IR IN V IN = 8V, V SLEW = 0V na On Characteristics - Slew Rate Control Driver Gate Current I G V IN = 6V, V GATE = 2V Slew Pin = Open 90 20 A Slew Pin = GND 0 A Slew Pin = V DD 0 50 na Notes: R θ JA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins. R θ JC is guaranteed by design while R θ CA is determined by the user's board design. 2 www.fairchildsemi.com

Electrical Characteristics Cont. T A = 25 C unless otherwise noted Parameter Symbol Conditions Min. Typ. Max. Units P-Channel Switching Times (V SUPPLY = 5.5V, V DD = 5.5V, Logic IN = 5.5V, C LOAD = 50pF, Test Circuit) = Open 8.3 s Delay On Time td ON Slew Pin = GND 0.6 ms = V DD 2.2 ms = Open 28 s V OUT Rise Time t R Slew Pin = GND.8 ms = V DD ms = Open 62 V/ms Output Slew Rate dv/dt Slew Pin = GND 26 V/ms = V DD 0.3 V/ms VDD 3 2 SLEW V SUPPLY C Load 0 % L O G IC IN 9 0 % LOGIC IN 4 5 O U T P U T (In v e rte d ) 0 % td O N t R Test Circuit Switching Waveform 3 www.fairchildsemi.com

Typical Characteristics Gate Current, (µa) Gate Current, (na) 95 90 85 80 75 70 65 Slew = Open Vdd=Vin=6V 60-50 0 50 50 4 2 0 8 6 Temperature, ( o C) Figure. Gate Output Current vs. Temperature (SLEW = OPEN) Slew = Vdd Vdd=Vin=6V Gate Current (µa) Output Risetime, microseconds (µsec) 2.0.5.0 0.5 Slew = Gnd Vdd=Vin=6V 0.0-50 0 50 50 0 Temperature, ( o C) Figure 2. Gate Output Current vs. Temperature (SLEW = GROUND) Slew = Open 4-50 0 50 50 Temperature, ( o C) 0. 0 0 Load Capacitance, picofarad (pf) Figure 3. Gate Output Current vs. Temperature (SLEW = V DD ) Figure 4. t RISE vs. Load Capacitance (SLEW = OPEN) Output Risetime, microseconds (µs) 00 0 0 Slew = Gnd Output Risetime, milliseconds (ms) 0 Slew = Vdd 0 0 Load Capacitance, picofarad (pf) 0. 0 0 Load Capacitance, picofarad (pf) Figure 5. t RISE vs. Load Capacitance (SLEW = GROUND) Figure 6. t RISE vs. Load Capacitance (SLEW = V DD ) 4 www.fairchildsemi.com

Typical Characteristics time, microseconds (µs) time, microseconds (µs) 200 75 50 25 7.5 7.0 6.5 6.0 5.5 5.0 0 0 20 30 40 50 Load Resistance, ohms (Ω) Slew = Open Figure 7. Switching Time vs. Load Resistance (SLEW = OPEN) tris Slew = Vdd time, µsecs time, ( µsec) 60 40 20 80 60 40 20 7.5 7.0 6.5 6.0 5.5 0 0 0 20 30 40 50 Load Resistance, ohms (Ω) Figure 8. Switching Time vs. Load Resistance (SLEW = GROUND) Slew = Open Slew = Gnd 75 0 0 20 30 40 50 Load Resistance, ohms (Ω) 5.0 0.0 0.5.0.5 2.0 2.5 Load Current, Amps (A) Figure 9. Switching Time vs. Load Resistance (SLEW = V DD ) Figure 0. Switching Time vs. Load Current (SLEW = OPEN) 60 40 Slew = Gnd 200 75 Slew = Vdd time, µsec 20 80 60 40 time, microseconds (µs) 50 25 20 0.0 0.5.0.5 2.0 2.5 Load Current, Amps (A) 75 0.0 0.5.0.5 2.0 2.5 Load Current, Amps (A) Figure. Switching Time vs. Load Current (SLEW = GROUND) Figure 2. Switching Time vs. Load Current (SLEW = V DD ) 5 www.fairchildsemi.com

Application Information Typical Application Logic Signal Slew Rate Control Source Battery powered systems make extensive usage of load switching, turning the power to subsystems off, in order to extend battery life. Power MOSFETs are used to accomplish this task. In PDA's and Cell phones, these MOSFETs are usually low threshold P-Channels. Since the loads typically include bypass capacitor components (high capacitive component), a high inrush current can occur when the load is switched on. This inrush current can cause transients on the main power supply disturbing circuitry supplied by it. The simplest method of limiting the inrush current is to control the slew rate of the MOSFET switch. This can be done with external R/C circuits, but this approach can occupy significant PCB area, and involves other compromises in performance. The slew rate control driver IC FDG90D is specifically designed to interface low voltage digital circuitry with power MOSFETs and reduce the rapid inrush current in load switch applications. The IC limits inrush current by controlling the current, which drives the gate of the P-Channel MOSFET switch. 4 2 VDD 3 5 I Gate Ig Drain Application Circuit Q t = I G Load where Qg is the Gate charge in nc for a given MOSFET and IG is the gate current controlled by the slew rate pin. Below is a captured image from an oscilloscope depicting the device response. The FDG90D was connected to control an FDG258P P-Channel DMOS. The Slew Rate control pin was set to open (floating state). g The control input is a CMOS compatible input with a minimum high input voltage of 2.55V with a power rail voltage of 6V. Therefore, it is compatible with any CMOS logic voltages between 2.55V and 5V and under these conditions there is no additional configuration required. The Slew Rate Control Driver (FDG90D) is designed to give a programmed choice of one of three steady dv/dt states on the output during turn-on. To change the dv/dt value, the user needs to use the Slew Rate Control Pin (Pin 2). To utilize the smallest current setting ( 0 na) from the IC, a voltage equal to V DD must be applied to the Slew Rate Control Pin 2. To use the next higher current setting ( ~A) a voltage equal to Ground must be applied to Pin 2. To achieve the highest current setting ( ~80A) or obtain a faster switching speed, the Slew Rate Pin2 must be open (floating). A higher value of capacitance will result in a slower switching rate. To determine the switching times of each setting use the simple equation: V IN V (inverted) gate V DD = 5.5V V RLoad V IN = 5.5V R LOAD =.5 Circuit waveforms for an FDG90D controlling a P-Channel FDG258P MOFET 6 www.fairchildsemi.com

Dimensional Outline and Pad Layout 7 www.fairchildsemi.com

TRADEMARKS The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not intended to be an exhaustive list of all such trademarks. ACEx Build it Now CorePLUS CROSSVOLT CTL Current Transfer Logic EcoSPARK EZSWITCH * Fairchild Fairchild Semiconductor FACT Quiet Series FACT FAST FastvCore FlashWriter * FPS FRFET Global Power Resource SM Green FPS Green FPS e-series GTO i-lo IntelliMAX ISOPLANAR MegaBuck MICROCOUPLER MicroFET MicroPak MillerDrive Motion-SPM OPTOLOGIC OPTOPLANAR PDP-SPM Power220 POWEREDGE Power-SPM PowerTrench Programmable Active Droop QFET QS QT Optoelectronics Quiet Series RapidConfigure SMART START SPM STEALTH SuperFET SuperSOT -3 SuperSOT -6 SuperSOT -8 SupreMOS SyncFET The Power Franchise TinyBoost TinyBuck TinyLogic TINYOPTO TinyPower TinyPWM TinyWire μserdes UHC Ultra FRFET UniFET VCX * EZSWITCH and FlashWriter are trademarks of System General Corporation, used under license by Fairchild Semiconductor. DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS. LIFE SUPPORT POLICY FAIRCHILD S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user. 2. A critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Product Status Definition Advance Information Formative or In Design This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. Preliminary No Identification Needed Obsolete First Production Full Production Not In Production This datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve the design. This datasheet contains specifications on a product that has been discontinued by Fairchild Semiconductor. The datasheet is printed for reference information only. Rev. I33 2008 Fairchild Semiconductor Corporation www.fairchildsemi.com

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