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Transcription:

PD-90712C POWER MOSFET THRU-HOLE (TO-254) IRFM360 400V, N-CHNNEL HEXFET MOSFET TECHNOLOGY Product Summary Part Number RDS(on) ID IRFM360 0.20 Ω 23 HEXFET MOSFET technology is the key to International Rectifier s advanced line of power MOSFET transistors. The efficient geometry design achieves very low on-state resistance combined with high transconductance. HEXFET transistors also feature all of the well-established advantages of MOSFETs, such as voltage control, very fast switching, ease of paralleling and electrical parameter temperature stability. They are well-suited for applications such as switching power supplies, motor controls, inverters, choppers, audio amplifiers, high energy pulse circuits, and virtually any application where high reliability is required. The HEXFET transistor s totally isolated package eliminates the need for additional isolating material between the device and the heatsink. This improves thermal efficiency and reduces drain capacitance. TO-254 Features: n Simple Drive Requirements n Ease of Paralleling n Hermetically Sealed n Electrically Isolated n Dynamic dv/dt Rating n Light-weight bsolute Maximum Ratings Parameter ID @ VGS = 10V, TC = 25 C Continuous Drain Current 23 ID @ VGS = 10V, TC = 100 C Continuous Drain Current 14 IDM Pulsed Drain Current À 92 PD @ TC = 25 C Max. Power Dissipation 250 W Units Linear Derating Factor 2.0 W/ C VGS Gate-to-Source Voltage ±20 V ES Single Pulse valanche Energy Á 980 mj IR valanche Current À 23 ER Repetitive valanche Energy À 25 mj dv/dt Peak Diode Recovery dv/dt  4.0 V/ns TJ Operating Junction -55 to 150 TSTG Storage Temperature Range C Lead Temperature 300 ( 0.063 in.(1.6mm) from case for 10s) Weight 9.3 (Typical) g For footnotes refer to the last page www.irf.com 1 05/12/15

Electrical Characteristics @ Tj = 25 C (Unless Otherwise Specified) Parameter Min Typ Max Units Test Conditions BVDSS Drain-to-Source Breakdown Voltage 400 V VGS = 0V, ID = 1.0m BVDSS/ TJ Temperature Coefficient of Breakdown 0.46 V/ C Reference to 25 C, ID = 1.0m Voltage RDS(on) Static Drain-to-Source On-State 0.20 VGS = 10V, ID = 14 Ω Resistance 0.23 VGS = 10V, ID = 23 Ã VGS(th) Gate Threshold Voltage 2.0 4.0 V VDS = VGS, ID = 250µ gfs Forward Transconductance 1.4 VDS = 15V, IDS = 14 Ã IDSS Zero Gate Voltage Drain Current 25 VDS = 320V,VGS=0V µ 250 VDS = 320V, VGS = 0V, TJ = 125 C IGSS Gate-to-Source Leakage Forward 100 VGS = 20V n IGSS Gate-to-Source Leakage Reverse -100 VGS = -20V Qg Total Gate Charge 210 VGS =10V, ID = 23 Qgs Gate-to-Source Charge 28 nc VDS = 200V Qgd Gate-to-Drain ( Miller ) Charge 120 td(on) Turn-On Delay Time 33 VDD = 200V, ID = 23, tr Rise Time 140 VGS =10V, RG = 2.35Ω ns td(off) Turn-Off Delay Time 120 tf Fall Time 99 LS + LD Total Inductance 6.8 nh Measured from drain lead (6mm/ 0.25in. from package) to source lead (6mm/0.25in. from package) Ciss Input Capacitance 4200 VGS = 0V, VDS = 25V Coss Output Capacitance 900 pf f = 1.0MHz Crss Reverse Transfer Capacitance 400 Source-Drain Diode Ratings and Characteristics Parameter Min Typ Max Units Test Conditions IS Continuous Source Current (Body Diode) 23 ISM Pulse Source Current (Body Diode) À 92 VSD Diode Forward Voltage 1.8 V Tj = 25 C, IS = 23, VGS = 0V Ã trr Reverse Recovery Time 1000 ns Tj = 25 C, IF = 23, di/dt 100/µs QRR Reverse Recovery Charge 16 µc VDD 50V Ã ton Forward Turn-On Time Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by LS + LD. Thermal Resistance Parameter Min Typ Max Units Test Conditions RthJC Junction-to-Case 0.5 RthCS Csae-to-sink 0.21 C/W RthJ Junction-to-mbient 48 Typical socket mount Note: Corresponding Spice and Saber models are available on International Rectifier Website. For footnotes refer to the last page 2 www.irf.com

Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics Fig 3. Typical Transfer Characteristics Fig 4. Normalized On-Resistance Vs. Temperature www.irf.com 3

I D, Drain-to-Source Current () IRFM360 13a & b Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage 1000 OPERTION IN THIS RE LIMITED BY RDS(on) 100 10 100µs 1ms 1 0.1 Tc = 25 C Tj = 150 C Single Pulse 10ms DC 1 10 100 1000 V DS, Drain-to-Source Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage Fig 8. Maximum Safe Operating rea 4 www.irf.com

V DS R D R G V GS D.U.T. + - V DD 10V Pulse Width 1 µs Duty Factor 0.1 % Fig 10a. Switching Time Test Circuit V DS 90% Fig 9. Maximum Drain Current Vs. Case Temperature 10% V GS t d(on) t r t d(off) t f Fig 10b. Switching Time Waveforms Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com 5

15V V DS L DRIVER R G 10 20V tp D.U.T. I S 0.01Ω + - V DD Fig 12a. Unclamped Inductive Test Circuit tp V (BR)DSS Fig 12c. Maximum valanche Energy Vs. Drain Current I S Fig 12b. Unclamped Inductive Waveforms Current Regulator Same Type as D.U.T. 50KΩ 10 V Q GS Q G Q GD 12V 10.2µF.3µF D.U.T. + V - DS V G V GS 3m Charge I G I D Current Sampling Resistors Fig 13a. Basic Gate Charge Waveform Fig 13b. Gate Charge Test Circuit 6 www.irf.com

Footnotes: À Repetitive Rating; Pulse width limited by maximum junction temperature. Á VDD = 50V, starting TJ = 25 C, L= 3.7mH Peak IL = 23, VGS = 10V Â ISD 23, di/dt 170/µs, VDD 400V, TJ 150 C Ã Pulse width 300 µs; Duty Cycle 2% Case Outline and Dimensions TO-254 3.78 [.149] 3.53 [.139] 13.84 [.545] 13.59 [.535] 6.60 [.260] 6.32 [.249] 0.12 [.005] 1.27 [.050] 1.02 [.040] 17.40 [.685] 16.89 [.665] 20.32 [.800] 20.07 [.790] 13.84 [.545] 13.59 [.535] B 1 2 3 C 14.48 [.570] 12.95 [.510] 0.84 [.033] MX. 3.81 [.150] 2X 3X 1.14 [.045] 0.89 [.035] 0.36 [.014] B 3.81 [.150] NOT ES: 1. DIMENSIONING & TOLERNCING PER SME Y14.5M-1994. 2. LL DIMENSIONS RE SHOWN IN MILLIMETERS [INCHES]. 3. CONTROLLING DIMENSION: INCH. 4. CONFORMS TO JEDEC OUTLINE TO-254. PIN SSIGNMENTS 1 = DRIN 2 = SOURCE 3 = GTE CUTION BERYLLI WRNING PER MIL-PRF-19500 Package containing beryllia shall not be ground, sandblasted, machined, or have other operations performed on them which will produce beryllia or beryllium dust. Furthermore, beryllium oxide packages shall not be placed in acids that will produce fumes containing beryllium. IR WORLD HEDQURTERS: 101 N. Sepulveda Blvd. El Segundo, California 90245, US Tel: (310) 252-7105 IR LEOMINSTER : 205 Crawford St., Leominster, Massachusetts 01453, US Tel: (978) 534-5776 TC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information. Data and specifications subject to change without notice. 05/2015 www.irf.com 7