SN54AS885, SN74AS885 8-BIT MAGNITUDE COMPARATORS

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SNAS, SNAS -BIT MAGNITUDE COMPARATORS Latchable P-Input Ports With Power-Up Clear Choice of Logical or Arithmetic (Two s Complement) Comparison Data and Inputs Utilize pnp Input Transistors to Reduce dc Loading Effects Approximately % Improvement in ac Performance Over Schottky TTL While Performing More Functions Cascadable to n Bits While Maintaining High Performance % Less Power Than STTL for an -Bit Comparison Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic (NT) and Ceramic (JT) 00-mil DIPs description These advanced Schottky devices are capable of performing high-speed arithmetic or logic comparisons on two -bit binary or two s complement words. Two fully decoded decisions about words P and Q are externally available at two outputs. These devices are fully expandable to any number of bits without external gates. To compare words of longer lengths, the and outputs of a stage handling less significant bits can be connected to the and inputs of the next stage handling more significant bits. The cascading paths are implemented with only a two-gate-level delay to reduce overall comparison times for long words. Two alternative methods of cascading are shown in application information. SNAS... JT PACKAGE SNAS... DW OR NT PACKAGE (TOP VIEW) Q NC SDASA DECEMBER REVISED JANUARY Q GND V CC P SNAS... FK PACKAGE (TOP VIEW) NC V C C P GND NC NC No internal connection The latch is transparent when P latch-enable () input is high; the P-input port is latched when is low. This provides the designer with temporary storage for the P-data word. The enable circuitry is implemented with minimal delay times to enhance performance when cascaded for longer words. The, P, and Q data inputs utilize pnp input transistors to reduce the low-level current input requirement to typically 0. ma, which minimizes dc loading effects. The SNAS is characterized for operation over the full military temperature range of C to C. The SNAS is characterized for operation from 0 C to 0 C. NC PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright, Texas Instruments Incorporated POST OFFICE BOX 0 DALLAS, TEXAS

SNAS, SNAS -BIT MAGNITUDE COMPARATORS SDASA DECEMBER REVISED JANUARY FUNCTION TABLE INPUTS OUTPUTS COMPARISON DATA P, Q Logical H P > Q X X H L Logical H P < Q X X L H Logical H P = Q H or L H or L H or L H or L Arithmetic L P AG Q X X H L Arithmetic L Q AG P X X L H Arithmetic L P = Q H or L H or L H or L H or L In these cases, follows and follows. AG = arithmetically greater than logic symbol COMP M [LOGIC] P Q M [ARITH, s COMP] C D > < 0 Q =0 0 P P > Q P < Q This symbol is in accordance with ANSI/IEEE Std - and IEC Publication -. Pin numbers shown are for the DW, JT, and NT packages. POST OFFICE BOX 0 DALLAS, TEXAS

SNAS, SNAS -BIT MAGNITUDE COMPARATORS SDASA DECEMBER REVISED JANUARY logic diagram (positive logic) P C D P P P = Q = = = = = = Q Q Q ARITH LOGIC MSB = Pin numbers shown are for the DW, JT, and NT packages. POST OFFICE BOX 0 DALLAS, TEXAS

SNAS, SNAS -BIT MAGNITUDE COMPARATORS SDASA DECEMBER REVISED JANUARY absolute maximum ratings over operating free-air temperature range (unless otherwise noted) Supply voltage, V CC........................................................................ V Input voltage, V I............................................................................ V Operating free-air temperature range, T A : SNAS.............................. C to C SNAS.................................. 0 C to 0 C Storage temperature range....................................................... C to C Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. recommended operating conditions SNAS SNAS UNIT MIN NOM MAX MIN NOM MAX VCC Supply voltage.... V VIH High-level input voltage V VIL Low-level input voltage 0. 0. V IOH High-level output current ma IOL Low-level output current ma tsu* Setup time, data before ns th* Hold time, data after. ns TA Operating free-air temperature 0 0 C * On products compliant to MIL-STD-, Class B, this parameter is based on characterization data but is not production tested. electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS SNAS SNAS MIN TYP MAX MIN TYP MAX VIK VCC =. V, II = ma.. V VOH VCC =. V to. V, IOH = ma VCC VCC V VOL VCC =. V, IOL = ma 0. 0. 0. 0. V II VCC =. V, VI = V 0. 0. ma IIH Others VCC =V. V, VI =V. 0 0 IIL, VCC =. V, VI = 0. V ma P, Q, IO VCC =. V, VO =. V ma ICC VCC =. V, See Note 0 0 ma All typical values are at VCC = V, TA = C. The output conditions have been chosen to produce a current that closely approximates one half of the true short-circuit output current, IOS. NOTE : ICC is measured with all inputs high except, which is low. UNIT µa POST OFFICE BOX 0 DALLAS, TEXAS

SNAS, SNAS -BIT MAGNITUDE COMPARATORS SDASA DECEMBER REVISED JANUARY switching characteristics (see Figure ) PARAMETER FROM (INPUT) TO (OUTPUT) SNAS VCC =. V to. V, CL = 0 pf, RL = 00 Ω, TA = MIN to MAX SNAS MIN TYP MAX MIN TYP MAX tplh,.. tphl.. tplh,, tphl.. tplh Any P or Q,... tphl data input All typical values are at VCC = V, TA = C. UNIT ns ns ns APPLICATION INFORMATION The AS can be cascaded to compare words longer than eight bits. Figure shows the comparison of two -bit words; however, the design is expandable to n bits. Figure shows the optimum cascading arrangement for comparing words of bits or greater. Typical delay times shown are at V CC = V, T A = C and use the standard advanced Schottky load of R L = 00 Ω, C L = 0 pf. Figure shows the fastest cascading arrangement for comparing -bit or -bit words. Typical delay times shown are at V CC = V, T A = C and use the standard advanced Schottky load of R L = 00 Ω, C L = 0 pf. POST OFFICE BOX 0 DALLAS, TEXAS

SNAS, SNAS -BIT MAGNITUDE COMPARATORS SDASA DECEMBER REVISED JANUARY APPLICATION INFORMATION AS H or L H or L H or L H or L P Q P Q AS P Q P Q AS AS H or L P Q AS. ns Typical. ns Typical Figure. -Bit to (n)-bit Magnitude Comparator POST OFFICE BOX 0 DALLAS, TEXAS

SNAS, SNAS -BIT MAGNITUDE COMPARATORS APPLICATION INFORMATION SDASA DECEMBER REVISED JANUARY Latch Enable AS AS AS H or L P LSB Q P Q P MSB MSB Q LSP Bit ns Typical Bit. ns Typical MSP Figure. Fastest Cascading Arrangement for Comparing -Bit or -Bit Words POST OFFICE BOX 0 DALLAS, TEXAS

SNAS, SNAS -BIT MAGNITUDE COMPARATORS SDASA DECEMBER REVISED JANUARY PARAMETER MEASUREMENT INFORMATION SERIES ALS/ALS AND AS/AS DEVICES VCC V RL = R = R S RL From Output Under Test CL (see Note A) RL Test Point From Output Under Test CL (see Note A) Test Point From Output Under Test CL (see Note A) R R Test Point LOAD CIRCUIT FOR BI-STATE TOTEM-POLE OUTPUTS LOAD CIRCUIT FOR OPEN-COLLECTOR OUTPUTS LOAD CIRCUIT FOR -STATE OUTPUTS Timing Input. V. V 0. V High-Level Pulse. V. V. V 0. V Data Input tsu. V th. V. V 0. V Low-Level Pulse tw. V. V. V 0. V VOLTAGE WAVEFORMS SETUP AND HOLD TIMES VOLTAGE WAVEFORMS PULSE DURATIONS Output Control (low-level enabling) Waveform S Closed (see Note B) tpzl. V. V tphz. V tplz. V 0. V. V VOL 0. V tpzh Waveform VOH S Open. V 0. V (see Note B) 0 V VOLTAGE WAVEFORMS ENABLE AND DISABLE TIMES, -STATE OUTPUTS Input In-Phase Output Out-of-Phase Output (see Note C) tplh tphl. V. V. V tphl. V 0. V VOH. V VOL tplh VOH. V. V VOL VOLTAGE WAVEFORMS PROPAGATION DELAY TIMES NOTES: A. CL includes probe and jig capacitance. B. Waveform is for an output with internal conditions such that the output is low except when disabled by the output control. Waveform is for an output with internal conditions such that the output is high except when disabled by the output control. C. When measuring propagation delay items of -state outputs, switch S is open. D. All input pulses have the following characteristics: PRR MHz, tr = tf = ns, duty cycle = 0%. E. The outputs are measured one at a time with one transition per measurement. Figure. Load Circuits and Voltage Waveforms POST OFFICE BOX 0 DALLAS, TEXAS

PACKAGE OPTION ADDENDUM www.ti.com -Mar- PACKAGING INFORMATION Orderable Device Status () Package Type Package Drawing Pins Package Qty Eco Plan () Lead/Ball Finish () MSL Peak Temp () Op Temp ( C) -0A ACTIVE LCCC FK TBD POST-PLATE N / A for Pkg Type - to - 0A SNJAS FK Device Marking -0LA ACTIVE CDIP JT TBD A N / A for Pkg Type - to -0LA SNJASJT SNASJT ACTIVE CDIP JT TBD A N / A for Pkg Type - to SNASJT (/) Samples SNASDW ACTIVE SOIC DW Green (RoHS & no Sb/Br) CU NIPDAU Level--C-UNLIM 0 to 0 AS SNJASFK ACTIVE LCCC FK TBD POST-PLATE N / A for Pkg Type - to - 0A SNJAS FK SNJASJT ACTIVE CDIP JT TBD A N / A for Pkg Type - to -0LA SNJASJT () The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. () Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all substances, including the requirement that lead not exceed 0.% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either ) lead-based flip-chip solder bumps used between the die and package, or ) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.% by weight in homogeneous material) () MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. () There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device. Addendum-Page

PACKAGE OPTION ADDENDUM www.ti.com -Mar- () Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation of the previous line and the two combined represent the entire Device Marking for that device. () Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish value exceeds the maximum column width. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis. OTHER QUALIFIED VERSIONS OF SNAS, SNAS : Catalog: SNAS Military: SNAS NOTE: Qualified Version Definitions: Catalog - TI's standard catalog product Military - QML certified for Military and Defense Applications Addendum-Page

MECHANICAL DATA MCER00A JANUARY REVISED JANUARY JT (R-GDIP-T**) LEADS SHOWN CERAMIC DUAL-IN-LINE A DIM PINS ** A MAX. (,).0 (,0) B A MIN.0 (,0).0 (,) 0.00 (,) 0.00 (0,) B MAX B MIN 0.00 (,) 0. (,) 0. (,) 0. (,) 0.0 (,) MAX 0.0 (0,) MIN 0. (,) 0. (,) 0.0 (,0) MAX 0.0 (,0) MIN Seating Plane 0.0 (0,) 0.0 (0,) 0.0 (,) 0.0 (0,) 0.00 (0,) 0 00/C 0/ NOTES: A. All linear dimensions are in inches (millimeters). B. This drawing is subject to change without notice. C. This package can be hermetically sealed with a ceramic lid using glass frit. D. Index point is provided on cap for terminal identification. E. Falls within MIL STD GDI-T, GDI-T, and JEDEC MO-0 AA, MO-0 AB POST OFFICE BOX 0 DALLAS, TEXAS

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