Certificate of Analysis BS 0021

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Brammer Standard Company, Inc. Certificate of Analysis BS 0021 Certified Reference Material 1 for 410 Stainless Steel Alloy (UNS Number S41000) Certified Estimate of Certified Estimate of Value 2 Uncertainty 3 Value 2 Ucertainty 3 Analysis listed as percent by weight C 0.128 0.003 V 0.029 0.002 Mn 0.420 0.006 P 0.021 0.001 S 0.008 0.001 Information Values 4 Si 0.354 0.008 As 0.004 Cu 0.040 0.002 B <0.0002 Ni 0.100 0.004 Ca 0.0002 Cr 12.00 0.05 Nb 0.001 Mo 0.016 0.001 O 0.004 Al 0.008 0.001 Ti 0.003 Co 0.015 0.001 W 0.005 N 0.029 0.0015 Sn 0.003 0.001 1 Brammer Standard Company, Inc., is accredited by A2LA (Certificate Number 656.02) to ISO Guide 34 as a Reference Material Producer to produce Certified Reference Materials. 2 The certified value listed is the present best estimate of the true value based on the results of an interlaboratory testing program. 3 The uncertainties listed are based on value judgments of the material inhomogeneity and the 95% confidence interval. The half-width confidence interval C(95%) is shown on page 2. 4 Information values are not certified and are provided for information only. See the following pages for more information. Certificate Number 0021-071801p1 Brammer Standard Company, Inc., 14603 Benfer Road, Houston, TX 77069-2895 Telephone (281) 440-9396 Fax (281) 440-4432 brammerstandard.com

BS 0021 Data listed as mass fraction expresse d as percent. 0021-071801p2 Analysis * C * Mn * P * S * Si * Cu * Ni * Cr * Mo 1 C 0.125 XRF 0.411 AIC 0.0193 C 0.0068 XRF 0.343 AIC 0.037 AIC 0.0956 TCr 11.9405 AIC 0.014 2 C 0.126 MnP 0.4143 XRF 0.020 C 0.007 XRF 0.348 AGX 0.039 GNi 0.096 XRF 11.968 AES 0.0147 3 C 0.127 MnP 0.415 AIC 0.020 C 0.0073 AIC 0.348 XRF 0.039 XRF 0.097 XRF 11.97 AIC 0.0149 4 C 0.1275 AIC 0.415 AIC 0.0202 C 0.00753 GSi 0.3486 XRF 0.039 AIC 0.097 TCr 11.98 AGX 0.015 5 C 0.13 XRF 0.419 AIC 0.0202 C 0.0077 XRF 0.350 ECS 0.039 MND 0.0978 XRF 11.991 AIC 0.016 6 C 0.130 AIC 0.421 XRF 0.0204 C 0.008 GSi 0.352 AIC 0.040 XRF 0.099 AIC 12.00 XRF 0.016 7 C 0.1302 AGX 0.421 AES 0.0207 IC 0.0080 AGA 0.357 AES 0.0402 XRF 0.10 TCr 12.01 XRF 0.016 8 XRF 0.422 AGA 0.0210 C 0.0082 AIC 0.361 AIC 0.0413 AGA 0.101 AIC 12.04 GMo 0.0162 9 AA 0.423 AIC 0.0213 C 0.0086 GSi 0.364 AIC 0.0415 XRF 0.102 XRF 12.065 XRF 0.0165 10 AIC 0.424 MPH 0.022 GSi 0.368 MCB 0.0420 AIC 0.105 TCr 12.07 MMo 0.0165 11 AES 0.427 MPN 0.0222 XRF 0.044 AIC 0.106 12 MnP 0.428 Average 0.1280 0.4200 0.0207 0.0077 0.3540 0.0402 0.0997 12.003 0.0156 Std Dev 0.0021 0.0053 0.0009 0.0006 0.0081 0.0019 0.0035 0.043 0.0009 Certified 0.128 0.420 0.021 0.008 0.354 0.040 0.100 12.00 0.016 t 2.4469 2.201 2.2281 2.306 2.2622 2.2281 2.2281 2.2622 2.2622 C(95%) 0.0020 0.0034 0.0006 0.0004 0.0058 0.0013 0.0024 0.031 0.0006 Analysis * Al * Co * N * Sn * V 1 AIC 0.007 AIC 0.0140 FU 0.0266 AIC 0.0017 MVE 0.0262 2 AES 0.0075 AIC 0.014 TN 0.0290 AES 0.0018 AAA 0.027 3 AIC 0.0076 AIC 0.0141 FU 0.02926 MSn 0.0020 AIC 0.0280 4 AES 0.0079 AAA 0.0142 FU 0.0293 AIC 0.002 XRF 0.028 5 AES 0.008 XRF 0.0145 FU 0.0294 AIM 0.0021 XRF 0.028 6 AGA 0.008 AES 0.0149 FU 0.0295 AIC 0.0021 XRF 0.029 7 AAA 0.0084 AGX 0.015 FU 0.0302 AES 0.0036 AGX 0.029 8 AIC 0.0084 AIC 0.0154 FU 0.031 AAG 0.0036 AES 0.0291 9 AIC 0.009 XRF 0.016 AGA 0.004 AES 0.0305 10 M5 0.0164 AIH 0.0043 AIC 0.0319 11 XRF 0.017 AIM 0.0045 AIC 0.0331 12 AIC 0.0170 13 XRF 0.017 Average 0.0080 0.0153 0.0293 0.0029 0.0291 Std Dev 0.0006 0.0012 0.0013 0.0011 0.0021 Certified 0.008 0.015 0.029 0.003 0.029 t 2.306 2.1788 2.3646 2.2281 2.2281 C(95%) 0.0004 0.0007 0.0011 0.0007 0.0014 --------------------------- Analysis * As * B * Ca * Nb * O * Ti * W --------------------------- 1 AES 0.0039 AES <0.0002 AIC 0.0001 XRF 0.001 FU 0.0031 AIC 0.0018 XRF 0.004 2 AAG 0.0040 AIC 0.0001 AES 0.00022 XRF 0.001 FU 0.00323 XRF 0.002 AES 0.004 3 AES 0.0015 FU 0.0034 AES 0.0026 MWC 0.0046 4 XRF 0.002 FU 0.0034 XRF 0.003 AIC 0.0048 5 FU 0.007 XRF 0.006 XRF 0.005 6 XRF 0.005 --------------------------- Average 0.0040 0.0002 0.0014 0.0040 0.0031 0.0050 --------------------------- Std Dev 0.0001 0.0001 0.0005 0.0017 0.0017 0.0013 --------------------------- Information (0.004) (<0.0002) (0.0002) (0.001) (0.004) (0.003) (0.005) --------------------------- Data in parenth eses are not certified but ar e provided for inform ation on ly. * Methods of analysis listed on p age 3 C(95%) = (t x sd)//n The half-width confidence interval, where t is the appropriate Student's t value, sd is the interlaboratory standard deviation, and n is the number of acceptable mean values. For further information regarding the confidence interval for the certified value see ISO Guide 35:1989 section 4.

Methods of Analysis Code Element Method AA AAA AAG AES AGA AGX AIC AIH AIM Flame Atomic Absorption Spectrometry Flame Atomic Absorption - standard addition method Electro-thermal atomiz ation (graphite furna ce) Atomic Absorption Sp ectrometry AES - Spark Source Optical Emission Spectrometry AES - Spark Source and Glow Discharge Spectrometry average Glow Discharge and X-Ray Fluorescence Spectrometry average AES - ICP -Inductively Cou pled Plasma Spectrometry AES - ICP -Inductively Coupled Plasma Spectrometry after hydride generation AES - ICP Mass Spectrometry addition method C C, S Combustion-Infrared Absorption (ASTM E 1019) traceable to CRMs ECS Cu Sulphide precipitation, electro- deposition, gravimetric FU N, O Inert gas Fusion Method (ASTM E 1019) traceble to CRMs GMo Mo Gravimetry, Benzolnoxime GNi Ni Dimethylglyoxime gravimetric GSi Si Gravimetry with perchloric acid IC S Ion chrometography M5 Co MAS - 5-Cl-PADAB spectrophotometric MCB Cu MAS - Bicyclohexane oxalyldihydrazone photometric MMo Mo MAS - Thiocyanate after extraction with butyl acetate MND Ni MAS - Dimethylgloxime photometric MnP Mn MAS - Periodate oxidation MPH P MAS - Heteropoly molybdenum blue photometric MPN P MAS - n-butyol alcohol-trichloromethane extraction photometric MSn Sn MAS - Phenylfluorone photometric MVE V MAS - n-benzoyl phenylhydroxylamine extraction photometric MWC W MAS - Chlorpromazine hydrochloride sodium thiocyanate - tri-chloromethane extraction TCr Cr Persulfate oxidation, ferrous sulfate titrimetric TN N Neutralization titrimetric after distillation separation XRF X-Ray Fluorescence spect rometry AES = Atomic Emissio n Spectrom etry MAS = M olecular Absorption Spectrometry (photometric, spectrophotometric methods) Co-operating Laboratories: The co-operating laboratories were: Laboratory Laboratory contact Allvac, Lockport, New York Thomas Herdlein Allvac, Monroe, North Carolina Patrick M. Cole ANAREM, Prague, Czech Republic Karel Bi ovskí Brammer Standard Co., Inc., Houston, Texas Richard P. Beaumont China National Analysis Center for Iron and Steel, Beijing, China Prof. Wang Haizhou Crucible Specialty Steel, Syracuse, New York William Mastroe J. Dirats and Co., Inc., Westfield, Massachusetts Eric E. Dirats IncoTest, Huntington, West Virginia Melissa G. Staley LECO Corporation, St. Joseph, Michigan Dennis Lawrenz Shiva Analyticals (India) Ltd., Hoskote, Bangalore, India Dr. T. V. Ramakrishna VHG Laboratories, Inc., Manchester, New Hampshire Julie M. McIntosh Certificate Number 0021-071801p3

Additional analytical data: This material was used as an unknown test specimen number 0021 in a nationally recognized Proficiency Testing Program (PTP) for stainless steel. Most of the participating laboratories used one or more of the ASTM Standard Test Methods E 572, E 1019, and E 1086. The PTP data was not used in calculating the certified values listed on pages 1 and 2. The data show n below are the results from the PTP. Combustion Instrument Analysis using ASTM Standard Test Method E 1019 C S N O Number of Labs 26 25 22 21 Grand Average 0.1279 0.0078 0.0299 0.0036 Standard Deviation 0.0049 0.0008 0.0009 0.0008 Optical Emission Spectrometric Analysis using ASTM Standard Test Method E 1086 C Mn P S Si Cu Ni Number of Labs 18 23 22 17 22 21 17 Grand Average 0.1320 0.4175 0.0209 0.0074 0.3568 0.0387 0.0994 Standard Deviation 0.0048 0.0093 0.0009 0.0010 0.0092 0.0047 0.0067 Cr Mo Co V Al Number of Labs 21 19 7 10 9 Grand Average 12.0566 0.0179 0.0156 0.0289 0.0085 Standard Deviation 0.0739 0.0033 0.0032 0.0040 0.0020 X-ray Emission Spectrometric Analysis using ASTM Standard Test Method E 572 Mn P Si Cu Ni Cr Mo V Co Number of Labs 16 8 10 14 17 17 17 9 16 Grand Average 0.4141 0.0205 0.3527 0.0385 0.0973 12.0322 0.0169 0.0297 0.0166 Standard Deviation 0.0069 0.0013 0.0100 0.0026 0.0054 0.0780 0.0021 0.0030 0.0033 Certification Process: The requirements of ISO Guide 31, ISO Guide 34, ISO Guide 35, and ASTM Standard Guides E 1724 and E 1831 were followed for the preparation of this reference material and certificate of analysis. This is a Certified Reference Material as defined by ISO Guide 30. Analysis: Chemical analyses were made on chips prepared by a lathe from the certified portion of the discs in accordance with ASTM Standard Practice E 1806. The laboratories participating in the testing normally followed the requirements of ISO Guide 25 and/or ISO Standard 17025. Individual values listed on page 2 are the average of each analyst's results. Methods of analysis are listed on page 3. Outliers: Some outlying data was excluded from the data listed on page 2 due to technical assessment of the cooperating laboratories and statistical evaluation. Traceability: The following Certified Reference Materials were used to validate the analytical data listed on page 2: SRM 20f, 125b, 131f, 155, 2159, 2160, 3013a, 3107, 3109a, 3161a; ECRM 096-1, 289-1, 295-1; BCS 152/3, 338, 431/1. Certificate Number 0021-071801p4

Homogeneity: This Certified Reference Material was tested for homogeneity using ASTM Standard Method E 826 and found acceptable. It was also examined by optical emission spectrometry using ASTM Standard Test Method E 1086 and found to be compatible with the following Reference Materials: SRM 1219, 1267, C1289, 1295; JSS 650-8; BS SS 4951, 91E, 410A. Validity statement: ISO Guide 31 states that the certificate of analysis should contain an expiration date for all materials where instability has been demonstrated or is considered possible, after which the certified value is no longer guaranteed by the certifying body. Whereas this material is in a solid form and stable, no expiration date is specified. Source: This material was produced by the Gloria Heavy Industrial Corporation, Tainan Hsien, Taiwan. It was melted by an electric arc furnace, bottom poured into ingots, hot rolled, and finished with a norm alized heat treatment. Form: This Certified Reference Material is in the form of a disc, approximately 40 mm in diameter and 12 mm thick. Use: This Certified Reference Material is intended for u se in optical emission and x-ray spectrometric m ethods of analysis. Refer to ISO Guide 33 for information about the use of Reference Materials. Certified area: The entire depth of the dis c may be used. Caution: As with any bar material, avoid optical emission spectrometric burns in the center of the disc (5 mm radius), as some segregation ma y be present. Sample Preparation: For best analytical results, use the same method for preparing the analytical surface on all reference materials as you use for production specimens. Avoid overheating the disc during surface preparation. Certificate Number: The unique identification number for this certificate of analysis is 0021-071801-px, where x indicates the page number. Refer to future Brammer Standard Company catalogs for information on any revisions to this or other Brammer Standard reference materials. You may also obtain information on revisions of certificates from the internet at brammerstandard.com. Safety Notice: A Material Safety Data Sheet (MSDS) is not required for this material. This material will not release or otherwise result in exposure to a hazardous chemical under normal conditions of use. Inquiries concerning this Reference Material should be directed to: Brammer Standard Co., Inc. Phone: (281) 440-9396 web brammerstandard.com 14603 Benfer Road Houston, Texas 77069-2895 USA Fax: (281) 440-4432 e-mail bramstan@netropolis.net Certified by: on July 18, 2001. G. R. Brammer Certificate Number 0021-071801p5

Brammer Standard Company, Inc., is accredited to ISO Guide 34 as a Reference Material Producer for the production of Certified Reference Materials and Reference Materials by A2LA (Certificate Number 656.02) The scope of accreditation is listed on the website: www.brammerstandard.com By Certificate Number 10539, the Quality System of Brammer Standard Company, Inc., is registered to ISO 90 02:199 4 by Na tional Q uality Assurance, U.S.A. Bramm er Standard Com pany's Chemica l Laborato ry is accredited to ISO G uide 25 by A2LA. (Certificate Number 656.01) References: ASTM docum ents available from ASTM, 100 Barr Harbo r Drive, W est Con shohocken, P A 19428-2959, Telephone: 610-832-9500 Fax: 610-832-9555 e-m ail: service@astm.org Website: www.astm.org E 572-94 Standard Test Method for X-Ray Emissioin Spectrometric Analysis of Stainless Steel E 826-85 (Reapproved 1996) Standard Practice for Testing Homogeneity of Materials for the Development of Referen ce M ateria ls E 1019-2000 Standard Tes t Methods for Dete rmination of C arbo n, Sulfur, N itroge n, and Ox ygen in Steel and in Iron, Nick el, and Co balt Alloys E 1086-94 Standard Test Method for Optical Emission Vacuum Spectrometric Analysis of Stainless Steel by the Point-to-Plane Excitation Technique E 1724-95 Standard Guide f or Testing and Certificatio n of M etal and M etal-r elated Re ference Mate rials E 1806-96 Standard Practice for Sampling Steel and Iron for Determination of Chemical Composition E 1831-96 Standard Guide for Preparing Certificates for Reference Materials Relating to Chemical Composition of Metals, Ores, and Related Materials. ISO Guides available from Global Engineering - www.global.ihs.com ISO Standard 17025 (First edition, 1999), General requirements for the competence of calibration and testing laboratories. ISO Guide 25 (Third edition, 1990), General requirements for the competence of calibration and testing laboratories. ISO Guide 30 (Second edition, 1991), Terms and definitions used in connection with reference materials. ISO Guide 31 (Second edition, 2000), Reference materials -Contents of certificates and labels. ISO Guide 33 (Second edition, 2000), Uses of certified reference materials. ISO Guide 34 (Second edition, 2000), General requirements for the competence of reference material producers. ISO Guide 35 (Second edition, 1989), Certification of reference materials - General and statistical principles. Other useful documents available from NIST, U.S. Department of Commerce, Gaithersburg, MD 20899. NIST Special Publication 260-100, Handbook for SRM Users NIST Special Publication 829, Use of NIST Standard Reference Materials for Decisions on Performance of Analytical Chemical Methods and Laboratories Certificate Number 0021-071801p6