CE TEST REPORT Report Number : ETLE080219.157.1 Report issue date: August 21, 2009 Model / Serial No. : NSD-S360 / NONE Multiple Model Name : NSD-S300, NSD-S230, NSD-S680, NSD-H350, NSD-S330, NSD-S370, NSD-S230IP, NSD-S300IP, NSD-S330IP, NSD-S360IP, NSD-S370IP, NSD-S680IP Product Type : INTELLIGENT DOME CAMERA Applicant : NEW BORN HIGHTECH Address : Byucksan/Kyungin Digital Valley 2 1218~1220, 481-10 Gasan-dong, Geumcheon-gu, Seoul, Korea Manufacturer : NEW BORN HIGHTECH Address : Byucksan/Kyungin Digital Valley 2 1218~1220, 481-10 Gasan-dong, Geumcheon-gu, Seoul, Korea Test Standard(s) : EN 55022: 1998 + A1: 2000 + A2: 2003 (Class A) EN 50130-4: 1995 + A1: 1998 + A2: 2003 Test Result : Positive Total pages including Attachments : 41 Prepared by: Hyung-min, Choi (Test Engineer) Reviewed by: Yo Han, Park (Chief Engineer) August 21, 2009 August 21, 2009 ETL Inc. 371-51, Gasan-dong, Geumcheon-gu, Seoul, 153-803, Korea Tel : 82-2-858-0786 Fax : 82-2-858-0788 The test report merely corresponds to the test sample. It is not permitted to copy extracts of these test result without the written permission of the test laboratory. Report no. ETLE080219.157.1 / Page 1 of 26
DIRECTORY A) Documentation Directory 2 Test Standards 3 Address of the test laboratory, Conditions/Power Utilized, Description of the EUT & Symbol Definitions 4 Equipment under Test 17 Summary 18 Test Setups (Photographs) 19 26 B) Test Data Conducted Emissions 150 khz - 30 MHz 5 Radiated emissions (electric field) 30 MHz - 1 000 MHz 6 Harmonic Current Emissions and Flicker 7 Electrostatic Discharge (ESD) 8 11 Radiated Electromagnetic Fields 12 EFT / Burst 13 Surge Transients 14 Conducted Disturbance 15 Voltage Dips, Interruptions & Variations 16 C) Attachment A. Test Data and Test Setup Drawing(s) A1 A6 B. List of Test Equipments B1 B3 C. Photo documentations C1 C4 D. Technical description of the test sample (e.g.cdf, Declaration) D1 D2 Report no. ETLE080219.157.1 / Page 2 of 26
EMC TEST STANDARD(S) The emc tests were performed according to the following standards: EMC - Directive 2004/108/EC and its amendments ------------------------------------------------------------------ EN 55022: 1998 + A1: 2000 + A2: 2003 - Class A - Class B EN 50130-4: 1995 + A1: 1998 + A2: 2003 EN 61000-3-2: 2000 + A2: 2005 EN 61000-3-3: 1995 + A1: 2001 + A2: 2005 IEC 61000-4-2: 1995 + A1:1998 + A2:2000 IEC 61000-4-3: 2002 + A1:2002 IEC 61000-4-4: 2004 IEC 61000-4-5: 1995 + A1:2000 IEC 61000-4-6: 1996 + A1:2000 IEC 61000-4-8: 1993 + A1:2000 IEC 61000-4-11: 2004 Note: For undated references, the latest edition of the publication at the time of testing (including amendments) was applied. Report no. ETLE080219.157.1 / Page 3 of 26
ADDRESS OF THE TEST LABORATORY ETL Inc. (Seoul office and EMC Laboratory) #371-51 Gasan-dong, Geumcheon-gu, Seoul, 153-803, Korea ETL Inc. (Yoju EMC Laboratory) #584, Sangwhal-ri, Ganam-myeon, Yoju-gun, Gyeonggi-do, 469-885, Korea ENVIRONMENTAL CONDITIONS During the measurement the environmental conditions were within the listed ranges: Temperature : 15 C - 35 C Humidity : 30 %R.H. - 60 %R.H. Atmospheric Pressure : 86 kpa - 106 kpa POWER SUPPLY SYSTEM UTILIZED Power supply system DC 24 V or AC 24 V SHORT DESCRIPTION OF THE EQUIPMENT UNDER TEST (EUT) Number of received / tested samples: 1 / 1 Serial Number: none DEFINITIONS FOR SYMBOLS USED IN THIS TEST REPORT The black square indicates that the listed condition, standard or equipment is applicable for this report. Blank box indicates that the listed condition, standard or equipment was not applicable for this report. Report no. ETLE080219.157.1 / Page 4 of 26
Conducted Emission (Interference Voltage) Test Conducted emissions were measured from 150 khz to 30 MHz with a bandwidth of 9 khz on the 230 V AC power and return leads of the EUT according to the methods defined in EN 55022. The EUT was placed upon a non-metallic table 0,8 m above the horizontal metal reference plane and placed 0,4 m from a vertical ground plane which is connected to the horizontal metal ground plane. Test not applicable Test area - shielded room Anechoic chamber Full compact chamber Used test instruments and test accessories please see Attachment B. Equipment type Class A Class B Frequency Range (MHz) Quasi-Peak limit (dbuv) Average limit (dbuv) 0,15 to 0,5 79 66 0,5 to 30 73 60 0,15 to 0,5 66 to 56 56 to 46 0,5 to 5 56 46 5 to 30 60 50 Pass Fail Minimum limit margin 22,80 db at 0,600 MHz Maximum limit exceeding db at MHz Remarks: Please refer to the test data and graph in Attachment A. Test is AC 24 V rated input voltages mode. (DC 24 V rated input voltages mode was not applied.) Report no. ETLE080219.157.1 / Page 5 of 26
Radiated Emission (electric field) Test Radiated emissions form 30 MHz to 1 000 MHz were measured with a bandwidth of 120 khz according to the methods defines in EN 55022. The EUT was placed on a non-metallic stand in the open-field site, 0,8 m above the ground plane. The interface cables and equipment positions were varied within limits of reasonable applications to determine the positions producing maximum radiated emissions. Test not applicable Test area - open site. Testing was performed at a test distance of: 10 m Used test instruments and test accessories please see Attachment B. Equipment type Class A Class B Frequency Range (MHz) Quasi-Peak limit (dbuv/m) 30 to 230 40 230 to 1 000 47 30 to 230 30 230 to 1 000 37 Pass Fail Minimum limit margin 5,70 db at 141,81 MHz Maximum limit exceeding db at MHz Remarks: Please refer to the test data in Attachment A. Test is DC 24 V and AC 24 V rated input voltages mode. Report no. ETLE080219.157.1 / Page 6 of 26
Harmonic Current Emissions and Flicker Power Frequency Harmonics Tests: The measured values of the harmonics components of the input current, including line current and neutral current, shall be compared with the limits given in EN 61000-3-2. Flicker Emission Tests: The total impedance of the test circuit, excluding the appliance under test, but including the internal impedance of the supply source, shall be equal to the reference impedance. Test not applicable Test area - ETL Harmonics test room Anechoic chamber Full compact chamber Used test instruments and test accessories please see Attachment B. Pass Fail Remarks: This test was not applied. Because, EUT power supplies from a DC 24 V or AC 24 V.. Report no. ETLE080219.157.1 / Page 7 of 26
Electrostatic Discharge (ESD) Immunity Test Tests were conducted in accordance with EN 61000-4-2. The test programs and software shall be chosen so as to exercise all normal modes of operation of the EUT. The use of special exercising software is encouraged, but permitted only where it can be shown that the EUT is being comprehensively exercised. Test not applicable ETL test room Used test instruments and test accessories please see Attachment B. Test specifications: Discharge Voltage (Air): 2,0 kv 4,0 kv 6,0 kv 8,0 kv Discharge Voltage (Contact): 2,0 kv 4,0 kv 6,0 kv Discharge Impedance: 330 Ω / 150 pf Discharge Repetition Rate: 1 s Number of Discharges: 10 at all locations Kind of Discharges: Air discharge Contact discharge Polarity: Positive Negative Location of Discharge: See Photograph (ESD Point map) Each location on the surface touchable by hand HCP, VCP Required performance criterion: Test results: There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the application of the discharges is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change. Met required performance criterion Report no. ETLE080219.157.1 / Page 8 of 26
Test data Test Point Discharge Type Discharge voltage [± kv] HCP / VCP Indirect 2 / 4 / 6 1. Screw point Contact 2 / 4 / 6 2. Video Out port Contact 2 / 4 / 6 3. Metal case Contact 2 / 4 / 6 Result Met required performance criterion Met required performance criterion (See the remarks) Remarks: During the contact discharge test, dot noise was appeared on screen of LCD TV Monitor. After the test, EUT was operated normally. Please refer to the test point in next page. Report no. ETLE080219.157.1 / Page 9 of 26
CONTACT AIR Report no. ETLE080219.157.1 / Page 10 of 26
CONTACT AIR 1 1 3 3 1 2 1 1 1 Report no. ETLE080219.157.1 / Page 11 of 26
Radiated Electromagnetic Fields Immunity Test Tests were conducted in accordance with EN 61000-4-3 over the frequency range of 80 MHz to 2 000 MHz. The transmitting antenna was located 3 m from the EUT at a height of 0,8 m above the floor. Front, sides and back of the EUT were exposed to a uniform field of 10 V/m using both horizontal and vertical antenna polarizations. Test not applicable ETL Semi-Anechoic chamber Full compact chamber Used test instruments and test accessories please see Attachment B. Test specifications: Frequency Range: 80 MHz 2 000 MHz Field Strength: 1 V/m 3 V/m 10 V/m Distance Antenna - EUT: 3 m Modulation: AM 1 khz 80 % Step/Dwell Time: 1 % / 3 s Polarization of Antenna: Horizontal Vertical Position of EUT 0 90 180 270 Required performance criterion: Test result: There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the conditioning is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change, and no such flickering of indicators occurs at a field strength of 3 V/m. - 1 V/m : no observable deterioration - 3 V/m : any deterioration of the picture is so minor that the system could still be used. - 10 V/m : no permanent damage or change Met required performance criterion Test data Frequency Range (MHz) Field Strength (V/m) Antenna Polarity Position (Angle) Result 80-2 000 1 & 3 Vertical Front / Rear / Right / Left 80-2 000 1 & 3 Horizontal Front / Rear / Right / Left 80-2 000 10 Vertical Front / Rear / Right / Left 80-2 000 10 Horizontal Front / Rear / Right / Left Met required performance criterion Met required performance criterion (See the remarks) Remarks: During the Radiated Electromagnetic Fields test to 10 V/m, line noise was appeared on screen of LCD TV Monitor. After the test, EUT was operated normally. Report no. ETLE080219.157.1 / Page 12 of 26
EFT/Burst Immunity Test Tests were conducted in accordance with EN 61000-4-4. Test not applicable ETL test room Used test instruments and test accessories please see Attachment B. Test specifications: Pulse Amplitude - AC Power Port: 2,0 kv Pulse Amplitude - DC Power Port: 1,0 kv Signal Port: 1,0 kv Burst Frequency: 5,0 khz Time of Coupling: 60 s Polarity: Positive Negative Location of Coupling Name of lines Type Length Remarks AC Power line 2-pins 0,5 m DC power line Unshielded >3,0 m Video Out Shielded >3,0 m Signal line RS-485/422 / AUX / SENSOR Unshielded >3,0 m Signal line Required performance criterion: Test result: There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the application of the bursts is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change. Met required performance criterion Test data Line Line for test Test level Coupling (± kv) Method AC-mains L/N 2 CDN AC-mains L+N 2 CDN DC-mains +, 1 Clamp Signal line Video Out 1 Clamp Signal line RS-485/422 / AUX / SENSOR 1 Clamp Result Met required performance criterion (See the remarks) Remarks: During the test, dot noise was appeared on screen of LCD TV Monitor. After the test, EUT was operated normally. Report no. ETLE080219.157.1 / Page 13 of 26
Surge Immunity Test Tests were conducted in accordance with EN 61000-4-5. Test not applicable ETL test room Used test instruments and test accessories please see Attachment B. Test specifications: Pulse Amplitude - AC Power Port: 0,5 kv 1,0 kv Pulse Amplitude - DC Power Port: Signal Port: 0,5 kv 0,5 kv Source Impedance: 2 Ω + 18 µf 12 Ω + 9 µf 42 Ω + 0,1 µf Number of Surges: 5 surges/angle Angle: 0 90 180 270 Repetition Rate: 60 s Polarity: Positive Negative Location of Coupling Name of lines Type Length Remarks AC Power line 2-pins 0,5 m Required performance criterion: Test result: There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the application of the surges is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change. Met required performance criterion Test data Line Line for test Test level (± kv) Coupling Method AC-mains L+N 0,5 / 1,0 CDN Result Met required performance criterion Remarks: No false or other malfunctions were observed during and after the test. Report no. ETLE080219.157.1 / Page 14 of 26
Conducted Disturbance Immunity Test Tests were conducted in accordance with EN 61000-4-6 over the frequency range of 150 khz to 100 MHz. Test not applicable ETL test room Used test instruments and test accessories please see Attachment B. Test specifications: Frequency Range: 0,15 MHz 100 MHz Voltage Level (EMF): 1 V 3 V 10 V Modulation: AM 1 khz 80 % PM 1 Hz Step/Dwell Time: 1 %/3 s Location of Coupling Name of lines Type Length Remarks AC Power line 2-pins 0,3 m DC power line Unshielded 0,3 m Video Out Shielded >3,0 m Signal line RS-485/422 / AUX / SENSOR Unshielded >3,0 m Signal line Required performance criterion: Test result: There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the conditioning is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change, and no such flickering of indicators occurs at a field strength of 3 V. - 1 V : no observable deterioration - 3 V : any deterioration of the picture is so minor that the system could still be used. - 10 V : no permanent damage or change Met required performance criterion Test data Frequency Range Test level Coupling Line for test (MHz) (V) Method 0,15 100 AC-mains 1 & 3 CDN 0,15 100 DC-mains 1 & 3 CDN 0,15 100 Signal line 1 & 3 Clamp 0,15 100 AC-mains 10 CDN 0,15 100 DC-mains 10 CDN 0,15 100 Signal line 10 Clamp Result Met required performance criterion Met required performance criterion (See the remarks) Remarks: During the Conducted Disturbance test to 10 V, line noise was appeared on screen of LCD TV Monitor. After the test, EUT was operated normally. Report no. ETLE080219.157.1 / Page 15 of 26
Voltage Dips, Interruptions & Variations Immunity Test Voltage variations tests were conducted in accordance with EN 61000-4-11. Test not applicable ETL test room Used test instruments and test accessories please see Attachment B. Test specifications: Nominal Mains Voltage (V NOM ): Level of Reduction (dip): 24 Vac 0,5 Period, 1 Period, 5 Period, 10 Period at 30 % of V NOM 0,5 Period, 1 Period, 5 Period, 10 Period at 60 % of V NOM 0,5 Period, 1 Period, 5 Period at 100 % of V NOM Duration of Interruption: 250 Period at >95 % of V NOM Voltage Fluctuation: Unom + 10 % Unom - 15 % Required performance criterion: Test result: Voltage variations - There shall be no damage, malfunction or change of status due to the different supply voltage conditions. Voltage dips : There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the conditioning is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change. Met required performance criterion Test data Test Test Level (% of V NOM ) Period Voltage dips 30 0,5 / 1 / 5 / 10 Voltage dips 60 0,5 / 1 / 5 / 10 Voltage dips 100 0,5 / 1 / 5 Result Met required performance criterion Test Test level Test voltage Result Voltage variations Supply voltage max. (Unom + 10 %) 26,4 V Voltage variations Supply voltage min. (Unom - 15 %) 20,4 V Met required performance criterion Remarks: No false or other malfunctions were observed during and after the test. Report no. ETLE080219.157.1 / Page 16 of 26
Equipment Under Test (EUT) Test Operation Mode: The equipment under test was operated under the following conditions during testing: Camera image display mode Camera image display mode and lens angle point auto mode (The worst condition) Configuration of the equipment under test: See constructional data form in Attachment D - Page D2 See product information form(s) in Attachment D - Page D3 The following devices and interface cables were connected during the testing: Type Model Serial No. Manufacturer LCD TV Monitor OR940S NONE ORION Adapter (for LCD TV Monitor) DA-48M12 Y3212072110038 19700 DC power supply E3616A KR64301658 HP Type of Cables Used - Power Supply Type: DC 24 V Asian Power Devices Inc. Device from Device to Type of Cable(Port) Length(m) Type of shield EUT LCD TV Monitor Video Out >3,0 Shielded EUT Termination RS-485/422 >3,0 Unshielded EUT Termination AUX >3,0 Unshielded EUT Termination SENSOR >3,0 Unshielded EUT DC power supply AC/DC Input 1,0 Unshielded LCD TV Monitor Adapter DC Input 1,2 Shielded - Power Supply Type: AC 24 V Device from Device to Type of Cable(Port) Length(m) Type of shield EUT LCD TV Monitor VIDEO OUT >3,0 Shielded EUT Termination RS-485/422 >3,0 Unshielded EUT Termination AUX >3,0 Unshielded EUT Termination SENSOR >3,0 Unshielded EUT Power socket AC/DC Input 1,0 Unshielded LCD TV Monitor Adapter DC Input 1,2 Shielded Report no. ETLE080219.157.1 / Page 17 of 26
GENERAL REMARKS: The Equipment Under Test (EUT) is the NEW BORN HIGHTECH (model: NSD-S360) The model NSD-S360 is basic model that was tested. Model Fitted variety zoom module Effective Pixels No. NSD-S360 (Basic model) x36 410k NSD-S300 x30 410k NSD-S230 x23 410k NSD-S680 x26 680k NSD-H350 x35 410k NSD-S330 x33 410k NSD-S370 x37 410k NSD-S230IP x23 410k NSD-S300IP x30 410k NSD-S330IP x33 410k NSD-S360IP x36 410k NSD-S370IP x37 410k NSD-S680IP x26 680k SUMMARY: All tests according to the regulations cited on page 3 were Performed Not Performed The Equipment Under Test - Fulfills the general approval requirements cited on page 3. - Does not fulfill the general approval requirements cited on page 3. Date of receipt of test sample: February 19, 2008 Test start date: February 20, 2008 Test end date: March 04, 2008 Report no. ETLE080219.157.1 / Page 18 of 26
Photograph of test setup: Conducted emissions 150 khz - 30 MHz Report no. ETLE080219.157.1 / Page 19 of 26
Photograph of test setup: Radiated emissions 30 MHz 1 000 MHz Report no. ETLE080219.157.1 / Page 20 of 26
Photograph of test setup: Electrostatic discharge (ESD) Report no. ETLE080219.157.1 / Page 21 of 26
Photograph of test setup: Radiated electromagnetic field Report no. ETLE080219.157.1 / Page 22 of 26
Photograph of test setup: EFT/Burst - AC power line - - DC power line/signal line - Report no. ETLE080219.157.1 / Page 23 of 26
Photograph of test setup: Surge Report no. ETLE080219.157.1 / Page 24 of 26
Photograph of test setup: Conducted disturbance - Power line - - Signal line - Report no. ETLE080219.157.1 / Page 25 of 26
Photograph of test setup: Voltage dips, interruptions Report no. ETLE080219.157.1 / Page 26 of 26
Attachment A Test Data and Test Setup Drawing(s) Report no. ETLE080219.157.1 / Page A1 of A6
Conducted Emissions Measurement EUT Limit apply to INTELLIGENT DOME CAMERA / NSD-S360 (S/N: N/A) EN 55022 Class A Test Date February 29, 2008 Power Supply Type Operating Condition Result AC 24 V Camera image display mode and lens angle point auto mode Passed by 22,80 db Conducted Emission Test Data The following table shows the highest levels of conducted emissions on both polarizations of hot and neutral line. Detector mode: CISPR Quasi-Peak mode (6 db Bandwidth: 9 khz) Frequency [MHz] Quasi-peak Result [db μv ] Average Phase (*H/**N) Limit [db μv ] Margin [db] Quasi-peak Average Quasi-peak Average 0,270 52,1 29,4 H 79,0 66,0 26,9 36,7 0,375 54,4 40,9 H 79,0 66,0 24,6 25,1 0,600 50,2 28,8 H 73,0 60,0 22,8 31,2 3,295 43,3 28,2 H 73,0 60,0 29,7 31,8 4,435 42,1 32,6 H 73,0 60,0 30,9 27,4 19,500 43,9 19,2 N 73,0 60,0 29,1 40,8 NOTES: 1. * H : HOT Line, **N : Neutral Line 2. Margin value = Limit Result 3. All conditions were investigated and the worst-case emissions are reported. 4. If the average limit is met when using a Quasi-peak detector receiver, the EUT shall be deemed to meet both limits and measurement with the average detector receiver is unnecessary. Hyung-min, Choi Test Engineer Report no. ETLE080219.157.1 / Page A2 of A6
Line Polarity : Hot Limit : Quasi-Peak Average Line Polarity : Neutral Quasi-peak Average Report no. ETLE080219.157.1 / Page A3 of A6
Radiated Emissions Measurement EUT Limit apply to INTELLIGENT DOME CAMERA / NSD-S360 (S/N: N/A) EN 55022 Class A Test Date February 29, 2008 Power Supply Type Operating Condition Result DC 24 V Camera image display mode and lens angle point auto mode Passed by 5,70 db Radiated Emission Test Data The following table shows the highest levels of radiated emissions on both polarizations of horizontal and vertical. Detector mode: CISPR Quasi-Peak mode (6 db Bandwidth: 120 khz) Frequency [MHz] Reading [db μv ] Polarization (*H/**V) Ant. Factor [db/m] Cable Loss [db] Result [db μv /m] Limit [db μv /m] Margin [db] 47,72 19,51 V 9,63 2,05 31,20 40,00 8,80 49,77 16,03 V 9,68 2,10 27,80 40,00 12,20 113,82 17,43 V 10,10 2,98 30,50 40,00 9,50 127,49 15,99 V 10,80 3,21 30,00 40,00 10,00 141,81 19,51 V 11,36 3,43 34,30 40,00 5,70 170,44 17,12 V 10,68 3,80 31,60 40,00 8,40 NOTES: 1. * H : Horizontal polarization, ** V : Vertical polarization 2. Result Level = Reading + Antenna factor + Cable loss 3. Margin value = Limit - Result 4. The measurement was performed for the frequency range 30 MHz ~ 1 000 MHz according to the EN 55022 Class A. Hyung-min, Choi Test Engineer Report no. ETLE080219.157.1 / Page A4 of A6
EUT Limit apply to INTELLIGENT DOME CAMERA / NSD-S360 (S/N: N/A) EN 55022 Class A Test Date February 29, 2008 Power Supply Type Operating Condition Result AC 24 V Camera image display mode and lens angle point auto mode Passed by 6,30 db Radiated Emission Test Data The following table shows the highest levels of radiated emissions on both polarizations of horizontal and vertical. Detector mode: CISPR Quasi-Peak mode (6 db Bandwidth: 120 khz) Frequency [MHz] Reading [db μv ] Polarization (*H/**V) Ant. Factor [db/m] Cable Loss [db] Result [db μv /m] Limit [db μv /m] Margin [db] 47,72 11,91 V 9,63 2,05 23,60 40,00 16,40 113,82 17,13 V 10,10 2,98 30,20 40,00 9,80 123,38 18,34 V 10,61 3,15 32,10 40,00 7,90 125,44 17,31 V 10,70 3,18 31,20 40,00 8,80 141,80 18,91 V 11,36 3,43 33,70 40,00 6,30 198,39 16,56 V 9,85 3,99 30,40 40,00 9,60 NOTES: 1. * H : Horizontal polarization, ** V : Vertical polarization 2. Result Level = Reading + Antenna factor + Cable loss 3. Margin value = Limit - Result 4. The measurement was performed for the frequency range 30 MHz ~ 1 000 MHz according to the EN 55022 Class A. Hyung-min, Choi Test Engineer Report no. ETLE080219.157.1 / Page A5 of A6
The setup drawing(s) - Power Supply Type: DC 24 V DC power supply LCD TV Monitor EUT - Power Supply Type: AC 24 V LCD TV Monitor EUT : Data Line : Power Line : Termination : Adapter Report no. ETLE080219.157.1 / Page A6 of A6
Attachment B List of Test Equipment Report no. ETLE080219.157.1 / Page B1 of B3
Emission Test Equipments Description Model Number Manufacturer Serial Number Cal Due Date EMI TEST Receiver ESVS 10 R & S 835165/001 08.05.03 EMI TEST Receiver ESHS 30 R & S 840190/002 09.02.25 LISN 3816-2 EMCO 1001 08.10.04 LISN 3816-2 EMCO 1002 08.10.04 LogBicon Antenna VULB9165 Schwarzbeck 2023 08.09.03 Turn-Table DETT-03 Daeil EMC - N/A Antenna Master DEAM-03 Daeil EMC - N/A Report no. ETLE080219.157.1 / Page B2 of B3
Immunity Test Equipments Description Model Number Manufacturer Serial Number Cal Due Date ESD Generator dito EM TEST AG 1201-65 08.10.09 Hybridlog Antenna HLP-2603 EMC Automation 30004 N/A Signal Generator 2025 IFR 202301/933 08.04.04 Amplifier AR75A250 Amplifier Research 27568 N/A RF Amplifier GRF5066 OPHIR 1011 N/A System Interface SI-300 EMC Automation 20700 N/A Power Meter 4232A Boonton 420001 08.04.04 Power Sensors 51011 Boonton 31619 / 31620 08.04.04 Dual Directional Coupler C5571 Werlatone 7860 N/A Dual Directional Coupler C3653 Werlatone 7825 N/A Switch Module RSM-02 EMC Automation 20002 N/A EMC Generator EMC Pro KeyTek 0208259 08.10.04 Capacitor Clamp N/A KeyTek 0208203 08.10.04 CDN FCC-801-M2-25A FCC 2011 08.04.04 Attenuator 33-20-34 Weinschel BH3583 08.04.04 EM Injection Clamp FCC-2031-32mm FCC 410 08.03.30 POWER AMPLIFIER 60S1G3M3 Amplifier Research 323267 N/A Microwave Horn Antenna AT4002A Amplifier Research 0324047 N/A 40 db COUPLING DC7144A Amplifier Research 0323905 08.06.09 Report no. ETLE080219.157.1 / Page B3 of B3
Attachment C Constructional Photographs of Equipment Under Test (EUT) Report no. ETLE080219.157.1 / Page C1 of C4
View of front View of rear Report no. ETLE080219.157.1 / Page C2 of C4
View of Bottom Report no. ETLE080219.157.1 / Page C3 of C4
Inside View of EUT Report no. ETLE080219.157.1 / Page C4 of C4
Attachment D Constructional Data Form and Product Information Form(s) Report no. ETLE080219.157.1 / Page D1 of D2
CONSTRTUCTION DATAFORM FOR EMC TESTING Applicant Address : NEW BORN HIGHTECH : Byucksan/Kyungin Digital Valley 2 1218~1220, 481-10 Gasan-dong, Geumcheon-gu, Seoul, Korea Factory Address : NEW BORN HIGHTECH : Byucksan/Kyungin Digital Valley 2 1218~1220, 481-10 Gasan-dong, Geumcheon-gu, Seoul, Korea Type : INTELLIGENT DOME CAMERA Rated voltage : DC 24 V or AC 24 V Serial No. : NONE Rated input power : Protection type : Protection class : Configuration of equipment: Rev. : Rev. : Source of interference : X-TAL 18,432 MHz; 17,734475 MHz; 14,31818 MHz Internal frequency : Noise suppression components : Measures for electromagnetic shielding : Place of issue date Seal and signature of applicant If applicable, if necessary complete overleaf End of test report Report no. ETLE080219.157.1 / Page D2 of D2