Test Report. Product Name : MEGA BOOK. : MS-1057, MS-1057B, S262, S262B, SIM2060, GNB-h2 series. Model No. Applicant : MICRO-STAR INTL Co., LTD.

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Test Report Product Name : MEGA BOOK Model No. : MS-1057, MS-1057B, S262, S262B, SIM2060, GNB-h2 series Applicant : MICRO-STAR INTL Co., LTD. Address : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C. Date of Receipt : 2005/12/28 Issued Date : 2006/04/03 Report No. : 061L018-IT-CE-P11V04 The test results relate only to the samples tested. The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein. This report must not be used to claim product endorsement by CNLA, NVLAP or any agency of the Government. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

Declaration of Conformity The following product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). The listed standards as below were applied: The following Equipment: Product Model Number Trade Name : MEGA BOOK : MS-1057, MS-1057B, S262, S262B, SIM2060, GNB-h2 series : MSI This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). For the evaluation regarding EMC, the following standards were applied: RFI Emission: EN 55022:1998+A1:2000 Class B : Product family standard EN 61000-3-2:2000 Class D : Limits for harmonic current emission EN 61000-3-3:1995+A1: 2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system Immunity: EN 55024:1998+A1:2001+A2:2003 : Product family standard The following importer/manufacturer is responsible for this declaration: Company Name : Company Address : Telephone : Facsimile : Person is responsible for marking this declaration: Name (Full Name) Position/ Title Date Legal Signature

QTK No.: 061L018-IT-CE-P11V04 Statement of Conformity This certifies that the following designated product: Product Model Number Trade Name Company Name : MEGA BOOK : MS-1057, MS-1057B, S262, S262B, SIM2060, GNB-h2 series : MSI : MICRO-STAR INTL Co., LTD. This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). For the evaluation regarding EMC, the following standards were applied: RFI Emission: EN 55022:1998+A1:2000 Class B : Product family standard EN 61000-3-2:2000 Class D : Limits for harmonic current emission EN 61000-3-3:1995+A1:2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system Immunity: EN 55024:1998+A1:2001+A2:2003 : Product family standard TEST LABORATORY 0914 Gene Chang / President The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo. QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. Tel: 886-2-8601-3788, Fax: 886-2-8601-3789, E-mail: service@quietek.com

Test Report Certification Issued Date : 2006/04/03 Report No. : 061L018-IT-CE-P11V04 Product Name Applicant Address Manufacturer Model No. Rated Voltage EUT Voltage Trade Name : MEGA BOOK : MICRO-STAR INTL Co., LTD. : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C. : MICRO-STAR INTL Co., LTD. : MS-1057, MS-1057B, S262, S262B, SIM2060, GNB-h2 series : AC 230 V / 50 Hz : AC 100-240V, 50-60Hz : MSI Applicable Standard : EN 55022:1998+A1: 2000 EN 61000-3-2:2000EN 61000-3-3:1995+A1:2001 EN 55024: 1998+A1: 2001+A2: 2003 AS/NZS CISPR 22: 2002 Test Result Performed Location : Complied : Linkou EMC laboratory No.5-22,Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kuo Shiang, Taipei, 244 Taiwan, R.O.C. TEL:+866-2-8601-3788 / FAX:+886-2-8601-3789 Documented By : (Rita Huang ) Reviewed By : ( Tommy Chen ) Approved By : ( Gene Chang ) Page: 2 of 127

Laboratory Information We, QuieTek Corporation, are an independent EMC and safety consultancy that was established the whole facility in our laboratories. The test facility has been accredited by the following accreditation Bodies in compliance with ISO 17025, EN 45001 and Guide 25: Taiwan R.O.C. : BSMI, DGT, CNLA Germany : TUV Rheinland Norway : Nemko, DNV USA : FCC, NVLAP Japan : VCCI The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation s Web Site : http://tw.quietek.com/modules/myalbum/ The address and introduction of QuieTek Corporation s laboratories can be founded in our Web site : http://www.quietek.com/ If you have any comments, Please don t hesitate to contact us. Our contact information is as below: HsinChu Testing Laboratory : No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C. TEL:+886-3-592-8858 / FAX:+886-3-592-8859 E-Mail : service@quietek.com 1313 LinKou Testing Laboratory : No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwa, R.O.C. TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789 E-Mail : service@quietek.com 0914 Page: 3 of 127

TABLE OF CONTENTS Description Page 1. General Information... 7 1.1. EUT Description... 7 1.2. Mode of Operation... 8 1.3. Tested System Details... 8 1.4. Configuration of Tested System... 9 1.5. EUT Exercise Software... 10 2. Technical Test... 11 2.1. Summary of Test Result... 11 2.2. List of Test Equipment... 12 2.3. Measurement Uncertainty... 15 2.4. Test Environment... 17 3. Conducted Emission (Main Terminals)... 18 3.1. Test Specification... 18 3.2. Test Setup... 18 3.3. Limit... 18 3.4. Test Procedure... 19 3.5. Deviation from Test Standard... 19 3.6. Test Result... 20 3.7. Test Photograph... 38 4. Radiated Emission... 41 4.1. Test Specification... 41 4.2. Test Setup... 41 4.3. Limit... 41 4.4. Test Procedure... 42 4.5. Deviation from Test Standard... 42 4.6. Test Result... 43 4.7. Test Photograph... 49 5. Harmonic Current Emission... 52 5.1. Test Specification... 52 5.2. Test Setup... 52 5.3. Limit... 52 5.4. Test Procedure... 54 5.5. Deviation from Test Standard... 54 5.6. Test Result... 55 5.7. Test Photograph... 61 6. Voltage Fluctuation and Flicker... 63 Page: 4 of 127

6.1. Test Specification... 63 6.2. Test Setup... 63 6.3. Limit... 63 6.4. Test Procedure... 64 6.5. Deviation from Test Standard... 64 6.6. Test Result... 65 6.7. Test Photograph... 68 7. Electrostatic Discharge... 70 7.1. Test Specification... 70 7.2. Test Setup... 70 7.3. Limit... 70 7.4. Test Procedure... 71 7.5. Deviation from Test Standard... 71 7.6. Test Result... 72 7.7. Test Photograph... 75 8. Radiated Susceptibility... 77 8.1. Test Specification... 77 8.2. Test Setup... 77 8.3. Limit... 77 8.4. Test Procedure... 78 8.5. Deviation from Test Standard... 78 8.6. Test Result... 79 8.7. Test Photograph... 82 9. Electrical Fast Transient/Burst... 84 9.1. Test Specification... 84 9.2. Test Setup... 84 9.3. Limit... 84 9.4. Test Procedure... 85 9.5. Deviation from Test Standard... 85 9.6. Test Result... 86 9.7. Test Photograph... 89 10. Surge... 92 10.1. Test Specification... 92 10.2. Test Setup... 92 10.3. Limit... 92 10.4. Test Procedure... 93 10.5. Deviation from Test Standard... 93 10.6. Test Result... 94 Page: 5 of 127

10.7. Test Photograph... 97 11. Conducted Susceptibility... 99 11.1. Test Specification... 99 11.2. Test Setup... 99 11.3. Limit... 100 11.4. Test Procedure... 100 11.5. Deviation from Test Standard... 100 11.6. Test Result... 101 11.7. Test Photograph... 104 12. Power Frequency Magnetic Field... 109 12.1. Test Specification... 109 12.2. Test Setup... 109 12.3. Limit... 109 12.4. Test Procedure... 109 12.5. Deviation from Test Standard... 109 12.6. Test Result... 110 12.7. Test Photograph... 113 13. Voltage Dips and Interruption... 115 13.1. Test Specification... 115 13.2. Test Setup... 115 13.3. Limit... 115 13.4. Test Procedure... 116 13.5. Deviation from Test Standard... 116 13.6. Test Result... 117 13.7. Test Photograph... 120 14. Attachment... 122 EUT Photograph... 122 Page: 6 of 127

1. General Information 1.1. EUT Description Product Name Trade Name Model No. Component Power Adapter (1) Power Adapter (2) MEGA BOOK MSI MS-1057, MS-1057B, S262, S262B, SIM2060, GNB-h2 series MFR: LITEON, M/N: PA-1650-02 Input: AC 100-240V, 50-60Hz 1.6A Output: DC19V-3.42A Cable out: Shielded, 1.8m with one ferrite core bonded. MFR: LI SHIN, M/N:0335A1965 Input: AC 100-240V, 50-60Hz 1.7A Output: DC19V-3.42A Cable out: Shielded, 1.8m with one ferrite core bonded. Note: 1. The EUT is including six models for different marketing requirement. Keyparts List Item Vendor Model CPU Intel Yonah 1.66GHz/ FSB 667MHz Battery MSI 925C2110 RAM Transcend 512M*2 HDD Toshiba MK4025GAS DVD-RW H.L GWA-4082N Motherboard MSI MS-1057 Invter SUMIDA IV140801T Panel AU 1312EW02 Adapter LITEON PA-1650-02 Modem Card LI SHIN Qcom 0335A1965 MD560(B)-01 MD560LMI-2 WLAN Intel WM3945ABG Page: 7 of 127

1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as: Pre-Test Mode Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Final Test Mode Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Emission Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Immunity Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Product Manufacturer Model No. Serial No. Power Cord 1 Monitor SAMSUNG 1200NF 800077E Non-Shielded, 1.8m 2 Microphone & ROSA RSM-900 N/A N/A Earphone 3 Slim COMBO ASUS SCB-2408D N/A Non-Shielded, 1.8m With Core*1 4 USB 2.0 HDD Topdisk ME-910 220955 Power by PC 5 USB 2.0 HDD Topdisk ME-910 233715 Power by PC 6 USB 2.0 HDD Topdisk ME-910 235577 Power by PC 7 Notebook PC DELL PPT N/A Non-Shielded, 0.8m 8 Exchange Network Sun Moon Star PX-4 95170087 Non-Shielded, 1.8m Page: 8 of 127

1.4. Configuration of Tested System Connection Diagram Signal Cable Type Signal cable Description A D-SUB Cable Shielded, 1.8m, with two ferrite cores bonded B Earphone & Microphone Cable Non-Shielded, 1.6m C 1394 Cable Shielded, 1.6m D USB Cable Shielded, 1.6m E USB Cable Shielded, 1.6m F USB Cable Shielded, 1.6m G LAN Cable Non-Shielded, 7.0m H TELECOM Cable Non-Shielded, 1.5m I TELECOM Cable Non-Shielded, 1.5m Page: 9 of 127

1.5. EUT Exercise Software 1 Setup the EUT and simulators as shown on 1.4. 2 Turn on the power of all equipment. 3 EUT get into Windows XP operating system. 4 Notebook will read data from USB 2.0 HDD and then writes the data into USB 2.0 HDD, same operation for hard disk. 5 Notebook will read data from CD-ROM or DVD and then writes the data into External USB optical device. 6 Notebook sends H character to LCD display and external monitor at the same time, the screen will display and fill with H pattern. 7 Notebook will communicate with the partner PC through the internal Fax/modem module (Lan Module). 8 The transmitted and received status will be shown on the monitor (TV). 9 Repeat the above procedure (4) to (8). Page: 10 of 127

2. Technical Test 2.1. Summary of Test Result No deviations from the test standards Deviations from the test standards as below description: Emission Performed Item Normative References Test Performed Deviation Conducted Emission EN 55022:1998+A1: 2000 Class B Yes No AS/NZS CISPR 22: 2002 Radiated Emission EN 55022:1998+A1: 2000 Class B Yes No AS/NZS CISPR 22: 2002 Power Harmonics EN 61000-3-2:2000 Yes No Voltage Fluctuation and Flicker EN 61000-3-3:1995+A1:2001 Yes No Immunity Performed Item Normative References Test Performed Deviation Electrostatic Discharge IEC 61000-4-2 Edition 1.2: 2001-04 Yes No Radiated susceptibility IEC 61000-4-3:2002+A1:2002 Yes No Electrical fast transient/burst IEC 61000-4-4:2004 Yes No Surge IEC 61000-4-5 Edition 1.1: 2001-04 Yes No Conducted susceptibility IEC 61000-4-6 Edition 2.1: 2004-11 Yes No Power frequency magnetic field IEC 61000-4-8 Edition 1.1: 2001-03 Yes No Voltage dips and interruption IEC 61000-4-11 2nd Edition: 2004-03 Yes No Page: 11 of 127

2.2. List of Test Equipment Conducted Emission / SR1 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCS 30 836858/022 2005/07/21 LISN R&S ENV4200 833209/007 2005/07/27 LISN R&S ESH3-Z5 836679/020 2005/02/17 Pulse Limiter R&S ESH3-Z2 357.88.10.52 2005/09/07 Radiated Emission / Site3 Instrument Manufacturer Type No. Serial No Cal. Date Bilog Antenna Schaffner Chase CBL6112B 2704 2005/09/15 Broadband Horn Antenna Schwarzbeck BBHA9170 208 2005/07/25 EMI Test Receiver R&S ESI 26 838786/004 2005/05/25 EMI Test Receiver R&S ESCS 30 838251/001 2005/03/22 Horn Antenna Schwarzbeck BBHA9120D 305 2005/08/10 Pre-Amplifier QTK N/A N/A 2006/01/03 Pre-Amplifier MITEQ AMF-4D-18040 0-45-6P 925974 2006/01/03 Spectrum Analyzer Advantest R3162 101102468 2005/10/24 Power Harmonics / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK54148 2005/07/11 IEC1000-4-X Analyzer(Flicker) Schaffner CCN 1000-1 X7 1887 2005/07/11 Voltage Fluctuation and Flicker / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK54148 2005/07/11 IEC1000-4-X Analyzer(Flicker) Schaffner CCN 1000-1 X7 1887 2005/07/11 Electrostatic Discharge / SR3 Instrument Manufacturer Type No. Serial No Cal. Date ESD simulator system Schaffner NSG 438 167 2005/06/07 Horizontal Coupling Plane(HCP) QuieTek HCP AL50 N/A N/A Vertical Coupling Plane(VCP) QuieTek VCP AL50 N/A N/A Radiated susceptibility / CB5 Instrument Manufacturer Type No. Serial No Cal. Date AF-BOX R&S AF-BOX ACCUST 100007 N/A Audio Analyzer R&S UPL 16 100137 2005/03/31 Bilog Antenna Schaffner Chase CBL6112B 2450 2006/01/03 Broad-Band Antenna Schwarzbeck VULB 9166 1085 2005/08/01 CMU200 UNIV.RADIOCOMM R&S CMU200 104846 2005/03/28 Directional Coupler A&R DC 6180 22735 2005/08/03 Dual Microphone Supply B&K 5935 2426784 2005/08/03 Page: 12 of 127

Mouth Simulator B&K 4227 2439692 2005/08/03 Power Amplifier A&R 30S1G3 309453 N/A Power Amplifier A&R 100W10000M7 A285000010 N/A Power Meter R&S NRVD(P.M) 100219 2005/01/17 Pre-Amplifier A&R 150A220 23067 N/A Probe Microphone B&K 4182 2278070 2005/08/03 Signal Generator R&S SMY02(9K-208 0) 825454/028 2005/10/03 Electrical fast transient/burst / SR3 Instrument Manufacturer Type No. Serial No Cal. Date Burst 4.8KV/16A Generator with CDN Schaffner PNW2225 200123-098SC 2005/12/28 Damped osc. Wave 100kHz Schaffner PNW2056 200124-058SC 2005/12/28 and 1MHz Double AC Source Variator Schaffner NSG 642A 30910014938 2005/12/28 Hybrid surge pulse 1.2/50uS Schaffner PNW 2050 20532-514LU 2006/01/03 PQT Generator Schaffner PNW2003 200138-007SC 2006/01/02 Pulse COUPLING NETWORK Schaffner CDN131 200124-007SC 2005/12/28 Surge / SR3 Instrument Manufacturer Type No. Serial No Cal. Date Burst 4.8KV/16A Generator with CDN Schaffner PNW2225 200123-098SC 2005/12/28 Damped osc. Wave 100kHz Schaffner PNW2056 200124-058SC 2005/12/28 and 1MHz Double AC Source Variator Schaffner NSG 642A 30910014938 2005/12/28 Hybrid surge pulse 1.2/50uS Schaffner PNW 2050 20532-514LU 2006/01/03 PQT Generator Schaffner PNW2003 200138-007SC 2006/01/02 Pulse COUPLING NETWORK Schaffner CDN131 200124-007SC 2005/12/28 Conducted susceptibility / SR6 Instrument Manufacturer Type No. Serial No Cal. Date CDN Schaffner CAL U100A 20405 2005/04/21 CDN Schaffner TRA U150 20454 2005/04/21 CDN M016S Schaffner CAL U100A 20410 2005/04/21 CDN M016S Schaffner TRA U150 21167 2005/04/21 CDN T002 Schaffner TRA U150 21169 2005/04/21 CDN T002 Schaffner CAL U100 20491 2005/04/21 CDN T400 Schaffner CAL U100 17735 2005/04/21 CDN T400 Schaffner TRA U150 21166 2005/04/21 Coupling Decoupling Network Schaffner CDN M016S 20822 2005/02/23 Coupling Decoupling Network Schaffner CDN T002 19018 2005/04/21 Coupling Decoupling Network Schaffner CDN T400 21226 2005/04/21 Coupling Decoupling Network Schaffner CDN M016S 20823 2005/04/21 EM-CLAMP Schaffner KEMZ 801 21024 2005/04/21 N/A N/A N/A N/A N/A Power frequency magnetic field / SR3 Page: 13 of 127

Instrument Manufacturer Type No. Serial No Cal. Date Induction Coil Interface Schaffner INA 2141 6002 N/A Magnetic Loop Coil Schaffner INA 702 199749-020IN N/A Magnetic/Electric field measuring system Lackmann Phymetric MV3 N/A N/A Triaxial ELF Magnetic Field Meter F.B.BELL 4090 9852 2005/05/30 Voltage dips and interruption / SR3 Instrument Manufacturer Type No. Serial No Cal. Date Burst 4.8KV/16A Generator with CDN Schaffner PNW2225 200123-098SC 2005/12/28 Damped osc. Wave 100kHz Schaffner PNW2056 200124-058SC 2005/12/28 and 1MHz Double AC Source Variator Schaffner NSG 642A 30910014938 2005/12/28 Hybrid surge pulse 1.2/50uS Schaffner PNW 2050 20532-514LU 2006/01/03 PQT Generator Schaffner PNW2003 200138-007SC 2006/01/02 Pulse COUPLING NETWORK Schaffner CDN131 200124-007SC 2005/12/28 Page: 14 of 127

2.3. Measurement Uncertainty Conducted Emission The measurement uncertainty is evaluated as ± 2.26 db. Radiated Emission The measurement uncertainty is evaluated as ± 3.19 db. Electrostatic Discharge As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in ESD testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant ESD standards. The immunity test signal from the ESD system meet the required specifications in IEC 61000-4-2 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Radiated susceptibility As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in RS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant RS standards. The immunity test signal from the RS system meet the required specifications in IEC 61000-4-3 through the calibration for the uniform field strength and monitoring for the test level with the uncertainty evaluation report for the electrical filed strength as being 2.72 db. Electrical fast transient/burst As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in RS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant RS standards. The immunity test signal from the RS system meet the required specifications in IEC 61000-4-3 through the calibration for the uniform field strength and monitoring for the test level with the uncertainty evaluation report for the electrical filed strength as being 2.72 db. Surge As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in Surge testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant Surge standards. The immunity test signal from the Surge system meet the required specifications in IEC 61000-4-5 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Conducted susceptibility As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in CS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant CS standards. Page: 15 of 127

The immunity test signal from the CS system meet the required specifications in IEC 61000-4-6 through the calibration for unmodulated signal and monitoring for the test level with the uncertainty evaluation report for the injected modulated signal level through CDN and EM Clamp/Direct Injection as being 3.72 db and 2.78 db. Power frequency magnetic field As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in PFM testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant PFM standards. The immunity test signal from the PFM system meet the required specifications in IEC 61000-4-8 through the calibration report with the calibrated uncertainty for the Gauss Meter to verify the output level of magnetic field strength as being 2 %. Voltage dips and interruption As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in DIP testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant DIP standards. The immunity test signal from the DIP system meet the required specifications in IEC 61000-4-11 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Page: 16 of 127

2.4. Test Environment Performed Item Items Required Actual Temperature ( C) 15-35 25 Conducted Emission Humidity (%RH) 25-75 50 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 25 Radiated Emission Humidity (%RH) 25-75 50 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 22 Electrostatic Discharge Humidity (%RH) 30-60 42 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 23 Radiated susceptibility Humidity (%RH) 25-75 43 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 23 Electrical fast transient/burst Humidity (%RH) 25-75 47 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 23.7 Surge Humidity (%RH) 10-75 45 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 23 Conducted susceptibility Humidity (%RH) 25-75 47 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 23 Power frequency Humidity (%RH) magnetic field 25-75 47 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 22 Voltage dips and interruption Humidity (%RH) 25-75 45 Barometric pressure (mbar) 860-1060 950-1000 Page: 17 of 127

3. Conducted Emission (Main Terminals) 3.1. Test Specification According to EMC Standard : EN 55022 and AS/NZS CISPR 22: 2004 3.2. Test Setup 3.3. Limit Limits Frequency (MHz) QP (dbuv) AV (dbuv) 0.15-0.50 66-56 56 46 0.50-5.0 56 46 5.0-30 60 50 Remarks: In the above table, the tighter limit applies at the band edges. Page: 18 of 127

3.4. Test Procedure The EUT and simulators are connected to the main power through a line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) Both sides of A.C. line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed on conducted measurement. Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using a receiver bandwidth of 9kHz. 3.5. Deviation from Test Standard No deviation. Page: 19 of 127

3.6. Test Result Site : SR-1 Time : 2006/02/06-11:47 Limit : CISPR_B_00M_QP Margin : 10 EUT : MEGA BOOK Probe : LISN-L(020) - Line1 Power : AC 230V/50Hz Note : MODE 1 Page: 20 of 127

Site : SR-1 Time : 2006/02/06-11:49 Limit : CISPR_B_00M_QP Margin : 0 EUT : MEGA BOOK Probe : LISN-L(020) - Line1 Power : AC 230V/50Hz Note : MODE 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 0.205 0.613 52.260 52.873-11.556 64.429 QUASIPEAK 2 0.279 0.300 42.360 42.660-19.654 62.314 QUASIPEAK 3 * 1.998 0.340 45.650 45.990-10.010 56.000 QUASIPEAK 4 2.443 0.358 39.420 39.778-16.222 56.000 QUASIPEAK 5 5.232 0.440 37.960 38.400-21.600 60.000 QUASIPEAK 6 6.400 0.480 37.050 37.530-22.470 60.000 QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 21 of 127

Site : SR-1 Time : 2006/02/06-11:49 Limit : CISPR_B_00M_AV Margin : 0 EUT : MEGA BOOK Probe : LISN-L(020) - Line1 Power : AC 230V/50Hz Note : MODE 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 0.205 0.613 43.800 44.413-10.016 54.429 AVERAGE 2 0.279 0.300 33.460 33.760-18.554 52.314 AVERAGE 3 * 1.998 0.340 42.480 42.820-3.180 46.000 AVERAGE 4 2.443 0.358 28.490 28.848-17.152 46.000 AVERAGE 5 5.232 0.440 32.970 33.410-16.590 50.000 AVERAGE 6 6.400 0.480 32.840 33.320-16.680 50.000 AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 22 of 127

Site : SR-1 Time : 2006/02/06-11:50 Limit : CISPR_B_00M_QP Margin : 10 EUT : MEGA BOOK Probe : LISN-N(020) - Line2 Power : AC 230V/50Hz Note : MODE 1 Page: 23 of 127

Site : SR-1 Time : 2006/02/06-11:53 Limit : CISPR_B_00M_QP Margin : 0 EUT : MEGA BOOK Probe : LISN-N(020) - Line2 Power : AC 230V/50Hz Note : MODE 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 0.209 0.300 49.660 49.960-14.354 64.314 QUASIPEAK 2 0.340 0.304 34.290 34.594-25.978 60.571 QUASIPEAK 3 * 1.998 0.350 45.940 46.290-9.710 56.000 QUASIPEAK 4 2.232 0.350 43.430 43.780-12.220 56.000 QUASIPEAK 5 5.236 0.420 39.580 40.000-20.000 60.000 QUASIPEAK 6 6.705 0.440 36.680 37.120-22.880 60.000 QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 24 of 127

Site : SR-1 Time : 2006/02/06-11:53 Limit : CISPR_B_00M_AV Margin : 0 EUT : MEGA BOOK Probe : LISN-N(020) - Line2 Power : AC 230V/50Hz Note : MODE 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 0.209 0.300 42.800 43.100-11.214 54.314 AVERAGE 2 0.340 0.304 27.930 28.234-22.338 50.571 AVERAGE 3 * 1.998 0.350 42.630 42.980-3.020 46.000 AVERAGE 4 2.232 0.350 40.260 40.610-5.390 46.000 AVERAGE 5 5.236 0.420 37.620 38.040-11.960 50.000 AVERAGE 6 6.705 0.440 34.320 34.760-15.240 50.000 AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 25 of 127

Site : SR-1 Time : 2006/02/06-11:12 Limit : CISPR_B_00M_QP Margin : 10 EUT : MEGA BOOK Probe : LISN-L(020) - Line1 Power : AC 230V/50Hz Note : MODE 2 Page: 26 of 127

Site : SR-1 Time : 2006/02/06-11:14 Limit : CISPR_B_00M_QP Margin : 0 EUT : MEGA BOOK Probe : LISN-L(020) - Line1 Power : AC 230V/50Hz Note : MODE 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 0.201 0.641 48.960 49.601-14.942 64.543 QUASIPEAK 2 0.263 0.315 37.750 38.065-24.706 62.771 QUASIPEAK 3 0.599 0.300 38.670 38.970-17.030 56.000 QUASIPEAK 4 * 2.283 0.350 43.640 43.990-12.010 56.000 QUASIPEAK 5 4.630 0.420 37.390 37.810-18.190 56.000 QUASIPEAK 6 6.521 0.480 42.100 42.580-17.420 60.000 QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 27 of 127

Site : SR-1 Time : 2006/02/06-11:14 Limit : CISPR_B_00M_AV Margin : 0 EUT : MEGA BOOK Probe : LISN-L(020) - Line1 Power : AC 230V/50Hz Note : MODE 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 0.201 0.641 44.370 45.011-9.532 54.543 AVERAGE 2 0.263 0.315 29.320 29.635-23.136 52.771 AVERAGE 3 0.599 0.300 34.250 34.550-11.450 46.000 AVERAGE 4 * 2.283 0.350 39.530 39.880-6.120 46.000 AVERAGE 5 4.630 0.420 30.400 30.820-15.180 46.000 AVERAGE 6 6.521 0.480 29.690 30.170-19.830 50.000 AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 28 of 127

Site : SR-1 Time : 2006/02/06-11:15 Limit : CISPR_B_00M_QP Margin : 10 EUT : MEGA BOOK Probe : LISN-N(020) - Line2 Power : AC 230V/50Hz Note : MODE 2 Page: 29 of 127

Site : SR-1 Time : 2006/02/06-11:17 Limit : CISPR_B_00M_QP Margin : 0 EUT : MEGA BOOK Probe : LISN-N(020) - Line2 Power : AC 230V/50Hz Note : MODE 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 0.197 0.300 47.680 47.980-16.677 64.657 QUASIPEAK 2 0.263 0.300 39.850 40.150-22.621 62.771 QUASIPEAK 3 0.599 0.310 39.220 39.530-16.470 56.000 QUASIPEAK 4 * 2.463 0.360 42.590 42.950-13.050 56.000 QUASIPEAK 5 4.627 0.410 37.250 37.660-18.340 56.000 QUASIPEAK 6 6.736 0.446 36.050 36.496-23.504 60.000 QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 30 of 127

Site : SR-1 Time : 2006/02/06-11:17 Limit : CISPR_B_00M_AV Margin : 0 EUT : MEGA BOOK Probe : LISN-N(020) - Line2 Power : AC 230V/50Hz Note : MODE 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 0.197 0.300 42.380 42.680-11.977 54.657 AVERAGE 2 0.263 0.300 31.630 31.930-20.841 52.771 AVERAGE 3 0.599 0.310 35.210 35.520-10.480 46.000 AVERAGE 4 * 2.463 0.360 35.890 36.250-9.750 46.000 AVERAGE 5 4.627 0.410 30.020 30.430-15.570 46.000 AVERAGE 6 6.736 0.446 28.520 28.966-21.034 50.000 AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 31 of 127

1. Site : SR-1 Time : 2006/03/23-06:14 Limit : CISPR_B_00M_QP Margin : 10 EUT : MEGABOOK Probe : LISN-020(L) - Line1 Power : AC 230V/50Hz Note : Mode 3 Page: 32 of 127

Site : SR-1 Time : 2006/03/23-06:15 Limit : CISPR_B_00M_QP Margin : 0 EUT : MEGABOOK Probe : LISN-020(L) - Line1 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 * 0.205 0.202 53.470 53.672-10.757 64.429 QUASIPEAK 2 0.275 0.212 47.230 47.442-14.987 62.429 QUASIPEAK 3 0.412 0.215 38.970 39.185-19.329 58.514 QUASIPEAK 4 0.826 0.231 36.940 37.171-18.829 56.000 QUASIPEAK 5 2.048 0.277 41.440 41.717-14.283 56.000 QUASIPEAK 6 4.396 0.368 39.240 39.608-16.392 56.000 QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 33 of 127

Site : SR-1 Time : 2006/03/23-06:15 Limit : CISPR_B_00M_AV Margin : 0 EUT : MEGABOOK Probe : LISN-020(L) - Line1 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 * 0.205 0.202 48.380 48.582-5.847 54.429 AVERAGE 2 0.275 0.212 43.750 43.962-8.467 52.429 AVERAGE 3 0.412 0.215 37.600 37.815-10.699 48.514 AVERAGE 4 0.826 0.231 35.010 35.241-10.759 46.000 AVERAGE 5 2.048 0.277 38.610 38.887-7.113 46.000 AVERAGE 6 4.396 0.368 31.990 32.358-13.642 46.000 AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 34 of 127

Site : SR-1 Time : 2006/03/23-06:16 Limit : CISPR_B_00M_QP Margin : 10 EUT : MEGABOOK Probe : LISN-020(N) - Line2 Power : AC 230V/50Hz Note : Mode 3 Page: 35 of 127

Site : SR-1 Time : 2006/03/23-06:18 Limit : CISPR_B_00M_QP Margin : 0 EUT : MEGABOOK Probe : LISN-020(N) - Line2 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 * 0.205 0.202 51.860 52.062-12.367 64.429 QUASIPEAK 2 0.275 0.203 46.240 46.443-15.985 62.429 QUASIPEAK 3 0.412 0.215 38.160 38.375-20.139 58.514 QUASIPEAK 4 2.048 0.277 41.860 42.137-13.863 56.000 QUASIPEAK 5 4.877 0.375 36.690 37.065-18.935 56.000 QUASIPEAK 6 25.002 0.833 35.910 36.743-23.257 60.000 QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 36 of 127

Site : SR-1 Time : 2006/03/23-06:18 Limit : CISPR_B_00M_AV Margin : 0 EUT : MEGABOOK Probe : LISN-020(N) - Line2 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv) (dbuv) (db) (dbuv) 1 * 0.205 0.202 48.290 48.492-5.937 54.429 AVERAGE 2 0.275 0.203 43.310 43.513-8.915 52.429 AVERAGE 3 0.412 0.215 36.720 36.935-11.579 48.514 AVERAGE 4 2.048 0.277 39.070 39.347-6.653 46.000 AVERAGE 5 4.877 0.375 30.370 30.745-15.255 46.000 AVERAGE 6 25.002 0.833 35.670 36.503-13.497 50.000 AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 37 of 127

3.7. Test Photograph Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Front View of Conducted Test Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Back View of Conducted Test Page: 38 of 127

Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Front View of Conducted Test Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Back View of Conducted Test Page: 39 of 127

Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Front View of Conducted Test Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Back View of Conducted Test Page: 40 of 127

4. Radiated Emission 4.1. Test Specification According to EMC Standard : EN 55022 and AS/NZS CISPR 22 4.2. Test Setup 4.3. Limit Frequency (MHz) Limits Distance (m) dbuv/m 30 230 10 30 230 1000 10 37 Remark: 1. The tighter limit shall apply at the edge between two frequency bands. 2. Distance refers to the distance in meters between the measuring instrument antenna and the closed point of any part of the device or system. Page: 41 of 127

4.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 10 meters. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated on radiated measurement. Radiated emissions were invested over the frequency range from 30MHz to1ghz using a receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of 10 meters. 4.5. Deviation from Test Standard No deviation. Page: 42 of 127

4.6. Test Result Site : OATS-3 Time : 2006/01/27-14:29 Limit : CISPR_B_10M_QP Margin : 6 EUT : MEGA BOOK Probe : CBL6112B-(2704) - HORIZONTAL Power : AC 230V/50Hz Note : MODE 1 Frequency (MHz) Correct Factor Reading Level Measure Level Margin (db) Limit (dbuv/m) Detector Type (db) (dbuv) (dbuv/m) 1 125.000 13.787 11.400 25.187-4.813 30.000 QUASIPEAK 2 238.077 13.874 13.100 26.975-10.025 37.000 QUASIPEAK 3 300.025 16.709 7.300 24.009-12.991 37.000 QUASIPEAK 4 480.045 22.073 7.800 29.873-7.127 37.000 QUASIPEAK 5 600.057 24.264 8.200 32.464-4.536 37.000 QUASIPEAK 6 * 720.068 25.924 7.200 33.124-3.876 37.000 QUASIPEAK 7 840.085 27.402 3.900 31.302-5.698 37.000 QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 43 of 127

Site : OATS-3 Time : 2006/01/27-14:13 Limit : CISPR_B_10M_QP Margin : 6 EUT : MEGA BOOK Probe : CBL6112B-(2704) - VERTICAL Power : AC 230V/50Hz Note : MODE 1 Frequency (MHz) Correct Factor Reading Level Measure Level Margin (db) Limit (dbuv/m) Detector Type (db) (dbuv) (dbuv/m) 1 * 120.015 13.603 12.500 26.103-3.897 30.000 QUASIPEAK 2 125.000 13.787 6.900 20.687-9.313 30.000 QUASIPEAK 3 300.030 16.709 8.800 25.509-11.491 37.000 QUASIPEAK 4 480.045 22.073 7.800 29.873-7.127 37.000 QUASIPEAK 5 600.055 24.264 8.600 32.864-4.136 37.000 QUASIPEAK 6 749.990 26.595 5.800 32.395-4.605 37.000 QUASIPEAK 7 916.362 28.129 3.200 31.329-5.671 37.000 QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 44 of 127

Site : OATS-3 Time : 2006/01/27-14:00 Limit : CISPR_B_10M_QP Margin : 6 EUT : MEGA BOOK Probe : CBL6112B-(2704) - HORIZONTAL Power : AC 230V/50Hz Note : MODE 2 Frequency (MHz) Correct Factor Reading Level Measure Level Margin (db) Limit (dbuv/m) Detector Type (db) (dbuv) (dbuv/m) 1 125.000 13.787 11.300 25.087-4.913 30.000 QUASIPEAK 2 200.057 11.599 12.600 24.200-5.800 30.000 QUASIPEAK 3 360.035 18.863 8.300 27.164-9.836 37.000 QUASIPEAK 4 480.055 22.074 8.500 30.573-6.427 37.000 QUASIPEAK 5 * 600.057 24.264 9.300 33.564-3.436 37.000 QUASIPEAK 6 720.065 25.924 5.500 31.424-5.576 37.000 QUASIPEAK 7 840.083 27.402 3.900 31.302-5.698 37.000 QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 45 of 127

Site : OATS-3 Time : 2006/01/27-13:44 Limit : CISPR_B_10M_QP Margin : 6 EUT : MEGA BOOK Probe : CBL6112B-(2704) - VERTICAL Power : AC 230V/50Hz Note : MODE 2 Frequency (MHz) Correct Factor Reading Level Measure Level Margin (db) Limit (dbuv/m) Detector Type (db) (dbuv) (dbuv/m) 1 120.007 13.602 10.300 23.902-6.098 30.000 QUASIPEAK 2 125.000 13.787 10.600 24.387-5.613 30.000 QUASIPEAK 3 240.000 14.124 7.600 21.724-15.276 37.000 QUASIPEAK 4 300.030 16.709 9.100 25.809-11.191 37.000 QUASIPEAK 5 480.050 22.074 6.500 28.573-8.427 37.000 QUASIPEAK 6 * 600.057 24.264 8.800 33.064-3.936 37.000 QUASIPEAK 7 782.453 26.687 4.400 31.088-5.912 37.000 QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 46 of 127

Site : OATS-3 Time : 2006/03/23-14:58 Limit : CISPR_B_10M_QP Margin : 6 EUT : MEGA BOOK Probe : CBL6112B-(2704) - HORIZONTAL Power : AC 230V/50Hz Note : Mode 3 Frequency (MHz) Correct Factor Reading Level Measure Level Margin (db) Limit (dbuv/m) Detector Type (db) (dbuv) (dbuv/m) 1 120.007 14.866 7.820 22.686-7.314 30.000 QUASIPEAK 2 151.117 13.470 7.220 20.690-9.310 30.000 QUASIPEAK 3 * 166.650 12.565 13.500 26.065-3.935 30.000 QUASIPEAK 4 233.117 14.698 16.620 31.318-5.682 37.000 QUASIPEAK 5 300.015 17.151 13.390 30.541-6.459 37.000 QUASIPEAK 6 327.677 17.907 12.230 30.137-6.863 37.000 QUASIPEAK 7 551.000 22.711 5.010 27.721-9.279 37.000 QUASIPEAK 8 771.055 25.450 3.400 28.849-8.151 37.000 QUASIPEAK 9 840.088 26.401 2.200 28.601-8.399 37.000 QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 47 of 127

Site : OATS-3 Time : 2006/03/23-14:47 Limit : CISPR_B_10M_QP Margin : 6 EUT : MEGA BOOK Probe : CBL6112B-(2704) - VERTICAL Power : AC 230V/50Hz Note : Mode 3 Frequency (MHz) Correct Factor Reading Level Measure Level Margin (db) Limit (dbuv/m) Detector Type (db) (dbuv) (dbuv/m) 1 54.403 9.236 15.000 24.236-5.764 30.000 QUASIPEAK 2 120.010 14.866 10.200 25.066-4.934 30.000 QUASIPEAK 3 * 163.210 12.687 14.200 26.887-3.113 30.000 QUASIPEAK 4 166.650 12.565 14.100 26.665-3.335 30.000 QUASIPEAK 5 233.345 14.714 14.720 29.434-7.566 37.000 QUASIPEAK 6 366.525 18.968 5.400 24.368-12.632 37.000 QUASIPEAK 7 785.070 25.624 2.630 28.254-8.746 37.000 QUASIPEAK 8 866.648 26.800 4.800 31.600-5.400 37.000 QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 48 of 127

4.7. Test Photograph Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Front View of Radiated Test Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Back View of Radiated Test Page: 49 of 127

Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Front View of Radiated Test Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Back View of Radiated Test Page: 50 of 127

Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Front View of Radiated Test Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Back View of Radiated Test Page: 51 of 127

5. Harmonic Current Emission 5.1. Test Specification According to EMC Standard : EN 61000-3-2 5.2. Test Setup 5.3. Limit (a) Limits of Class A Harmonics Currents Harmonics Order n Maximum Permissible harmonic current A Harmonics Order n Maximum Permissible harmonic current A Odd harmonics Even harmonics 3 2.30 2 1.08 5 1.14 4 0.43 7 0.77 6 0.30 9 0.40 8 n 40 0.23 * 8/n 11 0.33 13 0.21 15 n 39 0.15 * 15/n Page: 52 of 127

(b) Limits of Class B Harmonics Currents For Class B equipment, the harmonic of the input current shall not exceed the maximum permissible values given in table that is the limit of Class A multiplied by a factor of 1.5. (c) Limits of Class C Harmonics Currents Harmonics Order Maximum Permissible harmonic current Expressed as a percentage of the input current at the fundamental frequency n % 2 2 3 30.λ * 5 10 7 7 9 5 11 n 39 3 (odd harmonics only) *λ is the circuit power factor (d) Limits of Class D Harmonics Currents Harmonics Order n Maximum Permissible harmonic current per watt ma/w Maximum Permissible harmonic current A 3 3.4 2.30 5 1.9 1.14 7 1.0 0.77 9 0.5 0.40 11 0.35 0.33 11 n 39 (odd harmonics only) 3.85/n See limit of Class A Page: 53 of 127

5.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed. 5.5. Deviation from Test Standard No deviation. Page: 54 of 127

5.6. Test Result Product MEGA BOOK Test Item Test Mode Power Harmonics Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Date of Test 2006/01/27 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms 3 300 Current (Amps) 2 1 0-1 -2 200 100 0-100 -200 Voltage (Volts) -3-300 Harmonics and Class D limit line European Limits Current RMS(Amps) 0.225 0.200 0.175 0.150 0.125 0.100 0.075 0.050 0.025 0.000 4 8 12 16 20 24 28 32 36 40 Harmonic # Test result: Pass Worst harmonic was #0 with 0.00% of the limit. Page: 55 of 127

Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(pk%): 0.00 POHC(A): 0.000 POHC Limit(A): 0.000 Highest parameter values during test: V_RMS (Volts): 229.78 Frequency(Hz): 50.00 I_Peak (Amps): 3.019 I_RMS (Amps): 0.536 I_Fund (Amps): 0.204 Crest Factor: 6.211 Power (Watts): 46 Power Factor: 0.378 Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.004 3 0.163 0.158 0.0 0.171 0.237 0.00 Pass 4 0.004 5 0.158 0.088 0.0 0.166 0.132 0.00 Pass 6 0.004 7 0.152 0.046 0.0 0.160 0.070 0.00 Pass 8 0.004 9 0.144 0.023 0.0 0.151 0.035 0.00 Pass 10 0.005 11 0.134 0.016 0.0 0.140 0.024 0.00 Pass 12 0.005 13 0.123 0.014 0.0 0.128 0.021 0.00 Pass 14 0.005 15 0.111 0.012 0.0 0.116 0.018 0.00 Pass 16 0.005 17 0.099 0.011 0.0 0.102 0.016 0.00 Pass 18 0.005 19 0.086 0.009 0.0 0.089 0.014 0.00 Pass 20 0.004 21 0.073 0.009 0.0 0.075 0.013 0.00 Pass 22 0.004 23 0.061 0.008 0.0 0.062 0.012 0.00 Pass 24 0.004 25 0.049 0.007 0.0 0.050 0.011 0.00 Pass 26 0.003 27 0.039 0.007 0.0 0.039 0.010 0.00 Pass 28 0.003 29 0.029 0.006 0.0 0.029 0.009 0.00 Pass 30 0.002 31 0.020 0.006 0.0 0.021 0.009 0.00 Pass 32 0.002 33 0.013 0.005 0.0 0.014 0.008 0.00 Pass 34 0.001 35 0.007 0.005 0.0 0.008 0.008 0.00 Pass 36 0.001 37 0.004 0.005 0.0 0.004 0.007 0.00 Pass 38 0.001 39 0.004 0.005 0.0 0.004 0.007 0.00 Pass 40 0.001 1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 56 of 127

Product MEGA BOOK Test Item Power Harmonics Test Mode Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Date of Test 2006/01/27 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms 3 300 Current (Amps) 2 1 0-1 -2 200 100 0-100 -200 Voltage (Volts) -3-300 Harmonics and Class D limit line European Limits Current RMS(Amps) 0.225 0.200 0.175 0.150 0.125 0.100 0.075 0.050 0.025 0.000 4 8 12 16 20 24 28 32 36 40 Harmonic # Test result: Pass Worst harmonic was #0 with 0.00% of the limit. Page: 57 of 127

Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(pk%): 0.00 POHC(A): 0.000 POHC Limit(A): 0.000 Highest parameter values during test: V_RMS (Volts): 229.80 Frequency(Hz): 50.00 I_Peak (Amps): 2.771 I_RMS (Amps): 0.524 I_Fund (Amps): 0.204 Crest Factor: 5.700 Power (Watts): 47 Power Factor: 0.388 Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.005 3 0.165 0.158 0.0 0.175 0.238 0.00 Pass 4 0.005 5 0.160 0.089 0.0 0.170 0.133 0.00 Pass 6 0.005 7 0.153 0.047 0.0 0.162 0.070 0.00 Pass 8 0.005 9 0.144 0.023 0.0 0.152 0.035 0.00 Pass 10 0.005 11 0.133 0.016 0.0 0.141 0.024 0.00 Pass 12 0.005 13 0.121 0.014 0.0 0.128 0.021 0.00 Pass 14 0.005 15 0.109 0.012 0.0 0.114 0.018 0.00 Pass 16 0.005 17 0.095 0.011 0.0 0.100 0.016 0.00 Pass 18 0.005 19 0.082 0.009 0.0 0.085 0.014 0.00 Pass 20 0.004 21 0.068 0.009 0.0 0.071 0.013 0.00 Pass 22 0.004 23 0.056 0.008 0.0 0.057 0.012 0.00 Pass 24 0.003 25 0.044 0.007 0.0 0.045 0.011 0.00 Pass 26 0.003 27 0.033 0.007 0.0 0.033 0.010 0.00 Pass 28 0.002 29 0.023 0.006 0.0 0.024 0.009 0.00 Pass 30 0.002 31 0.015 0.006 0.0 0.015 0.009 0.00 Pass 32 0.001 33 0.008 0.005 0.0 0.009 0.008 0.00 Pass 34 0.001 35 0.004 0.005 0.0 0.004 0.008 0.00 Pass 36 0.001 37 0.004 0.005 0.0 0.005 0.007 0.00 Pass 38 0.001 39 0.006 0.005 0.0 0.007 0.007 0.00 Pass 40 0.001 1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 58 of 127

Product MEGA BOOK Test Item Power Harmonics Test Mode Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Date of Test 2006/03/23 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms 6 300 Current (Amps) 4 2 0-2 -4 200 100 0-100 -200 Voltage (Volts) -6-300 Harmonics and Class D limit line European Limits Current RMS(Amps) 0.30 0.25 0.20 0.15 0.10 0.05 0.00 4 8 12 16 20 24 28 32 36 40 Harmonic # Test result: Pass Worst harmonic was #0 with 0.00% of the limit. Page: 59 of 127

Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(pk%): 0.00 POHC(A): 0.000 POHC Limit(A): 0.000 Highest parameter values during test: V_RMS (Volts): 229.78 Frequency(Hz): 50.00 I_Peak (Amps): 3.494 I_RMS (Amps): 0.665 I_Fund (Amps): 0.261 Crest Factor: 6.197 Power (Watts): 59 Power Factor: 0.390 Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.004 3 0.198 0.202 0.0 0.235 0.303 0.00 Pass 4 0.005 5 0.192 0.113 0.0 0.227 0.169 0.00 Pass 6 0.005 7 0.184 0.059 0.0 0.216 0.089 0.00 Pass 8 0.005 9 0.173 0.030 0.0 0.202 0.045 0.00 Pass 10 0.006 11 0.160 0.021 0.0 0.186 0.031 0.00 Pass 12 0.006 13 0.145 0.018 0.0 0.167 0.026 0.00 Pass 14 0.006 15 0.130 0.015 0.0 0.148 0.023 0.00 Pass 16 0.006 17 0.114 0.014 0.0 0.127 0.020 0.00 Pass 18 0.006 19 0.098 0.012 0.0 0.107 0.018 0.00 Pass 20 0.005 21 0.082 0.011 0.0 0.088 0.016 0.00 Pass 22 0.005 23 0.066 0.010 0.0 0.070 0.015 0.00 Pass 24 0.004 25 0.052 0.009 0.0 0.054 0.014 0.00 Pass 26 0.004 27 0.039 0.008 0.0 0.040 0.013 0.00 Pass 28 0.003 29 0.028 0.008 0.0 0.029 0.012 0.00 Pass 30 0.002 31 0.019 0.007 0.0 0.020 0.011 0.00 Pass 32 0.002 33 0.012 0.007 0.0 0.013 0.010 0.00 Pass 34 0.001 35 0.007 0.007 0.0 0.009 0.010 0.00 Pass 36 0.001 37 0.006 0.006 0.0 0.009 0.009 0.00 Pass 38 0.001 39 0.007 0.006 0.0 0.010 0.009 0.00 Pass 40 0.001 1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 60 of 127

5.7. Test Photograph Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Power Harmonics Test Setup Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Power Harmonics Test Setup Page: 61 of 127

Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Power Harmonics Test Setup Page: 62 of 127

6. Voltage Fluctuation and Flicker 6.1. Test Specification According to EMC Standard : EN 61000-3-3 6.2. Test Setup 6.3. Limit The following limits apply: - the value of P st shall not be greater than 1.0; - the value of P lt shall not be greater than 0.65; - the value of d(t) during a voltage change shall not exceed 3.3 % for more than 500 ms; - the relative steady-state voltage change, d c, shall not exceed 3.3 %; - the maximum relative voltage change, d max, shall not exceed; a) 4 % without additional conditions; b) 6 % for equipment which is: - switched manually, or - switched automatically more frequently than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds), or manual restart, after a power supply interruption. NOTE The cycling frequency will be further limited by the P st and P 1t limit. For example: a d max of 6%producing a rectangular voltage change characteristic twice per hour will give a P 1t of about 0.65. Page: 63 of 127

c) 7 % for equipment which is: - attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment such as mixers, garden equipment such as lawn mowers, portable tools such as electric drills), or - switched on automatically, or is intended to be switched on manually, no more than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds) or manual restart, after a power supply interruption. P st and P 1t requirements shall not be applied to voltage changes caused by manual switching. 6.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed. 6.5. Deviation from Test Standard No deviation. Page: 64 of 127

6.6. Test Result Product MEGA BOOK Test Item Test Mode Voltage Fluctuation and Flicker Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Date of Test 2006/01/27 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits 1.00 0.75 Pst 0.50 0.25 0.00 6:08:21 Time is too short for Plt plot Parameter values recorded during the test: Vrms at the end of test (Volt): 229.64 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.001 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.001 Test limit: 0.650 Pass Page: 65 of 127

Product MEGA BOOK Test Item Voltage Fluctuation and Flicker Test Mode Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Date of Test 2006/01/27 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits 1.00 0.75 Pst 0.50 0.25 0.00 6:27:49 Time is too short for Plt plot Parameter values recorded during the test: Vrms at the end of test (Volt): 229.68 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.001 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.001 Test limit: 0.650 Pass Page: 66 of 127

Product MEGA BOOK Test Item Voltage Fluctuation and Flicker Test Mode Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Date of Test 2006/03/23 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits 1.00 0.75 Pst 0.50 0.25 0.00 5:05:46 Time is too short for Plt plot Parameter values recorded during the test: Vrms at the end of test (Volt): 229.64 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.001 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.001 Test limit: 0.650 Pass Page: 67 of 127

6.7. Test Photograph Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Flicker Test Setup Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Flicker Test Setup Page: 68 of 127

Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Flicker Test Setup Page: 69 of 127

7. Electrostatic Discharge 7.1. Test Specification According to Standard : IEC 61000-4-2 7.2. Test Setup 7.3. Limit Item Environmental Phenomena Units Test Specification Performance Criteria Enclosure Port Electrostatic Discharge kv(charge Voltage) ±8 Air Discharge ±4 Contact Discharge B Page: 70 of 127

7.4. Test Procedure Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT. Indirect application of discharges to the EUT: Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. 7.5. Deviation from Test Standard No deviation. Page: 71 of 127

7.6. Test Result Product MEGA BOOK Test Item Test Mode Electrostatic Discharge Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Date of Test 2006/02/10 Test Site No.3 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge 10 10 +8kV -8kV B B A A Pass Pass Contact Discharge 25 25 +4kV -4kV B B A A Pass Pass Indirect Discharge 50 +4kV B A Pass (HCP) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Front) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Left) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Back) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Right) 50-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 72 of 127

Product MEGA BOOK Test Item Electrostatic Discharge Test Mode Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Date of Test 2006/02/10 Test Site No.3 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge 10 10 +8kV -8kV B B A A Pass Pass Contact Discharge 25 25 +4kV -4kV B B A A Pass Pass Indirect Discharge 50 +4kV B A Pass (HCP) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Front) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Left) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Back) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Right) 50-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 73 of 127

Product MEGA BOOK Test Item Electrostatic Discharge Test Mode Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Date of Test 2006/03/24 Test Site No.3 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge 10 10 +8kV -8kV B B A A Pass Pass Contact Discharge 25 25 +4kV -4kV B B A A Pass Pass Indirect Discharge 50 +4kV B A Pass (HCP) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Front) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Left) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Back) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Right) 50-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 74 of 127

7.7. Test Photograph Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : ESD Test Setup Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : ESD Test Setup Page: 75 of 127

Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : ESD Test Setup Page: 76 of 127

8. Radiated Susceptibility 8.1. Test Specification According to Standard : IEC 61000-4-3 8.2. Test Setup 8.3. Limit Item Environmental Units Test Performance Phenomena Specification Criteria Enclosure Port Radio-Frequency MHz 80-1000 Electromagnetic Field Amplitude Modulated V/m(Un-modulated, rms) % AM (1kHz) 3 80 A Page: 77 of 127

8.4. Test Procedure The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. Both horizontal and vertical polarization of the antenna and four sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD camera is used to monitor EUT screen. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 3 V/m Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 80MHz - 1000MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s 8.5. Deviation from Test Standard No deviation. Page: 78 of 127

8.6. Test Result Product MEGA BOOK Test Item Test Mode Radiated susceptibility Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Date of Test 2006/02/06 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results 80-1000 FRONT H 3 A A PASS 80-1000 FRONT V 3 A A PASS 80-1000 BACK H 3 A A PASS 80-1000 BACK V 3 A A PASS 80-1000 RIGHT H 3 A A PASS 80-1000 RIGHT V 3 A A PASS 80-1000 LEFT H 3 A A PASS 80-1000 LEFT V 3 A A PASS 80-1000 UP H 3 A A PASS 80-1000 UP V 3 A A PASS 80-1000 DOWN H 3 A A PASS 80-1000 DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 79 of 127

Product MEGA BOOK Test Item Radiated susceptibility Test Mode Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Date of Test 2006/02/06 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results 80-1000 FRONT H 3 A A PASS 80-1000 FRONT V 3 A A PASS 80-1000 BACK H 3 A A PASS 80-1000 BACK V 3 A A PASS 80-1000 RIGHT H 3 A A PASS 80-1000 RIGHT V 3 A A PASS 80-1000 LEFT H 3 A A PASS 80-1000 LEFT V 3 A A PASS 80-1000 UP H 3 A A PASS 80-1000 UP V 3 A A PASS 80-1000 DOWN H 3 A A PASS 80-1000 DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 80 of 127

Product MEGA BOOK Test Item Radiated susceptibility Test Mode Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Date of Test 2006/03/24 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results 80-1000 FRONT H 3 A A PASS 80-1000 FRONT V 3 A A PASS 80-1000 BACK H 3 A A PASS 80-1000 BACK V 3 A A PASS 80-1000 RIGHT H 3 A A PASS 80-1000 RIGHT V 3 A A PASS 80-1000 LEFT H 3 A A PASS 80-1000 LEFT V 3 A A PASS 80-1000 UP H 3 A A PASS 80-1000 UP V 3 A A PASS 80-1000 DOWN H 3 A A PASS 80-1000 DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 81 of 127

8.7. Test Photograph Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Radiated Susceptibility Test Setup Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Radiated Susceptibility Test Setup Page: 82 of 127

Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Radiated Susceptibility Test Setup Page: 83 of 127

9. Electrical Fast Transient/Burst 9.1. Test Specification According to Standard : IEC 61000-4-4 9.2. Test Setup 9.3. Limit Item Environmental Phenomena I/O and communication ports Fast Transients Common Mode Input DC Power Ports Fast Transients Common Mode Input AC Power Ports Fast Transients Common Mode Units kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz Test Specification Performance Criteria +0.5 5/50 5 +0.5 5/50 5 +1 5/50 5 B B B Page: 84 of 127

9.4. Test Procedure The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on the table, and uses a 0.1m insulation between the EUT and ground reference plane. The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and projected beyond the EUT by at least 0.1m on all sides. Test on I/O and communication ports: The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1minute. Test on power supply ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT/B interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 minute. The length of the signal and power lines between the coupling device and the EUT is 0.5m. 9.5. Deviation from Test Standard No deviation. Page: 85 of 127

9.6. Test Result Product MEGA BOOK Test Item Test Mode Electrical fast transient/burst Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Date of Test 2006/02/06 Test Site No.3 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L+N+PE ± 1kV 60 CDN B A PASS LAN ± 0.5 kv 90 Clamp B A PASS Telecom ± 0.5 kv 90 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 86 of 127

Product MEGA BOOK Test Item Electrical fast transient/burst Test Mode Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Date of Test 2006/02/06 Test Site No.3 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L+N+PE ± 1kV 60 CDN B A PASS LAN ± 0.5 kv 90 Clamp B A PASS Telecom ± 0.5 kv 90 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 87 of 127

Product MEGA BOOK Test Item Electrical fast transient/burst Test Mode Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Date of Test 2006/02/06 Test Site No.3 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L+N+PE ± 1kV 60 CDN B A PASS LAN ± 0.5 kv 90 Clamp B A PASS Telecom ± 0.5 kv 90 Clamp B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 88 of 127

9.7. Test Photograph Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : EFT/B Test Setup Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : EFT/B Test Setup-Clamp Page: 89 of 127

Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : EFT/B Test Setup Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : EFT/B Test Setup-Clamp Page: 90 of 127

Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : EFT/B Test Setup Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : EFT/B Test Setup-Clamp Page: 91 of 127

10. Surge 10.1. Test Specification According to Standard : IEC 61000-4-5 10.2. Test Setup 10.3. Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports(See 1) and 2) ) Surges Tr/Th us Line to Ground kv Input DC Power Ports Surges Tr/Th us Line to Ground kv AC Input and AC Output Power Ports Surges Tr/Th us Line to Line kv Line to Ground kv Notes: Test Specification Performance Criteria 1.2/50 (8/20) ± 1 1.2/50 (8/20) ± 0.5 1.2/50 (8/20) ± 1 ± 2 1) Applicable only to ports which according to the manufacturer s may directly to outdoor cables. 2) Where normal functioning cannot be achieved because of the impact of the CDN on the EUT, no immunity test shall be required. B B B Page: 92 of 127

10.4. Test Procedure The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Input and Output AC Power or DC Input and DC Output Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 0 0, 90 0, 180 0, 270 0 and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min. 10.5. Deviation from Test Standard No deviation. Page: 93 of 127

10.6. Test Result Product MEGA BOOK Test Item Test Mode Surge Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Date of Test 2006/02/06 Test Site No.3 Shielded Room Voltage Time Complie Inject Inject Required Polarity Angle Interval d to Line Method Criteria kv (Second) Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 94 of 127

Product MEGA BOOK Test Item Surge Test Mode Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Date of Test 2006/02/06 Test Site No.3 Shielded Room Voltage Time Complie Inject Inject Required Polarity Angle Interval d to Line Method Criteria kv (Second) Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 95 of 127

Product MEGA BOOK Test Item Surge Test Mode Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Date of Test 2006/03/24 Test Site No.3 Shielded Room Voltage Time Complie Inject Inject Required Polarity Angle Interval d to Line Method Criteria kv (Second) Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 96 of 127

10.7. Test Photograph Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : SURGE Test Setup Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : SURGE Test Setup Page: 97 of 127

Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : SURGE Test Setup Page: 98 of 127

11. Conducted Susceptibility 11.1. Test Specification According to Standard : IEC 61000-4-6 11.2. Test Setup CDN Test Mode EM Clamp Test Mode Page: 99 of 127

11.3. Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports Radio-Frequency Continuous Conducted Input DC Power Ports Radio-Frequency Continuous Conducted Input AC Power Ports Radio-Frequency Continuous Conducted 11.4. Test Procedure MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) Test Specification 0.15-80 3 80 0.15-80 3 80 0.15-80 3 80 Performance Criteria A A A The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 130dBuV(3V) Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 0.15MHz 80MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s 11.5. Deviation from Test Standard No deviation. Page: 100 of 127

11.6. Test Result Product MEGA BOOK Test Item Test Mode Conducted susceptibility Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Date of Test 2006/02/07 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performanc Result Range Applied Method of Criteria e Criteria (MHz) dbuv(v) EUT Complied To 0.15~80 130 (3V) CDN AC IN A A PASS 0.15~80 130 (3V) Clamp LAN A A PASS 0.15~80 130 (3V) Clamp Telecom A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 101 of 127

Product MEGA BOOK Test Item Conducted susceptibility Test Mode Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Date of Test 2006/02/07 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performanc Result Range Applied Method of Criteria e Criteria (MHz) dbuv(v) EUT Complied To 0.15~80 130 (3V) CDN AC IN A A PASS 0.15~80 130 (3V) Clamp LAN A A PASS 0.15~80 130 (3V) Clamp Telecom A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 102 of 127

Product MEGA BOOK Test Item Conducted susceptibility Test Mode Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Date of Test 2006/03/24 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performanc Result Range Applied Method of Criteria e Criteria (MHz) dbuv(v) EUT Complied To 0.15~80 130 (3V) CDN AC IN A A PASS 0.15~80 130 (3V) CDN GIGA LAN A A PASS 0.15~80 130 (3V) CDN Telecom A A PASS 0.15~80 130 (3V) CDN LAN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 103 of 127

11.7. Test Photograph Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Conducted Susceptibility Test Setup Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Conducted Susceptibility Test Setup-(LAN) Page: 104 of 127

Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Conducted Susceptibility Test Setup-(Telecom) Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Conducted Susceptibility Test Setup Page: 105 of 127

Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Conducted Susceptibility Test Setup (LAN) Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Conducted Susceptibility Test Setup (Telecom) Page: 106 of 127

Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Conducted Susceptibility Test Setup Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Conducted Susceptibility Test Setup (GIGA LAN) Page: 107 of 127

Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Conducted Susceptibility Test Setup (Telecom) Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Conducted Susceptibility Test Setup (LAN) Page: 108 of 127

12. Power Frequency Magnetic Field 12.1. Test Specification According to Standard : IEC 61000-4-8 12.2. Test Setup 12.3. Limit Item Environmental Phenomena Enclosure Port Power-Frequency Magnetic Field 12.4. Test Procedure Units Hz A/m (r.m.s.) Test Specification Performance Criteria 50 1 A The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured at least 1m*1m min. The test magnetic field shall be placed at central of the induction coil. The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT. And the induction coil shall be rotated by 90 in order to expose the EUT to the test field with different orientation (X, Y, Z Orientations). 12.5. Deviation from Test Standard No deviation. Page: 109 of 127

12.6. Test Result Product MEGA BOOK Test Item Test Mode Power frequency magnetic field Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Date of Test 2006/02/06 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 110 of 127

Product MEGA BOOK Test Item Power frequency magnetic field Test Mode Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Date of Test 2006/02/06 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 111 of 127

Product MEGA BOOK Test Item Power frequency magnetic field Test Mode Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Date of Test 2006/03/24 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 112 of 127

12.7. Test Photograph Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Power Frequency Magnetic Field Test Setup Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Power Frequency Magnetic Field Test Setup Page: 113 of 127

Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Power Frequency Magnetic Field Test Setup Page: 114 of 127

13. Voltage Dips and Interruption 13.1. Test Specification According to Standard : IEC 61000-4-11 13.2. Test Setup 13.3. Limit Item Environmental Phenomena Input AC Power Ports Voltage Dips Voltage Interruptions Units % Reduction Period % Reduction Period % Reduction Period Test Specification Performance Criteria 30 C 25 >95 B 0.5 > 95 C 250 Page: 115 of 127

13.4. Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The power cord shall be used the shortest power cord as specified by the manufacturer. For Voltage Dips/ Interruptions test: The selection of test voltage is based on the rated power range. If the operation range is large than 20% of lower power range, both end of specified voltage shall be tested. Otherwise, the typical voltage specification is selected as test voltage. The EUT is connected to the power mains through a coupling device that directly couples to the Voltage Dips and Interruption Generator. The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25 Periods, for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of three voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied voltage and duration 250 Periods with a sequence of three voltage interruptions with intervals of 10 seconds. Voltage phase shifting are shall occur at 0 0, 45 0, 90 0,135 0,180 0,225 0, 270 0,315 0 of the voltage. 13.5. Deviation from Test Standard No deviation. Page: 116 of 127

13.6. Test Result Product MEGA BOOK Test Item Test Mode Voltage dips and interruption Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Date of Test 2006/01/27 Test Site No.3 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Test Result Criteria Complied To 30(161V) 0 25 C A PASS 30(161V) 45 25 C A PASS 30(161V) 90 25 C A PASS 30(161V) 135 25 C A PASS 30(161V) 180 25 C A PASS 30(161V) 225 25 C A PASS 30(161V) 270 25 C A PASS 30(161V) 315 25 C A PASS >95(0V) 0 0.5 B A PASS >95(0V) 45 0.5 B A PASS >95(0V) 90 0.5 B A PASS >95(0V) 135 0.5 B A PASS >95(0V) 180 0.5 B A PASS >95(0V) 225 0.5 B A PASS >95(0V) 270 0.5 B A PASS >95(0V) 315 0.5 B A PASS >95(0V) 0 250 C A PASS >95(0V) 45 250 C A PASS >95(0V) 90 250 C A PASS >95(0V) 135 250 C A PASS >95(0V) 180 250 C A PASS >95(0V) 225 250 C A PASS >95(0V) 270 250 C A PASS >95(0V) 315 250 C A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 117 of 127 kv

Product MEGA BOOK Test Item Voltage dips and interruption Test Mode Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Date of Test 2006/01/27 Test Site No.3 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Test Result Criteria Complied To 30(161V) 0 25 C A PASS 30(161V) 45 25 C A PASS 30(161V) 90 25 C A PASS 30(161V) 135 25 C A PASS 30(161V) 180 25 C A PASS 30(161V) 225 25 C A PASS 30(161V) 270 25 C A PASS 30(161V) 315 25 C A PASS >95(0V) 0 0.5 B A PASS >95(0V) 45 0.5 B A PASS >95(0V) 90 0.5 B A PASS >95(0V) 135 0.5 B A PASS >95(0V) 180 0.5 B A PASS >95(0V) 225 0.5 B A PASS >95(0V) 270 0.5 B A PASS >95(0V) 315 0.5 B A PASS >95(0V) 0 250 C A PASS >95(0V) 45 250 C A PASS >95(0V) 90 250 C A PASS >95(0V) 135 250 C A PASS >95(0V) 180 250 C A PASS >95(0V) 225 250 C A PASS >95(0V) 270 250 C A PASS >95(0V) 315 250 C A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 118 of 127

Product MEGA BOOK Test Item Voltage dips and interruption Test Mode Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Date of Test 2006/03/24 Test Site No.3 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Test Result Criteria Complied To 30(161V) 0 25 C A PASS 30(161V) 45 25 C A PASS 30(161V) 90 25 C A PASS 30(161V) 135 25 C A PASS 30(161V) 180 25 C A PASS 30(161V) 225 25 C A PASS 30(161V) 270 25 C A PASS 30(161V) 315 25 C A PASS >95(0V) 0 0.5 B A PASS >95(0V) 45 0.5 B A PASS >95(0V) 90 0.5 B A PASS >95(0V) 135 0.5 B A PASS >95(0V) 180 0.5 B A PASS >95(0V) 225 0.5 B A PASS >95(0V) 270 0.5 B A PASS >95(0V) 315 0.5 B A PASS >95(0V) 0 250 C A PASS >95(0V) 45 250 C A PASS >95(0V) 90 250 C A PASS >95(0V) 135 250 C A PASS >95(0V) 180 250 C A PASS >95(0V) 225 250 C A PASS >95(0V) 270 250 C A PASS >95(0V) 315 250 C A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 119 of 127 kv

13.7. Test Photograph Test Mode : Mode 1:Intel Yonah 1.66GHz, CRT 1024*768/60Hz+ LCD 1280*768/60Hz,Liteon, MD560 (B)-01 Description : Voltage Dips Test Setup Test Mode : Mode 2:Intel Yonah 1.66GHz, CRT only 2048*1536/60Hz,Li shin, MD560 (B)-01 Description : Voltage Dips Test Setup Page: 120 of 127

Test Mode : Mode 3:Intel Yonah 1.66GGz, CRT 1024*768/60Hz+LCD 1280*768/60Hz,Liteon, MD560LMI-2 Description : Voltage Dips Test Setup Page: 121 of 127

14. Attachment EUT Photograph (1) EUT Photo (2) EUT Photo Page: 122 of 127

(3) EUT Photo (4) EUT Photo Page: 123 of 127

(5) EUT Photo (6) EUT Photo Page: 124 of 127

(7) EUT Photo (8) EUT Photo Page: 125 of 127

(9) EUT Photo (10) EUT Photo Page: 126 of 127

(11) EUT Photo (12) EUT Photo Page: 127 of 127

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