Test Report. Product Name : MEGA BOOK : MS-1034, MS-1034B, MS-10341, MS-10341B, MS-10342, MS-10342B. Model No. Applicant : MICRO-STAR INTL Co., LTD.

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Test Report Product Name : MEGA BOOK Model No. : MS-1034, MS-1034B, MS-10341, MS-10341B, MS-10342, MS-10342B Applicant : MICRO-STAR INTL Co., LTD. Address : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C. Date of Receipt : 2006/02/08 Issued Date : 2006/03/01 Report No. : 062L020-IT-CE-P11V04 The test results relate only to the samples tested. The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein. This report must not be used to claim product endorsement by CNLA, NVLAP or any agency of the Government. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

Declaration of Conformity The following product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). The listed standards as below were applied: The following Equipment: Product Model Number Trade Name : MEGA BOOK : MS-1034, MS-1034B, MS-10341, MS-10341B, MS-10342, MS-1032B : MSI This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). For the evaluation regarding EMC, the following standards were applied: RFI Emission: EN 55022:1998+A1:2000+A2:2003 Class B : Product family standard EN 61000-3-2:2000 Class D : Limits for harmonic current emission EN 61000-3-3:1995+A1: 2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system Immunity: EN 55024:1998+A1:2001+A2:2003 : Product family standard The following importer/manufacturer is responsible for this declaration: Company Name : Company Address : Telephone : Facsimile : Person is responsible for marking this declaration: Name (Full Name) Position/ Title Date Legal Signature

QTK No.: 062L020-IT-CE-P11V04 Statement of Conformity This certifies that the following designated product: Product Model Number Trade Name Company Name : MEGA BOOK : MS-1034, MS-1034B, MS-10341, MS-10341B, MS-10342, MS-1032B : MSI : MICRO-STAR INTL Co., LTD. This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). For the evaluation regarding EMC, the following standards were applied: RFI Emission: EN 55022:1998+A1:2000+A2:2003 Class B : Product family standard EN 61000-3-2:2000 Class D : Limits for harmonic current emission EN 61000-3-3:1995+A1:2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system Immunity: EN 55024:1998+A1:2001+A2:2003 : Product family standard TEST LABORATORY 0914 Gene Chang / President The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo. QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. Tel: 886-2-8601-3788, Fax: 886-2-8601-3789, E-mail: service@quietek.com

Test Report Certification Issued Date : 2006/03/01 Report No. : 062L020-IT-CE-P11V04 Product Name : MEGA BOOK Applicant : MICRO-STAR INTL Co., LTD. Address : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C. Manufacturer : MICRO-STAR INTL Co., LTD. Model No. : MS-1034, MS-1034B, MS-10341, MS-10341B, MS-10342, MS-10342B Rated Voltage : AC 230 V / 50 Hz EUT Voltage : AC 100-240V / 50-60Hz Trade Name : MSI Applicable Standard : EN 55022: 1998+A1: 2000+A2: 2003 Class B EN 61000-3-2:2000EN 61000-3-3:1995+A1:2001 EN 55024: 1998+A1: 2001+A2: 2003 AS/NZS CISPR 22: 2004 Test Result : Complied Performed Location : Linkou EMC laboratory No.5-22,Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kuo Shiang, Taipei, 244 Taiwan, R.O.C. TEL:+866-2-8601-3788 / FAX:+886-2-8601-3789 Documented By : ( Rita Huang ) Reviewed By : ( Joy Liu ) Approved By : ( Gene Chang ) Page: 2 of 117

Laboratory Information We, QuieTek Corporation, are an independent EMC and safety consultancy that was established the whole facility in our laboratories. The test facility has been accredited by the following accreditation Bodies in compliance with ISO 17025, EN 45001 and Guide 25: Taiwan R.O.C. : BSMI, DGT, CNLA Germany : TUV Rheinland Norway : Nemko, DNV USA : FCC, NVLAP Japan : VCCI The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation s Web Site : http://tw.quietek.com/modules/myalbum/ The address and introduction of QuieTek Corporation s laboratories can be founded in our Web site : http://www.quietek.com/ If you have any comments, Please don t hesitate to contact us. Our contact information is as below: HsinChu Testing Laboratory : No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C. TEL:+886-3-592-8858 / FAX:+886-3-592-8859 E-Mail : service@quietek.com 1313 LinKou Testing Laboratory : No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwa, R.O.C. TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789 E-Mail : service@quietek.com 0914 Page: 3 of 117

TABLE OF CONTENTS Description Page 1. General Information... 7 1.1. EUT Description... 7 1.2. Mode of Operation... 8 1.3. Tested System Details... 8 1.4. Configuration of Tested System... 9 1.5. EUT Exercise Software... 10 2. Technical Test... 11 2.1. Summary of Test Result... 11 2.2. List of Test Equipment... 12 2.3. Measurement Uncertainty... 15 2.4. Test Environment... 17 3. Conducted Emission (Main Terminals)... 19 3.1. Test Specification... 19 3.2. Test Setup... 19 3.3. Limit... 19 3.4. Test Procedure... 20 3.5. Deviation from Test Standard... 20 3.6. Test Result... 21 3.7. Test Photograph... 33 4. Conducted Emissions (Telecommunication Ports)... 35 4.1. Test Specification... 35 4.2. Test Setup... 35 4.3. Limit... 35 4.4. Test Procedure... 36 4.5. Deviation from Test Standard... 36 4.6. Test Result... 37 4.7. Test Photograph... 52 5. Radiated Emission... 55 5.1. Test Specification... 55 5.2. Test Setup... 55 5.3. Limit... 55 5.4. Test Procedure... 56 5.5. Deviation from Test Standard... 56 5.6. Test Result... 57 5.7. Test Photograph... 61 6. Harmonic Current Emission... 63 Page: 4 of 117

6.1. Test Specification... 63 6.2. Test Setup... 63 6.3. Limit... 63 6.4. Test Procedure... 65 6.5. Deviation from Test Standard... 65 6.6. Test Result... 66 6.7. Test Photograph... 70 7. Voltage Fluctuation and Flicker... 71 7.1. Test Specification... 71 7.2. Test Setup... 71 7.3. Limit... 71 7.4. Test Procedure... 72 7.5. Deviation from Test Standard... 72 7.6. Test Result... 73 7.7. Test Photograph... 75 8. Electrostatic Discharge... 76 8.1. Test Specification... 76 8.2. Test Setup... 76 8.3. Limit... 76 8.4. Test Procedure... 77 8.5. Deviation from Test Standard... 77 8.6. Test Result... 78 8.7. Test Photograph... 80 9. Radiated Susceptibility... 81 9.1. Test Specification... 81 9.2. Test Setup... 81 9.3. Limit... 81 9.4. Test Procedure... 82 9.5. Deviation from Test Standard... 82 9.6. Test Result... 83 9.7. Test Photograph... 85 10. Electrical Fast Transient/Burst... 86 10.1. Test Specification... 86 10.2. Test Setup... 86 10.3. Limit... 86 10.4. Test Procedure... 87 10.5. Deviation from Test Standard... 87 10.6. Test Result... 88 Page: 5 of 117

10.7. Test Photograph... 90 11. Surge... 92 11.1. Test Specification... 92 11.2. Test Setup... 92 11.3. Limit... 92 11.4. Test Procedure... 93 11.5. Deviation from Test Standard... 93 11.6. Test Result... 94 11.7. Test Photograph... 96 12. Conducted Susceptibility... 97 12.1. Test Specification... 97 12.2. Test Setup... 97 12.3. Limit... 98 12.4. Test Procedure... 98 12.5. Deviation from Test Standard... 98 12.6. Test Result... 99 12.7. Test Photograph... 101 13. Power Frequency Magnetic Field... 103 13.1. Test Specification... 103 13.2. Test Setup... 103 13.3. Limit... 103 13.4. Test Procedure... 103 13.5. Deviation from Test Standard... 103 13.6. Test Result... 104 13.7. Test Photograph... 106 14. Voltage Dips and Interruption... 107 14.1. Test Specification... 107 14.2. Test Setup... 107 14.3. Limit... 107 14.4. Test Procedure... 108 14.5. Deviation from Test Standard... 108 14.6. Test Result... 109 14.7. Test Photograph...111 15. Attachment... 112 EUT Photograph... 112 Page: 6 of 117

1. General Information 1.1. EUT Description Product Name Trade Name Model No. Component Power Adapter (1) Power Adapter (2) MEGA BOOK MSI MS-1034, MS-1034B, MS-10341, MS-10341B, MS-10342, MS-10342B MFT: LITEON M/N: PA-1650-01 Input: AC100-240V, 50-60Hz 1.6A Output: DC 19V-3.42A Cable out: Shielded, 1.8m MFT: LI SHIN M/N: 0335A1965 Input: AC100-240V, 50-60Hz 1.7A Output: DC 19V-3.42A Cable out: Shielded, 1.8m Note: 1. The EUT is including six models for different marketing requirement. Keyparts List Item Vendor Model Name CPU Intel P6 T1600 2.16GHz LCD Samsung LTN154X3-L01-H HDD Fujitsu MHV2040AH ODD PHILIPS CD-RW DVD-ROM SCB5256 RAM Transcend DDR2 512MB 667 HYNIX CHIP Inverter Sumida S78-3300340-S49 Battery Celxpert CBPIL44 Adapter LITEON LI SHIN PA-1650-02 0335A1965 Keyboard CHICONY MP-03083US-3591 Modem QCOM MD560(B)-01 Wireless Intel WM3945ABG Touch Pad ELANTECH 810406-1853 Cemera CHICONY CMN5736 Page: 7 of 117

1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as: Pre-Test Mode Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Final Test Mode Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Emission Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Immunity Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) 1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Product Manufacturer Model No. Serial No. Power Cord 1 Monitor SONY PVM-14M2U 2105742 Non-Shielded, 1.8m 2 USB 2.0 HDD Topdisk ME-910 233715 Power by PC 3 USB 2.0 HDD Topdisk ME-910 220956 Power by PC 4 Slim COMBO ASUS SCB-2408D 42DM355284 Non-Shielded, 1.8m,with one ferrite core bonded. 5 USB Mouse Logitech M-BE58 HCA30103258 N/A 6 Keyboard BTC 5200U N/A N/A 7 Microphone & N/A MIC-06 N/A N/A Earphone 8 Walkman AIWA HS-TA164 N/A N/A 9 Monitor SAMSUNG 1200NF 800083Z Non-Shielded, 1.8m 10 Exchange Network Sun Moon Star PX-4 95170087 Non-Shielded, 1.8m 11 Notebook PC DELL PPT N/A Non-Shielded, 0.8m Page: 8 of 117

1.4. Configuration of Tested System Connection Diagram Signal Cable Type Signal cable Description A S-VIDEO Cable Shielded, 1.6m B USB Cable Shielded, 1.5m C USB Cable Shielded, 1.5m D 1394 Cable Shielded, 1.8m E USB Mouse Cable Shielded, 1.8m F USB Keyboard Cable Shielded, 1.8m G Earphone & Microphone Cable Non-Shielded, 1.6m H Audio Cable Non-Shielded, 1.5m I D-SUB Cable Shielded, 1.8m, with two ferrite cores bonded J TELECOM Cable Non-Shielded, 1.6m K TELECOM Cable Non-Shielded, 1.6m L LAN Cable Non-Shielded, 3.0m Page: 9 of 117

1.5. EUT Exercise Software 1 Setup the EUT and simulators as shown on 1.4. 2 Turn on the power of all equipment. 3 EUT get into Windows XP operating system. 4 Notebook will read data from USB 2.0 HDD and then writes the data into USB 2.0 HDD, same operation for hard disk. 5 Notebook will read data from CD-ROM or DVD and then writes the data into External USB optical device. 6 Notebook sends H character to LCD display and external monitor at the same time, the screen will display and fill with H pattern. 7 Notebook will communicate with the partner PC through the internal Fax/modem module (Lan Module). 8 The transmitted and received status will be shown on the monitor (TV). 9 Repeat the above procedure (4) to (8). Page: 10 of 117

2. Technical Test 2.1. Summary of Test Result No deviations from the test standards Deviations from the test standards as below description: Emission Performed Item Normative References Test Performed Deviation Conducted Emission EN 55022:1998+A1:2000+A2:2003 Yes No Class BAS/NZS CISPR 22: 2004 Conducted Emissions EN 55022:1998+A1:2000+A2:2003 Yes No (Telecommunication Ports) Class B AS/NZS CISPR 22: 2004 Radiated Emission EN 55022:1998+A1:2000+A2:2003 Yes No Class BAS/NZS CISPR 22: 2004 Power Harmonics EN 61000-3-2:2000 Yes No Voltage Fluctuation and Flicker EN 61000-3-3:1995+A1:2001 Yes No Immunity Performed Item Normative References Test Performed Deviation Electrostatic Discharge IEC 61000-4-2 Edition 1.2: 2001-04 Yes No Radiated susceptibility IEC 61000-4-3:2002+A1:2002 Yes No Electrical fast transient/burst IEC 61000-4-4:2004 Yes No Surge IEC 61000-4-5 Edition 1.1: 2001-04 Yes No Conducted susceptibility IEC 61000-4-6 Edition 2.1: 2004-11 Yes No Power frequency magnetic field IEC 61000-4-8 Edition 1.1: 2001-03 Yes No Voltage dips and interruption IEC 61000-4-11 2nd Edition: 2004-03 Yes No Page: 11 of 117

2.2. List of Test Equipment Conducted Emission / SR2 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCS 30 100367 2005/08/08 LISN R&S ESH3-Z5 836679/017 2006/02/16 LISN R&S ESH3-Z5 836679/023 2005/07/12 Pulse Limiter R&S ESH3-Z2 357.8810.52 2005/09/07 Conducted Emissions (Telecommunication Ports) / SR2 Instrument Manufacturer Type No. Serial No Cal. Date Capacitive Voltage Probe Schaffner CVP2200A 18331 2005/11/11 EM-CLAMP Schaffner KEMZ 801 21024 2005/04/21 EMI Test Receiver R&S ESCS 30 100367 2005/08/08 LISN R&S ESH3-Z5 836679/017 2006/02/16 LISN R&S ESH3-Z5 836679/023 2005/07/12 lmpedance Stabilization Network Schaffner ISN T400 19099 2005/07/14 Pulse Limiter R&S ESH3-Z2 357.8810.52 2005/09/07 RF Current Probe FCC F-65 10KHz~1GHz 198 2005/11/11 Radiated Emission / Site3 Instrument Manufacturer Type No. Serial No Cal. Date Bilog Antenna Schaffner Chase CBL6112B 2704 2005/09/15 Broadband Horn Antenna Schwarzbeck BBHA9170 208 2005/07/25 EMI Test Receiver R&S ESI 26 838786/004 2005/05/25 EMI Test Receiver R&S ESCS 30 838251/001 2005/03/22 Horn Antenna Schwarzbeck BBHA9120D 305 2005/08/10 Pre-Amplifier QTK N/A N/A 2006/01/03 Pre-Amplifier MITEQ AMF-4D-18040 0-45-6P 925974 2006/01/03 Spectrum Analyzer Advantest R3162 101102468 2005/10/24 Power Harmonics / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK54148 2005/07/11 IEC1000-4-X Analyzer(Flicker) Schaffner CCN 1000-1 X7 1887 2005/07/11 Voltage Fluctuation and Flicker / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK54148 2005/07/11 IEC1000-4-X Analyzer(Flicker) Schaffner CCN 1000-1 X7 1887 2005/07/11 Electrostatic Discharge / SR3 Instrument Manufacturer Type No. Serial No Cal. Date ESD simulator system Schaffner NSG 438 167 2005/06/07 Horizontal Coupling Plane(HCP) QuieTek HCP AL50 N/A N/A Vertical Coupling QuieTek VCP AL50 N/A N/A Page: 12 of 117

Plane(VCP) Radiated susceptibility / CB5 Instrument Manufacturer Type No. Serial No Cal. Date AF-BOX R&S AF-BOX ACCUST 100007 N/A Audio Analyzer R&S UPL 16 100137 2005/03/31 Bilog Antenna Schaffner Chase CBL6112B 2450 2006/01/03 Broad-Band Antenna Schwarzbeck VULB 9166 1085 2005/08/01 CMU200 UNIV.RADIOCOMM R&S CMU200 104846 2005/03/28 Directional Coupler A&R DC 6180 22735 2005/08/03 Dual Microphone Supply B&K 5935 2426784 2005/08/03 Mouth Simulator B&K 4227 2439692 2005/08/03 Power Amplifier A&R 30S1G3 309453 N/A Power Amplifier A&R 100W10000M7 A285000010 N/A Power Meter R&S NRVD(P.M) 100219 2005/01/17 Pre-Amplifier A&R 150A220 23067 N/A Probe Microphone B&K 4182 2278070 2005/08/03 Signal Generator R&S SMY02(9K-208 0) 825454/028 2005/10/03 Electrical fast transient/burst / SR3 Instrument Manufacturer Type No. Serial No Cal. Date Burst 4.8KV/16A Generator with CDN Schaffner PNW2225 200123-098SC 2005/12/28 Damped osc. Wave 100kHz Schaffner PNW2056 200124-058SC 2005/12/28 and 1MHz Double AC Source Variator Schaffner NSG 642A 30910014938 2005/12/28 Hybrid surge pulse 1.2/50uS Schaffner PNW 2050 20532-514LU 2006/01/03 PQT Generator Schaffner PNW2003 200138-007SC 2006/01/02 Pulse COUPLING NETWORK Schaffner CDN131 200124-007SC 2005/12/28 Surge / SR3 Instrument Manufacturer Type No. Serial No Cal. Date Burst 4.8KV/16A Generator with CDN Schaffner PNW2225 200123-098SC 2005/12/28 Damped osc. Wave 100kHz Schaffner PNW2056 200124-058SC 2005/12/28 and 1MHz Double AC Source Variator Schaffner NSG 642A 30910014938 2005/12/28 Hybrid surge pulse 1.2/50uS Schaffner PNW 2050 20532-514LU 2006/01/03 PQT Generator Schaffner PNW2003 200138-007SC 2006/01/02 Pulse COUPLING NETWORK Schaffner CDN131 200124-007SC 2005/12/28 Conducted susceptibility / SR6 Instrument Manufacturer Type No. Serial No Cal. Date CDN Schaffner CAL U100A 20405 2005/04/21 CDN Schaffner TRA U150 20454 2005/04/21 CDN M016S Schaffner CAL U100A 20410 2005/04/21 CDN M016S Schaffner TRA U150 21167 2005/04/21 CDN T002 Schaffner TRA U150 21169 2005/04/21 CDN T002 Schaffner CAL U100 20491 2005/04/21 CDN T400 Schaffner CAL U100 17735 2005/04/21 Page: 13 of 117

CDN T400 Schaffner TRA U150 21166 2005/04/21 Coupling Decoupling Network Schaffner CDN M016S 20822 2005/02/23 Coupling Decoupling Network Schaffner CDN T002 19018 2005/04/21 Coupling Decoupling Network Schaffner CDN T400 21226 2005/04/21 Coupling Decoupling Network Schaffner CDN M016S 20823 2005/04/21 EM-CLAMP Schaffner KEMZ 801 21024 2005/04/21 N/A N/A N/A N/A N/A Power frequency magnetic field / SR3 Instrument Manufacturer Type No. Serial No Cal. Date Induction Coil Interface Schaffner INA 2141 6002 N/A Magnetic Loop Coil Schaffner INA 702 199749-020IN N/A Magnetic/Electric field measuring system Lackmann Phymetric MV3 N/A N/A Triaxial ELF Magnetic Field Meter F.B.BELL 4090 9852 2005/05/30 Voltage dips and interruption / SR3 Instrument Manufacturer Type No. Serial No Cal. Date Burst 4.8KV/16A Generator with CDN Schaffner PNW2225 200123-098SC 2005/12/28 Damped osc. Wave 100kHz Schaffner PNW2056 200124-058SC 2005/12/28 and 1MHz Double AC Source Variator Schaffner NSG 642A 30910014938 2005/12/28 Hybrid surge pulse 1.2/50uS Schaffner PNW 2050 20532-514LU 2006/01/03 PQT Generator Schaffner PNW2003 200138-007SC 2006/01/02 Pulse COUPLING NETWORK Schaffner CDN131 200124-007SC 2005/12/28 Page: 14 of 117

2.3. Measurement Uncertainty Conducted Emission The measurement uncertainty is evaluated as ± 2.26 db. Conducted Emissions (Telecommunication Ports) The measurement uncertainty is evaluated as ± 2.26 db. Radiated Emission The measurement uncertainty is evaluated as ± 3.19 db. Electrostatic Discharge As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in ESD testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant ESD standards. The immunity test signal from the ESD system meet the required specifications in IEC 61000-4-2 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Radiated susceptibility As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in RS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant RS standards. The immunity test signal from the RS system meet the required specifications in IEC 61000-4-3 through the calibration for the uniform field strength and monitoring for the test level with the uncertainty evaluation report for the electrical filed strength as being 2.72 db. Electrical fast transient/burst As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in RS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant RS standards. The immunity test signal from the RS system meet the required specifications in IEC 61000-4-3 through the calibration for the uniform field strength and monitoring for the test level with the uncertainty evaluation report for the electrical filed strength as being 2.72 db. Surge As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in Surge testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant Surge standards. The immunity test signal from the Surge system meet the required specifications in IEC 61000-4-5 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Conducted susceptibility As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: Page: 15 of 117

1999[2], the requirements for measurement uncertainty in CS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant CS standards. The immunity test signal from the CS system meet the required specifications in IEC 61000-4-6 through the calibration for unmodulated signal and monitoring for the test level with the uncertainty evaluation report for the injected modulated signal level through CDN and EM Clamp/Direct Injection as being 3.72 db and 2.78 db. Power frequency magnetic field As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in PFM testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant PFM standards. The immunity test signal from the PFM system meet the required specifications in IEC 61000-4-8 through the calibration report with the calibrated uncertainty for the Gauss Meter to verify the output level of magnetic field strength as being 2 %. Voltage dips and interruption As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in DIP testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant DIP standards. The immunity test signal from the DIP system meet the required specifications in IEC 61000-4-11 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Page: 16 of 117

2.4. Test Environment Performed Item Items Required Actual Temperature ( C) 15-35 25 Conducted Emission Humidity (%RH) 25-75 50 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 25 Conducted Emissions Humidity (%RH) (Telecommunicati 25-75 50 on Ports) Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 25 Radiated Emission Humidity (%RH) 25-75 50 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 23.6 Electrostatic Discharge Humidity (%RH) 30-60 35 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 21.2 Radiated susceptibility Humidity (%RH) 25-75 50 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 24.3 Electrical fast transient/burst Humidity (%RH) 25-75 50 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 22.1 Surge Humidity (%RH) 10-75 50 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 22.3 Conducted susceptibility Humidity (%RH) 25-75 50 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 21 Page: 17 of 117

Power frequency magnetic field Voltage dips and interruption Humidity (%RH) 25-75 50 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 21.2 Humidity (%RH) 25-75 49 Barometric pressure (mbar) 860-1060 950-1000 Page: 18 of 117

3. Conducted Emission (Main Terminals) 3.1. Test Specification According to EMC Standard : EN 55022 and AS/NZS CISPR 22: 2004 3.2. Test Setup 3.3. Limit Limits Frequency (MHz) QP AV 0.15-0.50 66-56 56 46 0.50-5.0 56 46 5.0-30 60 50 Remarks: In the above table, the tighter limit applies at the band edges. Page: 19 of 117

3.4. Test Procedure The EUT and simulators are connected to the main power through a line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) Both sides of A.C. line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed on conducted measurement. Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using a receiver bandwidth of 9kHz. 3.5. Deviation from Test Standard No deviation. Page: 20 of 117

3.6. Test Result Site : SR-2 Time : 2006/02/14-10:54 Limit : CISPR_B_00M_QP Margin : 10 EUT : MEGA BOOK Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : Mode 1 Page: 21 of 117

Site : SR-2 Time : 2006/02/14-10:56 Limit : CISPR_B_00M_QP Margin : 0 EUT : MEGA BOOK Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 * 0.216 0.536 48.110 48.646-15.469 64.114 QUASIPEAK 2 0.423 0.300 28.500 28.800-29.400 58.200 QUASIPEAK 3 0.783 0.310 30.590 30.900-25.100 56.000 QUASIPEAK 4 1.709 0.332 37.540 37.872-18.128 56.000 QUASIPEAK 5 3.705 0.390 38.240 38.630-17.370 56.000 QUASIPEAK 6 17.236 1.040 32.940 33.980-26.020 60.000 QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 22 of 117

Site : SR-2 Time : 2006/02/14-10:56 Limit : CISPR_B_00M_AV Margin : 0 EUT : MEGA BOOK Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 0.216 0.536 36.500 37.036-17.079 54.114 AVERAGE 2 0.423 0.300 19.550 19.850-28.350 48.200 AVERAGE 3 0.783 0.310 28.150 28.460-17.540 46.000 AVERAGE 4 * 1.709 0.332 34.030 34.362-11.638 46.000 AVERAGE 5 3.705 0.390 27.120 27.510-18.490 46.000 AVERAGE 6 17.236 1.040 26.050 27.090-22.910 50.000 AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 23 of 117

Site : SR-2 Time : 2006/02/14-10:56 Limit : CISPR_B_00M_QP Margin : 10 EUT : MEGA BOOK Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : Mode 1 Page: 24 of 117

Site : SR-2 Time : 2006/02/14-10:58 Limit : CISPR_B_00M_QP Margin : 0 EUT : MEGA BOOK Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 * 0.216 0.300 47.080 47.380-16.734 64.114 QUASIPEAK 2 0.353 0.308 31.790 32.098-28.102 60.200 QUASIPEAK 3 0.709 0.310 28.340 28.650-27.350 56.000 QUASIPEAK 4 1.709 0.340 38.250 38.590-17.410 56.000 QUASIPEAK 5 3.701 0.390 36.640 37.030-18.970 56.000 QUASIPEAK 6 18.873 0.900 32.610 33.510-26.490 60.000 QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 25 of 117

Site : SR-2 Time : 2006/02/14-10:58 Limit : CISPR_B_00M_AV Margin : 0 EUT : MEGA BOOK Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 0.216 0.300 36.010 36.310-17.804 54.114 AVERAGE 2 0.353 0.308 22.390 22.698-27.502 50.200 AVERAGE 3 0.709 0.310 22.050 22.360-23.640 46.000 AVERAGE 4 * 1.709 0.340 35.360 35.700-10.300 46.000 AVERAGE 5 3.701 0.390 22.820 23.210-22.790 46.000 AVERAGE 6 18.873 0.900 26.290 27.190-22.810 50.000 AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 26 of 117

Site : SR-2 Time : 2006/02/15-10:31 Limit : CISPR_B_00M_QP Margin : 10 EUT : MEGA BOOK Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : Mode 2 Page: 27 of 117

Site : SR-2 Time : 2006/02/15-10:32 Limit : CISPR_B_00M_QP Margin : 0 EUT : MEGA BOOK Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 * 0.224 0.479 46.140 46.619-17.266 63.886 QUASIPEAK 2 0.443 0.300 36.740 37.040-20.589 57.629 QUASIPEAK 3 0.814 0.310 36.060 36.370-19.630 56.000 QUASIPEAK 4 1.552 0.330 35.070 35.400-20.600 56.000 QUASIPEAK 5 3.400 0.380 37.690 38.070-17.930 56.000 QUASIPEAK 6 17.670 1.050 31.080 32.130-27.870 60.000 QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 28 of 117

Site : SR-2 Time : 2006/02/15-10:32 Limit : CISPR_B_00M_AV Margin : 0 EUT : MEGA BOOK Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 0.224 0.479 41.080 41.559-12.326 53.886 AVERAGE 2 * 0.443 0.300 35.720 36.020-11.609 47.629 AVERAGE 3 0.814 0.310 33.700 34.010-11.990 46.000 AVERAGE 4 1.552 0.330 29.610 29.940-16.060 46.000 AVERAGE 5 3.400 0.380 32.770 33.150-12.850 46.000 AVERAGE 6 17.670 1.050 25.150 26.200-23.800 50.000 AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 29 of 117

Site : SR-2 Time : 2006/02/15-10:33 Limit : CISPR_B_00M_QP Margin : 10 EUT : MEGA BOOK Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : Mode 2 Page: 30 of 117

Site : SR-2 Time : 2006/02/15-10:34 Limit : CISPR_B_00M_QP Margin : 0 EUT : MEGA BOOK Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 * 0.220 0.300 47.610 47.910-16.090 64.000 QUASIPEAK 2 0.369 0.310 37.650 37.960-21.783 59.743 QUASIPEAK 3 0.740 0.318 36.480 36.798-19.202 56.000 QUASIPEAK 4 1.849 0.340 36.980 37.320-18.680 56.000 QUASIPEAK 5 4.584 0.410 34.610 35.020-20.980 56.000 QUASIPEAK 6 22.521 1.000 32.570 33.570-26.430 60.000 QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 31 of 117

Site : SR-2 Time : 2006/02/15-10:34 Limit : CISPR_B_00M_AV Margin : 0 EUT : MEGA BOOK Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 * 0.220 0.300 42.790 43.090-10.910 54.000 AVERAGE 2 0.369 0.310 35.760 36.070-13.673 49.743 AVERAGE 3 0.740 0.318 34.670 34.988-11.012 46.000 AVERAGE 4 1.849 0.340 32.490 32.830-13.170 46.000 AVERAGE 5 4.584 0.410 26.840 27.250-18.750 46.000 AVERAGE 6 22.521 1.000 24.730 25.730-24.270 50.000 AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 32 of 117

3.7. Test Photograph Test Mode : Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Description : Front View of Conducted Test Test Mode : Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Description : Back View of Conducted Test Page: 33 of 117

Test Mode : Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Description : Front View of Conducted Test Test Mode : Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Description : Back View of Conducted Test Page: 34 of 117

4. Conducted Emissions (Telecommunication Ports) 4.1. Test Specification According to EMC Standard : EN 55022 and AS/NZS CISPR 22: 2004 4.2. Test Setup 4.3. Limit Limits Frequency (MHz) QP AV 0.15-0.50 84 74 74 64 0.50-30 74 64 Remarks: The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz~0.50 MHz. Page: 35 of 117

4.4. Test Procedure Telecommunication Port: The mains voltage shall be supplied to the EUT via the LISN when the measurement of telecommunication port is performed. The common mode disturbances at the telecommunication port shall be connected to the ISN, which is 150 ohm impedance. Both alternative cables are tested related to the LCL requested. The measurement range is from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz. The 60dB LCL ISN is used for cat. 5 cable, 50dB LCL ISN is used for cat. 3 and 80dB LCL is used for alternative one. 4.5. Deviation from Test Standard No deviation. Page: 36 of 117

4.6. Test Result Site : SR-2 Time : 2006/02/14-11:46 Limit : ISN_Voltage_B_10db_00M_QP Margin : 10 EUT : MEGA BOOK Power : AC 230V/50Hz Probe : LISN-L(023) - Line1 Note : Mode 1: ISN 100 Mbps Page: 37 of 117

Site : SR-2 Time : 2006/02/14-11:48 Limit : ISN_Voltage_B_10db_00M_QP Margin : 0 EUT : MEGA BOOK Power : AC 230V/50Hz Probe : LISN-L(023) - Line1 Note : Mode 1: ISN 100 Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 0.205 0.613 57.560 58.173-24.256 82.429 QUASIPEAK 2 * 0.685 0.310 62.080 62.390-11.610 74.000 QUASIPEAK 3 1.740 0.340 58.470 58.810-15.190 74.000 QUASIPEAK 4 4.093 0.400 55.440 55.840-18.160 74.000 QUASIPEAK 5 8.716 0.560 53.960 54.520-29.480 84.000 QUASIPEAK 6 16.228 1.020 60.020 61.040-22.960 84.000 QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 38 of 117

Site : SR-2 Time : 2006/02/14-11:48 Limit : ISN_Voltage_B_10db_00M_AV Margin : 0 EUT : MEGA BOOK Power : AC 230V/50Hz Probe : LISN-L(023) - Line1 Note : Mode 1: ISN 100 Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 0.205 0.613 56.080 56.693-15.736 72.429 AVERAGE 2 0.685 0.310 53.660 53.970-10.030 64.000 AVERAGE 3 1.740 0.340 48.200 48.540-15.460 64.000 AVERAGE 4 * 4.093 0.400 55.150 55.550-8.450 64.000 AVERAGE 5 8.716 0.560 50.990 51.550-22.450 74.000 AVERAGE 6 16.228 1.020 56.700 57.720-16.280 74.000 AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 39 of 117

Site : SR-2 Time : 2006/02/14-11:42 Limit : ISN_Voltage_B_10db_00M_QP Margin : 10 EUT : MEGA BOOK Power : AC 230V/50Hz Probe : LISN-L(023) - Line1 Note : Mode 1: ISN 10 Mbps Page: 40 of 117

Site : SR-2 Time : 2006/02/14-11:44 Limit : ISN_Voltage_B_10db_00M_QP Margin : 0 EUT : MEGA BOOK Power : AC 230V/50Hz Probe : LISN-L(023) - Line1 Note : Mode 1: ISN 10 Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 0.209 0.585 57.240 57.825-24.489 82.314 QUASIPEAK 2 * 0.685 0.310 61.450 61.760-12.240 74.000 QUASIPEAK 3 1.670 0.330 56.750 57.080-16.920 74.000 QUASIPEAK 4 3.525 0.390 38.230 38.620-35.380 74.000 QUASIPEAK 5 9.994 0.600 62.660 63.260-20.740 84.000 QUASIPEAK 6 14.982 1.000 44.470 45.470-38.530 84.000 QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 41 of 117

Site : SR-2 Time : 2006/02/14-11:44 Limit : ISN_Voltage_B_10db_00M_AV Margin : 0 EUT : MEGA BOOK Power : AC 230V/50Hz Probe : LISN-L(023) - Line1 Note : Mode 1: ISN 10 Mbps Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 0.209 0.585 56.800 57.385-14.929 72.314 AVERAGE 2 * 0.685 0.310 51.380 51.690-12.310 64.000 AVERAGE 3 1.670 0.330 43.120 43.450-20.550 64.000 AVERAGE 4 3.525 0.390 32.200 32.590-31.410 64.000 AVERAGE 5 9.994 0.600 45.260 45.860-28.140 74.000 AVERAGE 6 14.982 1.000 21.070 22.070-51.930 74.000 AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 42 of 117

Site : SR-2 Time : 2006/02/14-11:23 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : MEGA BOOK Power : AC 230V/50Hz Probe : LISN-L(023) - Line1 Note : Mode 1: ISN TELCOM Page: 43 of 117

Site : SR-2 Time : 2006/02/14-11:25 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : MEGA BOOK Power : AC 230V/50Hz Probe : LISN-L(023) - Line1 Note : Mode 1: ISN TELCOM Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 0.291 0.300 34.050 34.350-45.621 79.971 QUASIPEAK 2 1.056 0.320 34.710 35.030-38.970 74.000 QUASIPEAK 3 * 2.048 0.340 59.880 60.220-13.780 74.000 QUASIPEAK 4 6.142 0.470 57.890 58.360-15.640 74.000 QUASIPEAK 5 10.240 0.610 47.690 48.300-25.700 74.000 QUASIPEAK 6 24.580 1.190 36.540 37.730-36.270 74.000 QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 44 of 117

Site : SR-2 Time : 2006/02/14-11:25 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : MEGA BOOK Power : AC 230V/50Hz Probe : LISN-L(023) - Line1 Note : Mode 1: ISN TELCOM Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 0.291 0.300 33.450 33.750-36.221 69.971 AVERAGE 2 1.056 0.320 32.470 32.790-31.210 64.000 AVERAGE 3 * 2.048 0.340 59.870 60.210-3.790 64.000 AVERAGE 4 6.142 0.470 57.880 58.350-5.650 64.000 AVERAGE 5 10.240 0.610 47.680 48.290-15.710 64.000 AVERAGE 6 24.580 1.190 34.680 35.870-28.130 64.000 AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 45 of 117

Site : SR-2 Time : 2006/02/15-10:08 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : MEGA BOOK Power : AC 230V/50Hz Probe : LISN-L(023) - Line1 Note : Mode 1: ISN GIGA VOL Page: 46 of 117

Site : SR-2 Time : 2006/02/15-10:08 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : MEGA BOOK Power : AC 230V/50Hz Probe : LISN-L(023) - Line1 Note : Mode 1: ISN GIGA VOL Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 0.205 0.613 38.880 39.493-42.936 82.429 QUASIPEAK 2 0.295 0.300 25.090 25.390-54.467 79.857 QUASIPEAK 3 0.650 0.308 35.150 35.458-38.542 74.000 QUASIPEAK 4 * 0.861 0.310 42.750 43.060-30.940 74.000 QUASIPEAK 5 3.435 0.380 15.450 15.830-58.170 74.000 QUASIPEAK 6 10.541 0.620 22.210 22.830-51.170 74.000 QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 47 of 117

Site : SR-2 Time : 2006/02/15-10:08 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : MEGA BOOK Power : AC 230V/50Hz Probe : LISN-L(023) - Line1 Note : Mode 1: ISN GIGA VOL Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 0.205 0.613 34.470 35.083-47.346 82.429 AVERAGE 2 0.295 0.300 20.970 21.270-58.587 79.857 AVERAGE 3 0.650 0.308 33.120 33.428-40.572 74.000 AVERAGE 4 * 0.861 0.310 42.190 42.500-31.500 74.000 AVERAGE 5 3.435 0.380 8.310 8.690-65.310 74.000 AVERAGE 6 10.541 0.620 17.580 18.200-55.800 74.000 AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 48 of 117

Site : SR-2 Time : 2006/02/15-10:08 Limit : ISN_Current_B_00M_QP Margin : 10 EUT : MEGA BOOK Power : AC 230V/50Hz Probe : LISN-L(023) - Line1 Note : Mode 1: ISN GIGA CUR Page: 49 of 117

Site : SR-2 Time : 2006/02/15-10:12 Limit : ISN_Current_B_00M_QP Margin : 0 EUT : MEGA BOOK Power : AC 230V/50Hz Probe : LISN-L(023) - Line1 Note : Mode 1: ISN GIGA CUR Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 0.177 0.743 3.500 4.243-34.986 39.229 QUASIPEAK 2 0.431 0.300 3.200 3.500-28.471 31.971 QUASIPEAK 3 1.220 0.320 2.200 2.520-27.480 30.000 QUASIPEAK 4 * 3.044 0.370 2.500 2.870-27.130 30.000 QUASIPEAK 5 7.907 0.530 0.800 1.330-28.670 30.000 QUASIPEAK 6 23.360 1.170 1.000 2.170-27.830 30.000 QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 50 of 117

Site : SR-2 Time : 2006/02/15-10:12 Limit : ISN_Current_B_00M_AV Margin : 0 EUT : MEGA BOOK Power : AC 230V/50Hz Probe : LISN-L(023) - Line1 Note : Mode 1: ISN GIGA CUR Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (db) 1 0.177 0.743 1.100 1.843-27.386 29.229 AVERAGE 2 0.431 0.300 1.200 1.500-20.471 21.971 AVERAGE 3 1.220 0.320 0.500 0.820-19.180 20.000 AVERAGE 4 3.044 0.370 1.000 1.370-18.630 20.000 AVERAGE 5 7.907 0.530 0.100 0.630-19.370 20.000 AVERAGE 6 * 23.360 1.170 0.900 2.070-17.930 20.000 AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 51 of 117

4.7. Test Photograph Test Mode : Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Description : Front View of ISN Test Test Mode : Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Description : Back View of ISN Test Page: 52 of 117

Test Mode : Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Description : Front View of ISN Test - GIGA VOL Test Mode : Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Description : Back View of ISN Test - GIGA VOL Page: 53 of 117

Test Mode : Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Description : Front View of ISN Test - GIGA CUR Test Mode : Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Description : Back View of ISN Test - GIGA CUR Page: 54 of 117

5. Radiated Emission 5.1. Test Specification According to EMC Standard : EN 55022 and AS/NZS CISPR 22 5.2. Test Setup 5.3. Limit Frequency (MHz) Limits Distance (m) dbuv/m 30 230 10 30 230 1000 10 37 Remark: 1. The tighter limit shall apply at the edge between two frequency bands. 2. Distance refers to the distance in meters between the measuring instrument antenna and the closed point of any part of the device or system. Page: 55 of 117

5.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 10 meters. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated on radiated measurement. Radiated emissions were invested over the frequency range from 30MHz to1ghz using a receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of 10 meters. 5.5. Deviation from Test Standard No deviation. Page: 56 of 117

5.6. Test Result Site : SITE 3 Time : 2006/02/07-13:47 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook PC Probe : CBL6112B-(2704) - HORIZONTAL Power : AC 230V/50Hz Note : MODE 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv/m) (db) (dbuv/m) 1 150.010 12.499 8.570 21.069-8.931 30.000 QUASIPEAK 2 175.500 11.313 15.080 26.393-3.607 30.000 QUASIPEAK 3 200.027 11.599 12.690 24.289-5.711 30.000 QUASIPEAK 4 254.250 15.665 8.220 23.885-13.115 37.000 QUASIPEAK 5 366.362 18.955 7.040 25.995-11.005 37.000 QUASIPEAK 6 * 480.045 22.073 11.620 33.693-3.307 37.000 QUASIPEAK 7 600.052 24.264 6.840 31.104-5.896 37.000 QUASIPEAK 8 720.065 25.924 5.860 31.784-5.216 37.000 QUASIPEAK 9 840.088 27.402 4.410 31.812-5.188 37.000 QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 57 of 117

Site : SITE 3 Time : 2006/02/07-14:00 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook PC Probe : CBL6112B-(2704) - VERTICAL Power : AC 230V/50Hz Note : MODE 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv/m) (db) (dbuv/m) 1 69.760 6.777 15.150 21.926-8.074 30.000 QUASIPEAK 2 150.000 12.500 11.470 23.970-6.030 30.000 QUASIPEAK 3 * 206.000 11.664 14.520 26.184-3.816 30.000 QUASIPEAK 4 357.953 18.789 5.960 24.749-12.251 37.000 QUASIPEAK 5 600.057 24.264 8.610 32.874-4.126 37.000 QUASIPEAK 6 720.065 25.924 6.290 32.214-4.786 37.000 QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 58 of 117

Site : SITE 3 Time : 2006/02/07-14:14 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook PC Probe : CBL6112B-(2704) - HORIZONTAL Power : AC 230V/50Hz Note : MODE 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv/m) (db) (dbuv/m) 1 150.000 12.500 8.550 21.050-8.950 30.000 QUASIPEAK 2 175.550 11.310 13.510 24.819-5.181 30.000 QUASIPEAK 3 219.600 11.549 9.630 21.179-8.821 30.000 QUASIPEAK 4 306.600 16.980 6.660 23.640-13.360 37.000 QUASIPEAK 5 480.025 22.072 11.150 33.223-3.777 37.000 QUASIPEAK 6 600.052 24.264 7.090 31.354-5.646 37.000 QUASIPEAK 7 * 720.037 25.924 7.580 33.504-3.496 37.000 QUASIPEAK 8 840.088 27.402 2.610 30.012-6.988 37.000 QUASIPEAK 9 998.600 28.896 3.500 32.396-4.604 37.000 QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 59 of 117

Site : SITE 3 Time : 2006/02/07-14:27 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook PC Probe : CBL6112B-(2704) - VERTICAL Power : AC 230V/50Hz Note : MODE 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (db) (dbuv/m) (db) (dbuv/m) 1 150.000 12.500 8.100 20.600-9.400 30.000 QUASIPEAK 2 175.550 11.310 10.560 21.869-8.131 30.000 QUASIPEAK 3 204.600 11.676 12.200 23.876-6.124 30.000 QUASIPEAK 4 333.800 17.851 8.300 26.150-10.850 37.000 QUASIPEAK 5 480.020 22.072 6.590 28.662-8.338 37.000 QUASIPEAK 6 * 600.055 24.264 8.060 32.324-4.676 37.000 QUASIPEAK 7 720.062 25.924 4.250 30.174-6.826 37.000 QUASIPEAK 8 840.075 27.402 1.230 28.632-8.368 37.000 QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 60 of 117

5.7. Test Photograph Test Mode : Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Description : Front View of Radiated Test Test Mode : Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Description : Back View of Radiated Test Page: 61 of 117

Test Mode : Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Description : Front View of Radiated Test Test Mode : Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Description : Back View of Radiated Test Page: 62 of 117

6. Harmonic Current Emission 6.1. Test Specification According to EMC Standard : EN 61000-3-2 6.2. Test Setup 6.3. Limit (a) Limits of Class A Harmonics Currents Harmonics Order n Maximum Permissible harmonic current A Harmonics Order n Maximum Permissible harmonic current A Odd harmonics Even harmonics 3 2.30 2 1.08 5 1.14 4 0.43 7 0.77 6 0.30 9 0.40 8 n 40 0.23 * 8/n 11 0.33 13 0.21 15 n 39 0.15 * 15/n Page: 63 of 117

(b) Limits of Class B Harmonics Currents For Class B equipment, the harmonic of the input current shall not exceed the maximum permissible values given in table that is the limit of Class A multiplied by a factor of 1.5. (c) Limits of Class C Harmonics Currents Harmonics Order Maximum Permissible harmonic current Expressed as a percentage of the input current at the fundamental frequency n % 2 2 3 30.λ * 5 10 7 7 9 5 11 n 39 3 (odd harmonics only) *λ is the circuit power factor (d) Limits of Class D Harmonics Currents Harmonics Order n Maximum Permissible harmonic current per watt ma/w Maximum Permissible harmonic current A 3 3.4 2.30 5 1.9 1.14 7 1.0 0.77 9 0.5 0.40 11 0.35 0.33 11 n 39 (odd harmonics only) 3.85/n See limit of Class A Page: 64 of 117

6.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed. 6.5. Deviation from Test Standard No deviation. Page: 65 of 117

6.6. Test Result Product MEGA BOOK Test Item Test Mode Power Harmonics Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Date of Test 2006/02/17 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms 6 300 Current (Amps) 4 2 0-2 -4 200 100 0-100 -200 Voltage (Volts) -6-300 Harmonics and Class D limit line European Limits Current RMS(Amps) 0.30 0.25 0.20 0.15 0.10 0.05 0.00 4 8 12 16 20 24 28 32 36 40 Harmonic # Test result: Pass Worst harmonic was #0 with 0.00% of the limit. Page: 66 of 117

Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(pk%): 0.00 POHC(A): 0.000 POHC Limit(A): 0.000 Highest parameter values during test: V_RMS (Volts): 229.75 Frequency(Hz): 50.00 I_Peak (Amps): 3.338 I_RMS (Amps): 0.657 I_Fund (Amps): 0.259 Crest Factor: 5.413 Power (Watts): 59 Power Factor: 0.391 Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.003 3 0.231 0.200 0.0 0.238 0.295 0.00 Pass 4 0.004 5 0.224 0.112 0.0 0.230 0.165 0.00 Pass 6 0.004 7 0.213 0.059 0.0 0.219 0.087 0.00 Pass 8 0.005 9 0.199 0.029 0.0 0.205 0.043 0.00 Pass 10 0.005 11 0.183 0.021 0.0 0.188 0.030 0.00 Pass 12 0.005 13 0.165 0.018 0.0 0.169 0.026 0.00 Pass 14 0.005 15 0.145 0.015 0.0 0.149 0.022 0.00 Pass 16 0.005 17 0.125 0.014 0.0 0.128 0.020 0.00 Pass 18 0.005 19 0.106 0.012 0.0 0.108 0.018 0.00 Pass 20 0.005 21 0.087 0.011 0.0 0.089 0.016 0.00 Pass 22 0.005 23 0.069 0.010 0.0 0.070 0.015 0.00 Pass 24 0.004 25 0.053 0.009 0.0 0.054 0.014 0.00 Pass 26 0.003 27 0.039 0.008 0.0 0.040 0.013 0.00 Pass 28 0.003 29 0.027 0.008 0.0 0.028 0.012 0.00 Pass 30 0.002 31 0.018 0.007 0.0 0.019 0.011 0.00 Pass 32 0.002 33 0.012 0.007 0.0 0.013 0.010 0.00 Pass 34 0.001 35 0.010 0.006 0.0 0.011 0.010 0.00 Pass 36 0.001 37 0.010 0.006 0.0 0.011 0.009 0.00 Pass 38 0.001 39 0.010 0.006 0.0 0.011 0.009 0.00 Pass 40 0.001 1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 67 of 117

Product MEGA BOOK Test Item Power Harmonics Test Mode Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Date of Test 2006/02/17 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms 6 300 Current (Amps) 4 2 0-2 -4 200 100 0-100 -200 Voltage (Volts) -6-300 Harmonics and Class D limit line European Limits Current RMS(Amps) 0.35 0.30 0.25 0.20 0.15 0.10 0.05 0.00 4 8 12 16 20 24 28 32 36 40 Harmonic # Test result: Pass Worst harmonic was #0 with 0.00% of the limit. Page: 68 of 117

Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(pk%): 0.00 POHC(A): 0.000 POHC Limit(A): 0.000 Highest parameter values during test: V_RMS (Volts): 229.80 Frequency(Hz): 50.00 I_Peak (Amps): 3.371 I_RMS (Amps): 0.724 I_Fund (Amps): 0.300 Crest Factor: 4.667 Power (Watts): 68 Power Factor: 0.412 Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.003 3 0.287 0.233 0.0 0.289 0.348 0.00 Pass 4 0.003 5 0.275 0.130 0.0 0.277 0.194 0.00 Pass 6 0.003 7 0.258 0.068 0.0 0.260 0.102 0.00 Pass 8 0.003 9 0.237 0.034 0.0 0.239 0.051 0.00 Pass 10 0.003 11 0.212 0.024 0.0 0.214 0.036 0.00 Pass 12 0.004 13 0.185 0.021 0.0 0.187 0.030 0.00 Pass 14 0.004 15 0.157 0.018 0.0 0.159 0.026 0.00 Pass 16 0.003 17 0.130 0.016 0.0 0.131 0.023 0.00 Pass 18 0.003 19 0.103 0.014 0.0 0.105 0.021 0.00 Pass 20 0.003 21 0.079 0.013 0.0 0.080 0.019 0.00 Pass 22 0.002 23 0.058 0.011 0.0 0.059 0.017 0.00 Pass 24 0.002 25 0.040 0.011 0.0 0.041 0.016 0.00 Pass 26 0.002 27 0.027 0.010 0.0 0.027 0.015 0.00 Pass 28 0.001 29 0.019 0.009 0.0 0.019 0.014 0.00 Pass 30 0.001 31 0.016 0.008 0.0 0.016 0.013 0.00 Pass 32 0.001 33 0.016 0.008 0.0 0.016 0.012 0.00 Pass 34 0.001 35 0.016 0.008 0.0 0.016 0.011 0.00 Pass 36 0.001 37 0.015 0.007 0.0 0.015 0.011 0.00 Pass 38 0.001 39 0.013 0.007 0.0 0.013 0.010 0.00 Pass 40 0.001 1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 69 of 117

6.7. Test Photograph Test Mode : Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Description : Power Harmonics Test Setup Test Mode : Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Description : Power Harmonics Test Setup Page: 70 of 117

7. Voltage Fluctuation and Flicker 7.1. Test Specification According to EMC Standard : EN 61000-3-3 7.2. Test Setup 7.3. Limit The following limits apply: - the value of P st shall not be greater than 1.0; - the value of P lt shall not be greater than 0.65; - the value of d(t) during a voltage change shall not exceed 3.3 % for more than 500 ms; - the relative steady-state voltage change, d c, shall not exceed 3.3 %; - the maximum relative voltage change, d max, shall not exceed; a) 4 % without additional conditions; b) 6 % for equipment which is: - switched manually, or - switched automatically more frequently than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds), or manual restart, after a power supply interruption. NOTE The cycling frequency will be further limited by the P st and P 1t limit. For example: a d max of 6%producing a rectangular voltage change characteristic twice per hour will give a P 1t of about 0.65. Page: 71 of 117

c) 7 % for equipment which is: - attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment such as mixers, garden equipment such as lawn mowers, portable tools such as electric drills), or - switched on automatically, or is intended to be switched on manually, no more than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds) or manual restart, after a power supply interruption. P st and P 1t requirements shall not be applied to voltage changes caused by manual switching. 7.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed. 7.5. Deviation from Test Standard No deviation. Page: 72 of 117

7.6. Test Result Product MEGA BOOK Test Item Test Mode Voltage Fluctuation and Flicker Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Date of Test 2006/02/17 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits 1.00 0.75 Pst 0.50 0.25 0.00 15:42:18 Time is too short for Plt plot Parameter values recorded during the test: Vrms at the end of test (Volt): 229.66 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.001 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.001 Test limit: 0.650 Pass Page: 73 of 117

Product MEGA BOOK Test Item Voltage Fluctuation and Flicker Test Mode Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Date of Test 2006/02/17 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits 1.00 0.75 Pst 0.50 0.25 0.00 12:04:13 Time is too short for Plt plot Parameter values recorded during the test: Vrms at the end of test (Volt): 229.61 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.001 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.001 Test limit: 0.650 Pass Page: 74 of 117

7.7. Test Photograph Test Mode : Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Description : Flicker Test Setup Test Mode : Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Description : Flicker Test Setup Page: 75 of 117

8. Electrostatic Discharge 8.1. Test Specification According to Standard : IEC 61000-4-2 8.2. Test Setup 8.3. Limit Item Environmental Phenomena Units Test Specification Performance Criteria Enclosure Port Electrostatic Discharge kv(charge Voltage) ±8 Air Discharge ±4 Contact Discharge B Page: 76 of 117

8.4. Test Procedure Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT. Indirect application of discharges to the EUT: Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. 8.5. Deviation from Test Standard No deviation. Page: 77 of 117

8.6. Test Result Product MEGA BOOK Test Item Test Mode Electrostatic Discharge Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Date of Test 2006/02/17 Test Site No.3 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge 10 10 +8kV -8kV B B A A Pass Pass Contact Discharge 25 25 +4kV -4kV B B A A Pass Pass Indirect Discharge 50 +4kV B A Pass (HCP) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Front) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Left) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Back) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Right) 50-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 78 of 117

Product MEGA BOOK Test Item Electrostatic Discharge Test Mode Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Date of Test 2006/02/17 Test Site No.3 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,B,C) Results Air Discharge 10 10 +8kV -8kV B B A A Pass Pass Contact Discharge 25 25 +4kV -4kV B B A A Pass Pass Indirect Discharge 50 +4kV B A Pass (HCP) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Front) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Left) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Back) 50-4kV B A Pass Indirect Discharge 50 +4kV B A Pass (VCP Right) 50-4kV B A Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 79 of 117

8.7. Test Photograph Test Mode : Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Description : ESD Test Setup Test Mode : Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Description : ESD Test Setup Page: 80 of 117

9. Radiated Susceptibility 9.1. Test Specification According to Standard : IEC 61000-4-3 9.2. Test Setup 9.3. Limit Item Environmental Units Test Performance Phenomena Specification Criteria Enclosure Port Radio-Frequency MHz 80-1000 Electromagnetic Field Amplitude Modulated V/m(Un-modulated, rms) % AM (1kHz) 3 80 A Page: 81 of 117

9.4. Test Procedure The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. Both horizontal and vertical polarization of the antenna and four sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD camera is used to monitor EUT screen. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 3 V/m Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 80MHz - 1000MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s 9.5. Deviation from Test Standard No deviation. Page: 82 of 117

9.6. Test Result Product MEGA BOOK Test Item Test Mode Radiated susceptibility Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Date of Test 2006/02/17 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results 80-1000 FRONT H 3 A A PASS 80-1000 FRONT V 3 A A PASS 80-1000 BACK H 3 A A PASS 80-1000 BACK V 3 A A PASS 80-1000 RIGHT H 3 A A PASS 80-1000 RIGHT V 3 A A PASS 80-1000 LEFT H 3 A A PASS 80-1000 LEFT V 3 A A PASS 80-1000 UP H 3 A A PASS 80-1000 UP V 3 A A PASS 80-1000 DOWN H 3 A A PASS 80-1000 DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 83 of 117

Product MEGA BOOK Test Item Radiated susceptibility Test Mode Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Date of Test 2006/02/17 Test Site Chamber5 Field Complied Frequency Position Polarity Required Strength To Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results 80-1000 FRONT H 3 A A PASS 80-1000 FRONT V 3 A A PASS 80-1000 BACK H 3 A A PASS 80-1000 BACK V 3 A A PASS 80-1000 RIGHT H 3 A A PASS 80-1000 RIGHT V 3 A A PASS 80-1000 LEFT H 3 A A PASS 80-1000 LEFT V 3 A A PASS 80-1000 UP H 3 A A PASS 80-1000 UP V 3 A A PASS 80-1000 DOWN H 3 A A PASS 80-1000 DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 84 of 117

9.7. Test Photograph Test Mode : Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Description : Radiated Susceptibility Test Setup Test Mode : Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Description : Radiated Susceptibility Test Setup Page: 85 of 117

10. Electrical Fast Transient/Burst 10.1. Test Specification According to Standard : IEC 61000-4-4 10.2. Test Setup 10.3. Limit Item Environmental Phenomena I/O and communication ports Fast Transients Common Mode Input DC Power Ports Fast Transients Common Mode Input AC Power Ports Fast Transients Common Mode Units kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz Test Specification Performance Criteria +0.5 5/50 5 +0.5 5/50 5 +1 5/50 5 B B B Page: 86 of 117

10.4. Test Procedure The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on the table, and uses a 0.1m insulation between the EUT and ground reference plane. The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and projected beyond the EUT by at least 0.1m on all sides. Test on I/O and communication ports: The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1minute. Test on power supply ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT/B interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 minute. The length of the signal and power lines between the coupling device and the EUT is 0.5m. 10.5. Deviation from Test Standard No deviation. Page: 87 of 117

10.6. Test Result Product MEGA BOOK Test Item Test Mode Electrical fast transient/burst Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Date of Test 2006/02/17 Test Site No.3 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L+N+PE ± 1kV 60 CDN B A PASS LAN ± 0.5 kv 90 Clamp B A PASS Telecom ± 0.5 kv 90 Clamp B B PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 88 of 117

Product MEGA BOOK Test Item Electrical fast transient/burst Test Mode Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Date of Test 2006/02/17 Test Site No.3 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L+N+PE ± 1kV 60 CDN B A PASS LAN ± 0.5 kv 90 Clamp B A PASS Telecom ± 0.5 kv 90 Clamp B B PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 89 of 117

10.7. Test Photograph Test Mode : Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Description : EFT/B Test Setup Test Mode : Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Description : EFT/B Test Setup-Clamp Page: 90 of 117

Test Mode : Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Description : EFT/B Test Setup Test Mode : Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Description : EFT/B Test Setup-Clamp Page: 91 of 117

11. Surge 11.1. Test Specification According to Standard : IEC 61000-4-5 11.2. Test Setup 11.3. Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports(See 1) and 2) ) Surges Tr/Th us Line to Ground kv Input DC Power Ports Surges Tr/Th us Line to Ground kv AC Input and AC Output Power Ports Surges Tr/Th us Line to Line kv Line to Ground kv Notes: Test Specification Performance Criteria 1.2/50 (8/20) ± 1 1.2/50 (8/20) ± 0.5 1.2/50 (8/20) ± 1 ± 2 1) Applicable only to ports which according to the manufacturer s may directly to outdoor cables. 2) Where normal functioning cannot be achieved because of the impact of the CDN on the EUT, no immunity test shall be required. B B B Page: 92 of 117

11.4. Test Procedure The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Input and Output AC Power or DC Input and DC Output Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 0 0, 90 0, 180 0, 270 0 and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min. 11.5. Deviation from Test Standard No deviation. Page: 93 of 117

11.6. Test Result Product MEGA BOOK Test Item Test Mode Surge Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Date of Test 2006/02/16 Test Site No.3 Shielded Room Voltage Time Complie Inject Inject Required Polarity Angle Interval d to Line Method Criteria kv (Second) Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 94 of 117

Product MEGA BOOK Test Item Surge Test Mode Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Date of Test 2006/02/16 Test Site No.3 Shielded Room Voltage Time Complie Inject Inject Required Polarity Angle Interval d to Line Method Criteria kv (Second) Criteria Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS L-PE ± 0 2kV 60 Direct B A PASS L-PE ± 90 2kV 60 Direct B A PASS L-PE ± 180 2kV 60 Direct B A PASS L-PE ± 270 2kV 60 Direct B A PASS N-PE ± 0 2kV 60 Direct B A PASS N-PE ± 90 2kV 60 Direct B A PASS N-PE ± 180 2kV 60 Direct B A PASS N-PE ± 270 2kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 95 of 117

11.7. Test Photograph Test Mode : Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Description : SURGE Test Setup Test Mode : Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Description : SURGE Test Setup Page: 96 of 117

12. Conducted Susceptibility 12.1. Test Specification According to Standard : IEC 61000-4-6 12.2. Test Setup CDN Test Mode EM Clamp Test Mode Page: 97 of 117

12.3. Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports Radio-Frequency Continuous Conducted Input DC Power Ports Radio-Frequency Continuous Conducted Input AC Power Ports Radio-Frequency Continuous Conducted 12.4. Test Procedure MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) Test Specification 0.15-80 3 80 0.15-80 3 80 0.15-80 3 80 Performance Criteria A A A The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 130dBuV(3V) Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 0.15MHz 80MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s 12.5. Deviation from Test Standard No deviation. Page: 98 of 117

12.6. Test Result Product MEGA BOOK Test Item Test Mode Conducted susceptibility Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Date of Test 2006/02/17 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performanc Result Range Applied Method of Criteria e Criteria (MHz) dbuv(v) EUT Complied To 0.15~80 130 (3V) CDN AC IN A A PASS 0.15~80 130 (3V) Clamp LAN A A PASS 0.15~80 130 (3V) Clamp Telecom A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 99 of 117

Product MEGA BOOK Test Item Conducted susceptibility Test Mode Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Date of Test 2006/02/17 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performanc Result Range Applied Method of Criteria e Criteria (MHz) dbuv(v) EUT Complied To 0.15~80 130 (3V) CDN AC IN A A PASS 0.15~80 130 (3V) Clamp LAN A A PASS 0.15~80 130 (3V) Clamp Telecom A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 100 of 117

12.7. Test Photograph Test Mode : Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Description : Conducted Susceptibility Test Setup Test Mode : Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Description : Conducted Susceptibility Test Setup-Clamp Page: 101 of 117

Test Mode : Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Description : Conducted Susceptibility Test Setup Test Mode : Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Description : Conducted Susceptibility Test Setup-Clamp Page: 102 of 117

13. Power Frequency Magnetic Field 13.1. Test Specification According to Standard : IEC 61000-4-8 13.2. Test Setup 13.3. Limit Item Environmental Phenomena Enclosure Port Power-Frequency Magnetic Field 13.4. Test Procedure Units Hz A/m (r.m.s.) Test Specification Performance Criteria 50 1 A The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured at least 1m*1m min. The test magnetic field shall be placed at central of the induction coil. The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT. And the induction coil shall be rotated by 90 in order to expose the EUT to the test field with different orientation (X, Y, Z Orientations). 13.5. Deviation from Test Standard No deviation. Page: 103 of 117

13.6. Test Result Product MEGA BOOK Test Item Test Mode Power frequency magnetic field Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Date of Test 2006/02/16 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 104 of 117

Product MEGA BOOK Test Item Power frequency magnetic field Test Mode Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Date of Test 2006/02/16 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 105 of 117

13.7. Test Photograph Test Mode : Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Description : Power Frequency Magnetic Field Test Setup Test Mode : Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Description : Power Frequency Magnetic Field Test Setup Page: 106 of 117

14. Voltage Dips and Interruption 14.1. Test Specification According to Standard : IEC 61000-4-11 14.2. Test Setup 14.3. Limit Item Environmental Phenomena Input AC Power Ports Voltage Dips Voltage Interruptions Units % Reduction Period % Reduction Period % Reduction Period Test Specification Performance Criteria 30 C 25 >95 B 0.5 > 95 C 250 Page: 107 of 117

14.4. Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The power cord shall be used the shortest power cord as specified by the manufacturer. For Voltage Dips/ Interruptions test: The selection of test voltage is based on the rated power range. If the operation range is large than 20% of lower power range, both end of specified voltage shall be tested. Otherwise, the typical voltage specification is selected as test voltage. The EUT is connected to the power mains through a coupling device that directly couples to the Voltage Dips and Interruption Generator. The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25 Periods, for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of three voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied voltage and duration 250 Periods with a sequence of three voltage interruptions with intervals of 10 seconds. Voltage phase shifting are shall occur at 0 0, 45 0, 90 0,135 0,180 0,225 0, 270 0,315 0 of the voltage. 14.5. Deviation from Test Standard No deviation. Page: 108 of 117

14.6. Test Result Product MEGA BOOK Test Item Test Mode Voltage dips and interruption Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Date of Test 2006/02/16 Test Site No.3 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Test Result Criteria Complied To 30(161V) 0 25 C A PASS 30(161V) 45 25 C A PASS 30(161V) 90 25 C A PASS 30(161V) 135 25 C A PASS 30(161V) 180 25 C A PASS 30(161V) 225 25 C A PASS 30(161V) 270 25 C A PASS 30(161V) 315 25 C A PASS >95(0V) 0 0.5 B A PASS >95(0V) 45 0.5 B A PASS >95(0V) 90 0.5 B A PASS >95(0V) 135 0.5 B A PASS >95(0V) 180 0.5 B A PASS >95(0V) 225 0.5 B A PASS >95(0V) 270 0.5 B A PASS >95(0V) 315 0.5 B A PASS >95(0V) 0 250 C A PASS >95(0V) 45 250 C A PASS >95(0V) 90 250 C A PASS >95(0V) 135 250 C A PASS >95(0V) 180 250 C A PASS >95(0V) 225 250 C A PASS >95(0V) 270 250 C A PASS >95(0V) 315 250 C A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 109 of 117 kv

Product MEGA BOOK Test Item Voltage dips and interruption Test Mode Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Date of Test 2006/02/16 Test Site No.3 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Test Result Criteria Complied To 30(161V) 0 25 C A PASS 30(161V) 45 25 C A PASS 30(161V) 90 25 C A PASS 30(161V) 135 25 C A PASS 30(161V) 180 25 C A PASS 30(161V) 225 25 C A PASS 30(161V) 270 25 C A PASS 30(161V) 315 25 C A PASS >95(0V) 0 0.5 B A PASS >95(0V) 45 0.5 B A PASS >95(0V) 90 0.5 B A PASS >95(0V) 135 0.5 B A PASS >95(0V) 180 0.5 B A PASS >95(0V) 225 0.5 B A PASS >95(0V) 270 0.5 B A PASS >95(0V) 315 0.5 B A PASS >95(0V) 0 250 C A PASS >95(0V) 45 250 C A PASS >95(0V) 90 250 C A PASS >95(0V) 135 250 C A PASS >95(0V) 180 250 C A PASS >95(0V) 225 250 C A PASS >95(0V) 270 250 C A PASS >95(0V) 315 250 C A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. kv Page: 110 of 117

14.7. Test Photograph Test Mode : Mode 1:Intel T1600 2.16Ghz,LCD+CRT 1280*1024/60Hz,Adapter(LITEON/PA-1650-02) Description : Voltage Dips Test Setup Test Mode : Mode 2:Intel T1600 2.16Ghz,LCD+TV 1024*768/60Hz,Adapter(LI SHIN/0335A1965) Description : Voltage Dips Test Setup Page: 111 of 117

15. Attachment EUT Photograph (1) EUT Photo (2) EUT Photo Page: 112 of 117

(3) EUT Photo (4) EUT Photo Page: 113 of 117

(5) EUT Photo (6) EUT Photo Page: 114 of 117

(7) EUT Photo (8) EUT Photo Page: 115 of 117

(9) EUT Photo (10) EUT Photo Page: 116 of 117

(11) EUT Photo (12) EUT Photo Page: 117 of 117

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