Silicon Storage Technology SST39VF800A 8 Mbit Multi-Purpose Flash Memory Structural Analysis

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February 23, 2005 Silicon Storage Technology SST39VF800A 8 Mbit Multi-Purpose Flash Memory Structural Analysis For questions, comments, or more information about this report, or for any additional technical needs concerning semiconductor technology, please call Sales at Chipworks.

8 Mbit Multi-Purpose Flash Memory Structural Analysis Table of Contents 1 Overview 1.1 List of Figures 1.2 List of Tables 1.3 Introduction 1.4 Device Summary 1.4 Process Summary 2 Device Overview 2.1 Package and Die 2.2 Die Features 3 Process Analysis 3.1 General Device Structure 3.2 Bond Pads 3.3 Dielectrics 3.4 Metallization 3.5 Vias and Contacts 3.6 Peripheral Transistors and Poly 3.7 Flash Cell Transistors 3.8 High Voltage Transistors 3.9 Isolation 3.10 Wells and Substrate 4 Flash Cell Analysis 4.1 Flash Cell in Plan-View 4.2 Cross-Sectional Analysis (Perpendicular to Word Line) 4.3 Cross-Sectional Analysis (Parallel to Word Line) 5 Materials Analysis 5.1 SIMS Analysis of Dielectrics 5.2 TEM-EDS Analysis of Dielectrics 5.3 TEM-EDS Analysis of Metal 1 5.4 TEM-EDS Polycide and Contacts

8 Mbit Multi-Purpose Flash Memory Structural Analysis 6 Critical Dimensions 6.1 Horizontal Dimensions 6.2 Vertical Dimensions 7 Report Evaluation

8 Mbit Multi-Purpose Flash Memory Overview 1 Overview 1.1 List of Figures 2.1.1 Top and Bottom Package Photographs 2.1.2 Plan-View Package X-Ray 2.1.3 Die Photograph 2.1.4 Die Markings 2.1.5 Annotated Die Photograph 2.2.1 Die Corner 1 2.2.2 Die Corner 2 2.2.3 Die Corner 3 2.2.4 Die Corner 4 2.2.5 Minimum Pitch Bond Pads 2.2.6 I/O Bond Pads 2.2.7 Dummy Metal Patterns 3.1.1 General View of SST39WF800A 3.1.2 Die Edge 3.1.3 Die Seal 3.2.1 Bond Pad 3.2.2 Right End Bond Pad 3.3.1 Passivation 3.3.2 Passivation Over Closely Spaced Metal 2 Lines 3.3.3 IMD 3.3.4 PMD 3.4.1 Minimum Pitch Metal 2 3.4.2 Minimum Pitch Metal 1 3.4.3 TEM Metal TiN Cap Layer 3.4.4 TEM Metal 1 TiN Barrier and Ti Adhesion Layers 3.5.1 Minimum Pitch Via 1 s 3.5.2 Minimum Pitch Contacts to Diffusion 3.5.3 TEM Contact Top 3.5.4 TEM Contact Bottom 3.5.5 Contact to Polycide 3.6.1 Minimum Gate Length NMOS Transistor 3.6.2 Minimum Gate Length PMOS Transistor 3.6.3 Peripheral Transistor Glass Etch 3.6.4 Minimum Pitch Poly 2 3.7.1 Flash Cell 1-1

8 Mbit Multi-Purpose Flash Memory Overview 3.7.2 TEM Flash Cell 3.7.3 TEM Floating and Select Gates 3.7.4 TEM Tunnel Oxide 3.7.5 TEM Select Gate Oxide 3.7.6 TEM Floating Gate Oxide 3.8.1 High Voltage Transistor 3.8.2 High Voltage Transistor Glass Etch 3.9.1 Minimum Width STI 3.9.2 Poly 2 on STI 3.9.3 Line of Polycide Over STI 3.10.1 Peripheral N-well 3.10.2 SRP of Peripheral N-well 3.10.3 SRP of Peripheral P-well 3.10.4 SRP of Array P-well 4.0.1 Split-Gate Flash Cell Schematic 4.1.1 Metal 2 Word Line Straps 4.1.2 Metal 1 Bit Lines 4.1.3 Flash Cell at Poly 4.1.4 Select and Floating Gates 4.1.5 Flash Array at Diffusion 4.2.1 Flash Array in Cross-Section 4.2.2 Flash Cell 4.2.3 Flash Cell Delineated with Glass Etch 4.3.1 Poly 2 Word Line and Floating Gate 4.3.2 Floating Gate 4.3.3 Select Gate 4.3.4 Bit Line Contacts 5.1.1 SEM Cross-Section Showing SIMs Analysis of IMD and PMD Layers 5.1.2 Sims Plot of IMD and PMD Layers 5.2.1 TEM-EDS Spectra of Nitride and Oxide Passivation 5.2.2 TEM-EDS Spectra of IMD Oxide and SOG Layers 5.2.3 TEM-EDS Spectra of PMD Oxide, BPGS and Nitride Layers 5.3.1 TEM-EDS Metal 1 TiN Barrier and Cap plus Ti Adhesion Layer 5.4.1 TEM-EDS Cobalt Silicided Gate Polysilicon 5.4.2 TEM-EDS Cobalt Silicided S/D Contact Diffusion 1-2

8 Mbit Multi-Purpose Flash Memory Overview 1.2 List of Tables 3.3.1 Dielectric Thickness 3.4.1 Metallization Vertical Dimensions 3.4.2 Metallization Horizontal Dimensions 3.5.1 Via and Contact Dimensions 3.6.1 Transistor and Polycide Dimensions 3.7.1 Split-Gate Transistor Dimensions 4.2.1 Flash Cell Dimensions 1-3

About Chipworks Chipworks is the recognized leader in reverse engineering and patent infringement analysis of semiconductors and electronic systems. The company s ability to analyze the circuitry and physical composition of these systems makes them a key partner in the success of the world s largest semiconductor and microelectronics companies. Intellectual property groups and their legal counsel trust Chipworks for success in patent licensing and litigation earning hundreds of millions of dollars in patent licenses, and saving as much in royalty payments. Research & Development and Product Management rely on Chipworks for success in new product design and launch, saving hundreds of millions of dollars in design, and earning even more through superior product design and faster launches. Contact Chipworks To find out more information on this report, or any other reports in our library, please contact Chipworks at: Chipworks 3685 Richmond Rd. Suite 500 Ottawa, Ontario K2H 5B7 Canada T: 1.613.829.0414 F: 1.613.829.0515 Web site: www.chipworks.com Email: info@chipworks.com Please send any feedback to feedback@chipworks.com