Topics. Memory Reliability and Yield Control Logic. John A. Chandy Dept. of Electrical and Computer Engineering University of Connecticut

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Transcription:

Topics Memory Reliability and Yield Control Logic

Reliability and Yield

Noise Sources in T DRam BL substrate Adjacent BL C WBL α-particles WL leakage C S electrode C cross

Transposed-Bitline Architecture BL9 C cross BL BL SA BL99 (a) Straightforward bit-line routing BL9 C cross BL BL SA BL99 (b) Transposed bit-line architecture

Alpha-particles (or Neutrons) α-particle WL V DD BL n + + + - - - + - + - + - + SiO 2 Particle ~ Million Carriers

Redundancy Redundant columns Redundant rows Memory Array Row Address Row Decoder Fuse : Bank Column Decoder Column Address

Error-Correcting Codes Example: Hamming Codes e.g. B3 Wrong with = 3

Redundancy and Error Correction 6Mbit DRAMs [Kalter9]

Data Retention in SRAM.3u I leakage.u 9n 7n 5n Factor 7.3 mm CMOS (A) 3n n.8 m CMOS m..6.2.8 V DD SRAM leakage increases with technology scaling

Suppressing Leakage in SRAM sleep V DD low-threshold transistor V DD V DDL V DD,int sleep V DD,int SRAM cell SRAM cell SRAM cell SRAM cell SRAM cell SRAM cell sleep V SS,int Inserting Extra Resistance Reducing the supply voltage

Data Retention in DRAM 2 2 2 I ACT I AC 2 3 2 4 2 5 I DC Cycle time : 5 ns T 5 75 C,S 2 6 5M 64M 255M G 4G 5G 64G Capacity (bit) 3.3 2.5 2..5.2..8 Operating voltage (V).53.4.32.24.9.6.3 Extrapolated threshold voltage at 25 C (V) From [Itoh]

Semiconductor Memory Trends (up to the 9 s) Memory Size as a function of time: x 4 every three years

Semiconductor Memory Trends (updated) From [Itoh]

Trends in Memory Cell Area From [Itoh]

Control Logic Finite State Machines Logic Implementations PLA ROM Multilevel Logic

State Machines Moore Machine Outputs are dependent only on current state Inputs Logic Current State Next State Memory Logic Outputs

State Machines Mealy Machine Outputs are dependent on current state and inputs Inputs Logic Outputs Current State Next State Memory

State Machine Design Moore Machine ON ON ON TRIGGER ON ON ON TRIGGER 2 ALARM ON TRIGGER ON TRIGGER

State Machine Design Mealy Machine ON ON ON TRIGGER ON ON ON TRIGGER 2 ON TRIGGER/ALARM ON TRIGGER/ALARM

State Machine Design S S ON TRIGGER NS NS ALARM X X X X X X X X X NS = ON TRIGGER + S S ON NS= S ON TRIGGER + S ON TRIGGER ALARM = S S

Programmable Logic Array x x Product terms AND plane x 2 OR plane f f x x x 2

PLA Design NS = ON TRIGGER + S S ON NS = S ON TRIGGER + S ON TRIGGER S S ON TRIGGER NS NS

Two-Level Logic Every logic function can be expressed in sum-of-products format (AND-OR) minterm Inverting format (NOR- NOR) more effective

PLA Design NS = ON + TRIGGER + S+ S + ON NS = S+ ON + TRIGGER + S + ON + TRIGGER S S ON TRIGGER NS NS

PLA Design

PLA versus ROM Programmable Logic Array structured approach to random logic two level logic implementation NOR-NOR (product of sums) NAND-NAND (sum of products) IDENTICAL TO ROM! Main difference ROM: fully populated PLA: one element per minterm Note: Importance of PLA s has drastically reduced. slow 2. better software techniques (mutli-level logic synthesis)

Programmable Logic Array Pseudo-NMOS PLA GND GND GND GND V DD GND GND GND V DD X X X X X 2 X 2 f f AND-plane OR-plane

Dynamic PLA f AND GND V DD f OR V DD f AND X X X X X 2 X 2 f f GND f OR AND-plane OR-plane

Clock Signal Generation for self-timed dynamic PLA f f Dummy AND row f AND f AND t pre t eval f AND Dummy AND row f OR f OR (a) Clock signals (b) Timing generation circuitry

PLA Layout V DD And-Plane Or-Plane φ GND x x x x x 2 x 2 Pull-up devices f f Pull-up devices

State Machine Design Other Control Implementation Microcode (ROM) Multilevel Logic

Next class HW5 due March 29th Clocking Read Chapter