Package Options Include Plastic Small-Outline (D) Packages, Ceramic Chip Carriers (FK), and Standard Plastic (N) and Ceramic (J) 00-mil DIPs description These devices contain four independent 2-input positive-nand gates. They perform the Boolean functions Y = A B or Y = A + B in positive logic. The SNALS00A and SNAS00 are characterized for operation over the full military temperature range of C to 2 C. The SN7ALS00A and SN7AS00 are characterized for operation from 0 C to 70 C. logic symbol FUTION TABLE (each gate) INPUTS OUTPUT A B Y H H L L X H X L H SNALS00A, SNAS00...J PACKAGE SN7ALS00A, SN7AS00...D OR N PACKAGE (TOP VIEW) GND 2 7 2 0 9 V CC B A Y B A Y SNALS00A, SNAS00... FK PACKAGE (TOP VIEW) 2 20 9 7 7 9 0 2 GND V CC B Y A A Y B A B A B 2 9 0 2 & Y Y No internal connection This symbol is in accordance with ANSI/IEEE Std 9-9 and IEC Publication 7-2. Pin numbers shown are for the D, J, and N packages. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright 99, Texas Instruments Incorporated POST OFFICE BOX 0 DALLAS, TEXAS 72
logic diagram (positive logic) 2 9 A 0 B 2 A B Pin numbers shown are for the D, J, and N packages. Y Y absolute maximum ratings over operating free-air temperature range (unless otherwise noted) Supply voltage, V CC........................................................................ 7 V Input voltage, V I............................................................................ 7 V Operating free-air temperature range, T A : SNALS00A............................. C to 2 C SN7ALS00A................................. 0 C to 70 C Storage temperature range....................................................... C to 0 C Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. recommended operating conditions SNALS00A SN7ALS00A MIN NOM MAX MIN NOM MAX VCC Supply voltage.... V VIH High-level input voltage 2 2 V VIL Low-level input voltage 0. 0. 0.7 IOH High-level output current 0. 0. ma IOL Low-level output current ma TA Operating free-air temperature 2 0 70 C Applies over temperature range C to 70 C Applies over temperature range 70 C to 2 C V 2 POST OFFICE BOX 0 DALLAS, TEXAS 72
electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) TEST CONDITIONS SNALS00A SN7ALS00A MIN TYP MAX MIN TYP MAX VIK VCC =. V, II = ma.2. V VOH VCC =. V to. V, IOH = 0. ma VCC 2 VCC 2 V VCC =V. IOL = ma 0.2 0. 0.2 0. IOL = ma 0. 0. II VCC =. V, VI = 7 V 0. 0. ma IIH VCC =. V, VI = 2.7 V 20 20 µa IIL VCC =. V, VI = 0. V 0. 0. ma IO VCC =. V, VO = 2.2 V 20 2 0 2 ma ICCH VCC =. V, VI = 0 0. 0. 0. 0. ma ICCL VCC =. V, VI =. V.. ma All typical values are at VCC = V, TA = 2 C. The output conditions have been chosen to produce a current that closely approximates one half of the true short-circuit output current, IOS. switching characteristics (see Figure ) V FROM (INPUT) TO (OUTPUT) VCC =. V to. V, CL = 0 pf, RL = 00 Ω, TA = MIN to MAX SNALS00A SN7ALS00A MIN MAX MIN MAX AorB Y 2 9 2 For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions. ns POST OFFICE BOX 0 DALLAS, TEXAS 72
absolute maximum ratings over operating free-air temperature range (unless otherwise noted) Supply voltage, V CC........................................................................ 7 V Input voltage, V I............................................................................ 7 V Operating free-air temperature range, T A : SNAS00............................... C to 2 C SN7AS00................................... 0 C to 70 C Storage temperature range....................................................... C to 0 C Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. recommended operating conditions SNAS00 SN7AS00 MIN NOM MAX MIN NOM MAX VCC Supply voltage.... V VIH High-level input voltage 2 2 V VIL Low-level input voltage 0. 0. V IOH High-level output current 2 2 ma IOL Low-level output current 20 20 ma TA Operating free-air temperature 2 0 70 C electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) TEST CONDITIONS SNAS00 SN7AS00 MIN TYP MAX MIN TYP MAX VIK VCC =. V, II = ma.2.2 V VOH VCC =. V to. V, IOH = 2 ma VCC 2 VCC 2 V VCC =. V, IOL = 20 ma 0. 0. 0. 0. V II VCC =. V, VI = 7 V 0. 0. ma IIH VCC =. V, VI = 2.7 V 20 20 µa IIL VCC =. V, VI = 0. V 0. 0. ma IO VCC =. V, VO = 2.2 V 0 2 0 2 ma ICCH VCC =. V, VI = 0 2.2 2.2 ma ICCL VCC =. V, VI =. V 0. 7. 0. 7. ma All typical values are at VCC = V, TA = 2 C. The output conditions have been chosen to produce a current that closely approximates one half of the true short-circuit output current, IOS. switching characteristics (see Figure ) FROM (INPUT) TO (OUTPUT) VCC =. V to. V, CL = 0 pf, RL = 00 Ω, TA = MIN to MAX SNAS00 SN7AS00 MIN MAX MIN MAX. AorB Y For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions. ns POST OFFICE BOX 0 DALLAS, TEXAS 72
MEASUREMENT INFORMATION SERIES ALS/7ALS AND AS/7AS DEVICES VCC 7 V RL = R = R2 S RL From Output Under Test CL (see Note A) RL Test Point From Output Under Test CL (see Note A) Test Point From Output Under Test CL (see Note A) R R2 Test Point LOAD CIRCUIT FOR BI-STATE TOTEM-POLE OUTPUTS LOAD CIRCUIT FOR OPEN-COLLECTOR OUTPUTS LOAD CIRCUIT FOR -STATE OUTPUTS Timing Input. V. V 0. V High-Level Pulse. V. V. V 0. V Data Input tsu. V th. V. V 0. V Low-Level Pulse tw. V. V. V 0. V TAGE WAVEFORMS SETUP AND HOLD TIMES TAGE WAVEFORMS PULSE DURATIONS Output Control (low-level enabling) Waveform S Closed (see Note B) tpzl. V. V tphz. V tplz. V 0. V. V 0. V tpzh Waveform 2 VOH S Open. V 0. V (see Note B) 0 V TAGE WAVEFORMS ENABLE AND DISABLE TIMES, -STATE OUTPUTS Input In-Phase Output Out-of-Phase Output (see Note C). V. V. V. V 0. V VOH. V VOH. V. V TAGE WAVEFORMS PROPAGATION DELAY TIMES NOTES: A. CL includes probe and jig capacitance. B. Waveform is for an output with internal conditions such that the output is low except when disabled by the output control. Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control. C. When measuring propagation delay items of -state outputs, switch S is open. D. All input pulses have the following characteristics: PRR MHz, tr = tf = 2 ns, duty cycle = 0%. E. The outputs are measured one at a time with one transition per measurement. Figure. Load Circuits and Voltage Waveforms POST OFFICE BOX 0 DALLAS, TEXAS 72
IMPORTANT NOTICE Texas Instruments (TI) reserves the right to make changes to its products or to discontinue any semiconductor product or service without notice, and advises its customers to obtain the latest version of relevant information to verify, before placing orders, that the information being relied on is current. TI warrants performance of its semiconductor products and related software to the specifications applicable at the time of sale in accordance with TI s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements. Certain applications using semiconductor products may involve potential risks of death, personal injury, or severe property or environmental damage ( Critical Applications ). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, INTENDED, AUTHORIZED, OR WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT APPLICATIONS, DEVICES OR SYSTEMS OR OTHER CRITICAL APPLICATIONS. Inclusion of TI products in such applications is understood to be fully at the risk of the customer. Use of TI products in such applications requires the written approval of an appropriate TI officer. Questions concerning potential risk applications should be directed to TI through a local SC sales office. In order to minimize risks associated with the customer s applications, adequate design and operating safeguards should be provided by the customer to minimize inherent or procedural hazards. TI assumes no liability for applications assistance, customer product design, software performance, or infringement of patents or services described herein. Nor does TI warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. Copyright 99, Texas Instruments Incorporated