FDP054N10 N-Channel PowerTrench MOSFET

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FDP054N0 N-Channel PowerTrench MOSFET V, 44A, 5.5mΩ Features R DS(on) = 4.6mΩ ( Typ.)@ V GS = 0V, I D = 75A Fast Switching Speed Low Gate Charge High Performance Trench Technology for Extremely Low R DS(on) High Power and Current Handling Capability RoHS Compliant Description April 202 This N-Channel MOSFET is produced using Fairchild Semiconductor s advanced PowerTrench process that has been especially tailored to minimize the on-state resistance and yet maintain superior switching performance. Application DC to DC Converters / Synchronous Rectification D G G D S TO-220 S MOSFET Maximum Ratings T C = 25 o C unless otherwise noted Symbol Parameter Ratings Units V DSS Drain to Source Voltage V V GSS Gate to Source Voltage ±20 V Thermal Characteristics - Continuous (T C = 25 o C, Silicon Limited) 44* I D Drain Current - Continuous (T C = o C, Silicon Limited) 02 A - Continuous (T C = 25 o C, Package Limited) 20 I DM Drain Current - Pulsed (Note ) 576 A E AS Single Pulsed Avalanche Energy (Note 2) 53 mj dv/dt Peak Diode Avalanche Energy (Note 3) 6 V/ns P D Power Dissipation (T C = 25 o C) 263 W - Derate above 25 o C.75 W/ o C T J, T STG Operating and Storage Temperature Range -55 to +75 o C T L Maximum Lead Temperature for Soldering Purpose, /8 from Case for 5 Seconds 300 o C *Calculated continuous current based on maximum allowable junction temperature. Package limitation current is 20A. Symbol Parameter Ratings Units R θjc Thermal Resistance, Junction to Case 0.57 o C/W R θja Thermal Resistance, Junction to Ambient 62.5 202 Fairchild Semiconductor Corporation

Package Marking and Ordering Information Device Marking Device Package Reel Size Tape Width Quantity FDP054N0 FDP054N0 TO-220 - - 50 Electrical Characteristics T C = 25 o C unless otherwise noted Symbol Parameter Test Conditions Min. Typ. Max. Units Off Characteristics BV DSS Drain to Source Breakdown Voltage I D = 250μA, V GS = 0V, T C = 25 o C - - V ΔBV DSS ΔT J On Characteristics Breakdown Voltage Temperature Coefficient Dynamic Characteristics I D = 250μA, Referenced to 25 o C - 0.0 - V/ o C V DS = V, V GS = 0V - - I DSS Zero Gate Voltage Drain Current μa V DS = V, V GS = 0V, T C = 50 o C - - 500 I GSS Gate to Body Leakage Current V GS = ±20V, V DS = 0V - - ± na V GS(th) Gate Threshold Voltage V GS = V DS, I D = 250μA 2.5 3.5 4.5 V R DS(on) Static Drain to Source On Resistance V GS = 0V, I D = 75A - 4.6 5.5 mω g FS Forward Transconductance V GS = 0V, I D = 75A (Note 4) - 92 - S C iss Input Capacitance - 9985 3280 pf V DS = 25V, V GS = 0V C oss Output Capacitance - 935 245 pf f = MHz C rss Reverse Transfer Capacitance - 390 585 pf Q g(tot) Total Gate Charge at 0V - 56 203 nc V DS = 80V, I D = 75A, Q gs Gate to Source Gate Charge - 53 - nc V GS = 0V Q gd Gate to Drain Miller Charge (Note 4,5) - 48 - nc Switching Characteristics t d(on) Turn-On Delay Time - 44 98 ns V DD = 50V, I D = 75A t r Turn-On Rise Time - 92 94 ns V GS = 0V, R GEN = 4.7Ω t d(off) Turn-Off Delay Time - 80 70 ns t f Turn-Off Fall Time (Note 4,5) - 39 88 ns Drain-Source Diode Characteristics I S Maximum Continuous Drain to Source Diode Forward Current - - 44 A I SM Maximum Pulsed Drain to Source Diode Forward Current - - 576 A V SD Drain to Source Diode Forward Voltage V GS = 0V, I SD = 75A - -.3 V t rr Reverse Recovery Time V GS = 0V, I SD =75A - 57 - ns Q rr Reverse Recovery Charge di F /dt = A/μs (Note 4) - 2 - nc Notes: : Repetitive Rating: Pulse width limited by maximum junction temperature 2: L = 0.4mH, I AS = 75A, V DD = 50V, R G = 25Ω, Starting T J = 25 C 3: I SD 75A, di/dt 200A/μs, V DD BV DSS, Starting T J = 25 C 4: Pulse Test: Pulse width 300μs, Duty Cycle 2% 5: Essentially Independent of Operating Temperature Typical Characteristics 2

Typical Performance Characteristics ID, Drain Current[A] Figure. On-Region Characteristics 0 V GS = 5.0 V 0.0 V 8.0 V 7.0 V 6.5 V 6.0 V *Notes:. 250μs Pulse Test 2. T C = 25 o C 0 0. V DS, Drain-Source Voltage[V] 6 Figure 2. Transfer Characteristics 3 4 5 6 7 V GS, Gate-Source Voltage[V] Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage Drain Current and Gate Voltage Variation vs. Source Current and Temperature RDS(on) [mω], Drain-Source On-Resistance 7 6 5 4 V GS = 0V V GS = 20V * Note : T C = 25 o C 3 0 200 300 400 I D, Drain Current [A] ID, Drain Current[A] IS, Reverse Drain Current [A] 0 0 0 0 * Notes :. V DS = 20V 2. 250μs Pulse Test 50 o C 50 o C -55 o C 25 o C Notes:. V GS = 0V 25 o C 2. 250μs Pulse Test 0.2 0.4 0.6 0.8.0.2 V SD, Body Diode Forward Voltage [V] Capacitances [pf] Figure 5. Capacitance Characteristics 000 00 0 Ciss = Cgs + Cgd (Cds = shorted) Coss = Cds + Cgd Crss = Cgd * Note:. V GS = 0V 2. f = MHz 0. 0 V DS, Drain-Source Voltage [V] C iss C oss C rss 30 VGS, Gate-Source Voltage [V] Figure 6. Gate Charge Characteristics 0 8 6 4 2 V DS = 20V V DS = 50V V DS = 80V * Note : I D = 75A 0 0 30 60 90 20 50 80 Q g, Total Gate Charge [nc] 3

Typical Performance Characteristics (Continued) Figure 7. Breakdown Voltage Variation vs. Temperature BVDSS, [Normalized] Drain-Source Breakdown Voltage.2..0 0.9 * Notes :. V GS = 0V 2. I D = 0mA 0.8-80 -40 0 40 80 20 60 200 T J, Junction Temperature [ o C] Figure 9. Maximum Safe Operating Area 0 Figure 8. On-Resistance Variation vs. Temperature RDS(on), [Normalized] Drain-Source On-Resistance 2.4 2.0.6.2 0.8 * Notes :. V GS = 0V 2. I D = 75A 0.4-80 -40 0 40 80 20 60 200 T J, Junction Temperature [ o C] Figure 0. Maximum Drain Current vs. Case Temperature 50 ID, DRAIN CURRENT (A) 0 THIS AREA IS LIMITED BY r DS(on) SINGLE PULSE T J = MAX RATED DC μs ms R θjc = 0.57 o C/W 0 ms T C = 25 o C ms 0. 0. 0 400 V DS, DRAIN to SOURCE VOLTAGE (V) ID, Drain Current [A] 50 Limitted by package 0 25 50 75 25 50 75 T C, Case Temperature [ o C] Figure. Transient Thermal Response Curve Thermal Response [Z θjc ] 0. 0.0 0.5 0.2 0. 0.05 0.02 0.0 Single pulse * Notes :. Z θjc (t) = 0.57 o C/W Max. 2. Duty Factor, D=t /t 2 3. T JM - T C = P DM * Z θjc (t) 0.00 0-5 0-4 0-3 0-2 0-0 Rectangular Pulse Duration [sec] P DM t t 2 4

Gate Charge Test Circuit & Waveform Resistive Switching Test Circuit & Waveforms Unclamped Inductive Switching Test Circuit & Waveforms 5

Peak Diode Recovery dv/dt Test Circuit & Waveforms DUT + I SD V DS _ L Driver R G Same Type as DUT V GS dv/dt controlled by RG I SD controlled by pulse period V DD V GS ( Driver ) Gate Pulse Width D = -------------------------- Gate Pulse Period 0V I FM, Body Diode Forward Current I SD ( DUT ) di/dt I RM Body Diode Reverse Current V DS ( DUT ) Body Diode Recovery dv/dt V SD V DD Body Diode Forward Voltage Drop 6

Package Dimensions TO-220 Dimensions in Millimeters 7

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PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Product Status Definition Advance Information Preliminary No Identification Needed Obsolete Formative / In Design First Production Full Production Not In Production Datasheet contains the design specifications for product development. Specifications may change in any manner without notice. Datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. Datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve the design. Datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor. The datasheet is for reference information only. Rev. I6 8