FDP V N-Channel PowerTrench MOSFET

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FDP2614 200V N-Channel PowerTrench MOSFET General Description This N-Channel MOSFET is produced using Fairchild Semiconductor s advanced PowerTrench process that has been especially tailored to minimize the on-state resistance and yet maintain superior switching performance. Application PDP application Description November 2007 62A, 200V, R DS(on) = 22.9mΩ @V GS = V Fast switching speed Low gate charge High performance trench technology for extremely low R DS(on) High power and current handling capability RoHS compliant D tm G D S TO-220 G S Absolute Maximum Ratings Symbol Parameter Ratings Unit V DS Drain-Source Voltage 200 V V GS Gate-Source Voltage ± 30 V I D Drain Current - Continuous (T C = 25 C) - Continuous (T C = 0 C) I DM Drain Current - Pulsed (Note 1) 62 39.3 see Figure 9 E AS Single Pulsed Avalanche Energy (Note 2) 145 mj dv/dt Peak Diode Recovery dv/dt (Note 3) 4.5 V/ns P D Power Dissipation (T C = 25 C) - Derate above 25 C T J, T STG Operating and Storage Temperature Range -55 to +150 C T L Maximum Lead Temperature for Soldering Purpose, 1/8 from Case for 5 Seconds 260 2.1 A A A W W/ C 300 C Thermal Characteristics Symbol Parameter Min. Max. Unit R θjc Thermal Resistance, Junction-to-Case -- 0.48 C/W R θja Thermal Resistance, Junction-to-Ambient -- 62.5 C/W 2007 Fairchild Semiconductor Corporation 1 www.fairchildsemi.com

Package Marking and Ordering Information Device Marking Device Package Reel Size Tape Width Quantity FDP2614 FDP2614 TO-220 - - 50 Electrical Characteristics T C = 25 C unless otherwise noted Symbol Parameter Conditions Min Typ Max Units Off Characteristics BV DSS Drain-Source Breakdown Voltage V GS = 0V, I D = 250μA, T J = 25 C 200 -- -- V ΔBV DSS ΔT J Breakdown Voltage Temperature Coefficient I DSS Zero Gate Voltage Drain Current V DS = 200V, V GS = 0V V DS = 200V, V GS = 0V, T J = 125 C I D = 250μA, Referenced to 25 C -- 0.2 -- V/ C I GSSF Gate-Body Leakage Current, Forward V GS = 30V, V DS = 0V -- -- 0 na I GSSR Gate-Body Leakage Current, Reverse V GS = -30V, V DS = 0V -- -- -0 na On Characteristics V GS(th) Gate Threshold Voltage V DS = V GS, I D = 250μA 3.0 4.0 5.0 V R DS(on) Static Drain-Source On-Resistance V GS = V, I D = 31A -- 22.9 27 mω g FS Forward Transconductance V DS = V, I D = 31A (Note 4) -- 72 -- S Dynamic Characteristics C iss Input Capacitance -- 5435 7230 pf C oss Output Capacitance V DS = 25V, V GS = 0V f = 1.0MHz -- 505 675 pf C rss Reverse Transfer Capacitance -- 1 165 pf Switching Characteristics t d(on) Turn-On Delay Time -- 77 165 ns t r Turn-On Rise Time V DD = 0V, I D = 62A V GS = V, R GEN = 25Ω -- 284 560 ns t d(off) Turn-Off Delay Time -- 3 220 ns t f Turn-Off Fall Time (Note 4, 5) -- 162 335 ns Q g Total Gate Charge -- 76 99 nc Q gs Gate-Source Charge V DS = 0V, I D = 62A V GS = V -- 35 -- nc Q gd Gate-Drain Charge (Note 4, 5) -- 18 -- nc Drain-Source Diode Characteristics and Maximum Ratings I S Maximum Continuous Drain-Source Diode Forward Current -- -- 62 A I SM Maximum Pulsed Drain-Source Diode Forward Current -- -- 186 A V SD Drain-Source Diode Forward Voltage V GS = 0V, I S = 62A -- -- 1.2 V t rr Reverse Recovery Time V GS = 0V, I S = 62A -- 145 -- ns Q rr Reverse Recovery Charge di F /dt =0A/μs (Note 4) -- 0.81 -- μc -- -- -- -- 500 μa μa Notes: 1. Repetitive Rating: Pulse width limited by maximum junction temperature 2. L = 1mH, I AS = 17A, V DD = 50V, R G = 25Ω, Starting T J = 25 C 3. I SD 62A, di/dt 0A/μs, V DD BV DSS, Starting T J = 25 C 4. Pulse Test: Pulse width 300μs, Duty Cycle 2% 5. Essentially Independent of Operating Temperature Typical Characteristics 2 www.fairchildsemi.com

Figure 1. On-Region Characteristics I D,Drain Current[A] 500 0 V GS Top : 15.0 V.0 V 8.0 V 7.0 V 6.5 V 6.0 V Bottom : 5.5 V 1. 250μs Pulse Test 2. T C = 25 o C 1 0.1 1 V DS,Drain-Source Voltage[V] Figure 3. On-Resistance Variation vs. Drain Current and Gate Voltage RDS(ON) [Ω], Drain-Source On-Resistance 0.06 0.05 0.04 0.03 0.02 V GS = V * Note : T J = 25 o C V GS = 20V 0.015 0 50 0 150 200 I D, Drain Current [A] Figure 2. Transfer Characteristics I D,Drain Current[A] 00 0 1. V DS = V 2. 250μs Pulse Test 150 o C 25 o C -55 o C 1 2 4 6 8 V GS,Gate-Source Voltage[V] Figure 4. Body Diode Forward Voltage Variation vs. Source Current and Temperature IDR, Reverse Drain Current [A] 00 0 1. V GS = 0V 2. I D = 250μA T A = 150 o C T A = 25 o C 1 0.2 0.4 0.6 0.8 1.0 1.2 VSD, Source-Drain voltage [V] Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics Capacitances [pf] 9000 6000 3000 C iss C oss C rss Ciss = Cgs + Cgd (Cds = shorted) Coss = Cds + Cgd Crss = Cgd * Note: 1. V GS = 0V 2. f = 1MHz V GS, Gate-Source Voltage [V] 8 6 4 2 V DS = 40V V DS = 0V V DS = 160V 0 0.1 1 V DS, Drain-Source Voltage [V] * Note : I D = 62A 0 30 0 20 40 60 80 0 Q g, Total Gate Charge [nc] 3 www.fairchildsemi.com

Figure 7. Breakdown Voltage Variation vs. Temperature BVDSS, [Normalized] Drain-Source Breakdown Voltage 1.2 1.1 1.0 0.9 1. V GS = 0V 2. I D = 250μA 0.8-0 -50 0 50 0 150 T J, Junction Temperature [ o C] Figure 9. Maximum Safe Operating Area 00 Figure 8. On-Resistance Variation vs. Temperature r DS(on), [Normalized] Drain-Source On-Resistance 3.0 2.5 2.0 1.5 1.0 0.5 1. V GS = V 2. I D = 31A 0.0-0 -50 0 50 0 150 200 T J, Junction Temperature [ o C] Figure. Maximum Drain Current vs. Case- Temperature 70 ID, Drain Current [A] 0 1 Operation in This Area is Limited by R DS(on) ms DC 0 μs 1ms 0.1 1. T C = 25 o C 2. T J = 150 o C 3. Single Pulse 0.01 1 0 V DS, Drain-Source Voltage [V] ID, Drain Current [A] 60 50 40 30 20 0 400 25 50 75 0 125 150 T C, Case Temperature [ o C] Figure 11. Transient Thermal Response Curve 0 Thermal Response [Z θjc ] -1-2 -3 0.5 0.2 0.1 0.05 0.02 0.01 Single pulse 1. Z θjc (t) = 0.48 o C/W Max. 2. Duty Factor, D=t 1 /t 2 3. T JM - T C = P DM * Z θjc (t) -5-4 -3-2 -1 0 1 Rectangular Pulse Duration [sec] P DM t 1 t 2 4 www.fairchildsemi.com

Gate Charge Test Circuit & Waveform Resistive Switching Test Circuit & Waveforms Unclamped Inductive Switching Test Circuit & Waveforms 5 www.fairchildsemi.com

Peak Diode Recovery dv/dt Test Circuit & Waveforms 6 www.fairchildsemi.com

Mechanical Dimensions (1.70) 13.08 ±0.20 9.20 ±0.20 1.30 ±0. (1.46) (1.00) 1.27 ±0. 9.90 ±0.20 (8.70) ø3.60 ±0. (45 ) (3.00) (3.70) 1.52 ±0. TO-220 15.90 ±0.20 2.80 ±0..08 ±0.30 18.95MAX. 4.50 ±0.20 1.30 +0. 0.05 2.54TYP [2.54 ±0.20] 0.80 ±0. 2.54TYP [2.54 ±0.20] 0.50 +0. 0.05 2.40 ±0.20.00 ±0.20 7 www.fairchildsemi.com

TRADEMARKS The following are registered and unregistered trademarks and service marks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. ACEx Build it Now CorePLUS CROSSVOLT CTL Current Transfer Logic EcoSPARK Fairchild Fairchild Semiconductor FACT Quiet Series FACT FAST FastvCore FPS FRFET Global Power Resource SM Green FPS Green FPS e-series GTO i-lo IntelliMAX ISOPLANAR MegaBuck MICROCOUPLER MicroFET MicroPak MillerDrive Motion-SPM OPTOLOGIC OPTOPLANAR PDP-SPM Power220 Power247 POWEREDGE Power-SPM PowerTrench Programmable Active Droop QFET QS QT Optoelectronics Quiet Series RapidConfigure SMART START SPM STEALTH SuperFET SuperSOT -3 SuperSOT -6 SuperSOT -8 SyncFET The Power Franchise TinyBoost TinyBuck TinyLogic TINYOPTO TinyPower TinyPWM TinyWire µserdes UHC UniFET VCX DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS. LIFE SUPPORT POLICY FAIRCHILD S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 2. A critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Product Status Definition Advance Information Preliminary No Identification Needed Obsolete Formative or In Design First Production Full Production Not In Production This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. This datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. This datasheet contains specifications on a product that has been discontinued by Fairchild Semiconductor. The datasheet is printed for reference information only. Rev. I31 8 www.fairchildsemi.com