Test Report Product Name : MEGA BOOK Model No. : MS-1049, MS-1049B, L710, 7100U Series Applicant : MICRO-STAR INT L Co., LTD. Address : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C. Date of Receipt : 2005/10/11 Issued Date : 2006/02/06 Report No. : 05AL126E The test results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation. Page: 1 of 82
Declaration of Conformity The following product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). The listed standards as below were applied: The following Equipment: Product Model Number Trade Name : MEGA BOOK : MS-1049, MS-1049B, L710, 7100U Series : MSI This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). For the evaluation regarding EMC, the following standards were applied: RFI Emission: EN 55022:1998+A1:2000+A2:2003 Class B : Product family standard EN 61000-3-2:2000 Class D : Limits for harmonic current emission EN 61000-3-3:1995+A1:2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system Immunity: EN 55024:1998+A1:2001+A2:2003 : Product family standard The following importer/manufacturer is responsible for this declaration: Company Name : Company Address : Telephone : Facsimile : Person is responsible for marking this declaration: Name (Full Name) Position/ Title Date Legal Signature
QTK No.:05AL126E Statement of Conformity This certifies that the following designated product: Product Model Number Trade Name Company Name : MEGA BOOK : MS-1049, MS-1049B, L710, 7100U Series : MSI : MICRO-STAR INT L Co., LTD This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). For the evaluation regarding EMC, the following standards were applied: RFI Emission: EN 55022:1998+A1:2000+A2:2003 Class B : Product family standard EN 61000-3-2:2000 Class D : Limits for harmonic current emission EN 61000-3-3:1995+A1:2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system Immunity: EN 55024:1998+A1:2001+A2:2003 : Product family standard TEST LABORATORY 0914 Gene Chang / President The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo. QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. Tel: 886-2-8601-3788, Fax: 886-2-8601-3789, E-mail: service@quietek.com
Test Report Certification Issued Date : 2006/02/06 Report No. : 05AL126E Product Name Applicant Address Manufacturer Model No. Rated Voltage EUT Voltage Trade Name Applicable Standard Classification Test Result : MEGA BOOK : MICRO-STAR INT L Co., LTD. : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C. : MICRO-STAR INT L Co., LTD. : MS-1049, MS-1049B, L710, 7100U Series : AC 230 V / 50 Hz : AC 100-240V, 50/60Hz : MSI, Averatec : EN 55022:1998+A1:2000+A2:2003, EN 55024:1998+A1:2001+A2:2003, EN 61000-3-2:2000,EN 61000-3-3:1995+A1:2001, AS/NZS CISPR 22:2004 : B : Complied The test results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation. Documented By : Tested By : (Gina Chen) Approved By : (Gary Wu ) (Gene Chang) 0914 Page: 2 of 82
TABLE OF CONTENTS Description Page 1. General Information...6 1.1. EUT Description...6 1.2. Test Mode...8 1.3. Tested System Details...10 1.4. Configuration of tested System...11 1.5. EUT Exercise Software...12 1.6. Test Facility...13 2. Conducted Emission...14 2.1. Test Equipment List...14 2.2. Test Setup...14 2.3. Limits...15 2.4. Test Procedure...15 2.5. Uncertainty...15 2.6. Test Specification...15 2.7. Test Result...16 2.8. Test Photo...18 3. Impedance Stabilization Network...19 3.1. Test Equipment List...19 3.2. Test Setup...19 3.3. Limits...20 3.4. Test Procedure...20 3.5. Uncertainty...20 3.6. Test Specification...20 3.7. Test Result...21 3.8. Test Photo...26 4. Radiated Emission...30 4.1. Test Equipment List...30 4.2. Test Setup...30 4.3. Limits...31 4.4. Test Procedure...31 4.5. Uncertainty...31 4.6. Test Specification...31 4.7. Test Result...32 4.8. Test Photo...34 5. Power Harmonics...35 5.1. Test Equipment List...35 5.2. Test Setup...35 5.3. Limits...36 5.4. Test Procedure...37 5.5. Uncertainty...37 5.6. Test Specification...37 5.7. Test Result...38 5.8. Test Photo...40 6. Voltage Fluctuation and Flicker...41 Page: 3 of 82
6.1. Test Equipment List...41 6.2. Test Setup...41 6.3. Limits...42 6.4. Test Procedure...42 6.5. Uncertainty...42 6.6. Test Specification...42 6.7. Test Result...43 6.8. Test Photo...44 7. Electrostatic Discharge (ESD)...45 7.1. Test Equipment List...45 7.2. Test Setup...45 7.3. Limits...46 7.4. Test Procedure...46 7.5. Uncertainty...46 7.6. Test Specification...46 7.7. Test Result...47 7.8. Test Photo...48 8. Radiated Susceptibility (RS)...49 8.1. Test Equipment List...49 8.2. Test Setup...49 8.3. Limits...50 8.4. Test Procedure...50 8.5. Uncertainty...50 8.6. Test Specification...50 8.7. Test Result...51 8.8. Test Photo...52 9. Electrical Fast Transient/Burst (EFT/B)...53 9.1. Test Equipment List...53 9.2. Test Setup...53 9.3. Limits...54 9.4. Test Procedure...54 9.5. Uncertainty...54 9.6. Test Specification...54 9.7. Test Result...55 9.8. Test Photo...56 10. Surge...58 10.1. Test Equipment List...58 10.2. Test Setup...58 10.3. Limits...59 10.4. Test Procedure...59 10.5. Uncertainty...59 10.6. Test Specification...59 10.7. Test Result...60 10.8. Test Photo...61 11. Conducted Susceptibility (CS)...62 11.1. Test Equipment List...62 11.2. Test Setup...62 Page: 4 of 82
11.3. Limits...63 11.4. Test Procedure...64 11.5. Uncertainty...64 11.6. Test Specification...64 11.7. Test Result...65 11.8. Test Photo...66 12. Power Frequency Magnetic Field...68 12.1. Test Equipment List...68 12.2. Test Setup...68 12.3. Limits...69 12.4. Test Procedure...69 12.5. Uncertainty...69 12.6. Test Specification...69 12.7. Test Result...70 12.8. Test Photo...71 13. Voltage Dips and Interruption Measurement...72 13.1. Test Equipment List...72 13.2. Test Setup...72 13.3. Limits...73 13.4. Test Procedure...73 13.5. Uncertainty...73 13.6. Test Specification...73 13.7. Test Result...74 13.8. Test Photo...75 Attachement...76 EUT Photograph...76 Reference : Laboratory of License Page: 5 of 82
1. General Information 1.1. EUT Description Product Name Trade Name Model No. MEGA BOOK MSI, Averatec MS-1049, MS-1049B, L710, 7100U Series Keypart List Type Description P/N CPU K8,AMD/TURION 64TMDML40BKX5LD,,2200MHz,OUPGA-754pin CPU K8,AMD/TMSMT28BQX4LD,,T1600MHz,OUPGA-754pin A10-K82G216-A08 A10-K81G616-A08 CPU K8,AMD/SMS2800BQX3LF,1.6GHz,OuPGA-754pin,256KB L2 CACHE,Mobile Sempron 25W A10-K81G636-A08 Series,2800+ CPU LCD HDD ODD CPU K8,AMD/SMS3000BQX2LF,,1.8GHz,OUPGA-754pin,128KBL2CACHE MOBILE SEMPRON 25W SERIES3000+ CPU K8,AMD/SMS3100BQX3LF,,1.8GHz,OUPGA-754pin,256KBL2CACHE MOBILE SEMPRON 25W SERIES3100+ CPU K8,AMD/SMS3300BQX2LF,,2.0GHz,OUPGA-754pin,128KBL2CACHE MOBILE SEMPRON 25W SERIES 3300+,LEAD FREE SYS/MODULE/LCD/SAMSUNG/LTN170WX-L05-G/1440x900DOTS/DISPLAY/WXGA/GLARE TYPE/17.0 inch TFT LCD PANEL/FOR MS-1036/#B SYS/HDD/ATA-100/IDE/2.5 /60GB/4200RPM/FUJITSU/MHT2060AT SYS/HDD/ATA-6/IDE/2.5 inch/80gb/4200rpm/fujitsu/mht2080at/for MS-1036 SYS/HDD/ATA-6/2.5 INCH/60GB/5400RPM/FUJITSU/MHV2060AH/FOR MS-1034,RoHS COMPLIANCE SYS/HDD/ATA-6/2.5 INCH/80GB/5400RPM/FUJITSU/MHV2080AH/FOR MS-1034,RoHS COMPLIANCE SYS/HDD/ATA-6/2.5 INCH/100GB/5400RPM/FUJITSU/MHV2100AH/FOR MS-1036,RoHS COMPLIANCE SYS/HDD/ATA-6/IDE/2.5 inch/100gb/5400rpm/toshiba/mk1032gax/for MS-1049,RoHS COMPLIANCE SYS/DVDRW/Slim type/8x-dvd±r/8x-dvd+rw/6x-dvd-rw/4x-dvd±r DL/8X-DVDROM/24X-CDR/16X-CDRW/24X-CDROM/HLDS/GWA-4082N/for MS-1046,RoHS COMPLIANCE SYS/CDRW/DVDROM combo/slim type/24x-r/24x-rw/8x-dvdrom/24x-cdrom/hlds/gcc-4244n/for MS-1029,RoHS COMPLIANCE A10-K81G856-A08 A10-K81G846-A08 A10-K83G306-A08 S78-230A020-S02 S71-1301020-F06 S71-1301191-F06 S71-1301380-F06 S71-1301390-F06 S71-1301400-F06 S71-1301500-T14 S7A-1317010-H44 S74-1303090-H44 Page: 6 of 82
Memory Inverter Battery Adaptor M2SAJ08D1AHXAF161GA-T, DDR1 400, 512MB M2S9I08D6APS9F081KA-T, DDR1 400, 256MB M2S5J08D1AHXAF161GA-T, DDR1 333, 512MB M2S5I08D6AHXAF081GA-T, DDR1 333, 256MB SYS,MODULE/INVERTER,SAMPO/DIVNMS0016D11--,NOTEBOOK INVERTER FOR 17 TFT LCD,FOR MS-1035 AND MS-1036 SYS/BATTERY PACK/LITHIUM-ION/SMP/925-2240/PANASONIC/VAVE=3.6V/2200mAh/6CELLS/10.8V/4400 mah/18650 SIZE/Pack: BLACK/MSI LOGO/FOR MS-1016 SYS/battery Pack/lithium-ion/WellTop/GMS-BMS080AAA00/Sony/Vave=3.7V/2400mAh/9cells/10.8V/720 0mAH/18650 size/pack: Black color/for MS-1016 SYS/ Power Supply Adaptor/ 90W/90-264Vin/4.74A/19Vout/ LI SHIN/LSE0202D1990/For MS-1029 S78-2407371-T75 S78-2406340-T75 S78-2407280-T75 S78-2406310-T75 S78-3300290-SG3 S91-030003H-SB3 S91-0300140-W38 S93-0406060-L44 K/B SYS/KEYBOARD/103Key/CHICONY/MP-03233US-359/US/Keycap:Black C/For MS-1035 S11-00US140-C54 Touchpad MDC Thermal SYS/MODULE/NoteBook Touchpad module/elantech/800406-1803/ 73.7mm* 43 mm/for MS-1029 SYS/MODEM/QCOM/MD560LMI-2(A)/MDC(Factor AC97/Azalia V.92 Modem Card)/For MS-1039 CPU new North bridge S78-3700110-E47 S52-2801100-Q09 E32-1300060-L01 E22-1049010-Y8 6833 WALN -- 6833B 6855B Note: 1. The EUT includes four models. Regarding to the different construction of the EUT, the model number is shown in the table as following: Model No. Trade Name MS-1049, MS-1049B, L710 MSI 7100U Series Averatec Page: 7 of 82
1.2. Test Mode QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as: Pre-Test Mode EMC Mode 1: Mode 2: Mode 3: Mode 4: Mode 5: Mode 6: Final Test Mode EMI Mode 1: EMS Mode 1: Type Description P/N Mode1 Mode2 Mode3 Mode4 Mode5 Mode6 CPU LCD HDD CPU K8,AMD/TURION 64TMDML40BKX5LD,,2200MHz,OUPGA-754pin A10-K82G216-A08 CPU K8,AMD/TMSMT28BQX4LD,,T1600MHz,OUPGA-754pin A10-K81G616-A08 V CPU K8,AMD/SMS2800BQX3LF,1.6GHz,OuPGA-754pin,256KB A10-K81G636-A08 L2 CACHE,Mobile Sempron 25W Series,2800+ V CPU K8,AMD/SMS3000BQX2LF,,1.8GHz,OUPGA-754pin,128KBL2C A10-K81G856-A08 V ACHE MOBILE SEMPRON 25W SERIES3000+ CPU K8,AMD/SMS3100BQX3LF,,1.8GHz,OUPGA-754pin,256KBL2C A10-K81G846-A08 V ACHE MOBILE SEMPRON 25W SERIES3100+ CPU K8,AMD/SMS3300BQX2LF,,2.0GHz,OUPGA-754pin,128KBL2C A10-K83G306-A08 V ACHE MOBILE SEMPRON 25W SERIES 3300+,LEAD FREE SYS/MODULE/LCD/SAMSUNG/LTN170WX-L05-G/1440x900D OTS/DISPLAY/WXGA/GLARE TYPE/17.0 inch TFT LCD S78-230A020-S02 V PANEL/FOR MS-1036/#B SYS/HDD/ATA-100/IDE/2.5 /60GB/4200RPM/FUJITSU/MHT2060AT S71-1301020-F06 V V V V V V SYS/HDD/ATA-6/IDE/2.5 inch/80gb/4200rpm/fujitsu/mht2080at/for MS-1036 S71-1301191-F06 V SYS/HDD/ATA-6/2.5 INCH/60GB/5400RPM/FUJITSU/MHV2060AH/FOR S71-1301380-F06 V MS-1034,RoHS COMPLIANCE SYS/HDD/ATA-6/2.5 INCH/80GB/5400RPM/FUJITSU/MHV2080AH/FOR S71-1301390-F06 V MS-1034,RoHS COMPLIANCE SYS/HDD/ATA-6/2.5 INCH/100GB/5400RPM/FUJITSU/MHV2100AH/FOR MS-1036,RoHS COMPLIANCE S71-1301400-F06 V SYS/HDD/ATA-6/IDE/2.5 inch/100gb/5400rpm/toshiba/mk1032gax/for S71-1301500-T14 V MS-1049,RoHS COMPLIANCE Page: 8 of 82
ODD Memory SYS/DVDRW/Slim type/8x-dvd±r/8x-dvd+rw/6x-dvd-rw/4x-dvd±r DL/8X-DVDROM/24X-CDR/16X-CDRW/24X-CDROM/HLDS/G WA-4082N/for MS-1046,RoHS COMPLIANCE S7A-1317010-H44 V SYS/CDRW/DVDROM combo/slim type/24x-r/24x-rw/8x-dvdrom/24x-cdrom/hlds/gcc-4 S74-1303090-H44 V V V 244N/For MS-1029,RoHS COMPLIANCE M2SAJ08D1AHXAF161GA-T, DDR1 400, 512MB S78-2407371-T75 V V V M2S9I08D6APS9F081KA-T, DDR1 400, 256MB S78-2406340-T75 V M2S5J08D1AHXAF161GA-T, DDR1 333, 512MB S78-2407280-T75 V V Inverter Battery Adaptor K/B Touchpad MDC Thermal M2S5I08D6AHXAF081GA-T, DDR1 333, 256MB S78-2406310-T75 V V SYS,MODULE/INVERTER,SAMPO/DIVNMS0016D11--,NOTEB OOK INVERTER FOR 17 TFT LCD,FOR MS-1035 AND MS-1036 S78-3300290-SG3 SYS/BATTERY PACK/LITHIUM-ION/SMP/925-2240/PANASONIC/VAVE=3.6V /2200mAh/6CELLS/10.8V/4400mAH/18650 SIZE/Pack: S91-030003H-SB3 V V V V V V BLACK/MSI LOGO/FOR MS-1016 SYS/battery Pack/lithium-ion/WellTop/GMS-BMS080AAA00/Sony/Vave=3. S91-0300140-W38 V 7V/2400mAh/9cells/10.8V/7200mAH/18650 size/pack: Black V V color/for MS-1016 SYS/ Power Supply Adaptor/ 90W/90-264Vin/4.74A/19Vout/ S93-0406060-L44 V V V LI SHIN/LSE0202D1990/For MS-1029 SYS/KEYBOARD/103Key/CHICONY/MP-03233US-359/US/Ke ycap:black C/For MS-1035 SYS/MODULE/NoteBook Touchpad module/elantech/800406-1803/ 73.7mm* 43 mm/for MS-1029 SYS/MODEM/QCOM/MD560LMI-2(A)/MDC(Factor AC97/Azalia V.92 Modem Card)/For MS-1039 S11-00US140-C54 V V V V V V S78-3700110-E47 V V V V V V S52-2801100-Q09 V V V V V V CPU new E32-1300060-L01 V V V V V V North bridge E22-1049010-Y8 6833 V WALN -- 6833B V 6855B V V V Page: 9 of 82
1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Product Manufacturer Model No. Serial No. Power Cord 1 LCD Monitor CMV CT-730D FMC122F56DA1145 Non-Shielded, 1.8m 2 USB Mouse Logitech M-BE58 HCA30102923 N/A 3 Walkman AIWA HS-TA164 N/A N/A 4 Microphone & N/A MIC-06 N/A N/A Earphone 5 Slim COMBO ASUS SCB-2408D 42DM355282 Non-shielded, 1.8m,with one ferrite core bonded. 6 USB 2.0 HDD Topdisk ME-910 031042 Power by PC 7 USB 2.0 HDD Topdisk ME-910 031085 Power by PC 8 Notebook PC DELL PPT N/A Non-Shielded, 0.8m 9 Monitor SONY PVM-14M2U 2111404 Non-Shielded, 1.8m 10 Exchange Network Sun Moon Star PX-4 95170087 Non-shielded, 1.8m Page: 10 of 82
1.4. Configuration of tested System Connection Diagram Signal Cable Type Signal cable Description A D-SUB Cable Shielded, 1.5m, with two ferrite cores bonded B USB Mouse Cable Shielded, 1.5m C USB Cable Shielded, 1.5m D Audio Cable Shielded, 1.8m E Earphone & Microphone Cable Non-Shielded, 2m F 1394 Cable Shielded, 2m G USB Cable Shielded, 1.5m H S-VIDEO Cable Shielded, 2m I LAN Cable Non-Shielded, 7m J TELECOM Cable Non-Shielded, 7m K TELECOM Cable Non-Shielded, 7m Page: 11 of 82
1.5. EUT Exercise Software 1 Setup the EUT and simulators as shown on 1.4. 2 Turn on the power of all equipment. 3 Notebook reads data from disk. 4 Notebook sends H pattern to monitor. 5 Notebook sends H pattern to printer, the printer will print H pattern on paper. 6 Notebook reads and writes data into and from modem. 7 Notebook will read data from floppy disk and then writes the data into floppy disk, same operation for hard disk. 8 Repeat the above procedure (4) to (7). Page: 12 of 82
1.6. Test Facility Ambient conditions in the laboratory: Items Test Item Required (IEC 68-1) Actual Temperature ( C) EN55022 CE 15-35 25 Humidity (%RH) 25-60 50 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) EN55022 RE 15-35 25 Humidity (%RH) 25-60 50 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) IEC 61000-4-11 15-35 24.2 Humidity (%RH) 25-75 51 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) IEC 61000-4-2 15-35 23.3 Humidity (%RH) 30-60 50 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) IEC 61000-4-5 15-35 24.2 Humidity (%RH) 10-75 51 Barometric pressure (mbar) 860-1060 950-1000 Temperature ( C) IEC 61000-4-8 15-35 24.2 Humidity (%RH) 25-75 51 Barometric pressure (mbar) 860-1060 950-1000 Site Description: Accredited by NVLAP NVLAP Lab Code: 200533-0 June 11, 2001 Accredited by DNV Statement No. : 413-99-LAB11 0914 April 18, 2001 Accredited by Nemko Certificate No.: ELA 165 May 03,2001 Accredited by TUV Rheinland Certificate No.: 10011438-1-2004 Accredited by CNLA Accredited Number: 0914 Site Name: Site Address: Quietek Corporation No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C. TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789 E-Mail : service@quietek.com Page: 13 of 82
2. Conducted Emission 2.1. Test Equipment List The following test equipment are used during the conducted emission test: Item Instrument Manufacturer Type No./Serial No Last Cal.. Remark 1 Test Receiver R & S ESCS 30/838251/001 Jan.,2005 2 L.I.S.N. R & S ESH3-Z5/836679/0023 May,2005 EUT 3 L.I.S.N. R & S ENV 4200/833209/0023 May,2005 Peripherals 4 Pulse Limiter R & S ESH3-Z2 May,2005 5 No.1 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 2.2. Test Setup Page: 14 of 82
2.3. Limits EN 55022:1998+A1: 2000+A2:2003 AC Mains Limits (dbuv) Frequency Class A Class B MHz QP AV QP AV 0.15-0.50 79 66 66-56 56-46 0.50-5.0 73 60 56 46 5.0-30 73 60 60 50 Remarks: In the above table, the tighter limit applies at the band edges 2.4. Test Procedure AC Mains: The EUT and simulators are connected to the main power through a line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm /50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) Both sides of AC line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed according to EN 55022:1998+A1: 2000+A2:2003 on conducted measurement. The bandwidth of the field strength meter (R & S Test Receiver ESCS 30) is set at 9kHz. 2.5. Uncertainty The measurement uncertainty is defined as ± 2.02 db 2.6. Test Specification According to EN 55022:1998+A1:2000+A2:2003 Page: 15 of 82
2.7. Test Result Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/20 Test Site No.1 Shielded Room Test Condition Conducted Emission Test Range 0.15-30MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv LINE 1 Quasi-Peak *0.170 0.202 49.250 49.452-15.977 65.429 0.205 0.202 45.220 45.422-19.007 64.429 0.263 0.203 40.510 40.713-22.058 62.771 0.451 0.206 40.320 40.526-16.874 57.400 0.513 0.206 38.310 38.516-17.484 56.000 1.474 0.219 33.210 33.429-22.571 56.000 Average 0.170 0.202 20.300 20.502-34.927 55.429 0.205 0.202 18.560 18.762-35.667 54.429 0.263 0.203 31.510 31.713-21.058 52.771 0.451 0.206 37.350 37.556-9.844 47.400 *0.513 0.206 38.010 38.216-7.784 46.000 1.474 0.219 33.150 33.369-12.631 46.000 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 16 of 82
Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/20 Test Site No.1 Shielded Room Test Condition Conducted Emission Test Range 0.15-30MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv LINE 2 Quasi-Peak 0.189 0.202 47.810 48.012-16.874 64.886 0.255 0.203 45.520 45.723-17.277 63.000 *0.451 0.206 40.440 40.646-16.754 57.400 0.896 0.212 33.790 34.002-21.998 56.000 1.474 0.219 33.630 33.849-22.151 56.000 2.498 0.233 32.430 32.663-23.337 56.000 Average 0.189 0.202 41.380 41.582-13.304 54.886 *0.255 0.203 44.160 44.363-8.637 53.000 0.451 0.206 37.730 37.936-9.464 47.400 0.896 0.212 33.670 33.882-12.118 46.000 1.474 0.219 33.530 33.749-12.251 46.000 2.498 0.233 27.220 27.453-18.547 46.000 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 17 of 82
2.8. Test Photo Test Mode : Mode 1: Description: Front View of Conducted Test - Mode 1 Test Mode : Mode 1: Description: Back View of Conducted Test - Mode 1 Page: 18 of 82
3. Impedance Stabilization Network 3.1. Test Equipment List The following test equipment are used during the conducted emission test: Item Instrument Manufacturer Type No./Serial No Last Cal.. Remark 1 Test Receiver R & S ESCS 30/838251/001 Jan.,2005 2 L.I.S.N. R & S ESH3-Z5/836679/0023 May,2005 EUT 3 L.I.S.N. R & S ENV 4200/833209/0023 May,2005 Peripheral 4 Pulse Limiter R & S ESH3-Z2 May,2005 5 ISN SCHAFFNER T400/19099 Apr.,2005 6 Voltage Probe SCHAFFNER CVP 2200A/18331 Apr.,2005 7 RF Current Probe FCC F-65/199 Apr.,2005 8 No.1 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 3.2. Test Setup Page: 19 of 82
3.3. Limits Telecommunication ports EN 55022:1998+A1: 2000+A2:2003 Telecommunication ports Limits db(uv) Frequency MHz Limit for conducted emissions from telecommunication ports of equipment intended for use in telecommunication centers only Limit for conducted emissions from telecommunication ports QP AV QP AV 0.15 0.50 97-87 84-74 84-74 74-64 0.5 30 87 74 74 64 Remarks: In the above table, the tighter limit applies at the band edges. 3.4. Test Procedure Telecommunication Port: The mains voltage shall be supplied to the EUT via the LISN when the measurement of telecommunication port is performed. The common mode disturbances at the telecommunication port shall be connected to the ISN, which is 150 ohm impedance. Both alternative cables are tested related to the LCL requested. The measurement range is from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz. The 60dB LCL ISN is used for cat. 5 cable, 50dB LCL ISN is used for cat. 3 and 80dB LCL is used for alternative one.. 3.5. Uncertainty The measurement uncertainty is defined as ± 1.8 db 3.6. Test Specification According to EN 55022:1998+A1: 2000+A2:2003 Page: 20 of 82
3.7. Test Result Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/21 Test Site No.1 Shielded Room Test Condition Impedance Stabilization Network Test Range 0.15-30MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv 100Mbps Quasi-Peak 0.193 9.798 59.950 69.748-13.024 82.771 0.580 9.767 47.590 57.357-16.643 74.000 1.541 9.740 46.650 56.390-17.610 74.000 5.236 9.770 50.690 60.460-13.540 74.000 7.923 9.795 51.890 61.685-22.315 84.000 *23.130 9.918 61.170 71.088-12.912 84.000 Average *0.193 9.798 59.170 68.968-3.804 72.771 0.580 9.767 46.260 56.027-7.973 64.000 1.541 9.740 43.140 52.880-11.120 64.000 5.236 9.770 47.950 57.720-6.280 64.000 7.923 9.795 49.070 58.865-15.135 74.000 23.130 9.918 59.090 69.008-4.992 74.000 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 21 of 82
Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/21 Test Site No.1 Shielded Room Test Condition Impedance Stabilization Network Test Range 0.15-30MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv 10Mbps Quasi-Peak 0.193 9.798 59.120 68.918-13.854 82.771 0.689 9.759 41.750 51.509-22.491 74.000 0.939 9.738 34.010 43.748-30.252 74.000 1.412 9.738 54.070 63.808-10.192 74.000 *4.947 9.766 59.240 69.006-4.994 74.000 10.009 9.813 62.370 72.183-11.817 84.000 Average *0.193 9.798 58.310 68.108-4.664 72.771 0.689 9.759 32.260 42.019-21.981 64.000 0.939 9.738 25.530 35.268-28.732 64.000 1.412 9.738 46.590 56.328-7.672 64.000 4.947 9.766 33.090 42.856-21.144 64.000 10.009 9.813 39.180 48.993-25.007 74.000 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 22 of 82
Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/21 Test Site No.1 Shielded Room Test Condition Impedance Stabilization Network Test Range 0.15-30MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv 1Gbps (Vol) Quasi-Peak *0.193 0.102 52.070 52.172-30.599 82.771 0.255 0.103 42.610 42.713-38.287 81.000 0.322 0.104 39.300 39.404-39.682 79.086 0.509 0.106 27.640 27.746-46.254 74.000 0.978 0.113 23.760 23.873-50.127 74.000 1.783 0.123 29.440 29.563-44.437 74.000 Average *0.193 0.102 51.380 51.482-21.289 72.771 0.255 0.103 42.600 42.703-28.297 71.000 0.322 0.104 38.860 38.964-30.122 69.086 0.509 0.106 25.220 25.326-38.674 64.000 0.978 0.113 14.880 14.993-49.007 64.000 1.783 0.123 20.260 20.383-43.617 64.000 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 23 of 82
Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/21 Test Site No.1 Shielded Room Test Condition Impedance Stabilization Network Test Range 0.15-30MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv 1Gbps (Current) Quasi-Peak 1.451 0.119 8.370 8.489-21.511 30.000 1.935 0.125 8.430 8.556-21.444 30.000 2.619 0.134 8.550 8.684-21.316 30.000 *4.705 0.162 9.010 9.172-20.828 30.000 15.548 0.307 6.840 7.147-22.853 30.000 28.779 0.484 7.210 7.694-22.306 30.000 Average 1.451 0.119 3.540 3.659-16.341 20.000 1.935 0.125 3.740 3.865-16.135 20.000 2.619 0.134 3.740 3.874-16.126 20.000 *4.705 0.162 4.350 4.512-15.488 20.000 15.548 0.307 1.780 2.087-17.913 20.000 28.779 0.484 2.160 2.644-17.356 20.000 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 24 of 82
Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/21 Test Site No.1 Shielded Room Test Condition Impedance Stabilization Network Test Range 0.15-30MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv db dbuv Telecom Quasi-Peak 0.193 9.798 58.660 68.458-14.314 82.771 0.255 9.793 56.600 66.393-14.607 81.000 0.318 9.788 50.410 60.198-19.002 79.200 *0.513 9.774 50.310 60.084-13.916 74.000 0.834 9.751 45.910 55.661-18.339 74.000 2.052 9.747 45.530 55.277-18.723 74.000 Average 0.193 9.798 57.220 67.018-5.754 72.771 *0.255 9.793 56.240 66.033-4.967 71.000 0.318 9.788 50.190 59.978-9.222 69.200 0.513 9.774 48.910 58.684-5.316 64.000 0.834 9.751 45.250 55.001-8.999 64.000 2.052 9.747 43.060 52.807-11.193 64.000 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 25 of 82
3.8. Test Photo Test Mode : Mode 1: Description: Front View of ISN Test - Mode 1 Test Mode : Mode 1: Description: Back View of ISN Test - Mode 1 Page: 26 of 82
Test Mode : Mode 1: Description: Front View of ISN Test - Mode 1-1G(Vol) Test Mode : Mode 1: Description: Back View of ISN Test - Mode 1-1G(Vol) Page: 27 of 82
Test Mode : Mode 1: Description: Front View of ISN Test - Mode 1-1G(Current) Test Mode : Mode 1: Description: Back View of ISN Test - Mode 1-1G(Current) Page: 28 of 82
Test Mode : Mode 1: Description: Front View of ISN Test - Mode 1-Telecom Test Mode : Mode 1: Description: Back View of ISN Test - Mode 1-Telecom Page: 29 of 82
4. Radiated Emission 4.1. Test Equipment List The following test equipment are used during the radiated emission test: Test Site Equipment Manufacturer Model No./Serial No. Last Cal. OATS 3 Test Receiver R & S ESCS 30 / 100122 Feb.,2005 Spectrum Analyzer Advantest R3162 / 120300652 Feb.,2005 Pre-Amplifier QTK AP-025C / CHM-0201003 May,2005 Bilog Antenna SCHAFFNER CBL6112B / 2697 May,2005 Note: 1. All equipments that need to be calibrate are with calibration period of 1 year. 2. Mark X test instruments are used to measure the final test results. 4.2. Test Setup Page: 30 of 82
4.3. Limits EN 55022: 1998+A1: 2000+A2:2003 Limits (dbuv/m) Frequency Class A Class B MHz Distance (m) dbuv/m Distance (m) dbuv/m 30 230 10 40 10 30 230 1000 10 47 10 37 Remarks: In the above table, the tighter limit applies at the band edges. 4.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 10 meters. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated according to EN 55022: 1998+A1: 2000+A2:2003 on radiated measurement. Radiated emissions were investigated over the frequency range from 30MHz to1ghz using a receiver bandwidth of 120kHz. Radiated measurement was performed at an antenna to EUT distance of 10 meters. 4.5. Uncertainty The measurement uncertainty is defined as ± 3.8 db 4.6. Test Specification According to EN 55022: 1998+A1: 2000+A2:2003 Page: 31 of 82
4.7. Test Result Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/11 Test Site OATS 3 Test Condition Radiated Emission Test Range 30-1000MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv/m db dbuv/m Horizontal 221.180 11.774 15.000 26.775-3.225 30.000 233.467 13.186 17.510 30.696-6.304 37.000 360.033 18.881 8.300 27.181-9.819 37.000 479.990 22.293 10.990 33.283-3.717 37.000 527.992 23.124 9.590 32.714-4.286 37.000 600.055 24.364 9.000 33.364-3.636 37.000 623.990 24.790 8.880 33.670-3.330 37.000 720.068 25.904 7.400 33.304-3.696 37.000 *800.018 26.996 6.900 33.896-3.104 37.000 840.075 27.302 6.550 33.852-3.148 37.000 Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. *, means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 32 of 82
Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/11 Test Site OATS 3 Test Condition Radiated Emission Test Range 30-1000MHz Frequency Correct Reading Measurement Margin Limit Factor Level Level MHz db dbuv dbuv/m db dbuv/m Vertical 59.980 6.722 19.100 25.822-4.178 30.000 120.010 13.605 9.900 23.505-6.495 30.000 167.040 11.744 10.400 22.144-7.856 30.000 239.995 14.203 17.100 31.303-5.697 37.000 360.035 18.881 7.000 25.881-11.119 37.000 400.008 20.402 10.100 30.502-6.498 37.000 *479.992 22.293 11.250 33.543-3.457 37.000 500.008 22.407 7.600 30.007-6.993 37.000 600.057 24.364 8.100 32.464-4.536 37.000 720.070 25.904 5.800 31.704-5.296 37.000 782.540 26.690 6.230 32.920-4.080 37.000 Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. *, means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 33 of 82
4.8. Test Photo Test Mode : Mode 1: Description: Front View of Radiated Test- Mode 1 Test Mode : Mode 1: Description: Back View of Radiated Test- Mode 1 Page: 34 of 82
5. Power Harmonics 5.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Power Harmonics Tester SCHAFFNER Profline 2105-400 S/N: HK54148 Feb.,2005 2 Analyzer SCHAFFNER CCN 1000-1/X71887 Feb.,2005 3 No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 5.2. Test Setup Page: 35 of 82
5.3. Limits Limits of Class A Harmonics Currents Harmonics Maximum Permissible Order harmonic current A n Odd harmonics Harmonics Order n Maximum Permissible harmonic current A Even harmonics 3 2.30 2 1.08 5 1.14 4 0.43 7 0.77 6 0.30 9 0.40 8 n 40 0.23 * 8/n 11 0.33 13 0.21 15 n 39 0.15 * 15/n Limits of Class B Harmonics Currents For Class B equipment, the harmonic of the input current shall not exceed the maximum permissible values given in table which is the limit of Class A multiplied by a factor of 1.5. Limits of Class C Harmonics Currents Harmonics Order n Maximum Permissible harmonic current Expressed as a percentage of the input current at the fundamental frequency % 2 2 3 30.λ * 5 10 7 7 9 5 11 n 39 (odd harmonics only) *λ is the circuit power factor 3 Page: 36 of 82
Limits of Class D Harmonics Currents Harmonics Order n Maximum Permissible harmonic current per watt ma/w Maximum Permissible harmonic current A 3 3.4 2.30 5 1.9 1.14 7 1.0 0.77 9 0.5 0.40 11 0.35 0.33 11 n 39 (odd harmonics only) 3.85/n See limit of Class A 5.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed. 5.5. Uncertainty The measurement uncertainty is defined as ± 3.23 % 5.6. Test Specification According to EN 61000-3-2:2000 Page: 37 of 82
5.7. Test Result Date of Test 2005/10/20 Test Site No.3 Shielded Room Test Mode Mode 1: Product MEGA BOOK Test Condition Power Harmonics Test Range Test Result: Pass Source qualification: Normal Current & voltage waveforms 0.9 300 Current (Amps) 0.6 0.3 0.0-0.3-0.6 200 100 0-100 -200 Voltage (Volts) -0.9-300 Harmonics and Class D limit line European Limits Current RMS(Amps) 0.45 0.40 0.35 0.30 0.25 0.20 0.15 0.10 0.05 0.00 4 8 12 16 20 24 28 32 36 40 Harmonic # Test result: Pass Worst harmonic was #9 with 13.09% of the limit. Page: 38 of 82
Test Result: Pass Source qualification: Normal THC(A): 0.06 I-THD(pk%): 15.15 POHC(A): 0.005 POHC Limit(A): 0.038 Highest parameter values during test: V_RMS (Volts): 229.85 Frequency(Hz): 50.00 I_Peak (Amps): 0.685 I_RMS (Amps): 0.398 I_Fund (Amps): 0.391 Crest Factor: 1.733 Power (Watts): 88 Power Factor: 0.963 Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.000 3 0.053 0.299 17.8 0.054 0.449 12.03 Pass 4 0.000 5 0.015 0.167 9.0 0.015 0.251 6.07 Pass 6 0.000 7 0.011 0.088 12.7 0.011 0.132 8.61 Pass 8 0.000 9 0.009 0.044 19.4 0.009 0.066 13.09 Pass 10 0.000 11 0.006 0.031 18.1 0.006 0.046 12.31 Pass 12 0.000 13 0.003 0.026 12.5 0.003 0.039 8.68 Pass 14 0.000 15 0.002 0.023 9.0 0.002 0.034 6.21 Pass 16 0.000 17 0.002 0.020 9.6 0.002 0.030 6.69 Pass 18 0.000 19 0.002 0.018 11.8 0.002 0.027 8.08 Pass 20 0.000 21 0.002 0.016 14.3 0.002 0.024 9.72 Pass 22 0.000 23 0.002 0.015 15.9 0.002 0.022 10.85 Pass 24 0.000 25 0.002 0.014 14.6 0.002 0.020 10.09 Pass 26 0.000 27 0.002 0.013 12.8 0.002 0.019 8.82 Pass 28 0.000 29 0.001 0.012 11.2 0.001 0.018 7.73 Pass 30 0.000 31 0.001 0.011 11.4 0.001 0.016 7.82 Pass 32 0.000 33 0.001 0.010 13.0 0.001 0.015 8.88 Pass 34 0.000 35 0.001 0.010 14.2 0.001 0.015 9.74 Pass 36 0.000 37 0.001 0.009 14.7 0.001 0.014 10.08 Pass 38 0.000 39 0.001 0.009 14.3 0.001 0.013 9.92 Pass 40 0.000 1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 39 of 82
5.8. Test Photo Test Mode : Mode 1: Description: Power Harmonics Test Setup -Mode 1 Page: 40 of 82
6. Voltage Fluctuation and Flicker 6.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Power Harmonics Tester SCHAFFNER Profline 2105-400 S/N: HK54148 Feb.,2005 2 Analyzer SCHAFFNER CCN 1000-1/X71887 Feb.,2005 3 No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 6.2. Test Setup Page: 41 of 82
6.3. Limits Voltage Fluctuations and Flicker: The following limits apply: - the value of P st shall not be greater than 1.0; - the value of P 1t shall not be greater than 0.65; - the value of d(t) during a voltage change shall not exceed 3.3 % for more than 500 ms; - the relative steady-state voltage change, d c, shall not exceed 3.3 %; - the maximum relative voltage change, d max, shall not exceed; a) 4 % without additional conditions; b) 6 % for equipment which is: - switched manually, or - switched automatically more frequently than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds), or manual restart, after a power supply interruption. NOTE The cycling frequency will be further limited by the P st and P 1t limit. For example: a d max of 6%producing a rectangular voltage change characteristic twice per hour will give a P 1t of about 0.65. c) 7 % for equipment which is: - attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment such as mixers, garden equipment such as lawn mowers, portable tools such as electric drills), or - switched on automatically, or is intended to be switched on manually, no more than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds) or manual restart, after a power supply interruption. P st and P 1t requirements shall not be applied to voltage changes caused by manual switching. 6.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed. 6.5. Uncertainty The measurement uncertainty is defined as ± 3.23 % 6.6. Test Specification According to EN 61000-3-3:1995+A1:2001 Page: 42 of 82
6.7. Test Result Date of Test 2005/10/20 Test Site No.3 Shielded Room Test Mode Mode 1: Product MEGA BOOK Test Condition Flicker Test Range Test Result: Pass Status: Test Completed Pst i and limit line European Limits 1.00 0.75 Pst 0.50 0.25 0.00 6:00:09 Time is too short for Plt plot Parameter values recorded during the test: Vrms at the end of test (Volt): 229.84 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.001 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.001 Test limit: 0.650 Pass Page: 43 of 82
6.8. Test Photo Test Mode : Mode 1: Description: Flicker Test Setup -Mode 1 Page: 44 of 82
7. Electrostatic Discharge (ESD) 7.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 ESD Simulator System SCHAFFNER NSG 438,S/N:167 Mar.,2005 2 Horizontal Coupling Plane(HCP) 3 Vertical Coupling Plane(VCP) QuieTek HCP AL50 N/A QuieTek VCP AL50 N/A 4 No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 7.2. Test Setup Page: 45 of 82
7.3. Limits Item Environmental Phenomena Units Test Specification Performance Criteria Enclosure Port Electrostatic Discharge Kv (Charge Voltage) ±8 Air Discharge B ±4 Contact Discharge Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. 7.4. Test Procedure Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT. Indirect application of discharges to the EUT: Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. 7.5. Uncertainty The measurement uncertainty is defined as ± 6.003 % 7.6. Test Specification According to IEC 61000-4-2 Edition 1.2: 2001-04 Page: 46 of 82
7.7. Test Result Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/13 Test Site No.3 Shielded Room Test Condition Electrostatic Discharge Test Range Item Air Discharge Contact Discharge Indirect Discharge (HCP) Indirect Discharge (VCP Front) Indirect Discharge (VCP Left) Indirect Discharge (VCP Back) Indirect Discharge (VCP Right) Amount of Discharge 10 10 25 25 50 50 50 50 50 50 50 50 50 50 Voltage +8kV -8kV +4kV -4kV +4kV -4kV +4kV -4kV +4kV -4kV +4kV -4kV +4kV -4kV Required Criteria B B B B B B B B B B B B B B Complied To Criteria (A,B,C) A A A A A A A A A A B B A A Results Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 47 of 82
7.8. Test Photo Test Mode : Mode 1: Description: ESD Test Setup -Mode 1 Page: 48 of 82
8. Radiated Susceptibility (RS) 8.1. Test Equipment List Item Equipment Manufacturer Model No. / Serial No. Last Cal. 1 Signal Generator R & S SMY02 / 825454/029 Oct., 2005 2 Power Amplifier A & R 100W10000M7 / A285000010 N/A 3 RF Power Amplifier OPHIRRF 5022F / 1075 N/A 4 Bilog Antenna Chase CBL6112B / 2452 Sep., 2005 5 Power Meter R & S NRVD / 100219 Jan., 2005 6 Directional Coupler A & R DC6180 / 22735 Jan, 2005 7 No.2 EMC Fully Chamber N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 8.2. Test Setup Page: 49 of 82
8.3. Limits Item Environmental Phenomena Enclosure Port Radio-Frequency Electromagnetic Field Amplitude Modulated Units MHz V/m(Un-modulated, rms) % AM (1kHz) Test Specification 80-1000 3 80 Performance Criteria A 8.4. Test Procedure The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. Both horizontal and vertical polarization of the antenna and six sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD camera is used to monitor EUT screen. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 3 V/M Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 80MHz - 1000MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s 8.5. Uncertainty The measurement uncertainty is defined as ± 6.17 % 8.6. Test Specification According to IEC 61000-4-3:2002+A1:2002 Page: 50 of 82
8.7. Test Result Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/19 Test Site Chamber2 Test Condition Radiated Susceptibility Test Range 80-1000MHz Field Complied To Frequency Position Polarity Required Strength Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,B,C) Results 80-1000 FRONT H 3 A A PASS 80-1000 FRONT V 3 A A PASS 80-1000 BACK H 3 A A PASS 80-1000 BACK V 3 A A PASS 80-1000 RIGHT H 3 A A PASS 80-1000 RIGHT V 3 A A PASS 80-1000 LEFT H 3 A A PASS 80-1000 LEFT V 3 A A PASS 80-1000 UP H 3 A A PASS 80-1000 UP V 3 A A PASS 80-1000 DOWN H 3 A A PASS 80-1000 DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 51 of 82
8.8. Test Photo Test Mode : Mode 1: Description: Radiated Susceptibility Test Setup -Mode 1 Page: 52 of 82
9. Electrical Fast Transient/Burst (EFT/B) 9.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Fast Transient/Burst Generator SCHAFFNER NSG 2050 S/N: 200124-031AR Jun.,2005 2 No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 9.2. Test Setup Page: 53 of 82
9.3. Limits Item Environmental Phenomena Units Test Specification Performance Criteria I/O and communication ports Fast Transients Common Mode Input DC Power Ports Fast Transients Common Mode Input AC Power Ports Fast Transients Common Mode kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz +0.5 5/50 5 +0.5 5/50 5 +1 5/50 5 B B B 9.4. Test Procedure The EUT are placed on a table that is 0.8 meter height, and a ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and ground reference plane. The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1min. For Input DC and AC Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 min. The length of power cord between the coupling device and the EUT shall be 0.5m ± 0.05m.. 9.5. Uncertainty The measurement uncertainty is defined as ± 8.80 % 9.6. Test Specification According to IEC 61000-4-4:2004 Page: 54 of 82
9.7. Test Result Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/19 Test Site No.3 Shielded Room Test Condition Electrical Fast Transient/Burst Test Range Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 1kV 60 CDN B A PASS LAN ± 0.5kV 90 Clamp B B PASS Telecom ± 0.5kV 90 Clamp B B PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 55 of 82
9.8. Test Photo Test Mode : Mode 1: Description: EFT/B Test Setup -Mode 1 Test Mode : Mode 1: Description: EFT/B Test Setup -Mode 1-Clamp-LAN Page: 56 of 82
Test Mode : Mode 1: Description: EFT/B Test Setup -Mode 1-Clamp-Telecom Page: 57 of 82
10. Surge 10.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Surge Generator SCHAFFNER NSG 2050 S/N: 200124-031AR Nov.,2004 2 No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 10.2. Test Setup Page: 58 of 82
10.3. Limits Item Environmental Phenomena Units Test Specification Performance Criteria Signal Ports and Telecommunication Ports (See 1) and 2)) Surges Tr/Ts us 1.2/50 (8/20) Line to Ground kv ± 1 B Input DC Power Ports Surges Line to Ground Tr/Ts us kv AC Input and AC Output Power Ports Surges Tr/Ts us Line to Line kv Line to Ground kv 1.2/50 (8/20) ± 0.5 B 1.2/50 (8/20) ± 1 ± 2 Notes: 1) Applicable only to ports which according to the manufacturer s may directly to outdoor cables. 2) Where normal functioning cannot be achieved because of the impact of the CDN on the EUT,no test shall be required. B 10.4. Test Procedure The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Input and Output AC Power or DC Input and DC Output Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 0 0, 90 0, 180 0, 270 0 and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min. 10.5. Uncertainty The measurement uncertainty is defined as ± 7.93 % 10.6. Test Specification According to IEC 61000-4-5 Edition 1.1: 2001-04 Page: 59 of 82
10.7. Test Result Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/19 Test Site No.3 Shielded Room Test Condition Surge Test Range Voltage Time Inject Inject Required Complied to Polarity Angle Interval Line Method Criteria Criteria kv (Second) Result L-N ± 0 1kV 60 Direct B A PASS L-N ± 90 1kV 60 Direct B A PASS L-N ± 180 1kV 60 Direct B A PASS L-N ± 270 1kV 60 Direct B A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 60 of 82
10.8. Test Photo Test Mode : Mode 1: Description: SURGE Test Setup-Mode 1 Page: 61 of 82
11. Conducted Susceptibility (CS) 11.1. Test Equipment List The following test equipment are used during the test: Item Equipment Manufacturer Model No. / Serial No. Last Cal. 1 CS SYSTEM SCHAFFNER NSG 2070 Mar.,2005 2 CDN SCHAFFNER CDN M016S / 20822 Dec.,2004 3 CDN SCHAFFNER CDN M016S / 20823 Dec.,2004 4 FIXED PAD SCHAFFNER INA 2070-1 / 2115 N/A 5 EM Clamp KEMZ 801 / 21024 Mar.,2005 6 No.6 Shielded Room N/A Note: All equipment upon which need to calibrated are with calibration period of 1 year. 11.2. Test Setup Page: 62 of 82
11.3. Limits Item Environmental Phenomena Units Signal Ports and Telecommunication Ports MHz Radio-Frequency V (rms, Continuous Conducted Un-modulated) % AM (1kHz) Input DC Power Ports Radio-Frequency Continuous Conducted Input AC Power Ports Radio-Frequency Continuous Conducted MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) Test Specification Performance Criteria 0.15-80 3 80 0.15-80 3 80 0.15-80 3 80 A A A Page: 63 of 82
11.4. Test Procedure The EUT are placed on a table that is 0.8 meter height, and a ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 130dBuV(3V) Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 0.15MHz 80MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s. 11.5. Uncertainty The measurement uncertainty is defined as ± 6.17 % 11.6. Test Specification According to IEC 61000-4-6 Edition 2.1: 2004-11 Page: 64 of 82
11.7. Test Result Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/19 Test Site No.6 Shielded Room Test Condition Conducted Susceptibility Test Range 0.15-80MHz Frequency Voltage Inject Tested Port of Required Performance Result Range Applied Method EUT Criteria Criteria Complied (MHz) dbuv(v) To 0.15~80 130 (3V) CDN AC IN A A PASS 0.15~80 130 (3V) Clamp LAN A A PASS 0.15~80 130 (3V) Clamp Telecom A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dbuv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 65 of 82
11.8. Test Photo Test Mode : Mode 1: Description: Conducted Susceptibility Test Setup -Mode 1 Test Mode : Mode 1: Description: Conducted Susceptibility Test Setup -Mode 1-Clamp-LAN Page: 66 of 82
Test Mode : Mode 1: Description: Conducted Susceptibility Test Setup -Mode 1-Clamp-Telecom Page: 67 of 82
12. Power Frequency Magnetic Field 12.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Power Line Maganetics SCHAFFNER INA 2141 S/N: 6002 Jun.,2005 2 Gauss Meter F.W.BELL 4090 Jun.,2005 3 Magnetic Field Coil SCHAFFNER INA702 Jun.,2005 S/N: 199749-020 IN 4 No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 12.2. Test Setup Page: 68 of 82
12.3. Limits Item Environmental Phenomena Units Test Specification Performance Criteria Enclosure Port Power-Frequency Magnetic Field Hz A/m (r.m.s.) 50 1 A 12.4. Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured at least 1m*1m min. The test magnetic field shall be placed at central of the induction coil. The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT. And the induction coil shall be rotated by 90 in order to expose the EUT to the test field with different orientation (X, Y, Z Orientations). 12.5. Uncertainty The measurement uncertainty is defined as ± 3.23 % 12.6. Test Specification According to IEC 61000-4-8 Edition 1.1: 2001-03 Page: 69 of 82
12.7. Test Result Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/19 Test Site No.3 Shielded Room Test Condition Power Frequency Magnetic Field Test Range Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 70 of 82
12.8. Test Photo Test Mode : Mode 1: Description: Power Frequency Magnetic Field Test Setup -Mode 1 Page: 71 of 82
13. Voltage Dips and Interruption Measurement 13.1. Test Equipment List Item Instrument Manufacturer Type No/Serial No. Last Calibration 1 Voltage Dips Generator SCHAFFNER NSG 2050 S/N: 200124-031AR Nov.,2004 2 No.3 Shielded Room N/A Note: All equipment upon which need to be calibrated are with calibration period of 1 year. 13.2. Test Setup Page: 72 of 82
13.3. Limits Item Environmental Phenomena Units Test Specification Performance Criteria Input AC Power Ports Voltage Dips Voltage Interruptions >95 0.5 30 25 > 95 250 % Reduction Period % Reduction Periods % Reduction Periods B C C 13.4. Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The power cord shall be used the shortest power cord as specified by the manufacturer. For Voltage Dips/ Interruptions test: The selection of test voltage is based on the rated power range. If the operation range is large than 20% of lower power range, both end of specified voltage shall be tested. Otherwise, the typical voltage specification is selected as test voltage. The EUT is connected to the power mains through a coupling device that directly couples to the Voltage Dips and Interruption Generator. The EUT shall be tested for 30% voltage dip of supplied voltage and duration 10ms, for 60% voltage dip of supplied voltage and duration 100ms with a sequence of three voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied voltage and duration 5000ms with a sequence of three voltage interruptions with intervals of 10 seconds. Voltage phase shifting are shall occur at 0 O, 45 O, 90 O, 135 O, 180 O, 225 O, 270 O, 315 O of the voltage. 13.5. Uncertainty The measurement uncertainty is defined as ± 2.03 % 13.6. Test Specification According to IEC 61000-4-11 Second Edition: 2004-03 Page: 73 of 82
13.7. Test Result Product MEGA BOOK Test Mode Mode 1: Date of Test 2005/10/19 Test Site No.3 Shielded Room Test Condition Voltage Dips and Interruption Reduction(%) Voltage Dips and Interruption Measurement Test Range Angle Test Duration (Periods) Required Performance Criteria Performance Criteria Complied To Test Result 30(161V) 0 25 C A PASS 30(161V) 45 25 C A PASS 30(161V) 90 25 C A PASS 30(161V) 135 25 C A PASS 30(161V) 180 25 C A PASS 30(161V) 225 25 C A PASS 30(161V) 270 25 C A PASS 30(161V) 315 25 C A PASS >95(0V) 0 0.5 B A PASS >95(0V) 45 0.5 B A PASS >95(0V) 90 0.5 B A PASS >95(0V) 135 0.5 B A PASS >95(0V) 180 0.5 B A PASS >95(0V) 225 0.5 B A PASS >95(0V) 270 0.5 B A PASS >95(0V) 315 0.5 B A PASS >95(0V) 0 250 C A PASS >95(0V) 45 250 C A PASS >95(0V) 90 250 C A PASS >95(0V) 135 250 C A PASS >95(0V) 180 250 C A PASS >95(0V) 225 250 C A PASS >95(0V) 270 250 C A PASS >95(0V) 315 250 C A PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 74 of 82
13.8. Test Photo Test Mode : Mode 1: Description: Voltage Dips Test Setup -Mode 1 Page: 75 of 82
Attachement EUT Photograph (1) EUT Photo (2) EUT Photo Page: 76 of 82
(3) EUT Photo (4) EUT Photo Page: 77 of 82
(5) EUT Photo (6) EUT Photo Page: 78 of 82
(7) EUT Photo (8) EUT Photo Page: 79 of 82
(9) EUT Photo (10) EUT Photo Page: 80 of 82
(11) EUT Photo Page: 81 of 82