NPA100-D GHz GaN 20W Power Amplifier. Product Description: Key Features:

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Product Description: The Nxbeam is a Ku-band high power GaN MMIC fabricated in 0.2um GaN HEMT on SiC. This part is ideally suited for satellite communications, point-to-point radios, and radar applications. The MMIC operates from 12.5 to 15.5 GHz and provides 20 W of saturated output power at >25% PAE in an ultra-small footprint of 9.2 mm 2 (4.6 mm x 2.0 mm). The comes in die form with RF input and output matched to 50 Ω with DC blocking capacitors for easy system integration. The HEMT devices are fully passivated for reliable operation. Band pad and backside metallization are Au-based for compatibility with eutectic die attachment methods. Key Features: Frequency: 12.5 15.5 GHz Linear Gain: 27 db Psat: 20 W PAE: >25% Chip Dimensions: 4.6 x 2.0 x 0.1 mm Electrical Specifications Test Condition: Vd = 28V, Idq = 2A, CW Operation, Temp. = 25 C Parameter Min Typical Max Unit Frequency 12.5 15.5 GHz Gain (small signal) 27 db Input Return Loss > 11 db Output Return Loss > 9 db Output Power (Pin = 21 dbm) 43 dbm Power Gain (Pin = 21 dbm) 22 db Power Added Efficiency (Pin = 21 dbm) 25 % Absolute Maximum Ratings (Temp. = 25 C) Parameter Min Max Unit Drain Voltage (Vd1, Vd2, Vd3) 28 V Drain Current (Id1) 300 ma Drain Current (Id2) 1050 ma Drain Current (Id3) 2700 ma Gate Voltage (Vg1, Vg2, Vg3) -5 0 V Input Power (Pin) 26 * dbm Assembly Temperature (30 seconds) 300 C 1 Circuit Block Diagram 2 3 4 5 6 7 8 * estimated value, actual value TBD Recommended Operating Condition Parameter Value Unit Drain Voltage (Vd) 24 or 28 V Drain Current (Idq) 2 A Gate Voltage (Vg) (Typical) -3.5 V 14 13 12 11 10 9 Pin number information detailed under Die Size and Bond Pad Information Page 1 of 7 Phone: 949-656-2883

Small Signal Performance (T=25 C) (pulsed-power on-wafer) CW Performance (in fixture) Page 2 of 7

CW Performance (in fixture) Page 3 of 7

CW Performance (in fixture) Linearity (in fixture) Tone Spacing: 1 MHz Tone Spacing: 1 MHz Tone Spacing: 1 MHz Page 4 of 7

1000 um 48.50 2000 um ± 25um Die Size and Bond Pad Information Chip Size = 4600 ±25 um x 2000 ±25 um Chip Thickness = 100 um Chip Backside metal is ground RF Input/Output Pad Dimensions = 134 um x 208 um DC Pad Dimensions: Vg1, Vg2, Vg3 = 100 um x 100 um Vd1 = 270 um x 100 um Vd2 = 310 um x 100 um Vd3 = 550 um x 100 um Pad Num. Function 1 RF in 2, 14 Vg1 3, 13 Vd1 4, 12 Vg2 5, 11 Vd2 6, 10 Vg3 7, 9 Vd3 8 RF out 3940 um 2494 um 1249 um 785 um 470 um 241 um 2 3 4 5 6 7 1 8 14 13 12 11 10 9 241 um 470 um 785 um 1249 um 2494 um 3940 um 4600 um ± 25um Page 5 of 7

Suggested Bonding Arraignment The following diagram is a suggested bonding arraignment but other arraignments are possible. It is also possible to tie all gate voltages together as well as all drain voltages together. Vg1 Vd1 Vg2 Vd2 Vg3 Vd3 2 3 4 5 6 7 RF in 1 8 RF out 14 13 12 11 10 9 Gate Connection 0.1 µf, 15 V Shunt Capacitor 0.01 µf, 15 V Shunt Capacitor 10 Ω, 30 V Series Resistor 100 pf, 15 V Shunt Capacitor Drain Connection 0.1 µf, 50 V Shunt Capacitor 0.01 µf, 50 V Shunt Capacitor 100 pf, 50 V Shunt Capacitor Assembly Process This product has gold backside metallization and can be mounted using either a conductive epoxy or AuSn attachment. Nxbeam recommends the use of AuSn attachment due to the high power level of this product to ensure good thermal conductivity. Maximum recommended temperature during die attachment is 320 C for 30 seconds. This product contains metal air bridges so caution should be taken when handling the die to avoid damage. Page 6 of 7

The can be biased from either top or bottom of the chip. Bias-down Procedure: 1.) Turn off RF signal. 2.) Gradually decrease the gate voltage down to -5 V. 3.) Gradually decrease the drain voltage down to 0 V. 4.) Gradually increase gate voltage to 0 V. 5.) Turn off supply voltages Bias Information Bias-up Procedure: 1.) It is recommended that voltage and current limits are set on the voltage supply s prior to biasing the product. 2.) Ensure power supplies are properly grounded to the product test fixture. 3.) Apply negative gate voltage (-5 V) to ensure all devices are pinched off. 4.) Gradually increase the drain bias voltage to the desired bias level but not to exceed the maximum voltage of 28 V. 5.) Gradually increase the gate voltage while monitoring the drain current until the desired drain current is achieved. 6.) Apply RF signal. ESD Sensitive Product Important Information The data contained in this document is a sampling of preproduction data. Nxbeam Inc. reserves the right to update and change without notice the characteristic data and other specifications as they apply to this document. Customers should obtain and verify the most recent product information before placing orders. Nxbeam Inc. assumes no responsibility or liability whatsoever for the use of the information contained herein. The product represented by this datasheet is subject to U.S. Export Law as contained in ITAR or the EAR regulations. Page 7 of 7