Dual N-Channel 30 V (D-S) MOSFET

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Transcription:

SPICE Device Model Si596DU Dual N-Channel 3 V (D-S) MOSFET DESCRIPTION The attached SPICE model describes the typical electrical characteristics of the n-channel vertical DMOS. The subcircuit model is extracted and optimized over the - 55 C to + 125 C temperature ranges under the pulsed V to 1 V gate drive. The saturated output impedance is best fit at the gate bias near the threshold voltage. A novel gate-to-drain feedback capacitance network is used to model the gate charge characteristics while avoiding convergence difficulties of the switched C gd model. All model parameter values are optimized to provide a best fit to the measured electrical data and are not intended as an exact physical interpretation of the device. CHARACTERISTICS N-Channel Vertical DMOS Macro Model (Subcircuit Model) Level 3 MOS Apply for both Linear and Switching Application Accurate over the - 55 C to + 125 C Temperature Range Model the Gate Charge, Transient, and Diode Reverse Recovery Characteristics SUBCIRCUIT MODEL SCHEMATIC D C GD G Gy + Gx M 2 R 1 3 DBD R G ETCV C GS M 1 S This document is intended as a SPICE modeling guideline and does not constitute a commercial product datasheet. Designers should refer to the appropriate datasheet of the same number for guaranteed specification limits. Document Number: 6589 S1-475-Rev. A, 1-Mar-1 1

SPICE Device Model Si596DU SPECIFICATIONS, unless otherwise noted PARAMETER SYMBOL TEST CONDITIONS SIMULATED DATA MEASURED DATA UNIT Static Gate-Source Threshold Voltage V GS(th) V DS = V GS, I D = 25 μa 1.4 - V Drain-Source On-State Resistance a R DS(on) V GS = 1 V, I D = 4.8 A.25.25 V GS = 4.5 V, I D = 4.1 A.34.33 Ω Forward Transconductance a g fs V DS = 15 V, I D = 4.8 A 14 14 S Body Diode Voltage V SD I S = 6 A.86.8 V Dynamic b Input Capacitance C iss 278 3 Output Capacitance C oss V DS = 15 V, V GS = V, f = 1 MHz 72 72 pf Reverse Transfer Capacitance C rss 34 34 Total Gate Charge s a. Pulse test; pulse width 3 μs, duty cycle 2 %. b. Guaranteed by design, not subject to production testing. Q g V DS = 15 V, V GS = 1 V, I D = 6.6 A 5.5 5.7 2.7 2.9 Gate-Source Charge Q gs V DS = 15 V, V GS = 4.5 V, I D = 6.6 A 1 1 Gate-Drain Charge Q gd 1.1 1.1 nc Document Number: 6589 2 S1-475-Rev. A, 1-Mar-1

SPICE Device Model Si596DU COMPARISON OF MODEL WITH MEASURED DATA, unless otherwise noted 25 1 2 V GS = 1 V, 7 V, 6 V, 5 V, 4 V 8 15 1 5 V GS = 3 V 6 4 2 T J = 125 C..5 1. 1.5 2. 2.5 3. V DS - Drain-to-Source Voltage (V) T J = - 55 C..5 1. 1.5 2. 2.5 3..6 4.5 35 R DS(on) - On-Resistance (Ω).4.3.2.1 V GS = 4.5 V V GS = 1 V C - Capacitance (pf) 3 25 2 15 1 5 c rss c iss c oss. 5 1 15 2 25 5 1 15 2 25 3 V DS - Drain-to-Source Voltage (V) 1 1 I D = 6.6 A 8 6 4 2 V DS = 15 V V DS = 24 V I S - Source Current (A) 1 1 T J = 15 C 1 2 3 4 5 6 Q g - Total Gate Charge (nc).1.3.6.9 1.2 V SD - Source-to-Drain Voltage (V) Dots and squares represent measured data. Document Number: 6589 S1-475-Rev. A, 1-Mar-1 3

SPICE Device Model Si596DU COMPARISON OF MODEL WITH MEASURED DATA, unless otherwise noted 1.8.8 I D = 4.8 A I D = 4.8 A R DS(on) - On-Resistance Normalized 1.5 1.2.9 V GS = 1 V, 4.5 V R DS(on) - On-Resistance (Ω).6.4.2 T J = 125 C.6-5 -25 25 5 75 1 125 15 T J - Junction Temperature ( C). 2 4 6 8 1 Dots and squares represent measured data. Document Number: 6589 4 S1-475-Rev. A, 1-Mar-1

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