74F827 74F Bit Buffers/Line Drivers

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Transcription:

10-Bit Buffers/Line Drivers General Description The and 10-bit bus buffers provide high performance bus interface buffering for wide data/address paths or buses carrying parity. The 10-bit buffers have NOR output enables for maximum control flexibility. The is an inverting version of the. Ordering Code: Features 3-STATE output is inverting Note 1: Devices also available in Tape and Reel. Specify by appending the suffix letter X to the ordering code. April 1988 Revised February 2004 Order Number Package Number Package Description SC M24B 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide (Note 1) SPC N24C 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide SC M24B 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide SPC (Note 1) N24C 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide 10-Bit Buffers/Line Drivers Connection Diagrams 2004 Fairchild Semiconductor Corporation DS009598 www.fairchildsemi.com

Logic Symbols IEEE/IEC IEEE/IEC Unit Loading/Fan Out U.L. Input I IH /I IL Pin Names Description HIGH/LOW Output I OH /I OL OE 1, OE 2 Output Enable Input 1.0/1.0 20 µa/ 0.6 ma D 0 D 7 Data Inputs 1.0/1.0 20 µa/ 0.6 ma O 0 O 7 Data Outputs, 3-STATE 600/106.6 (80) 12 ma/64 ma (48 ma) Functional Description The and are line drivers designed to be employed as memory address drivers, clock drivers and bus-oriented tramitters/receivers which provide improved PC board deity. The devices have 3-STATE outputs controlled by the Output Enable (OE) pi. The outputs can sink 64 ma and source 15 ma. Input clamp diodes limit high-speed termination effects. Function Table Inputs Outputs OE D n O n Function L H H L Traparent L L L H Traparent H X Z Z High Z H = HIGH Voltage level L = LOW Voltage Level Z = High Impedance X = Immaterial www.fairchildsemi.com 2

Logic Diagrams Please note that these diagrams are provided only for the understanding of logic operatio and should not be used to estimate propagation delays. 3 www.fairchildsemi.com

Absolute Maximum Ratings(Note 2) Storage Temperature 65 C to +150 C Ambient Temperature under Bias 55 C to +125 C Junction Temperature under Bias 55 C to +150 C V CC Pin Potential to Ground Pin 0.5V to +7.0V Input Voltage (Note 3) 0.5V to +7.0V Input Current (Note 3) 30 ma to +5.0 ma Voltage Applied to Output in HIGH State (with V CC = 0V) Standard Output 0.5V to V CC 3-STATE Output 0.5V to +5.5V Current Applied to Output in LOW State (Max) twice the rated I OL (ma) Recommended Operating Conditio Free Air Ambient Temperature Supply Voltage 0 C to +70 C +4.5V to +5.5V Note 2: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditio is not implied. Note 3: Either voltage limit or current limit is sufficient to protect inputs. DC Electrical Characteristics Symbol Parameter Min Typ Max Units V CC Conditio V IH Input HIGH Voltage 2.0 V Recognized as a HIGH Signal V IL Input LOW Voltage 0.8 V Recognized as a LOW Signal V CD Input Clamp Diode Voltage 1.2 V Min I IN = 18 ma V OH Output HIGH 10% V CC 2.4 I OH = 3 ma Voltage 10% V CC 2.0 V Min I OH = 15 ma 5% V CC 2.7 I OH = 3 ma V OL Output LOW Voltage 10% V CC 0.55 V Min I OL = 64 ma I IH Input HIGH Current 5.0 µa Max V IN = 2.7V I BVI Input HIGH Current Breakdown Test 7.0 µa Max V IN = 7.0V I CEX Output HIGH Leakage Current 50 µa Max V OUT = V CC V ID Input Leakage I ID = 1.9 µa 4.75 V 0.0 Test All Other Pi Grounded I OD Output Leakage V IOD = 150 mv 3.75 µa 0.0 Circuit Current All Other Pi Grounded I IL Input LOW Current 0.6 ma Max V IN = 0.5V I OZH Output Leakage Current 50 µa Max V OUT = 2.7V I OZL Output Leakage Current 50 µa Max V OUT = 0.5V I OS Output Short-Circuit Current 100 225 ma Max V OUT = 0V I ZZ Bus Drainage Test 500 µa 0.0V V OUT = 5.25V I CCH Power Supply Current () 30 45 ma Max V O = HIGH I CCL Power Supply Current () 60 90 ma Max V O = LOW I CCZ Power Supply Current () 40 60 ma Max V O = HIGH Z I CCH Power Supply Current () 14 20 ma Max V O = HIGH I CCL Power Supply Current () 56 85 ma Max V O = LOW I CCZ Power Supply Current () 35 50 ma Max V O = HIGH Z www.fairchildsemi.com 4

AC Electrical Characteristics T A = +25 C T A = 55 C to +125 C T A = 0 C to +70 C V CC = +5.0V V CC = +5.0V V CC = +5.0V Symbol Parameter C L = 50 pf C L = 50 pf C L = 50 pf Min Typ Max Min Max Min Max t PLH Propagation Delay 1.0 3.0 5.5 1.0 7.5 1.0 6.5 t PHL Data to Output () 1.5 3.3 5.5 1.5 7.0 1.5 6.0 t PLH Propagation Delay 1.0 3.0 5.0 1.0 5.5 t PHL Data to Output () 1.0 2.0 4.0 1.0 4.0 t PZH Output Enable Time 3.0 5.7 9.0 2.5 10.0 2.5 9.5 t PZL OE to O n 3.5 6.8 11.5 3.0 12.5 3.0 12.0 t PHZ Output Disable Time 1.5 3.3 8.0 1.5 9.0 1.5 8.5 t PLZ OE to O n 1.0 3.5 8.0 1.0 9.0 1.0 8.5 Units 5 www.fairchildsemi.com

Physical Dimeio inches (millimeters) unless otherwise noted 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide Package Number M24B www.fairchildsemi.com 6

Physical Dimeio inches (millimeters) unless otherwise noted (Continued) 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide Package Number N24C 10-Bit Buffers/Line Drivers Fairchild does not assume any respoibility for use of any circuitry described, no circuit patent licees are implied and Fairchild reserves the right at any time without notice to change said circuitry and specificatio. LIFE SUPPORT POLICY FAIRCHILD S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with itructio for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com 7 www.fairchildsemi.com