Format of S-parameter entries in CMC database
|
|
- Sharyl Ryan
- 5 years ago
- Views:
Transcription
1 Format of S-parameter entries in CMC database M. Zeier, METAS CCEM GT-RF Meeting, BIPM 1
2 S-parameters Scattering parameters are fundamental quantities in RF & MW metrology. They are measured with Vector Network Analyzers (VNA) They represent reflection and transmission properties of a DUT The quantity is complex-valued CCEM GT-RF Meeting, BIPM 2
3 Representation Polar coordinates (magnitude and phase) or cartesian coordinates (real and imaginary) imag A =B/A B real CCEM GT-RF Meeting, BIPM 3
4 Polar coordinates Magnitude and phase are related to physical phenomena and therefore more intuitive but The phase is cyclic and magnitude is >0 This leads to computational problems when doing statistical analysis or uncertainty propagation (non-linearities!) CCEM GT-RF Meeting, BIPM 4
5 Cartesian coordinates Real and imaginary components are better suited for calculations but less intuitive Recommendation: - Use cartesian coordinates for any type of calculation and as exchange data format - Convert to polar coordinates for interpretation CCEM GT-RF Meeting, BIPM 5
6 S-parameter CMCs Mag/Phase: 10 NMIs Re/Im: 8 NMIs Mixed/Undefined: 4 NMIs Due to the above mentioned arguments Re/Im entries were promoted over the last years But METAS changed back from Re/Im to Mag/Phase in last CMC round CCEM GT-RF Meeting, BIPM 6
7 CMCs declare best uncertainties are reviewed and approved Certificate with BIPM/MRA logo should not quote uncertainties that are smaller than CMC entries. In case of secondary parameter (independant variable: e.g. frequency): CMC entries quote the smallest uncertainty for a range of the independant variable CCEM GT-RF Meeting, BIPM 7
8 Example of CMC entry S 11 : magnitude of reflection coefficient abs(sxx) 9 khz to 3 GHz 3 GHz to 18 GHz 18 GHz to 33 GHz 33 GHz to 40 GHz 40 GHz to 50 GHz 50 GHz to 67 GHz BNC 50 Ohm to BNC 50 Ohm to BNC 50 Ohm to BNC 50 Ohm to BNC 50 Ohm to BNC 50 Ohm to BNC 50 Ohm to BNC 50 Ohm to BNC 50 Ohm to BNC 50 Ohm to BNC 50 Ohm to Type-N 75 Ohm to Type-N 75 Ohm to Type-N 75 Ohm to Type-N 75 Ohm to Type-N 75 Ohm to Type-N 75 Ohm to Type-N 75 Ohm to Type-N 75 Ohm to Type-N 75 Ohm to Type-N 75 Ohm to Type-N 75 Ohm to Type-N 50 Ohm to Type-N 50 Ohm to Type-N 50 Ohm to Type-N 50 Ohm to Type-N 50 Ohm to Type-N 50 Ohm to to Type-N 50 Ohm to to Type-N 50 Ohm to Type-N 50 Ohm to to Type-N 50 Ohm to to Type-N 50 Ohm to to PC-7 mm PC-7 mm PC-7 mm PC-7 mm to PC-7 mm to PC-7 mm to PC-7 mm to to PC-7 mm to to PC-7 mm to to PC-7 mm to to PC-7 mm to to PC-3.5 mm to to to PC-3.5 mm to to to PC-3.5 mm to to to PC-3.5 mm to to PC-3.5 mm to to PC-3.5 mm to to to PC-3.5 mm to to to PC-3.5 mm to to PC-3.5 mm to to to PC-3.5 mm to to to PC-3.5 mm to to to PC-2.92 mm to to PC-2.92 mm to to PC-2.92 mm to to to PC-2.92 mm to to to to PC-2.92 mm to to to to PC-2.92 mm to to to to PC-2.92 mm to to to to PC-2.92 mm to to to to PC-2.92 mm to to to to PC-2.92 mm to to to to PC-2.92 mm to to to to PC-2.4 mm to to to to PC-2.4 mm to to to to PC-2.4 mm to to to to PC-2.4 mm to to to to to PC-2.4 mm to to to to to PC-2.4 mm to to to to to PC-2.4 mm to to to to PC-2.4 mm to to to to to PC-2.4 mm to to to to to PC-2.4 mm to to to to to PC-2.4 mm to to to to to PC-1.85 mm to to to to PC-1.85 mm to to to to to PC-1.85 mm to to to to PC-1.85 mm to to to to to PC-1.85 mm to to to to to to PC-1.85 mm to to to to to to PC-1.85 mm to to to to to PC-1.85 mm to to to to to PC-1.85 mm to to to to to to PC-1.85 mm to to to to to PC-1.85 mm to to to to to to S-parameter uncertainty matrix representation within EURAMET: 3 independent variables: - Connector family - Value of S 11 - Frequency CCEM GT-RF Meeting, BIPM 8
9 Example of CMC entry (part of) S 11 : magnitude of reflection coefficient Connector family 1 Connector family 2 Magnitude of S 11 Frequency abs(sxx) 9 khz to 3 GHz 3 GHz to 18 GHz BNC 50 Ohm to BNC 50 Ohm to BNC 50 Ohm to BNC 50 Ohm to BNC 50 Ohm to BNC 50 Ohm to BNC 50 Ohm to BNC 50 Ohm to BNC 50 Ohm to BNC 50 Ohm to BNC 50 Ohm to Type-N 75 Ohm to Type-N 75 Ohm to Type-N 75 Ohm to Type-N 75 Ohm to Type-N 75 Ohm to Type-N 75 Ohm to Type-N 75 Ohm to Type-N 75 Ohm to Type-N 75 Ohm to Type-N 75 Ohm to Type-N 75 Ohm to Type-N 50 Ohm to Type-N 50 Ohm to Type-N 50 Ohm to CCEM GT-RF Meeting, BIPM 9
10 S-parameter uncertainties depend on the value of the measurand in the complex plane! Due to - Uncertainty in characterisation of standards - Proximity to standards used for VNA calibration - Other influences (cables, VNA etc) CCEM GT-RF Meeting, BIPM 10
11 S-parameter uncertainties Im i Rigorous propagation of uncertainties through VNA measurement model -1 1 Re Re/Im uncertainties vary strongly. Quoting smallest uncertainty is not very informative. Another dimension in the CMC uncertainty matrix would be needed. -i Dependence on phase relatively weak. Mag/Phase uncertainties in the current CMC matrix structure more informative CCEM GT-RF Meeting, BIPM 11
12 Conclusion The structure of the current CMC uncertainty matrix for S-parameters can t be extended by another dimension. This would just create confusion. Mag/phase representation is more informative than Re/Im for S-parameter CMC entries CCEM GT-RF Meeting, BIPM 12
Schedule of Accreditation issued by United Kingdom Accreditation Service 2 Pine Trees, Chertsey Lane, Staines-upon-Thames, TW18 3HR, UK
2 Pine Trees, Chertsey Lane, Staines-upon-Thames, TW18 3HR, UK Babcock International Group PC1409, Devonport Royal Dockyard Plymouth Devon PL1 4SG Contact: Mr C Burrow Tel: +44 (0)1752 324739 Fax: +44
More informationTwo different ways in evaluating the uncertainty of S-parameter measurements
th IMEKO TC International Symposium and 8th International Workshop on ADC Modelling and Testing Research on Electric and Electronic Measurement for the Economic Upturn Benevento, Italy, September 57, Two
More informationA New Noise Parameter Measurement Method Results in More than 100x Speed Improvement and Enhanced Measurement Accuracy
MAURY MICROWAVE CORPORATION March 2013 A New Noise Parameter Measurement Method Results in More than 100x Speed Improvement and Enhanced Measurement Accuracy Gary Simpson 1, David Ballo 2, Joel Dunsmore
More informationSchedule of Accreditation issued by United Kingdom Accreditation Service 2 Pine Trees, Chertsey Lane, Staines-upon-Thames, TW18 3HR, UK
2 Pine Trees, Chertsey Lane, Staines-upon-Thames, TW18 3HR, UK Unit 8 New Vision Business Park Glascoed Road St Asaph LL17 0LP Contact: Mr Alan Horner Tel: +44 (0)1492 550 398 E-Mail: alan.horner@mcs-testequipment.com
More informationSchedule of Accreditation issued by United Kingdom Accreditation Service 2 Pine Trees, Chertsey Lane, Staines-upon-Thames, TW18 3HR, UK
DC RESISTANCE Unit 4 Riverside Business Centre Walnut Tree Close Guildford Surrey GU1 4UG Contact: Ian Norman Tel: +44 (0)1483 302700 Fax: +44 (0)1483 300562 E-Mail: inorman@caltest.co.uk Website: www.caltest.co.uk
More informationFast and Accurate Simultaneous Characterization of Signal Generator Source Match and Absolute Power Using X-Parameters.
Fast and Accurate Simultaneous Characterization of Signal Generator Source Match and Absolute Power Using X-Parameters. April 15, 2015 Istanbul, Turkey R&D Principal Engineer, Component Test Division Keysight
More informationTEST EQUIPMENT PLUS. Signal Hound USB-SA44B / USB-TG44A. Application Note 1: The Smith Chart. Rev. 0
Rev. 0 TEST EQUIPMENT PLUS Signal Hound USB-SA44B / USB-TG44A Application Note 1: The Smith Chart USING THE SMITH CHART Chapter 1 1 Using the Smith Chart Making Single-Frequency Vector Impedance Measurements
More informationRadio ETI031 Laboratory Experiments 2: VECTOR NETWORK ANALYSER, ANTENNA and RECEIVER MEASUREMENTS
Lund University Electrical and Information Technology GJ 2007-09-30 Radio ETI031 Laboratory Experiments 2: VECTOR NETWORK ANALYSER, ANTENNA and RECEIVER MEASUREMENTS Göran Jönsson 2007 Objectives: Part
More informationAFRIMETS.EM.RF-S1. Attenuation and reflection measurements for coaxials at 100 MHz, 1 GHz and 10 GHz Type N Connector
AFRIMETS.EM.RF-S1 Attenuation and reflection measurements for coaxials at 100 MHz, 1 GHz and 10 GHz Type N Connector Main author Linoh Magagula 1 Co-authors Abdelrahman Sallam 3, Abdelkarim MALLAT 2, Nadia
More informationSchedule of Accreditation issued by United Kingdom Accreditation Service 2 Pine Trees, Chertsey Lane, Staines-upon-Thames, TW18 3HR, UK
2 Pine Trees, Chertsey Lane, Staines-upon-Thames, TW18 3HR, UK Avionic and Metrology Centre Unit G1/2 Treforest Industrial Estate Pontypridd CF37 5YL Contact: Mr P Ashurst Tel: +44 (0)1443 849970 Fax:
More informationImpedance 50 (75 connectors via adapters)
VECTOR NETWORK ANALYZER PLANAR 304/1 DATA SHEET Frequency range: 300 khz to 3.2 GHz Measured parameters: S11, S21, S12, S22 Dynamic range of transmission measurement magnitude: 135 db Measurement time
More informationThe 2-Port Shunt-Through Measurement and the Inherent Ground Loop
The Measurement and the Inherent Ground Loop The 2-port shunt-through measurement is the gold standard for measuring milliohm impedances while supporting measurement at very high frequencies (GHz). These
More informationVector Network Analyzers. Paul Coverdale VE3ICV
Paul Coverdale VE3ICV What is a vector network analyzer? What is a vector? A vector is a quantity having magnitude and direction A vector can be described in rectangular (X,Y) or polar ( Z θ) notation
More informationMEASUREMENT OF LARGE SIGNAL DEVICE INPUT IMPEDANCE DURING LOAD PULL
Model M956D CORPORAION MEASUREMEN OF LARGE SIGNAL DEVICE INPU IMPEDANCE DURING LOAD PULL Abstract Knowledge of device input impedance as a function of power level and load matching is useful to fully understand
More informationSchedule of Accreditation issued by United Kingdom Accreditation Service 2 Pine Trees, Chertsey Lane, Staines-upon-Thames, TW18 3HR, UK
code Location code Customers Sites 2 Pine Trees, Chertsey Lane, Staines-upon-Thames, TW18 3HR, UK Calibration Centre Bolkiah Garrison BB3510 Negara Brunei Darussalam Contact: Mr Yussof Taha Tel: +673-2-386475
More informationCircuit Characterization with the Agilent 8714 VNA
Circuit Characterization with the Agilent 8714 VNA By: Larry Dunleavy Wireless and Microwave Instruments University of South Florida Objectives 1) To examine the concepts of reflection, phase shift, attenuation,
More informationSignal Integrity Testing with a Vector Network Analyzer. Neil Jarvis Applications Engineer
Signal Integrity Testing with a Vector Network Analyzer Neil Jarvis Applications Engineer 1 Agenda RF Connectors A significant factor in repeatability and accuracy Selecting the best of several types for
More informationSchedule of Accreditation issued by United Kingdom Accreditation Service 2 Pine Trees, Chertsey Lane, Staines-upon-Thames, TW18 3HR, UK
Unit 3, Watt House Innovation Centre Pensnett Estate Kingswinford West Midlands DY6 7YD Contact: Mr A P Walker Tel: +44 (0)1384 401132 Fax: +44 (0)1384 400754 E-Mail: mail@quasartronics.com Website: www.quasartronics.com
More informationPLANAR R54. Vector Reflectometer KEY FEATURES
PLANAR R54 Vector Reflectometer KEY FEATURES Frequency range: 85 MHz 5.4 GHz Reflection coefficient magnitude and phase, cable loss, DTF Transmission coefficient magnitude when using two reflectometers
More informationCompact Series: S5065 & S5085 Vector Network Analyzers KEY FEATURES
Compact Series: S5065 & S5085 Vector Network Analyzers KEY FEATURES Frequency range: 9 khz - 6.5 or 8.5 GHz Measured parameters: S11, S12, S21, S22 Wide output power adjustment range: -50 dbm to +5 dbm
More informationSchedule of Accreditation issued by United Kingdom Accreditation Service 2 Pine Trees, Chertsey Lane, Staines-upon-Thames, TW18 3HR, UK
CET Structures Ltd. trading as CET Calibration M1 Commerce Park Markham Lane Duckmanton Chesterfield S44 5HS Contact: Mr Chris Locke Tel: +44 (0)1246 828318 Fax: +44 (0)1246 828319 E-Mail: chris.locke@cetcalibration.com
More informationSchedule of Accreditation issued by United Kingdom Accreditation Service 2 Pine Trees, Chertsey Lane, Staines-upon-Thames, TW18 3HR, UK
1 Wilson Street Contact: Mr Ibrahim Ibrahim Thornaby Tel: +44 (0) 1642 626148 Stockton-On-Tees Fax: +44 (0) 870 143 1869 TS17 7AR E-Mail: ibrahim@calibrate.co.uk United Kingdom Website: www.calibrate.co.uk
More informationPreliminary Users Manual for the Self Contained Return Loss and Cable Fault Test Set with Amplified Wideband Noise Source Copyright 2001 Bryan K.
Preliminary Users Manual for the Self Contained Return Loss and Cable Fault Test Set with Amplified Wideband Noise Source Copyright 2001 Bryan K. Blackburn Self Contained Test Set Test Port Regulated 12
More informationCompact VNA - TR7530. Extended Specifications EXTEND YOUR REACH TM
Compact VNA - TR7530 TM Extended Specifications Frequency range: 20 khz - 3 GHz Wide output power adjustment range: -50 dbm to +5 dbm Dynamic range: 123 db (10 Hz IF bandwidth) typ. Measurement time per
More informationSchedule of Accreditation issued by United Kingdom Accreditation Service 2 Pine Trees, Chertsey Lane, Staines-upon-Thames, TW18 3HR, UK
2 Pine Trees, Chertsey Lane, Staines-upon-Thames, TW18 3HR, UK Measurement House Contact: Mr David Gray Kingsway Tel: +44 (0)1792 588722 Fforestfach Fax: +44 (0)1792 582624 Swansea E-Mail: mail@haven.co.uk
More informationSCOPE OF ACCREDITATION TO ISO/IEC 17025:2005 ANSI/NCSL Z & ANSI/NCSLI Z
SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005 ANSI/NCSL Z540-1-1994 & ANSI/NCSLI Z540.3-2006 ANRITSU COMPANY MORGAN HILL CALIBRATION SERVICES 490 Jarvis Drive Morgan Hill, CA 95037 Yeou-Song (Brian) Lee
More information1000BASE-T1 EMC Test Specification for Common Mode Chokes
IEEE 1000BASE-T1 EMC Test Specification for Common Mode Chokes Version 1.0 Author & Company Dr. Bernd Körber, FTZ Zwickau Title 1000BASE-T1 EMC Test Specification for Common Mode Chokes Version 1.0 Date
More informationVector Network Analyzers T - Series
Datasheet Vector Network Analyzers T - Series Wide dynamic range 130 db typ. Low noise level < -120 dbm Low trace noise 1 mdb rms High measurement speed 125ms/point High effective directivity > 45 db Remote
More informationINAB Policy Statement on Scope Format for Calibration Laboratories PS27 1. INTRODUCTION
INAB Policy Statement on Scope Format for Calibration Laboratories PS27 1. INTRODUCTION 1.1. The definitive statement of the accreditation status of a calibration laboratory is the accreditation certificate
More informationSchedule of Accreditation issued by United Kingdom Accreditation Service 2 Pine Trees, Chertsey Lane, Staines-upon-Thames, TW18 3HR, UK
72 Manchester Road Kearsley Bolton BL4 8NZ Contact: Mr A Leonard Tel: +44 (0) 1204 571499 Fax: +44 (0) 1204 571734 E-Mail: enquiries@airflowmeasurements.com Website: www.airflowmeasurements.com AIR VELOCITY
More informationBureau International des Poids et Mesures. International Recognition of NMI Calibration and Measurement Capabilities: The CIPM MRA
Bureau International des Poids et Mesures International Recognition of NMI Calibration and Measurement Capabilities: The CIPM MRA Prof. Michael Kühne International School of Physics Enrico Fermi Metrology
More informationCompact VNA - TR1300/1
Compact VNA - TR1300/1 TM Extended Specifications Frequency range: 300 khz - 1.3 GHz Wide output power adjustment range: -55 dbm to +3 dbm Dynamic range: 135 db (10 Hz IF bandwidth) typ. Measurement time
More informationPLANAR S5048 and TR5048
PLANAR S5048 and TR5048 Vector Network Analyzers KEY FEATURES Frequency range: 20 khz 4.8 GHz COM/DCOM compatible for LabView Measured parameters: and automation programming S11, S12, S21, S22 (S5048)
More informationFINAL REPORT. CCEM.RF-K4.CL COMPARISON RF-Voltage measurements up to 1 GHz * Jan P.M. de Vreede 1 (Completed by James Randa 2 )
FINAL REPORT CCEM.RF-K4.CL COMPARISON RF-Voltage measurements up to 1 GHz * Jan P.M. de Vreede 1 (Completed by James Randa 2 ) 1 Department of Electricity, Radiation and Length Van Swinden Laboratorium
More informationIllustration of Plane Extension for the MSA 10/21/09
Illustration of Plane Extension for the MSA 10/21/09 In VNA Transmission and Reflection modes, the MSA sweep parameters window allows the user to specify a Plane Extension value. That value is intended
More informationCompact Series: S5048 & TR5048 Vector Network Analyzers KEY FEATURES
Compact Series: S5048 & TR5048 Vector Network Analyzers KEY FEATURES Frequency range: 20 khz - 4.8 GHz Measured parameters: S11, S12, S21, S22 (S5048) S11, S21 (TR5048) Wide output power adjustment range:
More informationReflectometer Series:
Reflectometer Series: R54, R60 & R140 Vector Network Analyzers Clarke & Severn Electronics Ph +612 9482 1944 Email sales@clarke.com.au BUY NOW - www.cseonline.com.au KEY FEATURES Patent: US 9,291,657 No
More informationFieldFox Handheld Education Series Part 3: Calibration Techniques for Precise Field Measurements
FieldFox Handheld Education Series Part 3: Calibration Techniques for Precise Field Measurements FieldFox Handheld Education Series Interference Testing Cable and Antenna Measurements Calibration Techniques
More informationScattered thoughts on Scattering Parameters By Joseph L. Cahak Copyright 2013 Sunshine Design Engineering Services
Scattered thoughts on Scattering Parameters By Joseph L. Cahak Copyright 2013 Sunshine Design Engineering Services Scattering parameters or S-parameters (aka Spars) are used by RF and microwave engineers
More informationThis annex is valid from: to Replaces annex dated: Location(s) where activities are performed under accreditation
Location(s) where activities are performed under accreditation Head ffice Vijzelmolenlaan 7 3447 GX oerden The Netherlands Location Abbreviation/ location Vijzelmolenlaan 7 3447 GX oerden The Netherlands
More informationValidation & Analysis of Complex Serial Bus Link Models
Validation & Analysis of Complex Serial Bus Link Models Version 1.0 John Pickerd, Tektronix, Inc John.J.Pickerd@Tek.com 503-627-5122 Kan Tan, Tektronix, Inc Kan.Tan@Tektronix.com 503-627-2049 Abstract
More informationCobalt Series 20 GHz EXTEND YOUR REACH TM
Cobalt Series 20 GHz TM Frequency range: 100 khz - 20 GHz Wide output power range: -60 dbm to +10 dbm Dynamic range: 135 db (10 Hz IF bandwidth) typ. Measurement time per point: 10 µs per point, min typ.
More informationAPMP KEY COMPARISON APMP.EM.RF-K3.F. Bilateral Comparison of horn antenna gain
APMP KEY COMPARISON APMP.EM.RF-K3.F Bilateral Comparison of horn antenna gain Final Report Jin-Seob Kang Korea Research Institute of Standards and Science (KRISS) 67 Gajeong-ro, Yuseong-gu, Daejeon 305-340,
More informationAgilent N9923A FieldFox RF Vector Network Analyzer 2 MHz to 4/6 GHz. Data Sheet
Agilent N9923A FieldFox RF Vector Network Analyzer 2 MHz to 4/6 GHz Data Sheet Table of Contents Definitions... 2 FieldFox RF Vector Network Analyzer... 3 Cable and Antenna Analyzer (Option 305)... External
More informationILAC input to CIPM MRA Review Workshop October 2015
ILAC input to CIPM MRA Review Workshop 13-14 October 2015 BIPM Sevres 13 October 2015 By Erik Oehlenschlaeger ILAC (DANAK) ILAC History ILAC first started as a conference in 1977 (Copenhagen) with the
More informationThis annex is valid from: to Replaces annex dated: Location(s) where activities are performed under accreditation
Normative document: EN IS/IEC 17025:2005 Location(s) where activities are performed under accreditation Head ffice Vijzelmolenlaan 7 3447 GX oerden The Netherlands Location Abbreviation/ location Vijzelmolenlaan
More informationPLANAR 804/1. Vector Network Analyzer
PLANAR 804/1 Vector Network Analyzer Frequency range: 100 khz 8 GHz Measured parameters: S11, S12, S21, S22 Wide output power range: -60 dbm to +10 dbm >145 db dynamic range (1 Hz IF bandwidth) Time domain
More informationPLANAR 814/1. Vector Network Analyzer
PLANAR 814/1 Vector Network Analyzer Frequency range: 100 khz 8 GHz Measured parameters: S11, S12, S21, S22 Wide output power range: -60 dbm to +10 dbm >150 db dynamic range (1 Hz IF bandwidth) Direct
More informationR&S ZVT Vector Network Analyzer Specifications
R&S ZVT Vector Network Analyzer Specifications Test & Measurement Data Sheet 08.00 CONTENTS Definitions... 3 Specifications... 4 Measurement range...4 Measurement speed...5 Measurement accuracy...6 Effective
More informationSchedule of Accreditation issued by United Kingdom Accreditation Service 2 Pine Trees, Chertsey Lane, Staines-upon-Thames, TW18 3HR, UK
2 Pine Trees, Chertsey Lane, Staines-upon-Thames, TW18 3HR, UK Standards & Calibration Laboratory Contact: Mr Martin Matthews Archcliffe Road Tel: +44 (0)1304 502121 Dover Fax: +44 (0)1304 502268 Kent
More informationImproving Amplitude Accuracy with Next-Generation Signal Generators
Improving Amplitude Accuracy with Next-Generation Signal Generators Generate True Performance Signal generators offer precise and highly stable test signals for a variety of components and systems test
More informationSCOPE OF ACCREDITATION TO ISO/IEC 17025:2005 ANSI/NCSL Z & ANSI/NCSLI Z
SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005 ANSI/NCSL Z540-1-1994 & ANSI/NCSLI Z540.3-2006 ANRITSU COMPANY MORGAN HILL CALIBRATION SERVICES 490 Jarvis Drive Morgan Hill, CA 95037 Yeou-Song (Brian) Lee
More informationDifferential Signal and Common Mode Signal in Time Domain
Differential Signal and Common Mode Signal in Time Domain Most of multi-gbps IO technologies use differential signaling, and their typical signal path impedance is ohm differential. Two 5ohm cables, however,
More informationNetwork Analysis Seminar. Cables measurement
Network Analysis Seminar Cables measurement Agenda 1. Device Under Test: Cables & Connectors 2. Instrument for cables testing: Network Analyzer 3. Measurement: Frequency Domain 4. Measurement: Time Domain
More informationCertificate of Calibration No
Federal Department of Justice olice FDJP Federal Office of Metrology METAS Certificate of Calibration No 7-006 Object GPS rcvr type Septentrio PolaRx4TR PRO serial 005 Antenna type Aero AT-675 serial 500
More informationElectronic Calibration (ECal) Modules for Vector Network Analyzers
TECHNICAL OVERVIEW Electronic Calibration (ECal) Modules for Vector Network Analyzers N755xA Series, 2-port Economy ECal Module 8509xC Series, 2-port RF ECal Module N469xD Series, 2-port Microwave ECal
More informationEXPERIMENT EM3 INTRODUCTION TO THE NETWORK ANALYZER
ECE 351 ELECTROMAGNETICS EXPERIMENT EM3 INTRODUCTION TO THE NETWORK ANALYZER OBJECTIVE: The objective to this experiment is to introduce the student to some of the capabilities of a vector network analyzer.
More informationSCOPE OF ACCREDITATION TO ISO 17025:2005 & ANSI/NCSL Z
SCOPE OF ACCREDITATION TO ISO 17025:2005 & ANSI/NCSL Z540-1-1994 ANRITSU COMPANY CANADIAN CALIBRATION SERVICE CENTER 700 Silver Seven Road, Suite 120 Kanata, Ontario K2V1C3 CANADA Yeou-Song (Brian) Lee
More information5 ESSENTIAL HINTS TO IMPROVE Millimeter-wave Network Analysis
5 ESSENTIAL HINTS TO IMPROVE Millimeter-wave Network Analysis Contents 5 Essential Hints to Improve Millimeter-wave Network Analysis Ensure Accurate, Repeatable Results Go to Hint 1 > Calibrate for Better
More informationLecture 19: Proper Microwave Laboratory Practices.
Whites, EE 481/581 Lecture 19 Page 1 of 6 Lecture 19: Proper Microwave Laboratory Practices. Microwave circuit measurements are very different than electrical measurements at lower frequencies. Here are
More informationRF-POWER STANDARD FROM AC-DC THERMAL CONVERTER. L. Brunetti, L. Oberto, M. Sellone
RF-POWER STANDARD FROM AC-DC THERMAL CONVERTER L. Brunetti, L. Oberto, M. Sellone Istituto Nazionale di Ricerca in Metrologia (INRIM) Strada delle Cacce 91, 10135 Torino, Italia Tel: + 39 (0)11 3919323,
More informationNATIONAL UNIVERSITY of SINGAPORE
NATIONAL UNIVERSITY of SINGAPORE Faculty of Engineering Electrical & Computer Engineering Department EE3104 Introduction to RF and Microwave Systems & Circuits Experiment 1 Familiarization on VNA Calibration
More informationEE290C - Spring 2004 Advanced Topics in Circuit Design
EE290C - Spring 2004 Advanced Topics in Circuit Design Lecture #3 Measurements with VNA and TDR Ben Chia Tu-Th 4 5:30pm 531 Cory Agenda Relationships between time domain and frequency domain TDR Time Domain
More informationSimplifying the Art of Terahertz Measurements
Simplifying the Art of Terahertz Measurements Achieving metrology-level accuracy with a manual probe system With significant expansion of emerging THz applications, such as non-invasive spectroscopy, security
More informationFuture challenges in high-frequency electromagnetic metrology (RF to terahertz)
Prof Nick Ridler IEEE Fellow Electromagnetics Science Leader National Physical Laboratory, UK CCEM workshop Future challenges in electrical metrology, BIPM, Paris, 23 March 2017 Focus on three new measurement
More informationInternationally accepted framework for metrology
Internationally accepted framework for metrology Andy Henson BIPM Working Groups The BIPM Bureau International des Poids et Measures the intergovernmental organization through which Member States act together
More informationJoint ILAC CIPM Communication regarding the. Accreditation of Calibration and Measurement Services. of National Metrology Institutes.
Joint ILAC CIPM Communication regarding the Accreditation of Calibration and Measurement Services of National Metrology Institutes 7 March 2012 Authorship This document was prepared by the International
More informationS3602C Vector Network Analyzer Datasheet
S3602C Vector Network Analyzer Datasheet Saluki Technology Inc. The document applies to the vector network analyzers of the following models: S3602C vector network analyzer (10MHz - 43.5GHz). Options of
More informationMicrowave measurements for planar circuits and components: State of the art and future directions. Dr. Uwe Arz PTB
Microwave measurements for planar circuits and components: State of the art and future directions Dr. Uwe Arz PTB Outline Previous work at PTB The EMPIR Initiative EMPIR Project 14IND02 PlanarCal 2 Why
More informationMeasurements with Scattering Parameter By Joseph L. Cahak Copyright 2013 Sunshine Design Engineering Services
Measurements with Scattering Parameter By Joseph L. Cahak Copyright 2013 Sunshine Design Engineering Services Network Analyzer Measurements In many RF and Microwave measurements the S-Parameters are typically
More informationAccredited calibration of field strength meters
Accredited calibration of field strength meters Calibration laboratory accredited in accordance with DIN EN ISO/IEC 17025:2005 by the Deutsche Akkreditierungsstelle (DAkkS) Application oriented calibration
More informationRF Characterization Report
SMA-J-P-H-ST-MT1 Mated with: RF316-01SP1-01BJ1-0305 Description: 50-Ω SMA Board Mount Jack, Mixed Technology Samtec, Inc. 2005 All Rights Reserved Table of Contents Introduction...1 Product Description...1
More information1-Port USB VNA - R60 Extended Specifications
TM 1- USB VNA - R60 Extended Specifications Patent US 9,291,657 - No test cable needed Frequency range: 1 MHz - 6 GHz Measurement time per point: 100 µs min typ. Automation programming in LabView, Python,
More informationTraceability and Modulated-Signal Measurements
Traceability and Modulated-Signal Measurements Kate A. Remley 1, Dylan F. Williams 1, Paul D. Hale 2 and Dominique Schreurs 3 1. NIST Electromagnetics Division 2. NIST Optoelectronics Division 3. K.U.
More informationSCOPE OF ACCREDITATION TO ISO/IEC 17025:2005, ANSI/NCSL Z , & ANSI/NCSL Z
SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005, ANSI/NCSL Z540-1-1994, & ANSI/NCSL Z540.3-2006 AGILENT TECHNOLOGIES SANTA ROSA METROLOGY SERVICES 1400 Fountain Grove Parkway Santa Rosa, CA 95403 Bob Ramirez
More informationA BALUNS AND BEADS REFLECTION BRIDGE 50 KHz to 1.5 GHz Sam Wetterlin 10/21/08
A BALUNS AND BEADS REFLECTION BRIDGE 50 KHz to 1.5 GHz Sam Wetterlin swetterlin@comcast.net 10/21/08 This article presents a reflection bridge useful from 50 KHz to the neighborhood of 1.5GHz. This bridge
More information2-2 Power Meter Calibration Power Meter Calibration 1 (1 mw, 50 ohm)
esearch and evelopment of Calibration Technology - ower eter Calibration --1 ower eter Calibration 1 (1 mw, 50 ohm) Tsutomu UGIYAA, ojiro AAI, ouichi EBATA, Iwao NIHIYAA, and atsumi FUJII NICT performs
More informationCCEM Meeting, March 2017
CCEM/17-Report-INTI CCEM Meeting, March 2017 1. Quantum Standards 1.1. Transport Phenomena of Quantum Hall Effect Systems (Contact: Mariano Real, mreal@inti.gob.ar and Alejandra Tonina, atonina@inti.gob.ar)
More informationTEST & MEASURING INSTRUMENTS. Analyzer. (4 Ports) 4 Ports
TEST & MEASURING INSTRUMENTS Analyzer (4 Ports) 4 Ports Key Features Frequrncy Range : 100kHz ~ 8GHz, 16 Parameters support (S11 ~ S44) Measurement time per point : 100us per point Wide Output Power Range
More informationSCOPE OF ACCREDITATION TO ISO/IEC 17025:2005 & ANSI/NCSL Z
SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005 & ANSI/NCSL Z540-1-1994 ANRITSU COMPANY CALIBRATION SERVICES TX FACILITY 1155 East Collins Blvd. Richardson, TX 75081 Yeou-Song (Brian) Lee Phone: 408 201 1976
More informationVector Network Analyzer
Vector Network Analyzer VNA Basics VNA Roadshow Budapest 17/05/2016 Content Why Users Need VNAs VNA Terminology System Architecture Key Components Basic Measurements Calibration Methods Accuracy and Uncertainty
More informationP R O D U C T D A T A
P R O D U C T D A T A PULSE Acoustic Material Testing in a Tube Type 7758 PULSE Acoustic Material Testing in a Tube Type 7758 is software for determining the acoustical properties of noise control materials
More informationHigh-speed Waveform Metrology
High-speed Waveform Metrology Paul Hale, Andrew Dienstfrey, Jeffrey Jargon, Kate Remley, Jack Wang, and Dylan Williams National Institute of Standards and Technology Boulder, Colorado USA BIPM March, 2015
More informationGrundlagen der Impedanzmessung
Grundlagen der Impedanzmessung presented by Michael Benzinger Application Engineer - RF & MW Agenda Impedance Measurement Basics Impedance Basics Impedance Dependency Factors Impedance Measurement Methods
More informationM5090. Extended Specifications EXTEND YOUR REACH TM
M5090 Extended Specifications TM Frequency range: 300 khz - 8.5 GHz Wide output power adjustment range: -55 dbm to +5 dbm Dynamic range: 130 db (10 Hz IF bandwidth) typ. Measurement time per point: 70
More informationSCOPE OF ACCREDITATION TO ISO/IEC 17025:2005 & ANSI/NCSL Z
SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005 & ANSI/NCSL Z540-1-1994 ANRITSU COMPANY CALIBRATION SERVICES TX FACILITY 1155 East Collins Blvd. Richardson, TX 75081 Yeou-Song (Brian) Lee Phone: 408 201 1976
More informationPM Series Microwave Power Calibration System
PM Series Microwave Power Calibration System Supports Sensors from most major manufacturers from 6 khz to 50 GHz Faster than direct compare method Lowest total uncertainty National Metrology Institute
More informationTechnical Information
Technical Information Power Sensor R&S NRP-Z91 Universal power measurement from 9 khz to 6 GHz The Power Sensor R&S NRP-Z91 is designed for measuring average power in a very wide frequency range. In particular,
More informationLA Techniques Ltd
8 GHz Vector Network Analyser Product overview 300 khz 8 GHz range 120 db dynamic range Flexible architecture 200µs sweep speed Signal generator mode Outstanding value The LA19-13-13 is a PC-driven Vector
More informationCIPM and CCPR What are these organizations and how do they affect my testing results. Maria Nadal Photometry, Surface Color and Appearance NIST
CIPM and CCPR What are these organizations and how do they affect my testing results Maria Nadal Photometry, Surface Color and Appearance NIST CIE USA Annual Meeting October 6-7, 2014 Calibration Laboratory
More informationCCEM KEY COMPARISON CCEM.RF-K18.CL (GT-RF/00-1) Final Report. C. Eiø, D. Adamson, J. Randa, D. Allal and R. Uzdin
CCEM KEY COMPARISON CCEM.RF-K18.CL (GT-RF/00-1) Noise in 50 Ω coaxial line at frequencies up to 1 GHz Final Report C. Eiø, D. Adamson, J. Randa, D. Allal and R. Uzdin Christopher Eiø National Physical
More informationMeasuring PCB, Cable and Interconnect Impedance, Dielectric Constants, Velocity Factor, and Lengths
Measuring PCB, Cable and Interconnect Impedance, Dielectric Constants, Velocity Factor, and Lengths Controlled impedance printed circuit boards (PCBs) often include a measurement coupon, which typically
More informationNI PXIe-5630 Specifications
NI PXIe-5630 Specifications RF Vector Network Analyzer This document lists specifications for the NI PXIe-5630 RF vector network analyzer (NI 5630). Specifications are warranted under the following conditions:
More informationBilateral Comparison EURAMET.AUV.V-K1.2. (vibration acceleration) Swiss Federal Office of Metrology METAS Christian Hof
Final report 2011 04 20 Bilateral Comparison EURAMET.AUV.V-K1.2 (vibration acceleration) Swiss Federal Office of Metrology METAS Christian Hof Abstract This report describes the results obtained in a bilateral
More informationS-Parameter Measurements with the Bode 100
Page 1 of 10 with the Bode 100 Page 2 of 10 Table of Contents 1 S-Parameters...3 2 S-Parameter Measurement with the Bode 100...4 2.1 Device Setup...4 2.2 Calibration...5 2.3 Measurement...7 2.3.1 S11 and
More informationCHQ SERIES. Surface Mount Chip Capacitors: Ultra High Frequency
26 High Frequency Measurement and Performance of High Multilayer Ceramic Capacitors Introduction Capacitors used in High Frequency applications are generally used in two particular circuit applications:
More informationDESCRIPTION OF THE OPERATION AND CALIBRATION OF THE MILLIMETER I/Q PHASE BRIDGE-INTERFEROMETER
DESCRIPTION OF THE OPERATION AND CALIBRATION OF THE MILLIMETER I/Q PHASE BRIDGE-INTERFEROMETER Overview of Interferometer Operation The block diagram of the I/Q Phase Bridge-Interferometer is shown below
More informationSCOPE OF ACCREDITATION TO ISO/IEC 17025:2005 & ANSI/NCSL Z
SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005 & ANSI/NCSL Z540-1-1994 ANRITSU CUSTOMER SUPPORT CO., LTD. 5-1-1 Onna, Atsugi-shi, Kanagawa-ken, 243-0032 Japan Toshio Yamazaki Phone: +81 46-296-6746 Email:
More informationAries Center probe CSP socket Cycling test
Aries Center probe CSP socket Cycling test RF Measurement Results prepared by Gert Hohenwarter 10/27/04 1 Table of Contents TABLE OF CONTENTS... 2 OBJECTIVE... 3 METHODOLOGY... 3 Test procedures... 5 Setup...
More informationDiscover. Blue Box. the. Difference. High Resistance Metrology Products Guide
Discover the Blue Box Difference High Resistance Metrology Products Guide Metrology is our Science, Accuracy is Our Business Measurements International (MI) is the world s premier metrology company. MI
More information