In-system Jitter Measurement Based on Blind Oversampling Data Recovery
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1 RADIOENGINEERING, VOL. 1, NO. 1, APRIL In-system Jtter Measurement Based on Blnd Oversamplng Data Recovery Mchal KUBÍČEK, Zdeněk KOLKA Dept. of Rado Electroncs, Brno Unversty of Technology, Purkyňova 118, Brno, Czech Republc Abstract. The paper descrbes a novel method for smple estmaton of jtter contaned n a receved dgtal sgnal. The man objectve of our research was to enable a nonnvasve measurement of data lnk propertes durng a regular data transmsson. To evaluate the sgnal qualty we estmate amount of jtter contaned n the receved sgnal by utlzng nternal sgnals of a data recovery crcut. The method s a pure dgtal algorthm sutable for mplementaton n any dgtal ntegrated crcut (ASIC or FPGA). It s based on a blnd-oversamplng data recovery crcut whch s used n some recevers nstead of a tradtonal PLL-based clock and data recovery (CDR) crcut. Combnaton of the descrbed jtter measurement block and the data recovery block forms a very effcent nput part of the dgtal recever. In such a confguraton t s able to smultaneously perform both data communcaton (data recovery) and sgnal qualty estmaton (jtter measurement). The jtter measurement porton of the recever requres no specal connecton of the receved data sgnal. Thus the measured sgnal s not nfluenced by the measurement crcutry at all. To verfy the method we performed a measurement on a laboratory free-space optcs lnk. Results of the measurement are satsfactory and can be used for on-lne channel analyss. Keywords Jtter, Blnd Oversamplng Data Recovery, FPGA, ASIC, Tme-to-Dgtal, Sgnal Qualty, Bt Error Rate 1. Introducton One of the basc measurements n the area of hghspeed baseband communcaton s the jtter measurement. The amount of jtter contaned n the receved sgnal has a drect mpact on the lnk performance and as such can be used, for example, as an ndcator of the receved sgnal qualty [1]. Also, t can be used to estmate the bt error rate (BER) durng regular data transmsson, whch s not achevable usng the tradtonal BER measurement devces. The tradtonal BER analyzers need to transmt a known data pattern n order to be able to detect errors. Another problem of the drect method s the relatvely long measurement tme requred to acheve suffcent confdence level at low bt error rates. On the other hand, the ndrect jtter-based BER measurement s usually somewhat less accurate. However, t can gve us relable results n a much shorter tme whle user data s beng transmtted over the lnk. Thus t s possble to perform the adjustment of lnk parameters n real tme durng regular transmsson (error correcton strategy, lnk speed, etc.). When measurng jtter n a tradtonal way (usng an osclloscope for example), t s necessary to splt the receved sgnal among the measurement nstrument and the recever tself. Ths s an nvasve method of measurement that may sgnfcantly nfluence the measured sgnal or even corrupt the measurement completely. To be able to measure the receved sgnal ths way t s necessary to ether use very sophstcated measurement tools (probes) or to desgn the recever wth havng the possblty of future measurements n mnd. Up to now several dgtal methods of jtter measurement were publshed. They utlze nternal sgnals of a recever thus elmnatng any nfluence of the measured sgnal. The jtter measurement method based on phase trackng (so called "follow me"; []) can capture only a low frequency jtter, whch s of relatvely low mpact on BER performance. Another method, based on jtter hstogram scannng [3], can gve us more precse results but requres much longer measurement tme. These methods were consdered to be unsutable for our applcaton. The newly developed method benefts from ts target platform. It gves us both smple mplementaton and hgh frequency jtter measurement. It s based on a blnd oversamplng data recovery crcut (BO-CDR; [4], [5], [6], [7]). For testng purpose t was ftted nto an FPGA utlzng ts programmable logc. A varety of other platforms can be used to run the algorthm as well (ASIC, processor). A sgnfcant beneft of combnng the BO-CDR based data recever wth the proposed jtter measurement crcutry les n the overall system smplfcaton. Ths results n a lower part number and a smaller PCB area. The
2 404 M. KUBÍČEK, Z. KOLKA, IN-SYSTEM JITTER MEASUREMENT BASED ON BLIND OVERSAMPLING DATA RECOVERY receved sgnal need not be splt between the recever and a jtter measurement devce, thus the receved (measured) sgnal s n no way affected. Moreover, the recever s completely asynchronous, wthout any loopback, and thus nherently stable (unlke some fast-respondng PLL-based systems [8]). On the other hand, the smplcty of the proposed method leads to somewhat lower accuracy. Secton of the paper descrbes the basc prncple of the measurement method; Secton 3 deals wth ts mplementaton and ntroduces the expermental results.. The Method of Jtter Measurement The jtter measurement algorthm utlzes nternal sgnals of a blnd oversamplng data recovery. In prncple t estmates edge densty dstrbuton functon over one unt nterval (UI). The unt nterval s a tme nterval equal to the duraton of one data symbol on a lnk. The whole unt nterval s subdvded nto several smaller equdstant subntervals by BO-CDR nput oversampler. The number of subntervals depends on the oversamplng rato of the BO-CDR used and ranges from 3 to 8 for most mplementatons. In Fg. 1 an example of receved data sgnal samplng wth oversamplng rato M = 5 s shown. The data sgnal s sampled by fve mutually phase-shfted samplng clocks havng the same frequency equal to the lnk data rate. The fve subntervals n each unt nterval defned by neghborng clocks are called samplng domans. In the example shown, edges are detected n the B-C doman thus clock E s chosen to sample the data as t s the sample nearest to the center of the symbol. The proposed algorthm s countng number of detected edges n partcular domans. Ths number s proportonal to the probablty densty functon (PDF) of edge occurrence over one UI. Thus t s possble to estmate the PDF of edge dstrbuton (.e. receved data jtter) based on ths smple statstc. We can obtan a very authentc mage of the actual PDF by ncreasng the oversamplng rato. Ths s very smlar to tradtonal jtter measurement technque called tme to dgtal [9], [10]. However, the hardware complexty of such a measurement devce would not be sutable for mplementaton due to large number ntegrators. For practcal reasons the oversamplng rato of the jtter measurement devce wll be always equal to the oversamplng rato of the used BO-CDR. We have focused on the estmaton of jtter RMS value σ to obtan measurement results comparable wth other measurement methods. The σ s the man parameter of the random jtter PDF. To estmate σ, we have used the followng equaton that s based on a basc equaton for standard devaton of dscrete random varable M 1 [UI] (1) est p M 1 M where µ s the mean value of the dstrbuton, and p s the probablty of edge occurrence n the -th doman. The term /M represents center of the samplng doman. It s assumed that the maxmum of PDF s located wthn the center samplng doman (µ s close to zero). The method of σ calculaton can be consdered to be relable only for lnks showng random jtter dstrbuton or very narrow double Drac dstrbuton [9]. A more complex jtter dstrbuton results n a less accurate estmaton of the RMS jtter value. However, even n such cases the method can be used to gve a relatve measure of sgnal qualty. Fg. 1. Prncple of edge detecton and oversamplng data recovery. Fg.. Example of rough edge densty estmaton over one unt nterval usng the oversamplng rato M = 5. To be able to estmate the jtter RMS we have to consder a frequency offset between transmtter and recever. To explan the prncple of the method we wll frst consder zero frequency offset. That means that the poston of jtter hstogram wthn the samplng domans s fxed (lke the one n Fg. ). Now let us denote n the number of edges detected wthn a fxed measurement tme n the -th samplng doman, and N the number of all edges detected durng the measurement (ncludng n ). Those values can be measured easly n a system utlzng BO-CDR and can be used to calculate the measured edge densty as n P ~. () N
3 RADIOENGINEERING, VOL. 1, NO. 1, APRIL Ths value s the requred estmate of p needed for RMS jtter calculaton, whch approxmates the theoretcal value 1 0.5M P ( ) PDF(, ) d (3) 1 0.5M where τ s the normalzed tme n UI, PDF(τ,µ) s the probablty densty functon of the measured jtter, and µ s the mean value relatve to the center of the samplng doman = 0. In a real system there s always a frequency offset between the transmtter and the recever reference clock. As a result, the mean value of the PDF s drftng slowly through the whole UI. Wthout any synchronzaton the measured long-tme edge densty would be same over all domans. That s why the algorthm must track on the samplng doman wth currently hghest edge densty. The trackng can be easly accomplshed by utlzng nternal sgnal for selectng an optmum samplng doman of the BO-CDR [5]. The tracng mechansm BO-CDR adjusts phase n dscrete steps of 1/M. Consderng the unform dstrbuton of over nterval <-0.5/M, 0.5/M > (see Fg. 3), the theoretcal value of the edge densty s equal to the long tme average R M 1 0.5M 1 0.5M P ( ) d. (4) R s an edge densty actually measured n a real system usng the descrbed method. By substtutng p = R n (1) we can calculate a so called pseudo RMS jtter value M 1 D R M 1 M. (5) Ths value s not a real jtter RMS as t s affected by the drft as llustrated n Fg. 3. Ths phase drft dstorts shape of jtter PDF seen by the sampler by convolutng t wth a pulse represented by a samplng doman. The dstorted PDF can be seen n Fg. 4 as the blue curve. The red curve n Fg. 3 represents measured (ntegrated) edge densty for the dstorted dstrbuton, whle the green curve s actual jtter PDF that we want to characterze. Fg. 3. Drft of a maxmum of the edge densty wthn a sngle samplng doman due to frequency offset between transmtter and recever. Due to the phase drft effect gven by (4) t s necessary to make a correcton of the calculated pseudo value σ D to get the real value of jtter RMS. We have assumed the normal dstrbuton of the random jtter. Then σ D can be easly expressed as a functon of standard devaton σ of the normal dstrbuton usng (3), (4), and (5) D f ( ). (6) Ths calculaton s relatvely complex for an embedded system and thus t s more effcent frst to evaluate (6) by a computer and then to use the calculated values as a look-up table durng the measurement tself. The correcton functon can be seen n Fg. 5. Fg. 4. Impact of the phase drft on the measured sgnal; the green curve s actual jtter PDF, the blue curve represents convoluton of the actual jtter PDF wth samplng doman pulse and the red one represents actually measured edge densty n partcular domans (nterval ntegral of the blue curve). The phase drft complcates the mplementaton of the algorthm because of the correcton functon. However, t ensures that the jtter can be measured even for a very low RMS value,.e. when the major porton of the PDF fts wthn a sngle samplng doman (lke the one shown n the upper example n Fg. 4). In case of very low jtter RMS value t would not be possble to measure the jtter wth acceptable precson by usng low oversamplng ratos (lke M = 5). For our method the low oversamplng rato s suffcent and the measurement resoluton (precson) s even hgher for low jtter levels, thanks to the small ntal slope of the correcton functon. There are applcatons where an exact RMS jtter value s rrelevant and a relatve sgnal qualty ndcaton s suffcent. In such a case the correcton calculaton can be omtted, thus smplfyng the system sgnfcantly. Please note that wander (slow varatons n frequency) and low frequency jtter cannot be evaluated by the proposed devce as these are fltered-out by the data recovery crcut va phase trackng the receved data sgnal. On the other hand, these are usually rrelevant for most systems as they have only margnal mpact on BER [11]. As the jtter measurement devce s drven by the data recovery crcut, t s ensured that each and every phase varaton causng an error s detected.
4 406 M. KUBÍČEK, Z. KOLKA, IN-SYSTEM JITTER MEASUREMENT BASED ON BLIND OVERSAMPLING DATA RECOVERY Corrected value [UI] Measured value [UI] Fg. 5. The relatonshp of measured value (σ D ) and corrected value (σ) of measured jtter RMS due to the phase drft effect (6). 3. The Measurement To verfy the qualty of the proposed method several real measurements were performed. The smplfed measurement setup s shown n Fg. 6. Please note that no external reference clock sgnal s necessary for the measurement, whch s n contrast to other recently publshed methods [10], [1], [13]. The whole recever frontend ncludng the jtter measurement devce was mplemented n Vrtex-5 FPGA populated on the Xlnx ML-505 development board. The FPGA was connected drectly to a condtoned receved sgnal of an expermental 15 Mb/s free-space optc lnk recever (System under test). The processor performs several tasks regardng the jtter measurement. Frst t takes care of reset of the ntegrators. When choosng the ntegraton tme we have to trade between tme resoluton and precson of the measurement. For our mplementaton we are usng relatvely low ntegraton tme as we want to montor fast changes of the measured channel propertes. Because the ntegraton tme s defned by software, t s very easy to change t and t can be adjusted even durng the measurement. The second task of the processor s calculaton of measurement correcton (as shown n Fg. 5) by performng a look-up to a correcton table saved n a processor RAM. Ths look-up can be alternatvely mplemented n hardware by utlzng few more slces and one BRAM block of the FPGA. The last task of the processor regardng the jtter measurement s data presentaton. In our case we are usng a termnal applcaton to log the statstcs so the processor s confgured to contnuously send the measured data over the seral lnk to a PC. The measurement results captured usng the FPGA-based jtter measurement devce were compared wth reference values acqured usng an osclloscope (Tektronx DPO754). As can be seen n Fg. 7, there s only lttle dfference between the two measurements, caused manly by md-frequency jtter components (frequences close to the BO-CDR trackng bandwdth). Measured jtter [UI] DPO754 Proposed method Fg. 6. Comparson of RMS jtter measured by osclloscope and by the proposed devce mplemented on an FPGA. Hardware requrements for algorthm mplementaton are very low. We decded to use 0 bt bnary counters for ntegrator mplementaton. It s worth mentonng, that t s only necessary to mplement one full-length counter for the central samplng doman and another ones for the remanng domans, as the edge densty s always the largest n the central doman (for reasonable sgnal qualty). Overall hardware cost s only 3 slces of the Vrtex-5 FPGA for the ntegrators whle the maxmum desgn frequency s unaffected by addng the jtter measurement functonalty. The rest of the algorthm s mplemented n a soft-core mcroprocessor, whch have been already present n the desgn Actual jtter [UI] Fg. 7. Comparson of RMS jtter measured by osclloscope and by the proposed devce mplemented on an FPGA. Our further research n ths area wll be focused on mprovement of the measurement precson by more detaled analyss of the measured edge densty over all samplng domans. 4. Concluson We have presented a novel, very effcent, fully dgtal crcutry for jtter (sgnal qualty) estmaton. It utlzes nternal sgnals of a blnd oversamplng data recovery crcut. It offers an opportunty to measure the receved sgnal qualty durng a regular transmsson wthout affectng the sgnal path (.e. wthout any mpact on the measured receved sgnal). Moreover, due to very low hardware requrements of the proposed method, t s possble to eas-
5 RADIOENGINEERING, VOL. 1, NO. 1, APRIL ly mplement the whole recever (sgnal condtonng, CDR, sgnal qualty measurement, data processng) nto a sngle chp (FPGA or ASIC) and thus smplfy the fnal devce. Accuracy of the proposed system was verfed usng a reference measurement. Consderng the smplcty of the measurement we can state that the error of measured jtter s relatvely small. The method can provde a smple measure of sgnal qualty for adjustng parameters of a transcever (lke forward error correcton scheme) but t n current setup s not sutable for reference measurements. Both the full VHDL source code for the algorthm and the Matlab code for correcton functon calculaton are avalable upon request at authors. Acknowledgements Ths work has been supported by the Czech Scence Foundaton under grant No P10/11/1376, by the Czech Mnstry of Industry and Trade under grant agreement No. FR-TI4/148 and by the project CZ WICOMT, fnanced from the operatonal program Educaton for Compettveness. The research leadng to these results has receved fundng from the European Communty's Seventh Framework Programme (FP7/ ) under grant agreement No The descrbed research was performed n laboratores supported by the SIX project; the regstraton number CZ.1.05/.1.00/03.007, the operatonal program Research and Development for Innovaton. [5] KUBÍČEK, M., KOLKA, Z. Blnd oversamplng data recovery wth low hardware complexty. Radoengneerng; 010, vol. 19, no. 1, p [6] PARK, S.-H., CHOI, K.-H., SHIN, J.-B., SIM, J.-Y., PARK, H.-J. A sngle-data-bt blnd oversamplng data-recovery crcut wth an add-drop FIFO for USB.0 hgh-speed nterface. IEEE Transactons on Crcuts and Systems II: Express Brefs, 008, vol. 55, no., p , ISSN [7] BUEREN, G., RODONI, L., JAECKEL, H., HUBER, A., BRUN, R., HOLZER, D., SCHMATZ, M to 44Gb/s quarter rate CDR wth data rate selecton n 90nm bulk CMOS. In 34th European Sold-State Crcuts Conference ESSCIRC 008. Ednburg (UK), Sept. 008, p ISBN [8] HSIEH, M., SOBELMAN, G. E. Archtectures for mult-ggabt wre-lnked clock and data recovery. IEEE Crcuts and Systems Magazne, 008, vol. 8, no. 4, p , 008. [9] MILLER, M., SCHNECKER, M. A Comparson of Methods for Estmatng Total Jtter Concernng Precson, Accuracy and Robustness. [Onlne], 007. Cted Avalable at: < er_methods_desgncon007.pdf> [10] MARINS, C. N. M., et al. New Jtter Measurement Technque Usng TDC Prncple n a FPGA Component. 4 pages. [Onlne] Cted Avalable at: downloads/doc_download/737-antono-alves-ferrera-junor. [11] YIN, J., ZENG, L.-G. A statstcal jtter tolerance estmaton appled for clock and data recovery usng oversamplng. In Proceedngs of IEEE Regon 10 Conference TENCON, 006.Hong Kong (Chna), 006, p ISBN [1] JAE WOOK LEE, JI HWAN CHUN, ABRAHAM, J.A. A random jtter RMS estmaton technque for BIST applcatons. In Proceedngs of the 009 Asan Test Symposum. ATS '09. Tachung (Tawan), 009, p. 9-14, ISBN [13] LI, M. P., JINHUA CHEN New methods for recever nternal jtter measurement. In IEEE Internatonal Test Conference. ITC 007.Santa Clara (USA), Oct. 007, p. 1-10, ISBN References [1] Total Jtter Measurement at Low Probablty Levels, Usng Optmzed BERT Scan Method. [onlne] Aglent Whte Paper, 005. Avalable at WWW:< aglent/ redrector.jspx?acton=ref&cname=agilent_editorial&cke y=68410&lc=eng&cc=us> [] BORGOSZ, J. Follow Me - Dgtal jtter measurement method. In Measurement Scence Revew, 006, vol. 6, sect. 3. ISSN [3] KUBÍČEK, M. In-system jtter measurement usng FPGA. In Proceedngs of 0th Internatonal Conference Radoelektronka 010. Brno (Czech Republc), 010. p ISBN [4] JOU, S.-J., LIN, C.-H., CHEN, Y.-H., LI, Z.-H. Desgn and analyss of dgtal data recovery crcuts usng oversamplng. IET Crcuts Devces Systems, 007, vol. 1, no. 1. ISSN: X About Authors... Mchal KUBÍČEK was born n Svtavy, Czech Republc, n He receved hs M.Sc. from Brno Unversty of Technology n 006 and Ph.D. degree at the Department of Rado Electroncs n 010 at the same unversty. He s concerned wth FPGA-based dgtal systems. Hs work s focused on hgh speed data transmssons, data processng and embedded systems. Zdeněk KOLKA was born n Brno, Czech Republc, n He receved the M.Sc. degree n 199 and the Ph.D. degree n 1997, both n Electrcal Engneerng, from Brno Unversty of Technology. In 1995 he joned the Department of Rado Electroncs, Brno Unversty of Technology. Hs research and teachng nterests are n computer-aded desgn of electronc crcuts, modelng, and numercal algorthms.
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