PROCEEDINGS OF SPIE. Front Matter: Volume 10339

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1 PROCEEDINGS OF SPIE SPIEDigitalLibrary.org/conference-proceedings-of-spie Front Matter: Volume 10339, "Front Matter: Volume 10339," Proc. SPIE 10339, Pacific Rim Laser Damage 2017: Optical Materials for High-Power Lasers, (4 August 2017); doi: / Event: Pacific Rim Laser Damage 2017: Optical Materials for High Power Lasers, 2017, Shanghai, China

2 PROCEEDINGS OF SPIE Pacific Rim Laser Damage 2017 Optical Materials for High-Power Lasers Jianda Shao Takahisa Jitsuno Wolfgang Rudolph Editors May 2017 Shanghai, China Organized by SPIE SIOM Shanghai Institute of Optics and Fine Mechanics (China) Cooperating Organizations Chinese Academy of Sciences National High-tech R&D Program The Chinese Optical Society Published by SPIE Volume Proceedings of SPIE X, V SPIE is an international society advancing an interdisciplinary approach to the science and application of light. Pacific Rim Laser Damage 2017: Optical Materials for High-Power Lasers, edited by Jianda Shao, Takahisa Jitsuno, Wolfgang Rudolph, Proc. of SPIE Vol , SPIE CCC code: X/17/$18 doi: / Proc. of SPIE Vol

3 The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon. Please use the following format to cite material from these proceedings: Author(s), "Title of Paper," in Pacific Rim Laser Damage 2017: Optical Materials for High-Power Lasers, edited by Jianda Shao, Takahisa Jitsuno, Wolfgang Rudolph, Proceedings of SPIE Vol (SPIE, Bellingham, WA, 2017) Seven-digit Article CID Number. ISSN: X ISSN: X (electronic) ISBN: ISBN: (electronic) Published by SPIE P.O. Box 10, Bellingham, Washington USA Telephone (Pacific Time) Fax SPIE.org Copyright 2017, Society of Photo-Optical Instrumentation Engineers. Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is X/17/$ Printed in the United States of America. Publication of record for individual papers is online in the SPIE Digital Library. SPIEDigitalLibrary.org Paper Numbering: Proceedings of SPIE follow an e-first publication model, with papers published first online and then in print. Papers are published as they are submitted and meet publication criteria. A unique citation identifier (CID) number is assigned to each article at the time of the first publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online, print, and electronic versions of the publication. SPIE uses a seven-digit CID article numbering system in which: The first five digits correspond to the SPIE volume number. The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript. The complete citation is used on the first page, and an abbreviated version on subsequent pages. Proc. of SPIE Vol

4 Contents vii ix Authors Conference Committee HIGH POWER LASER DAMAGE, UV THROUGH IR I High peak power green light generation by frequency doubling of a superluminescent pulse amplifier system [ ] LASER ABLATION AND LASER MACHINING I D laser printing by ultra-short laser pulses for micro-optical applications: towards telecom wavelengths (Invited Paper) [ ] Mathematical model for CO2 laser high precision ablation of fused silica [ ] MECHANISMS, MODELING, AND SIMULATIONS B Study on Brewster angle thin film polarizer using hafnia-silica mixture as high refractive index material [ ] C Simulation of the evolution of fused silica s surface defect during wet chemical etching [ ] D First-principles calculations of crystal structure, electronic structure and optical properties of RETaO4 (RE= Y, La, Sm, Eu, Dy, Er) [ ] HIGH LASER DAMAGE RESISTANT COATINGS I F Improving 355nm laser damage resistance for fluoride mirrors with overcoat layer [ ] G Study on high power CW laser s irradiation effect on yttria-stabilized zirconia coating [ ] H Comparison between intrinsic and contaminant-induced damages of multilayer dielectric gratings [ ] iii Proc. of SPIE Vol

5 HIGH POWER LASER DAMAGE, UV THROUGH IR II K Prejudgement of hot-images damage based on gradient direction matching method in high power laser system [ ] LASER ABLATION AND LASER MACHINING II N A compact plasma pre-ionized TEA CO2 laser pulse clipper for material processing [ ] O Towards crack-free ablation cutting of thin glass sheets with picosecond pulsed lasers [ ] NONLINEAR LASER CRYSTALS V Photoluminescence properties of KDP crystals under high power nanosecond laser irradiation [ ] W DKDP crystal growth controlled by cooling rate [ ] CHARACTERIZATION TECHNIQUES AND MEASUREMENT PROTOCOLS I X Spherical aberration compensation method for long focal-length measurement based on Talbot interferometry [ ] Y Transient transmittance and scattering changes during nanosecond laser-induced damage in fused silica [ ] HIGH LASER DAMAGE RESISTANT COATINGS II Design of broadband polarization-independent multilayer dielectric grating [ ] CHARACTERIZATION TECHNIQUES AND MEASUREMENT PROTOCOLS II UV fatigue investigations with non-destructive tools in silica (Invited Paper) [ ] Influence of laser wavelengths and polarizations on absorption of KDP crystal [ ] A Development of an infrared absorption measurement system for large aperture optics [ ] iv Proc. of SPIE Vol

6 OPTICAL GLASSES AND FIBERS C Exploring high power, extreme wavelength operating potential of rare-earth-doped silica fiber (Invited Paper) [ ] POSTER SESSION H Measurement system for diffraction efficiency of convex gratings [ ] I Highly transparent VO2-SiO2 films with excellent infrared characteristics by dual-target magnetron sputtering [ ] J Study on imaging reconstruction based on filtered back-projection combined with a modified shift-invariant wavelet threshold method [ ] K Discrimination of the glucose and the white sugar based on the pulsed laser-induced photoacoustic technique [ ] M Verification technology of remote sensing camera satellite imaging simulation based on ray tracing [ ] N Investigations on laser ablation mechanism of anti-reflection layers for solar cells [ ] S A calibration mechanism based on worm drive for space telescope [ ] V The influence of 1/ f noise on the electrical derivative initial peak of high-power semiconductor laser diodes [ ] W Effects of substrate etching on laser-induced damage of 355nm space coatings [ ] Y Effect of ion beam figuring on laser damage properties of KDP crystal [ ] Realization and testing of a deployable space telescope based on tape springs [ ] Range walk error correction and modeling on Pseudo-random photon counting system [ ] Investigation of the hydrogen of silica glass being laser-irradiating by 1 H MAS NMR [ ] Research on the welding process of aluminum alloy based on high power fiber laser [ ] Z-propagation Ti: Er: Tm: LiNbO3 strip waveguide with Er3+/Tm3+ Codoped [ ] Multiple-slit diffraction of high-polarization-order cylindrical vector beams [ ] Modeling for the thermal damage process of the optical film caused by contaminants [ ] v Proc. of SPIE Vol

7 B Modeling and simulation for effective removal rate of damage [ ] C The adsorption behavior between particle contamination and fused silica in high-energy laser system [ ] D Generation of multiple solitons in an all-fiber mode-locked Yb-doped ring laser [ ] E Effect of elastic region nanoparticle SiO2 jet polishing on the laser damage properties of fused silica [ ] F Design, fabrication and performance study of rugate narrow band minus filters [ ] G Analysis of hot images in final optics assembly [ ] vi Proc. of SPIE Vol

8 Authors Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B...0Z, followed by 10-1Z, 20-2Z, etc. Bai, Jian, 0X Bai, Q. S., 2C Beaudier, Alexandre, 16 Brasselet, Etienne, 06 Cao, Yu, 1N Cao, Zhen, 0V, 0Y, 18 Chai, Yingjie, 0B Chen, Jian, 1A Chen, Junming, 11 Chen, Qian, 22 Chen, Xiaomei, 1M Chen, Xin-hua, 1H Chen, Yu, 1W Chen, Zilun, 1C Cheng, Qing, 1I Chong, Yaqin, 1S, 20 Deng, Haifei, 27 Dong, Jingtao, 1A Dong, Tao, 0G Du, Juan, 0X Eppelt, Urs, 0O Fu, Bo, 23 Gao, Fengli, 1V Gao, Gan, 05 Gao, Lihong, 0D, 0G Gao, Yaru, 0K Gao, Zhixing, 23 Gasmi, Taieb, 0N Gong, Mali, 05 Gu, Qiongqiong, 1M Guan, Jian, 1V Guo, Kesheng, 1W Guo, Shuxu, 1V Han, Kai, 28 Hao, He, 05 Hao, Yanfei, 0H Hartmann, Claudia, 0O He, Hongbo, 0Y, 1W, 2F He, Linlu, 05 He, Ting, 09 He, Weiji, 22 He, X., 2C Hu, Guohang, 0V, 0Y, 18 Huang, Long, 1C Huang, Shanshi, 25 Huang, Xiao, 0X Huang, Ying, 1I Jiang, Zhigang, 09 Jiao, Zhaoyang, 2G Jin, Yunxia, 11 Jing, Nan, 20 Juodkazis, Saulius, 06 Lei, Wang, 1S, 20 Leng, Jinyong, 1C Li, Bingbing, 1A Li, Chuang, 1S, 20 Li, Dawei, 0V Li, Furen, 1Y Li, Heyang, 0C Li, Jinyu, 0G Li, Ruixian, 1C Li, Sheng Yi, 2B Li, Wenzhi, 0G Li, Xiao, 28 Lin, Yu Xuan, 2B Lin, Zunqi, 0O Liu, Dean, 0K Liu, Guodong, 1J, 1K Liu, Jia, 1W Liu, Peng, 1H Liu, Quan, 1H Liu, Qun, 0X Liu, Taixiang, 0C Liu, Wenwen, 1N, 25 Liu, Xiaofeng, 0V Liu, Yabin, 2D Liu, Yanbo, 0G Lou, Zhaokai, 28 Luo, Chao, 1H Luo, Jia, 0X Luo, Yang, 0V, 0Y Luo, Yujie, 0X Luo, Yupeng, 0X Ma, Zhuang, 0D, 0G Magallanes, Hernando, 06 Malinauskas, Mangirdas, 06 Miao, Jie, 0K Mizeikis, Vygantas, 06 Morikawa, Junko, 06 Natoli, Jean-Yves, 16 Nie, Lanjian, 23 Pan, Baoguo, 27 Pan, Xiaoming, 25 Pan, Xue, 0H Pang, Xiangyang, 0H Peng, Xiaocong, 0Y, 18 Piao, Ruiqi, 26 Qi, Hongji, 0F, 0W, 1W, 2F vii Proc. of SPIE Vol

9 Qi, Junli, 27 Ren, Zhong, 1J, 1K Ruan, Shuangchen, 2F Ryu, Meguya, 06 Schulz, Wolfgang, 0O Shan, Huihui, 27 Shan, Yao, 0V, 0Y Shao, Jianda, 09, 0B, 0W, 11, 18, 1W, 2F Shao, Zhufeng, 23 Shen, Shanshan, 22 Shen, Wei-min, 1H Shi, Bo, 27 Shi, Feng, 1Y, 2B, 2E Shi, Shuang, 0H Song, Ci, 2B Song, Jiangliang, 1Y, 2E Su, Da, 1I Sun, Jian, 0B Sun, Mingying, 0H, 0O, 2G Sun, Shijie, 0G Sun, Wenbao, 26 Tang, Min-xue, 1H Varapnickas, Simonas, 06 Wagner, Frank R., 16 Wang, Bin, 0F Wang, Chinhua, 2D Wang, Hu, 0F Wang, Hui, 23, 27 Wang, Jinyuan, 1V Wang, Song, 0D Wang, Weihua, 27 Wang, Xiao-feng, 1H Wang, Xiong, 1C Wang, Yanzhi, 1W, 2F Wang, Yaqin, 1I Wang, Yueliang, 18 Wei, Binbin, 0G Wei, Chaoyang, 09 Wu, Jian, 1C Wu, Zhouling, 1A Xia, Siyu, 1S Xiang, Zaikui, 23 Xiao, Hu, 1C Xiao, Qi, 1Y, 2E Xie, Xiaoyi, 0W Xu, Jiangmin, 1C Xu, Meili, 1V Xu, Nuo, 0B Yan, Hongwei, 0C Yan, Lianghong, 0C Yang, Aihua, 0K Yang, Deyun, 1M Yang, Jinhong, 27 Yang, Ke, 0C Yang, Liujiang, 0V, 0Y Yang, Ping, 2E Yang, W., 2C Yang, Xiaofei, 26 Yi, Kui, 0B, 2F Yu, Zhen, 0F Yuan, Xiaodong, 0C, 2C Zhang, Delong, 26 Zhang, F. H., 2C Zhang, Haitao, 05 Zhang, Hanwei, 1C Zhang, Hui, 27 Zhang, Jian, 1N, 25 Zhang, K., 2C Zhang, Lianqing, 27 Zhang, Wei, 25 Zhang, Weili, 0F Zhang, Yanli, 2G Zhang, Ying, 2F Zhao, Jiaoling, 09, 2F Zhao, Yuanan, 0B, 0V, 0Y, 18 Zhao, Zhi-cheng, 1H Zheng, Jiayi, 0D Zheng, Jilin, 2F Zhong, Peifeng, 1S, 20 Zhou, Jian-kang, 1H Zhou, Pu, 1C Zhu, Dehua, 1N Zhu, Jianqiang, 0H, 0K, 0O, 2G Zhu, Meiping, 0B, 1W Zhu, Xiaojun, 2D Zhu, Zhenghao, 0H viii Proc. of SPIE Vol

10 Conference Committee Conference Chairs Jianda Shao, Shanghai Institute of Optics and Fine Mechanics (China) Takahisa Jitsuno, Osaka University (Japan) Wolfgang Rudolph, The University of New Mexico (United States) Conference Program Committee MJ Soileau, CREOL, The College of Optics and Photonics, University of Central Florida (United States) Efim A. Khazanov, Institute of Applied Physics of the Russian Academy of Sciences (Russian Federation) Zhi M. Liao, Lawrence Livermore National Laboratory (United States) Zunqi Lin, Shanghai Institute of Optics and Fine Mechanics (China) Yongfeng Lu, University of Nebraska-Lincoln (United States) Jean-Yves Natoli, Institut Fresnel (France) Valdas Sirutkaitis, Vilnius University (Lithuania) Christopher J. Stolz, Lawrence Livermore National Laboratory (United States) Koji Sugioka, RIKEN (Japan) Takunori Taira, Institute for Molecular Science (Japan) Mauro Tonelli, Università di Pisa (Italy) Zhouling Wu, ZC Optoelectronic Technologies Ltd. (China) Qiao Xu, China Academy of Engineering Physics (China) Jiping Zou, Ecole Polytechnique (France) Ya Cheng, Shanghai Institute of Optics and Fine Mechanics (China) Yaping Dai, Institute of Applied Physics and Computational Mathematics (China) Hongbo He, Shanghai Institute of Optics and Fine Mechanics (China) Guixue Huang, Shanghai Institute of Optics and Fine Mechanics (China) Yuxin Leng, Shanghai Institute of Optics and Fine Mechanics (China) Liejia Qian, Shanghai Jiao Tong University (China) Kui Yi, Shanghai Institute of Optics and Fine Mechanics (China) Long Zhang, Shanghai Institute of Optics and Fine Mechanics (China) ix Proc. of SPIE Vol

11 Session Chairs 1 High Power Laser Damage, UV through IR I Boris V. Zhdanov, U.S. Air Force Academy (United States) Jianda Shao, Shanghai Institute of Optics and Fine Mechanics (China) 2 Laser Ablation and Laser Machining I Enam A. Chowdhury, The Ohio State University (United States) Yuxin Leng, Shanghai Institute of Optics and Fine Mechanics (China) 3 Mechanisms, Modeling, and Simulations Jean-Yves Natoli, Institut Fresnel (France) S. Roger Qiu, Lawrence Livermore National Laboratory (United States) 4 High Laser Damage Resistant Coatings I Takahisa Jitsuno, Osaka University (Japan) Zhanshan Wang, Tongji University (China) 5 High Power Laser Damage, UV through IR II Ioan Dancus, National Institute for Laser, Plasma and Radiation Physics (Romania) MJ Soileau, CREOL, The College of Optics and Photonics, University of Central Florida (United States) 6 Laser Ablation and Laser Machining II Takahisa Jitsuno, Osaka University (Japan) Zhouling Wu, ZC Optoelectronic Technologies Ltd. (China) 7 Laser Ceramics S. Roger Qiu, Lawrence Livermore National Laboratory (United States) Jun Wang, Shanghai Institute of Optics and Fine Mechanics (China) 8 Nonlinear Laser Crystals Ken-ichi Ueda, The University of Electro-Communications (Japan) Xin Ju, University of Science and Technology Beijing (China) 9 Characterization Techniques and Measurement Protocols I Jean-Yves Natoli, Institut Fresnel (France) Xin Ju, University of Science and Technology Beijing (China) 10 High Laser Damage Resistant Coatings II Valdas Sirutkaitis, Vilnius University (Lithuania) Jianda Shao, Shanghai Institute of Optics and Fine Mechanics (China) x Proc. of SPIE Vol

12 11 Characterization Techniques and Measurement Protocols II MJ Soileau, CREOL, The College of Optics and Photonics, University of Central Florida (United States) Zhouling Wu, ZC Optoelectronic Technologies Ltd. (China) 12 Optical Glasses and Fibers Saulius Juodkazis, Swinburne University of Technology (Australia) Jun Wang, Shanghai Institute of Optics and Fine Mechanics (China) xi Proc. of SPIE Vol

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