FCC Part 22H&90S Test Report
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- Silas Briggs
- 5 years ago
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1 FCC Part 22H&90S Test Report Product Name : Wireless Module Model No. : MC7354B FCC ID : N7NMC7354B IC : 2417C-MC7354B Applicant : Sierra Wireless Inc. Address : Wireless Way Richmond, British Columbia, Canada, V6V 3A4. Date of Receipt : Jun. 08, 2015 Test Date : Jun. 08, 2015~ Jul. 09, 2015 Issued Date : Jul. 13, 2015 Report No. : R-HP-US-P07V01 Report Version : V 3.0 The test results relate only to the samples tested. The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein. This report must not be used to claim product endorsement by any agency of the government. The test report shall not be reproduced without the written approval of QuieTek Corporation.
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3 Laboratory Information We, QuieTek Corporation, are an independent EMC and safety consultancy that was established the whole facility in our laboratories. The test facility has been accredited/accepted(audited or listed) by the following related bodies in compliance with ISO 17025, EN and specified testing scope: Taiwan R.O.C. : BSMI, NCC USA : FCC Japan : VCCI The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation s Web Site : The address and introduction of QuieTek Corporation s laboratories can be founded in our Web site : If you have any comments, Please don t hesitate to contact us. Our contact information is as below: HsinChu Testing Laboratory : No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C. TEL: / FAX: service@quietek.com LinKou Testing Laboratory : No.5-22, Ruishukeng, Linkou Dist., New Taipei City 24451, Taiwan, R.O.C. TEL : / FAX : service@quietek.com Suzhou Testing Laboratory : No.99 Hongye Rd., Suzhou Industrial Park, Suzhou, , Jiangsu, China TEL : / FAX : service@quietek.com Page: 3 of 171
4 Description TABLE OF CONTENTS Report No.: R-HP-US-P07V01 Page 1. General Information EUT Description Mode of Operation Tested System Details Configuration of Tested System EUT Exercise Software Technical Test Summary of Test Result Test Environment Maximum Output Power and Effective Isotropic Radiated Power Measurement Test Equipment Test Setup Test Procedure Uncertainty Test Result Modulation Characteristic Test Equipment Test Setup Limit Uncertainty Test Result Occupied Bandwidth Test Equipment Test Setup Test Procedure Uncertainty Test Result Conducted Band Edge Test Equipment Test Setup Test Procedure Uncertainty Test Result Spurious Emission Test Equipment Test Setup Page: 4 of 171
5 7.3. Test Procedure Uncertainty Test Result Frequency Stability Under Temperature & Voltage Variations Test Equipment Test Setup Test Procedure Uncertainty Test Result Page: 5 of 171
6 History of This Test Report REPORT NO. VERSION DESCRIPTION ISSUED DATE R-HP-US-P07V01 V1.0 Initial Issued Report Jun. 25, R-HP-US-P07V01 V R-HP-US-P07V01 V3.0 (1) Add the test requirement of regulation Part 90S (2) Replaced the original low channel and high channel in Part 22H (3) Modify the Maximum Output Power of test channel Jul. 10, 2015 Jul. 13, 2015 Page: 6 of 171
7 1. General Information 1.1. EUT Description Product Name Wireless Module Model No. MC7354B EUT Voltage DC 5V 4G Support Band LTE Band 26 Uplink Band 26: 814~849MHz Downlink Band 26: 859~894MHz Type of modulation QPSK, 16QAM Antenna Type Dipole Antenna Gain Band 26: 1dBi Page: 7 of 171
8 1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as: Test Mode Mode 1: LTE Band 26 Note: 1. Regards to the frequency band operation: the lowest, middle and highest frequency of channel were selected to perform the test, then shown on this report. 2. For the radiated emission test and conducted test, We have evaluated the each channel bandwidth of RB size and RB offset, show the worst result on this report. 3. Because of the band 26 occupies two bands which are MHz, so we test the band 26 with regulation Part 90S&Part 22H. Page: 8 of 171
9 1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Product Manufacturer Model No. Serial No. Power Cord 1 Radio Communication Tester Anritsu MT8820C N/A Page: 9 of 171
10 1.4. Configuration of Tested System Connection Diagram Signal Cable Type Signal cable Description Page: 10 of 171
11 1.5. EUT Exercise Software 1 Setup the EUT and simulators as shown on above. 2 Turn on the power of all equipment. 3 EUT Communicate with MT8820C, then select channel to test. Page: 11 of 171
12 2. Technical Test 2.1. Summary of Test Result For LTE Band 26(Mid & High Channel) (FCC Part 22 Subpart H, Industry Canada RSS-132, Issue 3, Industry Canada RSS-GEN, Issue 4 ) Performed Item FCC Rule IC Rule Limit Result < 7 Watts Pass Maximum Output Power Equivalent Isotropic < 7 Watts Pass Radiated Power Modulation characteristics Occupied Bandwidth Conducted Band Edge Emissions N/A Pass RSS-GEN 4.2 N/A Pass < -13dBm Pass Field Strength of Spurious Radiation Frequency Stability Under Temperature & Voltage Variations < -13dBm Pass 5.3 < 2.5 ppm Pass Page: 12 of 171
13 For LTE Band 26 (Low channel) (FCC Part 90 Subpart S & Part 2) Performed Item FCC Rule Limit Result < 30 Watts Pass Maximum Output Power Equivalent Isotropic < 30 Watts Pass Radiated Power Modulation characteristics Occupied Bandwidth Conducted Band Edge Emissions N/A Pass N/A Pass < - 20dBm&-13dBm Pass Field Strength of Spurious Radiation Frequency Stability Under Temperature & Voltage Variations < -13dBm Pass < 2.5 ppm Pass Page: 13 of 171
14 2.2. Test Environment Items Required (IEC 68-1) Actual Temperature ( C) Humidity (%RH) Barometric pressure (mbar) Page: 14 of 171
15 3. Maximum Output Power and Effective Isotropic Radiated Power Measurement 3.1. Test Equipment Peak Conducted Output Power / AC-6 Instrument Manufacturer Type No. Serial No Cali. Due Date PSA Series Spectrum Analyzer Agilent E4440A MY /03/10 Radio Communication Tester R&S CMU /03/10 Dual Directional Coupler Agilent 778D /03/10 10dB Coaxial Coupler Agilent 87300C MY /03/10 Temperature/Humidity Meter Zhicheng ZC1-2 AC6-TH 2016/01/07 Peak Radiated Output Power / AC-5 Instrument Manufacturer Type No. Serial No Cali. Due Date Radio Communication Tester R&S CMU /03/10 Preamplifier Miteq NSP /05/03 Preamplifier QuieTek AP-040G CHM /05/03 Bilog Antenna Teseq GmbH CBL6112D /10/15 DRG Horn ETS-Lindgren /01/07 Broad-Band Horn Antenna Schwarzbeck BBHA9120D /03/01 Coaxial Cable Huber+Suhner SUCOFLEX 106 AC5-C1 2016/03/01 Coaxial Cable Huber+Suhner SUCOFLEX 106 AC5-C2 2016/03/01 Coaxial Cable Huber+Suhner SUCOFLEX 102 AC5-C3 2016/03/10 EMI Receiver Agilent N9038A MY /08/07 Temperature/Humidity Meter Zhichen ZC1-2 AC5-TH 2016/01/07 Page: 15 of 171
16 3.2. Test Setup Conducted Power Measurement: Radiated Power Measurement: 3.3. Test Procedure For Conducted Power Measurement: a) The RF output of the transmitter was connected to base station simulator. b) The RF output of EUT was connected to the spectrum analyzer by RF cable and attenuator. The path loss was compensated to the results for each measurement.. c) Set EUT at maximum average power by base station simulator. d) Measure lowest, middle, and highest channels for each bandwidth and different modulation. Page: 16 of 171
17 For Effective Isotropic Radiated Power Measurement: e) The EUT was placed on a turntable with 1.5 meter height in a fully anechoic chamber. f) The EUT was set at 3 meters from the receiving antenna, which was mounted on the antenna tower g) LTE operating modes: Set RBW= 100 KHz, VBW= 300 KHz, RMS detector over frame, and use h) channel power option with bandwidth=5mhz, per section 4.0 of KDB D01. i) The table was rotated 360 degrees to determine the position of the highest radiated power. j) The height of the receiving antenna is adjusted to look for the maximum EIRP. k) Taking the record of maximum EIRP. l) A dipole antenna was substituted in place of the EUT and was driven by a signal generator. m) The conducted power at the terminal of the dipole antenna is measured. n) Repeat step 3 to step 5 to get the maximum EIRP of the substitution antenna. o) EIRP = Ps + Et Es + Gs = Ps + Rt Rs + Gs. p) Ps (dbm):input power to substitution antenna q) Gs (dbi or dbd):substitution antenna Gain. r) Et = Rt + AF s) Es = Rs + AF t) AF (db/m):receive antenna factor u) Rt:The highest received signal in spectrum analyzer for EUT. v) Rs:The highest received signal in spectrum analyzer for substitution antenna Uncertainty The measurement uncertainty is defined as for Conducted Power Measurement ± 1.2 db, for Radiated Power Measurement ± 3.2 db Page: 17 of 171
18 3.5. Test Result Product Wireless Module Test Item Maximum Output Power Date of Test 2015/07/09 Test Site TR-8 LTE Band 26 For Part 22H BW [MHz] RB Size RB Offset Mod Maximum Average Power [dbm] Low Ch. / Freq. Mid Ch. / Freq. High Ch. / Freq. Channel Frequency QPSK QAM Channel Frequency QPSK QAM Page: 18 of 171
19 Channel Frequency QPSK QAM Channel Frequency QPSK QAM Page: 19 of 171
20 Channel Frequency QPSK QAM Note: All conducted measurements are based on a RMS detector. Page: 20 of 171
21 LTE Band 26 For Part 90S BW [MHz] RB Size RB Offset Mod Maximum Average Power [dbm] Low Ch. / Freq. Mid Ch. / Freq. High Ch. / Freq. Channel Frequency QPSK QAM Channel Frequency QPSK QAM Channel Page: 21 of 171
22 Frequency QPSK QAM Channel Frequency QPSK QAM Note: All conducted measurements are based on a RMS detector. Page: 22 of 171
23 Product Wireless Module Test Item Effective Isotropic Radiated Power Date of Test 2015/07/09 Test Site AC-5 LTE Band 26 for Part 22H LTE Band 26 Radiated Power EIRP LTE Channel Modulation RB Configuration Freq. EIRP H/V Band BW (MHz) RB Size RB Offset (MHz) (dbm) QPSK H QPSK H QPSK H QPSK V QPSK V QPSK V QAM H QAM H QAM H QAM V QAM V QAM V QPSK H QPSK H QPSK H QPSK V QPSK V QPSK V QAM H QAM H QAM H QAM V Page: 23 of 171
24 QAM V QAM V 26 5 QPSK H 26 5 QPSK H 26 5 QPSK H 26 5 QPSK V 26 5 QPSK V 26 5 QPSK V QAM H QAM H QAM H QAM V QAM V QAM V 26 3 QPSK H 26 3 QPSK H 26 3 QPSK H 26 3 QPSK V 26 3 QPSK V 26 3 QPSK V QAM H QAM H QAM H QAM V QAM V QAM V QPSK H QPSK H QPSK H QPSK V Page: 24 of 171
25 QPSK V QPSK V QAM H QAM H QAM H QAM V QAM V QAM V Page: 25 of 171
26 LTE Band 26 for Part 90S LTE Band 26 Radiated Power EIRP LTE Channel Modulation RB Configuration Freq. EIRP H/V Band BW (MHz) RB Size RB Offset (MHz) (dbm) QPSK H QPSK V QAM H QAM V 26 5 QPSK H 26 5 QPSK H 26 5 QPSK H 26 5 QPSK V 26 5 QPSK V 26 5 QPSK V QAM H QAM H QAM H QAM V QAM V QAM V 26 3 QPSK H 26 3 QPSK H 26 3 QPSK H 26 3 QPSK V 26 3 QPSK V 26 3 QPSK V QAM H QAM H QAM H Page: 26 of 171
27 QAM V QAM V QAM V QPSK H QPSK H QPSK H QPSK V QPSK V QPSK V QAM H QAM H QAM H QAM V QAM V QAM V Page: 27 of 171
28 4. Modulation Characteristic 4.1. Test Equipment Modulation Characteristic / AC-6 Instrument Manufacturer Type No. Serial No Cal. Due Date PSA Series Spectrum Analyzer Agilent E4440A MY /03/10 Radio Communication Tester Anritsu MT8820C /03/10 Dual Directional Coupler Agilent 778D /03/10 10dB Coaxial Coupler Agilent 87300C MY /03/10 Temperature/Humidity Meter Zhicheng ZC1-2 AC6-TH 2016/01/ Test Setup 4.3. Limit N/A 4.4. Uncertainty The measurement uncertainty is defined as 0.1% 4.5. Test Result The modulation of GSM/WCDMA was verified and confirmed compliance with requirement. Page: 28 of 171
29 5. Occupied Bandwidth 5.1. Test Equipment Occupied Bandwidth / AC-6 Instrument Manufacturer Type No. Serial No Cali. Due Date PSA Series Spectrum Analyzer Agilent E4440A MY /03/10 Radio Communication Tester R&S CMU /03/10 Dual Directional Coupler Agilent 778D /03/10 10dB Coaxial Coupler Agilent 87300C MY /03/10 Temperature/Humidity Meter Zhicheng ZC1-2 AC6-TH 2016/01/ Test Setup 5.3. Test Procedure 1. The EUT was connected to Spectrum Analyzer and Base Station via power divider. 2. The RF output of EUT was connected to the spectrum analyzer by RF cable and attenuator. The path loss was compensated to the results for each measurement. 3. The 99% occupied bandwidth and 26 db bandwidth of the middle channel for the highest RF powers were measured Uncertainty The measurement uncertainty is defined as ± 10 Hz Page: 29 of 171
30 5.5. Test Result LTE Band 26 For Part 22H Product Wireless Module Test Item Test Mode Occupied Bandwidth Mode 1: LTE Band 26(15M/QPSK) Date of Test 2015/07/09 Test Site AC6 Channel No. 99% Occupied -26dB Occupied Frequency Bandwidth Bandwidth (MHz) (khz) (khz) Figure Channel RB0 (831.50MHz) Page: 30 of 171
31 Figure Channel RB0 ( MHz) Figure Channel RB0 (841.50MHz) Page: 31 of 171
32 Product Wireless Module Test Item Occupied Bandwidth Test Mode Mode 1: LTE Band 26 (15M/16QAM) Date of Test 2015/07/09 Test Site AC6 Channel No. 99% Occupied -26dB Occupied Frequency Bandwidth Bandwidth (MHz) (khz) (khz) Figure Channel RB0 (831.50MHz) Page: 32 of 171
33 Figure Channel RB0 (836.50MHz) Figure Channel RB0 (841.50MHz) Page: 33 of 171
34 Product Wireless Module Test Item Occupied Bandwidth Test Mode Mode 1: LTE Band 26(10M/QPSK) Date of Test 2015/07/09 Test Site AC6 Channel No. 99% Occupied -26dB Occupied Frequency Bandwidth Bandwidth (MHz) (khz) (khz) Figure Channel RB0 (829.00MHz) Page: 34 of 171
35 Figure Channel RB0 (836.50MHz) Figure Channel RB0 (844.00MHz) Page: 35 of 171
36 Product Wireless Module Test Item Occupied Bandwidth Test Mode Mode 1: LTE Band 26 (10M/16QAM) Date of Test 2015/07/09 Test Site AC6 Channel No. 99% Occupied -26dB Occupied Frequency Bandwidth Bandwidth (MHz) (khz) (khz) Figure Channel RB0 (829.00MHz) Page: 36 of 171
37 Figure Channel RB0 (836.50MHz) Figure Channel RB0 (844.00MHz) Page: 37 of 171
38 Product Wireless Module Test Item Occupied Bandwidth Test Mode Mode 1: LTE Band 26(5M/QPSK) Date of Test 2015/07/09 Test Site AC6 Channel No. 99% Occupied -26dB Occupied Frequency Bandwidth Bandwidth (MHz) (khz) (khz) Figure Channel RB0 (826.50MHz) Page: 38 of 171
39 Figure Channel RB0 (836.50MHz) Figure Channel RB0 (846.50MHz) Page: 39 of 171
40 Product Wireless Module Test Item Occupied Bandwidth Test Mode Mode 1: LTE Band 26 (5M/16QAM) Date of Test 2015/07/09 Test Site AC6 Channel No. 99% Occupied -26dB Occupied Frequency Bandwidth Bandwidth (MHz) (khz) (khz) Figure Channel RB0 (826.50MHz) Page: 40 of 171
41 Figure Channel RB0 (836.50MHz) Figure Channel RB0 (846.50MHz) Page: 41 of 171
42 Product Wireless Module Test Item Occupied Bandwidth Test Mode Mode 1: LTE Band 26(3M/QPSK) Date of Test 2015/07/09 Test Site AC6 Channel No. 99% Occupied -26dB Occupied Frequency Bandwidth Bandwidth (MHz) (khz) (khz) Figure Channel RB0 (825.50MHz) Page: 42 of 171
43 Figure Channel RB0 (836.50MHz) Figure Channel RB0 (847.50MHz) Page: 43 of 171
44 Product Wireless Module Test Item Occupied Bandwidth Test Mode Mode 1: LTE Band 26 (3M/16QAM) Date of Test 2015/07/09 Test Site AC6 Channel No. 99% Occupied -26dB Occupied Frequency Bandwidth Bandwidth (MHz) (khz) (khz) Figure Channel RB0 (825.50MHz) Page: 44 of 171
45 Figure Channel RB0 (836.50MHz) Figure Channel RB0 (847.50MHz) Page: 45 of 171
46 Product Wireless Module Test Item Occupied Bandwidth Test Mode Mode 1: LTE Band 26(1.4M/QPSK) Date of Test 2015/07/09 Test Site AC6 Channel No. 99% Occupied -26dB Occupied Frequency Bandwidth Bandwidth (MHz) (khz) (khz) Figure Channel RB0 (824.70MHz) Page: 46 of 171
47 Figure Channel RB0 (836.50MHz) Figure Channel RB0 (848.3MHz) Page: 47 of 171
48 Product Wireless Module Test Item Occupied Bandwidth Test Mode Mode 1: LTE Band 26 (1.4M/16QAM) Date of Test 2015/07/09 Test Site AC6 Channel No. 99% Occupied -26dB Occupied Frequency Bandwidth Bandwidth (MHz) (khz) (khz) Figure Channel RB0 (824.70MHz) Page: 48 of 171
49 Figure Channel RB0 (836.50MHz) Figure Channel RB0 (848.30MHz) Page: 49 of 171
50 LTE Band 26 For Part 90S Product Wireless Module Test Item Occupied Bandwidth Test Mode Mode 1: LTE Band 26(10M/QPSK) Date of Test 2015/07/09 Test Site AC6 99% Occupied -26dB Occupied Frequency Channel No. Bandwidth Bandwidth (MHz) (khz) (khz) Figure Channel RB0 (819.00MHz) Page: 50 of 171
51 Product Wireless Module Test Item Occupied Bandwidth Test Mode Mode 1: LTE Band 26 (10M/16QAM) Date of Test 2015/07/09 Test Site AC6 99% Occupied -26dB Occupied Frequency Channel No. Bandwidth Bandwidth (MHz) (khz) (khz) Figure Channel RB0 (819.00MHz) Page: 51 of 171
52 Product Wireless Module Test Item Occupied Bandwidth Test Mode Mode 1: LTE Band 26(5M/QPSK) Date of Test 2015/07/09 Test Site AC6 Channel No. 99% Occupied -26dB Occupied Frequency Bandwidth Bandwidth (MHz) (khz) (khz) Figure Channel RB0 (816.50MHz) Page: 52 of 171
53 Figure Channel RB0 (819.00MHz) Figure Channel RB0 (821.50MHz) Page: 53 of 171
54 Product Wireless Module Test Item Occupied Bandwidth Test Mode Mode 1: LTE Band 26 (5M/16QAM) Date of Test 2015/07/09 Test Site AC6 Channel No. 99% Occupied -26dB Occupied Frequency Bandwidth Bandwidth (MHz) (khz) (khz) Figure Channel RB0 (816.50MHz) Page: 54 of 171
55 Figure Channel RB0 (819.00MHz) Figure Channel RB0 (821.50MHz) Page: 55 of 171
56 Product Wireless Module Test Item Occupied Bandwidth Test Mode Mode 1: LTE Band 26(3M/QPSK) Date of Test 2015/07/09 Test Site AC6 Channel No. 99% Occupied -26dB Occupied Frequency Bandwidth Bandwidth (MHz) (khz) (khz) Figure Channel RB0 (815.50MHz) Page: 56 of 171
57 Figure Channel RB0 (831.50MHz) Figure Channel RB0 (847.50MHz) Page: 57 of 171
58 Product Wireless Module Test Item Occupied Bandwidth Test Mode Mode 1: LTE Band 26 (3M/16QAM) Date of Test 2015/07/09 Test Site AC6 Channel No. 99% Occupied -26dB Occupied Frequency Bandwidth Bandwidth (MHz) (khz) (khz) Figure Channel RB0 (815.50MHz) Page: 58 of 171
59 Figure Channel RB0 (831.50MHz) Figure Channel RB0 (847.50MHz) Page: 59 of 171
60 Product Wireless Module Test Item Occupied Bandwidth Test Mode Mode 1: LTE Band 26(1.4M/QPSK) Date of Test 2015/07/09 Test Site AC6 Channel No. 99% Occupied -26dB Occupied Frequency Bandwidth Bandwidth (MHz) (khz) (khz) Figure Channel RB0 (814.70MHz) Page: 60 of 171
61 Figure Channel RB0 (819.00MHz) Figure Channel RB0 (823.3MHz) Page: 61 of 171
62 Product Wireless Module Test Item Occupied Bandwidth Test Mode Mode 1: LTE Band 26 (1.4M/16QAM) Date of Test 2015/07/09 Test Site AC6 Channel No. 99% Occupied -26dB Occupied Frequency Bandwidth Bandwidth (MHz) (khz) (khz) Figure Channel RB0 (814.70MHz) Page: 62 of 171
63 Figure Channel RB0 (819.00MHz) Figure Channel RB0 (823.30MHz) Page: 63 of 171
64 6. Conducted Band Edge 6.1. Test Equipment Spurious Emission At Antenna Terminals (+/- 1MHz) / AC-6 Instrument Manufacturer Type No. Serial No Cali. Due Date PSA Series Spectrum Analyzer Agilent E4440A MY /03/10 Radio Communication Tester R&S CMU /03/10 Dual Directional Coupler Agilent 778D /03/10 10dB Coaxial Coupler Agilent 87300C MY /03/10 Temperature/Humidity Meter Zhicheng ZC1-2 AC6-TH 2016/01/ Test Setup 6.3. Test Procedure 1. The EUT was connected to spectrum analyzer and System Simulator via power divider. 2. The RF output of EUT was connected to the spectrum analyzer by RF cable and attenuator. The path loss was compensated to the results for each measurement. 3. The conducted spurious emission for the whole frequency range was taken Uncertainty The measurement uncertainty is defined as ± 1.2 db. Page: 64 of 171
65 6.5. Test Result LTE Band 26 For Part 22H Product Wireless Module Test Item Test Mode Conducted Band Edge Mode 1: LTE Band 26 (15M/QPSK) Date of Test 2015/07/09 Test Site AC6 Figure Channel (831.50MHz) 1RB0 Page: 65 of 171
66 75RB0 Page: 66 of 171
67 Figure Channel (841.5MHz) 1RB74 Page: 67 of 171
68 75RB0 Page: 68 of 171
69 Product Wireless Module Test Item Conducted Band Edge Test Mode Mode 1: LTE Band 26 (15M/16QAM) Date of Test 2015/07/09 Test Site AC6 Figure Channel (831.50MHz) 1RB0 Page: 69 of 171
70 75RB0 Page: 70 of 171
71 Figure Channel (841.50MHz) 1RB74 Page: 71 of 171
72 75RB0 Page: 72 of 171
73 Product Wireless Module Test Item Conducted Band Edge Test Mode Mode 1: LTE Band 26 (10M/QPSK) Date of Test 2015/07/09 Test Site AC6 Figure Channel (829.00MHz) 1RB0 Page: 73 of 171
74 50RB0 Page: 74 of 171
75 Figure Channel (844.00MHz) 1RB49 Page: 75 of 171
76 50RB0 Page: 76 of 171
77 Product Wireless Module Test Item Conducted Band Edge Test Mode Mode 1: LTE Band 26 (10M/16QAM) Date of Test 2015/07/09 Test Site AC6 Figure Channel (829.00MHz) 1RB0 Page: 77 of 171
78 50RB0 Page: 78 of 171
79 Figure Channel (844.00MHz) 1RB49 Page: 79 of 171
80 50RB0 Page: 80 of 171
81 Product Wireless Module Test Item Conducted Band Edge Test Mode Mode 1: LTE Band 26 (5M/QPSK) Date of Test 2015/07/09 Test Site AC6 Figure Channel (826.5MHz) 1RB0 Page: 81 of 171
82 25RB0 Page: 82 of 171
83 Figure Channel (846.50MHz) 1RB24 Page: 83 of 171
84 25RB0 Page: 84 of 171
85 Product Wireless Module Test Item Conducted Band Edge Test Mode Mode 1: LTE Band 26 (5M/16QAM) Date of Test 2015/07/09 Test Site AC6 Figure Channel (826.5MHz) 1RB0 Page: 85 of 171
86 25RB0 Page: 86 of 171
87 Figure Channel (846.50MHz) 1RB24 Page: 87 of 171
88 25RB0 Page: 88 of 171
89 Product Wireless Module Test Item Conducted Band Edge Test Mode Mode 1: LTE Band 26 (3M/QPSK) Date of Test 2015/07/09 Test Site AC6 Figure Channel (825.50MHz) 1RB0 Page: 89 of 171
90 15RB0 Page: 90 of 171
91 Figure Channel (847.50MHz) 1RB14 Page: 91 of 171
92 15RB0 Page: 92 of 171
93 Product Wireless Module Test Item Conducted Band Edge Test Mode Mode 1: LTE Band 26 (3M/16QAM) Date of Test 2015/07/09 Test Site AC6 Figure Channel (825.50MHz) 1RB0 Page: 93 of 171
94 15RB0 Page: 94 of 171
95 Figure Channel (825.50MHz) 1RB14 Page: 95 of 171
96 15RB0 Page: 96 of 171
97 Product Wireless Module Test Item Conducted Band Edge Test Mode Mode 1: LTE Band 26 (1.4M/QPSK) Date of Test 2015/07/09 Test Site AC6 Figure Channel (824.70MHz) 1RB0 Page: 97 of 171
98 7RB0 Page: 98 of 171
99 Figure Channel (848.30MHz) 1RB6 Page: 99 of 171
100 7RB0 Page: 100 of 171
101 Product Wireless Module Test Item Conducted Band Edge Test Mode Mode 1: LTE Band 26 (1.4M/16QAM) Date of Test 2015/07/09 Test Site AC6 Figure Channel (824.70MHz) 1RB0 Page: 101 of 171
102 7RB0 Page: 102 of 171
103 Figure Channel ( MHz) 1RB6 Page: 103 of 171
104 7RB0 Page: 104 of 171
105 LTE Band 26 For Part 90S Product Wireless Module Test Item Conducted Band Edge Test Mode Mode 1: LTE Band 26 (10M/QPSK) Date of Test 2015/07/09 Test Site AC6 Figure Channel (819.00MHz) 1RB0 Page: 105 of 171
106 50RB0 Page: 106 of 171
107 Figure Channel (819.00MHz) 1RB0 Page: 107 of 171
108 50RB0 Page: 108 of 171
109 Product Wireless Module Test Item Conducted Band Edge Test Mode Mode 1: LTE Band 26 (10M/16QAM) Date of Test 2015/07/09 Test Site AC6 Figure Channel (819.00MHz) 1RB0 Page: 109 of 171
110 50RB0 Page: 110 of 171
111 Figure Channel (819.00MHz) 1RB0 Page: 111 of 171
112 50RB0 Page: 112 of 171
113 Product Wireless Module Test Item Conducted Band Edge Test Mode Mode 1: LTE Band 26 (5M/QPSK) Date of Test 2015/07/09 Test Site AC6 Figure Channel (816.5MHz) 1RB0 Page: 113 of 171
114 25RB0 Page: 114 of 171
115 Figure Channel (821.50MHz) 1RB24 Page: 115 of 171
116 25RB0 Page: 116 of 171
117 Product Wireless Module Test Item Conducted Band Edge Test Mode Mode 1: LTE Band 26 (5M/16QAM) Date of Test 2015/07/09 Test Site AC6 Figure Channel (816.5MHz) 1RB0 Page: 117 of 171
118 25RB0 Page: 118 of 171
119 Figure Channel (821.50MHz) 1RB24 Page: 119 of 171
120 25RB0 Page: 120 of 171
121 Product Wireless Module Test Item Conducted Band Edge Test Mode Mode 1: LTE Band 26 (3M/QPSK) Date of Test 2015/07/09 Test Site AC6 Figure Channel (815.50MHz) 1RB0 Page: 121 of 171
122 15RB0 Page: 122 of 171
123 Figure Channel (822.50MHz) 1RB14 Page: 123 of 171
124 15RB0 Page: 124 of 171
125 Product Wireless Module Test Item Conducted Band Edge Test Mode Mode 1: LTE Band 26 (3M/16QAM) Date of Test 2015/07/09 Test Site AC6 Figure Channel (815.50MHz) 1RB0 Page: 125 of 171
126 15RB0 Page: 126 of 171
127 Figure Channel (822.50MHz) 1RB14 Page: 127 of 171
128 15RB0 Page: 128 of 171
129 Product Wireless Module Test Item Conducted Band Edge Test Mode Mode 1: LTE Band 26 (1.4M/QPSK) Date of Test 2015/07/09 Test Site AC6 Figure Channel (814.70MHz) 1RB0 Page: 129 of 171
130 7RB0 Page: 130 of 171
131 Figure Channel (823.30MHz) 1RB6 Page: 131 of 171
132 7RB0 Page: 132 of 171
133 Product Wireless Module Test Item Conducted Band Edge Test Mode Mode 1: LTE Band 26 (1.4M/16QAM) Date of Test 2015/07/09 Test Site AC6 Figure Channel (814.70MHz) 1RB0 Page: 133 of 171
134 7RB0 Page: 134 of 171
135 Figure Channel (823.30MHz) 1RB6 Page: 135 of 171
136 7RB0 Page: 136 of 171
137 7. Spurious Emission 7.1. Test Equipment Conducted Emission / AC-6 Instrument Manufacturer Type No. Serial No Cali. Due Date PSA Series Spectrum Analyzer Agilent E4440A MY /03/10 Radio Communication Tester R&S CMU /03/10 Dual Directional Coupler Agilent 778D /03/10 10dB Coaxial Coupler Agilent 87300C MY /03/10 Temperature/Humidity Meter Zhicheng ZC1-2 AC6-TH 2016/01/07 Radiated Spurious Emission / AC-5 Instrument Manufacturer Type No. Serial No Cali. Due Date EMI Receiver Agilent N9038A MY /08/07 Radio Communication Tester R&S CMU /03/10 PSG Analog Signal Generator Agilent E8257D MY /03/10 Preamplifier QuieTek AP-025C CHM /04/11 Preamplifier Miteq NSP /05/03 DRG Horn ETS-Lindgren /01/07 Broad-Band Horn Antenna Schwarzbeck BBHA9120D /03/01 Coaxial Cable Huber+Suhner SUCOFLEX 106 AC5-C1 2016/03/01 Coaxial Cable Huber+Suhner SUCOFLEX 106 AC5-C2 2016/03/01 Coaxial Cable Huber+Suhner SUCOFLEX 102 AC5-C3 2016/03/10 EMI Receiver Agilent N9038A MY /01/07 Temperature/Humidity Meter Zhichen ZC1-2 AC5-TH 2016/01/07 Page: 137 of 171
138 7.2. Test Setup Conducted Spurious Measurement: below 1GHz Radiated Spurious Measurement: below 1GHz Page: 138 of 171
139 Radiated Spurious Measurement: above 1GHz Page: 139 of 171
140 7.3. Test Procedure Conducted Spurious Measurement: a) The EUT was connected to spectrum analyzer and System Simulator via power divider. b) The RF output of EUT was connected to the spectrum analyzer by RF cable and attenuator. The path loss was compensated to the results for each measurement. c) The conducted spurious emission for the whole frequency range was taken. Radiated Spurious Measurement: d) The EUT was placed on a rotatable wooden table with 1.5 meter above ground. e) The EUT was set 3 meters from the receiving antenna, which was mounted on the antenna tower. f) The table was rotated 360 degrees to determine the position of the highest spurious emission. g) The height of the receiving antenna is varied between one meter and four meters to search the maximum spurious emission for both horizontal and vertical polarizations. h) Make the measurement with the spectrum analyzer's RBW = 1MHz, VBW = 1MHz, Sweep 500ms, Taking the record of maximum spurious emission. i) A horn antenna was substituted in place of the EUT and was driven by a signal generator. j) Tune the output power of signal generator to the same emission level with EUT maximum spurious emission. k) Taking the record of output power at antenna port l) Repeat step 7 to step 8 for another polarization. m) EIRP = SG - Cable loss + Antenna Gain 7.4. Uncertainty The measurement uncertainty is defined as 3.2 db for Radiated Power Measurement. Page: 140 of 171
141 7.5. Test Result LTE Band 26 for Part 22H Product Wireless Module Test Item Test Mode Conducted Spurious Emission Mode 1: LTE Band 26 (10M/QPSK) Date of Test 2015/07/09 Test Site TR8 Report No.: R-HP-US-P07V01 Low Channel 26840(829.00MHz) 1RB0 Page: 141 of 171
142 Mid Channel 26915(836.50MHz) 1RB0 Page: 142 of 171
143 High Channel 26990(844.00MHz) 1RB0 Page: 143 of 171
144 Product Wireless Module Test Item Conducted Spurious Emission Test Mode Mode 1: LTE Band 26 (10M/16QAM) Date of Test 2015/07/09 Test Site TR8 Low Channel 26840(829.00MHz) 1RB0 Page: 144 of 171
145 Mid Channel 26915(836.50MHz) 1RB0 Page: 145 of 171
146 High Channel 26990(844.00MHz) 1RB0 Page: 146 of 171
147 LTE Band 26 For Part 90S Product Wireless Module Test Item Conducted Spurious Emission Test Mode Mode 1: LTE Band 26 (10M/16QAM) Date of Test 2015/07/09 Test Site TR8 Low Channel 26740(819.00MHz) 1RB0 Page: 147 of 171
148 Product Wireless Module Test Item Conducted Spurious Emission Test Mode Mode 1: LTE Band 26 (10M/16QAM) Date of Test 2015/07/09 Test Site TR8 Low Channel 26740(819.00MHz) 1RB0 Page: 148 of 171
149 LTE Band 26 For Part 22H Product Wireless Module Test Item Radiated Spurious Emission Test Mode Mode 1: LTE Band 26 (10M/QPSK) Date of Test 2015/07/09 Test Site AC-5 Frequency (MHz) SA Reading (dbm) Ant.Pol. (H/V) SG Reading (dbm) Cable Loss (db) Gain (dbi) EIRP (dbm) Limit (dbm) Margin (db) Low Channel (829.00MHz) 1RB V V H H Middle Channel (836.50MHz) 1RB V V H H High Channel (844.00MHz) 1RB V V H H Page: 149 of 171
150 Product Wireless Module Test Item Radiated Spurious Emission Test Mode Mode 1: LTE Band 26 (10M/16QAM) Date of Test 2015/07/09 Test Site AC-5 Frequency (MHz) SA Reading (dbm) Ant.Pol. (H/V) SG Reading (dbm) Cable Loss (db) Gain (dbi) EIRP (dbm) Limit (dbm) Margin (db) Low Channel (829.00MHz) 1RB V V H H Middle Channel (836.50MHz) 1RB V V H H High Channel (844.00MHz) 1RB V V H H Page: 150 of 171
151 LTE Band 26 For Part 90S Product Wireless Module Test Item Radiated Spurious Emission Test Mode Mode 1: LTE Band 26 (10M/QPSK) Date of Test 2015/07/09 Test Site AC-5 Frequency (MHz) SA Reading (dbm) Ant.Pol. (H/V) SG Reading (dbm) Cable Loss (db) Gain (dbi) EIRP (dbm) Limit (dbm) Margin (db) Low Channel (819.00MHz) 1RB V V H H Product Wireless Module Test Item Radiated Spurious Emission Test Mode Mode 1: LTE Band 26 (10M/16QAM) Date of Test 2015/07/09 Test Site AC-5 Frequency (MHz) SA Reading (dbm) Ant.Pol. (H/V) SG Reading (dbm) Cable Loss (db) Gain (dbi) EIRP (dbm) Limit (dbm) Margin (db) Low Channel (819.00MHz) 1RB V V H H Page: 151 of 171
152 8. Frequency Stability Under Temperature & Voltage Variations 8.1. Test Equipment Report No.: R-HP-US-P07V01 Frequency Stability Under Temperature & Voltage Variations / TR-7 Instrument Manufacturer Type No. Serial No Cali. Due Date PSA Series Spectrum Analyzer Agilent E4440A MY /03/10 Radio Communication Tester R&S CMU /03/10 Dual Directional Coupler Agilent 778D /03/10 10dB Coaxial Coupler Agilent 87300C MY /03/10 DC Power Supply IDRC CD PR /03/10 Temperature & Humidity Chamber Gaoyu TH-1P-B WIT /01/07 Temperature/Humidity Meter Zhicheng ZC1-2 AC6-TH 2016/01/ Test Setup Page: 152 of 171
153 8.3. Test Procedure Frequency Stability Under Temperature Variations: The equipment under test was connected to an external AC or DC power supply and input rated voltage. RF output was connected to a frequency counter or spectrum analyzer via feed through attenuators. The EUT was placed inside the temperature chamber. Set the spectrum analyzer RBW low enough to obtain the desired frequency resolution and measure EUT 20 operating frequency as reference frequency. Turn EUT off and set the chamber temperature to -30. After the temperature stabilized for approximately 30 minutes recorded the frequency. Repeat step measure with 10 increased per stage until the highest temperature of +50 reached. Frequency Stability Under Voltage Variations: Set chamber temperature to 20. Use a variable AC power supply / DC power source to power the EUT and set the voltage to rated voltage. Set the spectrum analyzer RBW low enough to obtain the desired frequency resolution and recorded the frequency. Reduce the input voltage to specify extreme voltage variation (±15%) and endpoint, record the maximum frequency change Uncertainty The measurement uncertainty is defined as ± 10 Hz. Page: 153 of 171
154 8.5. Test Result LTE Band 26 for Part 22H Product Test Item Test Mode Wireless Module Report No.: R-HP-US-P07V01 Frequency Stability Under Temperature & Voltage Variations Mode 1: LTE Band 26 (15M/QPSK) Date of Test 2015/07/09 Test Site TR7 Temperature Interval ( ) Frequency Stability under Temperature Test Frequency Deviation (MHz) (Hz) Limit (Hz) ± ± ± ± ± ± ± ± ± Frequency Stability under Voltage DC Voltage (V) Test Frequency (MHz) Deviation (Hz) Limit (Hz) ± ± ± Page: 154 of 171
155 Product Wireless Module Test Item Frequency Stability Under Temperature & Voltage Variations Test Mode Mode 1: LTE Band 26 (15M/16QAM) Date of Test 2015/07/09 Test Site TR7 Temperature Interval ( ) Frequency Stability under Temperature Test Frequency Deviation (MHz) (Hz) Limit (Hz) ± ± ± ± ± ± ± ± ± Frequency Stability under Voltage DC Voltage (V) Test Frequency (MHz) Deviation (Hz) Limit (Hz) ± ± ± Page: 155 of 171
156 Product Wireless Module Test Item Frequency Stability Under Temperature & Voltage Variations Test Mode Mode 1: LTE Band 26 (10M/QPSK) Date of Test 2015/07/09 Test Site TR7 Temperature Interval ( ) Frequency Stability under Temperature Test Frequency Deviation (MHz) (Hz) Limit (Hz) ± ± ± ± ± ± ± ± ± Frequency Stability under Voltage DC Voltage (V) Test Frequency (MHz) Deviation (Hz) Limit (Hz) ± ± ± Page: 156 of 171
157 Product Wireless Module Test Item Frequency Stability Under Temperature & Voltage Variations Test Mode Mode 1: LTE Band 26 (10M/16QAM) Date of Test 2015/07/09 Test Site TR7 Temperature Interval ( ) Frequency Stability under Temperature Test Frequency Deviation (MHz) (Hz) Limit (Hz) ± ± ± ± ± ± ± ± ± Frequency Stability under Voltage DC Voltage (V) Test Frequency (MHz) Deviation (Hz) Limit (Hz) ± ± ± Page: 157 of 171
158 Product Wireless Module Test Item Frequency Stability Under Temperature & Voltage Variations Test Mode Mode 1: LTE Band 26 (5M/QPSK) Date of Test 2015/07/09 Test Site TR7 Temperature Interval ( ) Frequency Stability under Temperature Test Frequency Deviation (MHz) (Hz) Limit (Hz) ± ± ± ± ± ± ± ± ± Frequency Stability under Voltage DC Voltage (V) Test Frequency (MHz) Deviation (Hz) Limit (Hz) ± ± ± Page: 158 of 171
159 Product Wireless Module Test Item Frequency Stability Under Temperature & Voltage Variations Test Mode Mode 1: LTE Band 26 (5M/16QAM) Date of Test 2015/07/09 Test Site TR7 Temperature Interval ( ) Frequency Stability under Temperature Test Frequency Deviation (MHz) (Hz) Limit (Hz) ± ± ± ± ± ± ± ± ± Frequency Stability under Voltage DC Voltage (V) Test Frequency (MHz) Deviation (Hz) Limit (Hz) ± ± ± Page: 159 of 171
160 Product Wireless Module Test Item Frequency Stability Under Temperature & Voltage Variations Test Mode Mode 1: LTE Band 26 (3M/QPSK) Date of Test 2015/07/09 Test Site TR7 Temperature Interval ( ) Frequency Stability under Temperature Test Frequency Deviation (MHz) (Hz) Limit (Hz) ± ± ± ± ± ± ± ± ± Frequency Stability under Voltage DC Voltage (V) Test Frequency (MHz) Deviation (Hz) Limit (Hz) ± ± ± Page: 160 of 171
161 Product Wireless Module Test Item Frequency Stability Under Temperature & Voltage Variations Test Mode Mode 1: LTE Band 26 (3M/16QAM) Date of Test 2015/07/09 Test Site TR7 Temperature Interval ( ) Frequency Stability under Temperature Test Frequency Deviation (MHz) (Hz) Limit (Hz) ± ± ± ± ± ± ± ± ± Frequency Stability under Voltage DC Voltage (V) Test Frequency (MHz) Deviation (Hz) Limit (Hz) ± ± ± Page: 161 of 171
162 Product Wireless Module Test Item Frequency Stability Under Temperature & Voltage Variations Test Mode Mode 1: LTE Band 26 (1.4M/QPSK) Date of Test 2015/07/09 Test Site TR7 Temperature Interval ( ) Frequency Stability under Temperature Test Frequency Deviation (MHz) (Hz) Limit (Hz) ± ± ± ± ± ± ± ± ± Frequency Stability under Voltage DC Voltage (V) Test Frequency (MHz) Deviation (Hz) Limit (Hz) ± ± ± Page: 162 of 171
163 Product Wireless Module Test Item Frequency Stability Under Temperature & Voltage Variations Test Mode Mode 1: LTE Band 26 (1.4M/16QAM) Date of Test 2015/07/09 Test Site TR7 Temperature Interval ( ) Frequency Stability under Temperature Test Frequency Deviation (MHz) (Hz) Limit (Hz) ± ± ± ± ± ± ± ± ± Frequency Stability under Voltage DC Voltage (V) Test Frequency (MHz) Deviation (Hz) Limit (Hz) ± ± ± Page: 163 of 171
164 LTE Band 26 For Part 90S Product Wireless Module Test Item Frequency Stability Under Temperature & Voltage Variations Test Mode Mode 1: LTE Band 26 (10M/QPSK) Date of Test 2015/07/09 Test Site TR7 Temperature Interval ( ) Frequency Stability under Temperature Test Frequency Deviation (MHz) (Hz) Limit (Hz) ± ± ± ± ± ± ± ± ± Frequency Stability under Voltage DC Voltage (V) Test Frequency (MHz) Deviation (Hz) Limit (Hz) ± ± ± Page: 164 of 171
165 Product Wireless Module Test Item Frequency Stability Under Temperature & Voltage Variations Test Mode Mode 1: LTE Band 26 (10M/16QAM) Date of Test 2015/07/09 Test Site TR7 Temperature Interval ( ) Frequency Stability under Temperature Test Frequency Deviation (MHz) (Hz) Limit (Hz) ± ± ± ± ± ± ± ± ± Frequency Stability under Voltage DC Voltage (V) Test Frequency (MHz) Deviation (Hz) Limit (Hz) ± ± ± Page: 165 of 171
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