UNH IOL SAS Consortium SAS-3 Phy Layer Test Suite v1.0
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1 SAS-3 Phy Layer Test Suite v1.0 InterOperability Lab 121 Technology Drive, Suite 2 Durham, NH (603) Cover Letter XX/XX/XXXX Vendor Company Vendor: Enclosed are the results from the SAS-3 Clause 5 Physical Layer testing performed on the: Device Under Test The testing was performed according to Version 1.00 of the Clause 5 SAS-3 Physical Layer Test Suite, which is available online at: Note that the tests defined in this test suite are based on Clause 5 of the SAS-3 specification, ISO/IEC :201x, Serial Attached SCSI-3 (SAS-3) Standard T10/2212-D, Revision 05a. Please feel free to contact me at mklempa@iol.unh.edu if you have any questions regarding the test suite, or the results contained in this report. Sincerely, Michael Klempa
2 The University of New Hampshire InterOperability Laboratory Digital Signature Information This document was created using an Adobe digital signature. A digital signature helps to ensure the authenticity of the document, but only in this digital format. For information on how to verify the integrity of this document, please proceed to the following site: If, after following the steps indicated above, the document status still indicates Validity of author NOT confirmed, please contact the UNH-IOL to confirm the document s authenticity. To further validate the certificate integrity, Adobe 6.0 should report the following fingerprint information: MD5 Fingerprint (2013): D 1D 3C A4 1E 95 EE 03 7B 1B 2B 7D SHA-1 Fingerprint (2013): 48 9E 57 F A DA 39 4C B 11 AE 1E 4D 3B 7E Digitally signed by UNH-IOL Date: :22:24-04'00' 2
3 Table 1: Test Equipment and DUT Configuration/Feature Information DUT Details Manufacturer Model SAS Device Type (IT/CT) Mfr. Serial Number Port Tested Firmware Version Hardware Version Software Version UNH-IOL ID Number DUT: Reported Features DUT is a CT device DUT is an IT device that supports SATA DUT supports SSC on TX Test System Hardware Real-time DSO Sampling Scope MDI-to-SMA Adapter Vector Network Analyzer Additional Comments/Notes Agilent Infiniium DSO91304A, 13GHz, 40GS/s Real-time DSO Agilent DCA-J 86100C, with 86108B 50GHz Precision Waveform Analyzer Wilder Technologies SAS Receptacle Test Adapter Part No Agilent E5071C ENA S-Parameter measurements (Table 5, and Figures 19 through 30) were initially performed with the SAS mated connector pair included, and the TX and RX common-mode return loss results were both observed to be outside the conformance limits. (Note this is a common and expected problem, due to the common-mode characteristics of most SAS connectors.) The common-mode S-parameters were re-measured using timegating to remove the connector from the measurements. The eyemask used for 12G is informative. 3
4 Table 2: Group 1 - TX OOB Signaling Tests Test/Parameter Valid Range Measured Units Figure Test 5.1.1: AC TX Maximum Noise During OOB Idle Maximum peak-to-peak OOB idle noise < mvppd 1 Test 5.1.2: TX OOB Burst Amplitude (ZL Test Load): < mvppd 2 (ZL Test Load): > mvppd 2 (3G TCTF Load): < mvppd 3 (3G TCTF Load): > mvppd 3 Test 5.1.3: TX OOB Offset Delta Mean differential voltage during OOB burst -25/ mv 1 Test 5.1.4: TX OOB Common Mode Delta Mean common-mode voltage during OOB burst -50/+50 (61.9) mv 4 4
5 Table 3: Group 2 - TX SSC Requirements Test/Parameter Valid Range Measured Units Fig. Test 5.2.1: TX SSC Modulation Frequency Frequency of SSC modulation 30/ khz 6 Test 5.2.2: TX SSC Modulation Deviation and Balance (If DUT is a SAS phy that supports Down-spreading): Average upper SSC peak value: < ppm 6 Average lower SSC peak value: > ppm 6 (If DUT is an Expander phy that supports Centerspreading): Average upper SSC peak value: < 1000 N/P* ppm 8 Average lower SSC peak value: > N/P* ppm 8 Deviation Asymmetry: < 288 N/P* ppm 8 (If DUT is an Expander phy that supports Down-spreading when connected to SATA devices): Average upper SSC peak value: < N/A N/A* ppm - Average lower SSC peak value: > N/A N/A* ppm - Test 5.2.3: TX SSC df/dt (Informative) Peak df/dt: (SAS Down-spreading case) -850/ ppm/us 7 Peak df/dt: (SAS Center-spreading case) -850/+850 N/P* ppm/us 9 Peak df/dt: (SATA Down-spreading case) -850/+850 N/A* ppm/us - *N/P: This test was not performed because the DUT does not support SSC Center spreading. *N/A: This test is not applicable. 5
6 Table 4: Group 3 - TX NRZ Data Signaling Requirements Test/Parameter Range Measured Units Figure Test 5.3.1: TX Physical Link Rate Long Term Stability Mean TX bitrate (SSC disabled): -100/ ppm 10 Test 5.3.2: TX Common Mode RMS Voltage Limit RMS common-mode voltage: < mv Test 5.3.3: TX Common Mode Spectrum Minimum margin with respect to limit line: > 0 See Figure dbmv 11 Test 5.3.4: TX Peak-to-Peak Voltage TX peak-to-peak voltage: 536/ mv 12 Test 5.3.5: TX VMA and EQ TX Voltage Modulation Amplitude: >= mv 13 TX Equalization: 2/4 (1.82) db 13 Test 5.3.6: TX Rise and Fall Times TX rise time while transmitting 1010 pattern: >= ps 14 TX fall time while transmitting 1010 pattern: >= ps 14 Test 5.3.7: TX Random Jitter (RJ) Peak-to-peak 1E-12 BER with 1100 pattern: <= 150 (169.2) mui - Test 5.3.8: TX Total Jitter (TJ) Pk-pk TJ with 1100 pattern (SSC disabled): <= mui 15 Pk-pk TJ with 1100 pattern (SSC Down-spreading): <= mui 16 Pk-pk TJ with 1100 pattern (SSC Center-spreading): <= 250 N/P 1 * mui 17 Test 5.3.9: TX Waveform Distortion Penalty (WDP) SASWDP result for SCRAMBLED_0 pattern: < 13 N/P 2 * db 18 * N/P 1 : This test was not performed because the DUT does not support SSC Center spreading. * N/P 2 : This test was not performed, as it does not apply to this rate. 6
7 Table 5: Group 4 - S-Parameter Requirements Test/Parameter Range Measured Units Fig. Test 5.4.1: RX Differential Return Loss (SDD11) Minimum SDD11 margin: > db 19 Test 5.4.2: RX Common-Mode Return Loss (SCC11) Minimum SCC11 margin: > db 20 Test 5.4.3: RX Differential Impedance Imbalance (SCD11) Minimum SCD11 margin: > db 21 Test 5.4.4: TX Differential Return Loss (SDD22) Minimum SDD22 margin: > db 22 Test 5.4.5: TX Common-Mode Return Loss (SCC22) Minimum SCC22 margin: > db 23 Test 5.4.6: TX Differential Impedance Imbalance (SCD22) Minimum SCD22 margin: > db 24 7
8 Figure 1: TX Idle Noise and TX Offset Delta (Zero-Length Test Load) 8
9 Figure 2: OOB Maximum and Minimum Amplitude (Zero-Length Test Load) 9
10 Figure 3: OOB Maximum and Minimum Amplitude (3G TCTF) 10
11 Figure 4: TX OOB Common-Mode Delta (Zero-Length Test Load) 11
12 Figure 5: SSC + Link Rate Stability LPF Test Filter Response 12
13 Figure 6: SSC Profile (1010 Pattern, SAS Down-Spreading Case) 13
14 Figure 7: SSC df/dt (1010 Pattern, SAS Down-Spreading Case) 14
15 Figure 8: SSC Profile (1010 Pattern, SAS Center-Spreading Case) 15
16 Figure 9: SSC df/dt (1010 Pattern, SAS Center-Spreading Case) 16
17 Figure 10: TX Physical Link Rate Long Term Stability (1010 Pattern, SSC OFF) 17
18 Figure 11: TX Common Mode RMS Voltage Spectrum (CJTPAT Pattern, SSC OFF) 18
19 Figure 12: TX Vpp (D30.3 Pattern, SSC OFF) 19
20 Figure 13: TX VMA and EQ (TRAIN_DONE Pattern, SSC OFF) 20
21 Figure 14: TX Rise and Fall Times (1010 Pattern, SSC OFF) 21
22 Figure 15: TX Eye Diagram (1100 Pattern, SSC OFF) 22
23 Figure 16: TX Eye Diagram (1100 Pattern, SSC Down-Spreading) 23
24 Figure 17: TX Eye Diagram (1100 Pattern, SSC Center-Spreading) 24
25 Figure 18: SASWDP BER Eye (SCRAMBLED_0 Pattern, SSC OFF) 25
26 Figure 19: Ungated RX Differential Return Loss (SDD11) 26
27 Figure 20: Gated RX Common-Mode Return Loss (SCC11) 27
28 Figure 21: Ungated RX Differential Impedance Imbalance (SDC11) 28
29 Figure 22: Ungated TX Differential Return Loss (SDD22) 29
30 Figure 23: Gated TX Common-Mode Return Loss (SCC22) 30
31 Figure 24: Ungated TX Differential Impedance Imbalance (SDC22) 31
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