Low Power Quint AND/NAND Gate

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1 Low Power Quint AND/NAND Gate General Description The is monolithic quint AND/NAND gate. The Function output is the wire-nor of all five AND gate outputs. All inputs have 50 kω pull-down resistors. Features n Low Power Operation Logic Symbol August 1998 n 2000V ESD protection n Pin/function compatible with n Voltage compensated operating range = 4.2V to 5.7V n Available to industrial grade temperature range n Available to Standard Microcircuit Drawing (SMD) Low Power Quint AND/NAND Gate Logic Equation DS F = (D 1a D 2a )+(D 1b D 2b )+D 1c D 2c )+(D 1d D 2d )+(D 1e D 2e ). Pin Names D na D ne F O a O e O a O e Description Data Inputs Function Output Data Outputs Complementary Data Outputs 1998 National Semiconductor Corporation DS

2 Connection Diagrams 24-Pin DIP 24-Pin Quad Cerpak DS DS

3 Absolute Maximum Ratings (Note 1) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. Above which the useful life may be impaired Storage Temperature (T STG ) 65 C to +150 C Maximum Junction Temperature (T J ) Ceramic +175 C V EE Pin Potential to Ground Pin 7.0V to +0.5V Input Voltage (DC) V EE to +0.5V Output Current (DC Output HIGH) 50 ma ESD (Note 2) Recommended Operating Conditions 2000V Case Temperature (T C ) Military 55 C to +125 C Supply Voltage (V EE ) 5.7V to 4.2V Note 1: Absolute maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: ESD testing conforms to MIL-STD-883, Method Military Version DC Electrical Characteristics V EE = 4.2V to 5.7V, V CC = V CCA = GND, T C = 55 C to +125 C Symbol Parameter Min Max Units T C Conditions Notes V OH Output HIGH Voltage mv 0 C to +125 C mv 55 C V IN = V IH (Max) Loading with (Notes 3, 4, 5) V OL Output LOW Voltage mv 0 C to or V IL (Min) 50Ω0 to 2.0V +125 C mv 55 C V OHC Output HIGH Voltage 1035 mv 0 C to +125 C 1085 mv 55 C V IN = V IH (Min) Loading with (Notes 3, 4, 5) V OLC Output LOW Voltage 1610 mv 0 C to or V IL (Max) 50Ω to 2.0V +125 C 1555 mv 55 C V IH Input HIGH Voltage mv 55 C Guaranteed HIGH Signal (Notes 3, 4, 5, 6) +125 C for All Inputs V IL Input LOW Voltage mv 55 C to Guaranteed LOW Signal (Notes 3, 4, 5, 6) +125 C for All Inputs I IL Input LOW Current 0.50 µa 55 C to V EE = 4.2V (Notes 3, 4, 5) +125 C V IN = V IL (Min) Input High Current D 2a D 2e 250 µa 0 C to D 1a D 1e C V EE = 5.7V (Notes 3, 4, 5) I IH V IN = V IH (Max) D 2a D 2e 350 µa 55 C D 1a D 1e 500 I EE Power Supply Current ma 55 C to Inputs Open (Notes 3, 4, 5) +125 C Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals 55 C), then testing immediately without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides cold start specs which can be considered a worst case condition at cold temperatures. Note 4: Screen tested 100% on each device at 55 C, +25 C, and +125 C, Subgroups, 1, 2 3, 7, and 8. Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at 55 C, +25 C, and +125 C, Subgroups A1, 2, 3, 7, and 8. Note 6: Guaranteed by applying specified input condition and testing V OH /V OL. 3

4 AC Electrical Characteristics V EE = 4.2V to 5.7V, V CC = V CCA = GND Symbol Parameter T C = 55 C T C = +25 C T C = +125 C Units Conditions Notes Min Max Min Max Min Max t PLH Propagation Delay ns t PHL D na D ne to O, O (Notes 7, 8, 9) t PLH Propagation Delay ns Figures 1, 2 t PHL Data to F t TLH Transition Time ns (Note 10) t THL 20% to 80%, 80%to 20% Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals 55 C), then testing immediately after power-up. This provides cold start specs which can be considered a worst case condition at cold temperatures. Note 8: Screen tested 100% on each device at +25 C temperature only, Subgroup A9. Note 9: Sample tested (Method 5005, Table I) on each mfg. lot at +25 C, Subgroup A9, and at +125 C and 55 C temperatures, Subgroups A10 and A11. Note 10: Not tested at +25 C, +125 C, and 55 C temperature (design characterization data). Test Circuitry Notes: V CC,V CCA = +2V, V EE = 2.5V L1 and L2 = equal length 50Ω impedance lines R T = 50Ω terminator internal to scope Decoupling 0.1 µf from GND to V CC and V EE All unused outputs are loaded with 50Ω to GND C L = Fixture and stray capacitance 3pF FIGURE 1. AC Test Circuit DS

5 Switching Waveforms DS FIGURE 2. Propagation Delay and Transition Times 5

6 6

7 Physical Dimensions inches (millimeters) unless otherwise noted 24-Pin Ceramic Dual-In-Line Package (D) NS Package Number J24E 24-Pin Quad Cerpak (F) NS Package Number W24B 7

8 Low Power Quint AND/NAND Gate LIFE SUPPORT POLICY NATIONAL S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DE- VICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMI- CONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. National Semiconductor Corporation Americas Tel: Fax: support@nsc.com National Semiconductor Europe Fax: +49 (0) europe.support@nsc.com Deutsch Tel: +49 (0) English Tel: +49 (0) Français Tel: +49 (0) Italiano Tel: +49 (0) National Semiconductor Asia Pacific Customer Response Group Tel: Fax: sea.support@nsc.com National Semiconductor Japan Ltd. Tel: Fax: National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.

9 National Semiconductor Company Product Folder Design Purchasing Quality Company Jobs Products > Military/Aerospace > Logic > ECL > Low Power Quint AND/NAND Gate Contents General Description Features Datasheet Package Availability, Models, Samples & Pricing General Description The is monolithic quint AND/NAND gate. The Function output is the wire-nor of all five AND gate outputs. All inputs have 50 k Ohm pull-down resistors. Features Low Power Operation 2000V ESD protection Pin/function compatible with Voltage compensated operating range = -4.2V to -5.7V Available to industrial grade temperature range Available to Standard Microcircuit Drawing (SMD) Datasheet

10 Order Parts 50+ Order Parts 50+ Title Please use Adobe Acrobat to view PDF file(s). If you have trouble printing, see Printing Problems. Size (in Kbytes) Date View Online Download Receive via Low Power Quint AND/NAND Gate 109 Kbytes 4-Sep-98 View Online Download Receive via Mil-Aero Datasheet MN X 105 Kbytes View Online Download Receive via Package Availability, Models, Samples & Pricing Part Number [Information as of 1-Sep-2000] Package Models Samples Budgetary Pricing & Status Electronic Type # pins SPICE IBIS Quantity $US each Orders MXA Cerdip 24 Full production N/A N/A MYA Cerquad 24 Full production N/A N/A.. $ $ VXA Cerdip 24 Full production N/A N/A. 50+ $ VYA Cerquad 24 Full production N/A N/A. 50+ $ Std Pack Size tube of 15 tube of 14 tube of 15 tube of 14 Package Marking [logo] Z S 4 A$E DMQB /Q MXA [logo] Z S 4 A Q$E FMQB MYA [logo] Z S 4 A$E J-QMLV VXA [logo] Z S 4 A W- QMLV VYA $E MW8 wafer Full production N/A N/A. N/A -

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