3GPP LTE Solution. MS2690A/MS2691A/MS2692A Signal Analyzer. MS2830A Signal Analyzer

Transcription

1 Product Introduction 3GPP LTE Solution MS2690A/MS2691A/MS2692A Signal Analyzer MS2830A Signal Analyzer MX269020A LTE Downlink Measurement Software MX269021A LTE Uplink Measurement Software MX269908A LTE IQproducer

2 MS2690A/MS2691A/MS2692A Signal Analyzer MS2830A Signal Analyzer 3GPP LTE Solution MX269020A LTE Downlink Measurement Software MX269021A LTE Uplink Measurement Software MX269908A LTE IQproducer (Version 5.00) Anritsu Corporation Slide 1

3 Support from R&D to Manufacturing Customized cost performance and lower production costs are supported by a choice of the MS269xA high-end model with high performance and functions, and the MS2830A mid-range model with high speed and low cost. R&D Verification Prototype Manufacturing MS269xA MS2830A MS269xA Signal Analyzer High-performance and highfunction high-end model Slide 2 New! MS2830A Signal Analyzer High-speed and low-cost mid-range model

4 MS269xA Signal Analyzer Spectrum Analyzer (SPA) Function World-class dynamic range Avg. noise level: 155 dbm/hz (2 GHz) TOI: +22 dbm W-CDMA ACLR: 78 5 MHz Superior absolute amplitude accuracy up to 6 GHz ±0.3 db (50 Hz to 6 GHz) typ. Signal Analyzer (VSA) Function Wideband FFT analysis of MHz Option upgrade to 125 MHz Digitize waveforms capture function Multi-domain waveform analysis Save captured waveforms as IQ data MS2690A (50 Hz to 6.0 GHz) MS2691A (50 Hz to 13.5 GHz) MS2692A (50 Hz to 26.5 GHz) Slide 3 Vector Signal Generator (SG) (option) Frequency range: 125 MHz to 6 GHz RF Modulation bandwidth: 120 MHz Built in BER measurement function Built-in AWGN addition function

5 MS2830A Signal Analyzer MS2830A-040: 9 khz to 3.6 GHz MS2830A-041: 9 khz to 6.0 GHz MS2830A-043: 9 khz to 13.5 GHz 10 Times Faster Local measurement, display update time: 2.1 ms (SWT: 1ms) : 0.7 ms (SWT: 100us) Remote measurement, LAN transmission: 4.0ms Marker peak search: 1.5 ms Frequency switching +sweep + trace data transmission: 12 ms (RF/microwave band) High RF Performance Displayed Avg. Noise Level: 153 dbm/hz (30 MHz to 1GHz) TOI : +15 dbm (300 MHz to 3.5 GHz) Total Level Accuracy: ±0.3 db Typ. (300 khz to 4.0 GHz) Low Cost Plus High Performance High RF performance with low cost SG, SA all-in-one solution cuts costs by up to 30% Excellent Expandability Options Flexible configuration from basic spectrum analyzer to TRx all-in-one solution using options -Analysis Bandwidth Option- MS2830A-005: Analysis Bandwidth Extension to 31.25MHz MS2830A-006: Analysis Bandwidth 10 MHz -Vector Signal Generator Option- MS2830A-020: 3.6 GHz Vector Signal Generator MS2830A-021: 6 GHz Vector Signal Generator Low Power Consumption (45% down compared to conventional product) 110VA for 3.6/6 GHz SPA configuration CO2: Down 45%, Waste: Down 50% Slide 4

6 LTE Measurement Software 3GPP LTE Transmitter Measurement MX269020A LTE Downlink Measurement Software MX269021A LTE Uplink Measurement Software One unit supports LTE TRx analysis MS269xA 3GPP LTE Receiver Measurement MX269908A LTE IQproducer TM (MS269xA/MS2830A For Vector Signal Generator Option) MS2830A *MX269020A and MX269021A supported by December 2009 version Slide 5 Note: MX269021A PRACH measurement is not compliant with TS V8.3.1 Annex E.6.

7 LTE Measurement Software Features (1) Offers low residual EVM of 1% ( 0.5% typ.) and total level accuracy of ±0.6 db, which are required for developing LTE equipment. (2) Supports one-button spectrum analysis (Channel Power, OBW, ACLR, SEM) with wide dynamic range. (3) Easy measurement of test model signals Downlink (4) Installs replay function for troubleshooting faults (saves and replays 200 waveform frames). (5) EVM Window Length function offers flexible changing of FFT timing, which is useful for verifying multi-path and Ramp effects, etc. Slide 6

8 (1) Excellent Low Residual EVM and Total Level Accuracy The Anritsu MS269xA and MS2830A with unique built-in calibrator supports low residual EVM (<0.5% typ.) and excellent total level accuracy (±0.6 db). In particular, the MS269xA supports low residual EVM (<0.5% typ.) for LTE development and design margins. MS269xA Circuit Configuration Example of EVM Measurement Result (MS269xA) Downlink 20 MHz band, 64QAM EVM (rms): 0.31% Excellent EVM performance and level accuracy using internal calibrator *MS2830A: 300 khz to 4 GHz *Residual EVM catalog standards LTE DL: MS269xA: 1.0%, MS2830A: 1.3% LTE UL: MS269xA: 1.0%, MS2830A: 1.2% Slide 7

9 (2) Industry Leading Dynamic Range and Simple Measurement Simple one-touch operations measures each spectrum. In particular, the MS269xA supporting industry leading dynamic range assures true measurement of spectrum performance. One-touch Measurement Industry Leading Dynamic Range MS269xA specification Versatile Spectrum Measurements Channel Power Occupied Bandwidth ACLR SEM Slide 8

10 (3) Easy Measurement of Test Model Signals Downlink Test model signals defined in 3GPP TS as test patterns for BTS Tx tests are easily measured by selecting the test model name. Easy measurement by selecting test model name Slide 9

11 (4) Replay Function for Troubleshooting Faults Up to 200 frames of LTE signals can be captured as a file for replay by the LTE measurement software to perform analyses, such as EVM measurement. LTE Capture up to 200 frames seamlessly. Analyze offline by reading files. DUT Capture File Example of R&D use Save data for comparing each DUT test version Supports comparison of retrofitting improvement effects Example of production line use Save shipping inspection data Supports rechecking of performance data for troubleshooting post-shipping faults Slide 10

12 (5) EVM Window Length Function The EVM Window Length function supports flexible changing of FFT timing, which is useful for verification, such as the effect of multi-paths and Ramps. Ramp Ramp Direct Signal CP Useful symbol Multi-path Signal CP Useful symbol Change FFT Timing EVM Window (analysis range) EVM Window (analysis range) EVM Window (analysis range) Measurement result: Bad (Include other symbols of multi-path) Measurement result: Not Good (Include Ramp) Measurement result: Good (Exclude other symbols and Ramp) Slide 11

13 Details of LTE Measurement Software Functions Slide 12

14 LTE Measurement Software Display Configuration Common Settings IQ Constellation Numeric Results Operation Menu Graph Results Slide 13

15 Common Functions Operating Band 600 to 2700 MHz Channel Bandwidth 1.4 / 3 / 5 / 10 / 15 / 20 MHz PDSCH/PUSCH Modulation Scheme QPSK / 16QAM / 64QAM / Auto Analysis Time Length 10 subframes max. (1 frame) *Analyze up to 200 frames using Replay function. Slide 14

16 Measurement Functions (1/3) Text Display -Frequency Error -Output Power -EVM (Peak/rms) -Origin Offset -Timing Offset (External Trigger) Constellation Display -Constellation Graphical Display -EVM vs Subcarrier -EVM vs Symbol -Spectral Flatness -Power vs Resource Block -EVM vs Resource Block -RE Map Downlink New Downlink Downlink -Time Based EVM -EVM vs Demod-Symbol -In-Band Emission Uplink Uplink Uplink New Slide 15

17 Measurement Functions (2/3) Spectrum Display -Adjacent Channel Power -Channel Power -Occupied Bandwidth -Spectrum Emission Mask New : Red parts Summary Display Downlink -EVM/Power of Each Channel -Symbol Clock Error -IQ Skew/ IQ Imbalance/ IQ Quad Error -Total EVM -PDSCH (ALL/QPSK/16QAM/64QAM) EVM -PDCCH EVM -RS/SS/P-SS/S-SS EVM -PBCH/PCFICH/PHICH/DTX EVM -Power vs Slot -Cell ID -Number of PDCCH Symbols -RS power vs Subframe -OFDM Symbol Tx Power vs Subframe -RS/P-SS/S-SS/PBCH/PDCCH/ PCFICH/PHICH Power Slide 16

18 Measurement Functions (3/3) Summary Display Uplink -Total EVM (Time Based) -PUSCH QPSK EVM (Time Based) -PUSCH 16QAM EVM (Time Based) -PUSCH 64QAM EVM (Time Based) -Total EVM (Frequency Based) -PUSCH ALL EVM -PUSCH QPSK EVM -PUSCH 16QAM EVM -PUSCH 64QAM EVM -RS EVM -Power vs Slot New : Red parts -Frequency Error vs Slot [Hz] -Frequency Error vs Slot [ppm] -Origin Offset vs Slot -In-Band Emisssion -Spectral Flatness -PUCCH EVM -SRS EVM -PRACH EVM Slide 17

19 Measurement Functions/Text Display (Frequency Error, Tx Power, EVM) Displays (text) all active subcarrier Frequency Error, Output Power, EVM (rms, peak) values in user-specified subframes (10 max.). Choosing Average & Max displays average and maximum values on same screen. This is useful for evaluating DUT dispersion. Measurement Results (text) Measurement Area All Subcarrier User-specified subframe Subframe (0 to 9) Slide 18

20 Measurement Functions/Constellation Display (Constellation) Displays Constellation for all active subcarriers in userspecified symbol or in user-specified resource block (RB). Analyzes QPSK/16QAM/64QAM. Measurement Area User-specified symbol Constellation (Resource Block Number: 10) All Subcarrier Symbol (0 to139) User-specified resource block Subcarrier Subframe Slide 19

21 Measurement Functions/Graph Display (EVM vs Subcarrier) Displays EVM graph per subcarrier targeting userspecified symbol or user-specified subframes (10 max). Displays Peak and Average (rms) on same screen. This enables measurement of instantaneous EVM. Measurement Area User-specified symbol All Subcarrier All Subcarrier Symbol (0 to139) User-specified subframe Subframe (0 to 9) Slide 20 EVM vs Subcarrier Peak RMS

22 Measurement Functions/Graph Display (EVM vs Symbol) Displays EVM graph per symbol targeting user-specified symbol or user-specified subframes. Displays Peak and Average (rms) on same screen. This enables measurement of instantaneous EVM. Measurement Area User-specified subcarrier All Subcarrier Subframe (0 to 9) User-specified subframe Subframe (0 to 9) EVM vs Symbol Peak RMS Slide 21

23 Measurement Functions/Graph Display (Spectral Flatness) Displays amplitude/phase/group delay graph in userspecified subframes. Detects OFDM-specific problems such as symbol timing error between subcarriers. Measurement Area Amplitude display Phase display All Subcarrier User-specified subframe Amplitude difference display Group delay display Subframe (0 to 9) Slide 22

24 Measurement Functions/Graph Display (1/2) (Power vs Resource Block) Downlink Observes power distribution of each resource block of specified subframe. Checks power boosting at each resource block. Measurement Area Power vs RB (specified subframe display) All Subcarrier User-specified subframe Subframe (0 to 9) Power *RB time axis in subframe units Slide 23 Resource Block

25 Measurement Functions/Graph Display (2/2) (Power vs Resource Block) Displays power of each resource block of specified subframe segments as graph. The power distribution of each resource block can be seen instantly. Measurement Area Downlink Power vs RB (whole display) All Subcarrier User-specified subframe Subframe (0 to 9) Subframe Resource Block *RB time axis in subframe units Slide 24

26 Measurement Functions/Graph Display (EVM vs Resource Block) Downlink Displays EVM distribution for each resource block of specified subframe segments as graph. Identify EVM deterioration with resource block. Measurement Area EVM vs RB All Subcarrier User-specified subframe Subframe (0 to 9) Resource Block Peak rms *RB time axis in subframe units Slide 25

27 Measurement Functions/Graph Display (RE MAP) Downlink Displays physical channel in resource block (RB) and resource element (RE). The constellation for each RE and EVM result can be confirmed at the graphical display, supporting intuitive recognition of channel performance. RE Constellation Display New RE Physical Channel, EVM Display RB Enlarged Display Slide 26

28 Measurement Functions/Graph Display (Time Based EVM) Uplink Displays PUSCH EVM of each symbol for all subcarriers as graph to observe temporal change in PUSCH EVM. *This is a measurement item supported by EVM measurements defined in 3GPP specification (TS ) of September 2008 version. Measurement Area Time Based EVM All Subcarrier User-specified subframe Subframe (0 to 9) Peak RMS Slide 27

29 Measurement Functions/Graph Display (EVM vs Demod-Symbol) Displays PUSCH EVM of demodulated symbol for up to 10 subframes for specified symbols or specified segments as graph. *This is a measurement item supported by EVM measurements added from 3GPP specification (TS ) of September 2008 version. Measurement Area All Subcarrier (Demod-Symbol) All Subcarrier (Demod-Symbol) User-specified symbol Symbol (0 to139) User-specified subframe Subframe (0 to 9) EVM vs Demod-Symbol Slide 28 Uplink Peak RMS

30 Measurement Functions/Graph Display (In-Band Emission) Uplink Measures In-Band Emission per resource block at each Tx band spurious, carrier leak and image. Displays power (RMS/Max./Min.) per resource block as well as subcarrier for easy understanding of in-band spurious. RMS Max. Min. New Allocated RB Carrier Leak Image Slide 29

31 Measurement Functions/Summary Display (Summary Display) Displays various information, such as EVM and power of each channel (PDSCH, PUSCH, PDCCH, RS, SS, PBCH, etc.) as text. Each channel EVM RS POWER and OSTP Slide 30

32 Measurement Functions/Spectrum Display (Spectrum Measurement) One-touch 3GPP LTE spectrum measurement (ACLR, channel power, OBW, SEM) using MS269xA and MS2830A superior level accuracy and wide dynamic range spectrum analyzer/signal analyzer function. Channel Power OBW ACLR SEM* *Requires SEM template for initial parameter setting Slide 31

33 Auto Measurement Function (DMRS Parameters ) Uplink New Inputting broadcast and control information automatically calculates and sets physical layer parameters for DMRS (DeModulation Reference Signal) pattern generation. Input following four parameters Automatic setting of 60 physical layer parameters Auto calculation 20 Slots x 3 Physical Layer Parameter Slide 32

34 Detail Setting Screen Detailed parameters, such as channel estimation ON/OFF and pseudorandom sequence specification, recommended in 3GPP TS36.211, can be set. Selecting Test Model Name measures Test Model signals Supports new/old pseudorandom sequence TS36.211(V8.2.0) TS36.211(V8.3.0) Slide 33 Supports Localized/Distributed virtual resource block type

35 MX269908A LTE IQproducer (MS269xA/MS2830A for Vector Signal Generator option) Slide 34

36 MS269xA/MS2830A Vector Signal Generator Option The spectrum analyzer and signal generator in one main frame support easy configuration of measurement systems and save bench space, initial equipment investment, and running costs (calibration, management, and power consumption). AMP Test Signal Generator Spectrum Analyzer MS269xA/MS2830A Vector Signal Generator Option RF Output AMP Analysis AMP Signal Generator Spectrum Analyzer MS269xA/MS2830A Vector Signal Generator Option BS/UE Test RF Output BS/UE Tx Rx Analysis BS/UE Tx Rx Slide 35

37 LTE IQproducer The LTE IQproducer is a software tool for creating waveform patterns for 3GPP LTE (FDD) Uplink and Downlink TRx waveforms. It runs on both the MS269xA/MS2830A Windows XP OS and on the the external PC. LTE IQproducer LTE IQproducer Create Waveform Create Waveform No transfer when using in MS269xA and MS2830A Transfer Built-in HDD Load Waveform Memory Select RF Output Slide 36

38 LTE IQproducer Display Configuration Excellent operability supports easy waveform generation Parameters for Common settings (PHY, FFT size, Band width, etc.) Channel details Tree structure display (Down/Up Link, Channels, etc.) Displays Frame Structure, FFT, Time Domain, CCDF for generated waveform Slide 37

39 Convenient Rx Measurements such as Dynamic Range Tests The AWGN Waveform Combine function is convenient for Rx measurements, such as dynamic range tests and is installed by adding the MS269xA/MS2830A Vector Signal Generator option. Added AWGN Output 1. Create Waveform Pattern 2. Load Waveform Pattern and output LTE Signal AWGN DUT Throughput Measurement *MS2830A AWGN waveform combine function is an option. Slide 38

40 Specifications are subject to change without notice. Anritsu Corporation Onna, Atsugi-shi, Kanagawa, Japan Phone: Fax: U.S.A. Anritsu Company 1155 East Collins Blvd., Suite 100, Richardson, TX 75081, U.S.A. Toll Free: Phone: Fax: Canada Anritsu Electronics Ltd. 700 Silver Seven Road, Suite 120, Kanata, Ontario K2V 1C3, Canada Phone: Fax: Brazil Anritsu Eletrônica Ltda. Praça Amadeu Amaral, 27-1 Andar Bela Vista - São Paulo - SP - Brasil Phone: Fax: Mexico Anritsu Company, S.A. de C.V. Av. Ejército Nacional No. 579 Piso 9, Col. Granada México, D.F., México Phone: Fax: U.K. Anritsu EMEA Ltd. 200 Capability Green, Luton, Bedfordshire, LU1 3LU, U.K. Phone: Fax: France Anritsu S.A. 12 avenue du Québec, Bâtiment Iris 1- Silic 638, VILLEBON SUR YVETTE, France Phone: Fax: Germany Anritsu GmbH Nemetschek Haus, Konrad-Zuse-Platz München, Germany Phone: Fax: Italy Anritsu S.p.A. Via Elio Vittorini 129, Roma, Italy Phone: Fax: Sweden Anritsu AB Borgafjordsgatan 13, KISTA, Sweden Phone: Fax: Finland Anritsu AB Teknobulevardi 3-5, FI VANTAA, Finland Phone: Fax: Denmark Anritsu A/S (Service Assurance) Anritsu AB (Test & Measurement) Kirkebjerg Allé 90, DK-2605 Brøndby, Denmark Phone: Fax: Russia Anritsu EMEA Ltd. Representation Office in Russia Tverskaya str. 16/2, bld. 1, 7th floor. Russia, , Moscow Phone: Fax: United Arab Emirates Anritsu EMEA Ltd. Dubai Liaison Office P O Box Dubai Internet City Al Thuraya Building, Tower 1, Suit 701, 7th Floor Dubai, United Arab Emirates Phone: Fax: Singapore Anritsu Pte. Ltd. 60 Alexandra Terrace, #02-08, The Comtech (Lobby A) Singapore Phone: Fax: India Anritsu Pte. Ltd. India Branch Office 3rd Floor, Shri Lakshminarayan Niwas, #2726, 80 ft Road, HAL 3rd Stage, Bangalore , India Phone: Fax: P.R. China (Hong Kong) Anritsu Company Ltd. Units 4 & 5, 28th Floor, Greenfield Tower, Concordia Plaza, No. 1 Science Museum Road, Tsim Sha Tsui East, Kowloon, Hong Kong Phone: Fax: P.R. China (Beijing) Anritsu Company Ltd. Beijing Representative Office Room 2008, Beijing Fortune Building, No. 5, Dong-San-Huan Bei Road, Chao-Yang District, Beijing , P.R. China Phone: Fax: Korea Anritsu Corporation, Ltd. 8F Hyunjuk Building, , Yeoksam Dong, Kangnam-ku, Seoul, , Korea Phone: Fax: Australia Anritsu Pty. Ltd. Unit 21/270 Ferntree Gully Road, Notting Hill, Victoria 3168, Australia Phone: Fax: Taiwan Anritsu Company Inc. 7F, No. 316, Sec. 1, Neihu Rd., Taipei 114, Taiwan Phone: Fax: Please Contact: 1005 Printed on Recycled Paper No. MS269xA_LTE-E-L-1-(5.00) Printed in Japan PRS