MXD2125GL/HL MXD2125ML/NL

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Improved, Ultra Low Noise ±2 g Dual Axis Accelerometer with Digital Outputs MXD2125GL/HL MXD2125ML/NL FEATURES Resolution better than 1 milli-g Dual axis accelerometer fabricated on a monolithic CMOS IC On chip mixed mode signal processing No moving parts 50,000 g shock survival rating 17 Hz bandwidth expandable to >160 Hz 3.0V to 5.25V single supply continuous operation Continuous self test Independent axis programmability (special order) Compensated for Sensitivity over temperature Ultra low initial Zero-g Offset APPLICATIONS Automotive Vehicle Security/Vehicle stability control/ Headlight Angle Control/Tilt Sensing Security Gas Line/Elevator/Fatigue Sensing Information Appliances Computer Peripherals/PDA s/mouse Smart Pens/Cell Phones Gaming Joystick/RF Interface/Menu Selection/Tilt Sensing GPS electronic Compass tilt Correction Consumer LCD projectors, pedometers, blood pressure Monitor, digital cameras Sck (optional) CLK Heater Control 2-AXIS SENSOR Internal Oscillator Vdd X axis Y axis Continous Self Test Factory Adjust Offset & Gain Gnd LPF LPF Temperature Sensor Voltage Reference Vda MXD2125GL/HL/ML/NL FUNCTIONAL BLOCK DIAGRAM A/D A/D Tout Vref Dout X Dout Y GENERAL DESCRIPTION The MXD2125GL/HL/ML/NL is a low cost, dual axis accelerometer fabricated on a standard, submicron CMOS process. It is a complete sensing system with on-chip mixed mode signal processing. The MXD2125GL/HL/ML/NL measures acceleration with a full-scale range of ±2 g and a sensitivity of 12.5%/g. It can measure both dynamic acceleration (e.g. vibration) and static acceleration (e.g. gravity). The MXD2125GL/HL/ML/NL design is based on heat convection and requires no solid proof mass. This eliminates stiction and particle problems associated with competitive devices and provides shock survival of 50,000 g, leading to significantly lower failure rate and lower loss due to handling during assembly. The MXD2125GL/HL/ML/NL provides two digital outputs that are set to 50% duty cycle at zero g acceleration. The outputs are digital with duty cycles (ratio of pulse width to period) that are proportional to acceleration. The duty cycle outputs can be directly interfaced to a microprocessor. The typical noise floor is 0.2 mg/ Hz allowing signals below 1 milli-g to be resolved at 1 Hz bandwidth. The MXD2125GL/HL/ML/NL is packaged in a hermetically sealed LCC surface mount package (5 mm x 5 mm x 2 mm height) and is operational over a -40 C to 105 C(M/NL) and 0 C to 70 C(G/HL) temperature range. Information furnished by is believed to be accurate and reliable. However, no responsibility is assumed by for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of., Inc. 800 Turnpike St., Suite 202, North Andover, MA 01845 Tel: 978.738.0900 Fax: 978.738.0196 www.memsic.com MXD2125GL/ML/NL/HL Rev.D Page 1 of 7 5/15/2004

MXD2125GL/HL/ML/NL SPECIFICATIONS (Measurements @ 25 C, Acceleration = 0 g unless otherwise noted; V DD, V DA = 5.0V unless otherwise specified) Parameter Conditions Min MXD2125G/HL Typ Max Min MXD2125M/NL Typ Max Units SENSOR INPUT Each Axis Measurement Range 1 ±2.0 ±2.0 g Nonlinearity Best fit straight line 0.5 0.5 % of FS Alignment Error 2 X Sensor to Y Sensor ±1.0 ±1.0 degrees Transverse Sensitivity 3 ±2.0 ±2.0 % SENSITIVITY Sensitivity, Digital Outputs at pins 4 D OUTX and D OUTY Change Each Axis 11.8 12.5 13.2 11.8 12.5 13.2 % duty cycle/g over Temperature -10 +8-25 +8 % ZERO g BIAS LEVEL Each Axis 0 g Offset 4-0.0 + - 0.0 + g 0 g Duty Cycle 4 48.7 50 51.3 48.7 50 51.3 % duty cycle 0 g Offset over Temperature ±1.5 ±1.5 mg/ C Based on 12.5%/g ±0.02 ±0.02 %/ C NOISE PERFORMANCE Noise Density, rms 0.2 0.4 0.2 0.4 mg/ Hz FREQUENCY RESPONSE 3dB Bandwidth 12 17 12 17 Hz TEMPERATURE OUTPUT T out Voltage 1.15 1.25 1.35 1.15 1.25 1.35 V Sensitivity 4.6 5.0 5.4 4.6 5.0 5.4 mv/ K VOLTAGE REFERENCE V Ref @3.0V-5.0V supply 2.4 2.5 2.65 2.4 2.5 2.65 V Change over Temperature mv/ C Current Drive Capability Source 100 100 µa SELF TEST Continuous Voltage at D OUTX, D OUTY under Failure Continuous Voltage at D OUTX, D OUTY under Failure @5.0V Supply, output rails to supply voltage @3.0V Supply, output rails to supply voltage 5.0 5.0 V 3.0 3.0 D OUTX and D OUTY OUTPUTS Normal Output Range @5.0V Supply @3.0V Supply 4.9 2.9 4.9 2.9 V V Current Source or sink, @ 100 100 µa 3.0V-5.0V supply Rise/Fall Time 3.0 to 5.0V supply 90 100 110 90 100 110 ns Turn-On Time @5.0V Supply @3.0V Supply 100 40 100 40 ms ms POWER SUPPLY Operating Voltage Range 3.0 5.25 3.0 5.25 V Supply Current @ 5.0V 2.5 3.1 3.9 2.5 3.1 3.9 ma Supply Current 4 @ 3.0V 3.0 3.8 4.6 3.0 3.8 4.6 ma TEMPERATURE RANGE Operating Range 0 +70-40 +105 C NOTES level specifications on this page will be met. Please contact the factory for specially 1 Guaranteed by measurement of initial offset and sensitivity. trimmed devices for low supply voltage operation. 2 Alignment error is specified as the angle between the true and indicated axis of sensitivity. 3 Transverse sensitivity is the algebraic sum of the alignment and the inherent sensitivity errors. 4 The device operates over a 3.0V to 5.25V supply range. Please note that sensitivity and zero g bias level will be slightly different at 3.0V operation. For devices to be operated at 3.0V in production, they can be trimmed at the factory specifically for this lower supply voltage operation, in which case the sensitivity and zero g bias V MXD2125GL/ML/NL/HL Rev.D Page 2 of 7 5/15/2004

ABSOLUTE MAXIMUM RATINGS* Supply Voltage (V DD, V DA )...-0.5 to +7.0V Storage Temperature. -65 C to +150 C Acceleration..50,000 g *Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; the functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Pin Description: LCC-8 Package Pin Name Description 1 T OUT Temperature (Analog Voltage) 2 D OUTY Y-Axis Acceleration Digital Signal 3 Gnd Ground 4 V DA Analog Supply Voltage 5 D OUTX X-Axis Acceleration Digital Signal 6 V ref 2.5V Reference 7 Sck Optional External Clock 8 V DD Digital Supply Voltage Ordering Guide Model Package Style Digital Output Temperature Range MXD2125GL LCC - 8 100 Hz 0 to 70 C MXD2125HL LCC - 8 400Hz 0 to 70 C MXD2125ML LCC - 8 100 Hz -40 to 105 MXD2125NL LCC - 8 400 Hz -40 to 105 All parts are shipped in tape and reel packaging. Caution: ESD (electrostatic discharge) sensitive device. 1 2 3 8 7 6 5 X +g THEORY OF OPERATION The device is a complete dual-axis acceleration measurement system fabricated on a monolithic CMOS IC process. The device operation is based on heat transfer by natural convection and operates like other accelerometers having a proof mass. The stationary element, or proof mass, in the sensor is a gas. A single heat source, centered in the silicon chip is suspended across a cavity. Equally spaced aluminum/polysilicon thermopiles (groups of thermocouples) are located equidistantly on all four sides of the heat source (dual axis). Under zero acceleration, a temperature gradient is symmetrical about the heat source, so that the temperature is the same at all four thermopiles, causing them to output the same voltage. Acceleration in any direction will disturb the temperature profile, due to free convection heat transfer, causing it to be asymmetrical. The temperature, and hence voltage output of the four thermopiles will then be different. The differential voltage at the thermopile outputs is directly proportional to the acceleration. There are two identical acceleration signal paths on the accelerometer, one to measure acceleration in the x-axis and one to measure acceleration in the y-axis. Please visit the website at www.memsic.com for a picture/graphic description of the free convection heat transfer principle. Y +g 4 Top View Note: The logo s arrow indicates the +X sensing direction of the device. The +Y sensing direction is rotated 90 away from the +X direction following the right-hand rule. Small circle indicates pin one(1). MXD2125GL/ML/NL/HL Rev.D Page 3 of 7 5/15/2004

MXD2125GL/HL/ML/NL PIN DESCRIPTIONS V DD This is the supply input for the digital circuits and the sensor heater in the accelerometer. The DC voltage should be between 3.0 and 5.25 volts. Refer to the section on PCB layout and fabrication suggestions for guidance on external parts and connections recommended. V DA This is the power supply input for the analog amplifiers in the accelerometer. V DA should always be connected to V DD. Refer to the section on PCB layout and fabrication suggestions for guidance on external parts and connections recommended. Gnd This is the ground pin for the accelerometer. D OUTX This pin is the digital output of the x-axis acceleration sensor. It is factory programmable to 100 Hz or 400 Hz. The user should ensure the load impedance is sufficiently high as to not source/sink >100µA typical. While the sensitivity of this axis has been programmed at the factory to be the same as the sensitivity for the y-axis, the accelerometer can be programmed for non-equal sensitivities on the x- and y-axes. Contact the factory for additional information. D OUTY This pin is the digital output of the y-axis acceleration sensor. It is factory programmable to 100 Hz or 400 Hz. The user should ensure the load impedance is sufficiently high as to not source/sink >100µA typical. While the sensitivity of this axis has been programmed at the factory to be the same as the sensitivity for the x-axis, the accelerometer can be programmed for non-equal sensitivities on the x- and y-axes. Contact the factory for additional information. T OUT This pin is the buffered output of the temperature sensor. The analog voltage at T OUT is an indication of the die temperature. This voltage is useful as a differential measurement of temperature from ambient and not as an absolute measurement of temperature. Sck The standard product is delivered with an internal clock option (800kHz). This pin should be grounded when operating with the internal clock. An external clock option can be special ordered from the factory allowing the user to input a clock signal between 400kHz And 1.6MHz V ref A reference voltage is available from this pin. It is set at 2.50V typical and has 100µA of drive capability. DISCUSSION OF TILT APPLICATIONS AND RESOLUTION Tilt Applications: One of the most popular applications of the accelerometer product line is in tilt/inclination measurement. An accelerometer uses the force of gravity as an input to determine the inclination angle of an object. A accelerometer is most sensitive to changes in position, or tilt, when the accelerometer s sensitive axis is perpendicular to the force of gravity, or parallel to the Earth s surface. Similarly, when the accelerometer s axis is parallel to the force of gravity (perpendicular to the Earth s surface), it is least sensitive to changes in tilt. Table 1 and Figure 2 help illustrate the output changes in the X- and Y-axes as the unit is tilted from +90 to 0. Notice that when one axis has a small change in output per degree of tilt (in mg), the second axis has a large change in output per degree of tilt. The complementary nature of these two signals permits low cost accurate tilt sensing to be achieved with the device (reference application note AN-00MX-007). Y Top View X +90 0 Figure 2: Accelerometer Position Relative to Gravity X-Axis Orientation To Earth s Surface (deg.) X Output (g) X-Axis Change per deg. of tilt (mg) 0 0 Y Output (g) gravity Y-Axis Change per deg. of tilt (mg) 90 1.000 5 0.000 17.45 85 0.996 1.37 0.087 17.37 80 0.985 2.88 74 17.16 70 0.940 5.86 0.342 16.35 60 0.866 8.59 0.500 15.04 45 0.707 12.23 0.707 12.23 30 0.500 15.04 0.866 8.59 20 0.342 16.35 0.940 5.86 10 74 17.16 0.985 2.88 5 0.087 17.37 0.996 1.37 0 0.000 17.45 1.000 5 Table 1: Changes in Tilt for X- and Y-Axes MXD2125GL/ML/NL/HL Rev.D Page 4 of 7 5/15/2004

Resolution: The accelerometer resolution is limited by noise. The output noise will vary with the measurement bandwidth. With the reduction of the bandwidth, by applying an external low pass filter, the output noise drops. Reduction of bandwidth will improve the signal to noise ratio and the resolution. The output noise scales directly with the square root of the measurement bandwidth. The maximum amplitude of the noise, its peak- to- peak value, approximately defines the worst case resolution of the measurement. With a simple RC low pass filter, the rms noise is calculated as follows: Noise (mg rms) = Noise(mg/ Hz ) * ( Bandwidth ( Hz) *1.6) The peak-to-peak noise is approximately equal to 6.6 times the rms value (for an average uncertainty of %). DIGITAL INTERFACE The MXD2125GL/HL/ML/NL is easily interfaced with low cost microcontrollers. For the digital output accelerometer, one digital input port is required to read one accelerometer output. For the analog output accelerometer, many low cost microcontrollers are available today that feature integrated A/D (analog to digital converters) with resolutions ranging from 8 to 12 bits. In many applications the microcontroller provides an effective approach for the temperature compensation of the sensitivity and the zero g offset. Specific code set, reference designs, and applications notes are available from the factory. The following parameters must be considered in a digital interface: Resolution: smallest detectable change in input acceleration Bandwidth: detectable accelerations in a given period of time Acquisition Time: the duration of the measurement of the acceleration signal DUTY CYCLE DEFINITION The MXD2125GL/HL/ML/NL has two PWM duty cycle outputs (x,y). The acceleration is proportional to the ratio T1/T2. The zero g output is set to 50% duty cycle and the sensitivity scale factor is set to 20% duty cycle change per g. These nominal values are affected by the initial tolerance of the device including zero g offset error and sensitivity error. This device is offered from the factory programmed to either a 10ms period (100 Hz) or a 2.5ms period (400Hz). T1 T2 (Period) Duty Cycle Length of the on portion of the cycle. Length of the total cycle. Ratio of the 0n time (T1) of the cycle to the total cycle (T2). Defined as T1/T2. Pulse width Time period of the on pulse. Defined as T1. T1 A (g)= (T1/T2-0.5)/20% 0g = 50% Duty Cycle T2= 2.5ms or 10ms (factory programmable) Figure 3: Typical output Duty C ycle CHOOSING T2 AND COUNTER FREQUENCY DESIGN TRADE-OFFS The noise level is one determinant of accelerometer resolution. The second relates to the measurement resolution of the counter when decoding the duty cycle output. The actual resolution of the acceleration signal is limited by the time resolution of the counting devices used to decode the duty cycle. The faster the counter clock, the higher the resolution of the duty cycle and the shorter the T2 period can be for a given resolution. Table 2 shows some of the trade-offs. It is important to note that this is the resolution due to the microprocessors counter. It is probable that the accelerometer s noise floor may set the lower limit on the resolution. Sample Rate Counter- Clock Rate (MHz) T2 Counts Per T2 Cycle Resolution (mg) Counts T2 (ms) per g 2.5 400 2.0 5000 625 1.6 2.5 400 1.0 2500 312.5 3.2 2.5 400 0.5 1250 156.3 6.4 10.0 100 2.0 20000 2500 0.4 10.0 100 1.0 10000 1250 0.8 10.0 100 0.5 5000 625 1.6 Table 2: Trade-Offs Between Microcontroller Counter Rate and T2 Period. USING THE ACCELEROMETER IN VERY LOW POWER APPLICATIONS (BATTERY OPERATION) In applications with power limitations, power cycling can be used to extend the battery operating life. One important consideration when power cycling is that the accelerometer turn on time limits the frequency bandwidth of the accelerations to be measured. For example, operating at 3.0V the turn on time is 40mS. To double the operating time, a particular application may cycle power ON for 40mS, then OFF for 40mS, resulting in a measurement period of 80mS, or a frequency of 12.5Hz. With a frequency of measurements of 12.5Hz, accelerations changes as high as 6.25Hz can be detected. Power cycling can be used effectively in many inclinometry applications, where inclination changes can be slow and infrequent. MXD2125GL/ML/NL/HL Rev.D Page 5 of 7 5/15/2004

V SUPPLY CONVERTING THE DIGITAL OUTPUT TO AN ANALOG OUTPUT The PWM output can be easily converted into an analog output by integration. A simple RC filter can do the conversion. Note that that the impedance of the circuit following the integrator must be much higher than the impedance of the RC filter. Reference figure 4 for an example. C1 VDA R VDD Accelerometer C2 DOUT Accel. 10K 1uF AOUT Figure 4: Converting the digital output to an analog voltage POWER SUPPLY NOISE REJECTION Two capacitors and a resistor are recommended for best rejection of power supply noise (reference Figure 5 below). The capacitors should be located as close as possible to the device supply pins (V DA, V DD ). The capacitor lead length should be as short as possible, and surface mount capacitors are preferred. For typical applications, capacitors C1 and C2 can be ceramic µf, and the resistor R can be 10 Ω. In 5V applications where power consumption is not a concern, maximum supply noise rejection can be obtained by significantly increasing the values of C1, C2 and R. For example, C1 = C2 = 0.47 µf and R = 270 Ω will virtually eliminate power supply noise effects. Figure 5: Power Supply Noise Rejection PCB LAYOUT AND FABRICATION SUGGESTIONS 1. The Sck pin should be grounded to minimize noise. 2. Liberal use of ceramic bypass capacitors is recommended. 3. Robust low inductance ground wiring should be used. 4. Care should be taken to ensure there is thermal symmetry on the PCB immediately surrounding the device and that there is no significant heat source nearby. 5. A metal ground plane should be added directly beneath the device. The size of the plane should be similar to the device s footprint and be as thick as possible. 6. Vias can be added symmetrically around the ground plane. Vias increase thermal isolation of the device from the rest of the PCB. MXD2125GL/ML/NL/HL Rev.D Page 6 of 7 5/15/2004

LCC-8 PACKAGE DRAWING Fig 6: Hermetically Sealed Package Outline MXD2125GL/ML/NL/HL Rev.D Page 7 of 7 5/15/2004