STN2NF10. N-channel 100V Ω - 2.4A - SOT-223 STripFET II Power MOSFET. Features. Description. Application. Internal schematic diagram.

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Transcription:

N-channel 100V - 0.23Ω - 2.4A - SOT-223 STripFET II Power MOSFET Features Type V DSS R DS(on) I D STN2NF10 100V < 0.26Ω 2.4A 2 Description This Power MOSFET is the latest development of STMicroelectronics unique single feature size strip-based process. The resulting transistor shows extremely high packing density for low onresistance, rugged avalanche characteristics and less critical alignment steps therefore a remarkable manufacturing reproducibility. 1 2 SOT-223 3 Application Switching application DC-DC converters Internal schematic diagram Order code Part number Marking Package Packaging STN2NF10 N2NF10 SOT-223 Tape & reel April 2007 Rev 6 1/13 www.st.com 13

Contents STN2NF10 Contents 1 Electrical ratings............................................ 3 2 Electrical characteristics..................................... 4 2.1 Electrical characteristics (curves)............................. 6 3 Test circuit................................................ 9 4 Package mechanical data.................................... 10 5 Revision history........................................... 12 2/13

Electrical ratings 1 Electrical ratings Table 1. Absolute maximum ratings Symbol Parameter Value Unit V DS Drain-source voltage (V GS =0) 100 V V GS Gate-source voltage ± 20 V I D Drain current (continuous) at T C = 25 C 2.4 A I D Drain current (continuous) at T C = 100 C 1.5 A I DM (1) Drain current (pulsed) 17 A Derating factor 0.026 W/ C P TOT (2) E AS (3) dv/dt (4) Total dissipation at T C = 25 C 3.3 W Single pulse avalanche energy 200 mj Peak diode recovery voltage slope 30 V/ns T j T stg Operating junction temperature Storage temperature -55 to 150 C 1. Pulse width limited by safe operating area 2. This value is rated according to Rthj-amb, t < 10sec 3. I AS = 2.4A, V DD = 30V, Rg=4.7Ω, starting Tj = 25 C 4. I SD < 6A, di/dt < 500A/µs, V DD = 80% V (BR)DSS Table 2. Thermal data Symbol Parameter Value Unit Rthj-amb (1) Rthj-amb (2) Thermal resistance junction-amb 38 C/W Thermal resistance junction-amb 62.5 C/W 1. When mounted on 1inch² FR-4 board, 2 oz. Cu, (t < 10sec) 2. When mounted on 1inch² FR-4 board, 2 oz. Cu, (t >10sec) 3/13

Electrical characteristics STN2NF10 2 Electrical characteristics (T CASE =25 C unless otherwise specified) Table 3. On/off states Symbol Parameter Test conditions Min. Typ. Max. Unit V (BR)DSS Drain-source breakdown voltage I D = 250µA, V GS = 0 100 V I DSS Zero gate voltage drain current (V GS = 0) V DS = Max rating, V DS = Max rating,tc=125 C V DS = 30V, Tc=125 C 1 10 1 µa µa µa I GSS Gate body leakage current (V DS = 0) V GS = ±20V ±100 na V GS(th) Gate threshold voltage V DS = V GS, I D = 250µA 2 4 V R DS(on) Static drain-source on resistance V GS = 10V, I D = 1.2A 0.23 0.26 Ω Table 4. Dynamic Symbol Parameter Test conditions Min. Typ. Max. Unit g fs Forward transconductance V DS =15V, I D =1.2A 2.5 S C iss C oss C rss Input capacitance Output capacitance Reverse transfer capacitance V DS =25V, f=1mhz, V GS =0 280 45 20 pf pf pf Q g Q gs Q gd Total gate charge Gate-source charge Gate-drain charge V DD =80V, I D = 6A V GS =10V (see Figure 15) 10 2.5 4 14 nc nc nc 4/13

Electrical characteristics Table 5. Switching times Symbol Parameter Test conditions Min. Typ. Max. Unit t d(on) t r Turn-on delay time Rise time V DD =50V, I D = 2.4A V GS =10V, R G =4.7Ω (see Figure 14) 6 10 ns ns t d(off) t f Turn-off delay time Fall time V DD =50V, I D = 2.4A V GS =10V, R G =4.7Ω (see Figure 14) 20 3 ns ns Table 6. Source drain diode Symbol Parameter Test conditions Min. Typ. Max Unit I SD I (1) SDM Source-drain current Source-drain current (pulsed) 2.4 17 A A V SD (2) Forward on voltage I SD = 2.4A, V GS =0 1.2 V t rr Q rr I RRM Reverse recovery time Reverse recovery charge Reverse recovery current I SD = 6A, V DD =10V di/dt=100a/µs,tj=150 C (see Figure 19) 70 175 5 ns nc A 1. Pulse width limited by safe operating area 2. Pulsed: pulse duration = 300µs, duty cycle 1.5% 5/13

Electrical characteristics STN2NF10 2.1 Electrical characteristics (curves) Figure 1. Safe operating area Figure 2. Thermal impedance Figure 3. Output characteristics Figure 4. Transfer characteristics Figure 5. Transconductance Figure 6. Static drain-source on resistance 6/13

Electrical characteristics Figure 7. Gate charge vs. gate-source voltage Figure 8. Capacitance variations Figure 9. Normalized gate threshold voltage vs. temperature Figure 10. Normalized on resistance vs. temperature Figure 11. Source-drain diode forward characteristics Figure 12. Normalized BV DSS vs. temperature 7/13

Electrical characteristics STN2NF10 Figure 13. Max drain current vs. temperature 8/13

Test circuit 3 Test circuit Figure 14. Switching times test circuit for resistive load Figure 15. Gate charge test circuit Figure 16. Test circuit for inductive load switching and diode recovery times Figure 17. Unclamped inductive load test circuit Figure 18. Unclamped inductive waveform Figure 19. Switching time waveform 9/13

Package mechanical data STN2NF10 4 Package mechanical data In order to meet environmental requirements, ST offers these devices in ECOPACK packages. These packages have a Lead-free second level interconnect. The category of second level interconnect is marked on the package and on the inner box label, in compliance with JEDEC Standard JESD97. The maximum ratings related to soldering conditions are also marked on the inner box label. ECOPACK is an ST trademark. ECOPACK specifications are available at: www.st.com 10/13

Package mechanical data SOT-223 MECHANICAL DATA DIM. mm inch MIN. TYP. MAX. MIN. TYP. MAX. A 1.80 0.071 B 0.60 0.70 0.80 0.024 0.027 0.031 B1 2.90 3.00 3.10 0.114 0.118 0.122 c 0.24 0.26 0.32 0.009 0.010 0.013 D 6.30 6.50 6.70 0.248 0.256 0.264 e 2.30 0.090 e1 4.60 0.181 E 3.30 3.50 3.70 0.130 0.138 0.146 H 6.70 7.00 7.30 0.264 0.276 0.287 V 10 o 10 o A1 0.02 P008B 11/13

Revision history STN2NF10 5 Revision history Table 7. Revision history Date Revision Changes 14-Sep-2006 4 The document has been reformatted 29-Mar-2007 5 Figure 1 has been updated 04-Apr-2007 6 New test condition for I DSS on Table 3 12/13

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