March 4-7, 2018 Hilton Phoenix / Mesa Hotel Mesa, Arizona Archive

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March 4-7, 2018 Hilton Phoenix / Mesa Hotel Mesa, Arizona Archive 2018 BiTS Workshop Image: pilgrims49 / istock

COPYRIGHT NOTICE The presentation(s)/poster(s) in this publication comprise the Proceedings of the 2018 BiTS Workshop. The content reflects the opinion of the authors and their respective companies. They are reproduced here as they were presented at the 2018 BiTS Workshop. This version of the presentation or poster may differ from the version that was distributed in hardcopy & softcopy form at the 2018 BiTS Workshop. The inclusion of the presentations/posters in this publication does not constitute an endorsement by BiTS Workshop or the workshop s sponsors. There is NO copyright protection claimed on the presentation/poster content by BiTS Workshop. However, each presentation/poster is the work of the authors and their respective companies: as such, it is strongly encouraged that any use reflect proper acknowledgement to the appropriate source. Any questions regarding the use of any materials presented should be directed to the author(s) or their companies. The BiTS logo and are trademarks of BiTS Workshop. All rights reserved.

Dan Campion Xcerra Corporation / MultiTest UltraGig Tri-Temp HetNet 802.11ad URLLC Antenna 802.11ax Calibration BeamForming Coax Module Thermal WiGig OTA Wide BW Spectral LTE-WAN R15 mmtc IoT LPWAN WaveGuide Efficiency R14 Carrier MMIMO R13 embb V2X Small Cell Aggregation Overwhelmed by 5G Test Considerations? Evolving 5G standards and protocols are driving the need for production contactor solutions that provide performance previously only seen in engineering labs for testing RF signals through both contacted and over the air (OTA) test. These solutions need to combine broadband RF performance for cmwave and mmwave bands with the robustness needed for production test floors, while meeting reasonable Cost of Test (CoT) targets.

Package Trends: Frequency Bands: QFN BGA WLCSP DUT / Tester Interfaces: Antenna in Package (AiP) MIMO (Multiple In Multiple Out) Antenna Arrays Variety of Contact Technologies Required: WaveGuide and Coax Tester Interfaces Short Scrub for Singulated QFN Broadband Wafer Solution to 100GHz 5G Contacting Building Blocks Broadband Singulated Solution to 100GHz Short Pogo for BGA / QFN / WLCSP Antenna Technology 5G Contactor Solutions Need to be Modular & Robust Advanced RF Contacting Building Blocks are often combined to meet evolving package and test requirements for 5G applictions. Assuming technical requirements are met, a variety of contact technologies can reduce CoT. BiTS 2018 2

Conclusions 5G RF Contacting Solutions must be integrated with the entire test cell between the tester and handler/prober for production environments. A variety of modular contact technology solutions allow for the solution to be adapted to the unique test requirements. Below is an example of an OTA contactor solution for an AiP device that addressed poor patch antenna quality achieved when antenna was built into PCB. Modeled OTA Solution w/ Patch Antenna in Contactor Test Results Superior with Patch Integrated in Contactor vs PCB Broadband Contactor + Patch for 76-81GHz BGA AiP PCB Patch Contactor LeadFrame Patch Provide solutions ready for the production test floor Re-configure building blocks to fit evolving requirements BiTS 2018 3