WinCal XE - The Microwave Tool Leonard Hayden Cascade Microtech, Inc.
Presentation Outline WinCal XE TM Software application for vector network analyzer probing and measurement Overview of WinCal XE features Calibration Validation Measurement Analysis Case studies Characterization of inductors Modeling of Gate-Oxide Capacitor Differential amplifier testing
Features Overview VNA Calibration System setup captured at device levell Probe location and orientation matter Standard orientation must be compatible as well E.g., ISS rotation
Features Overview VNA Calibration Library of Probes and Impedance Standard Substrates Internal tables of electrical behavior Visual user interface with images of standards
Features Overview VNA Calibration Library of calibration methods Solid core set usual SOL based including unknown thru (SOLR) Notable advances Multi-line TRL (NIST refcal) Enhanced LRRM (elrrm ) 16 term SVD cal Hybrid 4-port cals Pluggable - simplifies future extensions DUT DUT
Features Overview VNA Calibration Complete support of 2 nd Tier Calibration Cals calculate error boxes between ref planes Any subset of ports Send to VNA augments the first-tier cal with the 2 nd tier Useful in mixed interface E.g., Port 1 is probe tip, port 2 is coax connector Coax cal 1 st tier, SOL probe tip 2 nd tier te cal on port 1 2nd Tier on
Features Overview Cal Validation Do I have a good calibration? Simple validation strategy: Measure additional element not used dfor calibration Vector comparison: measurement vs. expected behavior All ports tested Supports: Open verification after LRRM Golden die compare with prior reference result Vector comparison is very sensitive Good cal can be better than known (LRRM vs Copen) Excellent for improving consistency
Features Overview: Measurement Multiple page document Up to 4 graphs per page polar, Smith, x-y Dynamically select active data items Library of data reduction methods to create traces Live new traces appear as new data comes in Templates with views, no data
Features Overview: Analysis Post processing of data Create new data items from old in scratch pad Library of primitives and functions Functions are provided but can also be easily created by user
Features Overview: Analysis Local Data Reduction and Viewing Example: Inductor Q XE converts S-parameters to Z-parameters, extracts imaginary part and divides by real View device data for sanity check Device or data analysis & exploration Test development & refinement Quick verification of cal or setup
Case Study: Inductor Measurement Measured on-wafer inductor as 2-port Measured open and shorted pads Calculated intrinsic inductor (de-embed pads) Calculated differential inductor Displayed differential inductance, resistance, and Q
Case Study: Gate Capacitor Modeling Custom toolbar with model values Comparison graphs including EVM Error Vector Magnitude PORT P= 1 Z= 50 Ohm RE S ID= Ri R= 4.18 Ohm CAP ID= C1 C= 271 ff RES ID= Rint R= 11.7 Ohm CAP ID= Cint C= 4.98e4 f F CAP ID= Cox C= 1.28e4 f F IND ID= L1 L= 8.9 ph Scratchpad to calculate the model behavior
Case Study: Differential Amplifier 1 st tier coaxial ref plane 2 nd tier differential probe-tip ref plane 2 nd tier single-ended probe-tip ref plane 1 st tier coaxial ref plane Port 1 Port 2 No possible Thru, so how do we calibrate to the probe tips? Answer: 1 st tier 2-port coaxial calibration 2 nd tier differential probe-tip 1-port cal (port 1) 2 nd tier single-ended 1-port cal (port 2)
WinCal XE is the Microwave Tool Visit www.cascademicrotech.com/wincal for more information FREE DEMO VERSION Unlimited data viewing, manipulation and display FREE TRIAL VERSION Fully functional for 30 days Academic discount available Visit our booth for a demo