Hello, and welcome to the Texas Instruments Precision overview of AC specifications for Precision DACs. In this presentation we will briefly cover

Similar documents
The simplest DAC can be constructed using a number of resistors with binary weighted values. X[3:0] is the 4-bit digital value to be converter to an

DATA CONVERSION AND LAB (17.368) Fall Class # 07. October 16, 2008

Data Conversion and Lab (17.368) Fall Lecture Outline

ELG3336: Converters Analog to Digital Converters (ADCs) Digital to Analog Converters (DACs)

Hello, and welcome to the TI Precision Labs video series discussing comparator applications. The comparator s job is to compare two analog input

INTEGRATED CIRCUITS. AN109 Microprocessor-compatible DACs Dec

Analog I/O. ECE 153B Sensor & Peripheral Interface Design Winter 2016

Selecting and Using High-Precision Digital-to-Analog Converters

P a g e 1. Introduction

+2.7V to +5.5V, Low-Power, Triple, Parallel 8-Bit DAC with Rail-to-Rail Voltage Outputs

Laboratory 6. Lab 6. Operational Amplifier Circuits. Required Components: op amp 2 1k resistor 4 10k resistors 1 100k resistor 1 0.

Quad 12-Bit Digital-to-Analog Converter (Serial Interface)

Lecture 6: Digital/Analog Techniques

While the Riso circuit is both simple to implement and design it has a big disadvantage in precision circuits. The voltage drop from Riso is

Op-Amp Simulation Part II

Low Cost 10-Bit Monolithic D/A Converter AD561

Laboratory 9. Required Components: Objectives. Optional Components: Operational Amplifier Circuits (modified from lab text by Alciatore)

Chapter 13: Comparators

Basics of Analog Multiplexers 1. Exercises TI Precision Labs Op Amps

8-Bit, high-speed, µp-compatible A/D converter with track/hold function ADC0820

Chapter 3 Novel Digital-to-Analog Converter with Gamma Correction for On-Panel Data Driver

MCP Bit, Quad Digital-to-Analog Converter with EEPROM Memory. Features. Description. Applications

Input Drive Circuitry for SAR ADCs. Section 8

AD557 SPECIFICATIONS. T A = 25 C, V CC = 5 V unless otherwise noted) REV. B

SPT BIT, 100 MWPS TTL D/A CONVERTER

DSP Project. Reminder: Project proposal is due Friday, October 19, 2012 by 5pm in my office (Small 239).

APPLICATION NOTE 5581 CHALLENGE THE CONVENTIONAL - MAKE UNIPOLAR DACS BIPOLAR

Op-Amp Specifications

EE 3305 Lab I Revised July 18, 2003

Specifying A D and D A Converters

EE320L Electronics I. Laboratory. Laboratory Exercise #2. Basic Op-Amp Circuits. Angsuman Roy. Department of Electrical and Computer Engineering

Using High Speed Differential Amplifiers to Drive Analog to Digital Converters

Transfer Function DAC architectures/examples Calibrations

Practical Testing Techniques For Modern Control Loops

Chapter 7: From Digital-to-Analog and Back Again

An Analog Phase-Locked Loop

12-Bit, Low-Power, Dual, Voltage-Output DAC with Serial Interface

CENG4480 Lecture 04: Analog/Digital Conversions

Lab 8 D/A Conversion and Waveform Generation Lab Time: 9-12pm Wednesday Lab Partner: Chih-Chieh Wang (Dennis) EE145M Station 13

ECE3204 D2015 Lab 1. See suggested breadboard configuration on following page!

10-Bit µp-compatible D/A converter

Hello, and welcome to the TI Precision Labs video discussing comparator applications, part 4. In this video we will discuss several extra features

ANALOG TO DIGITAL (ADC) and DIGITAL TO ANALOG CONVERTERS (DAC)

OBSOLETE. Parameter AD9621 AD9622 AD9623 AD9624 Units

Multiplying DACs. Flexible Building Blocks.

ELG4139: Converters Analog to Digital Converters (ADCs) Digital to Analog Converters (DACs)

Experiment 1: Amplifier Characterization Spring 2019

ECEN Network Analysis Section 3. Laboratory Manual

2.5 V to 5.5 V, 230 A, Parallel Interface Dual Voltage-Output 8-/10-/12-Bit DACs AD5332/AD5333/AD5342/AD5343*

OBSOLETE. Low Cost Quad Voltage Controlled Amplifier SSM2164 REV. 0

Fixed Frequency Control vs Constant On-Time Control of Step-Down Converters

LC2 MOS Complete 12-Bit Multiplying DAC AD7845

Fan in: The number of inputs of a logic gate can handle.

QUAD 12-BIT DIGITAL-TO-ANALOG CONVERTER (12-bit port interface)

University of North Carolina, Charlotte Department of Electrical and Computer Engineering ECGR 3157 EE Design II Fall 2009

CMOS 12-Bit Buffered Multiplying DAC AD7545A

Tuesday, March 1st, 9:15 11:00. Snorre Aunet Nanoelectronics group Department of Informatics University of Oslo.

PHYS 536 The Golden Rules of Op Amps. Characteristics of an Ideal Op Amp

When you have completed this exercise, you will be able to relate the gain and bandwidth of an op amp

Low-Power, 12-Bit, Rail to Rail Voltage-Output Serial DAC in SOT23

Operational Amplifiers (Op Amps)

2.5 V to 5.5 V, 500 A, Parallel Interface Quad Voltage-Output 8-/10-/12-Bit DACs AD5334/AD5335/AD5336/AD5344*

+2.7V to +5.5V, Low-Power, Dual, Parallel 8-Bit DAC with Rail-to-Rail Voltage Outputs

Rahul Prakash, Eugenio Mejia TI Designs Precision: Verified Design Digitally Tunable MDAC-Based State Variable Filter Reference Design

10-Bit, Low-Power, Rail-to-Rail Voltage-Output Serial DAC in SOT23

+3V/+5V, Low-Power, 8-Bit Octal DACs with Rail-to-Rail Output Buffers

Data Converters. Dr.Trushit Upadhyaya EC Department, CSPIT, CHARUSAT

Input Offset Voltage (V OS ) & Input Bias Current (I B )

Data Conversion Circuits & Modulation Techniques. Subhasish Chandra Assistant Professor Department of Physics Institute of Forensic Science, Nagpur

PRODUCT OVERVIEW. (4k, BCD) * FOR BCD MODELS, THIS RESISTOR IS OPEN CIRCUIT. +6.3V REFERENCE 15V SUPPLY. Figure 1. DAC-HZ Functional Block Diagram

EE240B Discussion 9. Eric Chang. Berkeley Wireless Research Center UC Berkeley

Homework Set 3.5 Sensitive optoelectronic detectors: seeing single photons

Homework Assignment 10

TLC5620C, TLC5620I QUADRUPLE 8-BIT DIGITAL-TO-ANALOG CONVERTERS

DACPORT Low Cost, Complete P-Compatible 8-Bit DAC AD557*

Data Conversion and Lab (17.368) Fall Lecture Outline

Serial Input 18-Bit Monolithic Audio DIGITAL-TO-ANALOG CONVERTER

AN increasing number of video and communication applications

A 40 MHz Programmable Video Op Amp

MAS.836 HOW TO BIAS AN OP-AMP

Low Distortion, Precision, Wide Bandwidth Op Amp AD9617

Fundamentals of Data Converters. DAVID KRESS Director of Technical Marketing

AD8232 EVALUATION BOARD DOCUMENTATION

ETIN25 Analogue IC Design. Laboratory Manual Lab 2

SMP04 SPECIFICATIONS ELECTRICAL CHARACTERISTICS

ECE 6770 FINAL PROJECT

EK307 Active Filters and Steady State Frequency Response

AN-1106 Custom Instrumentation Amplifier Design Author: Craig Cary Date: January 16, 2017

Analogue to Digital Conversion

SPI-/I 2 C-Compatible, Temperature Sensor, 4-Channel ADC and Quad Voltage Output ADT7516/ADT7517/ADT7519

OPERATIONAL AMPLIFIERS (OP-AMPS) II

Chapter 2 Signal Conditioning, Propagation, and Conversion

University of Pittsburgh

FUNCTIONAL BLOCK DIAGRAM REFIN DAC REGISTER A INPUT REGISTER A INPUT REGISTER B DAC REGISTER B DAC REGISTER C INPUT REGISTER C DAC REGISTER D LDAC

LC2 MOS Octal 8-Bit DAC AD7228A

LM1971 Digitally Controlled 62 db Audio Attenuator with Mute

6.111 Lecture # 15. Operational Amplifiers. Uses of Op Amps

MCP Bit, Quad Digital-to-Analog Converter with EEPROM Memory. Features. Description. Applications

UNIT III Data Acquisition & Microcontroller System. Mr. Manoj Rajale

TLV5620C, TLV5620I QUADRUPLE 8-BIT DIGITAL-TO-ANALOG CONVERTERS

Transcription:

Hello, and welcome to the Texas Instruments Precision overview of AC specifications for Precision DACs. In this presentation we will briefly cover the three most important AC specifications of DACs: settling time, glitch, and noise. 1

To begin our discussion, let s look at settling time. The characterization of DAC settling time is consistent with operational amplifier settling time specifications, which should make sense as the output op-amp included in the DAC will dominate the settling time figure. Op-amp settling time is usually referred to as output settling time while a DAC specification is described as input-to-output settling time. As is illustrated on this figure the difference between output settling time and input-to-output settling time is that we include a time period called dead time in the input-to-output setting time figure. Dead time is specified as the time it takes for the output to rise to 10% towards the desired analog output value from the time the digital code was applied to the DAC. Dead time is caused by the time required for the DAC to latch the incoming data word, perform the required switching, and for the analog signal to propagate to the output. Slew time takes over where dead time left off and is the time required to transition from 10% of the desired analog output to 90%. This specification, along with the remaining settling time figures, are dominated by the output amplifiers characteristics. After slew time we observe recovery time and linear settling time - usually referred to as large signal settling time and small signal settling time respectively. At the moment the output passes inside of a pre-determined error band and does not leave the band again the output is said to be settled and at it s final value. In many applications analog settling time is the dominant figure to consider for a DACs update rate, even if the serial interface is capable of running faster. 2

This is a capture taken from the DAC9881 datasheet. The settling time measurement is made from when the LDAC signal has fallen low and the input data word begins to propagate through the system. Notice that the dead time is very short, large signal settling time is pretty well behaved, and the settling time is primarily spent in the linear settling or small signal settling region and slew time. Remember to pay attention to how the datasheet electrical characteristics table shows the settling time measurement being taken. In this case, the DAC9881 is shown to settle to 0.003% FSR with a specific load of 10kOhms in parallel with 50pF and over a transition from code 0x04000 to 0x3C000. This is a large step size and is intended to be a worst-case figure. The settling time figure will look much better across smaller code transitions as larger step sizes generally take longer to settle. 3

Related to settling time is another specification called glitch or glitch area. While the settling time specification is dominated by the output buffer the glitch specification is dominated by the DAC itself and glitch will make contributions to settling time. Glitch impulse area is defined as the area associated with the overshoot or undershoot created by a code transition, and is generally quantified in Volt-seconds. There are two different types of glitches, single-lobe and double-lobe, which are mostly dependent on the DAC architecture. The DAC R-2R architecture produces the largest glitch in terms of amplitude and duration. 4

There are two primary sources of glitch, both relating to the switches used inside the DAC. First, when the switches transition the charge injection associated with the switches themselves will contribute a glitch at the output. Second, the switches will not switch at exactly the same time which will lead to larger glitch impulses. Glitch impulse area is heavily dependent on the DAC architecture. String DAC architectures feature fewer simultaneously switching nodes and will therefore exhibit smaller glitch area R-2R DACs. R2R DACs may switch many switches in parallel during code transitions. A worst case scenario arises when every switch transitions in an R-2R DAC. The R-2R architecture displays large glitch areas at major-carry transitions - a single-code transition that causes the most significant bit (MSB) to change because of the transitioning lower bits (LSBs). Some examples would be moving from binary 011 to 100 or 1000 to 0111. Let s look at an illustration of the first example. 5

In order to show more detail, let s look at each switch s transition and relate it to what is observed on the output. The R-2R structure is shown in three states here. The first switch state is the initial setting of the DAC. At this point the output has already settled and we have just written the new value. In the second state, the DAC enters a major carry transition where all of the switches are briefly connected to GND due to digital propagation delay of the most significant bit relative to the lease significant bits. This may be different from device to device. Then in the final state, the DAC switches settle out and charge is injected from the switches. Following this is the recovery time or small signal settling time. 6

Comparing side by side a major carry transition vs a non major carry transition, we can see how large glitch is a result of a major carry transition on the order of 150mV. Both pictures on this slide show the DAC9881 stepping up one code. The picture on the left is crossing over a major carry code transition while the picture on the right is not. 7

So far in our glitch discussion we ve been looking at the R-2R DAC architecture because it s much easier to observe glitch area with an R-2R DAC. When we compare the R-2R glitch side by side with the string DAC we observe noticeable improvements. 8

There are two solutions to glitch reduction, and they are summarized here side by side to assess the pros and cons. Depending on the application requirements, a simple RC filter may do the trick. If the system needs to maintain good settling time and the RC filer approach is therefore unacceptable, a sample and hold circuit is the best solution. Of course, the other option is to steer clear of R-2R DACs and look towards a string DAC solution to avoid large glitch impulses, but doing so may force a tradeoff in other specs. 9

Next, we will talk about noise. As in almost any device, there is going to be noise associated with DACs. In noise conscious applications the goal is to minimize the DAC noise as much as possible to achieve optimal performance. In order to do that we need to look at the three major sources of noise contribution: the DAC s internal resistor network, the output amplifier - which may be integrated - and the reference voltage also possibly integrated. First, lets examine the resistor network. 10

For an example calculation, let s look at an unbuffered R-2R MDAC, which is simply a resistor ladder without an output amplifier. The easiest way to think of the resistor ladder when analyzing noise is as a single equivalent resistor which changes value as you change code. At full scale code, all the switches are switched to the IOUT node, basically creating a resistor in series with the reference and IOUT. If you were to look back into the DAC from the Iout node, you will see an equivalent resistance equal to the entire resistor chain. TI datasheets often specify this impedance in the electrical characteristics table as the reference input impedance. Once you have the equivalent output impedance at IOUT, you can calculate the resistor noise, also thermal noise, from the network using the resistor thermal noise equation shown here. One subtle but important note is that there are two resistances of interest here. First, there is the equivalent resistance of the resistor network which is code dependent. Second, you have the feedback resistor which is used in combination with an output amplifier to create an output voltage. When the DAC is in a gain of -1 The value of the feedback resistor is equal to the DAC resistor network at full scale code. Both of these resistances need to be accounted for when calculating the thermal resistor noise of the system. 11

Our second source of noise is the DAC s output amplifier. This output amplifier may be included internally in the DAC or you may have the option to choose your own external amplifier to meet your system needs. 12

Examining op amp noise has four basic components, 1/f voltage noise, broadband voltage noise, resistor voltage noise, and current noise. Current noise and resistor noise have a lot to do with implementation and less to do with properties of the amplifier itself. For our purposes we ll only consider the 1/f and broadband noise component since these are more intrinsic values to the operational amplifier and will help us select our amplifier intelligently. The key thing to illustrate here is that in a typical application our focus will be on DC operating conditions where the bandwidth is limited and the broadband region will not contribute significant noise. 13

As a best practice when your amplifier is external, search for devices with low 1/f noise. And when it comes time to do noise estimations for your design, check out the TI Precision Labs video series on Op-Amp noise for guidance on how to calculate your amplifier noise. When the amplifier is internal to the DAC, most of the work is already done for you and the noise is characterized in the DAC datasheet. You can generally find a noise number in the electrical characteristics, and a plot of the noise spectrum with the other graphs further in the document. 14

Last, we need to look into the reference voltage. Looking back at the transfer function for the DAC, we see that the noise and gain of our DAC is directly dependent on the reference voltage. Therefore, it is very important to have a few quick design steps to optimize the design of the reference voltage. 15

The initial accuracy and output noise level of the voltage reference is directly coupled into the DAC. The accuracy of the voltage reference is a DC phenomena, however the output noise is an AC event. As the output voltage of the DAC increases, per programmed input code, the voltage reference noise level increases in magnitude. Keep in mind there are other sources that could also have an impact on the noise such as power supply transients and the cleanliness of the ground layer. That is why well regulated supplies and a proper layout are a major focus of every design. 16

In summary, we learned about the three major AC specifications that are relevant to Precision DACs: settling time, glitch, and noise. We learned about single and double lobe glitches and why they exist. And we also covered the three major noise contributors: the resistor network, output amplifiers, and reference voltages. Thank you for watching this video on AC specifications for precision DACs. Please watch our other videos on precision DACs to learn more. 17