High voltage CoolMOS CE in SOT-223 package

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AN_201603_PL52_016 High voltage CoolMOS CE in SOT-223 package About this document Scope and purpose Nowadays, the package costs of high voltage, high ohmic MOSFETs (metal oxide semiconductor field effect transistors) is the dominant part of the overall end customer selling price, therefore it is necessary to find other package solutions which can meet the same requirements and provide the same benefits as currently used package concepts. This application note will provide an explanation of how to use a high voltage CoolMOS TM in a SOT-223 package. This package is a direct pin to pin replacement for DPAK without suffering any thermal limitations when using the DPAK footprint for SOT-223. Infineon Technologies provides the first high voltage MOSFET portfolio in a SOT-223 package without middle pin. This features the smallest geometry per R DS(on) (drain source on-state resistance) and reduces the overall BOM (bill of material) of an application as much as possible. The biggest challenge when using SMD packages is the thermal behavior. DPAK is already widely used, especially in lighting applications. This document is going to compare DPAK and SOT-223 with respect to package dimensions and, most importantly, the thermal behavior. Intended audience This application note is written to give an application engineer or SMPS (switched mode power supply) designer the ability to overcome thermal boundaries related to SOT-223 through simulations and real application measurements. Application Note Revision1.0

SOT-223 versus DPAK package outlines Table of contents About this document... 1 Table of contents... 2 1 SOT-223 versus DPAK package outlines... 3 2 Thermal behavior in steady state... 4 3 Thermal behavior in end customer designs... 7 3.1 18 W LED driver (open frame measurement)... 7 3.1.1 Setup description... 7 3.1.2 Results... 7 3.2 50 W LED driver (closed frame measurement)... 8 3.2.1 Setup description... 8 3.2.2 Results... 8 3.3 10 W charger... 9 3.3.1 Setup description... 9 3.3.2 Results... 9 3.4 Application test summary... 9 4 Portfolio... 11 Revision history... 12 Application Note 2 Revision1.0

SOT-223 versus DPAK package outlines 1 SOT-223 versus DPAK package outlines The SOT-223 package can be a direct pin to pin replacement for a DPAK package with the outer dimensions and lead spacing shown in Figure 1. Figure 1 Package comparison SOT-223 and DPAK It can be seen that the middle pin of a standard SOT-223 is removed which allows the inclusion of 700 V MOSFETs. This version of SOT-223 is even safer with respect to soldering processes (reflow or especially wave) as there is less possibility for solder residues between the leads. Additionally, the optical solder inspection after the soldering process allows greater visibility than with DPAK. As already anticipated in the scope and purpose section of this document the biggest challenge with SOT-223 is the thermal behavior. This application note will discuss the general structure and thermal resistance (R th ) during steady state conditions in the next section. Application Note 3 Revision1.0

Thermal behavior in steady state 2 Thermal behavior in steady state The SOT-223 package does not offer an exposed leadframe like DPAK does. Therefore, the overall R th,jc (thermal resistance from junction to backside of the leadframe) is not a useful parameter and a SOT-223 package uses R th,js (thermal resistance from junction to solder point) which is typically higher than the R th,jc from a DPAK (see Figure 2). Figure 2 Simplified R th,jc (DPAK) versus R th,js (SOT-223) This leads to the conclusion that a SOT-223 package can only be used as a plug and play replacement if the overall power losses (switching losses and conduction losses) of the MOSFET do not exceed 300 mw and by accepting a slightly higher case temperature. If the power losses exceed this value, an additional copper area (connected to the drain pin (D)) needs to be included on the PCB (printed circuit board). Figure 3 below shows the thermal dependency of DPAK and SOT-223 packages on the copper area around the drain connection. Figure 3 Thermal simulation of junction temperature @250 mw and ambient temperature of 55 C This thermal behavior can be illustrated and explained by a constant current measurement setup which shows the temperature differences of the MOSFET mold compound. This comparison uses a DPAK mounted on Application Note 4 Revision1.0

Thermal behavior in steady state minimum footprint (~40 mm²) and a SOT-223 placed on various PCB footprints (35 µm copper thickness / FR4 material), with up to 800 mw losses within the MOSFET. Figure 4 Thermal measurement with different adapter PCBs for SOT-223 Application Note 5 Revision1.0

Thermal behavior in steady state A DPAK on DPAK footprint: This adapter board uses the minimum DPAK footprint with a DPAK package in order to have a reference measurement. The thermal image was acquired by a thermal camera after thermal saturation with a thermal gradient (ΔT C ) < 0.1 C/min. B C D SOT-223 on SOT-223 footprint: ~10 mm² copper area SOT-223 on DPAK footprint: ~40 mm² copper area SOT-223 on DPAK + 20 mm² Cu: ~60 mm² copper area The use of a SOT-223 package on the minimum SOT-223 footprint adds an additional 10 C to the mold compound temperature when compared to the DPAK which makes this setup suitable for very low power levels - giving the possibility to save board space. Nevertheless, as a direct DPAK replacement it can only be implemented if the design has enough thermal headroom. With this setup it is possible to use a SOT-223 package as a direct drop-in replacement for DPAK by accepting a ~5 C higher mold compound temperature. However, the DPAK design should have some thermal headroom before reaching specification limits. The IFX recommended usage is represented by this configuration. With an additional copper area on the drain lead of around 20 mm² in comparison to the DPAK minimum footprint it is possible to achieve nearly the same thermal performance as with a DPAK. It is clear that in case of using a SOT-223 package on minimum footprint as a replacement for DPAK would need very high thermal headroom and this is typically not available in customer designs. The best opportunity to reach similar performace to the DPAK is to increase the copper area. This is especially true in lighting applications and is discussed in the next section of this application note where we will cover some thermal measurements in real customer designs with open and closed frames. Application Note 6 Revision1.0

Thermal behavior in end customer designs 3 Thermal behavior in end customer designs By reviewing end customer designs, especially in the lighting segment, there is a general availability of additional copper, in the range of >150 mm², as can be seen below. This would allow for a plug and play replacement by accepting a 2 C higher case temperature. Furthermore, all results which are shown are taken after 30 minutes burn-in time in order to heat up the whole application. Attention: for a reliable and correct comparison between different packages even with the same technology inside it is necessary to have characterized and matched devices with respect to the chip inside the package itself. 3.1 18 W LED driver (open frame measurement) 3.1.1 Setup description This LED driver is a single stage power factor corrected isolated flyback LED driver for lighting applications. V IN = 90 305 V AC I OUT = 350 ma V OUT = 12 50 V DC Copper area = ~175 mm² (red marking) Tested MOSFETs: IPD65R1K4C6 vs. IPN65R1K5CE Thermal measurement: thermal camera; open frame; ambient = 25 C 3.1.2 Results Figure 5 Thermal comparison of IPD65R1K4C6 vs. IPN65R1K5CE in an 18 W LED driver Application Note 7 Revision1.0

Thermal behavior in end customer designs Figure 5 above illustrates the maximum mold compound temperature on the y-axis and the output power on the x-axis. The IPD65R1K4C6 is represented as reference line in blue directly on the x-axis while the IPN65R1K5CE is represented as yellow line. It is clearly shown that the IPN65R1K5CE exhibits a higher mold compound temperature (2.5 C at full load and 120 V AC input) than the IPD65R1K4C6. Now we will consider closed frame operation. 3.2 50 W LED driver (closed frame measurement) 3.2.1 Setup description This LED driver is a single stage power factor corrected isolated flyback LED driver for lighting applications. V IN = 198 264 V AC I OUT = 350 ma V OUT = 54 150 V DC Copper area = ~530 mm² (red marking) Tested MOSFETs: IPD70R1K5CE vs. IPN70R1K5CE Thermal measurement: thermocouples; closed frame; ambient inside enclosure = 52 C 3.2.2 Results Figure 6 Thermal comparison of IPD65R1K4C6 vs. IPN65R1K5CE in a 50 W LED driver Application Note 8 Revision1.0

Thermal behavior in end customer designs 3.3 10 W charger 3.3.1 Setup description This charger is a QR flyback which typically uses an IPAK SL (short leads). In this case adapter boards were used to analyze the thermal performance the same as the constant current measurement which was only tested at full load condition after 30min burn-in phase. V IN = 86 264 V AC I OUT = 2 A V OUT = 5 V DC Copper area for SOT-223 = ~60 mm² (DPAK = ~40 mm²) Tested MOSFETs: IPD60R2K0C6 vs. IPN60R2K1CE Thermal measurement: thermal camera; open frame; ambient = 25 C 3.3.2 Results Table 1 Thermal comparison of IPD60R2K0C6 vs. IPN60R2K1CE in a 10 W charger @ V IN=90 V AC Adapter PCB DPAK on DPAK footprint (reference) SOT-223 on SOT-223 footprint SOT-223 on DPAK footprint SOT-223 ond DPAK footprint + 20 mm² T ambient [ C] T MOS [ C] ΔT (T MOS -T ambient ) ΔT DPAK vs. SOT-223 [ C] 24.6 95 Reference 25.3 113.5 +17.8 C 25.4 103.4 +7.6 C 24.7 97.9 +2.8 C It is clearly visible that this R DS(on) class would not fit the requirement of the charger itself. It clearly shows the thermal differences related to the package. In this case the SOT-223 would have a 2.8 C higher mold compound temperature on the DPAK footprint increased by 20 mm² (total of ~60 mm² copper area) than a DPAK on a DPAK footprint which leads to the following conclusion for all of the application tests performed. 3.4 Application test summary All of the applications analyzed have shown that the mold compound temperature is heavily dependant on the additional cooling from the copper area connected to the drain pin. With an additional copper area of ~20 mm² and above, when compared to the DPAK minimum footprint, it is possible for a SOT-223 package to have nearly the same thermal performance as a DPAK by accepting a 2 C 3 C (approx.) higher case temperature. This gives the SMPS designer the opportunity to reduce the overall BOM costs significantly as an additional copper area of 20 mm², if not already in place, does not increase the production costs of the application PCB. Application Note 9 Revision1.0

Thermal behavior in end customer designs The last section of this document will show the available portfolio of CoolMOS TM high voltage MOSFETs in SOT- 223. Application Note 10 Revision1.0

Portfolio 4 Portfolio The portfolio is currently based on CE technology in 4 voltage classes as shown in Figure 7 below. Figure 7 Portfolio for SOT-223 In the future, the portfolio is planned to expand to include the latest technologies. Even lower R DS(on) values will be possible as better R DS(on) * A (area) technologies are in development. Updates to the portfolio will follow after the new P7 technologies are released by Infineon Technologies. Application Note 11 Revision1.0

Revision history Revision history Major changes since the last revision Page or reference Description of change Application Note 12 Revision1.0

Trademarks of Infineon Technologies AG AURIX, C166, CanPAK, CIPOS, CoolGaN, CoolMOS, CoolSET, CoolSiC, CORECONTROL, CROSSAVE, DAVE, DI-POL, DrBlade, EasyPIM, EconoBRIDGE, EconoDUAL, EconoPACK, EconoPIM, EiceDRIVER, eupec, FCOS, HITFET, HybridPACK, Infineon, ISOFACE, IsoPACK, i-wafer, MIPAQ, ModSTACK, my-d, NovalithIC, OmniTune, OPTIGA, OptiMOS, ORIGA, POWERCODE, PRIMARION, PrimePACK, PrimeSTACK, PROFET, PRO-SIL, RASIC, REAL3, ReverSave, SatRIC, SIEGET, SIPMOS, SmartLEWIS, SOLID FLASH, SPOC, TEMPFET, thinq!, TRENCHSTOP, TriCore. Trademarks updated August 2015 Other Trademarks All referenced product or service names and trademarks are the property of their respective owners. Edition 2016-03-24 Published by Infineon Technologies AG 81726 Munich, Germany 2017 Infineon Technologies AG. All Rights Reserved. Do you have a question about this document? Email: erratum@infineon.com Document reference AN_201603_PL52_016 IMPORTANT NOTICE The information contained in this application note is given as a hint for the implementation of the product only and shall in no event be regarded as a description or warranty of a certain functionality, condition or quality of the product. Before implementation of the product, the recipient of this application note must verify any function and other technical information given herein in the real application. Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind (including without limitation warranties of non-infringement of intellectual property rights of any third party) with respect to any and all information given in this application note. The data contained in this document is exclusively intended for technically trained staff. It is the responsibility of customer s technical departments to evaluate the suitability of the product for the intended application and the completeness of the product information given in this document with respect to such application. For further information on the product, technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies office (www.infineon.com). WARNINGS Due to technical requirements products may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies office. Except as otherwise explicitly approved by Infineon Technologies in a written document signed by authorized representatives of Infineon Technologies, Infineon Technologies products may not be used in any applications where a failure of the product or any consequences of the use thereof can reasonably be expected to result in personal injury.