SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005 & ANSI/NCSL Z

SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005 & ANSI/NCSL Z540-1-1994 SIMCO SCIENTIFIC INSTRUMENT REPAIR AND CALIBRATION SERVICES CO., LTD. Flat 404 North Software Tower, NanSha IT Park Panyu NanSha, Guangzhou, Guangdong, China 511458 Catherine Xu Phone: (86) 20 3468 5600 Fax: (86) 20 3468 5602 CALIBRATION Valid To: September 30, 2017 Certificate Number: 1395.18 In recognition of the successful completion of the A2LA evaluation process, accreditation is granted to this laboratory to perform the following calibrations 1 : I. Chemical Parameter/Equipment Range CMC 2 ( ) Comments Conductivity, Fixed Points 10 S 100 S 1000 S 1413 S 0.21 S 0.59 S 4.9 S 4.4 S Reference solutions II. Dimensional Parameter/Equipment Range CMC 2, 7 ( ) Comments Calipers, Micrometers 3 Length Only Up to 40 in (9L + 0.6R) in Gage blocks Tapes and Rules 3 (0.01 to 1000) mm 0.015 mm Gage blocks Pin Gages Up to 4 in 30 in Lasermic A2LA Cert. No. 1395.18) Revised 11/3/2016 Page 1 of 18

III. Electrical DC/Low Frequency Parameter/Equipment Range CMC 2, 6, 8 ( ) Comments DC Voltage Generate (0 to 220) mv (0.22 to 2.2) V (2.2 to 11) V (11 to 22) V (22 to 220) V (220 to 1100) V 1.4 µv/v + 0.1 µv 5.1 µv/v + 2 µv 3.4 µv/v + 20 µv 3.0 µv/v + 20 µv 4.2 µv/v + 0.1 mv 5.4 µv/v + 1.5 mv Fluke 5700A DC Voltage Measure (0 to 100) mv (0.1 to 1) V (1 to 10) V (10 to 100) V (100 to 1000) V* 11 V/V + 0.8 V 9 V/V + 0.8 V 9 V/V + 1 V 17 V/V + 31 V 15 V/V + 100 V* HP 3458A OPT-2 *add 12 (V in /1000) 2 ppm to all V in > 100 DC Voltage Generate, Fixed Points 1 V 1.018 V 10 V 14 V/V 27 V/V 28 V/V Fluke 732A DC Current Generate (0 to 220) µa (0.22 to 2.2) ma (2.2 to 22) ma (22 to 220) ma (0.22 to 2.2) A (2.2 to 3) A (3 to 11) A (11 to 20.5) A 0.13 na/a + 0.02 µa 50 na/a + 0.05 µa 45 na/a + 0.25 µa 140 na/a + 2.5 µa 55 µa/a + 40 µa 470 µa/a + 40 µa 0.0059 % + 500 µa 0.12 % + 750 µa* Fluke 5700A *Specifications apply within 2 minutes of selecting operate DC Current Measure (0 to 1) A (1 to 10) A (10 to 100) A (0.1 to 1) ma (1 to 10) ma (10 to 100) ma 45 A/A + 45 pa 43 A/A + 110 pa 52 A/A + 900 pa 36 A/A + 6 na 36 A/A + 60 na 43 A/A + 600 na HP 3458A OPT-2 (0.1 to 1) A (1 to 3) A 0.013 % + 12 A 0.18 % HP 34401A (3 to 100) A (100 to 200) A 0.41 % 0.31 % HP 34401A w/dc shunt A2LA Cert. No. 1395.18) Revised 11/3/2016 Page 2 of 18

Parameter/Equipment Range CMC 2, 5, 6 ( ) Comments Resistance 3 Generate (0 to 11) (11 to 33) (33 to 110) (110 to 330) (0.33 to 1.1) k (1.1 to 3.3) k (3.3 to 11) k (11 to 33) k (33 to 110) k (110 to 330) k (0.33 to 1.1) M (1.1 to 3.3) M (3.3 to 11) M (11 to 33) M (33 to 110) M (110 to 323) M (0.11 to 1.1) G 13 / + 1 m 16 / + 1.5 m 21 / + 1.4 m 22 / + 2 m 24 / + 2 m 13 / + 0.02 24 / + 0.02 23 / + 0.2 24 / + 0.2 25 / + 2 27 / + 2 47 / + 30 0.01 % + 50 0.018 % + 2.5 k 0.039 % + 3 k 0.23 % + 0.1 M 1.2 % + 1 M Fluke 5520A/SC1100 CMC s shown are based on 4-wire compensation only; for 2-wire and 2-wire compensation add 5 V per ampere stimulus current. (R floor = E/I) Resistance 3 Measure (0 to 10) (10 to 100) (0.1 to 1) k (1 to 10) k (10 to 100) k (0.1 to 1) M (1 to 10) M (10 to 100) M (100 to 1000) M 19 / + 50 16 / + 0.5 m 13 / + 1 m 13 / + 10 m 13 / + 0.6 19 / + 3 60 / + 120 0.06 % + 1 k 0.09 % + 5 M HP 3458A OPT-2 Within 1 C of last ACAL and 5 C of T CAL. Electrical Simulation of Thermocouples 3 Type E -250 C to -100 C -100 C to -25 C -25 C to 350 C 350 C to 650 C 650 C to 1000 C 0.5 C 0.17 C 0.16 C 0.17 C 0.21 C Fluke 5520A Type J -210 C to -100 C -100 C to -30 C -30 C to 150 C 150 C to 760 C 760 C to 1200 C 0.22 C 0.15 C 0.13 C 0.15 C 0.22 C A2LA Cert. No. 1395.18) Revised 11/3/2016 Page 3 of 18

Parameter/Equipment Range CMC 2, 5 ( ) Comments Electrical Simulation of Thermocouples 3 (cont) Type K -200 C to -100 C -100 C to -25 C -25 C to 120 C 120 C to 1000 C 1000 C to 1372 C 0.29 C 0.18 C 0.16 C 0.26 C 0.4 C Fluke 5520A Type T -250 C to -150 C -150 C to 0 C 0 C to 120 C 120 C to 400 C 0.63 C 0.24 C 0.16 C 0.14 C Electrical Simulation of RTD 3 Pt 3916, 100 Ω -200 ºC to -190 ºC 400 ºC to 630 ºC 0.30 ºC 0.15 ºC Fluke 5520A Pt 385, 200 Ω -200 ºC to -190 ºC 400 ºC to 630 ºC 0.14 ºC 0.15 ºC Pt 385, 500 Ω -200 ºC to -80 ºC 400 ºC to 630 ºC 0.13 ºC 0.14 ºC Pt 385, 500 Ω -200 ºC to 0 ºC 400 ºC to 630 ºC 0.13 ºC 0.14 ºC Oscilloscopes Level Sine Wave 50 khz Ref. 5 mv to 5.5 V (p-p) 3.4 % + 300 V Fluke 5520A/SC1100 Level Sine Flatness 5 mv to 5.5 V 50 khz to 100 MHz (100 to 300) MHz (300 to 600) MHz 3.2 % + 100 V 3.4 % + 100 V 4.3 % + 100 V Relative to 50 khz reference 5 mv to 3.5 V (600 to 1100) MHz 4.3 % + 100 V Vertical Gain DC Into 50 Into 1 M (0 to 6.6) V (0 to 130) V 0.2 % + 40 V 0.27 % + 40 V A2LA Cert. No. 1395.18) Revised 11/3/2016 Page 4 of 18

Parameter/Equipment Range CMC 2, 5, 8 ( ) Comments Oscilloscopes (cont) Square Wave Into 50 Into 1 M 1 mv to 6.6 V (p-p) 1 mv to 130 V (p-p) 0.21 % + 40 V 0.16 % + 40 V Fluke 5520A/SC1100 Freq. > 1 khz Time Marker Output Into 50 (1 to 10) ns 10 ns to 50 ms 50 ms to 5 s in 5-2-1 sequence 0.071 % 0.032 % 0.032 % Pulse Rise Time 5 mv to 2.5 V (p-p) Up to 2 MHz (2 to 1100) MHz 300 ps 350 ps 11 ps 11 ps Resistance Generate, Fixed Points 0.01 Ω 0.1 Ω 1 Ω 10 Ω 100 Ω 1 kω 10 kω 100 kω 1 MΩ 10 MΩ 100 MΩ 1 GΩ 10 GΩ 100 GΩ 1 TΩ 1.2 % 0.14 % 0.02 % 25 µω/ω 21 µω/ω 53 µω/ω 13 µω/ω 13 µω/ω 0.10 % 0.012 % 0.12 % 1.2 % 8.2 % 5.9 % 16 % L&N 4222 L&N 4221 L&N 4020B L&N 4025B L&N 4030B L&N 4035B L&N 4040B L&N 4045B L&N 4050B SIMCO S5155 set R&S CR504 1 Ω 1.9 Ω 10 Ω 19 Ω 100 Ω 190 Ω 1 kω 1.9 kω 10 kω 19 kω 100 kω 190 kω 78 µω/ω 53 µω/ω 77 µω/ω 28 µω/ω 19 µω/ω 33 µω/ω 18 µω/kω 16 µω/kω 18 µω/kω 16 µω/kω 0.025 % 0.014 % Fluke 5700A A2LA Cert. No. 1395.18) Revised 11/3/2016 Page 5 of 18

Parameter/Equipment Range CMC 2, 8 ( ) Comments Resistance Generate, Fixed Points (cont) 1 MΩ 1.9 MΩ 10 MΩ 19 MΩ 100 MΩ 0.017 % 0.012 % 0.069 % 0.065 % 0.070 % Fluke 5700A Capacitance Measure @ 1 khz, 120 Hz, 10 khz (1 to 10) pf (10 to 100) pf (100 to 1000) pf (1 to 10) nf (10 to 100) nf (100 to 1000) nf 0.033 % 0.016 % 0.014 % 0.014 % 0.014 % 0.014 % GenRad 1693 Capacitance Generate @ 1 khz 10 pf 100 pf 1000 pf 10 nf 100 nf 0.034 % 0.018 % 0.012 % 0.016 % 0.016 % 76-3A 1404A 1409L 1409T Inductance Measure @ 1 khz 100 µh to 1 mh 1 mh to 1 H (1 to 5) H (5 to 10) H 0.015 % 0.014 % 0.015 % 0.016 % Gen-Rad 1693 @ 100 Hz 100 µh to 1 mh 1 mh to 1 H 1 mh to 10 H 0.051 % 0.030 % 0.072 % Inductance Generate Fixed Points @ 1 khz 1 mh 10 mh 100 mh 1 H 5 H 0.045 % 0.036 % 0.11 % 0.11 % 0.11 % Gen-Rad 1482-E Gen-Rad 1482-H Gen-Rad 1482-L Gen-Rad 1482-P Gen-Rad 1482-R @ 100 Hz 5 H 1 mh 0.13 % 0.076 % Gen-Rad 1482-R Gen-Rad 1482-E A2LA Cert. No. 1395.18) Revised 11/3/2016 Page 6 of 18

Parameter/Range Frequency CMC 2, 8 ( ) Comments AC Voltage Generate (1 to 2.2) mv (10 to 20) Hz (20 to 40) Hz 40 Hz to 20 khz (300 to 500) khz 500 khz to 1 MHz 0.11 % + 5 µv 0.0020 % + 5 µv 0.026 % + 5 µv 0.045 % + 5 µv 0.15 % + 6 µv 0.18 % + 12 µv 0.078 % + 25 µv 0.27 % + 25 µv Fluke 5700A (2.2 to 22) mv (10 to 20) Hz (20 to 40) Hz 40 Hz to 20 khz (300 to 500) khz 500 khz to 1 MHz 0.050 % + 5 µv 0.022 % + 5 µv 0.0097 % + 5 µv 0.036 % + 5 µv 0.077 % + 6 µv 0.12 % + 12 µv 0.16 % + 25 µv 0.43 % + 25 µv (22 to 220) mv (10 to 20) Hz (20 to 40) Hz 40 Hz to 20 khz (300 to 500) khz 500 khz to 1 MHz 0.047 % + 15 µv 0.018 % + 8 µv 0.0086 % + 8 µv 0.026 % + 8 µv 0.069 % + 20 µv 0.089 % + 25 µv 0.14 % + 30 µv 0.29 % + 60 µv (0.22 to 2.2) V (10 to 20) Hz (20 to 40) Hz 40 Hz to 20 khz (300 to 500) khz 500 khz to 1 MHz 0.049 % + 50 µv 0.016 % + 20 µv 0.0071 % + 10 µv 0.012 % + 12 µv 0.024 % + 40 µv 0.044 % + 100 µv 0.11 % + 250 µv 0.24 % + 400 µv (2.2 to 22) V (10 to 20) Hz (20 to 40) Hz 40 Hz to 20 khz (300 to 500) khz 500 khz to 1 MHz 0.046 % + 0.5 mv 0.015 % + 0.2 mv 0.0066 % + 0.07 mv 0.022 % + 0.12 mv 0.045 % + 0.25 mv 0.13 % + 0.8 mv 0.23 % + 2.5 mv 0.53 % + 4 mv A2LA Cert. No. 1395.18) Revised 11/3/2016 Page 7 of 18

Parameter/Range Frequency CMC 2, 6, 8 ( ) Comments AC Voltage Generate (cont) (22 to 220) V (10 to 20) Hz (20 to 40) Hz 40 Hz to 20 khz (300 to 500) khz 500 khz to 1 MHz 0.031 % + 5 mv 0.011 % + 2 mv 0.0061 % + 0.7 mv 0.011 % + 1.2 mv 0.017 % + 3 mv 0.12 % + 20 mv 0.42 % + 50 mv 0.80 % + 100 mv Fluke 5700A (220 to 1100) V (15 to 50) Hz 50 Hz to 1 khz 0.028 % + 20 mv 0.0080 % + 4 mv AC Voltage Measure (1 to 10) mv (1 to 40) Hz 40 Hz to 1 khz (1 to 20) khz 0.04 % + 3 V 0.03 % + 1.1 V 0.04 % + 1.1 V 0.1 % + 1.1 V 0.5 % + 1.1 V 4 % + 2 V HP 3458A OPT-2 (10 to 100) mv (1 to 40) Hz 40 Hz to 1 khz (1 to 20) khz (0.3 to 1) MHz (1 to 2) MHz 0.0016 % + 4 V 0.009 % + 2 V 0.015 % + 2 V 0.03 % + 2 V 0.09 % + 2 V 0.3 % + 10 V 1.6 % + 10 V 1.7 % + 10 V A2LA Cert. No. 1395.18) Revised 11/3/2016 Page 8 of 18

Parameter/Range Frequency CMC 2, 6, 8 ( ) Comments AC Voltage (cont) Measure 100 mv to 1 V (1 to 40) Hz 40 Hz to 1 khz (1 to 20) khz (0.3 to 1) MHz (1 to 2) MHz 0.01 % + 40 V 0.01 % + 20 V 0.02 % + 20 V 0.04 % + 20 V 0.09 % + 20 V 1.2 % + 100 V 1.6 % + 100 V 1.7 % + 100 V HP 3458A OPT-2 (1 to 10) V (1 to 40) Hz 40 Hz to 1 khz (1 to 20) khz (0.3 to 1) MHz (1 to 2) MHz 0.01 % + 0.4 mv 0.01 % + 0.2 mv 0.02 % + 0.2 mv 0.04 % + 0.2 mv 0.09 % + 0.2 mv 0.3 % + 1 mv 1 % + 1 mv 1.7 % + 1 mv (10 to 100) V (1 to 40) Hz 40 Hz to 1 khz (1 to 20) khz (0.3 to 1) MHz 0.03 % + 4 mv 0.02 % + 2 mv 0.02 % + 2 mv 0.035 % + 2 mv 0.14 % + 2 mv 0.5 % + 10 mv 1.7 % + 10 mv (100 to 1000) V (1 to 40) Hz 40 Hz to 1 khz (1 to 20) khz 0.05 % + 20 mv 0.05 % + 20 mv 0.07 % + 20 mv 0.14 % + 20 mv 0.3 % + 20 mv AC Current 3 Generate (45 to 1000) Hz (30 to 220) µa (0.22 to 2.2) ma (2.2 to 22) ma (22 to 220) ma (0.22 to 2.2) A (2.2 to 11) A (11 to 20.5) A 0.050 % + 0.025 µa 0.013 % + 0.035 µa 0.016 % + 0.35 µa 0.012 % + 3.5 µa 0.051 % + 35 µa 0.045 % + 3 ma 0.14 % + 3 ma Fluke 5700A Fluke 5520A/SC 1100 LCOMP off A2LA Cert. No. 1395.18) Revised 11/3/2016 Page 9 of 18

Parameter/Range Frequency CMC 2, 5, 6, 8 ( ) Comments AC Current 3 Measure (5 to 100) A (0.1 to 1) ma (45 to 5000) Hz 0.05 % + 0.03 A 0.04 % + 0.2 A HP 3458A OPT-2 (1 to 10) ma (10 to 100) ma (0.1 to 1) A (1 to 10) A (45 to 5000) Hz 0.046 % + 2 A 0.04 % + 20 A 0.1 % + 0.2 ma 0.73 % HP 34401A Phase Angle 3 Generate -90 to +90 (10 to 65) Hz (65 to 500) Hz 500 Hz to 1 khz (1 to 5) khz (5 to 10) khz (10 to 30) khz 0.1 0.2 0.4 2 4 12 Fluke 5520A/SC1100 Measure 0 to 360 Voltage Voltage Voltage Current 65 Hz to 10 khz (10 to 30) khz 65 Hz to 1 khz 0.04 0.22 0.03 Stanford Research SR830 Harmonic Distortion 20 Hz to 20 khz (20 to 100) khz 1.5 db 2.5 db HP8903B AC/DC High Voltage Measure DC High Voltage (1 to 60) kv 0.17 % VD60-6.2Y-A-LB-A w/ 3458A AC High Voltage (Peak 120 kv) (1 to 60) kv 1.3 % VD60-6.2Y-A-LB-A A2LA Cert. No. 1395.18) Revised 11/3/2016 Page 10 of 18

IV. Electrical RF/Microwave Parameter/Range 4 Frequency CMC 2, 8 ( ) Comments RF Power 3 Generate (+13 to -86) dbm 200 Hz to 1 khz (1 to <100) khz 100 khz >100 khz to 25 MHz (25 to 80) MHz 0.23 db 0.14 db 0.07 db 0.14 db 0.23 db HP 3335A (+10 to -110) dbm 10 MHz to 2 GHz (2 to 20) GHz (20 to 40) GHz (40 to 50) GHz 0.7 db 0.9 db 1 db 2.1 db HP 83650B Absolute RF Power 3 Measure 0 dbm 50 MHz 0.45 % Precision measurements EL 1300 thermal converter (+13 to -20) dbm 100 khz to 2.6 GHz 0.12 db HP 8902A w/11722a power sensor (+13 to -30) dbm 300 khz to 1 MHz 1 MHz to 2 GHz 2 GHz to 4.2 GHz 1.8 % 1.8 % 1.8 % 1.8 % HP 438A w/hp8482a (4.2 to 10) GHz (10 to 18) GHz (18 to 26) GHz (26 to 40) GHz (40 to 50) GHz 3.0 % 3.1 % 3.2 % 3.5 % 4.4 % HP438A w/hp 8487A (-70 to -20) dbm 50 MHz to 1 GHz (1 to 12) GHz (12 to 26) GHz (26 to 40) GHz (40 to 50) GHz 2.9 % 2.7 % 3.3 % 3.6 % 4.5 % HP 438A w/hp 8487A HP 438A w/hp 8481D HP 438A w/hp 8487A A2LA Cert. No. 1395.18) Revised 11/3/2016 Page 11 of 18

Parameter/Range 4 Frequency CMC 2 ( ) Comments Tuned RF Power 3, Relative Measure 0 db, Reference (-0 to -10) db (-10 to -20) db (-20 to -30) db (-30 to -40) db (-40 to -50) db (-50 to -60) db (-60 to -70) db (-70 to -80) db (-80 to -90) db (-90 to -100) db (-100 to -110) db (-110 to -120) db 2.5 MHz to 1.3 GHz 0 db 0.23 db 0.24 db 0.27 db 0.30 db 0.31 db 0.38 db 0.42 db 0.47 db 0.51 db 0.56 db 0.61 db 0.68 db HP 8902A, HP 11722A 0 db, Reference (-0 to -10) db (-10 to -20) db (-20 to -30) db (-30 to -40) db (-40 to -50) db (-50 to -60) db (-60 to -70) db (-70 to -80) db (-80 to -90) db (-90 to -100) db (-100 to -110) db (1.3 to 26.5) GHz 0 db 0.34 db 0.41 db 0.48 db 0.55 db 0.64 db 0.73 db 0.81 db 0.89 db 0.99 db 1.1 db 1.2 db HP 8902A, HP 11792A, HP11793A RF Attenuation 3 Generate (1 to 2) db (3 to 4) db (3 to 6) db (7 to 10) db 11 db DC to 12.4 GHz 0.36 db 0.47 db 0.59 db 0.70 db 0.82 db HP 8494B (1 to 5) db (6 to 9) db (10 to 11) db (12.4 to 18) GHz 0.82 db 0.93 db 1.1 db A2LA Cert. No. 1395.18) Revised 11/3/2016 Page 12 of 18

Parameter/Range 4 Frequency CMC 2 ( ) Comments RF Attenuation 3 (cont) Generate 10 db 20 db 30 db 40 db 50 db 60 db 70 db 80 db 90 db 100 db 110 db DC to 4 GHz 0.24 db 0.47 db 0.59 db 0.82 db 0.94 db 1.2 db 1.4 db 1.6 db 1.8 db 1.9 db 2.1 db HP 8496A 10 db 20 db 30 db 40 db 50 db 60 db 70 db 80 db 90 db 100 db 110 db 4 GHz to 12.4 GHz 1.1 db 1.2 db 1.9 db 2.4 db 3.0 db 3.5 db 4.1 db 4.7 db 5.3 db 5.9 db 6.5 db HP 8496B 10 db 20 db 30 db 40 db 50 db 60 db 70 db 80 db 90 db 100 db 110 db 12.4 GHz to 18 GHz 1.1 db 1.3 db 2.1 db 2.7 db 3.4 db 4.0 db 4.7 db 5.3 db 6.0 db 6.6 db 7.3 db A2LA Cert. No. 1395.18) Revised 11/3/2016 Page 13 of 18

Parameter/Range 4 Frequency CMC 2, 8 ( ) Comments Amplitude Modulation 3 Measure (0.15 to 10) MHz Rate 50 Hz to 10 khz Depths: 5 % to 50 % 2.8 % + 1 digit HP 8902A Rate 50 Hz to 10 khz Depths: 50 % to 99 % 2.8 % + 1 digit Rate 20 Hz to 10 khz Depths: 0 % to 50 % 3.8 % + 1 digit Rate 20 Hz to 10 khz Depths: 50 % to 99 % 3.6 % + 1 digit (10 to 1300) MHz Rate 20 Hz to 100 khz Depths: 0 % to 50 % 3.8 % + 1 digit Rate 20 Hz to 100 khz Depths: 50 % to 99 % 3.6 % + 1 digit Rate 50 Hz to 50 khz Depths: 5 % to 50 % 1.9 % + 1 digit Rate 50 Hz to 50 khz Depths: 50 % to 90 % 1.5 % + 1 digit (1.3 to 27) GHz Rate 50 Hz to 50 khz Depths: 5 % to 50 % 4.3 % + 1 digit HP 8902A w/ 11793A Rate 50 Hz to 50 khz Depths: 50 % to 90 % 2.3 % + 1 digit Frequency Modulation 3 Measure (0.25 to 10) MHz Rate 20 Hz to 10 khz 3.4 % + 1 digit HP 8902A (10 to 1300) MHz Rate 50 Hz to 100 khz 2.7 % + 1 digit Rate 20 Hz to 200 khz 6.3 % + 1 digit 10 MHz to 27 GHz Rate 50 Hz to 100 khz 2.7 % + 1 digit HP 8902A w/ 11793A Rate 20 Hz to 200 khz 6.3 % + 1 digit A2LA Cert. No. 1395.18) Revised 11/3/2016 Page 14 of 18

V. Mechanical Parameter/Equipment Range CMC 2, 8 ( ) Comments Scales & Balances 3 (1 to 15) g (>15 to 45) g (>45 to 100) g (>100 to <500) g 500 g (>500 to 1500) g (>1500 to 3000) g (>3000 to 4000) g (1.5M + 17) µg (0.2M + 28) µg (0.2M + 154) µg (0.9M + 260) µg 160 µg 1.3 mg 1.8 mg 2 mg OIML Class F1 and Class 1 weights; M = Total Mass Using substitution method to 16 kg, CMC is increased by a multiple for each substitution. All measurement uncertainties will also include resolution of the unit under test. 2 kg 5 and 7 kg (10 to 17) kg (>17 to 22) kg (>22 to 32) kg (>32 to 47) kg (> 47 to 87) kg 0.06 g 0.26 g 0.56 g 0.33 g 0.49 g 0.7 g 1.1 g OIML Class M2 weights using substitution method to 348 kg, CMC is increased by a multiple for each substitution. All measurement uncertainties will also include resolution of the unit under test. Pressure Measure (0 to 300) psig 0.059 % Druck DPI 605 Pressure Measuring Equipment (0 to 300) psig 0.059 % Druck DPI 605 Torque Wrenches (10 to 50) in lbf (50 to 500) in lbf (25-250) ft lbf 0.84 % 0.89 % 0.83 % Torque display with transducers Mass 20 kg 0.18 g Class F1 20 kg mass A2LA Cert. No. 1395.18) Revised 11/3/2016 Page 15 of 18

VI. Optical Quantities Parameter/Equipment Range CMC 2, 8 ( ) Comments Fiber Optic Wavelength Measuring Equipment (1510 to 1530) nm (1530 to 1560) nm (1560 to 1595) nm (1595 to 1630) nm 0.50 pm 0.41 pm 1.9 pm 1.9 pm Preselected wavelengths w/ NIST SRM 2517a NIST SRM 2519a NIST SRM 2514 NIST SRM 2515 Fiber Optic Wavelength Measure (700 to 1650) nm 0.006 nm Agilent 86120B Fiber Optic Power Measuring Equipment 1310 nm (1450 to 1590) nm 1550 nm (-40 to -1) dbm (-40 to +7) dbm (-40 to -1) dbm 2.6 % 2.6 % 4.1 % + 5 pw Laser power sources monitored by Agilent 8163A, 81618A, 81624A Fiber Optic Power Measure 1310 nm 1550 nm (-40 to +10) dbm (-40 to +10) dbm 2.6 % 2.6 % Agilent 8163A, 81618A and 81624A (1000 to 1630) nm (-40 to +10) dbm 4.1 % + 5 pw VII. Thermodynamics Parameter/Equipment Range CMC 2, 8 ( ) Comments Temperature Measure (-200 to 0) C 0.4 C Fluke 741B w/3-wire RTD (0 to 600) C (600 to 1250) C 0.6 C 0.75 % K thermocouple Humidity Measure (0 to 90) % RH (90 to 100) % RH 1.4 % RH 2.6 % RH Vaisala HM141 w/hmp46 A2LA Cert. No. 1395.18) Revised 11/3/2016 Page 16 of 18

VIII. Time & Frequency Parameter/Equipment Range CMC 2, 8 ( ) Comments Frequency Measuring Equipment (5, 10) MHz 100 µhz to 10 MHz 10 MHz to 50 GHz 0.042 µhz/hz 0.11 µhz/hz 0.042 µhz/hz Fluke 910 GPS Agilent 33120 A HP 83650B Frequency Measure 0.1 Hz to 26.5 GHz 0.012 µhz/hz Fluke 910 GPS Agilent 53151A Time Interval Measure 25 ps to 1 s 1.2 % Agilent 86100A w/ 86105A 1 This laboratory offers commercial calibration service and field calibration service. 2 Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement that a laboratory can achieve within its scope of accreditation when performing more or less routine calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory may be greater than the CMC due to the behavior of the customer s device and to influences from the circumstances of the specific calibration. 3 Field calibration service is available for this calibration and this laboratory meets A2LA R104 General Requirements: Accreditation of Field Testing and Field Calibration Laboratories for these calibrations. Please note the actual measurement uncertainties achievable on a customer's site can normally be expected to be larger than the CMC found on the A2LA Scope. Allowance must be made for aspects such as the environment at the place of calibration and for other possible adverse effects such as those caused by transportation of the calibration equipment. The usual allowance for the actual uncertainty introduced by the item being calibrated, (e.g. resolution) must also be considered and this, on its own, could result in the actual measurement uncertainty achievable on a customer s site being larger than the CMC. 4 Where ranges are not specified, the CMC stated is for the cardinal points only. 5 Based on using the standard at the temperature the Fluke 5520A with SC600 was calibrated (tcal ± 5 o C) and assuming the instrument is zeroed at least every seven days or when the ambient temperature changes more than 5 o C. For resistance, a zero calibration is performed at least every 12 hours within ± 1 o C of use. In the statement of CMC, the value is defined as the percentage of reading. A2LA Cert. No. 1395.18) Revised 11/3/2016 Page 17 of 18

6 Based on using the standard at the temperature the HP 3458A was calibrated (tcal ± 5 o C) and an autocalibration (ACAL) was performed within the previous 24 hours (± 1 o C of ambient temperature). In the statement of CMC, the value is defined as the percentage of reading. 7 In the statement of CMC, L is the numerical value of the nominal length of the device measured in inches; R is the numerical value of the resolution of the device in microinches. 8 In the statement of CMC, percentages are to be read as percent of reading, unless noted otherwise. A2LA Cert. No. 1395.18) Revised 11/3/2016 Page 18 of 18

Accredited Laboratory A2LA has accredited SIMCO SCIENTIFIC INSTRUMENT REPAIR AND CALIBRATION SERVICES CO., LTD. Guangzhou, PEOPLE S REPUBLIC OF CHINA for technical competence in the field of Calibration This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories. This laboratory also meets the requirements of ANSI/NCSLI Z540-1-1994 and any additional program requirements in the field of calibration. This accreditation demonstrates technical competence for a defined scope and the operation of a laboratory quality management system (refer to joint ISO-ILAC- IAF Communiqué dated 8 January 2009). Presented this 3 rd day of September 2015. President/CEO For the Accreditation Council Certificate Number 1395.18 Valid to September 30, 2017 Revised November 3, 2016 For the calibrations to which this accreditation applies, please refer to the laboratory s Calibration Scope of Accreditation.