How to do the Thermal Noise Lab. And also your DNA melting lab report

Similar documents
Prepare Sample 3.1. Place Sample in Stage. Replace Probe (optional) Align Laser 3.2. Probe Approach 3.3. Optimize Feedback 3.4. Scan Sample 3.

Standard Operating Procedure of Atomic Force Microscope (Anasys afm+)

Date: Current Balance. In this lab, you will examine the interaction of two current carrying wires.

OPTICS IN MOTION. Introduction: Competing Technologies: 1 of 6 3/18/2012 6:27 PM.

Atomic Force Microscopy (I)

NAME SECTION PERFORMANCE TASK # 3. Part I. Qualitative Relationships

Experiment 1: Fraunhofer Diffraction of Light by a Single Slit

Homework Set 3.5 Sensitive optoelectronic detectors: seeing single photons

Nanoscale Material Characterization with Differential Interferometric Atomic Force Microscopy

UNIVERSITY OF WATERLOO Physics 360/460 Experiment #2 ATOMIC FORCE MICROSCOPY

Outline: Introduction: What is SPM, history STM AFM Image treatment Advanced SPM techniques Applications in semiconductor research and industry

R. J. Jones College of Optical Sciences OPTI 511L Fall 2017

Nanonics Systems are the Only SPMs that Allow for On-line Integration with Standard MicroRaman Geometries

ECE 317 Laboratory #1 Force Sensitive Resistors

Intermediate and Advanced Labs PHY3802L/PHY4822L

Part 2: Second order systems: cantilever response

Graph Matching. walk back and forth in front of. Motion Detector

Basic methods in imaging of micro and nano structures with atomic force microscopy (AFM)

Criteria for Optical Systems: Optical Path Difference How do we determine the quality of a lens system? Several criteria used in optical design

Class #9: Experiment Diodes Part II: LEDs

Bruker Dimension Icon AFM Quick User s Guide

Operational Amplifiers

Electronic Instrumentation ENGR-4300 Fall 2004 Section Experiment 7 Introduction to the 555 Timer, LEDs and Photodiodes

CENG4480 Embedded System Development and Applications The Chinese University of Hong Kong Laboratory 1: Op Amp (I)

Module 9C: The Voltage Comparator (Application: PWM Control via a Reference Voltage)

SENSOR+TEST Conference SENSOR 2009 Proceedings II

University of MN, Minnesota Nano Center Standard Operating Procedure

ECEN 4606, UNDERGRADUATE OPTICS LAB

Bruker Dimension Icon AFM Quick User s Guide

INDIAN INSTITUTE OF TECHNOLOGY BOMBAY

o Semiconductor Diode Symbol: The cathode contains the N-type material and the anode contains the P-type material.

Measure the roll-off frequency of an acousto-optic modulator

Instructions for easyscan Atomic Force Microscope

Laboratory 8 Lock-in amplifier 1

Instructions for the Experiment

Ph 3455 The Photoelectric Effect

Atomic Force Microscopy (Bruker MultiMode Nanoscope IIIA)

CO2 laser heating system for thermal compensation of test masses in high power optical cavities. Submitted by: SHUBHAM KUMAR to Prof.

R. J. Jones Optical Sciences OPTI 511L Fall 2017

Figure for the aim4np Report

1.6 Beam Wander vs. Image Jitter

Effects of Incident Optical Power on the Effective Reverse Bias Voltage of Photodiodes This Lab Fact demonstrates how the effective reverse bias

Exploring TeachSpin s Two-Slit Interference, One Photon at a Time Workshop Manual

Experiment 1 Topic: Sensors/Measurement Systems/Calibration Week A Procedure

PSD Characteristics. Position Sensing Detectors

CHAPTER 5 FINE-TUNING OF AN ECDL WITH AN INTRACAVITY LIQUID CRYSTAL ELEMENT

Optical Pumping Control Unit

ECEN. Spectroscopy. Lab 8. copy. constituents HOMEWORK PR. Figure. 1. Layout of. of the

Polarization Experiments Using Jones Calculus

Supplementary Materials

DSC Lab 2: Force and Displacement Measurement Page 1

Description of options, upgrades and accessories for the laser beam stabilization system Compact

Experiment P58: Light Intensity in Double-Slit and Single-Slit Diffraction Patterns (Light Sensor, Rotary Motion Sensor)

ENGN/PHYS 207 Fall 2018 Assignment #5 Final Report Due Date: 5pm Wed Oct 31, 2018

Single Slit Diffraction

Physics 2020 Lab 9 Wave Interference

First and second order systems. Part 1: First order systems: RC low pass filter and Thermopile. Goals: Department of Physics

ATOMIC FORCE MICROSCOPY

Horiba LabRAM ARAMIS Raman Spectrometer Revision /28/2016 Page 1 of 11. Horiba Jobin-Yvon LabRAM Aramis - Raman Spectrometer

FIELD- EFFECT TRANSISTORS: MOSFETS

2018 Conference on Laboratory Instruction Beyond the First Year. Quick Summary

6 Experiment II: Law of Reflection

Uncovering a Hidden RCL Series Circuit

EXPRIMENT 3 COUPLING FIBERS TO SEMICONDUCTOR SOURCES

ELECTRICAL ENGINEERING TECHNOLOGY PROGRAM EET 433 CONTROL SYSTEMS ANALYSIS AND DESIGN LABORATORY EXPERIENCES

Cutting-edge Atomic Force Microscopy techniques for large and multiple samples

Experiment #12 X-Ray Diffraction Laboratory

Weld gap position detection based on eddy current methods with mismatch compensation

Angular Drift of CrystalTech (1064nm, 80MHz) AOMs due to Thermal Transients. Alex Piggott

Microscopic Structures

Experimental Analysis of Luminescence in Printed Materials

2 Thermistor + Op-Amp + Relay = Sensor + Actuator

AFM AC Tips and Tricks Oregon State University. AC mode - This Manual Does Not Replace the Manufactures Manual and/or Proper Training!

Modern Physics Laboratory MP4 Photoelectric Effect

Resistance and Resistivity

RENISHAW RAMAN MICROSCOPE STANDARD OPERATING PROCEDURE

LAB V. LIGHT EMITTING DIODES

I = I 0 cos 2 θ (1.1)

Surface Finish Measurement Methods and Instrumentation

Overview of experiments and projects

MEMS Optical Scanner "ECO SCAN" Application Notes. Ver.0

ANALOG TO DIGITAL CONVERTER ANALOG INPUT

Kit for building your own THz Time-Domain Spectrometer

Park NX-Hivac The world s most accurate and easy to use high vacuum AFM for failure analysis.

sin(wt) y(t) Exciter Vibrating armature ENME599 1

Texas Components - Data Sheet. The TX53G1 is an extremely rugged, low distortion, wide dynamic range sensor. suspending Fluid.

Lab Week 4. Analog Discovery introduction MATLAB Circuit building and Oscilloscope Measurements Ethics

Dimensions in inches (mm) .021 (0.527).035 (0.889) .016 (.406).020 (.508 ) .280 (7.112).330 (8.382) Figure 1. Typical application circuit.

25-Gbit/s, 850-nm VCSEL

The 34th International Physics Olympiad

Potentiometer Tutorial Cornerstone Electronics Technology and Robotics I Week 8

AY 105 Lab Experiment #1: Radiometry/Photometry

Putting it all Together

Nontraditional Machining Techniques

Point Calibration. July 3, 2012

ALMY Stability. Kevan S Hashemi and James R Bensinger Brandeis University January 1998

What are we looking at?

Standard Operating Procedure

Fig. 1 Tachometer Built from Old CD, DC Motor, and Photogate

Application Note 5525

Transcription:

How to do the Thermal Noise Lab And also your DNA melting lab report

Agenda for our Theory Free Day How to put away your DNA melting apparatus DNA melting lab report The teaching AFM Tips for the thermal noise lab

Logistics Four thermal noise lab stations will be available on Monday Six stations available for finalizing work on DNA melting Thermal noise stations will be added throughout the week as needed You need a new lab partner Email me by Monday if you do not have one DNA melting report is due 10/10 Hand in to me in lab by 7:00 PM Submit electronically (PDF or MS Word document) If you do not get a confirmation email within 1.5 hours, assume I have not received your report Late work not accepted without prior arrangement Come by the lab with data analysis questions Thermal noise lab ends 10/17 Report due 10/24

FINISHING UP DNA MELTING

How to Put Your DNA Melting Apparatus Away Everything taken apart, returned its correct location It may help to sing the One of These Things song while you work Do not put anything back broken Strip your electronic breadboard Return large caps, op amps Resistors, broken components in dead components box Susan, introducing One of These Things in the very first episode of Sesame Street. (Image reproduced from The Muppet Wiki) 20.309 version of One of These Things

It s Time to Play Our Game

How to Put a Lens Away Properly identify lens Lens measuring demo Clean, if necessary Wrap like a piece of candy In the right box If you didn t keep the original box, find one Wrap filters similarly and replace gently in storage bin Do not clean them If very dirty or damaged, return to an instructor

Report (and life) Ethics You may discuss the report with your partner and other students; however: The report you submit must be entirely your own work Give credit to your lab partner You may share data with other groups; however: You must clearly state the source of anything that was not a direct result of your own efforts in the lab You must produce one set of charts using only the data you gathered in the lab You may provide additional analysis based on other people s data You must submit your raw data and the scripts you used Email detailing format coming If you used any code that you did not write yourself, you must credit the author

I have no sense of humor about plagiarized work. Please be diligent with your citations.

DNA Melting Report Report should be around 5 and certainly < 10 pages, with charts, not including code listings Suggested format: bullet points Section 1A: Your results List of samples you ran Four exquisitely presented and labeled plots 20 match; single mismatch; and complete mismatch f vs. T with curve fits, melting points, and estimated thermodynamic parameters Derivative plots with curve fit and melting temperature by various methods Similar plot with length or strength investigation on single set of axes Derivative plot of strength/length Table with all estimated thermodynamic parameters T m (by various methods) S, H Presentation counts! All plots titled, axes labeled, legend, units specified, readable fonts, etc Bullet points explaining anything about your data that needs explaining Section 1B: Complete results Plots, tables including data you may have obtained from other people I can provide data for comparison/additional analysis

Example Data Plot

Example Derivative Plot

DNA Melting Report, Continued Section 2A: Document your instrument Gains/component values/cutoff frequencies, etc Optical layout (simple block diagram including component values) Did you do anything differently than the lab manual suggested? Section 2B: How did your design change? What problems did you have in the lab? How did you modify your original design to address the problems? Section 2C:Characterize your instrument Signal to noise (power ratio, db): compute the standard deviation of your signal and divide by the range. Take 20 log 10 of this value. Section 3: Analysis and discussion Outline data analysis algorithm. Include relevant parameters: filter kernel lengths, window shape, etc How do various methods of estimating T m compare? How do the thermodynamic properties compare with models? Discuss sources of systematic and random error Section 4: Raw data and code Each group should electronically submit.m files (or other language), raw data (.txt) files Do not submit any code or data that your group did not create You will receive an email this weekend detailing the format for your submission I will compile class-wide results from raw data

THERMAL NOISE LAB

Thermal Noise Lab Procedure Only experiment 3 in the lab manual is required If you are interested in imaging, you can give it a try You can also do a final project on the AFM 1. Calibration Determine the sensitivity of the detector (distance/volt) 2. Set system gain Remember to record your amplifier settings Very common mistake last year 3. Measure PSD of cantilever excited by thermal noise 4. Analysis Model cantilever as a mass/spring system Fit curve to determine resonant frequency, Q, and thermal noise limit Example PSD

Practical Introduction to the Teaching AFM Interdigitated probes Optical system Sample positioning system

Interdigitated Probes ID fingers act like a diffraction grating Deflection of tip changes intensity of diffraction spots Fingers travel through a distance of /4 from maximum to minimum intensity 3 sizes of imaging probes (shown above) Two probes on each device (L&M or M&S) Long: 400um long; grating starts 117um and ends 200um from the base Medium: 325um long; grating starts 77um and ends 160um from the base Short: 250um long; grating starts 43um and ends 125um from the base Noise probe (below) gives a cleaner curve Two probes on each device 350um long [NOTE: ID fingers have 4um spacing, not 2um as usual]; grating starts 140um and ends 250um from the base 275um long; grating starts 93um and ends 175um from the base Correction factor must be applied to account for placement of fingers versus tip Imaging Probe Thermal Noise Probe

Beamsplitter reflects 50% of the light at 90 degrees Beam to the right is stopped Lens focuses spot on cantilever and recolimates reflected light Fundamental diffraction spot falls on photodiode AFM Optical System

Sample Positioning System X-Y-Z stage for coarse movement Micrometer driven X-Y Motorized Z Motor is very slow. Move large distances (such as when loading samples) by hand Piezo movement for scanning

Piezo Scanning Stage Piezo material changes dimension in response to electric field Disc divided into quadrants Equal voltage on quadrants induces up/down (fundamental mode) movement Opposite voltages induces 2 nd mode motion Magnet/steel rod amplifies motion

Adjusting the Laser Adjust the laser to shine on the ID fingers Position photodiode Fundamental spot should pass through opening and fall on photodiode Aim at cantilever to find fundamental Shine here to find spot 0 Spot 2 Spot 0

Laser Kinematic Mount ThorLabs KC1 Kinematic mount 3 thumbscrews allow fine setting of laser beam direction Easiest to use X- and Y- directions and walk beam out to the ID fingers Adjustment Knob Spring

Calibration Output is nonlinear Sensitivity ( out/ in) is equal to the derivative of the response curve Greatest sensitivity is in the middle of the curve Sensitivity is zero at the peaks and valleys You will measure sensitivity by bringing a hard sample into contact with the probe and scanning it up and down with the piezo stage Z-mod scan software function Use relationship to laser wavelength ( /4 between zeroes) to determine absolute distance Apply probe geometry correction factor Tip: position the spot at one end or the other of the ID fingers I sin 2 2 z

Biasing Too Low Too High Highest Sensitivity Alignment of fingers varies due to residual stress in the silicon wafer Can use this effect to bias sensor at point of highest sensitivity for thermal noise measurement

Crank X-Y-Z stage way down (annoying) Use your fingers, not the motor Mount sample disk on top of the post Make sure magnet is at the center of the piezo stage Bring the sample close to the tip Run Z-mod scan in software Make sure switch on back is in Z-mod scan mode Gently bring the sample into contact Don t crash the sample disk look underneath You will see the diffraction spots change when the sample makes contact Try not to break a cantilever If you do, ask an instructor to change it If you are using thermal noise probe, align sample so it touches only one cantilever Record calibration curve Back sample away Turn up amplifier gain Record noise spectrum Procedure