Absolute Maximum Ratings Parameter Rating Unit Drain Voltage (V D ) 150 V Gate Voltage (V G ) -8 to +2 V Gate Current (I G ) 39 ma Operational Voltage

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60W GaN WIDEBAND POWER AMPLIFIER Package: Hermetic 2-Pin Flanged Ceramic Features Broadband Operation DC to 3.5GHz Advanced GaN HEMT Technology Advanced Heat-Sink Technology Small Signal Gain = db at 2GHz 48V Operation Typical Performance Output Power 75W at P3dB Drain Efficiency 68% at P3dB -40 C to 85 C Operation Applications Commercial Wireless Infrastructure Cellular and WiMAX Infrastructure Civilian and Military Radar General Purpose Broadband Amplifiers Public Mobile Radios Industrial, Scientific, and Medical RF IN VG Pin 1 ( CUT ) Product Description Ordering Information GND BASE Functional Block Diagram RF OUT VD Pin 2 The RF3932 is a 48V, 60W high power discrete amplifier designed for commercial wireless infrastructure, cellular and WiMAX infrastructure, industrial/scientific/medical, and general purpose broadband amplifier applications. Using an advanced high power density Gallium Nitride (GaN) semiconductor process, these high-performance amplifiers achieve high efficiency and flat gain over a broad frequency range in a single amplifier design. The RF3932 is an unmatched GaN transistor, packaged in a hermetic flanged ceramic package. This package provides excellent thermal stability through the use of advanced heat sink and power dissipation technologies. Ease of integration is accomplished by incorporating simple, optimized matching networks external to the package that provide wideband gain and power performance in a single amplifier. RF3932S2 RF3932SB RF3932SQ RF3932SR RF3932TR7 RF3932PCK-411 2-Piece sample bag 5-Piece bag 25-Piece bag 0 Pieces on 7 short reel 750 Pieces on 7 reel Fully assembled evaluation board optimized for 2.GHz; 48V Optimum Technology Matching Applied GaAs HBT GaAs MESFET InGaP HBT SiGe BiCMOS Si BiCMOS SiGe HBT GaAs phemt Si CMOS Si BJT GaN HEMT BiFET HBT LDMOS RF MICRO DEVICES, RFMD, Optimum Technology Matching, Enabling Wireless Connectivity, PowerStar, POLARIS TOTAL RADIO and UltimateBlue are trademarks of RFMD, LLC. BLUETOOTH is a trademark owned by Bluetooth SIG, Inc., U.S.A. and licensed for use by RFMD. All other trade names, trademarks and registered trademarks are the property of their respective owners., RF Micro Devices, Inc. 7628 support, Thorndike contact Road, RFMD Greensboro, at (+1) 336-678-5570 NC 27409-9421 or customerservice@rfmd.com. For sales or technical 1 of

Absolute Maximum Ratings Parameter Rating Unit Drain Voltage (V D ) 150 V Gate Voltage (V G ) -8 to +2 V Gate Current (I G ) 39 ma Operational Voltage 65 V Ruggedness (VSWR) :1 Storage Temperature Range -55 to +5 C Operating Temperature Range (T C ) -40 to +85 C Operating Junction Temperature (T J ) 0 C Human Body Model Class 1A MTTF (T J < 0 C, 95% Confidence Limits)* 3 x 6 Hours Thermal Resistances, R TH (junction to case) measured at T C = 85 C, DC bias only 2.6 C/W Caution! ESD sensitive device. Exceeding any one or a combination of the Absolute Maximum Rating conditions may cause permanent damage to the device. Extended application of Absolute Maximum Rating conditions to the device may reduce device reliability. Specified typical performance or functional operation of the device under Absolute Maximum Rating conditions is not implied. The information in this publication is believed to be accurate and reliable. However, no responsibility is assumed by RF Micro Devices, Inc. ("RFMD") for its use, nor for any infringement of patents, or other rights of third parties, resulting from its use. No license is granted by implication or otherwise under any patent or patent rights of RFMD. RFMD reserves the right to change component circuitry, recommended application circuitry and specifications at any time without prior notice. RFMD Green: RoHS compliant per EU Directive 02/95/EC, halogen free per IEC 649-2-21, < 00ppm each of antimony trioxide in polymeric materials and red phosphorus as a flame retardant, and <2% antimony in solder. *MTTF - median time to failure for wear-out failure mode (30% I DSS degradation) which is determined by the technology process reliability. Refer to product qualification report for FIT (random) failure rate. Operation of this device beyond any one of these limits may cause permanent damage. For reliable continuous operation, the device voltage and current must not exceed the maximum operating values specified in the table below. Bias Conditions should also satisfy the following expression: P DISS < (T J - T C ) / R TH J-C and T C = T CASE Parameter Specification Min. Typ. Max. Unit Recommended Operating Conditions Drain Voltage (V DSQ ) 28 48 V Gate Voltage (V GSQ ) -4.5-3.7-2.5 V Drain Bias Current 2 ma Frequency of Operation DC 3500 MHz Capacitance C RSS 5 pf V G = -8V, V D = OV C ISS 23 pf V G = -8V, V D = OV C OSS.5 pf V G = -8V, V D = OV DC Functional Test I G (off) - Gate Leakage 2 ma V G = -8V, V D = OV I D (off) - Drain Leakage 2.5 ma V G = -8V, V D = 48V V GS (th) - Threshold Voltage -4.2 V V D = 48V, I D = ma Condition V DS (on) - Drain Voltage at high current 0.25 V V G = OV, I D = 1.5A RF Functional Test [1], [2] V GSQ -3.4 V V D = 48V, I D = 2mA Gain 11 13 db CW, P OUT = 47.8dBm, f = 20MHz Drain Efficiency 55 60 % CW, P OUT = 47.8dBm, f = 20MHz Input Return Loss - db CW, P OUT = 47.8dBm, f = 20MHz 2 of 7628 Thorndike Road, Greensboro, NC 27409-9421 For sales or technical support, contact RFMD at (+1) 336-678-5570 or customerservice@rfmd.com.

Specification Parameter Unit Min. Typ. Max. RF Typical Performance [1], [2] Small Signal Gain 21 db CW, f = 900MHz Small Signal Gain db CW, f = 20MHz Output Power at PdB 48.80 dbm CW, f = 900MHz Output Power at P3dB 48.70 dbm CW, f = 20MHz Drain Efficiency at P3dB 68 % CW, f = 900MHz Drain Efficiency at P3dB 66 % CW, f = 20MHz [1] Test Conditions: CW Operation, V DSQ = 48V, I DQ = 2mA, T = 25ºC [2] Performance in a standard tuned test fixture. Condition 7628 support, Thorndike contact Road, RFMD Greensboro, at (+1) 336-678-5570 NC 27409-9421 or customerservice@rfmd.com. For sales or technical 3 of

) RF3932 Typical Performance in Standard 2.GHz Tuned Test Fixture (CW, T = 25 C, unless otherwise noted) Gain vs. Output Power (f = 20MHz) (Pulsed % duty cycle, us, Vd = 48V, Idq = 2mA) 70 Efficiency vs. Output Power (f = 20MHz) (Pulsed % duty cycle, us, Vd = 48V, Idq = 2mA) 15 13 11 Gain 85C Gain 25C Gain -25C Drain Efficiency (%) 60 50 40 30 Eff 85C Eff 25C Eff -25C 32 34 36 38 40 42 44 46 48 Output Power (dbm) 32 34 36 38 40 42 44 46 48 Output Power (dbm) IRL, Input Return Loss (db) Input Return Loss vs. Output Power (f = 20MHz) (Pulsed % duty cycle, us, Vd = 48V, Idq = 2mA) -6-8 - - - - -18 - -24-26 IRL 85C -22 IRL 25C IRL -25C -28-30 32 34 36 38 40 42 44 46 48 Frequency (MHz) Small Signal Performance vs. Frequency, Pout = 30dBm (Vd = 48V, Idq = 2mA) 17-13 Fixed tuned test circuit - 15-15 13 11 9 8 7 Gain IRL - -17-18 -19 - -21-22 -23 6-24 5-25 4-26 3-27 21 21 2130 20 2150 20 2170 Frequency (MHz) Input Return Loss (db) Gain/IRL vs. Frequency, Pout = 47.8dBm (CW, Vd = 48V, Idq = 2mA) 17-5 Fixed tuned test circuit -6 15-7 -8 13-9 11 9 8 - -11 - -13-7 -15 6-5 Gain IRL -17 4-18 21 21 2130 20 2150 20 2170 Frequency (MHz) Input Return Loss (db) Drain Efficiency (%) Drain Efficiency vs. Frequency, Pout = 47.8dBm (CW, Vd = 48V, Idq = 2mA) 66 Fixed tuned test circuit 64 62 60 Eff 58 56 21 21 2130 20 2150 20 2170 Frequency (MHz) 4 of 7628 Thorndike Road, Greensboro, NC 27409-9421 For sales or technical support, contact RFMD at (+1) 336-678-5570 or customerservice@rfmd.com.

Gain/ Efficiency vs. Pout, f = 20MHz (CW, Vd = 48V, Idq = 2mA) 80 Gain/ Efficiency vs. Pout, f = 20MHz (Pulsed % duty cycle, us, Vd = 48V, Idq = 2mA) 80 15 70 15 70 60 60 13 11 9 Gain Drain Eff 50 40 30 Drain Efficiency (%) 13 11 9 Gain Drain Eff 50 40 30 Drain Efficiency (%) 8 0 30 35 40 45 50 Pout, Output Power (dbm) 8 0 30 35 40 45 50 Pout, Output Power (dbm) -15 IMD3 vs. Pout (2-Tone 1MHz Sepera on, Vd = 48V, Idq varied, fc = 20MHz) 18 Gain vs. Pout (2-Tone 1MHz Sepera on, Vd = 48V, Idq varied, fc = 20MHz) IMD3, Intermodula on Distor on (dbc) - -25-30 -35 1mA 5mA 2mA 275mA 330mA 1mA 5mA 2mA 275mA 330mA -40 1 Pout, Output Power (W-PEP) 0 1 Pout, Output Power (W-PEP) 0 Intermodula on Distor on (IMD - dbc) - -15 - -25-30 -35-40 -45-50 IMD vs. Output Power (Vd = 48V, Idq = 2mA, f1 = 2139.5MHz, f2 = 20.5MHz) -IMD3 IMD3 -IMD5 IMD5 -IMD7 IMD7-55 1 0 Pout, Output Power (W- PEP) 7628 support, Thorndike contact Road, RFMD Greensboro, at (+1) 336-678-5570 NC 27409-9421 or customerservice@rfmd.com. For sales or technical 5 of

) RF3932 Typical Performance in Standard 900MHz Tuned Test Fixture (CW, T = 25 C, unless otherwise noted) Small Signal Performance vs. Frequency, Pout = 30dBm (Vd = 48V, Idq = 2mA) 23 22 Fixed tuned test circuit 21 19 18 17 15-7 -8-9 - Gain IRL -11-880 890 900 9 9 Frequency (MHz) -3-4 -5-6 Input Return Loss (db) Gain/IRL vs. Frequency, Pout = 47.8dBm (CW, Vd = 48V, Idq = 2mA) 22-21 -11 Fixed tuned test circuit - 19-13 18-17 15-15 - -17-18 13-19 - 11 Gain IRL -21-22 880 890 900 9 9 Frequency (MHz) Input Return Loss (db) Drain Efficiency (%) Drain Efficiency vs. Frequency, Pout = 47.8dBm (CW, Vd = 48V, Idq = 2mA) 73 71 Fixed tuned test circuit 69 67 65 63 61 59 57 Eff 55 880 890 900 9 9 Frequency (MHz) Gain/ Efficiency vs. Pout, f = 900MHz (CW, Vd = 48V, Idq = 2mA) 26 24 22 18 Gain Drain Eff 38 40 42 44 46 48 50 Pout, Output Power (dbm) 80 70 60 50 40 30 Drain Efficiency (%) 26 Gain/ Efficiency vs. Pout, f = 900MHz (Pulsed % duty cycle, us, Vd = 48V, Idq = 2mA) 80 - IMD3 vs. Pout (2-Tone 1MHz Sepera on, Vd = 48V, Idq varied, fc = 900MHz) 24 22 18 70 60 Gain 30 Drain Eff 38 40 42 44 46 48 50 Pout, Output Power (dbm) 50 40 Drain Efficiency (%) IMD3, Intermodula on Distor on (dbc) -15 - -25-30 -35-40 -45-50 1 1mA 5mA 2mA 275mA 330mA Pout, Output Power (W-PEP) 0 6 of 7628 Thorndike Road, Greensboro, NC 27409-9421 For sales or technical support, contact RFMD at (+1) 336-678-5570 or customerservice@rfmd.com.

24 23 22 21 19 18 17 1 Gain vs. Pout (2-Tone 1MHz Separa on, Vd = 48V, Idq varied, fc = 900MHz) 1mA 5mA 2mA 275mA 330mA 0 Pout, Output Power (W-PEP) Intermodula on Distor on (IMD - dbc) - -15 - -25-30 -35-40 -45-50 -55 1 IMD vs. Output Power (Vd = 48V, Idq = 2mA, f1 = 899.5MHz, f2 = 900.5MHz) -IMD3 IMD3 -IMD5 IMD5 -IMD7 IMD7 0 Pout, Output Power (W- PEP) 7628 support, Thorndike contact Road, RFMD Greensboro, at (+1) 336-678-5570 NC 27409-9421 or customerservice@rfmd.com. For sales or technical 7 of

Package Drawing (Package Style: Flanged Ceramic) 2 3 1 All dimensions in mm. Pin Function Description 1 Gate Gate - VG input 2 Drain Drain - VD RF Output 3 Source Source - Ground Base 8 of 7628 Thorndike Road, Greensboro, NC 27409-9421 For sales or technical support, contact RFMD at (+1) 336-678-5570 or customerservice@rfmd.com.

Bias Instruction for RF3932 Evaluation Board ESD Sensitive Material. Please use proper ESD precautions when handling devices of evaluation board. Evaluation board requires additional external fan cooling. Connect all supplies before powering evaluation board. 1. Connect RF cables at RF IN and RF OUT. 2. Connect ground to the ground supply terminal, and ensure that both the VG and VD grounds are also connected to this ground terminal. 3. Apply -8V to V G. 4. Apply 48V to V D. 5. Increase V G until drain current reaches 2mA or desired bias point. 6. Turn on the RF input. 7628 support, Thorndike contact Road, RFMD Greensboro, at (+1) 336-678-5570 NC 27409-9421 or customerservice@rfmd.com. For sales or technical 9 of

2.GHz Evaluation Board Schematic 2.GHz Evaluation Board Bill of Materials Component Value Manufacturer Part Number C1 pf ATC ATC800A0JT C2, C, C11, C15 33pF ATC ATC800A330JT C3,C 0.1 F Murata GRM32NR72A4KA01L C4,C13 4.7 F Murata GRM55ER72A475KA01L C5 0 F Panasonic ECE-V1HA1UP C6 2.2pF ATC ATC800A2R2BT C7, C8 0.8pF ATC ATC800A0R8BT C9 3.0pF ATC ATC800A3R0BT C 0 F Panasonic EEV-TG2A1M R1 Panasonic ERJ-8GEYJ0V C, C17, C18, C19 Not used - - PCB RO4350, 0.030" thick dielectric Rogers - of 7628 Thorndike Road, Greensboro, NC 27409-9421 For sales or technical support, contact RFMD at (+1) 336-678-5570 or customerservice@rfmd.com.

2.GHz Evaluation Board Layout Device Impedances Frequency (MHz) Z Source ( ) Z Load ( 21 2.56 - j4.27 4.76 + j0.7 20 2.45 - j3.94 4.77 + j1.3 2170 2.36 - j3.6 4.80 + j1.9 Note: Device impedances reported are the measured evaluation board impedances chosen for a trade-off of efficiency, peak power, and linearity performance across the entire frequency bandwidth. 7628 support, Thorndike contact Road, RFMD Greensboro, at (+1) 336-678-5570 NC 27409-9421 or customerservice@rfmd.com. For sales or technical 11 of

900MHz Evaluation Board Schematic 900MHz Evaluation Board Bill of Materials Component Value Manufacturer Part Number C1, C2, C, C11 68pF ATC ATC0B680JT C3,C 0.1 F Murata GRM32NR72A4KA01L C4,C13 4.7 F Murata GRM55ER72A475KA01L C6 18pF ATC ATC800A180JT C7 15pF ATC ATC800A150JT C8 6.8pF ATC ATC0B6R8CT C9 2.0pF ATC ATC0B2R0CT C 330 F Panasonic EEU-FC2A331 C5 0 F Panasonic ECE-V1HA1UP R1 Panasonic ERJ-8GEYJ0V of 7628 Thorndike Road, Greensboro, NC 27409-9421 For sales or technical support, contact RFMD at (+1) 336-678-5570 or customerservice@rfmd.com.

900MHz Evaluation Board Layout Device Impedances Frequency (MHz) Z Source ( ) Z Load ( 880 1. + j1.1.68 + j6.5 900 1.30 + j1.5 13.30 + j7.2 9 1.60 + j1.6.00 + j7.9 Note: Device impedances reported are the measured evaluation board impedances chosen for a trade-off of efficiency, peak power, and linearity performance across the entire frequency bandwidth. 7628 support, Thorndike contact Road, RFMD Greensboro, at (+1) 336-678-5570 NC 27409-9421 or customerservice@rfmd.com. For sales or technical 13 of

Device Handling/Environmental Conditions GaN HEMT devices are ESD sensitive materials. Please use proper ESD precautions when handling devices or evaluation boards. GaN HEMT Capacitances The physical structure of the GaN HEMT results in three terminal capacitors similar to other FET technologies. These capacitances exist across all three terminals of the device. The physical manufactured characteristics of the device determine the value of the C DS (drain to source), C GS (gate to source) and C GD (gate to drain). These capacitances change value as the terminal voltages are varied. RFMD presents the three terminal capacitances measured with the gate pinched off (V GS = -8V) and zero volts applied to the drain. During the measurement process, the parasitic capacitances of the package that holds the amplifier is removed through a calibration step. Any internal matching is included in the terminal capacitance measurements. The capacitance values presented in the typical characteristics table of the device represent the measured input (C ISS ), output (C OSS ), and reverse (C RSS ) capacitance at the stated bias voltages. The relationship to three terminal capacitances is as follows: C ISS = C GD + C GS C OSS = C GD + C DS C RSS = C GD DC Bias The GaN HEMT device is a depletion mode high electron mobility transistor (HEMT). At zero volts V GS the drain of the device is saturated and uncontrolled drain current will destroy the transistor. The gate voltage must be taken to a potential lower than the source voltage to pinch off the device prior to applying the drain voltage, taking care not to exceed the gate voltage maximum limits. RFMD recommends applying V GS = -5V before applying any V DS. RF Power transistor performance capabilities are determined by the applied quiescent drain current. This drain current can be adjusted to trade off power, linearity, and efficiency characteristics of the device. The recommended quiescent drain current (I DQ ) shown in the RF typical performance table is chosen to best represent the operational characteristics for this device, considering manufacturing variations and expected performance. The user may choose alternate conditions for biasing this device based on performance trade off. Mounting and Thermal Considerations The thermal resistance provided as R TH (junction to case) represents only the packaged device thermal characteristics. This is measured using IR microscopy capturing the device under test temperature at the hottest spot of the die. At the same time, the package temperature is measured using a thermocouple touching the backside of the die embedded in the device heatsink but sized to prevent the measurement system from impacting the results. Knowing the dissipated power at the time of the measurement, the thermal resistance is calculated. In order to achieve the advertised MTTF, proper heat removal must be considered to maintain the junction at or below the maximum of 0 C. Proper thermal design includes consideration of ambient temperature and the thermal resistance from ambient to the back of the package including heatsinking systems and air flow mechanisms. Incorporating the dissipated DC power, it is possible to calculate the junction temperature of the device. of 7628 Thorndike Road, Greensboro, NC 27409-9421 For sales or technical support, contact RFMD at (+1) 336-678-5570 or customerservice@rfmd.com.