ECE 521. Design Flow. Fall 2016 Simulation. Design Verification. Why Solve Equations on a Computer?

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Design Flow Comparison with specs Redesign Concept Implementation Design Specifications Circuit Schematic ECE 521 Layout SPICE etc. Physical definition Fall 2016 Physical verification Parasitic Extraction Layout vs Schematic (LVS) Layout Parasitic Extraction (LPE) Fabrication Testing PRODUCT Design Verification Why Solve Equations on a Computer? Prototyping or bread boarding Implement and see if design works Tweak component values for proper operation Start from mathematical descriptions of components (Models) Formulate equations based on physical laws (KCL, KVL) Specify input test patterns and find output Equations solved by use of a computer Problem has no closed-form solution Have to use numerical techniques Problems typically very large so cannot be solved by hand In IC world simulation is a necessity Cannot bread board ICs Fabrication for design iterations is an expensive alternative First step to ensuring first-pass silicon Can do early design even before complete process exists

Role of Modeling in Design The Modeling Hierarchy Realization Design Modeling Speed Accuracy Physical Behavior Models High-level Lumpedelement Compact Numerical Verification Simulated Behavior VHDL-AMS Verilog-A RLC BSIM3 EKV PISCES Medici A Case Study - BSIM3 MOSFET Model Levels Functional Behavioral/Algorithm SIMULA, SIMULINK BSIM3v1 BSIM3v2 BSIM3v3.1 BSIM3v3.2 BSIM4 Timing verification Register level RTL Logic verification Logic gate level TEGAS, LOGISIM 92 94 96 98 00 Transistor level Timing CRYSTAL, ELSim BSIM3v3.0 Circuit level SPICE, ASTAP, Compact model development, implementation and validation takes several years Technology CAD (TCAD) Device level Process SEDAN, PISCES SUPREM, SAMPLE

Digital vs Analog CAD The Design Productivity Gap Potential Design Complexity and Designer Productivity Logic Tr./Chip Tr./S.M. Equivalent Added Complexity 58 %/Yr compounded Complexity growth rate $10 $3 $1 21 %/Yr compound Productivity growth rate 3 Yr. Design Year Technology Chip Complexity Frequency Staff Staff Cost* 1997 250 nm 13 M Tr. 400 MHz 210 90 M 1998 250 nm 20 M Tr. 500 270 120 M 1999 180 nm 32 M Tr. 600 360 160 M 2002 130 nm 130 M Tr. 800 800 360 M * @ $ 150 k / Staff Yr. (In 1997 Dollars) Source: SEMATECH Hardware and Software Design Gaps versus Time (2011 ITRS Roadmap) http://www.semiconductors.org/clientuploads/research_technolo gy/itrs/2011/2011design.pdf Why Analog Circuit? Difficult and challenging Analog behavior specified in terms of complex functions Time-domain waveforms (settling time, slew) Frequency response (mag, phase, spectra) Distortion (HD, IMD) Noise Device matching Require very accurate component

Challenges in Analog Circuit & Modeling are Design Bottlenecks Accurate Low frequency, high frequency Noise Distortion Statistical variations Faster simulation techniques Power supplies modulators RF oscillators, mixers, phase noise, mixing Phase-locked loops Accurate distortion calculation & Modeling IC Design ICs Commercial Products Reduced simulation times Accurate Modeling of high frequency effects of RF ICs ITRS Modeling and Challenges http://www.semiconductors.org/clientuploads/research_technology/itrs/2013/2013 Modeling_Summary.pdf Nanoscale device modeling for novel devices General, accurate, computationally efficient and robust quantum based simulators incl. fundamental parameters linked to electronic band structure and phonon spectra Coupling traditional electronic for memories with new state variables (e.g. spin, polarization, local material composition, phase state, mass density/mechanical stress, bonding arrangement, ) Models for gate stacks with ultra-thin/high-k dielectrics for relevant channel materials (e.g. Ge, SiGe, InGaAs,...) w.r.t. electrical permittivity, built-in charges, influence on workfunction by interface interaction with metals, reliability, tunneling currents and carrier transport Input What is This Course About? R1 1 0 1K C1 1 0 1pF M1 1 2 0 0 MOD1 W=1U L=1U Advanced numerical device simulation and their efficient usage for predicting and reproducing statistical fluctuations of structure, dopant and material variations in order to assess the impact of variations on statistics of device performance, including non-gaussian distributions Hierarchical simulation Supporting heterogeneous integration (SoC+SiP) by enhancing CAD-tools to simulate mutual interactions of building blocks, interconnect, dies on wafer level and in 3D and package: - possibly consisting of different technologies, - covering and combining different modelling and simulation levels as well as different simulation domains '- including manufacturability Engine and Models Numerical Solution Input processor Output processor Theoretical foundation, modeling, software Multiphysics simulation Thermal modeling for 3D ICs and assessment of modeling and CAD tools capable of supporting 3D designs. Thermo-mechanical modeling of Through Silicon Vias and thin stacked dies (incl. adhesive/interposers), and their impact on active device properties (stress, expansion, keepout regions, ). Size effects (microstructure, surfaces,...) and variability of thinned wafers Combined EM and drift diffusion simulation to include inductance effects in substrate caused by interconnects and bond wires Output Time Freq

The Anatomy of a Circuit Simulator (From Dr. Res Saleh) Who Can Benefit from This Course Circuit designers Be an informed consumer of simulation tools Simulator knowledge helps identify problems Model developers Models implemented in simulators Tight coupling between & algorithms Computer-aided design (CAD) tool developer Simulators are the most important IC-CAD tool Basic Skills Required Brief Overview of SPICE Model development Circuit Theory Circuit Simulator Numerical Methods Algorithms, Complexity analysis Software, data structures 1969-70 CANCER project (Computer Analysis of Nonlinear Circuits Excluding Radiation) Ron Rohrer s class project 1970-72 CANCER program (Rohrer and Nagel) 1972 SPICE1 released as public-domain tool (Nagel and Pederson) 1975 SPICE 2A, 2C 1976 SPICE 2D New MOS 1979 SPICE 2E Device levels 1980 SPICE 2F Portable SPICE, MOSFET charge 1982 SPICE 2G 1985 SPICE 3C (Quarles, Newton, and Pederson) 1993 SPICE 3F 1999 NGSPICE (SPICE 3F + enhancements) 2014 NGSPICE (Release 26) CUSPICE - NGSPICE on CUDA platforms

SPICE The Present IEEE Milestone Plaque (From Dr. Larry Nagel) The alphabet SPICE(s) HSPICE, GSPICE, QSPICE, PSPICE, Internal SPICE TI-SPICE (TINA), TekSPICE, ADICE, LTSPICE, Others Qucs, Gnucap, ifreeda, DoCircuits, EveryCircuit, CircuitLab, Circuit-cloud, Open source parallel SPICE XYCE (https://xyce.sandia.gov/) Commercial Spectre, Eldo, AFS, ADS, SmartSpice, Recognized as an IEEE milestone (significant technical achievement) in 2011 Reasons for Success Proper choice of algorithms and software system Friendly (intuitive) input description language Public domain software Developed by circuit designers Useful tool for teaching and understanding circuits SPICE The Future New functionality Algorithms Device Chip, package, electrothermal simulation Coupled simulation domains Analog behavioral modeling languages Robust simulation of extremely large circuits Full-chip circuit simulation Faster simulation Fast SPICE(s) Hardware accelerated simulation GPU Multi-core

Course Outline (DC Analysis) Solution of linear resistive circuits R, independent (dc) current/voltage sources Linear dependent (controlled) sources Equation formulation methods Equation solution methods Software implementation Solution of nonlinear resistive circuits Diodes, Transistors, all linear components Equation formulation methods Equation solution methods Software implementation Course Outline (Transient Analysis) Solution of linear dynamic circuits R, independent (dc, time-varying) current/voltage sources Linear dependent (controlled) sources C, L Diodes, Transistors Equation formulation methods Equation solution methods Software implementation Solution of nonlinear dynamic circuits Nonlinear capacitors Course Outline (Other Analyses) Other Information and Assignments Small-signal AC analysis Pole-zero analysis Sensitivity analysis Fourier analysis Small-signal noise analysis Analysis methods for RF circuits Class webpage: http://web.engr.oregonstate.edu/~karti/ece521.html Lecture notes posted on class webpage Anonymous feedback available on webpage Read background papers posted on webpage Familiarize/review C programming language HW#1 posted (Due Oct 12) More on it next week C-code templates provided