Swept-wavelength Amplitude and Group Delay Measurement Setup

Similar documents
FAST AMPLITUDE AND DELAY MEASUREMENT FOR CHARACTERIZATION OF OPTICAL DEVICES. A Thesis MICHAEL THOMAS THOMPSON

Swept Wavelength Testing:

Agilent 86030A 50 GHz Lightwave Component Analyzer Product Overview

First Time User Manual

a 1550nm telemeter for outdoor application based on off-the-shelf components

PowerPXIe Series. Analog Power Meter ADVANCE SPEC SHEET

CHAPTER 5 FINE-TUNING OF AN ECDL WITH AN INTRACAVITY LIQUID CRYSTAL ELEMENT

Technical Brief #5. Power Monitors

Narrowband PMD Measurements with the Agilent 8509C Product Note

Agilent 71400C Lightwave Signal Analyzer Product Overview. Calibrated measurements of high-speed modulation, RIN, and laser linewidth

Agilent Technologies PSA Series Spectrum Analyzers Test and Adjustment Software

CHAPTER 4 RESULTS. 4.1 Introduction

FFP-C Fiber Fabry-Perot Controller OPERATING INSTRUCTIONS. Version 1.0 MICRON OPTICS, INC.

Agilent 8703B Lightwave Component Analyzer Technical Specifications. 50 MHz to GHz modulation bandwidth

Platform Migration 8510 to PNA. Graham Payne Application Engineer Agilent Technologies

Keysight Technologies Using a Wide-band Tunable Laser for Optical Filter Measurements

SHF Communication Technologies AG

An Example Design using the Analog Photonics Component Library. 3/21/2017 Benjamin Moss

Advanced Test Equipment Rentals ATEC (2832) EDFA Testing with the Interpolation Technique Product Note

PRELIMINARY. This application note documents performance of the CSA with the TLS-650 (New Focus 6528) tunable laser.

The Theta Laser A Low Noise Chirped Pulse Laser. Dimitrios Mandridis

Multiply Resonant EOM for the LIGO 40-meter Interferometer

Contents. CALIBRATION PROCEDURE NI PXIe-5668R 14 GHz and 26.5 GHz Signal Analyzer

3 General Principles of Operation of the S7500 Laser

Study of Analog Phase-Locked Loop (APLL)

SUPPLEMENTARY INFORMATION DOI: /NPHOTON

ModBox-CBand-DPSK series C-Band, 12 Gb/s Reference Transmitters

Agilent 8360B Series Synthesized Swept Signal Generators 8360L Series Synthesized Swept CW Generators Data Sheet

Agilent 81600B All-band Tunable Laser Source Technical Specifications December 2002

Testing with Femtosecond Pulses

Agilent Pulsed Measurements Using Narrowband Detection and a Standard PNA Series Network Analyzer

Measuring Photonic, Optoelectronic and Electro optic S parameters using an advanced photonic module

IMD Measurement Wizard for the E5072A ENA Series Network Analyzer Operation Manual. Agilent Technologies June 2012

Agilent 81980/ 81940A, Agilent 81989/ 81949A, Agilent 81944A Compact Tunable Laser Sources

IV Assembly and Automation of the SPR Spectrometer

Suppression of Stimulated Brillouin Scattering

FREQUENCY SYNTHESIZERS, SIGNAL GENERATORS

some aspects of Optical Coherence Tomography

GFT Channel Digital Delay Generator

Operation Guide: Using the 86100C DCA-J Jitter Spectrum and Phase Noise Application Revision 1.0

PXIe Contents. Required Software CALIBRATION PROCEDURE

SCTE. San Diego Chapter March 19, 2014

Study of multi physical parameter monitoring device based on FBG sensors demodulation system

Project: IEEE P Working Group for Wireless Personal Area Networks N

ModBox 1550 nm 44 Gb/s NRZ C, L bands ; 100 Mb/s - 44 Gb/s Reference Transmitter

Agilent 8703A Lightwave Component Analyzer Technical Specifications

Agilent 86146B Optical Spectrum Analyzer Technical Specifications

레이저의주파수안정화방법및그응용 박상언 ( 한국표준과학연구원, 길이시간센터 )

Model 855 RF / Microwave Signal Generator

PCS-150 / PCI-200 High Speed Boxcar Modules

EDFA Applications in Test & Measurement

W-band vector network analyzer based on an audio lock-in amplifier * Abstract

ModBox - Spectral Broadening Unit

This section lists the specications for the Agilent 8360 B-Series. generators, Agilent Technologies has made changes to this product

Advanced Test Equipment Rentals ATEC (2832)

Self-optimizing additive pulse mode-locked fiber laser: wavelength tuning and selective operation in continuous-wave or mode-locked regime

ModBox Pulse Generation Unit

Agilent 8614xB Optical Spectrum Analyzer Family Technical Specifications

Suppression of Rayleigh-scattering-induced noise in OEOs

ModBox 1550 nm 12 Gb/s DPSK C, L bands ; 12 Gb/s Reference Transmitter & Receiver

Supplementary Figures

1.5µm PbSe Power Detector

P a g e 1 ST985. TDR Cable Analyzer Instruction Manual. Analog Arts Inc.

Key Features for OptiSystem 12

Dispersion measurement in optical fibres over the entire spectral range from 1.1 mm to 1.7 mm

Agilent 8360B Series Synthesized Swept Signal Generators 8360L Series Synthesized Swept CW Generators

External Source Control

Fiber Pigtailed Variable Frequency Shifters Acousto-optic products

OPERATING MANUAL CAVITY DUMPER / PULSE PICKER DRIVER MODEL NUMBER: 643ZZ.ZZZ-SYN-Y-X

2520 Pulsed Laser Diode Test System

PHOTLINE. Technologies. LiNbO3 Modulators MMIC Amplifiers Instrumentations. Hervé Gouraud November 2009

Directly Chirped Laser Source for Chirped Pulse Amplification

Ultra high resolutions : 140 MHz/1.12 pm ; 20 MHz/0.16 pm ; 5 MHz/0.04 pm... Features:

QuickSyn Frequency Synthesizers

DISPERSION MEASUREMENT FOR ON-CHIP MICRORESONATOR. A Thesis. Submitted to the Faculty. Purdue University. Steven Chen. In Partial Fulfillment of the

Laser Diode Characterization and Its Challenges

Measurements of lightwave component reflections with the Agilent 8504B precision reflectometer Product Note

1550 nm Programmable Picosecond Laser, PM

Advanced Test Equipment Rentals ATEC (2832)

Extending the Offset Frequency Range of the D2-135 Offset Phase Lock Servo by Indirect Locking

DC to 3.5-GHz Amplified Photoreceivers Models 1591 & 1592

ModBox 850 nm 28 Gb/s NRZ 800 band ; 100 Mb/s - 28 Gb/s Reference Transmitter

Agilent 8614xB Optical Spectrum Analyzer Family Technical Specifications

Key Reference. Agilent Technologies E8257D/67D PSG Signal Generators. Manufacturing Part Number: E Printed in USA July 2007

ModBox 1550 nm 12 Gb/s DPSK

Photomixing THz Spectrometer Review

FFP-TF2 Fiber Fabry-Perot Tunable Filter Technical Reference

Keysight Technologies IL and PDL spectra with the N7786B Polarization Synthesizer and the N7700A Photonic Application Suite.

INGAAS FAST PIN (RF) AMPLIFIED PHOTODETECTORS

Specification for Radiated susceptibility Test

E/O and O/E Measurements with the 37300C Series VNA

Chapter 3 Experimental study and optimization of OPLLs

Novel OBI noise reduction technique by using similar-obi estimation in optical multiple access uplink

Measure the roll-off frequency of an acousto-optic modulator

Optical Modulation and Frequency of Operation

Great Britain: LASER COMPONENTS (UK) Ltd., Phone: , Fax: , France: LASER COMPONENTS

Model 7000 Series Phase Noise Test System

IVCAD VNA Base Load Pull with Active/Hybrid Tuning. Getting Started v3.5

Setup of the four-wavelength Doppler lidar system with feedback controlled pulse shaping

Agilent 86142B and 86146B Optical Spectrum Analyzers

Transcription:

Swept-wavelength Amplitude and Group Delay Measurement Setup DRAFT! (Modified: June 12, 2007) Background: The group delay of an optical device under test (DUT) is measured by modulating an optical signal with an tone, e.g. at 2 GHz, transmitting it through the device, and detecting the tone with a high-speed photodetector. The detected signal is then compared to a reference path to determine the relative phase shift, given as follows: DUT ref Where 2 f, DUT is the group delay of the optical path at wavelength, and is ref a fixed (but not necessarily known) delay of the reference path. Since we don t know the reference path length precisely, we actually measure changes in the optical path group delay as we change the optical wavelength (or frequency). An Analog Devices board (AD8302) takes the output of the photodetector and a reference signal as inputs and computes the relative amplitude and phase, providing these signals as voltage outputs which are subsequently digitized. The optical frequency and wavelength are related through the speed of light in vacuum c as follows: f c / where the wavelength in vacuum is given. In an optical opt opt fiber, the wavelength and speed are reduced by the refractive index of the silica glass fiber (n~1.5), but the frequency remains unchanged. Test Setup: The test setup consists of two major paths, an path and an optical path, which is shown in blue in Fig. 1. A tunable laser (Agilent 81680A) is used so that the group delay can be measured at many wavelengths. Mike s Box Mike s Box Fig. 1. Test setup for optical group delay and amplitude measurement.

The generator (Wiltron 6637A-40) and laser are computer controlled using a National Instruments PCI-6110 (or similar) DAQ board and BNC2110 breakout box. The laser also receives GPIB commands. A trigger signal is received from the laser using the PFIO when a wavelength scan starts. From the DAQ board, analog output AO0 goes to the Wiltron FM phase lock input. The analog inputs to the DAQ board are: AI0=Vphase from AD8302, AI1=Vamp from AD8302, AI2=Wiltron FM phase lock signal (Note: in future, may be detector from interferometer output), AI3=detector from gas reference. The FM output is nominally 10kHz, output sample rate 4e6 S/s, and input sampling rate 5e6 S/s (maximum setting). The voltage outputs of the AD8302 are related to the relative amplitude of the two inputs and phase as follows: The voltage outputs of the AD8302 (see the datasheet for more details) are shown in Fig. 2. The maximum voltage range for the outputs is 0 to 1.8V. The measured relative delay is proportional to the relative phase. The delay, relative to the reference path, is given by ( rad) ns. A 2 phase change (of the detected signal) implies a change in 2 f GHz delay of one period. For a 2GHz modulation frequency, one period is 500ps. Note that the Vphase output is V-shaped, so we don t know the exact phase unless we could limit the range to 0-180 degrees (or 180-360 degrees). To overcome this ambiguity problem, we sweep the frequency over at least one cycle of the phase response as indicated in Fig. 3. Ideally, the optical wavelength should not change during this frequency sweep. The output for one cycle is then input to the Goertzel algorithm which calculates the amplitude and phase for the fundamental frequency. We then use this information to calculate the output amplitude and delay (in ps). Fig. 2. Response of the AD8302 amplitude and phase outputs from the data sheet.

Notes: Fig. 3. Vphase outputs from AD8302 for two different group delays as the source is frequency modulated. 1. NI DAQ board in Dell Dimension 4550 is working on analog inputs and outputs; however, the DAQ board in Dell Precision 380 analog outputs are not working! 2. The DC bias to the modulator is not shown explicity in Fig. 1, nor is the possibility of adding another coupler and interferometer to track the linearity of the wavelength sweep. 3. A polarization controller (e.g. fiber paddles) is often needed directly in front of the DUT. 4. Data must be acquired at two modulation frequencies if 3 rd -order dispersion is significant. Setup and Test Procedure: The major steps in the test algorithm are shown in Fig. 5. A picture of the optical table and equipment is shown in Fig. 6. Latest software version: Fast_phase_Goertzel_Mathscript_newref.vi (updated ~ May 07) The detailed procedure, including setup is described in the following steps: 1. Setup the optical modulator: The modulator has a DC bias that must be set to the 3dB point (half-maximum) value. The modulator is very polarization dependent, so one of the principal states of the modulator is first found by varying the DC bias to find a minimum transmission point, then varying the input polarization (using fiber paddles) to make the minimum as low as possible (preferably, 30dB below the maximum transmission or more). Then, the DC bias is changed to find the maximum transmission, then moved to the half-transmission (or 3dB) value. Typically, the bias is around +5.7V (channel 7 of power supply) for the current modulator in Mike s box. The VOA should be grounded with -22V on equalizer.

2. The Agilent tunable laser is set to +0dBm (may need to increase power to +5.5dBm), Peak transmission is about -10dBm. The Picometrix photodetector should have the appropriate voltage applied to it with a bias T on the output (otherwise it has a 3V offset on the output). Check the trigger signal (PFIO). 3. The Wiltron generator may be set at +16dBm with a 90/10 splitter on the output. The 90% output goes to the optical modulator (e.g. Mike s box ) and the 10% goes through ~23dB of attenuation to the reference input on the AD8302. The attenuators are to match the amplitude of the reference and photodetected signals as close as possible (AD8302 Vamp~0.9V), which increases the dynamic range of the amplitude measurement. Keep the difference in endpoints of the period to within 0.015V for best accuracy of Goertzel algorithm. Check that the AO0 goes to the FM phase lock on the backplate. On the frontside, enable the FM and phaselock button. Set the frequency to 2GHz, CWF1, AM enable? 4. The AD8302 should have a 5V power input. Check the outputs: AI0=Vphase, AI1=Vamp. 5. Check connection of gas cell reference and interferometer photodetector outputs to analog inputs. 6. Run a wavelength sweep and verify that one FM cycle is being captured (use % to shave off to adjust), Want in the range of 0.2-0.3 or chage amp voltage (~3V) to FM out. 7. Measure gas cell as reference device and compare to previous measurements to verify proper test set operation.

Fig. 4. Front panel of Labview software.

Fig. 5. Major steps in the measurement procedure using frequency modulation. For additional information see: Picture placeholder Fig. 6. Optical table setup. M.T. Thompson, Fast amplitude and delay measurement for characterization of optical devices, Masters Thesis, August 2006, Texas A&M University, Department of Electrical and Computer Engineering.

Fig. 7. More detailed system diagram. Fig. 8. Graph from program showing an frequency sweep and the detected Vphase with one period demarcated by the red area. Appendix: Mathscript samplespercycle=round(samplespercycle); xaxis=0:(speed*fmdt):(stopwl-startwl); xaxis = xaxis + startwl; deltaw=(stopwl-startwl)/outputcycles; stepsize=deltaw;

%---------------------selecting what part of cycles to pull out (5% to 95% of cycle) periodstart=percentage*samplespercycle; periodend=samplespercycle-(percentage*samplespercycle)-1; periodstart=round(periodstart); periodend=round(periodend); samples=periodend-periodstart+1; %---------------------- %----------------------Make reference signal of pulling data out for plotting triggerend=outputcycles trigger=0; for n=1:triggerend; trigger(1,(((n-1)*samplespercycle)+(periodstart)):(((n-1)*samplespercycle)+(periodend)))=1.6; end %---------------------Pulling out cycles for n=1:outputcycles; goertzeldata(n,1:((1-2*percentage)*samplespercycle))=fmphase(1,(((n- 1)*samplespercycle)+(periodstart)):(((n-1)*samplespercycle)+(periodend))); end; %---------------------- %----------------------Goertzel Algorithm FMgoertzel=0; FMgoertzelx=0; for i=1:outputcycles %FMref=goertzeldata(ref,1:(samples)); FMshifted=goertzeldata(i,1:(samples)); x=fmshifted; xmean = mean(x); x = x-xmean; xmax = max(x); xsamps = 0: 1/length(x):1-1/length(x); y = xmax*cos(2*pi*xsamps + rad_shift); FMref = y + xmean; %down_sample=50; %y=downsample(y,down_sample); %x=downsample(x,down_sample); range=1:50; xg = goertzel(x,range); % Now use Goertzel to obtain the PSD yg = goertzel(y,range); [z,yg_correct_sample]=max(yg); %Grab the sample number which is our target frequency [z,xg_correct_sample]=max(xg); %Grab the sample number which is our target frequency

FMgoertzel(1,i)=angle(yg(1,yg_correct_sample)/xg(1,xg_correct_sample))*180/pi; %actual shifted angle between signals FMgoertzelx(1,i)=startwl+(deltaw*i)-deltaw; end; %----------------------------- %Calculate if length(xaxis) ~= length(fmphase) xaxis = xaxis(2:length(xaxis)); end; onecycletime=totalsamplingtime/outputcycles; figure(1) title('example of Data Taken (1st few cycles)') xlabel('wavelength (nm)') ylabel('voltage (Volts)') plot(xaxis,fmphase,xaxis,fmcontrol,xaxis(1,1:length(trigger)),trigger) axis([ (startwl +1*stepsize) (startwl+ 11*stepsize) 0 2.5, ]') figure(2) title('reference Cycle Vphase Data') xlabel('wavelength (nm)') ylabel('voltage (Volts)') plot(xaxis,fmphase,xaxis,fmcontrol,xaxis(1,1:length(trigger)),trigger) axis([(startwl + 1*stepsize) (startwl + 2*stepsize) 0 2.5]) figure(3) plot(xaxis,fmmagnitude) title('device Magnitude Performance Curve') xlabel('wavelength (nm)') ylabel('voltage (Volts)') figure(4) plot(fmgoertzelx,fmgoertzel*250/180) title('device Phase Performance Curve') xlabel('wavelength (nm)') ylabel(' Phase Delay (ps)') axis([startwl stopwl -250 250]) save(filename,'fmgoertzel','fmmagnitude')