MEMS in ECE at CMU. Gary K. Fedder

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MEMS in ECE at CMU Gary K. Fedder Department of Electrical and Computer Engineering and The Robotics Institute Carnegie Mellon University Pittsburgh, PA 15213-3890 fedder@ece.cmu.edu http://www.ece.cmu.edu/~mems 18-200 - September 23, 2004 09/14/03 Fedder 1

What is MEMS? MEMS have mechanical components with dimensions measured in microns and numbers measured from a few to millions MEMS is a way to make both mechanical and electrical components MEMS is manufacturing using integrated-circuit batch fabrication processes 09/14/03 Fedder 2

Why work on MEMS? Miniaturization portable and remote applications Lighter, faster, lower power sensors and actuators Multiplicity of devices More complexity allowed arrayed systems (e.g., imagers) possible Cost reduction possible Microelectronic integration smart and aware systems on chip Mixed electrical, mechanical, thermal, optical, fluidic, chemical, biochemical systems 09/14/03 Fedder 3

MEMS in Embedded Systems Information systems are pervasive in our lives Trend is toward portability, autonomy, context awareness Creating demand for miniature sensor and actuation systems Ultimately, the embedded system is a MEMS MEMS node 1 physical world MEMS node i MEMS node 2 09/14/03 Fedder 4

Bulk (Substrate) Micromachining Preferential etching of silicon, glass, and other substrates bridge cantilevers groove Examples: Grooves for fiber-optic alignment Membranes for pressure sensors, microphones Nozzles for ink-jet printing, drug delivery substrate membrane nozzle well 09/14/03 Fedder 5

Surface (Thin Film) Micromachining Mechanics from thin films on surface Etching of sacrificial material under microstructure Suspended structures for inertial sensing, thermal sensing, resonators, optics, fluidics... electrically insulating layer substrate anchor suspended microstructure microchannel 09/14/03 Fedder 6

Micromechanical Structural Material Survives process steps Stiffness Yield strength Density Electrical conductivity or isolation Thermal conductivity or isolation Residual stress Residual stress gradient curl structural 09/14/03 Fedder 7

Example: Multi-level Polysilicon Processes MUMPS Process Bottom polysilicon interconnect Two movable polysilicon layers middle poly1 gold dimple top poly2 anchored poly0 www.memscap.com 09/14/03 Fedder 8

Post-CMOS Micromachining One focus of MEMS research in ECE at CMU Structures made starting from CMOS electronics Dielectric layers Scalable CMOS Gate polysilicon N-metal interconnect Silicon substrate G. Fedder et al., Sensors & Actuators A, v.57, no.2, 1996 09/14/03 Fedder 9

Post-CMOS Micromachining Oxide RIE Step 1: reactive-ion etch of dielectric layers Top metal layer acts as a mask & protects the CMOS 09/14/03 Fedder 10

Post-CMOS Micromachining Si DRIE Step 2: DRIE of silicon substrate Spacing between structures and silicon is defined 09/14/03 Fedder 11

Post-CMOS Micromachining Release Step 3: isotropic etch of silicon substrate Structures are undercut & released 09/14/03 Fedder 12

CMOS MEMS Structures Made from CMOS interconnect layers Electronic integration Electrostatic and thermal actuation can be added Capacitive and resistive sensing can be added H. Lakdawala, et al., JSSC Mar. 2002. 09/14/03 Fedder 13

Lateral Low-G Accelerometer Low-G accelerometer to study noise sources in CMOS-MEMS Limit: air molecules hitting the structure! sense fingers proof mass suspension 09/14/03 Fedder 14

Electrothermal Actuators Electrically controllable motion on chip Microbeams are electrically heated (Power = I 2 R) Beams bend from material expansion 200 µm 10 µm self actuation (25 C) 40 µm 20 µm electrothermal actuation (178 C) 09/14/03 Fedder 15

Electrothermal Comb-Finger Capacitor Tunable capacitor in 0.35 µm CMOS Dense comb array provides variable capacitance Electrothermal actuators Yoke for moving fingers Finger motion Yoke for static fingers A. Oz, G. K. Fedder, IEEE Transducers 2003 & MTT-S RFIC 2003, June 2003 09/14/03 Fedder 16

Electrothermal Micromirrors 1 mm by 1 mm by 25 µm-thick mirror Thermal actuation of 25º from 0 to 5 ma poly-si heater metal-1 Si plate oxide H. Xie, Y. Pan, G. K. Fedder, IEEE MEMS 02 & Sensors & Actuators 02 H. Xie, A. Jain, T. Xie, Y. Pan, G. K. Fedder, CLEO 2003 09/14/03 Fedder 17

Implantable Bone Stress Imager Applications: Measure bone stress in fracture sites Measure stress on implant interface Textured surface for osteointegration 100 s of stress sensors for statistical data 1 mm 1 st gen chip 09/14/03 Fedder 18

The Bottom Line MEMS spans many levels processing physical transduction devices system-on-chip design Work merges ECE areas with other fields e.g., mechanical, chemical, biology Emerging area in industry lots of hype, lots of opportunity 09/14/03 Fedder 19

Applied Physics Device Sub-areas, Fall 04 18-303 Semiconductor 18-311 devices I Engineering electromagnetics Electromechanics Mechatronics design 18-578 or Semiconductor 18-401 18-410 devices II, FETS Physical 18-412 sensors, transducers and instrumentation IC fabrication MEMS 18-614 processes 18-815 09/14/03 Fedder 20

Course Content (Abridged Version) 18-303 Engineering Electromagnetics I Static electric and magnetic fields in free space and in materials; Maxwell s equations, boundary conditions and potential functions; Uniform plane waves, transmission lines, waveguides, radiation and antennas. 18-311 Semiconductor Devices I P-N diodes, bipolar transistors, MOSFETs, photodiodes, LEDs and solar cells; Doping, electron and hole transport, and band diagrams. 18-401 Electromechanics Electromechanical statics and dynamics; Energy conversion in synchronous, induction, and commutator rotating machines, electromechanical relays, capacitive microphones and speakers, and magnetic levitation. 18-410 Physical Sensors, Transducers and Instrumentation Sensor physics, transducers, electronic detection, and signal conversion; Case study driven. 18-412 Semiconductor Devices II MOSFETs, JFETs, MESFETs, TFTs; Device scaling; CCD imagers; active matrix flat panel displays; digital and RF applications. 09/14/03 Fedder 21