CERTIFICATE EN 55022: 1998+A1: 2000+A2: 2003 EN 55024: 1998+A1: 2001+A2: EN : A2: 2005 IEC Edition 1.

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CERTIFICATE Issued Date: Jan. 31, 2008 Report No.: 07C055R-ITCEP07V04 This is to certify that the following designated product Product : GV-IO System V3 Trade name : Model Number : GV-IO US ox V2.00, GV-RELAY V2.00, GV-NET I/O CARD V3.10, GV-IO_12OUT CARD V3.00, GV-IO_12IN CARD V3.00 Company Name : GeoVision Inc. This product, which has been issued the test report listed as above in QuieTek Laboratory, is based on a single evaluation of one sample and confirmed to comply with the requirements of the following EMC standard. EN 55022: 1998+A1: 2000+A2: 2003 EN 55024: 1998+A1: 2001+A2: 2003 EN 61000-3-2: 2000+ A2: 2005 IEC 61000-4-2 Edition 1.2: 2001-04 EN 61000-3-3: 1995+ A1: 2001 IEC 61000-4-3: 2002+A1: 2002 IEC 61000-4-4: 2004 IEC 61000-4-5 Edition 1.1: 2001-04 IEC 61000-4-6 Edition 2.1: 2004-11 IEC 61000-4-8 Edition 1.1: 2001-03 IEC 61000-4-11 Second Edition: 2004-03 TEST LAORATORY Vincent Lin / Deputy Manager No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. TEL:+886-2-8601-3788 FAX:+886-2-8601-3789 Email:service@quietek.com http://www.quietek.com

Test Report Product Name : GV-IO System V3 Model No. : GV-IO US ox V2.00, GV-RELAY V2.00, GV-NET I/O CARD V3.10, GV-IO_12OUT CARD V3.00, GV-IO_12IN CARD V3.00 Applicant : GeoVision Inc. Address : 9F., No.246, Sec. 1, Neihu Rd., Neihu District, Taipei 114, Taiwan R.O.C. Date of Receipt : 2007/12/03 Issued Date : 2008/01/31 Report No. : 07C055R-ITCEP07V04 The test results relate only to the samples tested. The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein. This report must not be used to claim product endorsement by TAF, NVLAP or any agency of the Government. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

Declaration of Conformity The following product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (2004/108/EC). The listed standards as below were applied: The following Equipment: Product : GV-IO System V3 Model Number : GV-IO US ox V2.00, GV-RELAY V2.00, GV-NET I/O CARD V3.10, GV-IO_12OUT CARD V3.00, GV-IO_12IN CARD V3.00 Trade Name : This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (2004/108/EC). For the evaluation regarding EMC, the following standards were applied: RFI Emission: EN 55022: 1998+A1: 2000+A2: 2003 Class : Product family standard EN 61000-3-2:2000+A2: 2005 Class A : Limits for harmonic current emission EN 61000-3-3:1995+A1: 2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system Immunity: EN 55024:1998+A1:2001+A2:2003 : Product family standard The following importer/manufacturer is responsible for this declaration: Company Name : Company Address : Telephone : Facsimile : Person is responsible for marking this declaration: Name (Full Name) Position/ Title Date Legal Signature

QTK No.: 07C055R-ITCEP07V04 Statement of Conformity This certifies that the following designated product: Product : GV-IO System V3 Model Number : GV-IO US ox V2.00, GV-RELAY V2.00, GV-NET I/O CARD V3.10, GV-IO_12OUT CARD V3.00, GV-IO_12IN CARD V3.00 Trade Name : Company Name : GeoVision Inc. This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (2004/108/EC). For the evaluation regarding EMC, the following standards were applied: RFI Emission: EN 55022: 1998+A1: 2000+A2: 2003 Class : Product family standard EN 61000-3-2:2000+A2: 2005 Class A : Limits for harmonic current emission EN 61000-3-3:1995+A1: 2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system Immunity: EN 55024:1998+A1:2001+A2:2003 : Product family standard TEST LAORATORY Vincent Lin / Deputy Manager The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo. QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. Tel: 886-2-8601-3788, Fax: 886-2-8601-3789, E-mail: service@quietek.com

Test Report Certification Issued Date : 2008/01/31 Report No. : 07C055R-ITCEP07V04 Product Name : GV-IO System V3 Applicant : GeoVision Inc. Address : 9F., No.246, Sec. 1, Neihu Rd., Neihu District, Taipei 114, Taiwan R.O.C. Manufacturer : GeoVision Inc. Model No. : GV-IO US ox V2.00, GV-RELAY V2.00, GV-NET I/O CARD V3.10, GV-IO_12OUT CARD V3.00, GV-IO_12IN CARD V3.00 Rated Voltage : AC 230 V / 50 Hz EUT Voltage : 5V, 12V Trade Name : Applicable Standard : EN 55022: 1998+A1: 2000+A2: 2003 Class EN 55024: 1998+A1: 2001+A2: 2003 EN 61000-3-2: 2000+A2: 2005 EN 61000-3-3:1995+A1: 2001 Test Result : Complied Performed Location : Quietek Corporation (Linkou Laboratory) No.5-22,Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kuo Shiang, Taipei, 244 Taiwan, R.O.C. TEL:+866-2-8601-3788 / FAX:+886-2-8601-3789 Documented y : Reviewed y : Approved y : ( Engineering Adm. Assistant / Jinn Chen ) ( Assistant Engineer / Elvis Su ) ( Deputy Manager / Vincent Lin ) Page: 2 of 126

Laboratory Information We, QuieTek Corporation, are an independent EMC and safety consultancy that was established the whole facility in our laboratories. The test facility has been accredited/accepted (audited or listed) by the following related bodies in compliance with ISO 17025, EN 45001 and specified testing scopes: Taiwan R.O.C. : SMI, NCC, TAF Germany : TUV Rheinland Norway : Nemko, DNV USA : FCC, NVLAP Japan : VCCI The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation s Web Site :http://tw.quietek.com/modules/enterprise/services.php?item=100 The address and introduction of QuieTek Corporation s laboratories can be founded in our Web site : http://www.quietek.com/ If you have any comments, Please don t hesitate to contact us. Our contact information is as below: HsinChu Testing Laboratory : No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C. TEL:+886-3-592-8858 / FAX:+886-3-592-8859 E-Mail : service@quietek.com LinKou Testing Laboratory : No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C. TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789 E-Mail : service@quietek.com Reports from oth Laboratories Are Accepted by : Page: 3 of 126

TALE OF CONTENTS Description Page 1. General Information... 7 1.1. EUT Description... 7 1.2. Mode of Operation... 8 1.3. Tested System Details... 9 1.4. Configuration of Tested System... 10 1.5. EUT Exercise Software... 11 2. Technical Test... 12 2.1. Summary of Test Result... 12 2.2. List of Test Equipment... 13 2.3. Measurement Uncertainty... 16 2.4. Test Environment... 18 3. Conducted Emission (Main Terminals)... 19 3.1. Test Specification... 19 3.2. Test Setup... 19 3.3. Limit... 19 3.4. Test Procedure... 20 3.5. Deviation from Test Standard... 20 3.6. Test Result... 21 3.7. Test Photograph... 39 4. Radiated Emission... 42 4.1. Test Specification... 42 4.2. Test Setup... 42 4.3. Limit... 42 4.4. Test Procedure... 43 4.5. Deviation from Test Standard... 43 4.6. Test Result... 44 4.7. Test Photograph... 50 5. Harmonic Current Emission... 53 5.1. Test Specification... 53 5.2. Test Setup... 53 5.3. Limit... 53 5.4. Test Procedure... 55 5.5. Deviation from Test Standard... 55 5.6. Test Result... 56 5.7. Test Photograph... 62 6. Voltage Fluctuation and Flicker... 64 Page: 4 of 126

6.1. Test Specification... 64 6.2. Test Setup... 64 6.3. Limit... 64 6.4. Test Procedure... 65 6.5. Deviation from Test Standard... 65 6.6. Test Result... 66 6.7. Test Photograph... 69 7. Electrostatic Discharge... 71 7.1. Test Specification... 71 7.2. Test Setup... 71 7.3. Limit... 71 7.4. Test Procedure... 72 7.5. Deviation from Test Standard... 72 7.6. Test Result... 73 7.7. Test Photograph... 76 8. Radiated Susceptibility... 78 8.1. Test Specification... 78 8.2. Test Setup... 78 8.3. Limit... 78 8.4. Test Procedure... 79 8.5. Deviation from Test Standard... 79 8.6. Test Result... 80 8.7. Test Photograph... 83 9. Electrical Fast Transient/urst... 85 9.1. Test Specification... 85 9.2. Test Setup... 85 9.3. Limit... 85 9.4. Test Procedure... 86 9.5. Deviation from Test Standard... 86 9.6. Test Result... 87 9.7. Test Photograph... 90 10. Surge... 92 10.1. Test Specification... 92 10.2. Test Setup... 92 10.3. Limit... 92 10.4. Test Procedure... 93 10.5. Deviation from Test Standard... 93 10.6. Test Result... 94 Page: 5 of 126

10.7. Test Photograph... 97 11. Conducted Susceptibility... 99 11.1. Test Specification... 99 11.2. Test Setup... 99 11.3. Limit... 100 11.4. Test Procedure... 100 11.5. Deviation from Test Standard... 100 11.6. Test Result... 101 11.7. Test Photograph... 104 12. Power Frequency Magnetic Field... 106 12.1. Test Specification... 106 12.2. Test Setup... 106 12.3. Limit... 106 12.4. Test Procedure... 106 12.5. Deviation from Test Standard... 106 12.6. Test Result... 107 12.7. Test Photograph... 110 13. Voltage Dips and Interruption... 112 13.1. Test Specification... 112 13.2. Test Setup... 112 13.3. Limit... 112 13.4. Test Procedure... 113 13.5. Deviation from Test Standard... 113 13.6. Test Result... 114 13.7. Test Photograph... 117 14. Attachment... 119 EUT Photograph... 119 Page: 6 of 126

1. General Information 1.1. EUT Description Product Name Trade Name Model No. GV-IO System V3 GV-IO US ox V2.00, GV-RELAY V2.00, GV-NET I/O CARD V3.10, GV-IO_12OUT CARD V3.00, GV-IO_12IN CARD V3.00 Component US Cable Shielded, 1.1m Telecom to US Shielded, 0.3m Cable Power Adapter #1 Sunny, SYS1298-1305-W2 Cable Out: Non-Shielded, 1.5m Input: AC100~240V, 50/60Hz, 1.0A Output: DC 5V, 2.0A Power Adapter #2 DVE, DSA-0131F-12 Cable Out: Non-Shielded, 1.5m Input: AC100~240V, 50/60Hz, 0.3A Output: DC 12V, 1.0A Page: 7 of 126

1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as: Pre-Test Mode Mode 1: Normal Operation, Adp DSA-0131F-12 Mode 2: Normal Operation, Adp SYS1298-1305-W2 Mode 3: Normal Operation, PC SYSTEM Final Test Mode Mode 1: Normal Operation, Adp DSA-0131F-12 Emission Mode 2: Normal Operation, Adp SYS1298-1305-W2 Mode 3: Normal Operation, PC SYSTEM Mode 1: Normal Operation, Adp DSA-0131F-12 Immunity Mode 2: Normal Operation, Adp SYS1298-1305-W2 Mode 3: Normal Operation, PC SYSTEM Page: 8 of 126

1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Product Manufacturer Model No. Serial No. Power Cord 1 Printer EPSON StyLus C63 FAPY094339 Non-Shielded, 1.8m 2 US Mouse Logitech M-E58 HCA30103299 N/A 3 Keyboard TC 5200U N/A N/A 4 Modem ACEEX DM-1414 0102027553 Non-Shielded, 1.8m 5 LCD Monitor CMV CT-730D FNC122F57CA1072 Non-Shielded, 1.8m 6 Computer IM N/A N/A Non-Shielded, 1.8m Page: 9 of 126

1.4. Configuration of Tested System Connection Diagram Signal Cable Type Signal cable Description A Printer Cable Shielded, 1.2m US Cable Shielded, 1.5m C US Cable Shielded, 1.5m D RS232 Cable Shielded, 1.5m E D-SU Cable Shielded, 1.8m, with one ferrite core bonded. F US Cable Shielded, 1.1m G Singnal Cable Non-Shielded, 0.2m, two PCS. Page: 10 of 126

1.5. EUT Exercise Software 1 Setup the EUT and simulators as shown on 1.4. 2 Turn on the power of all equipment. 3 Personal Computer reads data from disk. 4 Personal Computer sends H pattern to printer, the printer will print H pattern on paper. 5 Personal Computer reads and writes data into and from modem. 6 Personal Computer will read data from floppy disk and then writes the data into floppy disk, same operation for hard disk. 7 Repeat the above procedure (4) to (6). Page: 11 of 126

2. Technical Test 2.1. Summary of Test Result No deviations from the test standards Deviations from the test standards as below description: Emission Performed Item Normative References Test Performed Deviation Conducted Emission EN 55022:1998+A1:2000+A2:2003 Class Yes No Impedance Stabilization EN 55022:1998+A1:2000+A2:2003 Class No No Network Radiated Emission EN 55022:1998+A1:2000+A2:2003 Class Yes No Power Harmonics EN 61000-3-2:2000+A2:2005 Yes No Voltage Fluctuation and Flicker EN 61000-3-3:1995+A1:2001 Yes No Immunity Performed Item Normative References Test Performed Deviation Electrostatic Discharge IEC 61000-4-2 Edition 1.2: 2001-04 Yes No Radiated susceptibility IEC 61000-4-3:2002+A1: 2002 Yes No Electrical fast transient/burst IEC 61000-4-4:2004 Yes No Surge IEC 61000-4-5 Edition 1.1: 2001-04 Yes No Conducted susceptibility IEC 61000-4-6 Edition 2.1: 2004-11 Yes No Power frequency magnetic field IEC 61000-4-8 Edition 1.1: 2001-03 Yes No Voltage dips and interruption IEC 61000-4-11 2nd Edition: 2004-03 Yes No Page: 12 of 126

2.2. List of Test Equipment Conducted Emission / SR1 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCS 30 836858/022 2007/07/21 LISN R&S ESH3-Z5 836679/020 2007/02/17 LISN R&S ENV4200 833209/007 2007/07/27 Pulse Limiter R&S ESH3-Z2 357.88.10.52 2007/09/07 Radiated Emission / Site3 Instrument Manufacturer Type No. Serial No Cal. Date ilog Antenna Schaffner Chase CL6112 2704 2007/08/09 roadband Horn Antenna Schwarzbeck HA9170 208 2007/07/25 EMI Test Receiver R&S ESI26 838786/004 2007/06/19 EMI Test Receiver R&S ESCS 30 838251/001 2007/05/11 Horn Antenna Schwarzbeck HA9120D 305 2007/08/10 Pre-Amplifier MITEQ AMF-4D-18040 0-45-6P 925974 2008/01/03 Pre-Amplifier QTK N/A N/A 2008/01/03 Spectrum Analyzer Advantest R3162 101102468 2007/10/24 Power Harmonics / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK54148 2007/06/29 IEC1000-4-X Analyzer(Flicker) Schaffner CCN 1000-1 X7 1887 2007/06/29 Voltage Fluctuation and Flicker / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK54148 2007/06/29 IEC1000-4-X Analyzer(Flicker) Schaffner CCN 1000-1 X7 1887 2007/06/29 Electrostatic Discharge / SR3 Instrument Manufacturer Type No. Serial No Cal. Date ESD simulator system Schaffner NSG 438 167 2007/06/07 Horizontal Coupling Plane(HCP) QuieTek HCP AL50 N/A N/A Vertical Coupling Plane(VCP) QuieTek VCP AL50 N/A N/A Radiated susceptibility / C5 Instrument Manufacturer Type No. Serial No Cal. Date AF-OX R&S AF-OX ACCUST 100007 N/A Audio Analyzer R&S UPL 16 100137 2007/03/16 ilog Antenna Schaffner Chase CL6112 2450 2008/01/03 road-and Antenna Schwarzbeck VUL 9166 1085 2007/08/02 CMU200 UNIV.RADIOCOMM R&S CMU200 104846 2007/03/16 Directional Coupler A&R DC 6180 22735 N/A Dual Microphone Supply &K 5935 2426784 2007/08/04 Mouth Simulator &K 4227 2439692 2007/08/04 Page: 13 of 126

Power Amplifier A&R 30S1G3 309453 N/A Power Amplifier A&R 100W10000M7 A285000010 N/A Power Meter R&S NRVD(P.M) 100219 2007/04/21 Pre-Amplifier A&R 150A220 23067 N/A Probe Microphone &K 4182 2278070 2007/08/04 Signal Generator R&S SMY02(9K-208 0) 825454/028 2007/09/22 Electrical fast transient/burst / SR2 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2050 System Mainframe N/A N/A N/A 2007/12/28 Surge / SR2 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2050 System Mainframe N/A N/A N/A 2007/12/28 Conducted susceptibility / SR6 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2070 RF-Generator Schaffner N/A N/A 2007/04/21 Power frequency magnetic field / SR3 Instrument Manufacturer Type No. Serial No Cal. Date Induction Coil Interface Schaffner INA 2141 6002 N/A Magnetic Loop Coil Schaffner INA 702 199749-020IN N/A Magnetic/Electric field measuring system Lackmann Phymetric MV3 N/A N/A Triaxial ELF Magnetic Field Meter F..ELL 4090 9852 2007/05/30 Voltage dips and interruption / SR2 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2050 System Mainframe N/A N/A N/A 2007/12/28 Schaffner NSG 2050 System Mainframe Instrument Manufacturer Type No. Serial No Cal. Date urst 4.8KV/16A Generator with CDN Schaffner PNW2225 200123-098SC 2007/12/28 Damped osc. Wave 100kHz and 1MHz Schaffner PNW2056 200124-058SC 2007/12/28 Double AC Source Variator Schaffner NSG 642A 30910014938 2007/12/28 Hybrid surge pulse 1.2/50uS Schaffner PNW 2050 20532-514LU 2007/12/28 PQT Generator Schaffner PNW2003 200138-007SC 2008/01/02 Pulse COUPLING NETWORK Schaffner CDN131 200124-007SC 2007/12/28 Page: 14 of 126

Schaffner NSG 2070 RF-Generator Instrument Manufacturer Type No. Serial No Cal. Date CDN Schaffner CAL U100A 20405 2007/04/21 CDN Schaffner TRA U150 20454 2007/04/21 CDN M016S Schaffner CAL U100A 20410 2007/04/21 CDN M016S Schaffner TRA U150 21167 2007/04/21 CDN T002 Schaffner CAL U100 20491 2007/04/21 CDN T002 Schaffner TRA U150 21169 2007/04/21 CDN T400 Schaffner CAL U100 17735 2007/04/21 CDN T400 Schaffner TRA U150 21166 2007/04/21 Coupling Decoupling Network Schaffner CDN M016S 20822 2007/02/23 Coupling Decoupling Network Schaffner CDN M016S 20823 2007/04/21 Coupling Decoupling Network Schaffner CDN T002 19018 2007/04/21 Coupling Decoupling Network Schaffner CDN T400 21226 2007/04/21 EM-CLAMP Schaffner KEMZ 801 21024 2007/04/21 Page: 15 of 126

2.3. Measurement Uncertainty Conducted Emission The measurement uncertainty is evaluated as ± 2.26 d. Radiated Emission The measurement uncertainty is evaluated as ± 3.19 d. Electrostatic Discharge As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in ESD testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant ESD standards. The immunity test signal from the ESD system meet the required specifications in IEC 61000-4-2 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Radiated susceptibility As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in RS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant RS standards. The immunity test signal from the RS system meet the required specifications in IEC 61000-4-3 through the calibration for the uniform field strength and monitoring for the test level with the uncertainty evaluation report for the electrical filed strength as being 2.72 d. Electrical fast transient/burst As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in EFT/urst testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant EFT/urst standards. The immunity test signal from the EFT/urst system meet the required specifications in IEC 61000-4-4 through the calibration report with the calibrated uncertainty for the waveform of voltage, frequency and timing as being 1.63 %, 2.8 10-10 and 2.76%. Surge As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in Surge testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant Surge standards. The immunity test signal from the Surge system meet the required specifications in IEC 61000-4-5 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Page: 16 of 126

Conducted susceptibility As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in CS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant CS standards. The immunity test signal from the CS system meet the required specifications in IEC 61000-4-6 through the calibration for unmodulated signal and monitoring for the test level with the uncertainty evaluation report for the injected modulated signal level through CDN and EM Clamp/Direct Injection as being 3.72 d and 2.78 d. Power frequency magnetic field As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in PFM testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant PFM standards. The immunity test signal from the PFM system meet the required specifications in IEC 61000-4-8 through the calibration report with the calibrated uncertainty for the Gauss Meter to verify the output level of magnetic field strength as being 2 %. Voltage dips and interruption As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in DIP testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant DIP standards. The immunity test signal from the DIP system meet the required specifications in IEC 61000-4-11 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%. Page: 17 of 126

2.4. Test Environment Performed Item Items Required Actual Temperature ( C) 15-35 25 Conducted Emission Humidity (%RH) 25-75 50 arometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 25 Radiated Emission Humidity (%RH) 25-75 50 arometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 24 Electrostatic Discharge Humidity (%RH) 30-60 42 arometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 20 Radiated susceptibility Humidity (%RH) 25-75 53 arometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 18 Electrical fast transient/burst Humidity (%RH) 25-75 52 arometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 22 Surge Humidity (%RH) 10-75 53 arometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 20 Conducted susceptibility Humidity (%RH) 25-75 52 arometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 18 Power frequency Humidity (%RH) magnetic field 25-75 51 arometric pressure (mbar) 860-1060 950-1000 Temperature ( C) 15-35 22 Voltage dips and interruption Humidity (%RH) 25-75 53 arometric pressure (mbar) 860-1060 950-1000 Page: 18 of 126

3. Conducted Emission (Main Terminals) 3.1. Test Specification According to EMC Standard : EN 55022 3.2. Test Setup 3.3. Limit Limits Frequency (MHz) QP (duv) AV (duv) 0.15-0.50 66-56 56 46 0.50-5.0 56 46 5.0-30 60 50 Remarks: In the above table, the tighter limit applies at the band edges. Page: 19 of 126

3.4. Test Procedure The EUT and simulators are connected to the main power through a line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) oth sides of A.C. line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed on conducted measurement. Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using a receiver bandwidth of 9kHz. 3.5. Deviation from Test Standard No deviation. Page: 20 of 126

3.6. Test Result Site : SR-1 Time : 2007/12/07-10:18 Limit : CISPR 00M_QP Margin : 10 EUT : GV-IO System V3 Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : Mode 1 Page: 21 of 126

Site : SR-1 Time : 2007/12/07-10:20 Limit : CISPR 00M_QP Margin : 0 EUT : GV-IO System V3 Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) 1 0.220 0.505 40.920 41.425-22.575 64.000 QUASIPEAK 2 0.482 0.300 35.510 35.810-20.704 56.514 QUASIPEAK 3 * 0.681 0.310 37.560 37.870-18.130 56.000 QUASIPEAK 4 1.017 0.320 33.830 34.150-21.850 56.000 QUASIPEAK 5 1.834 0.340 34.070 34.410-21.590 56.000 QUASIPEAK 6 2.623 0.360 35.680 36.040-19.960 56.000 QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 22 of 126

Site : SR-1 Time : 2007/12/07-10:20 Limit : CISPR 00M_AV Margin : 0 EUT : GV-IO System V3 Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) 1 0.220 0.505 28.470 28.975-25.025 54.000 AVERAGE 2 0.482 0.300 15.530 15.830-30.684 46.514 AVERAGE 3 * 0.681 0.310 21.930 22.240-23.760 46.000 AVERAGE 4 1.017 0.320 10.580 10.900-35.100 46.000 AVERAGE 5 1.834 0.340 18.920 19.260-26.740 46.000 AVERAGE 6 2.623 0.360 11.560 11.920-34.080 46.000 AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 23 of 126

Site : SR-1 Time : 2007/12/07-10:21 Limit : CISPR 00M_QP Margin : 10 EUT : GV-IO System V3 Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : Mode 1 Page: 24 of 126

Site : SR-1 Time : 2007/12/07-10:23 Limit : CISPR 00M_QP Margin : 0 EUT : GV-IO System V3 Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) 1 0.201 0.300 42.170 42.470-22.073 64.543 QUASIPEAK 2 0.392 0.310 37.670 37.980-21.106 59.086 QUASIPEAK 3 0.623 0.310 32.590 32.900-23.100 56.000 QUASIPEAK 4 1.314 0.330 34.030 34.360-21.640 56.000 QUASIPEAK 5 1.623 0.340 34.910 35.250-20.750 56.000 QUASIPEAK 6 * 2.459 0.360 37.230 37.590-18.410 56.000 QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 25 of 126

Site : SR-1 Time : 2007/12/07-10:23 Limit : CISPR 00M_AV Margin : 0 EUT : GV-IO System V3 Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) 1 * 0.201 0.300 33.970 34.270-20.273 54.543 AVERAGE 2 0.392 0.310 27.100 27.410-21.676 49.086 AVERAGE 3 0.623 0.310 12.230 12.540-33.460 46.000 AVERAGE 4 1.314 0.330 10.380 10.710-35.290 46.000 AVERAGE 5 1.623 0.340 11.360 11.700-34.300 46.000 AVERAGE 6 2.459 0.360 13.710 14.070-31.930 46.000 AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 26 of 126

Site : SR-1 Time : 2007/12/07-10:38 Limit : CISPR 00M_QP Margin : 10 EUT : GV-IO System V3 Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : Mode 2 Page: 27 of 126

Site : SR-1 Time : 2007/12/07-10:40 Limit : CISPR 00M_QP Margin : 0 EUT : GV-IO System V3 Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) 1 0.150 0.300 53.220 53.520-12.480 66.000 QUASIPEAK 2 0.298 0.300 48.740 49.040-12.731 61.771 QUASIPEAK 3 * 0.451 0.300 44.730 45.030-12.370 57.400 QUASIPEAK 4 0.748 0.310 42.600 42.910-13.090 56.000 QUASIPEAK 5 0.896 0.310 41.610 41.920-14.080 56.000 QUASIPEAK 6 1.345 0.320 39.710 40.030-15.970 56.000 QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 28 of 126

Site : SR-1 Time : 2007/12/07-10:40 Limit : CISPR 00M_AV Margin : 0 EUT : GV-IO System V3 Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) 1 0.150 0.300 42.570 42.870-13.130 56.000 AVERAGE 2 0.298 0.300 40.210 40.510-11.261 51.771 AVERAGE 3 * 0.451 0.300 35.920 36.220-11.180 47.400 AVERAGE 4 0.748 0.310 32.190 32.500-13.500 46.000 AVERAGE 5 0.896 0.310 30.390 30.700-15.300 46.000 AVERAGE 6 1.345 0.320 29.110 29.430-16.570 46.000 AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 29 of 126

Site : SR-1 Time : 2007/12/07-10:41 Limit : CISPR 00M_QP Margin : 10 EUT : GV-IO System V3 Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : Mode 2 Page: 30 of 126

Site : SR-1 Time : 2007/12/07-10:43 Limit : CISPR 00M_QP Margin : 0 EUT : GV-IO System V3 Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) 1 * 0.150 0.300 54.390 54.690-11.310 66.000 QUASIPEAK 2 0.298 0.300 49.000 49.300-12.471 61.771 QUASIPEAK 3 0.451 0.310 44.630 44.940-12.460 57.400 QUASIPEAK 4 0.748 0.320 41.800 42.120-13.880 56.000 QUASIPEAK 5 1.048 0.320 40.660 40.980-15.020 56.000 QUASIPEAK 6 1.349 0.330 39.650 39.980-16.020 56.000 QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 31 of 126

Site : SR-1 Time : 2007/12/07-10:43 Limit : CISPR 00M_AV Margin : 0 EUT : GV-IO System V3 Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) 1 * 0.150 0.300 49.030 49.330-6.670 56.000 AVERAGE 2 0.298 0.300 41.210 41.510-10.261 51.771 AVERAGE 3 0.451 0.310 33.840 34.150-13.250 47.400 AVERAGE 4 0.748 0.320 36.640 36.960-9.040 46.000 AVERAGE 5 1.048 0.320 33.720 34.040-11.960 46.000 AVERAGE 6 1.349 0.330 27.140 27.470-18.530 46.000 AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 32 of 126

Site : SR-1 Time : 2007/12/07-11:01 Limit : CISPR 00M_QP Margin : 10 EUT : GV-IO System V3 Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : Mode 3 Page: 33 of 126

Site : SR-1 Time : 2007/12/07-11:03 Limit : CISPR 00M_QP Margin : 0 EUT : GV-IO System V3 Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) 1 0.205 0.615 41.630 42.245-22.184 64.429 QUASIPEAK 2 0.408 0.300 36.490 36.790-21.839 58.629 QUASIPEAK 3 0.505 0.300 34.300 34.600-21.400 56.000 QUASIPEAK 4 1.322 0.320 35.440 35.760-20.240 56.000 QUASIPEAK 5 2.130 0.350 32.660 33.010-22.990 56.000 QUASIPEAK 6 * 15.228 1.000 38.900 39.900-20.100 60.000 QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 34 of 126

Site : SR-1 Time : 2007/12/07-11:03 Limit : CISPR 00M_AV Margin : 0 EUT : GV-IO System V3 Probe : LISN-L(023) - Line1 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) 1 0.205 0.615 37.660 38.275-16.154 54.429 AVERAGE 2 0.408 0.300 35.650 35.950-12.679 48.629 AVERAGE 3 0.505 0.300 34.270 34.570-11.430 46.000 AVERAGE 4 * 1.322 0.320 35.080 35.400-10.600 46.000 AVERAGE 5 2.130 0.350 31.120 31.470-14.530 46.000 AVERAGE 6 15.228 1.000 31.500 32.500-17.500 50.000 AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 35 of 126

Site : SR-1 Time : 2007/12/07-11:04 Limit : CISPR 00M_QP Margin : 10 EUT : GV-IO System V3 Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : Mode 3 Page: 36 of 126

Site : SR-1 Time : 2007/12/07-11:06 Limit : CISPR 00M_QP Margin : 0 EUT : GV-IO System V3 Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) 1 0.205 0.300 43.820 44.120-20.309 64.429 QUASIPEAK 2 0.408 0.310 36.610 36.920-21.709 58.629 QUASIPEAK 3 * 0.509 0.310 37.220 37.530-18.470 56.000 QUASIPEAK 4 3.455 0.387 31.750 32.137-23.863 56.000 QUASIPEAK 5 10.353 0.510 37.100 37.610-22.390 60.000 QUASIPEAK 6 15.283 0.900 38.550 39.450-20.550 60.000 QUASIPEAK Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 37 of 126

Site : SR-1 Time : 2007/12/07-11:06 Limit : CISPR 00M_AV Margin : 0 EUT : GV-IO System V3 Probe : LISN-N(023) - Line2 Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv) (d) (duv) 1 0.205 0.300 40.640 40.940-13.489 54.429 AVERAGE 2 0.408 0.310 35.690 36.000-12.629 48.629 AVERAGE 3 * 0.509 0.310 37.210 37.520-8.480 46.000 AVERAGE 4 3.455 0.387 29.650 30.037-15.963 46.000 AVERAGE 5 10.353 0.510 32.250 32.760-17.240 50.000 AVERAGE 6 15.283 0.900 32.500 33.400-16.600 50.000 AVERAGE Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 38 of 126

3.7. Test Photograph Test Mode : Mode 1: Normal Operation, Adp DSA-0131F-12 Description : Front View of Conducted Test Test Mode : Mode 1: Normal Operation, Adp DSA-0131F-12 Description : ack View of Conducted Test Page: 39 of 126

Test Mode : Mode 2: Normal Operation, Adp SYS1298-1305-W2 Description : Front View of Conducted Test Test Mode : Mode 2: Normal Operation, Adp SYS1298-1305-W2 Description : ack View of Conducted Test Page: 40 of 126

Test Mode : Mode 3: Normal Operation, PC SYSTEM Description : Front View of Conducted Test Test Mode : Mode 3: Normal Operation, PC SYSTEM Description : ack View of Conducted Test Page: 41 of 126

4. Radiated Emission 4.1. Test Specification According to EMC Standard : EN 55022 4.2. Test Setup 4.3. Limit Frequency (MHz) Limits Distance (m) duv/m 30 230 10 30 230 1000 10 37 Remark: 1. The tighter limit shall apply at the edge between two frequency bands. 2. Distance refers to the distance in meters between the measuring instrument antenna and the closed point of any part of the device or system. Page: 42 of 126

4.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 10 meters. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. oth horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated on radiated measurement. Radiated emissions were invested over the frequency range from 30MHz to1ghz using a receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of 10 meters. 4.5. Deviation from Test Standard No deviation. Page: 43 of 126

4.6. Test Result Site : Site 3 Time : 2007/12/27-16:47 Limit : CISPR 10M_QP Margin : 6 EUT : GV-IO System V3 Probe : CL6112(2920) - HORIZONTAL Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv/m) (d) (duv/m) 1 131.800 14.031 10.500 24.532-5.468 30.000 QUASIPEAK 2 192.607 11.646 10.550 22.196-7.804 30.000 QUASIPEAK 3 204.000 11.974 12.700 24.674-5.326 30.000 QUASIPEAK 4 * 216.000 11.660 16.030 27.689-2.311 30.000 QUASIPEAK 5 314.996 17.688 14.390 32.078-4.922 37.000 QUASIPEAK 6 400.900 20.951 12.000 32.951-4.049 37.000 QUASIPEAK 7 566.671 24.634 8.910 33.544-3.456 37.000 QUASIPEAK 8 687.266 26.186 8.420 34.606-2.394 37.000 QUASIPEAK 9 800.006 27.499 3.800 31.299-5.701 37.000 QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 44 of 126

Site : Site 3 Time : 2007/12/27-16:54 Limit : CISPR 10M_QP Margin : 6 EUT : GV-IO System V3 Probe : CL6112(2920) - VERTICAL Power : AC 230V/50Hz Note : Mode 1 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv/m) (d) (duv/m) 1 32.630 17.855 11.100 28.955-1.045 30.000 QUASIPEAK 2 55.250 7.791 17.170 24.960-5.040 30.000 QUASIPEAK 3 * 119.851 13.890 15.430 29.321-0.679 30.000 QUASIPEAK 4 131.850 14.030 12.820 26.850-3.150 30.000 QUASIPEAK 5 204.000 11.974 14.320 26.294-3.706 30.000 QUASIPEAK 6 216.000 11.660 17.470 29.129-0.871 30.000 QUASIPEAK 7 315.000 17.688 12.980 30.668-6.332 37.000 QUASIPEAK 8 500.000 23.073 9.250 32.323-4.677 37.000 QUASIPEAK 9 566.670 24.634 5.950 30.584-6.416 37.000 QUASIPEAK 10 601.356 24.901 5.570 30.471-6.529 37.000 QUASIPEAK 11 700.008 26.434 3.890 30.324-6.676 37.000 QUASIPEAK 12 997.820 29.846 1.840 31.686-5.314 37.000 QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 45 of 126

Site : Site 3 Time : 2007/12/27-16:47 Limit : CISPR 10M_QP Margin : 6 EUT : GV-IO System V3 Probe : CL6112(2920) - HORIZONTAL Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv/m) (d) (duv/m) 1 131.800 14.031 10.500 24.532-5.468 30.000 QUASIPEAK 2 192.607 11.646 10.550 22.196-7.804 30.000 QUASIPEAK 3 204.000 11.974 12.700 24.674-5.326 30.000 QUASIPEAK 4 * 216.000 11.660 16.030 27.689-2.311 30.000 QUASIPEAK 5 314.996 17.688 14.390 32.078-4.922 37.000 QUASIPEAK 6 400.900 20.951 12.000 32.951-4.049 37.000 QUASIPEAK 7 566.671 24.634 8.910 33.544-3.456 37.000 QUASIPEAK 8 687.266 26.186 8.420 34.606-2.394 37.000 QUASIPEAK 9 800.006 27.499 3.800 31.299-5.701 37.000 QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 46 of 126

Site : Site 3 Time : 2007/12/27-16:54 Limit : CISPR 10M_QP Margin : 6 EUT : GV-IO System V3 Probe : CL6112(2920) - VERTICAL Power : AC 230V/50Hz Note : Mode 2 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv/m) (d) (duv/m) 1 32.630 17.855 11.100 28.955-1.045 30.000 QUASIPEAK 2 55.250 7.791 17.170 24.960-5.040 30.000 QUASIPEAK 3 * 119.851 13.890 15.430 29.321-0.679 30.000 QUASIPEAK 4 131.850 14.030 12.820 26.850-3.150 30.000 QUASIPEAK 5 204.000 11.974 14.320 26.294-3.706 30.000 QUASIPEAK 6 216.000 11.660 17.470 29.129-0.871 30.000 QUASIPEAK 7 315.000 17.688 12.980 30.668-6.332 37.000 QUASIPEAK 8 500.000 23.073 9.250 32.323-4.677 37.000 QUASIPEAK 9 566.670 24.634 5.950 30.584-6.416 37.000 QUASIPEAK 10 601.356 24.901 5.570 30.471-6.529 37.000 QUASIPEAK 11 700.008 26.434 3.890 30.324-6.676 37.000 QUASIPEAK 12 997.820 29.846 1.840 31.686-5.314 37.000 QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 47 of 126

Site : Site 3 Time : 2007/12/27-16:47 Limit : CISPR 10M_QP Margin : 6 EUT : GV-IO System V3 Probe : CL6112(2920) - HORIZONTAL Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv/m) (d) (duv/m) 1 131.800 14.031 10.500 24.532-5.468 30.000 QUASIPEAK 2 192.607 11.646 10.550 22.196-7.804 30.000 QUASIPEAK 3 204.000 11.974 12.700 24.674-5.326 30.000 QUASIPEAK 4 * 216.000 11.660 16.030 27.689-2.311 30.000 QUASIPEAK 5 314.996 17.688 14.390 32.078-4.922 37.000 QUASIPEAK 6 400.900 20.951 12.000 32.951-4.049 37.000 QUASIPEAK 7 566.671 24.634 8.910 33.544-3.456 37.000 QUASIPEAK 8 687.266 26.186 8.420 34.606-2.394 37.000 QUASIPEAK 9 800.006 27.499 3.800 31.299-5.701 37.000 QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 48 of 126

Site : Site 3 Time : 2007/12/27-16:54 Limit : CISPR 10M_QP Margin : 6 EUT : GV-IO System V3 Probe : CL6112(2920) - VERTICAL Power : AC 230V/50Hz Note : Mode 3 Frequency Correct Factor Reading Level Measure Level Margin Limit Detector Type (MHz) (d) (duv) (duv/m) (d) (duv/m) 1 32.630 17.855 11.100 28.955-1.045 30.000 QUASIPEAK 2 55.250 7.791 17.170 24.960-5.040 30.000 QUASIPEAK 3 * 119.851 13.890 15.430 29.321-0.679 30.000 QUASIPEAK 4 131.850 14.030 12.820 26.850-3.150 30.000 QUASIPEAK 5 204.000 11.974 14.320 26.294-3.706 30.000 QUASIPEAK 6 216.000 11.660 17.470 29.129-0.871 30.000 QUASIPEAK 7 315.000 17.688 12.980 30.668-6.332 37.000 QUASIPEAK 8 500.000 23.073 9.250 32.323-4.677 37.000 QUASIPEAK 9 566.670 24.634 5.950 30.584-6.416 37.000 QUASIPEAK 10 601.356 24.901 5.570 30.471-6.529 37.000 QUASIPEAK 11 700.008 26.434 3.890 30.324-6.676 37.000 QUASIPEAK 12 997.820 29.846 1.840 31.686-5.314 37.000 QUASIPEAK Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 49 of 126

4.7. Test Photograph Test Mode : Mode 1: Normal Operation, Adp DSA-0131F-12 Description : Front View of Radiated Test Test Mode : Mode 1: Normal Operation, Adp DSA-0131F-12 Description : ack View of Radiated Test Page: 50 of 126

Test Mode : Mode 2: Normal Operation, Adp SYS1298-1305-W2 Description : Front View of Radiated Test Test Mode : Mode 2: Normal Operation, Adp SYS1298-1305-W2 Description : ack View of Radiated Test Page: 51 of 126

Test Mode : Mode 3: Normal Operation, PC SYSTEM Description : Front View of Radiated Test Test Mode : Mode 3: Normal Operation, PC SYSTEM Description : ack View of Radiated Test Page: 52 of 126

5. Harmonic Current Emission 5.1. Test Specification According to EMC Standard : EN 61000-3-2 5.2. Test Setup 5.3. Limit (a) Limits of Class A Harmonics Currents Harmonics Order n Maximum Permissible harmonic current A Harmonics Order n Maximum Permissible harmonic current A Odd harmonics Even harmonics 3 2.30 2 1.08 5 1.14 4 0.43 7 0.77 6 0.30 9 0.40 8 n 40 0.23 * 8/n 11 0.33 13 0.21 15 n 39 0.15 * 15/n Page: 53 of 126

(b) Limits of Class Harmonics Currents For Class equipment, the harmonic of the input current shall not exceed the maximum permissible values given in table that is the limit of Class A multiplied by a factor of 1.5. (c) Limits of Class C Harmonics Currents Harmonics Order Maximum Permissible harmonic current Expressed as a percentage of the input current at the fundamental frequency n % 2 2 3 30.λ * 5 10 7 7 9 5 11 n 39 3 (odd harmonics only) *λ is the circuit power factor (d) Limits of Class D Harmonics Currents Harmonics Order n Maximum Permissible harmonic current per watt ma/w Maximum Permissible harmonic current A 3 3.4 2.30 5 1.9 1.14 7 1.0 0.77 9 0.5 0.40 11 0.35 0.33 11 n 39 (odd harmonics only) 3.85/n See limit of Class A Page: 54 of 126

5.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed. 5.5. Deviation from Test Standard No deviation. Page: 55 of 126

5.6. Test Result Product GV-IO System V3 Test Item Test Mode Power Harmonics Mode 1: Normal Operation, Adp DSA-0131F-12 Date of Test 2007/12/31 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms 0.6 300 Current (Amps) 0.4 0.2 0.0-0.2-0.4 200 100 0-100 -200 Voltage (Volts) -0.6-300 Harmonics and Class A limit line European Limits Current RMS(Amps) 3.5 3.0 2.5 2.0 1.5 1.0 0.5 0.0 4 8 12 16 20 24 28 32 36 40 Harmonic # Test result: Pass Worst harmonic was #15 with 7.25% of the limit. Page: 56 of 126

Test Result: Pass Source qualification: Normal THC(A): 0.06 I-THD(%): 198.98 POHC(A): 0.019 POHC Limit(A): 0.251 Highest parameter values during test: V_RMS (Volts): 229.75 Frequency(Hz): 50.00 I_Peak (Amps): 0.474 I_RMS (Amps): 0.094 I_Fund (Amps): 0.032 Crest Factor: 5.355 Power (Watts): 7.8 Power Factor: 0.361 Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.001 1.080 0.0 0.001 1.620 0.04 Pass 3 0.023 2.300 1.0 0.025 3.450 0.73 Pass 4 0.001 0.430 0.1 0.001 0.645 0.10 Pass 5 0.022 1.140 1.9 0.024 1.710 1.43 Pass 6 0.001 0.300 0.2 0.001 0.450 0.16 Pass 7 0.021 0.770 2.7 0.023 1.155 2.02 Pass 8 0.000 0.230 0.2 0.001 0.345 0.17 Pass 9 0.020 0.400 4.9 0.022 0.600 3.63 Pass 10 0.000 0.184 0.3 0.001 0.276 0.20 Pass 11 0.018 0.330 5.5 0.020 0.495 4.06 Pass 12 0.000 0.153 0.3 0.001 0.230 0.25 Pass 13 0.017 0.210 7.9 0.018 0.315 5.78 Pass 14 0.000 0.131 0.3 0.000 0.197 0.25 Pass 15 0.015 0.150 10.0 0.016 0.225 7.25 Pass 16 0.000 0.115 0.3 0.000 0.173 0.26 Pass 17 0.013 0.132 10.1 0.014 0.199 7.22 Pass 18 0.000 0.102 0.4 0.001 0.153 0.33 Pass 19 0.012 0.118 9.9 0.012 0.178 7.01 Pass 20 0.000 0.092 0.4 0.000 0.138 0.31 Pass 21 0.010 0.107 9.4 0.011 0.161 6.63 Pass 22 0.000 0.084 0.4 0.000 0.125 0.35 Pass 23 0.009 0.098 8.8 0.009 0.147 6.16 Pass 24 0.000 0.077 0.4 0.000 0.115 0.36 Pass 25 0.007 0.090 8.1 0.008 0.135 5.63 Pass 26 0.000 0.071 0.5 0.000 0.106 0.38 Pass 27 0.006 0.083 7.4 0.006 0.125 5.12 Pass 28 0.000 0.066 0.5 0.000 0.099 0.37 Pass 29 0.005 0.078 6.8 0.005 0.116 4.71 Pass 30 0.000 0.061 0.5 0.000 0.092 0.43 Pass 31 0.004 0.073 6.1 0.005 0.109 4.26 Pass 32 0.000 0.058 0.5 0.000 0.086 0.39 Pass 33 0.004 0.068 5.6 0.004 0.102 3.96 Pass 34 0.000 0.054 0.5 0.000 0.081 0.39 Pass 35 0.003 0.064 5.1 0.004 0.096 3.70 Pass 36 0.000 0.051 0.5 0.000 0.077 0.39 Pass 37 0.003 0.061 4.7 0.003 0.091 3.46 Pass 38 0.000 0.048 0.5 0.000 0.073 0.39 Pass 39 0.003 0.058 4.4 0.003 0.087 3.22 Pass 40 0.000 0.046 0.4 0.000 0.069 0.37 Pass 1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 57 of 126

Product GV-IO System V3 Test Item Power Harmonics Test Mode Mode 2: Normal Operation, Adp SYS1298-1305-W2 Date of Test 2007/12/31 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms 0.3 300 Current (Amps) 0.2 0.1 0.0-0.1-0.2 200 100 0-100 -200 Voltage (Volts) -0.3-300 Harmonics and Class A limit line European Limits Current RMS(Amps) 3.5 3.0 2.5 2.0 1.5 1.0 0.5 0.0 4 8 12 16 20 24 28 32 36 40 Harmonic # Test result: Pass Worst harmonic was #19 with 5.10% of the limit. Page: 58 of 126

Test Result: Pass Source qualification: Normal THC(A): 0.04 I-THD(%): 213.69 POHC(A): 0.014 POHC Limit(A): 0.251 Highest parameter values during test: V_RMS (Volts): 229.76 Frequency(Hz): 50.00 I_Peak (Amps): 0.304 I_RMS (Amps): 0.056 I_Fund (Amps): 0.019 Crest Factor: 6.649 Power (Watts): 4.4 Power Factor: 0.338 Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.001 1.080 0.1 0.001 1.620 0.04 Pass 3 0.013 2.300 0.6 0.015 3.450 0.44 Pass 4 0.001 0.430 0.2 0.001 0.645 0.11 Pass 5 0.013 1.140 1.1 0.015 1.710 0.86 Pass 6 0.001 0.300 0.2 0.001 0.450 0.20 Pass 7 0.012 0.770 1.6 0.014 1.155 1.23 Pass 8 0.001 0.230 0.3 0.001 0.345 0.20 Pass 9 0.012 0.400 2.9 0.014 0.600 2.26 Pass 10 0.001 0.184 0.3 0.001 0.276 0.24 Pass 11 0.011 0.330 3.4 0.013 0.495 2.59 Pass 12 0.001 0.153 0.4 0.001 0.230 0.33 Pass 13 0.010 0.210 5.0 0.012 0.315 3.79 Pass 14 0.001 0.131 0.4 0.001 0.197 0.32 Pass 15 0.010 0.150 6.5 0.011 0.225 4.90 Pass 16 0.001 0.115 0.5 0.001 0.173 0.34 Pass 17 0.009 0.132 6.8 0.010 0.199 5.06 Pass 18 0.001 0.102 0.5 0.001 0.153 0.45 Pass 19 0.008 0.118 6.8 0.009 0.178 5.10 Pass 20 0.000 0.092 0.5 0.001 0.138 0.39 Pass 21 0.007 0.107 6.8 0.008 0.161 5.02 Pass 22 0.000 0.084 0.5 0.001 0.125 0.42 Pass 23 0.006 0.098 6.6 0.007 0.147 4.85 Pass 24 0.000 0.077 0.5 0.000 0.115 0.41 Pass 25 0.006 0.090 6.2 0.006 0.135 4.55 Pass 26 0.000 0.071 0.5 0.000 0.106 0.42 Pass 27 0.005 0.083 5.8 0.005 0.125 4.21 Pass 28 0.000 0.066 0.5 0.000 0.099 0.42 Pass 29 0.004 0.078 5.3 0.004 0.116 3.81 Pass 30 0.000 0.061 0.5 0.000 0.092 0.43 Pass 31 0.003 0.073 4.7 0.004 0.109 3.37 Pass 32 0.000 0.058 0.5 0.000 0.086 0.40 Pass 33 0.003 0.068 4.2 0.003 0.102 2.94 Pass 34 0.000 0.054 0.5 0.000 0.081 0.38 Pass 35 0.002 0.064 3.6 0.002 0.096 2.50 Pass 36 0.000 0.051 0.4 0.000 0.077 0.37 Pass 37 0.002 0.061 3.1 0.002 0.091 2.12 Pass 38 0.000 0.048 0.4 0.000 0.073 0.35 Pass 39 0.001 0.058 2.6 0.002 0.087 1.81 Pass 40 0.000 0.046 0.4 0.000 0.069 0.34 Pass 1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 59 of 126

Product GV-IO System V3 Test Item Power Harmonics Test Mode Mode 3: Normal Operation, PC SYSTEM Date of Test 2007/12/31 Test Site No.3 Shielded Room Test Result: Pass Source qualification: Normal Current & voltage waveforms 1.5 300 Current (Amps) 1.0 0.5 0.0-0.5-1.0 200 100 0-100 -200 Voltage (Volts) -1.5-300 Harmonics and Class D limit line European Limits Current RMS(Amps) 0.50 0.45 0.40 0.35 0.30 0.25 0.20 0.15 0.10 0.05 0.00 4 8 12 16 20 24 28 32 36 40 Harmonic # Test result: Pass Worst harmonic was #3 with 62.47% of the limit. Page: 60 of 126

Test Result: Pass Source qualification: Normal THC(A): 0.34 I-THD(%): 81.95 POHC(A): 0.009 POHC Limit(A): 0.041 Highest parameter values during test: V_RMS (Volts): 229.76 Frequency(Hz): 50.00 I_Peak (Amps): 1.370 I_RMS (Amps): 0.560 I_Fund (Amps): 0.419 Crest Factor: 2.452 Power (Watts): 96.5 Power Factor: 0.750 Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.000 3 0.303 0.328 92.4 0.303 0.485 62.47 Pass 4 0.000 5 0.138 0.183 75.5 0.139 0.271 51.15 Pass 6 0.000 7 0.050 0.096 51.9 0.050 0.143 35.32 Pass 8 0.000 9 0.038 0.048 78.6 0.038 0.071 53.35 Pass 10 0.000 11 0.014 0.034 41.2 0.014 0.051 28.05 Pass 12 0.000 13 0.015 0.029 53.1 0.015 0.042 36.67 Pass 14 0.000 15 0.009 0.025 34.0 0.009 0.037 23.71 Pass 16 0.000 17 0.007 0.022 32.2 0.007 0.032 22.54 Pass 18 0.000 19 0.007 0.020 36.0 0.007 0.029 24.95 Pass 20 0.000 21 0.002 0.018 11.5 0.002 0.026 8.35 Pass 22 0.000 23 0.006 0.016 36.4 0.006 0.024 25.83 Pass 24 0.000 25 0.001 0.015 9.4 0.002 0.022 7.96 Pass 26 0.000 27 0.004 0.014 28.6 0.004 0.021 20.97 Pass 28 0.000 29 0.002 0.013 19.2 0.003 0.019 13.74 Pass 30 0.000 31 0.002 0.012 19.8 0.003 0.018 14.20 Pass 32 0.000 33 0.003 0.011 27.0 0.003 0.017 19.35 Pass 34 0.000 35 0.001 0.011 10.4 0.001 0.016 8.14 Pass 36 0.000 37 0.003 0.010 28.6 0.003 0.015 20.51 Pass 38 0.000 39 0.001 0.010 11.9 0.001 0.014 9.01 Pass 40 0.000 1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass. Page: 61 of 126

5.7. Test Photograph Test Mode : Mode 1: Normal Operation, Adp DSA-0131F-12 Description : Power Harmonics Test Setup Test Mode : Mode 2: Normal Operation, Adp SYS1298-1305-W2 Description : Power Harmonics Test Setup Page: 62 of 126

Test Mode : Mode 3: Normal Operation, PC SYSTEM Description : Power Harmonics Test Setup Page: 63 of 126

6. Voltage Fluctuation and Flicker 6.1. Test Specification According to EMC Standard : EN 61000-3-3 6.2. Test Setup 6.3. Limit The following limits apply: - the value of P st shall not be greater than 1.0; - the value of P lt shall not be greater than 0.65; - the value of d(t) during a voltage change shall not exceed 3.3 % for more than 500 ms; - the relative steady-state voltage change, d c, shall not exceed 3.3 %; - the maximum relative voltage change, d max, shall not exceed; a) 4 % without additional conditions; b) 6 % for equipment which is: - switched manually, or - switched automatically more frequently than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds), or manual restart, after a power supply interruption. NOTE The cycling frequency will be further limited by the P st and P 1t limit. For example: a d max of 6%producing a rectangular voltage change characteristic twice per hour will give a P 1t of about 0.65. Page: 64 of 126

c) 7 % for equipment which is: - attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment such as mixers, garden equipment such as lawn mowers, portable tools such as electric drills), or - switched on automatically, or is intended to be switched on manually, no more than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds) or manual restart, after a power supply interruption. P st and P 1t requirements shall not be applied to voltage changes caused by manual switching. 6.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed. 6.5. Deviation from Test Standard No deviation. Page: 65 of 126

6.6. Test Result Product GV-IO System V3 Test Item Test Mode Voltage Fluctuation and Flicker Mode 1: Normal Operation, Adp DSA-0131F-12 Date of Test 2007/12/31 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits 1.00 0.75 Pst 0.50 0.25 11:15:47 Plt and limit line 0.50 Plt 0.25 11:15:47 Parameter values recorded during the test: Vrms at the end of test (Volt): 229.72 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.160 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.070 Test limit: 0.650 Pass Page: 66 of 126

Product GV-IO System V3 Test Item Voltage Fluctuation and Flicker Test Mode Mode 2: Normal Operation, Adp SYS1298-1305-W2 Date of Test 2007/12/31 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits 1.00 0.75 Pst 0.50 0.25 11:33:40 Plt and limit line 0.50 Plt 0.25 11:33:40 Parameter values recorded during the test: Vrms at the end of test (Volt): 229.70 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.160 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.070 Test limit: 0.650 Pass Page: 67 of 126

Product GV-IO System V3 Test Item Voltage Fluctuation and Flicker Test Mode Mode 3: Normal Operation, PC SYSTEM Date of Test 2007/12/31 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Pst i and limit line European Limits 1.00 0.75 Pst 0.50 0.25 10:39:05 Plt and limit line 0.50 Plt 0.25 10:39:05 Parameter values recorded during the test: Vrms at the end of test (Volt): 229.49 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (ms): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.160 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.070 Test limit: 0.650 Pass Page: 68 of 126

6.7. Test Photograph Test Mode : Mode 1: Normal Operation, Adp DSA-0131F-12 Description : Flicker Test Setup Test Mode : Mode 2: Normal Operation, Adp SYS1298-1305-W2 Description : Flicker Test Setup Page: 69 of 126

Test Mode : Mode 3: Normal Operation, PC SYSTEM Description : Flicker Test Setup Page: 70 of 126

7. Electrostatic Discharge 7.1. Test Specification According to Standard : IEC 61000-4-2 7.2. Test Setup 7.3. Limit Item Environmental Phenomena Units Test Specification Performance Criteria Enclosure Port Electrostatic Discharge kv(charge Voltage) ±8 Air Discharge ±4 Contact Discharge Page: 71 of 126

7.4. Test Procedure Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT. Indirect application of discharges to the EUT: Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. 7.5. Deviation from Test Standard No deviation. Page: 72 of 126

7.6. Test Result Product GV-IO System V3 Test Item Test Mode Electrostatic Discharge Mode 1: Normal Operation, Adp DSA-0131F-12 Date of Test 2008/01/18 Test Site No.3 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,,C) Results Air Discharge 10 10 +8kV -8kV Pass Pass Contact Discharge 25 25 +4kV -4kV Pass Pass Indirect Discharge 50 +4kV Pass (HCP) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Front) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Left) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP ack) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Right) 50-4kV Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 73 of 126

Product GV-IO System V3 Test Item Electrostatic Discharge Test Mode Mode 2: Normal Operation, Adp SYS1298-1305-W2 Date of Test 2008/01/18 Test Site No.3 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,,C) Results Air Discharge 10 10 +8kV -8kV Pass Pass Contact Discharge 25 25 +4kV -4kV Pass Pass Indirect Discharge 50 +4kV Pass (HCP) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Front) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Left) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP ack) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Right) 50-4kV Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 74 of 126

Product GV-IO System V3 Test Item Electrostatic Discharge Test Mode Mode 3: Normal Operation, PC SYSTEM Date of Test 2008/01/18 Test Site No.3 Shielded Room Item Amount of Discharge Voltage Required Criteria Complied To Criteria (A,,C) Results Air Discharge 10 10 +8kV -8kV Pass Pass Contact Discharge 25 25 +4kV -4kV Pass Pass Indirect Discharge 50 +4kV Pass (HCP) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Front) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Left) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP ack) 50-4kV Pass Indirect Discharge 50 +4kV Pass (VCP Right) 50-4kV Pass Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points. Page: 75 of 126

7.7. Test Photograph Test Mode : Mode 1: Normal Operation, Adp DSA-0131F-12 Description : ESD Test Setup Test Mode : Mode 2: Normal Operation, Adp SYS1298-1305-W2 Description : ESD Test Setup Page: 76 of 126

Test Mode : Mode 3: Normal Operation, PC SYSTEM Description : ESD Test Setup Page: 77 of 126

8. Radiated Susceptibility 8.1. Test Specification According to Standard : IEC 61000-4-3 8.2. Test Setup 8.3. Limit Item Environmental Units Test Performance Phenomena Specification Criteria Enclosure Port Radio-Frequency MHz 80-1000 Electromagnetic Field Amplitude Modulated V/m(Un-modulated, rms) % AM (1kHz) 3 80 A Page: 78 of 126

8.4. Test Procedure The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. oth horizontal and vertical polarization of the antenna and four sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD camera is used to monitor EUT screen. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 3 V/m Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 80MHz - 1000MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s 8.5. Deviation from Test Standard No deviation. Page: 79 of 126

8.6. Test Result Product GV-IO System V3 Test Item Test Mode Radiated susceptibility Mode 1: Normal Operation, Adp DSA-0131F-12 Date of Test 2007/12/31 Test Site Chamber5 Field Complied To Frequency Position Polarity Required Strength Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,,C) Results 80-1000 FRONT H 3 A A PASS 80-1000 FRONT V 3 A A PASS 80-1000 ACK H 3 A A PASS 80-1000 ACK V 3 A A PASS 80-1000 RIGHT H 3 A A PASS 80-1000 RIGHT V 3 A A PASS 80-1000 LEFT H 3 A A PASS 80-1000 LEFT V 3 A A PASS 80-1000 UP H 3 A A PASS 80-1000 UP V 3 A A PASS 80-1000 DOWN H 3 A A PASS 80-1000 DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 80 of 126

Product GV-IO System V3 Test Item Radiated susceptibility Test Mode Mode 2: Normal Operation, Adp SYS1298-1305-W2 Date of Test 2007/12/31 Test Site Chamber5 Field Complied To Frequency Position Polarity Required Strength Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,,C) Results 80-1000 FRONT H 3 A A PASS 80-1000 FRONT V 3 A A PASS 80-1000 ACK H 3 A A PASS 80-1000 ACK V 3 A A PASS 80-1000 RIGHT H 3 A A PASS 80-1000 RIGHT V 3 A A PASS 80-1000 LEFT H 3 A A PASS 80-1000 LEFT V 3 A A PASS 80-1000 UP H 3 A A PASS 80-1000 UP V 3 A A PASS 80-1000 DOWN H 3 A A PASS 80-1000 DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 81 of 126

Product GV-IO System V3 Test Item Radiated susceptibility Test Mode Mode 3: Normal Operation, PC SYSTEM Date of Test 2007/12/31 Test Site Chamber5 Field Complied To Frequency Position Polarity Required Strength Criteria (MHz) (Angle) (H or V) Criteria (V/m) (A,,C) Results 80-1000 FRONT H 3 A A PASS 80-1000 FRONT V 3 A A PASS 80-1000 ACK H 3 A A PASS 80-1000 ACK V 3 A A PASS 80-1000 RIGHT H 3 A A PASS 80-1000 RIGHT V 3 A A PASS 80-1000 LEFT H 3 A A PASS 80-1000 LEFT V 3 A A PASS 80-1000 UP H 3 A A PASS 80-1000 UP V 3 A A PASS 80-1000 DOWN H 3 A A PASS 80-1000 DOWN V 3 A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at at frequency MHz. No false alarms or other malfunctions were observed during or after the test. V/m Page: 82 of 126

8.7. Test Photograph Test Mode : Mode 1: Normal Operation, Adp DSA-0131F-12 Description : Radiated Susceptibility Test Setup Test Mode : Mode 2: Normal Operation, Adp SYS1298-1305-W2 Description : Radiated Susceptibility Test Setup Page: 83 of 126

Test Mode : Mode 3: Normal Operation, PC SYSTEM Description : Radiated Susceptibility Test Setup Page: 84 of 126

9. Electrical Fast Transient/urst 9.1. Test Specification According to Standard : IEC 61000-4-4 9.2. Test Setup 9.3. Limit Item Environmental Phenomena I/O and communication ports Fast Transients Common Mode Input DC Power Ports Fast Transients Common Mode Input AC Power Ports Fast Transients Common Mode Units kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz kv (Peak) Tr/Th ns Rep. Frequency khz Test Specification Performance Criteria +0.5 5/50 5 +0.5 5/50 5 +1 5/50 5 Page: 85 of 126

9.4. Test Procedure The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on the table, and uses a 0.1m insulation between the EUT and ground reference plane. The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and projected beyond the EUT by at least 0.1m on all sides. Test on I/O and communication ports: The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1minute. Test on power supply ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT/ interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 minute. The length of the signal and power lines between the coupling device and the EUT is 0.5m. 9.5. Deviation from Test Standard No deviation. Page: 86 of 126

9.6. Test Result Product GV-IO System V3 Test Item Test Mode Electrical fast transient/burst Mode 1: Normal Operation, Adp DSA-0131F-12 Date of Test 2008/01/30 Test Site No.2 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L + N + PE ± 1kV 60 CDN A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 87 of 126

Product GV-IO System V3 Test Item Electrical fast transient/burst Test Mode Mode 2: Normal Operation, Adp SYS1298-1305-W2 Date of Test 2008/01/30 Test Site No.2 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L + N + PE ± 1kV 60 CDN A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 88 of 126

Product GV-IO System V3 Test Item Electrical fast transient/burst Test Mode Mode 3: Normal Operation, PC SYSTEM Date of Test 2008/01/30 Test Site No.2 Shielded Room Inject Line Polarity Voltage kv Inject Time (Second) Inject Method Required Criteria Complied to Criteria Result L + N + PE ± 1kV 60 CDN A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line. No false alarms or other malfunctions were observed during or after the test. kv of Page: 89 of 126

9.7. Test Photograph Test Mode : Mode 1: Normal Operation, Adp DSA-0131F-12 Description : EFT/ Test Setup Test Mode : Mode 2: Normal Operation, Adp SYS1298-1305-W2 Description : EFT/ Test Setup Page: 90 of 126

Test Mode : Mode 3: Normal Operation, PC SYSTEM Description : EFT/ Test Setup Page: 91 of 126

10. Surge 10.1. Test Specification According to Standard : IEC 61000-4-5 10.2. Test Setup 10.3. Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports(See 1) and 2) ) Surges Tr/Th us Line to Ground kv Input DC Power Ports Surges Tr/Th us Line to Ground kv AC Input and AC Output Power Ports Surges Tr/Th us Line to Line kv Line to Ground kv Notes: Test Specification Performance Criteria 1.2/50 (8/20) ± 1 1.2/50 (8/20) ± 0.5 1.2/50 (8/20) ± 1 ± 2 1) Applicable only to ports which according to the manufacturer s may directly to outdoor cables. 2) Where normal functioning cannot be achieved because of the impact of the CDN on the EUT, no immunity test shall be required. Page: 92 of 126

10.4. Test Procedure The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Input and Output AC Power or DC Input and DC Output Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 0 0, 90 0, 180 0, 270 0 and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min. 10.5. Deviation from Test Standard No deviation. Page: 93 of 126

10.6. Test Result Product GV-IO System V3 Test Item Test Mode Surge Mode 1: Normal Operation, Adp DSA-0131F-12 Date of Test 2008/01/04 Test Site No.2 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 0 1kV 60 Direct A PASS L-N ± 90 1kV 60 Direct A PASS L-N ± 180 1kV 60 Direct A PASS L-N ± 270 1kV 60 Direct A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 94 of 126

Product GV-IO System V3 Test Item Surge Test Mode Mode 2: Normal Operation, Adp SYS1298-1305-W2 Date of Test 2008/01/04 Test Site No.2 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 0 1kV 60 Direct A PASS L-N ± 90 1kV 60 Direct A PASS L-N ± 180 1kV 60 Direct A PASS L-N ± 270 1kV 60 Direct A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 95 of 126

Product GV-IO System V3 Test Item Surge Test Mode Mode 3: Normal Operation, PC SYSTEM Date of Test 2008/01/04 Test Site No.2 Shielded Room Inject Line Polarity Angle Voltage kv Time Interval (Second) Inject Method Required Criteria Complied to Criteria Result L-N ± 0 1kV 60 Direct A PASS L-N ± 90 1kV 60 Direct A PASS L-N ± 180 1kV 60 Direct A PASS L-N ± 270 1kV 60 Direct A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. Page: 96 of 126

10.7. Test Photograph Test Mode : Mode 1: Normal Operation, Adp DSA-0131F-12 Description : SURGE Test Setup Test Mode : Mode 2: Normal Operation, Adp SYS1298-1305-W2 Description : SURGE Test Setup Page: 97 of 126

Test Mode : Mode 3: Normal Operation, PC SYSTEM Description : SURGE Test Setup Page: 98 of 126

11. Conducted Susceptibility 11.1. Test Specification According to Standard : IEC 61000-4-6 11.2. Test Setup CDN Test Mode EM Clamp Test Mode Page: 99 of 126

11.3. Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports Radio-Frequency Continuous Conducted Input DC Power Ports Radio-Frequency Continuous Conducted Input AC Power Ports Radio-Frequency Continuous Conducted 11.4. Test Procedure MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) MHz V (rms, Un-modulated) % AM (1kHz) Test Specification 0.15-80 3 80 0.15-80 3 80 0.15-80 3 80 Performance Criteria A A A The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 130duV(3V) Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 0.15MHz 80MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s 11.5. Deviation from Test Standard No deviation. Page: 100 of 126

11.6. Test Result Product GV-IO System V3 Test Item Test Mode Conducted susceptibility Mode 1: Normal Operation, Adp DSA-0131F-12 Date of Test 2007/12/31 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performance Result Range Applied Method of Criteria Criteria (MHz) duv(v) EUT Complied To 0.15~80 130 (3V) CDN AC IN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at duv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 101 of 126

Product GV-IO System V3 Test Item Conducted susceptibility Test Mode Mode 2: Normal Operation, Adp SYS1298-1305-W2 Date of Test 2007/12/31 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performance Result Range Applied Method of Criteria Criteria (MHz) duv(v) EUT Complied To 0.15~80 130 (3V) CDN AC IN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at duv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 102 of 126

Product GV-IO System V3 Test Item Conducted susceptibility Test Mode Mode 3: Normal Operation, PC SYSTEM Date of Test 2007/12/31 Test Site No.6 Shielded Room Frequency Voltage Inject Tested Port Required Performance Result Range Applied Method of Criteria Criteria (MHz) duv(v) EUT Complied To 0.15~80 130 (3V) CDN AC IN A A PASS Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at duv(v) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 103 of 126

11.7. Test Photograph Test Mode : Mode 1: Normal Operation, Adp DSA-0131F-12 Description : Conducted Susceptibility Test Setup Test Mode : Mode 2: Normal Operation, Adp SYS1298-1305-W2 Description : Conducted Susceptibility Test Setup Page: 104 of 126

Test Mode : Mode 3: Normal Operation, PC SYSTEM Description : Conducted Susceptibility Test Setup Page: 105 of 126

12. Power Frequency Magnetic Field 12.1. Test Specification According to Standard : IEC 61000-4-8 12.2. Test Setup 12.3. Limit Item Environmental Phenomena Enclosure Port Power-Frequency Magnetic Field 12.4. Test Procedure Units Hz A/m (r.m.s.) Test Specification Performance Criteria 50 1 A The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured at least 1m*1m min. The test magnetic field shall be placed at central of the induction coil. The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT. And the induction coil shall be rotated by 90 in order to expose the EUT to the test field with different orientation (X, Y, Z Orientations). 12.5. Deviation from Test Standard No deviation. Page: 106 of 126

12.6. Test Result Product GV-IO System V3 Test Item Test Mode Power frequency magnetic field Mode 1: Normal Operation, Adp DSA-0131F-12 Date of Test 2007/12/31 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 107 of 126

Product GV-IO System V3 Test Item Power frequency magnetic field Test Mode Mode 2: Normal Operation, Adp SYS1298-1305-W2 Date of Test 2007/12/31 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 108 of 126

Product GV-IO System V3 Test Item Power frequency magnetic field Test Mode Mode 3: Normal Operation, PC SYSTEM Date of Test 2007/12/31 Test Site No.3 Shielded Room Polarization Frequency Magnetic Required Performance Test Result (Hz) Strength Performance Criteria (A/m) Criteria Complied To X Orientation 50 1 A A PASS Y Orientation 50 1 A A PASS Z Orientation 50 1 A A PASS Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 109 of 126

12.7. Test Photograph Test Mode : Mode 1: Normal Operation, Adp DSA-0131F-12 Description : Power Frequency Magnetic Field Test Setup Test Mode : Mode 2: Normal Operation, Adp SYS1298-1305-W2 Description : Power Frequency Magnetic Field Test Setup Page: 110 of 126

Test Mode : Mode 3: Normal Operation, PC SYSTEM Description : Power Frequency Magnetic Field Test Setup Page: 111 of 126

13. Voltage Dips and Interruption 13.1. Test Specification According to Standard : IEC 61000-4-11 13.2. Test Setup 13.3. Limit Item Environmental Phenomena Input AC Power Ports Voltage Dips Voltage Interruptions Units % Reduction Period % Reduction Period % Reduction Period Test Specification Performance Criteria 30 C 25 >95 0.5 > 95 C 250 Page: 112 of 126

13.4. Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The power cord shall be used the shortest power cord as specified by the manufacturer. For Voltage Dips/ Interruptions test: The selection of test voltage is based on the rated power range. If the operation range is large than 20% of lower power range, both end of specified voltage shall be tested. Otherwise, the typical voltage specification is selected as test voltage. The EUT is connected to the power mains through a coupling device that directly couples to the Voltage Dips and Interruption Generator. The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25 Periods, for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of three voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied voltage and duration 250 Periods with a sequence of three voltage interruptions with intervals of 10 seconds. Voltage phase shifting are shall occur at 0 0, 45 0, 90 0,135 0,180 0,225 0, 270 0,315 0 of the voltage. 13.5. Deviation from Test Standard No deviation. Page: 113 of 126

13.6. Test Result Product GV-IO System V3 Test Item Test Mode Voltage dips and interruption Mode 1: Normal Operation, Adp DSA-0131F-12 Date of Test 2008/01/04 Test Site No.2 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Page: 114 of 126 Required Performance Criteria Performance Criteria Complied To Test Result 30(161V) 0 25 C A PASS 30(161V) 45 25 C A PASS 30(161V) 90 25 C A PASS 30(161V) 135 25 C A PASS 30(161V) 180 25 C A PASS 30(161V) 225 25 C A PASS 30(161V) 270 25 C A PASS 30(161V) 315 25 C A PASS >95(0V) 0 0.5 A PASS >95(0V) 45 0.5 A PASS >95(0V) 90 0.5 A PASS >95(0V) 135 0.5 A PASS >95(0V) 180 0.5 A PASS >95(0V) 225 0.5 A PASS >95(0V) 270 0.5 A PASS >95(0V) 315 0.5 A PASS >95(0V) 0 250 C C PASS >95(0V) 45 250 C C PASS >95(0V) 90 250 C C PASS >95(0V) 135 250 C C PASS >95(0V) 180 250 C C PASS >95(0V) 225 250 C C PASS >95(0V) 270 250 C C PASS >95(0V) 315 250 C C PASS Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test.

Product GV-IO System V3 Test Item Voltage dips and interruption Test Mode Mode 2: Normal Operation, Adp SYS1298-1305-W2 Date of Test 2008/01/04 Test Site No.2 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Criteria Complied To Test Result 30(161V) 0 25 C A PASS 30(161V) 45 25 C A PASS 30(161V) 90 25 C A PASS 30(161V) 135 25 C A PASS 30(161V) 180 25 C A PASS 30(161V) 225 25 C A PASS 30(161V) 270 25 C A PASS 30(161V) 315 25 C A PASS >95(0V) 0 0.5 A PASS >95(0V) 45 0.5 A PASS >95(0V) 90 0.5 A PASS >95(0V) 135 0.5 A PASS >95(0V) 180 0.5 A PASS >95(0V) 225 0.5 A PASS >95(0V) 270 0.5 A PASS >95(0V) 315 0.5 A PASS >95(0V) 0 250 C C PASS >95(0V) 45 250 C C PASS >95(0V) 90 250 C C PASS >95(0V) 135 250 C C PASS >95(0V) 180 250 C C PASS >95(0V) 225 250 C C PASS >95(0V) 270 250 C C PASS >95(0V) 315 250 C C PASS Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 115 of 126

Product GV-IO System V3 Test Item Voltage dips and interruption Test Mode Mode 3: Normal Operation, PC SYSTEM Date of Test 2008/01/04 Test Site No.2 Shielded Room Voltage Dips and Interruption Reduction(%) Angle Test Duration (Periods) Required Performance Criteria Performance Criteria Complied To Test Result 30(161V) 0 25 C A PASS 30(161V) 45 25 C A PASS 30(161V) 90 25 C A PASS 30(161V) 135 25 C A PASS 30(161V) 180 25 C A PASS 30(161V) 225 25 C A PASS 30(161V) 270 25 C A PASS 30(161V) 315 25 C A PASS >95(0V) 0 0.5 A PASS >95(0V) 45 0.5 A PASS >95(0V) 90 0.5 A PASS >95(0V) 135 0.5 A PASS >95(0V) 180 0.5 A PASS >95(0V) 225 0.5 A PASS >95(0V) 270 0.5 A PASS >95(0V) 315 0.5 A PASS >95(0V) 0 250 C C PASS >95(0V) 45 250 C C PASS >95(0V) 90 250 C C PASS >95(0V) 135 250 C C PASS >95(0V) 180 250 C C PASS >95(0V) 225 250 C C PASS >95(0V) 270 250 C C PASS >95(0V) 315 250 C C PASS Meet criteria A: Operate as intended during and after the test Meet criteria : Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kv of Line. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 116 of 126

13.7. Test Photograph Test Mode : Mode 1: Normal Operation, Adp DSA-0131F-12 Description : Voltage Dips Test Setup Test Mode : Mode 2: Normal Operation, Adp SYS1298-1305-W2 Description : Voltage Dips Test Setup Page: 117 of 126

Test Mode : Mode 3: Normal Operation, PC SYSTEM Description : Voltage Dips Test Setup Page: 118 of 126

14. Attachment EUT Photograph (1) EUT Photo (2) EUT Photo Page: 119 of 126

(3) EUT Photo (4) EUT Photo Page: 120 of 126

(5) EUT Photo (6) EUT Photo Page: 121 of 126

(7) EUT Photo (8) EUT Photo Page: 122 of 126

(9) EUT Photo (10) EUT Photo Page: 123 of 126

(11) EUT Photo (12) EUT Photo Page: 124 of 126

(13) EUT Photo (14) EUT Photo Page: 125 of 126

(15) EUT Photo (16) EUT Photo Page: 126 of 126

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