NP160N04TUK. Data Sheet MOS FIELD EFFECT TRANSISTOR. Description. Features. Ordering Information. Absolute Maximum Ratings (TA=25 C)

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MOS FIELD EFFECT TRANSISTOR Data Sheet R07DS0543EJ0200 Rev. 2.00 Description NP160N04TUK is N-channel MOS Field Effect Transistor designed for high current switching applications. Features Super low on-state resistance RDS(on) = 1.5 m MAX. ( VGS = 10 V, ID = 80 A ) Low Ciss Ciss = 7200 pf TYP. ( VDS = 25 V ) Designed for automotive application and AEC-Q101 qualified Ordering Information Part No. Lead Plating Packing Package NP160N04TUK-E1-AY *1 Pure Sn (Tin) Tape 800 p/reel Taping (E1 type) TO-263-7pin(MP-25ZT) NP160N04TUK-E2-AY *1 Taping (E2 type) Note: 1. Pb-free (This product does not contain Pb in the external electrode.) Absolute Maximum Ratings (TA=25 C) Item Symbol Ratings Unit Drain to Source Voltage (VGS = 0 V) VDSS 40 V Gate to Source Voltage (VDS = 0 V) VGSS ±20 V Drain Current (DC) (TC = 25 C) ID(DC) ±160 A Drain Current (pulse) *1, 3 ID(pulse) ±640 A Total Power Dissipation (TC = 25 C) PT1 250 W Total Power Dissipation (TA = 25 C) PT2 1.8 W Channel Temperature Tch 175 C Storage Temperature Tstg -55 to 175 C Repetitive Avalanche Current *2, 3 IAR 56 A Repetitive Avalanche Energy *2, 3 EAR 313 mj Thermal Resistance Channel to Case Thermal Resistance Rth(ch-C) *3 0.60 C/W Channel to Ambient Thermal Resistance Rth(ch-A) *3 83.3 C/W Notes *1. TC = 25 C, PW 10 μ s, Duty Cycle 1% *2. RG = 25 Ω, VGS = 20 0 V *3. Not subject of production test. Verified by design/characterization. R07DS0543EJ0200 Rev.2.00 Page 1 of 6

Electrical Characteristics (TA=25 C) Item Symbol Min Typ Max Unit Test Conditions Zero Gate Voltage Drain Current I DSS 1 A VDS = 40 V, VGS = 0 V Gate Leakage Current I GSS ±100 na VGS = 20 V, VDS = 0 V Gate to Source Threshold Voltage V GS(th) 2.0 3.0 4.0 V VDS = VGS, ID = 250 A Forward Transfer Admittance *1 y fs 60 120 S VDS = 5 V, ID = 80 A Drain to Source On-state R DS(on) 1.25 1.50 m VGS = 10 V, ID = 80 A Resistance *1 Input Capacitance *2 C iss 7200 10800 pf VDS = 25 V Output Capacitance *2 C oss 1040 1560 pf VGS = 0 V Reverse Transfer Capacitance *2 C rss 390 710 pf f = 1 MHz Turn-on Delay Time *2 t d(on) 30 70 ns VDD = 20 V, ID = 80 A Rise Time *2 t r 16 40 ns VGS = 10 V Turn-off Delay Time *2 t d(off) 100 200 ns RG = 0 Fall Time *2 t f 13 40 ns Total Gate Charge *2 Q G 126 189 nc VDD = 32 V Gate to Source Charge Q GS 32 nc VGS = 10 V Gate to Drain Charge Q GD 31 nc ID = 160 A Body Diode Forward Voltage *1 V F(S-D) 0.9 1.5 V IF = 160 A, VGS = 0 V Reverse Recovery Time t rr 62 ns IF = 160 A, VGS = 0 V Reverse Recovery Charge Q rr 110 nc di/dt = 100 A/ s Note. *1 Pulse test Note. *2 Not subject of production test. Verified by design/characterization. R07DS0543EJ0200 Rev.2.00 Page 2 of 6

DERATING FACTOR OF FORWARD BIAS SAFE OPERATING AREA TOTAL POWER DISSIPATION vs. CASE TEMPERATURE 120 dt - Percentage of Rated Power - % 100 80 60 40 20 0 0 50 100 150 200 Pt Total Power Dissipation - W T C - Case Temperature - C T C - Case Temperature - C FORWARD BIAS SAFE OPERATING AREA ID - Drain Current - A V DS - Drain to Source Voltage V TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH Rth(t) - Transient Thermal Resistance - C/W 100 1 m 10 m 100 m 1 10 100 1000 PW - Pulse Width - s R07DS0543EJ0200 Rev.2.00 Page 3 of 6

DRAIN CURRENT vs. DRAIN TO SOURCE VOLTAGE FORWARD TRANSFER CHARACTERISTICS ID - Drain Current - A ID - Drain Current - A V DS - Drain to Source Voltage - V V GS - Gate to Source Voltage - V GATE TO SOURCE THRESHOLD VOLTAGE vs. CHANNEL TEMPERATURE FORWARD TRANSFER ADMITTANCE vs. CURRENT DRAIN VGS(th) Gate to Source Threshold Voltage - V T ch - Channel Temperature - C yfs - Forward Transfer Admittance - S I D - Drain Current - A DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT DRAIN TO SOURCE ON-STATE RESISTANCE vs. GATE TO SOURCE VOLTAGE RDS(on) - Drain to Source On-state Resistance - m I D - Drain Current - A RDS(on) - Drain to Source On-state Resistance - m V GS - Gate to Source Voltage - V R07DS0543EJ0200 Rev.2.00 Page 4 of 6

DRAIN TO SOURCE ON-STATE RESISTANCE vs. CHANNEL TEMPERATURE CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE RDS(on) - Drain to Source On-state Resistance - m T ch - Channel Temperature - C Ciss, Coss, Crss - Capacitance - pf V DS - Drain to Source Voltage - V SWITCHING CHARACTERISTICS DYNAMIC INPUT CHARACTERISTICS td(on),tr,td(off),tr Switching Time - ns VDS - Drain to Source Voltage - V VGS - Gate to Source Voltage - V I D - Drain Current - A Q G - Gate Charge - nc SOURCE TO DRAIN DIODE FORWARD VOLTAGE REVERSE RECOVERY TIME vs. DRAIN CURRENT IF - Diode Forward Current - A trr Reverse Recovery Time - ns V F(S-D) - Source to Drain Voltage - V I F - Drain Current - A R07DS0543EJ0200 Rev.2.00 Page 5 of 6

Package Dimensions Package Name MASS (Typ.) Unit : mm TO-263-7pin (MP-25ZT) - Drain Gate Body Diode Source Equivalent circuit Remark: Strong electric field, when exposed to this device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it once, when it has occurred. R07DS0543EJ0200 Rev.2.00 Page 6 of 6

Revision History NP180N04TUK Preliminary Datasheet Rev. Date Page 0.01 Apr 26, 2010-1st edition 2.00 May 24,2018 1 2 Note 3 was added Note 2 was added Description Summary All trademarks and registered trademarks are the property of their respective owners. C - 1

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