2SA1743 SILICON POWER TRANSISTOR DATA SHEET PNP SILICON EPITAXIAL TRANSISTOR FOR HIGH-SPEED SWITCHING. PACKAGE DRAWING (UNIT: mm) FEATURES

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DATA SHEET SILICON POWER TRANSISTOR 2SA1743 PNP SILICON EPITAXIAL TRANSISTOR FOR HIGH-SPEED SWITCHING The 2SA1743 is a power transistor developed for high-speed switching and features a high hfe at low VCE(sat). This transistor is ideal for use as a driver in DC/DC converters and actuators. In addition, a small resin-molded insulation type package contributes to high-density mounting and reduction of mounting cost. PACKAGE DRAWING (UNIT: mm) FEATURES High hfe and low VCE(sat): hfe 100 (VCE = 2 V, IC = 2 A) V CE(sat) 0.3 V (IC = 6 A, IB = 0.3 A) Full-mold package that does not require an insulating board or bushing QUALITY GRADES Standard Please refer to Quality Grades on NEC Semiconductor Devices (Document No. C11531E) published by NEC Corporation to know the specification of quality grade on the devices and its recommended applications. Electrode Connection 1. Base 2. Collector 3. Emitter ABSOLUTE MAXIMUM RATINGS (Ta = 25 C) Parameter Symbol Ratings Unit Collector to base voltage VCBO 100 V Collector to emitter voltage VCEO 60 V Emitter to base voltage VEBO 7.0 V Collector current (DC) IC(DC) 10 A Collector current (pulse) IC(pulse)* 20 A Base current (DC) IB(DC) 5.0 A Total power dissipation PT (Tc = 25 C) 30 W Total power dissipation PT (Ta = 25 C) 2.0 W Junction temperature Tj 150 C Storage temperature Tstg 55 to +150 C *PW 300 µs, duty cycle 10% The information in this document is subject to change without notice. Before using this document, please confirm that this is the latest version. Not all devices/types available in every country. Please check with local NEC representative for availability and additional information. Document No. D16126EJ1V0DS00 (1st edition) Date Published April 2002 N CP(K) Printed in Japan 2002

ELECTRICAL CHARACTERISTICS (Ta = 25 C) Parameter Symbol Conditions MIN. TYP. MAX. Unit Collector to emitter voltage VCEO(SUS) IC = 6.0 A, IB = 0.6 A, L = 1 mh 60 V Collector to emitter voltage VCEX(SUS) IC = 6.0 A, IB1 = IB2 = 0.6 A, VBE(OFF) = 1.5 V, L = 180 µh, clamped 60 V Collector cutoff current ICBO VCB = 60 V, IE = 0 10 µa Collector cutoff current ICER VCE = 60 V, RBE = 50 Ω, Ta = 125 C 1.0 ma Collector cutoff current ICEX1 VCE = 60 V, VBE(OFF) = 1.5 V 10 µa Collector cutoff current ICEX2 VCE = 60 V, VBE(OFF) = 1.5 V, Ta = 125 C 1.0 ma Emitter cutoff current IEBO VEB = 5.0 V, IC = 0 10 µa DC current gain hfe1* VCE = 2.0 V, IC = 1.0 A 100 DC current gain hfe2* VCE = 2.0 V, IC = 2.0 A 100 400 DC current gain hfe3* VCE = 2.0 V, IC = 6.0 A 60 Collector saturation voltage VCE(sat)1* IC = 6.0 A, IB = 0.3 A 0.3 V Collector saturation voltage VCE(sat)2* IC = 8.0 A, IB = 0.4 A 0.5 V Base saturation voltage VBE(sat)1* IC = 6.0 A, IB = 0.3 A 1.2 V Base saturation voltage VBE(sat)2* IC = 8.0 A, IB = 0.4 A 1.5 V Collector capacitance Cob VCB = 10 V, IE = 0, f = 1.0 MHz 230 pf Gain bandwidth product ft VCE = 10 V, IC = 1.0 A 80 MHz Turn-on time ton IC = 6.0 A, RL = 8.3 Ω, 0.3 µs Storage time tstg IB1 = IB2 = 0.3 A, VCC 50 V Refer to the test circuit. 1.5 µs Fall time tf 0.3 µs * Pulse test PW 350 µs, duty cycle 2% hfe CLASSIFICATION Marking M L K hfe2 100 to 200 150 to 300 200 to 400 SWITCHING TIME (ton, tstg, tf) TEST CIRCUIT Base current waveform Collector current waveform 2 Data Sheet D16126EJ1V0DS

TYPICAL CHARACTERISTICS (Ta = 25 C) Total Power Dissipation PT (W) Case Temperature TC ( C) IC Derating dt (%) Case Temperature TC ( C) Single pulse Collector to Emitter Voltage VCE (V) Collector to Emitter Voltage VCE (V) Transient Thermal Resistance Rth(j c) ( C/W) Pulse Width PW (s) Without heatsink With infinite heatsink Data Sheet D16126EJ1V0DS 3

Pulse test Base Saturation Voltage VBE(sat) (V) Collector Saturation Voltage VCE(sat) (V) Pulse test Collector Capacitance Cob (pf) Fall Time tf (µs) StorageTime tstg (µs) Turn-On Time ton (µs) DC Current Gain hfe Collector to Emitter Voltage VCE (V) Gain Bandwidth Product ft (MHz) Collector to Base Voltage VCB (V) 4 Data Sheet D16126EJ1V0DS

[MEMO] Data Sheet D16126EJ1V0DS 5

The information in this document is current as of July, 2001. The information is subject to change without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products and/or types are available in every country. Please check with an NEC sales representative for availability and additional information. No part of this document may be copied or reproduced in any form or by any means without prior written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document. NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from the use of NEC semiconductor products listed in this document or any other liability arising from the use of such products. No license, express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC or others. Descriptions of circuits, software and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples. The incorporation of these circuits, software and information in the design of customer's equipment shall be done under the full responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third parties arising from the use of these circuits, software and information. While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize risks of damage to property or injury (including death) to persons arising from defects in NEC semiconductor products, customers must incorporate sufficient safety measures in their design, such as redundancy, fire-containment, and anti-failure features. NEC semiconductor products are classified into the following three quality grades: "Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products developed based on a customer-designated "quality assurance program" for a specific application. The recommended applications of a semiconductor product depend on its quality grade, as indicated below. Customers must check the quality grade of each semiconductor product before using it in a particular application. "Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots "Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support) "Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems and medical equipment for life support, etc. The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness to support a given application. (Note) (1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries. (2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for NEC (as defined above). M8E 00. 4

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