EE351 Laboratory Exercise 4 Field Effect Transistors

Similar documents
EE351 Laboratory Exercise 1 Diode Circuits

Electronic Circuits II - Revision

ET Training. Electronics: JFET Instructor: H.Pham. The JUNCTION FIELF EFFECT TRANSISTOR (JFET) n channel JFET p channel JFET

JFET 101, a Tutorial Look at the Junction Field Effect Transistor 8May 2007, edit 2April2016, Wes Hayward, w7zoi

EE 330 Laboratory 8 Discrete Semiconductor Amplifiers

Lab 5: FET circuits. 5.1 FET Characteristics

Electronics I. Last Time

Chapter 8: Field Effect Transistors

Lab 6: MOSFET AMPLIFIER

EE431 Lab 1 Operational Amplifiers

EE 230 Lab Lab 9. Prior to Lab

Basic Electronics Prof. Dr. Chitralekha Mahanta Department of Electronics and Communication Engineering Indian Institute of Technology, Guwahati

Experiment#: 8. The JFET Characteristics & DC Biasing. Electronics (I) Laboratory. The Hashemite University. Faculty of Engineering

ECE 310L : LAB 9. Fall 2012 (Hay)

LAB 4 : FET AMPLIFIERS

Curve Tracer Laboratory Assistant Using the Analog Discovery Module as A Curve Tracer

Physics 120 Lab 6 (2018) - Field Effect Transistors: Ohmic Region

FIELD EFFECT TRANSISTORS

HomeBrew RF Siganl Generator FET Follower

Lecture (03) The JFET

UNIVERSITY OF UTAH ELECTRICAL ENGINEERING DEPARTMENT

EE 330 Laboratory 8 Discrete Semiconductor Amplifiers

Electronic Circuits. Junction Field-effect Transistors. Dr. Manar Mohaisen Office: F208 Department of EECE

Field - Effect Transistor

ELEC 2210 EXPERIMENT 8 MOSFETs

Electronics 1 Lab (CME 2410) School of Informatics & Computing German Jordanian University Laboratory Experiment (10) Junction FETs

Phy 335, Unit 4 Transistors and transistor circuits (part one)

Resonant Frequency of the LRC Circuit (Power Output, Voltage Sensor)

Unit III FET and its Applications. 2 Marks Questions and Answers

E B C. Two-Terminal Behavior (For testing only!) TO-92 Case Circuit Symbol

UNIVERSITY OF NORTH CAROLINA AT CHARLOTTE Department of Electrical and Computer Engineering

Experiment 5 Single-Stage MOS Amplifiers

The Common Source JFET Amplifier

ELEG 309 Laboratory 4

EXPERIMENT 3 Half-Wave and Full-Wave Rectification

4 Transistors. 4.1 IV Relations

UNIT 3: FIELD EFFECT TRANSISTORS

8. Characteristics of Field Effect Transistor (MOSFET)

DISCUSSION The best way to test a transistor is to connect it in a circuit that uses the transistor.

ENEE 307 Laboratory#2 (n-mosfet, p-mosfet, and a single n-mosfet amplifier in the common source configuration)

Name: Date: Score: / (75)

Shankersinh Vaghela Bapu Institute of Technology INDEX

Chapter 8: Field Effect Transistors

Exercise 2: Collector Current Versus Base Current

Electronic Devices. Floyd. Chapter 9. Ninth Edition. Electronic Devices, 9th edition Thomas L. Floyd

Real Analog - Circuits 1 Chapter 1: Lab Projects

VTU NOTES QUESTION PAPERS NEWS RESULTS FORUMS TESTING OF DIODE CLIPPING CIRCUITS

UNIVERSITY OF TECHNOLOGY, JAMAICA School of Engineering -

DEPARTMENT OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCE MASSACHUSETTS INSTITUTE OF TECHNOLOGY CAMBRIDGE, MASSACHUSETTS 02139

UNIVERSITY OF TECHNOLOGY, JAMAICA SCHOOL OF ENGENEERING. Electrical Engineering Science. Laboratory Manual

The Field Effect Transistor

Dev Bhoomi Institute Of Technology Department of Electronics and Communication Engineering PRACTICAL INSTRUCTION SHEET

EXPERIMENT 7: DIODE CHARACTERISTICS AND CIRCUITS 10/24/10

LAB 8: Activity P52: LRC Circuit

Electric Circuit Fall 2017 Lab3 LABORATORY 3. Diode. Guide

55:041 Electronic Circuits

Frequently Asked Questions

ANALOG FUNDAMENTALS C. Topic 4 BASIC FET AMPLIFIER CONFIGURATIONS

FET Biasing. Electronic Circuit Design ME /8/2013. Spring Chapter 2. Chapter Contents. Course Support

CHAPTER 8 FIELD EFFECT TRANSISTOR (FETs)

Revised: Summer 2010

Piecewise Linear Circuits

EE311: Electrical Engineering Junior Lab, Fall 2006 Experiment 4: Basic MOSFET Characteristics and Analog Circuits

PHYSICS 330 LAB Operational Amplifier Frequency Response

Q1. Explain the construction and principle of operation of N-Channel and P-Channel Junction Field Effect Transistor (JFET).

EE320L Electronics I. Laboratory. Laboratory Exercise #2. Basic Op-Amp Circuits. Angsuman Roy. Department of Electrical and Computer Engineering

Field Effect Transistors

Federal Urdu University of Arts, Science & Technology Islamabad Pakistan SECOND SEMESTER ELECTRONICS - I

Experiment 6: Biasing Circuitry

COLLECTOR DRAIN BASE GATE EMITTER. Applying a voltage to the Gate connection allows current to flow between the Drain and Source connections.

EE 2274 MOSFET BASICS

ENG 100 Lab #2 Passive First-Order Filter Circuits

EE2210 Laboratory Project 1 Fall 2013 Function Generator and Oscilloscope

EE 2274 DIODE OR GATE & CLIPPING CIRCUIT

Laboratory #4: Solid-State Switches, Operational Amplifiers Electrical and Computer Engineering EE University of Saskatchewan

EE320L Electronics I. Laboratory. Laboratory Exercise #6. Current-Voltage Characteristics of Electronic Devices. Angsuman Roy

Transmit filter designs for ADSL modems

ECE4902 C Lab 7

~ s ~?en Mos FETA ~S \ B. 1pf ]) ~~D. :Jg F~ T~ [E~] 4 ~ ;tq 5~, td D G-1 G-1 . LD S~B. N~ p~ (;. I.PJ

EE70 - Intro. Electronics

ECE3042 Lab Report and Homework Guidelines. Homework. Lab Report

EE4902 C Lab 7

Experiment P45: LRC Circuit (Power Amplifier, Voltage Sensor)

4.2.2 Metal Oxide Semiconductor Field Effect Transistor (MOSFET)

Chapter 5: Field Effect Transistors

THE JFET. Script. Discuss the JFET and how it differs from the BJT. Describe the basic structure of n-channel and p -channel JFETs

BME/ISE 3512 Bioelectronics. Laboratory Five - Operational Amplifiers

Başkent University Department of Electrical and Electronics Engineering EEM 311 Electronics II Experiment 8 OPERATIONAL AMPLIFIERS

EE 210: CIRCUITS AND DEVICES

Three Terminal Devices

Objectives The purpose of this lab is build and analyze Differential amplifiers based on NMOS transistors (or NPN transistors).

Sirindhorn International Institute of Technology Thammasat University at Rangsit

Field Effect Transistors

UNIT 4 BIASING AND STABILIZATION

EXPERIMENT 5 : THE DIODE

THIRD SEMESTER ELECTRONICS - II BASIC ELECTRICAL & ELECTRONICS LAB DEPARTMENT OF ELECTRICAL ENGINEERING

UNIVERSITY OF PENNSYLVANIA EE 206

Chapter 8. Field Effect Transistor

Field Effect Transistors

INC 253 Digital and electronics laboratory I

Transcription:

Oct. 28, 2007, rev. July 26, 2009 Introduction The purpose of this laboratory exercise is for students to gain experience making measurements on Junction (JFET) to confirm mathematical models and to gain practical experience with analysis and design of JFET amplifiers. Do not use SPICE for this lab the results will probably differ by a wide margin compared to your measured values. The only way to make SPICE work is to customize the JFET model to the IDSS and VP values you measure. 1.0 Initial Measurement and Setup The first thing to do is to become familiar with your JFET and to verify that it is operational prior to doing experiments with it. Use the data sheet for your JFET to identify the gate, source, and drain leads. Since this is an N-channel JFET the gate is made of P-type semiconductor and the channel is made of N-type semiconductor. For the following measurements, use an ohmmeter set on a range that can measure forward biased diodes (this is typically the 2K full-scale range some meters have a special diode test range use that if yours has one). 1.1 Confirm a forward bias condition when the plus lead is connected to the gate and the negative lead is connected to the source and then the drain. 1.2 Confirm a reverse bias condition when the negative lead is connected to the gate and the plus lead is connected to the source and then the drain. 1.3 Connect the ohmmeter across the drain and source (polarity does not matter) with the gate lead open and confirm some kind of conduction. JFETs vary widely so no specific value can be given here. Typically this can range from less than one hundred up to several hundred ohms. The key point is that if this measurement shows a high resistance (much over 1,000 ohms) then the JFET may be defective. 1.4 Continue to the next part if the JFET passed the above tests. Otherwise, try a different JFET. 1

2.0 Measuring IDSS and VP EE351 Laboratory Exercise 4 Figure 1 2.1 Build the circuit in Figure 1 but do not install the transistor yet. The 680 ohm drain resistor is about the largest that can be used if the IDSS of your JFET is at the high end of its possible range. The voltage divider network is designed to work with your lab power supply to convert the positive 0 6 volt control into a negative control for biasing the gate of the JFET. Verify that the gate voltage varies from about -4.6 to 0.0 as the 0 6 volt supply is varied from 0 to 6 volts. Fix any problems before continuing. 2.2 Install the transistor and set the gate voltage to 0.00 volts. Measure the voltage, VRD, across RD and compute the drain current from Ohm s law this is the method to use for measuring drain current in subsequent steps. Record this current as IDSS. This should be between about 2 and 20 ma. Use a different JFET if this current is more than 20 ma. 2.3 Adjust the gate voltage to -4.6 volts and measure and record the drain current. It should be significantly smaller than IDSS and may be zero depending on your particular JFET. If not then there is something wrong either you have a wiring error or the JFET is defective. Do not proceed until whatever problem is fixed. 2.4.0 Measuring VP is a bit tricky as it can be difficult to define a point at which ID just reaches zero actually a very small residual current. This can cause the magnitude of VP to be overstated. To make it easier for the student to obtain 2

credible results for this lab the measurement will be made at a specific point and extrapolated to VP. Using the standard mathematical model for a JFET, the student should show that when (ID/IDSS) = 0.01 that (VGS/VP) is 0.9. Thus, we adjust VGS so that the drain current is one percent of IDSS and then divide that voltage by 0.9 to obtain a good value for VP. 2.4.1 Adjust the gate voltage such that the drain current, ID, is one percent of the measured IDSS. If, for your particular JFET, you need to go below -4.6 volts for the gate voltage then change the 33K resistor in the voltage divider network to 15K. This will permit a gate voltage adjustment range of -8 to -4.4 volts. It should not take more than -8 volts to bring ID to near zero. Start over with another FET if this does not work. 2.4.2 Divide the gate voltage from 2.4.1 by 0.9 to obtain a good value for VP. Record this value. You now have the basic model information for your JFET. 3.0 Plotting transfer characteristics Figure 2 The student will plot the ID versus VGS and gm versus VGS over the range of VGS from VP to 0. Connect the circuit in Figure 2. Depending on your particular JFET you may need to start with R1 = 33K and then change to R2 = 15K if more than -4.6 volts is needed. Note that ID is the DC voltage across RD divided by RD. 3

The 1000 Hz sine wave signal generator provides a varying gate voltage so that the resulting variation in ID can be measured. This permits the gm to be calculated for each operating point. A low value of 0.1 Vpp is used for the vgs so that the system is linear. Note that id is the peak-peak voltage measured (using a scope) at the drain terminal and then divided by RD (the other end of RD is at signal ground) and that gm is id/vgs. Expect ratios in the 0.003 range for VGS = 0 down to below 0.0001 for VGS approaching VP. 3.1 Complete the following table. There is no point taking data beyond VP. VGS ID id 0.0 V ma mapp -0.2-0.4-0.6-1.0-1.2-1.4-1.6-1.8-2.0-2.2-2.4-2.6-2.8-3.0-3.2-3.4-3.6-3.8-4.0-4.2-4.4-4.6-4.8-5.0-5.2-5.4-5.6-5.8-6.0 Continue if needed until VP is reached for your particular JFET. 4

3.2 Plot the actual ID versus VGS data from data in 3.1 and the theoretical data from the model of your JFET together. 3.3 Plot the actual gm versus VGS data from data in 3.1 and the theoretical data from the model of your JFET together. Also plot (on a different graph) the actual gm versus ID data from data in 3.1 and the theoretical data from the model of your JFET together. 4.0 Common Source Amplifier Figure 3 4.1 Build the circuit in Figure 3. To customize this part of the lab for good results for your particular JFET, choose a convenient value of RD that is around 20/IDSS this is only a rough guideline. Calculate the required value of RS to bias the JFET for an ID that is half of IDSS. Use the nearest standard resistor. 4.2 Measure VD and compute the actual ID. Compare these to the predicted values from analysis. Hint: VD should be in the general vicinity of 10 volts give or take about 3 volts. Figure out what is wrong if this is not the case otherwise the next part of the lab will not work right. 4.3 Adjust the signal generator output level to a 0.1 Vpp 1000 Hz sine wave as measured at the gate terminal of the FET. Measure the peak-peak AC signal amplitude at the drain terminal. Compute the actual gain and compare to the theoretical gain calculation. Use the gm you measured for the actual drain current you are using. 5

4.4 Connect a load resistor (between about half and twice the value you are using for RD) as shown in Figure 4. Measure the AC voltage across the load. Compute the actual gain and compare to the theoretical gain calculation. Using the voltage divider equation, compute the output resistance of the amplifier and compare with the theoretical value. Compute the power gain of the amplifier. Figure 4 4.5 Increase the amplitude from the signal generator until some kind of distortion is observed in the waveform across the load resistor. Usually the first visible sign of distortion is non-symmetrical halves of the sine wave across the load. Record the peak-peak output amplitude obtained. 4.6 Increase the amplitude from the signal generator until on half of the sine wave across the load begins to clip and observe the distortion. 6

5.0 Common Drain Amplifier EE351 Laboratory Exercise 4 Figure 5:Common drain amplifier 5.1 Complete the design of the circuit in Figure 5. Use the same resistor for RS as you used for RD in the previous part. Calculate the value of R3 to bias the JFET for a drain current three fourths of IDSS. Remember that you know VS from the product of ID and RS and that you need a specific VG to form the required VGS for the target drain current. Complete the design of the voltage divider to obtain that VG. 5.2 Build the circuit in Figure 5 and measure VS and VG. From these values, compute ID and VGS. Check these against the values calculated from analysis using the model of your JFET. 5.3 Apply a 0.1 Vpp 1000 Hz sine wave signal as measured on the gate terminal and measure the peak-peak signal at the source terminal. Compute the voltage gain of the amplifier and compare with the value from analysis. 5.4 Refer to Figure 6 and connect the same load resistor as used in the previous part and measure the peak-peak signal across it. Compute the voltage gain of the amplifier and compare with the value from analysis. Using the voltage divider equation, compute the output resistance of the amplifier and compare with the theoretical value. Compute the power gain of the amplifier. 7

Figure 6 5.5 Increase the amplitude from the signal generator until some kind of distortion is observed in the waveform across the load resistor. Usually the first visible sign of distortion is non-symmetric halves of the sine wave across the load. Record the peak-peak output amplitude obtained. 5.6 Increase the amplitude from the signal generator until on half of the sine wave across the load begins to clip and observe the distortion. 8