Reliability Testing of MWD Assemblies Developing a Standard

Reliability Testing of MWD Assemblies Developing a Standard I.A.D.D. Forum Thursday, September 29, 2016 Presented by: Bob Joyce

Questions One Must Ask?? Why is there no standard or best practice? Can we develop guidelines for testing: Board and sensor level qualification? Sub-assembly level qualification? Production Screens? Transportation Qualification? Can standards be developed for various classes of technology? Is there sufficient testing performed at the various development and production stages??

Environmental Tests Electrical Function Temperature Temp with Vibe Shock Pressure Flow Loop

Sample of Existing Test Standards Component level testing/batteries MIL-STD-883H (vibe), MIL-STD-202G 9(all), IEEE UN Testing for Lithium Batteries Sub-Assembly level testing for Downhole NO Governing Standard for Qualification Navmat P-9492: Manufacturing Screen (Thermal & Vibe) MIL-STD-810G: General all encompassing for qualifying products MIL-STD-167: Vibration only standard IEC-60068-2: General Spec (Inter. Electrotechnical Comm) ASTM-D4160: Shipping (Amer. Society for Testing & Materials) ISTA-2A: Packages (Inter. Safe Transit Assoc.)

Common Practices Thermal Testing Burn-In Dwell Time = max. downhole dwell time Soak Temp = Targeted spec (add 10 o -15 o C) Thermal Cycles Lower SP = coldest environment possible (subtract 10 o -15 o C) Upper SP = same as Burn-In Ramp Rates = 15 o -20 o C/min. (lower if sensitive sensors involved) Number of Cycles = 10-20 Life Testing Combination of above As many as 30-40 days Models available to predict MTBF

Accelerated Life Tests - HALT Common Practice Engineering prototype phase Method to determine weaknesses in design Present product as exposed as possible Destructive test Thermal & vibe Typhoon4 Inferno Chamber Temperature: -100 o C to +250 o C Vibration: Up to 85 G rms

Temperature ( C) HALT Highly Accelerated Life Test Determine Lower Functional Limit Cold Step Stress 40 20 0-20 -40-60 -80-100 -120 0 50 100 150 200 250 Test Time (min.)

Temperature ( C) HALT Highly Accelerated Life Test Hot Step Stress 250 200 150 100 50 0 0 50 100 150 200 250 300 Test Time (min.) Determine Upper Functional Limit

Vibration (Grms) Temperature ( C) Rapid Thermal Cycling HALT 200 150 100 50 0-50 -100 0 50 100 150 200 Test Time (min.) Vibration Step Stress 60 50 40 30 20 10 0 0 50 100 150 200 Test Time (minutes)

Temperature ( C) Vibration (Grms) HALT Combined Environment Temperature Vibration 200 60 150 50 100 40 50 30 0 20-50 10-100 0 0 20 40 60 80 100 120 140 160 180 200 Test Time (min.)

HALT Testing MWD Probe Diagnostics Multiple Potted PCB s Customer Monitoring a HALT Inaert board test Powered PCB s unpotted

Modified HALT Programs 10 Cycles Product Temp: -40 o C to +150 o C Vibe: Constant 50 G rms Dwell Time: 15 min. Transitions: ~60 o C/min.

Typical Vibe Test Test Articles: Electro-Mechanical Sub-Assemblies Desired Temp Ratings: 150 o C to 185 o C (200 o C) Qualification: Verify performance simulating downhole drilling conditions. (Vibe, Shock, Temp) Insert pic of MWD tool

Vibration Sources - Drilling Stick Slip Bit Bounce (displ.) Forward Whirl Bit Bounce (axial) BHA Whirl Stabilizers Bit (cones/blades) Whirl (backward) Mud Motors Bit (inserts) Tortional Resonance Tortional Bit Chatter Bit Bounce (impact) Ave. Amplitude = 10-15 G I I I I 1 10 100 1000 Frequency (Hz)

Fixturing/Orientation Z Axis X Axis Rotate 90 for Y

Accel Placement Insert Pics Large 3 axis, fixture accel

Vibration Sine Sweeps

Displacement (mm p-p) Displacement (mm p-p) Sine HOLD Test 3mm Disp. 7 Displacement Profile Demand 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Frequency (Hz) Displacement vs. Time X-Axis Control 1.00000 0.10000 0.01000 0.00100 0.00010 Demand 0 1 2 3 4 5 6 Time (min) X-Axis Control Jan 21, 2014 08:10:27 Demand: 3 mm Control Disp: 2.999 mm Control G: 1.358 G Total Time: 0:05:51 End of Timed Test 1-Sine Hold 3mm X-Axis S/N SMA-0200

Vibration Sine Sweeps Common Practice Sweep 5-500 Hz 1 G peak Sine input (X, Y & Z axes) Resonance Test 5-20 G peak Sine input (X, Y & Z axes) Qual Test 1 Oct./min. sweep speed Check resonance of entire system including fixtures Measure transmissibility of key locations on UUT Dwell on highest resonance for 10-60 minutes

Vibration Random Common Practice Freq: 5-1000 Hz 0.8-20 G rms Various profiles for different applications Run Random profile for 20-120 minutes

20G Random Vibe

Acceleration Spectral Density (G²/Hz) Random Vibe - Transport 0.75 G rms Acceleration Spectral Density 1x10-2 1x10-3 1x10-4 1x10-5 Demand Control 1 10 100 Frequency (Hz) 300 Feb 06, 2014 13:57:50 Level 1) 100 % Output: 0.304 Volts RMS ASTM D4169 D4728B Mod 300Hz 0.7468G 1 hour Demand: 0.7468 G RMS Level Time: 1:00:00 Rosemount Analytical Model 370XA Chromatograph Control: 0.7521 G RMS Total Time: 1:00:20 End of Test S/N 130706

4G Random Transportation Qual

Vibration Test Plan QUAL TRANSPORT Freq (Hz.) 5-1000 5-300 Sine Ampl (g) 5 1 Speed (oct/min) 1 3 Random Ampl (g) 15-20 0.7-1.8 At times Vibe tests requested at Temp

Shake & Bake

Shaker Vibe vs HALT Vibe 6DOF Vibe Excitation 6 5000 Hz. G rms level controlled

Classic Shock 50 Gpeak

Free Fall or Pneumatic Shock Testing Common Practice ½ Sine input (X, Y & Z axes) # Shocks Variable (10-200) Larger Assemblies 10 50 G peak (Transport/Screens) 250 500 G peak (Quals) Pulse Width: 10-30 msec. Smaller Assemblies/PCB s 500 1000 G peak Pulse Width: ½ -2 msec.

The Toughness of Shock Tests

Flow Loop Testing

Snubber Performance Study

Snubber Performance - Shock 1100 G 550 G

Diagnostics Screen

Summary There are no governing test specs for downhole sub-assemblies across the industry There are common and somewhat accepted practices for testing but with broad limits OEM s and large service companies vary in their approach to testing. (time to market, budgets) There is no doubt that a Best Practice plan will contribute to lowering those warranty costs Independent labs like DynaQual are very interested in helping to develop test standards for the industry

Thank You