Fundamental Characterizations of Diamond Disc, Pad, and Retaining Ring Wear in Chemical Mechanical Planarization Processes

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Fundamental Characterizations of Diamond Disc, Pad, and Retaining Ring Wear in Chemical Mechanical Planarization Processes Yun Zhuang 1,2, Len Borucki 1, Ara Philipossian 1,2 1. Araca, Inc., Tucson, Arizona 85750, USA 2. University of Arizona, Tucson, Arizona 85721, USA

Outline Introduction Diamond disc wear characterization Active diamond characterization Aggressive diamond characterization Diamond wear characterization Pad wear characterization Pad macro wear characterization Pad surface micro wear characterization Retaining ring wear characterization Summary

Introduction Diamond disc Pad Retaining Ring During pad conditioning, the interactions between the pad and diamond disc result in not only pad wear but also diamond disc wear. During wafer polishing, the interactions between the pad and retaining ring result in not only pad wear but also retaining ring wear.

Diamond Disc Wear Characterization Active diamond characterization Aggressive diamond characterization Diamond wear characterization

Identify Active Diamonds - Short Draw Test Patent Applied for US 11/528,825 MMC TRD 100 grit 8.0 lbf 109 active diamonds Conditioner is pulled only about ¼. Scratch origins are marked. Faint scratches Partial scratches

Identify Aggressive Diamonds - Long Draw Test Polycarbonate surface is profiled Conditioner is pulled more than one diameter. Sometimes color is used for contrast

Furrow Surface Area Analysis The ten most aggressive diamonds account for more than 50% of pad cut rate during conditioning.

Locate Aggressive Diamonds 3

Diamond Wear New aggressive diamond Same diamond after wear test Normally there is no bulk wear on the diamond and micro wear occurs on the cutting edges of the diamond.

Pad Wear Characterization Pad macro wear characterization Pad surface micro wear characterization

Pad Macro Wear Characterization Optimization of the pad conditioning sweep schedule on a rotary polishing tool can significantly improve the pad macro wear uniformity.

Pad Surface Interferometry Analysis 1/e λ Pad surface interferometry image Pad surface abruptness extraction Profilometry analysis: surface roughness (top pad asperities to pad valleys), no consistent correlation with material removal rates. Interferometry analysis: surface abruptness (top 20-30 μm pad asperities), closely correlated with material removal rates.

Effect of Pad Conditioning 1 Conditioned by Disc A Surface Height Probability Density (1/micron) 0.1 0.01 0.001 0.0001 Disc A Disc B Conditioned by Disc B 0.00001-60 -40-20 0 20 40 60 Pad Surface Height to the Mean (micron) Disc aggressiveness Coefficient of friction Variance of shear force Pad surface abruptness ILD removal rate A > B A > B A > B A > B A > B

Pad Surface Contact Area Measurement Laser Confocal Microscopy Sample holder with sapphire window and load cell Reflected Image Sapphire window Zeiss LSM 510 Meta NLO Plan-Neoflaur 10x/0.3 objective 488 nm wavelength laser Pad Contact No reflected image Black area

Pad Surface Contact Area Image 100 μm

Pad Surface Contact Area Analysis Pad contact area histogram Pad contact area vs. Pressure

Effect of Pad Conditioning The ratio of the contacting summit density to the contact area fraction is more important than either measured separately since the ratio determines the mean real contact pressure.

Retaining Ring Wear Characterization Conventional methods: Micrometry Long wear time May introduce gross measurement error Weight Loss Long wear time May introduce gross measurement error Cannot provide local wear rate Advanced method: Interferometry Short wear time Provide accurate local wear rate

Retaining Ring Design and Wear Characterization Several shallow trenches (1.5 mm in diameter and 0.2 mm in depth) were precision-machined into the land areas of each ring. Trench interferometry image before wear test Trench interferometry image after 4-hour wear test

Retaining Ring Wear Rate Pre and post interferometry results from the micro-machined trenches indicate the following wear rates: PPS - 1 ring: 28.2 µm/hour PEEK - 1 ring: 24.0 µm/hour PEEK - 2 ring: 23.5 µm/hour This indicates that the retaining ring material, not design, is the main factor influencing the wear rate. Micrometry results (taken from areas adjacent to the micro-machined trenches) indicate a difference of ± 13percent compared to interferometry results.

COF and Pad Temperature The PEEK rings achieve better lubricity and COF stability than the PPS ring. Higher temperatures associated with the PPS ring can cause higher material removal rates, thus indicating that thermal effects need to be taken into account when qualifying rings made of new materials.

Pad Surface Interferometry Analysis The PEEK 2 ring achieves a narrower pad surface height distribution than the PPS 1 and PEEK 1 rings, suggesting that the slot design and or the edge rounding plays significant roles in shaping the pad micro texture.

Summary The method for active and aggressive diamond characterization is introduced. Normally there is no bulk wear on diamonds and wear mainly occurs on the cutting edges of the active diamonds. An optimized conditioning sweep schedule can generate a much more uniform pad thickness profile. For pad surface micro wear characterization, confocal microscopy analysis is used to analyze pad surface contact area. Interferometry analysis is used to establish pad surface height probability density functions and extract pad surface abruptness. Interferometry analysis is used to characterize retaining ring wear, which not only allows retaining rings to be subjected to significantly shorter than usual wear time, but also provides more accurate estimate of local wear rates than conventional micrometry or weight loss measurements.