EVALUATION OF A FOCUSED LASER SPOT DIAMETER FOR AN OPTICAL ANGLE SENSOR. Yuki Shimizu, Taiji Maruyama, Shota Nakagawa, Yuan-Liu Chen, Wei Gao

Similar documents
Investigation of an optical sensor for small angle detection

A Single Lens Micro-Angle Sensor

Wavefront Sensing In Other Disciplines. 15 February 2003 Jerry Nelson, UCSC Wavefront Congress

Comparison of resolution specifications for micro- and nanometer measurement techniques

A 3D Profile Parallel Detecting System Based on Differential Confocal Microscopy. Y.H. Wang, X.F. Yu and Y.T. Fei

Development of a new multi-wavelength confocal surface profilometer for in-situ automatic optical inspection (AOI)

Laser Telemetric System (Metrology)

Real-Time Scanning Goniometric Radiometer for Rapid Characterization of Laser Diodes and VCSELs

1 Introduction. Research Article

Profile Measurement of Resist Surface Using Multi-Array-Probe System

Development of a Micro-CMM

AgilOptics mirrors increase coupling efficiency into a 4 µm diameter fiber by 750%.

PROCEEDINGS OF SPIE. Measurement of low-order aberrations with an autostigmatic microscope

(51) Int Cl.: G01B 9/02 ( ) G01B 11/24 ( ) G01N 21/47 ( )

Beam Shaping and Simultaneous Exposure by Diffractive Optical Element in Laser Plastic Welding

CHAPTER 5 FINE-TUNING OF AN ECDL WITH AN INTRACAVITY LIQUID CRYSTAL ELEMENT

SpotOptics. The software people for optics OPAL O P A L

plasmonic nanoblock pair

OPAL. SpotOptics. AUTOMATED WAVEFRONT SENSOR Single and double pass O P A L

Mode analysis of Oxide-Confined VCSELs using near-far field approaches

Design and Testing of a Micro-thermal Sensor Probe for Nondestructive Detection of Defects on a Flat Surface

Use of Computer Generated Holograms for Testing Aspheric Optics

A novel tunable diode laser using volume holographic gratings

A novel algorithm for the signal interpolation of the displacement measurement based on a Fabry-Perot interferometer

Collimation Tester Instructions

Compact ellipsometer employing a static polarimeter module with arrayed polarizer and wave-plate elements

High stability multiplexed fibre interferometer and its application on absolute displacement measurement and on-line surface metrology

Improving a commercially available heterodyne laser interferometer to sub-nm uncertainty

School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei, China 2

5 m-measurement system for traceable measurements of tapes and rules

Diffractive Axicon application note

Technical Explanation for Displacement Sensors and Measurement Sensors

Design Description Document

Industrial quality control HASO for ensuring the quality of NIR optical components

Development of innovative fringe locking strategies for vibration-resistant white light vertical scanning interferometry (VSI)

Characteristics of point-focus Simultaneous Spatial and temporal Focusing (SSTF) as a two-photon excited fluorescence microscopy

The Henryk Niewodniczański INSTITUTE OF NUCLEAR PHYSICS Polish Academy of Sciences ul. Radzikowskiego 152, Kraków, Poland.

1.6 Beam Wander vs. Image Jitter

Displacement sensor by a common-path interferometer

Parallel Mode Confocal System for Wafer Bump Inspection

Study of a Miniature Air Bearing Linear Stage System

A Laser-Based Thin-Film Growth Monitor

OPTICS IN MOTION. Introduction: Competing Technologies: 1 of 6 3/18/2012 6:27 PM.

Spatially Resolved Backscatter Ceilometer

Bias errors in PIV: the pixel locking effect revisited.

Supplementary Information

Dynamic beam shaping with programmable diffractive optics

3.0 Alignment Equipment and Diagnostic Tools:

1272. Phase-controlled vibrational laser percussion drilling

Ron Liu OPTI521-Introductory Optomechanical Engineering December 7, 2009

REAL TIME THICKNESS MEASUREMENT OF A MOVING WIRE

NANOMEFOS (Nanometer Accuracy Non-contact Measurement of Free-form Optical Surfaces)

Length-Sensing OpLevs for KAGRA

Adaptive Optics for LIGO

PSD Characteristics. Position Sensing Detectors

Understanding Optical Specifications

Uncertainty in measurements of micro-patterned thin film thickness using Nanometrological AFM - Reliability of parameters for base straight line -

Machine Tools with an Enhanced Ball Screw Drive in Vertical Axis for Shaping of Micro Textures

Computer Generated Holograms for Optical Testing

High Resolution Detection of Synchronously Determining Tilt Angle and Displacement of Test Plane by Blu-Ray Pickup Head

Testing Aspheric Lenses: New Approaches

Dynamic Phase-Shifting Electronic Speckle Pattern Interferometer

Sensitivity Enhancement of Bimaterial MOEMS Thermal Imaging Sensor Array using 2-λ readout

Week IV: FIRST EXPERIMENTS WITH THE ADVANCED OPTICS SET

J. C. Wyant Fall, 2012 Optics Optical Testing and Testing Instrumentation

ADVANCED OPTICS LAB -ECEN 5606

Agilent 5527A/B-2 Achieving Maximum Accuracy and Repeatability

CHIRPED FIBER BRAGG GRATING (CFBG) BY ETCHING TECHNIQUE FOR SIMULTANEOUS TEMPERATURE AND REFRACTIVE INDEX SENSING

Fabrication of large grating by monitoring the latent fringe pattern

Chapter 7. Optical Measurement and Interferometry

A broadband achromatic metalens for focusing and imaging in the visible

Test procedures Page: 1 of 5

MICROMACHINED INTERFEROMETER FOR MEMS METROLOGY

University of Huddersfield Repository

Fast Optical Form Measurements of Rough Cylindrical and Conical Surfaces in Diesel Fuel Injection Components

Coherent Laser Measurement and Control Beam Diagnostics

Optical Components for Laser Applications. Günter Toesko - Laserseminar BLZ im Dezember

PROCEEDINGS OF SPIE. Automated asphere centration testing with AspheroCheck UP

EE119 Introduction to Optical Engineering Fall 2009 Final Exam. Name:

Nano Beam Position Monitor

Confocal Imaging Through Scattering Media with a Volume Holographic Filter

Supplementary Materials

Radial Polarization Converter With LC Driver USER MANUAL

A New Profile Measurement Method for Thin Film Surface

Eric B. Burgh University of Wisconsin. 1. Scope

7. Michelson Interferometer

Instructions for the Experiment

An Optical Characteristic Testing System for the Infrared Fiber in a Transmission Bandwidth 9-11μm

G. Serra.

ADAPTIVE CORRECTION FOR ACOUSTIC IMAGING IN DIFFICULT MATERIALS

Polarization Experiments Using Jones Calculus

Adaptive multi/demultiplexers for optical signals with arbitrary wavelength spacing.

Supplementary Figure 1. GO thin film thickness characterization. The thickness of the prepared GO thin

Proceeding The Alignment Method for Linear Scale Projection Lithography Based on CCD Image Analysis

HIGH-RESOLUTION FIBER-COUPLED INTERFEROMETRIC POINT SENSOR FOR MICRO- AND NANO-METROLOGY. Markus Schake, Markus Schulz and Peter Lehmann ABSTRACT

4DAD, a device to align angularly and laterally a high power laser using a conventional sighting telescope as metrology

Laser interferometric measuring system for positioning in nanometrology

Real-time displacement measurement using VCSEL interferometer

MEASUREMENT APPLICATION GUIDE OUTER/INNER

Laser Beam Analysis Using Image Processing

Transcription:

59 th ILMENAU SCIENTIFIC COLLOQUIUM Technische Universität Ilmenau, 11 15 September 2017 URN: urn:nbn:de:gbv:ilm1-2017iwk-071:8 EVALUATION OF A FOCUSED LASER SPOT DIAMETER FOR AN OPTICAL ANGLE SENSOR Yuki Shimizu, Taiji Maruyama, Shota Nakagawa, Yuan-Liu Chen, Wei Gao Department of Finemechanics, Tohoku University 6-6-01, Aramaki Aza-Aoba, Aoba-ku, Sendai, Miyagi, 9808579 Japan ABSTRACT This paper presents a new method for measurement of a focused laser beam diameter by using a single cell photodiode (PD) for achievement of further higher measurement sensitivity of an optical angle sensor based on laser autocollimation. The proposed method referred to as the PD edge method utilizes an edge of the PD active cell in the same manner as the conventional knife-edge method, which is often employed for the evaluation of light spot diameter. The proposed PD edge method is expected to evaluate the focused laser beam diameter without the influence of light diffraction, which is often observed in the case of knife-edge method. After a description of the proposed PD edge method, its feasibility is demonstrated throughout the experiments by using a developed prototype optical setup. Index Terms - Optical angle sensor, Laser autocollimation, Abbe principle. 1. INTRODUCTION Strong demands on the fabrication of highly-precise free form optics can be found in the field of production engineering. Fabrication accuracy of such precision products is determined by the positioning accuracy of positioning systems to be used in ultra precision machine tools [1]. For feedback control of a positioning system, high precision displacement sensors such as linear encoders or laser interferometers are often employed [2]. Meanwhile, most of the positioning systems such as linear stages have an offset between its measurement axis and the motion axis, resulting in a positioning error [3] which is often referred to as the Abbe error. Some novel positioning systems [4-8] are designed to comply with the Abbe principle. In the case of employing laser interferometers [4-6], the measurement axes of the interferometers are aligned to intersect at the tip of the measurement probe so that angular error motions of the positioning table will not affect the measurement accuracy. Such a configuration can also be realized while using linear encoders as the displacement sensors for feedback control of a positioning table [7, 8]. Meanwhile, such configurations of the displacement sensors with respect to the positioning table will severely restrict the mechanical design of a precision positioning system. Therefore, in most of the cases, it is difficult to design positioning systems in machine tools or measuring instruments complying with the Abbe principle. To achieve further higher positioning accuracy in such machine tools or measuring instruments, the angular error motions of a positioning table are required to be measured by using appropriate angle sensors so that feedback control of a stage table can be carried out with the output signals from the angle sensors. For measurement of angular error motions of a stage table, autocollimators are often employed. Some of the commercially available autocollimators have achieved a high measurement resolution of up to 0.005 arc-second [9]. Meanwhile, most of the autocollimators have employed a CCD (Charge Coupled Device), whose cutoff frequency is 2017 - TU Ilmenau

not high enough to be applied for closed-loop control of the stage table, as its position detector. It has therefore been difficult to apply the commercially available autocollimators to the feedback control of a stage system. This drawback can be addressed by applying photodiodes (PDs), whose cutoff frequency is much higher than that of the CCD, to the optical angle sensors [10-12] based on laser autocollimation [13] for the dynamic measurement of the angular error motions of stage systems. By using a quadrant photodiode (QPD), two-degree-of-freedom tilt can be measured simultaneously. Furthermore, with the employment of a diffraction grating as a measurement target, three-dimensional angular motion of a stage table can be measured simultaneously [14]. Meanwhile, the sensitivity of angle sensor can be improved by reducing the diameter of focused laser beam on the PDs [12]. The employment of single cell photodiodes (SPDs) can accept further smaller focused laser beam to achieve further higher sensitivity [15]. In this case, the evaluation of the diameter of focused laser beam becomes an important task to assure the high measurement resolution of the optical angle sensor. In responding to the background described above, in this paper, a new method for the measurement of the diameter of focused laser beam is proposed. Some experiments by using the developed optical setup are carried out to demonstrate the feasibility of the proposed method. 2. PRINCIPLE OF THE PROPOSED METHOD 2.1 Laser Autocollimation Figure 1 shows a schematic of the optical configuration for an optical angle sensor based on laser autocollimation [7]. In the optical angle sensor, angular displacement of a measurement target (a plane mirror) is detected as the translational displacement of the laser beam, which is reflected by the mirror and is made incident to a collimator objective, on the detector plane. The relationship between the angular displacement about the X(Y)-axis θ X(Y) and the translational displacement of the focused laser beam along the X(Y)-axis δ X(Y) can be expressed as follows [10]: δ X ( Y ) δ X ( Y ) θ X ( Y ) = arctan 2 f (1) 2 f where f is the focal length of the collimator objective. By detecting δ X(Y) from the output signals of a PD, θ X(Y) can be detected. Now the focused laser beam diameter w on the PD plane can be expressed as follows [16]: 1.22 fλ w = (2) D QPD I A δ I D Light source Lens Diameter: D Focal length: f Gap: g Laser beam Mirror Polarized beam splitter with a λ/4 plate Collimator objective Detector I B SPD δ I C I Meas Fig. 1 A schematic of the optical configuration for two-axis laser autocollimator 2017 - TU Ilmenau 2

where D and λ are the diameter and the light wavelength of the laser beam made incident to the collimator objective, respectively. From Eqs. (1) and (2), the following equation can be obtained: θ 0.61 X ( Y ) λ X ( Y ) wd δ (3) Equation (3) means that the smaller focused laser beam diameter w contributes to improve the sensor sensitivity. However, in the case of employing quadrant-cell photodiode (QPD) as the position sensing detector, too small focused laser beam cannot be detected due to the existences of insensitive area with the gap of g among the active cells. This drawback can be overcome by employing a single cell photodiode as the position sensing detector and align the focused laser beam on the edge of the single cell. This optical configuration can accept further smaller focused laser beam and thus improve the measurement resolution of the optical angle sensor [15]. 2.2 Evaluation of a focused laser beam diameter by using an edge of an active cell in photodiode For the evaluation of laser beam diameter, the knife edge method [17], a schematic of which is shown in Fig. 2(a), has often been employed due to its simple principle and easy setup. In the method, the knife edge will be moved to cut across the laser beam, while monitoring the light intensity of the laser beam passed around the knife edge. However, in the case of measuring the focused laser beam diameter, this method is not suitable since the influence of diffraction at the knife edge becomes significant. To address the drawback of knife-edge method described above, in this paper, a new method referred to as the PD-edge method, a schematic of which is shown in Fig. 2(b), is therefore proposed. In the proposed method, a detector plane will be placed at the focal plane of the objective lens. The focused laser beam will be placed around the edge of the active cell of PD. After that, a relative motion will be given in-between the laser beam and the PD, while monitoring variation of the light intensity of the laser beam made incident to the active cell of PD (Fig. 3). Since there are not any influences of the light diffraction at the edge, which becomes significant especially in the case of measuring focused laser beam diameter by the conventional knife edge method, the proposed method is expected to achieve precise measurement of the focused laser beam diameter. 3. EXPERIMENTS FOR EVALUATION OF THE FOCUSED LASER BEAM DIAMETER To verify the feasibility of the proposed PD-edge method, experiments were carried out. Incident beam Detector Detector Incident beam Knife edge Diffraction (a) Insensitive area Fig. 2 (a) The conventional knife-edge method and (b) the proposed PD-edge method (b) 2017 - TU Ilmenau 3

Sensitive area Insensitive area Spot Intensity PD Output 1 Position 0.135 w 0 Position Fig. 3 Relationship among the position of the focused laser beam on the photodiode, photodiode output and the intensity distribution of the focused laser beam Figure 4 shows a schematic of the experimental setup constructed in this paper. A laser beam from the laser diode was collimated, and was expanded by a beam expander. A diameter of the expanded laser beam D was adjusted by an iris, and was focused on a SPD by using a collimator objective. The SPD was mounted on a linear stage so that it could be scanned in the Y-direction for the measurement of the focused laser beam diameter d. The displacement of the linear stage was measured by a length gauge, whose measurement axis was aligned to be coincide with the motion axis of the SPD. Experiments were repeated while increasing the d SPD Linear stage Objective lens Y Z Beam expander X Length gauge D Iris Laser diode (a) A photograph of the setup (b) A schematic of the setup Fig. 4 Experimental setup for the PD-edge method 2017 - TU Ilmenau 4

Focused laser beam diameter d µm 25 20 15 10 5 0 PD edge method Beam profiler (knife edge) Theoretical 0 5 10 15 20 25 Diameter of the laser beam made incident to the collimator objective D mm Fig. 5 Focused laser beam diameter measured by the conventional method (knife-edge method) and the proposed PD edge method incident beam diameter D from 2 mm to 24 mm by adjusting the iris. For comparison, the focused laser beam diameter d was also measured by a commercial beam profiler (BeamScan, Photon Inc.), whose measurement principle was based on the knife edge method. Figure 5 shows the measured focused laser beam diameter d with each incident beam diameter D. In the figure, theoretical value of the focused laser beam diameter calculated from a thin-lens equation without aberrations is also plotted. As can be seen in the figure, the commercial beam profiler showed relatively larger focused laser beam diameter than that acquired by the PD-edge method. Meanwhile, on the other hand, the result of the PD-edge method showed a good agreement with the theoretical value in the region where the incident beam diameter D was smaller than 10 mm. From these results, it has been verified that the proposed PD-edge method can measure the micrometric diameter of a focused laser beam. It should be noted that the measured focused laser beam diameter d was found to increase when the incident beam diameter D was set to be larger than 12 mm. A spherical aberration of the objective lens is considered as a root cause of the increase of the focused laser beam diameter [15]. 4. CONCLUSIONS A new method for measurement of a focused laser beam diameter, which is referred to as the PD edge method, is proposed for achieving further higher measurement sensitivity of an optical angle sensor based on the laser autocollimation. Experimental results by the developed prototype optical setup for the PD edge method have demonstrated that the proposed method can measure the diameter of focused laser beam, which cannot have been measured by the commercial beam profiler based on the knife-edge method. It should be noted that attentions have been paid in this paper to verify the feasibility of the proposed PD edge method. A verification test of the improvement of angle sensor sensitivity by optimizing the focused laser beam diameter, as well as the uncertainty analysis of the beam diameter measurement will be carried out in future work. ACKNOWLEDGEMENTS This research is supported by Japan Society for the Promotion of Science (JSPS). 2017 - TU Ilmenau 5

REFERENCES [1] F.Z.Fang, X.D. Zhang, A. Weckenmann, G.X. Zhang, C. Evans, Manufacturing and measurement of freeform optics, CIRP Annals - Manufacturing Technology, 62-2 (2013) pp. 823-846. [2] W. Gao, S.W. Kim, H. Bosse, H. Haitjema, Y.L. Chen, X.D. Lu, et al. Measurement technologies for precision engineering, CIRP Annals - Manufacturing Technology, 64-2 (2015) pp. 773 96. [3] J.B. Bryan, The Abbe Principle Revisited: An Updated Interpretation, Precision Engineering, 1-3 (1979) 129-132. [4] E. Manske, G. Jäger, T. Hausotte and R. Füßl, Recent developments and challenges of nanopositioning and nanomeasuring technology, Measurement Science and Technology, 23 (2012) pp. 074001. [5] G. Jäger, E. Manske, T. Hausotte, A. Müller and F Balzer, Nanopositioning and nanomeasuring machine NPMM-200 a new powerful tool for large-range micro- and nanotechnology, Surface Topography: Metrology and Properties, 4 (2016) pp. 034004. [6] R. TAM, Ultra Precision Coordinate Measuring Machine Design, Calibration and Error Compensation, Technische Universiteit Delft, Eindhoven, (2012) (ISBN 90-6464-287-7, Ph.D. thesis). [7] R. Bernhardt, Temperature Robust Structure of a Coordinate Measuring Machine. Presentation at Euspen Special Interest Group Meeting: Thermal Issues, Zurich, Switzerland (2014). [8] K.C. Fan, C.L. Liu, P.T. Wu, Y.C. Chen, W.L. Wang, The Structure Design of a Micro-precision CMM with Abbé Principle, Proceedings of the 35th International MATADOR Conference (2007) pp 297-300. [9] Möller-Werdel Optical, Electric Autocollimators, http://www.moeller-wedeloptical.com (accessed 19 July 2017). [10] W. Gao, Precision Nanometrology - Sensors and Measuring Systems for Nanomanufacturing, Springer-Verlag, London, 2010. [11] W. Gao, P.S. Huang, T. Yamada, S. Kiyono, A compact and sensitive two-dimensional angle probe for flatness measurement of large silicon wafers, Precision Engineering, 26-4 (2002) pp. 396 404. [12] Y. Saito, Y. Arai, W. Gao, Investigation of an optical sensor for small tilt angle detection of a precision linear stage, Measurement Science and Technology, 21-5 (2010) pp. 054006. [13] A.E. Ennos, M.S. Virdee, High accuracy profile measurement of quasi-conical mirror surfaces by laser autocollimation, Precision Engineering, 4-1 (1982) pp. 5-8. [14] W. Gao, Y. Saito, H. Muto, Y. Arai, Y. Shimizu, A three-axis autocollimator for detection of angular error motions of a precision stage, CIRP Annals - Manufacturing Technology, 60-1 (2011) pp. 515 518. [15] Y. Shimizu, S.L. Tan, D. Murata, T. Maruyama, S. Ito, Y.L. Chen, and W. Gao, Ultrasensitive angle sensor based on laser autocollimation for measurement of stage tilt motions, Optics Express, 24-3 (2016) pp. 2788-2805. [16] E. Hecht, Optics 5 th Ed., Pearson (2016). [17] J.M. Khosrofian, B.A. Garetz, Measurement of a Gaussian laser beam diameter through the direct inversion of knife-edge data, Applied Optics, 22 (1983) pp. 3406-3410. CONTACTS Dr. Yuki Shimizu yuki.shimizu@nano.mech.tohoku.ac.jp 2017 - TU Ilmenau 6